Data sheet acquired from Harris Semiconductor
SCHS210G
August 1997 - Revised June 2006
CD54HC4075, CD74HC4075,
CD54HCT4075, CD74HCT4075
High-Speed CMOS Logic
Triple 3-Input OR Gate
[ /Title
(CD74H
C4075,
CD74H
CT4075)
/Subject
(High
Speed
CMOS
Logic
Triple 3Input
Features
• Buffered Inputs
• Typical Propagation Delay: 8ns at V
C
= 15pF, TA = 25oC
L
• Fanout (Over Temperature Range)
- Standard Outputs. . . . . . . . . . . . . . . 10 LSTTL Loads
- Bus Driver Outputs . . . . . . . . . . . . . 15 LSTTL Loads
• Wide Operating Temperature Range . . . -55
• Balanced Propagation Delay and Transition Times
• Significant Power Reduction Compared to LSTTL
Logic ICs
• HC Types
- 2V to 6V Operation
- High Noise Immunity: N
at VCC = 5V
• HCT Types
- 4.5V to 5.5V Operation
- Direct LSTTL Input Logic Compatibility,
V
= 0.8V (Max), VIH = 2V (Min)
IL
- CMOS Input Compatibility, I
= 30%, NIH = 30% of V
IL
≤ 1µ A at VOL, V
l
CC
= 5V,
o
C to 125oC
OH
Description
The ’HC4075 and ’HCT4075 logic gates utilize silicon-gate
CMOS technology to achieve operating speeds similar to
LSTTL gates with the low power consumption of standard
CMOS integratedcircuits. All devices have the ability to drive
10 LSTTL loads. The HCT logic family is functionally pin
compatible with the standard LS logic family.
Ordering Information
TEMP. RANGE
CC
PART NUMBER
CD54HC4075F3A -55 to 125 14 Ld CERDIP
CD54HC4075FK -55 to 125 20 LCCC
CD54HCT4075F3A -55 to 125 14 Ld CERDIP
CD74HC4075E -55 to 125 14 Ld PDIP
CD74HC4075M -55 to 125 14 Ld SOIC
CD74HC4075MT -55 to 125 14 Ld SOIC
CD74HC4075M96 -55 to 125 14 Ld SOIC
CD74HC4075NSR -55 to 125 14 Ld SOP
CD74HC4075PW -55 to 125 14 Ld TSSOP
(oC) PACKAGE
CD74HC4075PWR -55 to 125 14 Ld TSSOP
CD74HC4075PWT -55 to 125 14 Ld TSSOP
CD74HCT4075E -55 to 125 14 Ld PDIP
NOTE: When ordering, use the entire part number. The suffixes 96
and R denote tape and reel. The suffix T denotes a small-quantity
reel of 250.
CAUTION: These devices are sensitive to electrostatic discharge. Users should follow proper IC Handling Procedures.
Copyright
© 2006, Texas Instruments Incorporated
1
Pinout
CD54HC4075, CD74HC4075, CD54HCT4075, CD74HCT4075
CD54HC4075, CD54HCT4075 (CERDIP)
CD74HC4075 (PDIP, SOIC, SOP, TSSOP)
CD74HCT4075 (PDIP)
TOP VIEW
1A
NC
2A
2B
1A
1B
1C
1Y
GND
1
2
3
4
5
6
7
14
13
12
11
10
9
8
SN54HC4075 (FK)
(TOP VIEW)
CC
NC
2B
2A
V
32 12 01 9
4
5
V
3C
3B
3A
3Y
2Y
2C
CC
3C
18
17
3B
NC
1B
NC
1C
6
7
8
91 0 1 11 21 3
1Y
GND
NC
2C
2Y
16
15
14
3A
NC
3Y
2
CD54HC4075, CD74HC4075, CD54HCT4075, CD74HCT4075
Functional Diagram
3
1A
1B
1C
2A
2B
2C
3A
3B
3C
4
5
1
2
8
11
12
13
6
1Y
9
2Y
10
3Y
GND = 7
= 14
V
CC
TRUTH TABLE
INPUTS OUTPUT
nA nB nC nY
Logic Diagram
LLLL
HXXH
XHXH
XXHH
H = High Voltage Level, L = Low Voltage Level, X = Irrelevant
nA
nB
nC
nY
3
CD54HC4075, CD74HC4075, CD54HCT4075, CD74HCT4075
Absolute Maximum Ratings Thermal Information
DC Supply Voltage, VCC. . . . . . . . . . . . . . . . . . . . . . . . -0.5V to 7V
