Texas Instruments CD74HCT573M96, CD74HCT573M, CD74HCT573E, CD74HCT373M96, CD74HCT373M Datasheet

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1
Data sheet acquired from Harris Semiconductor SCHS182
Features
• Common Latch Enable Control
• Common Three-State Output Enable Control
• Buffered Inputs
• Three-State Outputs
• Typical Propagation Delay = 12ns at V
CC
= 5V,
C
L
= 15pF, TA = 25oC (Data to Output for HC373)
• Fanout (Over Temperature Range)
- Standard Outputs. . . . . . . . . . . . . . . 10 LSTTL Loads
- Bus Driver Outputs . . . . . . . . . . . . . 15 LSTTL Loads
• Wide Operating Temperature Range . . . -55
o
C to 125oC
• Balanced Propagation Delay and Transition Times
• Significant Power Reduction Compared to LSTTL Logic ICs
• HC Types
- 2V to 6V Operation
- High Noise Immunity: N
IL
= 30%, NIH = 30% of V
CC
at VCC = 5V
• HCT Types
- 4.5V to 5.5V Operation
- Direct LSTTL Input Logic Compatibility,
V
IL
= 0.8V (Max), VIH = 2V (Min)
- CMOS Input Compatibility, I
l
1µA at VOL, V
OH
Description
The Harris CD74HC373, CD74HCT373, CD54HC573, CD74HC573, and CD74HCT573 are high speed Octal Trans­parent Latches manufactured with silicon gate CMOS technol­ogy. They possess the low power consumption of standard CMOS integrated circuits, as well as the ability to drive 15 LSTTL devices. The CD74HCT373 and CD74HCT573 are functionally as well as pin compatible with the standard 74LS373 and 74LS573.
The outputs are transparent to the inputs when the latch enable (
LE) is high. When the latch enable (LE) goes low the
data is latched. The output enable (
OE) controls the three-
state outputs. When the output enable (
OE) is high the outputs are in the high impedance state. The latch operation is independent to the state of the output enable. The 373 and 573 are identical in function and differ only in their pinout arrangements.
Ordering Information
PART NUMBER
TEMP. RANGE
(oC) PACKAGE
PKG.
NO.
CD54HC573F -55 to 125 20 Ld CERDIP F20.3 CD74HC373E -55 to 125 20 Ld PDIP F20.3 CD74HCT373E -55 to 125 20 Ld PDIP E20.3 CD74HC573E -55 to 125 20 Ld PDIP E20.3 CD74HCT573E -55 to 125 20 Ld PDIP E20.3 CD74HC373M -55 to 125 20 Ld SOIC M20.3 CD74HCT373M -55 to 125 20 Ld SOIC M20.3 CD74HC573M -55 to 125 20 Ld SOIC M20.3 CD74HCT573M -55 to 125 20 Ld SOIC M20.3
NOTES:
1. When ordering, use the entire partnumber. Add the suffix 96 to obtain the variant in the tape and reel.
2. Wafer or die for this part number are available which meets all electrical specifications. Please contact your local sales office or Harris customer service for ordering information.
