• Significant Power Reduction Compared to LSTTL
Logic ICs
• HC Types
- 2V to 6V Operation
- High Noise Immunity: N
at VCC = 5V
• HCT Types
- 4.5V to 5.5V Operation
- Direct LSTTL Input Logic Compatibility,
V
= 0.8V (Max), VIH = 2V (Min)
IL
- CMOS Input Compatibility, I
= 30%, NIH = 30% of V
IL
≤ 1µA at VOL, V
l
o
Applications
• Logical Comparators
• Parity Generators and Checkers
• Adders and Subtractors
C to 125oC
CC
OH
CD74HCT86
High Speed CMOS Logic
Quad 2-Input EXCLUSIVE OR Gate
Description
TheHarrisCD74HC86,CD74HCT86containfour
independent EXCLUSIVE OR gates in one package. They
providethesystemdesignerwithameansfor
implementation of theEXCLUSIVE OR function. Logic gates
utilize silicon gate CMOS technology to achieve operating
speeds similar to LSTTL gates with the low power
consumption of standard CMOS integrated circuits. All
devices havethe ability to drive 10 LSTTL loads. The 74HCT
logic family is functionally pin compatible with the standard
74LS logic family.
Ordering Information
TEMP.RANGE
PART NUMBER
CD74HC86E-55 to 12514 Ld PDIPE14.3
CD74HCT86E-55 to 12514 Ld PDIPE14.3
CD74HC86M-55 to 12514 Ld SOICM14.15
CD74HCT86M-55 to 12514 Ld SOICM14.15
CD54HC86W-55 to 125Wafer
CD54HCT86W-55 to 125Wafer
CD54HC86H-55 to 125Die
NOTE: Whenordering, use the entire part number.Addthe suffix 96
to obtain the variant in the tape and reel.
(oC)PACKAGE
PKG.
NO.
Pinout
CD74HC86, CD74HCT86
(PDIP, SOIC)
TOP VIEW
1A
1
2
1B
3
1Y
4
2A
5
2B
6
2Y
7
GND
CAUTION: These devices are sensitive to electrostatic discharge. Users should follow proper IC Handling Procedures.
Copyright
CAUTION: Stresses above those listed in “Absolute Maximum Ratings” may cause permanent damage to the device. This is a stress only rating and operation
of the device at these or any other conditions above those indicated in the operational sections of this specification is not implied.
NOTE:
1. θJA is measured with the component mounted on an evaluation PC board in free air.
Maximum Storage Temperature Range . . . . . . . . . .-65oC to 150oC
Maximum Lead Temperature (Soldering 10s). . . . . . . . . . . . .300oC
(SOIC - Lead Tips Only)
CC
DC Electrical Specifications
PARAMETERSYMBOL
HC TYPES
High Level Input
Voltage
Low Level Input
Voltage
High Level Output
Voltage
CMOS Loads
High Level Output
Voltage
TTL Loads
Low Level Output
Voltage
CMOS Loads
Low Level Output
Voltage
TTL Loads
Input Leakage
Current
Quiescent Device
Current
V
IH
V
IL
V
OH
V
OL
I
I
I
CC
TEST
CONDITIONS
25oC-40oC TO +85oC-55oC TO 125oC
VCC (V)
--21.5--1.5-1.5-V
4.53.15--3.15 -3.15-V
64.2--4.2-4.2-V
--2--0.5-0.5-0.5V
4.5--1.35-1.35-1.35V
6--1.8-1.8-1.8V
VIH or
V
-0.0221.9--1.9-1.9-V
IL
-0.024.54.4--4.4 -4.4-V
-0.0265.9--5.9-5.9-V
-44.53.98--3.84-3.7-V
-5.265.48--5.34-5.2-V
VIH or
V
0.022--0.1-0.1-0.1V
IL
0.024.5--0.1-0.1-0.1V
0.026--0.1-0.1-0.1V
44.5--0.26-0.33-0.4V
5.26--0.26-0.33-0.4V
VCC or
-6--±0.1-±1-±1µA
GND
VCC or
06--2-20-40µA
GND
UNITSVI(V)IO(mA)MINTYPMAXMINMAXMINMAX
3
CD74HC86, CD74HCT86
DC Electrical Specifications (Continued)
TEST
CONDITIONS
PARAMETERSYMBOL
VCC (V)
HCT TYPES
High Level Input
Voltage
Low Level Input
Voltage
High Level Output
Voltage
V
IH
--4.5 to
5.5
V
IL
--4.5 to
5.5
V
OH
VIH or
V
IL
-0.024.54.4--4.4-4.4-V
CMOS Loads
High Level Output
-44.53.98--3.84-3.7-V
Voltage
TTL Loads
Low Level Output
Voltage
V
OL
VIH or
V
IL
-0.024.5--0.1-0.1-0.1V
CMOS Loads
Low Level Output
44.5--0.26-0.33-0.4V
Voltage
TTL Loads
Input Leakage
Current
I
I
V
CC
05.5-±0.1-±1-±1µA
and
GND
Quiescent Device
Current
Additional Quiescent
Device Current Per
I
CC
VCC or
05.5--2-20-40µA
GND
∆I
CC
V
CC
-2.1
-4.5 to
5.5
Input Pin: 1 Unit Load
(Note 2)
NOTE:
2. For dual-supply systems theorectical worst case (VI = 2.4V, VCC = 5.5V) specification is 1.8mA.
25oC-40oC TO +85oC-55oC TO 125oC
2-- 2 - 2 - V
--0.8-0.8-0.8V
-100360-450-490µA
UNITSVI(V)IO(mA)MINTYPMAXMINMAXMINMAX
HCT Input Loading Table
INPUTUNIT LOADS
All1
NOTE: Unit Load is ∆ICClimit specified in DC Electrical
Specifications table, e.g. 360µA max at 25oC.
Switching Specifications Input t
PARAMETERSYMBOL
HC TYPES
Propagation Delay,Input to
Output (Figure 1)
PropagationDelay,DataInputto
Output Y
Transition Times (Figure 1)t
t
PLH
t
PLH
TLH
, tf = 6ns
r
, t
PHLCL
, t
PHLCL
, t
THLCL
TEST
CONDITIONS
= 50pF2--120-150-180ns
= 15pF5-9-----ns
= 50pF2--75-95-110ns
V
CC
(V)
25oC-40oC TO 85oC -55oC TO 125oC
UNITSMIN TYP MAXMINMAXMINMAX
4.5--24-30-36ns
6--20-26-31ns
4.5--15-19-22ns
6--13-16-19ns
4
CD74HC86, CD74HCT86
Switching Specifications Input t
PARAMETERSYMBOL
Input CapacitanceC
Power Dissipation Capacitance
, tf = 6ns (Continued)
r
TEST
CONDITIONS
I
C
PD
----10-10-10pF
- 5-22-----pF
V
CC
(V)
(Notes 3, 4)
HCT TYPES
Propagation Delay, Input to
t
PLH
, t
PHLCL
= 50pF4.5--32-40-48ns
Output (Figure 2)
PropagationDelay,DataInputto
t
PLH
, t
PHLCL
= 15pF5-13-----ns
Output Y
Transition Times (Figure 2)t
Input CapacitanceC
Power Dissipation Capacitance
TLH
, t
I
C
PD
THLCL
= 50pF4.5--15-19-22ns
----10-10-10pF
- 5-27-----pF
(Notes 3, 4)
NOTES:
3. CPD is used to determine the dynamic power consumption, per gate.
4. PD = V
2
fi (CPD + CL) where fi = input frequency, CL = output load capacitance, VCC = supply voltage.
CC
Test Circuits and Waveforms
25oC-40oC TO 85oC -55oC TO 125oC
UNITSMIN TYP MAXMINMAXMINMAX
tr = 6nstf = 6ns
V
t
CC
GND
TLH
INPUT
t
INVERTING
OUTPUT
THL
t
PHL
90%
50%
10%
t
90%
50%
10%
PLH
FIGURE 1. HC AND HCU TRANSITION TIMES AND PROPAGA-
TION DELAY TIMES, COMBINATION LOGIC
= 6ns
t
PLH
t
f
1.3V
10%
90%
t
3V
GND
TLH
tr = 6ns
INPUT
t
INVERTING
OUTPUT
THL
t
2.7V
1.3V
0.3V
PHL
FIGURE 2. HCT TRANSITION TIMES AND PROPAGATION
DELAY TIMES, COMBINATION LOGIC
5
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accordance with TI’s standard warranty. Testing and other quality control techniques are utilized to the extent
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Copyright 1998, Texas Instruments Incorporated
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