• SCR-Latchup-Resistant CMOS Process and Circuit
Design
• Speed of Bipolar FAST™/AS/S with Significantly
Reduced Power Consumption
• Balanced Propagation Delays
• AC Types Feature 1.5V to 5.5V Operation and
Balanced Noise Immunity at 30% of the Supply
• ±24mA Output Drive Current
- Fanout to 15 FAST™ ICs
Drives 50Ω Transmission Lines
Pinout
CD74AC257, CD74ACT257, CD74ACT258
(PDIP, SOIC)
TOP VIEW
AC/ACT257ACT258ACT258AC/ACT257
V
1I
1I
1Y
2I
2I
2Y
GND
S
0
1
0
1
1I
1I
1Y
2I
2I
2Y
GND
1
S
2
0
3
1
4
5
0
6
1
7
8
16
CC
15
OE
14
4I
0
13
4I
1
12
4Y
3I
11
0
10
3I
1
9
3Y
V
OE
4I
4I
4Y
3I
3I
3Y
CC
0
1
0
1
Description
The CD74AC257, CD74ACT257 and CD74ACT258 are
quad 2-input multiplexers with three-state outputs that utilize
the Harris Advanced CMOS Logic technology. Each of these
devices selects four bits of data from two sources under the
control of a common Select input (S). The Output Enable
(
OE) is active LOW. When OE is HIGH, all of the outputs (Y
or
Y) are in the high-impedance state regardless of all other
input conditions.
Moving data from two groups of registers to four common
output buses is a common use of the CD74AC257,
CD74ACT257 and CD74ACT258. The state of the Select
input determines the particular register from which the data
comes. The CD74AC257, CD74ACT257 and CD74ACT258
can also be used as function generators.
Ordering Information
PART
NUMBER
CD74AC257E0 to 70oC, -40 to 85,
CD74ACT257E0 to 70oC, -40 to 85,
CD74ACT258E0 to 70oC, -40 to 85,
CD74AC257M0 to 70oC, -40 to 85,
CD74ACT257M0 to 70oC, -40 to 85,
CD74ACT258M0 to 70oC, -40 to 85,
NOTES:
1. When ordering, use the entire part number. Add the suffix 96 to
obtain the variant in the tape and reel.
2. Waf erand die for this part number is available which meets all electrical specifications. Please contact your local sales office or Harris
customer service for ordering information.
TEMP.
RANGE (oC)PACKAGE
16 Ld PDIPE16.3
-55 to 125
16 Ld PDIPE16.3
-55 to 125
16 Ld PDIPE16.3
-55 to 125
16 Ld SOICM16.15
-55 to 125
16 Ld SOICM16.15
-55 to 125
16 Ld SOICM16.15
-55 to 125
PKG.
NO.
CAUTION: These devices are sensitive to electrostatic discharge. Users should follow proper IC Handling Procedures.
FAST™ is a Trademark of Fairchild Semiconductor.
CAUTION: Stresses above those listed in “Absolute Maximum Ratings” may cause permanent damage to the device. This is a stress only rating and operation
of the device at these or any other conditions above those indicated in the operational sections of this specification is not implied.
NOTES:
3. For up to 4 outputs per device, add ±25mA for each additional output.
4. Unless otherwise specified, all voltages are referenced to ground.
5. θJA is measured with the component mounted on an evaluation PC board in free air.
FIGURE 1. THREE-STATE PROPAGATION DELAY TIMES AND TEST CIRCUIT
6
nI
, nI1, S
0
Y
t
PLH
CD74AC257, CD74ACT257, CD74ACT258
= 3nstr = 3ns
t
f
90%
V
S
10%
t
PHL
V
S
INPUT
LEVEL
GND
INPUT LEVEL
S
t
PLH
Y
t
PHL
V
S
V
S
FIGURE 2. INPUTS OR SELECT TO OUTPUT PROPAGATION
DELAYS (AC/ACT257)
OUTPUT
R
(NOTE)
L
C
L
50pF
500Ω
DUT
OUTPUT
LOAD
NOTE: For AC Series Only: When VCC = 1.5V, RL = 1kΩ.
CD74ACCD74ACT
Input LevelV
Input Switching Voltage, V
Output Switching Voltage, V
S
S
0.5 V
0.5 V
CC
CC
CC
1.5V
0.5 V
FIGURE 4. PROPAGATION DELAY TIMES
FIGURE 3. SELECT TO OUTPUT PROPAGATION DELAYS
(ACT258)
3V
CC
7
IMPORTANT NOTICE
T exas Instruments and its subsidiaries (TI) reserve the right to make changes to their products or to discontinue
any product or service without notice, and advise customers to obtain the latest version of relevant information
to verify, before placing orders, that information being relied on is current and complete. All products are sold
subject to the terms and conditions of sale supplied at the time of order acknowledgement, including those
pertaining to warranty, patent infringement, and limitation of liability.
TI warrants performance of its semiconductor products to the specifications applicable at the time of sale in
accordance with TI’s standard warranty. Testing and other quality control techniques are utilized to the extent
TI deems necessary to support this warranty . Specific testing of all parameters of each device is not necessarily
performed, except those mandated by government requirements.
CERT AIN APPLICATIONS USING SEMICONDUCTOR PRODUCTS MAY INVOLVE POTENTIAL RISKS OF
DEATH, PERSONAL INJURY, OR SEVERE PROPERTY OR ENVIRONMENTAL DAMAGE (“CRITICAL
APPLICATIONS”). TI SEMICONDUCTOR PRODUCTS ARE NOT DESIGNED, AUTHORIZED, OR
WARRANTED TO BE SUITABLE FOR USE IN LIFE-SUPPORT DEVICES OR SYSTEMS OR OTHER
CRITICAL APPLICA TIONS. INCLUSION OF TI PRODUCTS IN SUCH APPLICATIONS IS UNDERST OOD TO
BE FULLY AT THE CUSTOMER’S RISK.
In order to minimize risks associated with the customer’s applications, adequate design and operating
safeguards must be provided by the customer to minimize inherent or procedural hazards.
TI assumes no liability for applications assistance or customer product design. TI does not warrant or represent
that any license, either express or implied, is granted under any patent right, copyright, mask work right, or other
intellectual property right of TI covering or relating to any combination, machine, or process in which such
semiconductor products or services might be or are used. TI’s publication of information regarding any third
party’s products or services does not constitute TI’s approval, warranty or endorsement thereof.
Copyright 1999, Texas Instruments Incorporated
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