November 1997
CAUTION: These devices are sensitive to electrostatic discharge. Users should follow proper IC Handling Procedures. Copyright
© Harris Corporation 1997
CD74HC373, CD74HCT373,
CD54HC573, CD74HC573,
CD74HCT573
High Speed CMOS Logic
Octal Transparent Latch, Three-State Output
File Number 1679.1
[ /Title (CD74 HC373 , CD74 HCT37 3, CD54 HC573 , CD74 HC573 , CD74 HCT57
3) /Sub-
2
Pinout
CD74HC373, CD74HCT373
(PDIP, SOIC)
TOP VIEW
CD54HC573, CD74HC573, CD74HCT573
(PDIP, SOIC, CERDIP)
TOP VIEW
Functional Block Diagrams
CD74HC373, CD74HCT373, CD74HC573, CD74HCT573
CD74HCT573
11
12
13
14
15
16
17
18
20 19
10
9
8
7
6
5
4
3
2
1
OE
Q0 D0 D1 Q1 Q2
D3
D2
Q3
GND
V
CC
D7 D6 Q6
Q7
Q5 D5 D4 Q4 LE 11
12
13
14
15
16
17
18
20 19
10
9
8
7
6
5
4
3
2
1
OE
D0 D1 D2 D3 D4
D6
D5
D7
GND
V
CC
Q1 Q2 Q3
Q0
Q4 Q5 Q6 Q7 LE
O
0
D
0
LE
OE
O
1
D
1
O
2
D
2
O
3
D
3
O
4
D
4
O
5
D
5
O
6
D
6
O
7
D
7
D G
O
D G
O
D G
O
D G
O
D G
O
D G
O
D G
O
D G
O
O
0
D
0
LE
OE
O
1
D
1
O
2
D
2
O
3
D
3
O
4
D
4
O
5
D
5
O
6
D
6
O
7
D
7
D G
O
D G
O
D G
O
D G
O
D G
O
D G
O
D G
O
D
G
O
TRUTH TABLE
OUTPUT ENABLE LATCH ENABLE DATA OUTPUT
LHHH LHLL LLlL LLhH HXXZ
NOTE: H = High Voltage Level, L = Low VoltageLevel, X = Don’t Care, Z = High Impedance State, l = Low voltage level one set-up time prior to the high to low latch enable transition, h = High voltage level one set-up time prior to the high to low latch enable transition.
CD74HC373, CD74HCT373, CD54HC573, CD74HC573, CD74HCT573
3
Absolute Maximum Ratings Thermal Information
DC Supply Voltage, VCC. . . . . . . . . . . . . . . . . . . . . . . . -0.5V to 7V
DC Input Diode Current, I
IK
For VI < -0.5V or VI > VCC + 0.5V. . . . . . . . . . . . . . . . . . . . . .±20mA
DC Output Diode Current, I
OK
For VO < -0.5V or VO > VCC + 0.5V . . . . . . . . . . . . . . . . . . . .±20mA
DC Drain Current, per Output, I
O
For -0.5V < VO < VCC + 0.5V. . . . . . . . . . . . . . . . . . . . . . . . . .±35mA
DC Output Source or Sink Current per Output Pin, I
O
For VO > -0.5V or VO < VCC + 0.5V . . . . . . . . . . . . . . . . . . . .±25mA
DC VCC or Ground Current, ICC . . . . . . . . . . . . . . . . . . . . . . . . .±50mA
Operating Conditions
Temperature Range, TA . . . . . . . . . . . . . . . . . . . . . . -55oC to 125oC
Supply Voltage Range, V
CC
HC Types . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .2V to 6V
HCT Types . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .4.5V to 5.5V
DC Input or Output Voltage, VI, VO . . . . . . . . . . . . . . . . . 0V to V
CC
Input Rise and Fall Time
2V . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 1000ns (Max)
4.5V. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 500ns (Max)
6V . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 400ns (Max)
Thermal Resistance (Typical, Note 3). . . .θJA (oC/W) θJA(oC/W)
PDIP Package. . . . . . . . . . . . . . . . . . . 125 N/A
CERDIP Package . . . . . . . . . . . . . . . . 85 24
SOIC Package. . . . . . . . . . . . . . . . . . . 120 N/A
Maximum Junction Temperature (Plastic Package) . . . . . . . . 150oC
Maximum Storage Temperature Range . . . . . . . . . .-65oC to 150oC
Maximum Lead Temperature (Soldering 10s). . . . . . . . . . . . .300oC
(SOIC - Lead Tips Only)
CAUTION: Stresses above those listed in “Absolute Maximum Ratings” may cause permanent damage to the device. This is a stress only rating and operation of the device at these or any other conditions above those indicated in the operational sections of this specification is not implied.
NOTE:
3. θJA is measured with the component mounted on an evaluation PC board in free air.
