• SCR-Latchup-Resistant CMOS Process and Circuit
Design
• Speed of Bipolar FAST™/AS/S with Significantly
Reduced Power Consumption
• Balanced Propagation Delays
• AC Types Feature 1.5V to 5.5V Operation and
Balanced Noise Immunity at 30% of the Supply
• ±24mA Output Drive Current
- Fanout to 15 FAST™ ICs
- Drives 50Ω Transmission Lines
= 5V, TA = 25oC, CL = 50pF
CC
Pinout
CD74AC00, CD74ACT00
(PDIP, SOIC)
TOP VIEW
1A
1B
1Y
2A
2B
2Y
GND
1
2
3
4
5
6
7
14
V
CC
4A
13
12
4B
11
4Y
10
3A
9
3B
8
3Y
CD74ACT00
Quad 2-Input NAND Gate
Description
The CD74AC00 and CD74ACT00 are quad 2-input NAND
gates that utilize the Harris Advanced CMOS Logic technology.
Ordering Information
PART
NUMBER
CD74AC00E-55 to 12514 Ld PDIPE14.3
CD74ACT00E-55 to 12514 Ld PDIPE14.3
CD74AC00M-55 to 12514 Ld SOICM14.15
CD74ACT00M-55 to 12514 Ld SOICM14.15
NOTES:
1. When ordering, use the entire part number. Add the suffix 96 to
obtain the variant in the tape and reel.
2. Waf erand die for this partnumber is available which meets all electrical specifications. Please contact your local sales office or Harris
customer service for ordering information.
Functional Diagram
1A
1B
2A
2B
3B
3A
4B
4A
ABY
LLH
HLH
LHH
HHL
TEMP.
RANGE (oC)PACKAGE
1
2
4
5
9
10
12
13
TRUTH TABLE
INPUTSOUTPUTS
3
6
8
11
GND = 7
V
CC
1Y
2Y
3Y
4Y
= 14
PKG.
NO.
CAUTION: These devices are sensitive to electrostatic discharge. Users should follow proper IC Handling Procedures.
FAST™ is a Trademark of Fairchild Semiconductor.
CAUTION: Stresses above those listed in “Absolute Maximum Ratings” may cause permanent damage to the device. This is a stress only rating and operation
of the device at these or any other conditions above those indicated in the operational sections of this specification is not implied.
NOTES:
3. For up to 4 outputs per device, add ±25mA for each additional output.
4. Unless otherwise specified, all voltages are referenced to ground.
5. θJA is measured with the component mounted on an evaluation PC board in free air.
AdditionalSupply Current per
Input Pin TTL Inputs High
I
CC
VCC or
05.5-4-40-80µA
GND
∆I
CC
V
-2.1
CC
-4.5 to
5.5
-2.4-2.8-3mA
1 Unit Load
NOTES:
6. Test one output at a time for a 1-second maximum duration. Measurement is made by forcing current and measuring voltage to minimize
power dissipation.
7. Test verifies a minimum 50Ω transmission-line-drive capability at 85
o
C, 75Ω at 125oC.
-40oC TO
85oC
-55oC TO
125oC
UNITSV
ACT Input Load Table
INPUTUNIT LOAD
All0.15
NOTE: Unit load is ∆ICClimit specified in DC ElectricalSpecifications
Table, e.g., 2.4mA max at 25oC.
3
CD74AC00, CD74ACT00
Switching Specifications Input t
PARAMETERSYMBOL V
, tf = 3ns, CL= 50pF (Worst Case)
r
(V)
CC
AC TYPES
Propagation Delay, Input to
Output
t
PLH
, t
PHL
1.5--83--91ns
3.3
2.7-9.32.6-10.2ns
(Note 9)
5
1.9-6.61.8-7.3ns
(Note 10)
Input CapacitanceC
Power Dissipation CapacitanceC
I
PD
-- -10- -10pF
--45--45-pF
(Note 11)
ACT TYPES
Propagation Delay, Input to
Output
Input CapacitanceC
Power Dissipation CapacitanceC
t
PHL
t
PLH
PD
5
(Note 10)
I
-- -10- -10pF
2.8-82.7-8ns
3.4-9.53.3-9.5ns
--45--45-pF
(Note 11)
NOTES:
8. Limits tested at 100%.
9. 3.3V Min at 3.6V, Max at 3V.
10. 5V Min at 5.5V, Max at 4.5V.
11. CPD is used to determine the dynamic power consumption per gate.
AC: PD = V
ACT: PD = V
2
fi(CPD + CL)
CC
2
fi(CPD + CL) + VCC∆ICC where fi = input frequency, CL = output load capacitance, VCC = supply voltage.
CC
-40oC TO 85oC-55oC TO 125oC
UNITSMINTYPMAXMINTYPMAX
OUTPUT
R
(NOTE)
L
DUT
OUTPUT
LOAD
500Ω
C
L
50pF
NOTE: For AC Series Only: When VCC = 1.5V, RL = 1kΩ.
CD74ACCD74ACT
Input LevelV
Input Switching Voltage, V
Output Switching Voltage, V
S
S
0.5 V
0.5 V
CC
CC
CC
FIGURE 1. PROPAGATION DELAY TIMES
3V
1.5V
0.5 V
CC
tr = 3ns
LEVEL
V
I
V
O
INPUT
= 3ns
t
f
t
PHL
t
PLH
FIGURE 2. WAVEFORMS
90%
V
S
10%
V
S
GND
4
IMPORTANT NOTICE
T exas Instruments and its subsidiaries (TI) reserve the right to make changes to their products or to discontinue
any product or service without notice, and advise customers to obtain the latest version of relevant information
to verify, before placing orders, that information being relied on is current and complete. All products are sold
subject to the terms and conditions of sale supplied at the time of order acknowledgement, including those
pertaining to warranty, patent infringement, and limitation of liability.
TI warrants performance of its semiconductor products to the specifications applicable at the time of sale in
accordance with TI’s standard warranty. Testing and other quality control techniques are utilized to the extent
TI deems necessary to support this warranty . Specific testing of all parameters of each device is not necessarily
performed, except those mandated by government requirements.
CERT AIN APPLICATIONS USING SEMICONDUCTOR PRODUCTS MAY INVOLVE POTENTIAL RISKS OF
DEATH, PERSONAL INJURY, OR SEVERE PROPERTY OR ENVIRONMENTAL DAMAGE (“CRITICAL
APPLICATIONS”). TI SEMICONDUCTOR PRODUCTS ARE NOT DESIGNED, AUTHORIZED, OR
WARRANTED TO BE SUITABLE FOR USE IN LIFE-SUPPORT DEVICES OR SYSTEMS OR OTHER
CRITICAL APPLICA TIONS. INCLUSION OF TI PRODUCTS IN SUCH APPLICATIONS IS UNDERST OOD TO
BE FULLY AT THE CUSTOMER’S RISK.
In order to minimize risks associated with the customer’s applications, adequate design and operating
safeguards must be provided by the customer to minimize inherent or procedural hazards.
TI assumes no liability for applications assistance or customer product design. TI does not warrant or represent
that any license, either express or implied, is granted under any patent right, copyright, mask work right, or other
intellectual property right of TI covering or relating to any combination, machine, or process in which such
semiconductor products or services might be or are used. TI’s publication of information regarding any third
party’s products or services does not constitute TI’s approval, warranty or endorsement thereof.
Copyright 1999, Texas Instruments Incorporated
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