• Significant Power Reduction Compared to LSTTL
Logic ICs
• HC Types
- 2V to 6V Operation
- High NoiseImmunity: N
V
= 5V
CC
= 30%, NIH= 30%of VCCat
IL
• HCT Types
- 4.5V to 5.5V Operation
- Direct LSTTL Input Logic Compatibility,
V
= 0.8V (Max), VIH = 2V (Min)
IL
- CMOS Input Compatibility, I
≤ 1µA at VOL, V
l
o
C to 125oC
OH
CD74HCT153
High Speed CMOS Logic
Dual 4-Input Multiplexer
Description
The Harris CD74HC153 and CD74HCT153 are dual 4 to line
selector/multiplexers which select one of 4 to 1 line
selector/multiplexers which select one of four sources for
each section by the common select inputs, S0 and S1. When
the enable inputs (1
LOW state.
Ordering Information
PART NUMBER TEMP. RANGE (oC) PACKAGE
CD74HC153E-55 to 12516 Ld PDIPE16.3
CD74HCT153E-55 to 12516 Ld PDIPE16.3
CD74HC153M-55 to 12516 Ld SOICM16.15
CD74HCT153M-55 to 12516 Ld SOICM16.15
CD54HC153W-55 to 125Wafer
NOTES:
1. When ordering, use the entire partnumber. Add the suffix 96 to
obtain the variant in the tape and reel.
2. Waferor die forthispart number isavailablewhich meets allelectrical specifications. Please contact your local sales office or
Harris customer service for ordering information.
E, 2E) are HIGH, the outputs are in the
PKG.
NO.
Pinout
CD74HC153, CD74HCT153
(PDIP, SOIC)
TOP VIEW
V
1
1E
2
S1
3
1I
3
4
1I
2
5
1I
1
6
1I
0
7
1Y
8
GND
CAUTION: These devices are sensitive to electrostatic discharge. Users should follow proper IC Handling Procedures.
Copyright
CAUTION: Stresses above those listed in “Absolute Maximum Ratings” may cause permanent damage to the device. This is a stress only rating and operation
of the device at these or any other conditions above those indicated in the operational sections of this specification is not implied.
NOTE:
3. θJA is measured with the component mounted on an evaluation PC board in free air.
Maximum Storage Temperature Range . . . . . . . . . .-65oC to 150oC
Maximum Lead Temperature (Soldering 10s) . . . . . . . . . . . . . 300oC
(SOIC - Lead Tips Only)
CC
DC Electrical Specifications
PARAMETERSYMBOL
HC TYPES
High Level Input
Voltage
Low Level Input
Voltage
High Level Output
Voltage
CMOS Loads
High Level Output
Voltage
TTL Loads
Low Level Output
Voltage
CMOS Loads
Low Level Output
Voltage
TTL Loads
Input Leakage
Current
Quiescent Device
Current
V
IH
V
IL
V
OH
V
OL
I
I
I
CC
TEST
CONDITIONS
(V)IO(mA)MINTYPMAXMINMAXMINMAX
I
V
CC
(V)
o
25
C-40oC TO 85oC -55oC TO 125oC
UNITSV
--21.5--1.5-1.5-V
4.53.15--3.15 -3.15-V
64.2--4.2-4.2-V
--2--0.5-0.5-0.5V
4.5--1.35-1.35-1.35V
6--1.8-1.8-1.8V
VIHor VIL-0.0221.9--1.9-1.9-V
-0.024.54.4--4.4 -4.4-V
-0.0265.9--5.9-5.9-V
- - ---- - - - V
-44.53.98--3.84-3.7-V
-5.265.48--5.34-5.2-V
VIHor VIL0.022--0.1-0.1-0.1V
0.024.5--0.1-0.1-0.1V
0.026--0.1-0.1-0.1V
- - ---- - - - V
44.5--0.26-0.33-0.4V
5.26--0.26-0.33-0.4V
VCC or
-6--±0.1-±1-±1µA
GND
VCC or
06--8-80-160µA
GND
3
CD74HC153, CD74HCT153
DC Electrical Specifications (Continued)
TEST
CONDITIONS
PARAMETERSYMBOL
HCT TYPES
High Level Input
Voltage
Low Level Input
V
IH
V
IL
Voltage
High Level Output
Voltage
V
OH
CMOS Loads
High Level Output
Voltage
TTL Loads
Low Level Output
V
OL
Voltage
CMOS Loads
Low Level Output
Voltage
TTL Loads
Input Leakage
Current
Quiescent Device
Current
Additional Quiescent
I
I
I
CC
∆I
CC
Device Current Per
Input Pin: 1 Unit Load
NOTE: For dual-supply systems theorectical worst case (V
(V)IO(mA)MINTYPMAXMINMAXMINMAX
I
--4.5 to
--4.5 to
VIHor VIL-0.024.54.4--4.4-4.4-V
-44.53.98--3.84-3.7-V
VIHor VIL0.024.5--0.1-0.1-0.1V
44.5--0.26-0.33-0.4V
VCCand
05.5--±0.1-±1-±1µA
GND
VCC or
05.5--8-80-160µA
GND
V
CC
-4.5 to
-2.1
o
C-40oC TO 85oC -55oC TO 125oC
V
CC
25
(V)
2--2- 2 - V
5.5
--0.8-0.8-0.8V
5.5
-100360-450-490µA
5.5
= 2.4V, VCC = 5.5V) specification is 1.8mA.
