• Significant Power Reduction Compared to LSTTL
Logic ICs
• HC Types
- 2V to 6V Operation
- High Noise Immunity: N
Pinout
= 50MHz at VCC = 5V, CL = 15pF, TA = 25oC
MAX
o
= 30%, NIH = 30% of V
IL
CD74HC166, CD74HCT166 (PDIP, SOIC)
GND
C to 125oC
CC
TOP VIEW
1
DS
2
D0
D1
3
D2
4
D3
5
6
CE
7
CP
8
CD74HCT166
High Speed CMOS Logic
8-Bit Parallel-In/Serial-Out Shift Register
at VCC = 5V
• HCT Types
- 4.5V to 5.5V Operation
- Direct LSTTL Input Logic Compatibility,
V
= 0.8V (Max), VIH = 2V (Min)
IL
- CMOS Input Compatibility, I
Ordering Information
TEMP. RANGE
PART NUMBER
CD74HC166E-55 to 12516 Ld PDIPE16.3
CD74HCT166E-55 to 12516 Ld PDIPE16.3
CD74HC166M-55 to 12516 Ld SOICM16.15
CD74HCT166M-55 to 12516 Ld SOICM16.15
CD54HC166W-55 to 125Wafer
NOTES:
1. When ordering,use the entire partnumber.Add the suffix 96 to
obtain the variant in the tape and reel.
2. Wafer and die is available which meets all electrical
specifications. Please contact your local sales office or Harris
customer service for ordering information.
V
16
CC
15
PE
14
D7
13
Q7
D6
12
D5
11
D4
10
9
MR
(oC)PACKAGE
≤ 1µA at VOL, V
l
OH
PKG.
NO.
CAUTION: These devices are sensitive to electrostatic discharge. Users should follow proper IC Handling Procedures.
Copyright
NOTES:
H = High Voltage Level
L = Low Voltage Level
X = Don’t Care
↑ = Transition from Low to High Level
a...h = The level of steady-state input at inputs D0 thru D7, respectively.
Q00, Q10, Q70 = The level of Q0, Q1, or Q7, respectively, before the indicated steady-state input conditions were established.
Q0n, Q6n = The level of Q0 or Q6, respectively, before the most recent ↑ transition of the clock.
CAUTION: Stresses above those listed in “Absolute Maximum Ratings” may cause permanent damage to the device. This is a stress only rating and operation
of the device at these or any other conditions above those indicated in the operational sections of this specification is not implied.
NOTE:
3. θJA is measured with the component mounted on an evaluation PC board in free air.
NOTE: Outputs should be switching from 10% VCC to 90% VCC in
accordance with device truth table. For f
, input duty cycle = 50%.
MAX
FIGURE 1. HC CLOCK PULSE RISE AND FALLTIMES AND
PULSE WIDTH
I
f
CL
50%
V
CC
GND
1.3V
I
fC
L
3V
GND
trCL= 6ns
CLOCK
0.3V
2.7V
1.3V
0.3V
t
fCL
t
WL
= 6ns
1.3V
t
WH
t
WL
+ tWH=
NOTE: Outputs should be switching from 10% VCC to 90% VCC in
accordance with device truth table. For f
, input duty cycle = 50%.
MAX
FIGURE 2. HCT CLOCK PULSE RISE AND FALLTIMES AND
PULSE WIDTH
6
CD74HC166, CD74HCT166
Test Circuits and Waveforms
(Continued)
tr = 6nstf = 6ns
V
t
CC
GND
TLH
INPUT
t
90%
50%
10%
THL
90%
t
PLH
50%
10%
INVERTING
OUTPUT
t
PHL
FIGURE 3. HC AND HCU TRANSITION TIMES AND PROPAGA-
TION DELAY TIMES, COMBINATION LOGIC
tfC
L
V
50%
GND
t
H(L)
V
50%
t
SU(L)
GND
CLOCK
INPUT
DAT A
INPUT
t
SU(H)
trC
L
90%
10%
t
H(H)
CC
CC
= 6ns
tr = 6ns
INPUT
t
2.7V
1.3V
0.3V
THL
t
f
3V
GND
t
TLH
90%
t
PLH
1.3V
10%
INVERTING
OUTPUT
t
PHL
FIGURE 4. HCT TRANSITION TIMES AND PROPAGATION
DELAY TIMES, COMBINATION LOGIC
CLOCK
INPUT
DAT A
INPUT
t
SU(H)
trC
L
2.7V
0.3V
t
H(H)
1.3V
1.3V
tfC
L
1.3V
t
H(L)
1.3V
t
SU(L)
3V
GND
3V
GND
OUTPUT
t
REM
V
CC
SET, RESET
OR PRESET
50%
90%
t
PLH
IC
t
TLH
t
THL
90%
50%
10%
t
PHL
GND
C
L
50pF
FIGURE 5. HC SETUP TIMES, HOLD TIMES, REMOVALTIME,
AND PROPAGATION DELAY TIMES FOR EDGE
TRIGGERED SEQUENTIAL LOGIC CIRCUITS
OUTPUT
t
REM
3V
SET, RESET
OR PRESET
1.3V
90%
1.3V
t
IC
t
PLH
TLH
t
THL
90%
1.3V
10%
t
PHL
GND
C
L
50pF
FIGURE 6. HCT SETUP TIMES, HOLD TIMES, REMOVAL TIME,
AND PROPAGATION DELAY TIMES FOR EDGE
TRIGGERED SEQUENTIAL LOGIC CIRCUITS
7
IMPORTANT NOTICE
T exas Instruments and its subsidiaries (TI) reserve the right to make changes to their products or to discontinue
any product or service without notice, and advise customers to obtain the latest version of relevant information
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pertaining to warranty, patent infringement, and limitation of liability.
TI warrants performance of its semiconductor products to the specifications applicable at the time of sale in
accordance with TI’s standard warranty. Testing and other quality control techniques are utilized to the extent
TI deems necessary to support this warranty . Specific testing of all parameters of each device is not necessarily
performed, except those mandated by government requirements.
CERTAIN APPLICATIONS USING SEMICONDUCTOR PRODUCTS MAY INVOLVE POTENTIAL RISKS OF
DEATH, PERSONAL INJURY, OR SEVERE PROPERTY OR ENVIRONMENTAL DAMAGE (“CRITICAL
APPLICATIONS”). TI SEMICONDUCTOR PRODUCTS ARE NOT DESIGNED, AUTHORIZED, OR
WARRANTED TO BE SUITABLE FOR USE IN LIFE-SUPPORT DEVICES OR SYSTEMS OR OTHER
CRITICAL APPLICA TIONS. INCLUSION OF TI PRODUCTS IN SUCH APPLICATIONS IS UNDERST OOD TO
BE FULLY AT THE CUSTOMER’S RISK.
In order to minimize risks associated with the customer’s applications, adequate design and operating
safeguards must be provided by the customer to minimize inherent or procedural hazards.
TI assumes no liability for applications assistance or customer product design. TI does not warrant or represent
that any license, either express or implied, is granted under any patent right, copyright, mask work right, or other
intellectual property right of TI covering or relating to any combination, machine, or process in which such
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party’s products or services does not constitute TI’s approval, warranty or endorsement thereof.
Copyright 1998, Texas Instruments Incorporated
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