DC Electrical Specifications
PARAMETER SYMBOL
TEST
CONDITIONS
VCC (V)
25
o
C -40oC TO 85oC -55oC TO 125oC
UNITSV
I
(V) IO(mA) MIN TYP MAX MIN MAX MIN MAX
HC TYPES
High Level Input Voltage
V
IH
- - 2 1.5 - - 1.5 - 1.5 - V
4.5 3.15 - - 3.15 - 3.15 - V 6 4.2 - - 4.2 - 4.2 - V
Low Level Input Voltage
V
IL
- - 2 - - 0.5 - 0.5 - 0.5 V
4.5 - - 1.35 - 1.35 - 1.35 V 6 - - 1.8 - 1.8 - 1.8 V
High Level Output Voltage CMOS Loads
V
OH
VIH or
V
IL
-0.02 2 1.9 - - 1.9 - 1.9 - V
-0.02 4.5 4.4 - - 4.4 - 4.4 - V
-0.02 6 5.9 - - 5.9 - 5.9 - V
High Level Output Voltage TTL Loads
-6 4.5 3.98 - - 3.84 - 3.7 - V
-7.8 6 5.48 - - 5.34 - 5.2 - V
Low Level Output Voltage CMOS Loads
V
OL
VIH or
V
IL
0.02 2 - - 0.1 - 0.1 - 0.1 V
0.02 4.5 - - 0.1 - 0.1 - 0.1 V
0.02 6 - - 0.1 - 0.1 - 0.1 V
Low Level Output Voltage TTL Loads
6 4.5 - - 0.26 - 0.33 - 0.4 V
7.8 6 - - 0.26 - 0.33 - 0.4 V
Input Leakage Current
I
I
VCC or
GND
-6--±0.1 - ±1-±1µA
Quiescent Device Current
I
CC
VCC or
GND
0 6 - - 8 - 80 - 160 µA
CD74HC373, CD74HCT373, CD54HC573, CD74HC573, CD74HCT573
4
Three-State Leakage Current
-V
IL
or
V
IH
VO =
VCCor
GND
6--±0.5 - ±5-±10 µA
HCT TYPES
High Level Input Voltage
V
IH
- - 4.5 to
5.5
2-- 2 - 2 - V
Low Level Input Voltage
V
IL
- - 4.5 to
5.5
- - 0.8 - 0.8 - 0.8 V
High Level Output Voltage CMOS Loads
V
OH
VIH or
V
IL
-0.02 4.5 4.4 - - 4.4 - 4.4 - V
High Level Output Voltage TTL Loads
-6 4.5 3.98 - - 3.84 - 3.7 - V
-7.8 6 5.48 - - 5.34 - 5.2 - V
Low Level Output Voltage CMOS Loads
V
OL
VIH or
V
IL
0.02 4.5 - - 0.1 - 0.1 - 0.1 V
Low Level Output Voltage TTL Loads
6 4.5 - - 0.26 - 0.33 - 0.4 V
7.8 6 - - 0.26 - 0.33 - 0.4 V
Input Leakage Current
I
I
VCC to
GND
- 5.5 - - ±0.1 - ±1-±1µA
Quiescent Device Current
I
CC
VCC or
GND
0 5.5 - - 8 - 80 - 160 µA
Three-State Leakage Current
-V
IL
or
V
IH
VO =
VCCor
GND
6--±0.5 - ±5-±10 µA
Additional Quiescent Device Current Per Input Pin: 1 Unit Load (Note 4)
I
CC
V
CC
-2.1
- 4.5 to
5.5
- 100 360 - 450 - 490 µA
NOTE:
4. For dual-supply systems theoretical worst case (V
I
= 2.4V, VCC = 5.5V) specification is 1.8mA.
