The device is useful in a wide variety of shifting, counting
and storage applications. It performs serial, parallel, serial to
parallel, or parallel to serial data transfers at very high
speeds.
The two modes of operation, shift right (Q
load, are controlled by the state of the Parallel Enable (
input. Serial data enters the first flip-flop (Q
inputs when the
direction Q
transition. The J and K inputs provide the flexibility of the JKtype input for special applications and by tying the two pins
together, the simple D-type input for general applications.
The device appears as four common-clocked D flip-flops
when the
tion, data on the parallel inputs (D0-D3) is transferred to the
respective Q
be achieved by tying the Q
holding the
All parallel and serial data transfers are synchronous, occurring
after each Low to High clock transition. The CD74HC195 series
utilizes edge triggering; therefore, there is no restriction on the
activity of the J,
than set-up and hold time requirements. A Low on the
asynchronous Master Reset (
independent of any other input condition.
PE input is high, and is shifted one bit in the
0-Q1-Q2-Q3
PE input is Low. After the Low to High clock transi-
0-Q3
PE input low.
K, Pn and PE inputs for logic operations, other
following each Low to High clock
outputs. Shift left operation (Q3-Q2) can
outputs to the Dn-1 inputs and
n
MR) input sets all Q outputs Low,
) and parallel
0-Q1
) via the J and K
0
PE)
PInout
MR
D0
D1
D2
D3
GND
1
2
J
3
K
4
5
6
7
8
CD74HC195
(PDIP, SOIC)
TOP VIEW
Ordering Information
PKG.
PART NUMBER TEMP. RANGE (oC) PACKAGE
CD74HC195E-55 to 12516 Ld PDIPE16.3
16
V
CC
15
Q
0
14
Q
1
13
Q
2
12
Q
3
11
Q
3
10
CP
9
PE
CD74HC195M-55 to 12516 Ld SOICM16.15
NOTES:
1. When ordering, use the entire part number.
2. Die for this part number is available which meets all electrical
specifications. Please contact your local sales office or Harris
customer service for ordering information.
NO.
CAUTION: These devices are sensitive to electrostatic discharge. Users should follow proper IC Handling Procedures.
Copyright
Asynchronous ResetLXXXXXLLLLH
Shift, Set First StageH↑hhhX
H
Shift, Reset First StageH↑hllXLq0q
Shift, Toggle First StageH↑hhlXq
0
Shift, Retain First StageH↑hlhXq0q
Parallel LoadH↑lXXdnd0d
q
0
q
0
0
1
q
1
1
q
1
q
1
d
2
q
2
q
2
q
2
q
2
q
q
q
q
d3d2
2
2
2
2
NOTE: H = High Voltage Level
L = Low Voltage Level,
X = Don’t Care
↑ = Transition from Low to High Level
l = Low Voltage Level One Set-up Time Prior to the Low to High Clock Transition
h = Low Voltage Level One Set-up Time prior to the High to Low Clock Transition,
dn (qn) = Lower Case Letters Indicate the State of the Referenced Input (or output) One Set-up Time Prior to the Low to High Clock
Transition.
CAUTION: Stresses above those listed in “Absolute Maximum Ratings” may cause permanent damage to the device. This is a stress only rating and operation
of the device at these or any other conditions above those indicated in the operational sections of this specification is not implied.
NOTE:
3. θJA is measured with the component mounted on an evaluation PC board in free air.
FIGURE 3. J, K OR PARALLEL ENABLE PRE-REQUISITE TIMES
FIGURE 2. MASTER RESET PRE-REQUISITE AND
PROPAGATION DELAYS
VALID
V
V
S
t
h
0.5 V
CC
CC
GND
GND
5
IMPORTANT NOTICE
T exas Instruments and its subsidiaries (TI) reserve the right to make changes to their products or to discontinue
any product or service without notice, and advise customers to obtain the latest version of relevant information
to verify, before placing orders, that information being relied on is current and complete. All products are sold
subject to the terms and conditions of sale supplied at the time of order acknowledgement, including those
pertaining to warranty, patent infringement, and limitation of liability.
TI warrants performance of its semiconductor products to the specifications applicable at the time of sale in
accordance with TI’s standard warranty. Testing and other quality control techniques are utilized to the extent
TI deems necessary to support this warranty . Specific testing of all parameters of each device is not necessarily
performed, except those mandated by government requirements.
CERTAIN APPLICATIONS USING SEMICONDUCTOR PRODUCTS MAY INVOLVE POTENTIAL RISKS OF
DEATH, PERSONAL INJURY, OR SEVERE PROPERTY OR ENVIRONMENTAL DAMAGE (“CRITICAL
APPLICATIONS”). TI SEMICONDUCTOR PRODUCTS ARE NOT DESIGNED, AUTHORIZED, OR
WARRANTED TO BE SUITABLE FOR USE IN LIFE-SUPPORT DEVICES OR SYSTEMS OR OTHER
CRITICAL APPLICA TIONS. INCLUSION OF TI PRODUCTS IN SUCH APPLICATIONS IS UNDERST OOD TO
BE FULLY AT THE CUSTOMER’S RISK.
In order to minimize risks associated with the customer’s applications, adequate design and operating
safeguards must be provided by the customer to minimize inherent or procedural hazards.
TI assumes no liability for applications assistance or customer product design. TI does not warrant or represent
that any license, either express or implied, is granted under any patent right, copyright, mask work right, or other
intellectual property right of TI covering or relating to any combination, machine, or process in which such
semiconductor products or services might be or are used. TI’s publication of information regarding any third
party’s products or services does not constitute TI’s approval, warranty or endorsement thereof.
Copyright 1998, Texas Instruments Incorporated
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