• Significant Power Reduction Compared to LSTTL
Logic ICs
• HC Types
- 2V to 6V Operation
- High Noise Immunity: N
= 30%, NIH = 30% of V
IL
at VCC = 5V
• HCT Types
- 4.5V to 5.5V Operation
- Direct LSTTL Input Logic Compatibility,
V
= 0.8V (Max), VIH = 2V (Min)
IL
- CMOS Input Compatibility, I
≤ 1µA at VOL, V
l
o
C to 125oC
OH
Description
The Harris CD74HC283 and CD74HCT283 binary full
adders that add two 4-bit binary numbers and generate a
carry-out bit if the sum exceeds 15.
Because of the symmetry of the add function, this device
can be used with either all active-high operands (positive
logic) or with all active-low operands (negative logic). When
using positive logicthe carry-in input must be tied low if there
is no carry-in.
Ordering Information
PART NUMBER TEMP. RANGE (oC) PACKAGE
CD74HC283E-55 to 12516 Ld PDIPE16.3
CD74HCT283E-55 to 12516 Ld PDIPE16.3
CD74HC283M-55 to 12516 Ld SOICM16.15
CC
CD74HCT283M-55 to 12516 Ld SOICM16.15
NOTES:
1. When ordering, use the entire part number. Add the suffix 96 to
obtain the variant in the tape and reel.
2. Wafer and die is available which meets all electrical
specifications. Please contact your local sales office or Harris
customer service for ordering information.
PKG.
NO.
Pinout
CD74HC283, CD74HCT283
(PDIP, SOIC)
TOP VIEW
16
1
S1
2
B1
3
A1
4
S0
5
A0
6
B0
7
C
IN
8
GND
CAUTION: These devices are sensitive to electrostatic discharge. Users should follow proper IC Handling Procedures.
Copyright
CAUTION: Stresses above those listed in “Absolute Maximum Ratings” may cause permanent damage to the device. This is a stress only rating and operation
of the device at these or any other conditions above those indicated in the operational sections of this specification is not implied.
NOTE:
3. θJA is measured with the component mounted on an evaluation PC board in free air.
FIGURE 1. HC AND HCU TRANSITION TIMES AND PROPAGA-
TION DELAY TIMES, COMBINATION LOGIC
FIGURE 2. HCT TRANSITION TIMES AND PROPAGATION
DELAY TIMES, COMBINATION LOGIC
5
IMPORTANT NOTICE
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TI warrants performance of its semiconductor products to the specifications applicable at the time of sale in
accordance with TI’s standard warranty. Testing and other quality control techniques are utilized to the extent
TI deems necessary to support this warranty . Specific testing of all parameters of each device is not necessarily
performed, except those mandated by government requirements.
CERTAIN APPLICA TIONS USING SEMICONDUCT OR PRODUCTS MAY INVOLVE POTENTIAL RISKS OF
DEATH, PERSONAL INJURY, OR SEVERE PROPERTY OR ENVIRONMENTAL DAMAGE (“CRITICAL
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BE FULLY AT THE CUSTOMER’S RISK.
In order to minimize risks associated with the customer’s applications, adequate design and operating
safeguards must be provided by the customer to minimize inherent or procedural hazards.
TI assumes no liability for applications assistance or customer product design. TI does not warrant or represent
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Copyright 1998, Texas Instruments Incorporated
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