DC Input Diode Current, I
IK
For VI < -0.5V or VI > VCC + 0.5V. . . . . . . . . . . . . . . . . . . . . .± 20mA
DC Output Diode Current, I
OK
For VO < -0.5V or VO > VCC + 0.5V . . . . . . . . . . . . . . . . . . . .± 20mA
DC Output Source or Sink Current per Output Pin, I
O
For VO > -0.5V or VO < VCC + 0.5V . . . . . . . . . . . . . . . . . . . .± 25mA
DC VCC or Ground Current, I
CC orIGND
. . . . . . . . . . . . . . . . . .± 50mA
Operating Conditions
Temperature Range (TA) . . . . . . . . . . . . . . . . . . . . . -55oC to 125oC
Supply Voltage Range, V
HC Types . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .2V to 6V
HCT Types . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .4.5V to 5.5V
DC Input or Output Voltage, VI, VO . . . . . . . . . . . . . . . . . 0V to V
Input Rise and Fall Time
2V . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 1000ns (Max)
4.5V. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 500ns (Max)
6V . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 400ns (Max)
CAUTION: Stresses above those listed in “Absolute Maximum Ratings” may cause permanent damage to the device. This is a stress only rating and operation
of the device at these or any other conditions above those indicated in the operational sections of this specification is not implied.
NOTE:
1. The package thermal impedance is calculated in accordance with JESD 51-7.
CC
Package Thermal Impedance, θ JA(see Note 1):
E (PDIP) Package . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .80oC/W
M (SOIC) Package. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .86oC/W
NS (SOP) Package . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 76oC/W
PW (TSSOP) Package . . . . . . . . . . . . . . . . . . . . . . . . . 113oC/W
Maximum Junction Temperature (Hermetic Package or Die) .175oC
Maximum Junction Temperature (Plastic Package) . . . . . . . . 150oC
Maximum Storage Temperature Range . . . . . . . . . .-65oC to 150oC
Maximum Lead Temperature (Soldering 10s). . . . . . . . . . . . .300oC
(SOIC - Lead Tips Only)
CC
DC Electrical Specifications
PARAMETER SYMBOL
HC TYPES
High Level Input
Voltage
Low Level Input
Voltage
High Level Output
Voltage
CMOS Loads
High Level Output
Voltage
TTL Loads
Low Level Output
Voltage
CMOS Loads
Low Level Output
Voltage
TTL Loads
Input Leakage
Current
Quiescent Device
Current
V
IH
V
IL
V
OH
V
OL
I
I
I
CC
TEST
CONDITIONS
(V) IO(mA) MIN TYP MAX MIN MAX MIN MAX
I
V
CC
(V)
o
25
C -40oC TO 85oC -55oC TO 125oC
UNITS V
- - 2 1.5 - - 1.5 - 1.5 - V
4.5 3.15 - - 3.15 - 3.15 - V
6 4.2 - - 4.2 - 4.2 - V
- - 2 - - 0.5 - 0.5 - 0.5 V
4.5 - - 1.35 - 1.35 - 1.35 V
6 - - 1.8 - 1.8 - 1.8 V
VIHor VIL-0.02 2 1.9 - - 1.9 - 1.9 - V
-0.02 4.5 4.4 - - 4.4 - 4.4 - V
-0.02 6 5.9 - - 5.9 - 5.9 - V
-4 4.5 3.98 - - 3.84 - 3.7 - V
-5.2 6 5.48 - - 5.34 - 5.2 - V
VIHor VIL0.02 2 - - 0.1 - 0.1 - 0.1 V
0.02 4.5 - - 0.1 - 0.1 - 0.1 V
0.02 6 - - 0.1 - 0.1 - 0.1 V