DC Electrical Specifications (Continued)
PARAMETER SYMBOL
TEST
CONDITIONS
VCC (V)
25
o
C -40oC TO 85oC -55oC TO 125oC
UNITSV
I
(V) IO(mA) MIN TYP MAX MIN MAX MIN MAX
HCT Input Loading Table
INPUT
UNIT LOADS
HCT373 HCT573
OE 1.5 1.25 Dn 0.4 0.3 LE 0.6 0.65
NOTE: Unit Load is ICClimit specified in DC Electrical Specifica­tions table, e.g., 360µA max at 25oC.
CD74HC373, CD74HCT373, CD54HC573, CD74HC573, CD74HCT573
5
Prerequisite For Switching Specifications
PARAMETER SYMBOL
TEST
CONDITIONS
V
CC
(V)
25
o
C -40oC TO 85oC -55oCTO125oC
UNITSMIN TYP MAX MIN MAX MIN MAX
HC TYPES
LE Pulse Width t
W
- 2 80 - - 100 - 120 - ns
4.5 16 - - 20 - 24 - ns 6 14 - - 17 - 20 - ns
Set-up Time Data to
LE t
SU
- 2 50 - - 65 - 75 - ns
4.5 10 - - 13 - 15 - ns 6 9 - - 11 - 13 - ns
Hold Time, Data to
LE
(573)
t
H
- 2 40 - - 50 - 60 - ns
4.5 8 - - 10 - 12 - ns 6 7 - - 9 - 10 - ns
Hold Time, Data to
LE
(373)
t
H
-25--5-5-ns
4.5 5 - - 5 - 5 - ns 65--5-5-ns
HCT TYPES
LE Pulse Width t
w
- 4.5 16 - - 20 - 24 - ns
Set-up Time Data to
LE t
w
- 4.5 13 - - 16 - 20 - ns
Hold Time, Data to
LE t
H
- 4.5 10 - - 13 - 15 - ns
Switching Specifications Input t
r
, tf = 6ns
PARAMETER SYMBOL
TEST
CONDITIONS V
CC
(V)
25oC -40oC TO 85oC
-55oC TO 125oC
UNITSTYP MAX MAX MAX
HC TYPES
Propagation Delay, Data to Qn (HC/HCT373)
t
PLH
, t
PHLCL
= 50pF 2 - 150 190 225 ns
4.5 - 30 38 45 ns 6 - 26 33 38 ns
CL= 15pF 5 12 - - - ns
Propagation Delay, Data to Qn (HC/HCT573)
t
PLH,tPHLCL
= 50pF 2 - 175 220 265 ns
4.5 - 35 44 53 ns 6 - 30 37 45 ns
CL= 15pF 5 14 - - - ns
Propagation Delay, LE to Qn
t
PLH,tPHLCL
= 50pF 2 - 175 220 265 ns
4.5 - 35 44 53 ns 6 - 30 37 45 ns
CL= 15pF 5 14 - - - ns
CD74HC373, CD74HCT373, CD54HC573, CD74HC573, CD74HCT573
6
Output Enabling Time t
PZL,tPZHCL
= 50pF 2 - 150 190 225 ns
4.5 - 30 38 45 ns 6 - 26 33 38 ns
CL= 15pF 5 12 - - - ns
Output Disabling Time t
PLZ,tPHZCL
= 50pF 2 - 150 190 225 ns
4.5 - 30 38 45 ns 6 - 26 33 38 ns
CL= 15pF 5 12 - - - ns
Output Transition Time t
TLH
, t
THLCL
= 50pF 2 - 60 75 90 ns
4.5 - 12 15 18 ns 6 - 10 13 15 ns
Input Capacitance C
I
---1010 10pF
Three-State Output Capacitance
C
O
---2020 20pF
Power Dissipation Capacitance (Notes 5, 6)
C
PD
- 5 51 - - - pF
HCT TYPES
Propagation Delay, Data to Qn (HC/HCT373)
t
PLH
, t
PHLCL
= 50pF 4.5 - 32 40 48 ns
CL= 15pF 5 13 - - - ns
Propagation Delay, Data to Qn (HC/HCT573)
t
PLH
, t
PHLCL
= 50pF 4.5 - 35 44 53 ns
CL= 15pF 5 17 - - - ns
Propagation Delay, LE to Qn
t
PLH
, t
PHLCL
= 50pF 4.5 - 35 44 53 ns
CL= 15pF 5 14 - - - ns
Output Enabling Time t
PZL
, t
PZHCL
= 50pF 4.5 - 35 44 53 ns
CL= 15pF 5 14 - - - ns
Output Disabling Time t
PLZ
, t
PZHCL
= 50pF 4.5 - 35 44 53 ns
CL= 15pF 5 14 - - - ns
Output Transition Time t
TLH
, t
THLCL
= 50pF 4.5 - 12 15 18 ns
Input Capacitance C
I
---1010 10pF
Three-State Output Capacitance
C
O
---2020 20pF
Power Dissipation Capacitance (Notes 5, 6)
C
PD
- 5 53 - - - pF
NOTES:
5. CPD is used to determine the no-load dynamic power consumption, per latch.
6. PD (total power per latch) = V
CC
2
fi (CPD + CL) where fi = Input Frequency, CL = Output Load Capacitance, VCC = Supply Voltage.
Switching Specifications Input t
r
, tf = 6ns (Continued)
PARAMETER SYMBOL
TEST
CONDITIONS V
CC
(V)
25oC -40oC TO 85oC
-55oC TO 125oC
UNITSTYP MAX MAX MAX
CD74HC373, CD74HCT373, CD54HC573, CD74HC573, CD74HCT573
7
Test Circuits and Waveforms
NOTE: Outputs should be switching from 10% VCC to 90% VCC in accordance with device truth table.For f
MAX
, input duty cycle = 50%.
FIGURE 1. HC CLOCK PULSE RISE AND FALL TIMES AND
PULSE WIDTH
NOTE: Outputs should be switching from 10% VCC to 90% VCC in accordance with device truth table.For f
MAX
, input duty cycle = 50%.
FIGURE 2. HCT CLOCK PULSE RISE AND FALL TIMES AND
PULSE WIDTH
FIGURE 3. HC TRANSITION TIMES AND PROPAGATION
DELAY TIMES, COMBINATION LOGIC
FIGURE 4. HCT TRANSITION TIMES AND PROPAGATION
DELAY TIMES, COMBINATION LOGIC
FIGURE 5. HC SETUP TIMES, HOLD TIMES, REMOVALTIME,
AND PROPAGATION DELAY TIMES FOR EDGE TRIGGERED SEQUENTIAL LOGIC CIRCUITS
FIGURE 6. HCT SETUP TIMES, HOLD TIMES, REMOVALTIME,
AND PROPAGATION DELAY TIMES FOR EDGE TRIGGERED SEQUENTIAL LOGIC CIRCUITS
CLOCK
90%
50%
10%
GND
V
CC
trC
L
tfC
L
50%
50%
t
WL
t
WH
10%
tWL+ tWH=
fC
L
I
CLOCK
2.7V
1.3V
0.3V
GND
3V
t
rCL
= 6ns
t
fCL
= 6ns
1.3V
1.3V
t
WL
t
WH
0.3V
t
WL
+ tWH=
fC
L
I
t
PHL
t
PLH
t
THL
t
TLH
90% 50% 10%
50%
10%
INVERTING
OUTPUT
INPUT
GND
V
CC
tr = 6ns tf = 6ns
90%
t
PHL
t
PLH
t
THL
t
TLH
2.7V
1.3V
0.3V
1.3V
10%
INVERTING
OUTPUT
INPUT
GND
3V
tr = 6ns
t
f
= 6ns
90%
trC
L
tfC
L
GND
V
CC
GND
V
CC
50%
90%
10%
GND
CLOCK
INPUT
DAT A
INPUT
OUTPUT
SET, RESET OR PRESET
V
CC
50%
50%
90%
10%
50%
90%
t
REM
t
PLH
t
SU(H)
t
TLH
t
THL
t
H(L)
t
PHL
IC
C
L
50pF
t
SU(L)
t
H(H)
trC
L
tfC
L
GND
3V
GND
3V
1.3V
2.7V
0.3V
GND
CLOCK
INPUT
DAT A
INPUT
OUTPUT
SET, RESET OR PRESET
3V
1.3V
1.3V
1.3V
90%
10%
1.3V
90%
t
REM
t
PLH
t
SU(H)
t
TLH
t
THL
t
H(L)
t
PHL
IC
C
L
50pF
t
SU(L)
1.3V
t
H(H)
1.3V
CD74HC373, CD74HCT373, CD54HC573, CD74HC573, CD74HCT573
8
FIGURE 7. HC THREE-STATE PROPAGATION DELAY
WAVEFORM
FIGURE 8. HCT THREE-STATE PROPAGATION DELAY
WAVEFORM
NOTE: Open drain waveformst
PLZ
and t
PZL
are the same as those for three-state shown on the left. The test circuit is Output RL=1kΩto
VCC, CL = 50pF.