I
UNITSV
HCT Input Loading Table
INPUTUNIT LOADS
Data0.45
Enable0.6
Select1.35
NOTE: Unit Load is ∆ICClimit specified in DC Electrical Table, e.g.
360µA max at 25oC.
Switching Specifications Input t
PARAMETERSYMBOL
HC TYPES
Propagation Delay (Figure 1)t
S to Y4.5--32-40-48ns
I to Yt
, tf = 6ns
r
PLH,
t
PHL
PLH,
t
PHL
TEST
CONDITIONS
o
25
V
CC
C
-40oC TO
85oC
(V)
-55oC TO
125oC
CL= 50pF2--160-200-240ns
C
=15pF5-13-----ns
L
C
= 50pF6--27-34-41ns
L
CL= 50pF2--145-180-220ns
4.5--29-36-44ns
C
=15pF5-12-----ns
L
= 50pF6--25-31-38ns
C
L
UNITSMINTYPMAXMINMAXMINMAX
4
CD74HC153, CD74HCT153
Switching Specifications Input t
PARAMETERSYMBOL
E to Yt
, tf = 6ns (Continued)
r
TEST
CONDITIONS
CL= 50pF2-120-150-180ns
PLH,
t
PHL
o
25
V
CC
C
-40oC TO
85oC
-55oC TO
125oC
(V)
4.5-24-30-36ns
CL=15pF5-9-----ns
C
= 50pF6--20-26-31ns
L
Output Transition Time
(Figure 1)
t
TLH,tTHLCL
= 50pF2--75-95-110ns
4.5--15-19-22ns
6--13-16-19ns
Input CapacitanceC
Power Dissipation Capacitance
(Notes 4, 5)
IN
C
PD
----10-10-10pF
-5-45-----pF
HCT TYPES
Propagation Delay (Figure 2)t
S to YCL= 50pF4.5--34-43-51ns
I to Yt
I to Yt
E to Yt
Output Transition Timet
Input CapacitanceC
Power Dissipation Capacitance
(Notes 4, 5)
,
PLH
t
PHL
,
PLH
t
PHL
,
PLH
t
PHL
,
PLH
t
PHL
TLH,tTHLCL
IN
C
PD
=15pF5-14----ns
C
L
CL= 50pF4.5--24-30-36ns
C
=15pF5-9-----ns
L
CL= 50pF4.5-34-43-51ns
=15pF5-14-----ns
C
L
CL= 50pF4.5--27-34-41ns
C
=15pF5-11----ns
L
= 50pF4.5--15-19-22ns
----10-10-10pF
-5-45-----pF
NOTES:
4. C
is used to determine the dynamic power consumption, per multiplexer.
PD
5. PD = V
2
fi(CPD + CL) where fi = Input Frequency, CL = Output Load Capacitance, VCC = Supply Voltage.
CC
UNITSMINTYPMAXMINMAXMINMAX
Test Circuit and Waveform
OUTPUT Y
tr = 6ns
E
I OR S
t
PLH
FIGURE 1. PROPAGATION DELAY TIMES
5
tf = 6ns
t
PHL
90%
V
S
10%
V
S
IMPORTANT NOTICE
T exas Instruments and its subsidiaries (TI) reserve the right to make changes to their products or to discontinue
any product or service without notice, and advise customers to obtain the latest version of relevant information
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pertaining to warranty, patent infringement, and limitation of liability.
TI warrants performance of its semiconductor products to the specifications applicable at the time of sale in
accordance with TI’s standard warranty. Testing and other quality control techniques are utilized to the extent
TI deems necessary to support this warranty . Specific testing of all parameters of each device is not necessarily
performed, except those mandated by government requirements.
CERTAIN APPLICATIONS USING SEMICONDUCTOR PRODUCTS MAY INVOLVE POTENTIAL RISKS OF
DEATH, PERSONAL INJURY, OR SEVERE PROPERTY OR ENVIRONMENTAL DAMAGE (“CRITICAL
APPLICATIONS”). TI SEMICONDUCTOR PRODUCTS ARE NOT DESIGNED, AUTHORIZED, OR
WARRANTED TO BE SUITABLE FOR USE IN LIFE-SUPPORT DEVICES OR SYSTEMS OR OTHER
CRITICAL APPLICA TIONS. INCLUSION OF TI PRODUCTS IN SUCH APPLICATIONS IS UNDERST OOD TO
BE FULLY AT THE CUSTOMER’S RISK.
In order to minimize risks associated with the customer’s applications, adequate design and operating
safeguards must be provided by the customer to minimize inherent or procedural hazards.
TI assumes no liability for applications assistance or customer product design. TI does not warrant or represent
that any license, either express or implied, is granted under any patent right, copyright, mask work right, or other
intellectual property right of TI covering or relating to any combination, machine, or process in which such
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party’s products or services does not constitute TI’s approval, warranty or endorsement thereof.
Copyright 1998, Texas Instruments Incorporated
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