• Significant Power Reduction Compared to LSTTL
Logic ICs
• HC Types
- 2V to 6V Operation
- High Noise Immunity: N
at VCC = 5V
• HCT Types
- 4.5V to 5.5V Operation
- Direct LSTTL Input Logic Compatibility,
V
= 0.8V (Max), VIH = 2V (Min)
IL
- CMOS Input Compatibility, I
= 30%, NIH = 30% of V
IL
≤ 1µA at VOL, V
l
CC
= 5V,
o
C to 125oC
CC
OH
CD74HCT20
High Speed CMOS Logic
Dual 4-Input NAND Gate
Description
The Harris CD74HC20, CD74HCT20, logic gates utilize
silicon gate CMOS technology to achieve operating speeds
similar to LSTTL gates with the low power consumption of
standard CMOS integrated circuits. All devices have the
ability to drive 10 LSTTL loads. The 74HCT logic family is
functionally pin compatible with the standard 74LS logic
family.
Ordering Information
TEMP.RANGE
PART NUMBER
CD74HC20E-55 to 12514 Ld PDIPE14.3
CD74HCT20E-55 to 12514 Ld PDIPE14.3
CD74HC20M-55 to 12514 Ld SOICM14.15
CD74HCT20M-55 to 12514 Ld SOICM14.15
CD54HC20W-55 to 125Wafer
NOTES:
1. When ordering, use the entire part number.Add the suffix 96 to
obtain the variant in the tape and reel.
2. Die for this part number is available which meets all electrical
specifications. Please contact your local sales office or Harris
customer service for ordering information.
(oC)PACKAGE
PKG.
NO.
Pinout
CD74HC20, CD74HCT20
(PDIP, SOIC)
TOP VIEW
1A
1
2
1B
3
NC
4
1C
5
1D
6
1Y
7
GND
CAUTION: These devices are sensitive to electrostatic discharge. Users should follow proper IC Handling Procedures.
Copyright
CAUTION: Stresses above those listed in “Absolute Maximum Ratings” may cause permanent damage to the device. This is a stress only rating and operation
of the device at these or any other conditions above those indicated in the operational sections of this specification is not implied.
NOTE:
3. θJA is measured with the component mounted on an evaluation PC board in free air.
Maximum Storage Temperature Range . . . . . . . . . .-65oC to 150oC
Maximum Lead Temperature (Soldering 10s). . . . . . . . . . . . .300oC
(SOIC - Lead Tips Only)
CC
DC Electrical Specifications
PARAMETERSYMBOL
HC TYPES
High Level Input
Voltage
Low Level Input
Voltage
High Level Output
Voltage
CMOS Loads
High Level Output
Voltage
TTL Loads
Low Level Output
Voltage
CMOS Loads
Low Level Output
Voltage
TTL Loads
Input Leakage
Current
V
IH
V
IL
V
OH
V
OL
I
I
TEST
CONDITIONS
25oC-40oC TO 85oC-55oC TO 125oC
VCC (V)
--21.5--1.5-1.5-V
4.53.15--3.15 -3.15-V
64.2--4.2-4.2-V
--2--0.5-0.5-0.5V
4.5--1.35-1.35-1.35V
6--1.8-1.8-1.8V
VIH or
V
-0.0221.9--1.9-1.9-V
IL
-0.024.54.4--4.4 -4.4-V
-0.0265.9--5.9-5.9-V
---------V
-44.53.98--3.84-3.7-V
-5.265.48--5.34-5.2-V
VIH or
V
0.022--0.1-0.1-0.1V
IL
0.024.5--0.1-0.1-0.1V
0.026--0.1-0.1-0.1V
---------V
44.5--0.26-0.33-0.4V
5.26--0.26-0.33-0.4V
VCC or
-6--±0.1-±1-±1µA
GND
UNITSVI(V)IO(mA)MINTYPMAXMINMAXMINMAX
3
CD74HC20, CD74HCT20
DC Electrical Specifications (Continued)
TEST
CONDITIONS
PARAMETERSYMBOL
Quiescent Device
Current
I
CC
VCC or
GND
VCC (V)
06--2-20-40µA
HCT TYPES
High Level Input
Voltage
Low Level Input
Voltage
High Level Output
Voltage
V
IH
--4.5 to
5.5
V
IL
--4.5 to
5.5
V
OH
VIH or
V
IL
-0.024.54.4--4.4-4.4-V
CMOS Loads
High Level Output
-44.53.98--3.84-3.7-V
Voltage
TTL Loads
Low Level Output
Voltage
V
OL
VIH or
V
IL
0.024.5--0.1-0.1-0.1V
CMOS Loads
Low Level Output
44.5--0.26-0.33-0.4V
Voltage
TTL Loads
Input Leakage
Current
I
I
V
CC
05.5-±0.1-±1-±1µA
and
GND
Quiescent Device
Current
Additional Quiescent
Device Current Per
I
CC
VCC or
05.5--2-20-40µA
GND
∆I
CC
V
CC
-2.1
-4.5 to
5.5
Input Pin: 1 Unit Load
(Note 4)
NOTE:
4. For dual-supply systems theorectical worst case (VI = 2.4V, VCC = 5.5V) specification is 1.8mA.
25oC-40oC TO 85oC-55oC TO 125oC
2-- 2 - 2 - V
--0.8-0.8-0.8V
-100360-450-490µA
UNITSVI(V)IO(mA)MINTYPMAXMINMAXMINMAX
HCT Input Loading Table
INPUTUNIT LOADS
All0.15
NOTE: Unit Load is ∆ICClimit specified in DC Electrical
Specifications table, e.g. 360µA max at 25oC.
Switching Specifications Input t
PARAMETERSYMBOL
HC TYPES
Propagation Delay,Input to
Output (Figure1)
PropagationDelay,DataInputto
Output Y
t
PLH
t
PLH
, tf = 6ns
r
, t
PHLCL
, t
PHLCL
TEST
CONDITIONS
= 50pF2--100-125-150ns
= 15pF5-8-----ns
V
CC
(V)
25oC-40oC TO 85oC -55oC TO 125oC
UNITSMIN TYP MAXMINMAXMINMAX
4.5--20-25-30ns
6--17-21-26ns
4
CD74HC20, CD74HCT20
Switching Specifications Input t
PARAMETERSYMBOL
Transition Times (Figure1)t
, tf = 6ns (Continued)
r
CONDITIONS
, t
TLH
THLCL
TEST
V
CC
(V)
= 50pF2--75-95-110ns
4.5--15-19-22ns
6--13-16-19ns
Input CapacitanceC
Power Dissipation Capacitance
C
I
PD
----10-10-10pF
- 5-26-----pF
(Notes 5, 6)
HCT TYPES
Propagation Delay, Input to
t
PLH
, t
PHLCL
= 50pF4.5--28-35-42ns
Output (Figure 2)
PropagationDelay,DataInputto
t
PLH
, t
PHLCL
= 15pF5-11-----ns
Output Y
Transition Times (Figure 2)t
Input CapacitanceC
Power Dissipation Capacitance
TLH
, t
I
C
PD
THLCL
= 50pF4.5--15-19-22ns
----10-10-10pF
- 5-38-----pF
(Notes 5, 6)
NOTES:
5. CPD is used to determine the dynamic power consumption, per gate.
6. PD = V
2
fi (CPD + CL) where fi = input frequency, CL = output load capacitance, VCC = supply voltage.
CC
25oC-40oC TO 85oC -55oC TO 125oC
UNITSMIN TYP MAXMINMAXMINMAX
Test Circuits and Waveforms
tr = 6nstf = 6ns
V
t
CC
GND
TLH
t
PHL
90%
50%
10%
t
90%
50%
10%
PLH
INPUT
t
INVERTING
OUTPUT
THL
FIGURE 1. HC AND HCU TRANSITION TIMES AND PROPAGA-
TION DELAY TIMES, COMBINATION LOGIC
= 6ns
t
PLH
t
f
1.3V
10%
90%
t
3V
GND
TLH
tr = 6ns
INPUT
t
INVERTING
OUTPUT
THL
t
2.7V
1.3V
0.3V
PHL
FIGURE 2. HCT TRANSITION TIMES AND PROPAGATION
DELAY TIMES, COMBINATION LOGIC
5
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accordance with TI’s standard warranty. Testing and other quality control techniques are utilized to the extent
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performed, except those mandated by government requirements.
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Copyright 1998, Texas Instruments Incorporated
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