FIGURE 9. HC AND HCT THREE-STATE PROPAGATION DELAY TEST CIRCUIT
Test Circuits and Waveforms
(Continued)
50%
10%
90%
GND
V
CC
10%
90%
50%
50%
OUTPUT
DISABLE
OUTPUT LOW
TO OFF
OUTPUT HIGH
TO OFF
OUTPUTS ENABLED
OUTPUTS
DISABLED
OUTPUTS ENABLED
6ns 6ns
t
PZH
t
PHZ
t
PZL
t
PLZ
0.3
2.7
GND
3V
10%
90%
1.3V
1.3V
OUTPUT
DISABLE
OUTPUT LOW
TO OFF
OUTPUT HIGH
TO OFF
OUTPUTS ENABLED
OUTPUTS
DISABLED
OUTPUTS ENABLED
t
r
6ns
t
PZH
t
PHZ
t
PZL
t
PLZ
6ns t
f
1.3
IC WITH
THREE-
STATE
OUTPUT
OTHER
INPUTS
TIED HIGH
OR LOW
OUTPUT
DISABLE
VCC FOR t
PLZ
AND t
PZL
GND FOR t
PHZ
AND t
PZH
OUTPUT
R
L
= 1k
C
L
50pF
CD74HC373, CD74HCT373, CD54HC573, CD74HC573, CD74HCT573
IMPORTANT NOTICE
T exas Instruments and its subsidiaries (TI) reserve the right to make changes to their products or to discontinue any product or service without notice, and advise customers to obtain the latest version of relevant information to verify, before placing orders, that information being relied on is current and complete. All products are sold subject to the terms and conditions of sale supplied at the time of order acknowledgement, including those pertaining to warranty, patent infringement, and limitation of liability.
TI warrants performance of its semiconductor products to the specifications applicable at the time of sale in accordance with TI’s standard warranty. Testing and other quality control techniques are utilized to the extent TI deems necessary to support this warranty. Specific testing of all parameters of each device is not necessarily performed, except those mandated by government requirements.
CERT AIN APPLICATIONS USING SEMICONDUCTOR PRODUCTS MAY INVOLVE POTENTIAL RISKS OF DEATH, PERSONAL INJURY, OR SEVERE PROPERTY OR ENVIRONMENTAL DAMAGE (“CRITICAL APPLICATIONS”). TI SEMICONDUCTOR PRODUCTS ARE NOT DESIGNED, AUTHORIZED, OR WARRANTED TO BE SUITABLE FOR USE IN LIFE-SUPPORT DEVICES OR SYSTEMS OR OTHER CRITICAL APPLICATIONS. INCLUSION OF TI PRODUCTS IN SUCH APPLICA TIONS IS UNDERST OOD TO BE FULLY AT THE CUSTOMER’S RISK.
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Copyright 1999, Texas Instruments Incorporated
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