4 4.5 - - 0.26 - 0.33 - 0.4 V
5.2 6 - - 0.26 - 0.33 - 0.4 V
VCC or
-6--±0.1 - ±1-±1 µA
GND
VCC or
0 6 - - 2 - 20 - 40 µ A
GND
4
CD54HC4075, CD74HC4075, CD54HCT4075, CD74HCT4075
DC Electrical Specifications (Continued)
TEST
CONDITIONS
PARAMETER SYMBOL
HCT TYPES
High Level Input
Voltage
Low Level Input
V
IH
V
IL
Voltage
High Level Output
Voltage
V
OH
CMOS Loads
High Level Output
Voltage
TTL Loads
Low Level Output
V
OL
Voltage
CMOS Loads
Low Level Output
Voltage
TTL Loads
Input Leakage
Current
Quiescent Device
Current
Additional Quiescent
Device Current Per
I
I
I
CC
∆ I
CC
(Note 2)
Input Pin: 1 Unit Load
NOTE:
2. For dual-supply systems theoretical worst case (V
(V) IO(mA) MIN TYP MAX MIN MAX MIN MAX
I
- - 4.5 to
- - 4.5 to
VIHor VIL-0.02 4.5 4.4 - - 4.4 - 4.4 - V
VIHor VIL0.02 4.5 - - 0.1 - 0.1 - 0.1 V
VCCand
GND
VCC or
GND
V
CC
-2.1
o
C -40oC TO 85oC -55oC TO 125oC
V
CC
(V)
25
UNITS V
2--2- 2 - V
5.5
- - 0.8 - 0.8 - 0.8 V
5.5
-4 4.5 3.98 - - 3.84 - 3.7 - V
4 4.5 - - 0.26 - 0.33 - 0.4 V
0 5.5 - ± 0.1 - ± 1-± 1 µ A
0 5.5 - - 2 - 20 - 40 µ A
- 4.5 to
- 100 360 - 450 - 490 µ A
5.5
= 2.4V, VCC = 5.5V) specification is 1.8mA.
I
HCT Input Loading Table
INPUT UNIT LOADS
All 1.6
NOTE: Unit Load is ∆ ICClimit specified in DC Electrical Table, e.g.
360µ A max at 25oC.
Switching Specifications Input t
PARAMETER SYMBOL
HC TYPES
Propagation Delay,
Input to Output (Figure 1)
Transition Times (Figure 1) t
Input Capacitance C
r
t
PLH,tPHL
, t
TLH
THL
IN
, tf = 6ns
TEST
CONDITIONS VCC(V)
CL= 50pF 2 - - 100 - 125 - 150 ns
CL= 15pF 5 - 8 - - - - - ns
CL= 50pF 2 - - 75 - 95 - 110 ns
- - - - 10 - 10 - 10 pF
-40oC TO
25oC
85oC -55oC TO 125oC
UNITS MIN TYP MAX MIN MAX MIN MAX
4.5 - - 20 - 25 - 30 ns
6 - - 17 - 21 - 26 ns
4.5 - - 15 - 19 - 22 ns
6 - - 13 - 16 - 19 ns
5
Switching Specifications Input t
, tf = 6ns (Continued)
r
TEST
PARAMETER SYMBOL
Power Dissipation Capacitance
C
CONDITIONS VCC(V)
PD
-5 - 2 6 - - - - - p F
(Notes 3, 4)
HCT TYPES
Propagation Delay, Input to
Output (Figure 2)
Transition Times (Figure 2) t
Input Capacitance C
Power Dissipation Capacitance
t
PLH
TLH
, t
CL= 50pF 4.5 - - 24 - 30 - 36 ns
PHL
CL= 15pF 5 - 9 - - - - - ns
, t
IN
C
PD
CL= 50pF 4.5 - - 15 - 19 - 22 ns
THL
- - - - 10 - 10 - 10 pF
-5 - 2 8 - - - - - p F
(Notes 3, 4)
NOTES:
3. CPD is used to determine the dynamic power consumption, per gate.
4. PD = V
2
fi(CPD + CL) where fi = Input Frequency, CL = Output Load Capacitance, VCC = Supply Voltage.
CC
Test Circuits and Waveforms
25oC
-40oC TO
85oC -55oC TO 125oC
UNITS MIN TYP MAX MIN MAX MIN MAX
tr = 6ns tf = 6ns
V
t
TLH
CC
GND
INPUT
t
INVERTING
OUTPUT
THL
t
PHL
90%
50%
10%
t
90%
50%
10%
PLH
FIGURE 1. HC AND HCU TRANSITION TIMES AND PROPAGA-
TION DELAY TIMES, COMBINATION LOGIC
= 6ns
t
PLH
t
f
1.3V
10%
t
90%
3V
GND
TLH
tr = 6ns
INPUT
t
INVERTING
OUTPUT
THL
t
PHL
2.7V
1.3V
0.3V
FIGURE 2. HCT TRANSITION TIMES AND PROPAGATION
DELAY TIMES, COMBINATION LOGIC
6