Speed of Bipolar F, AS, and S, With
Significantly Reduced Power Consumption
D
Balanced Propagation Delays
D
±24-mA Output Drive Current
– Fanout to 15 F Devices
D
SCR-Latchup-Resistant CMOS Process and
Circuit Design
D
Exceeds 2-kV ESD Protection Per
CD54ACT32 ...F PACKAGE
CD74ACT32 ...E OR M PACKAGE
1A
1B
1Y
2A
2B
2Y
GND
(TOP VIEW)
1
14
2
13
3
12
4
11
5
10
6
7
9
8
V
4B
4A
4Y
3B
3A
3Y
CC
MIL-STD-883, Method 3015
description/ordering information
The ’ACT32 devices are quadruple 2-input positive-OR gates. These devices perform the Boolean function
Y+A
• B or Y+A)B in positive logic.
ORDERING INFORMA TION
T
A
PDIP – ETubeCD74ACT32ECD74ACT32E
°
–
†
Package drawings, standard packing quantities, thermal data, symbolization, and PCB design guidelines
are available at www.ti.com/sc/package.
°
CDIP – FTubeCD54ACT32F3ACD54ACT32F3A
PACKAGE
–
†
TubeCD74ACT32M
Tape and reelCD74ACT32M96
ORDERABLE
PART NUMBER
TOP-SIDE
MARKING
logic diagram (positive logic)
Please be aware that an important notice concerning availability, standard warranty, and use in critical applications of
Texas Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet.
FUNCTION TABLE
(each gate)
INPUTS
AB
HXH
XHH
LLL
A
B
OUTPUT
Y
Y
PRODUCTION DATA information is current as of publication date.
Products conform to specifications per the terms of Texas Instruments
standard warranty. Production processing does not necessarily include
testing of all parameters.
POST OFFICE BOX 655303 • DALLAS, TEXAS 75265
Copyright 2003, Texas Instruments Incorporated
On products compliant to MIL-PRF-38535, all parameters are tested
unless otherwise noted. On all other products, production
processing does not necessarily include testing of all parameters.
absolute maximum ratings over operating free-air temperature range (unless otherwise noted)
Supply voltage range, V
Input clamp current, I
Output clamp current, I
Continuous output current, I
Continuous current through V
Package thermal impedance, θ
Stresses beyond those listed under “absolute maximum ratings” may cause permanent damage to the device. These are stress ratings only, and
functional operation of the device at these or any other conditions beyond those indicated under “recommended operating conditions” is not
implied. Exposure to absolute-maximum-rated conditions for extended periods may affect device reliability.
NOTES: 1. The input and output voltage ratings may be exceeded if the input and output current ratings are observed.
2. The package thermal impedance is calculated in accordance with JESD 51-7.
Implications of Slow or Floating CMOS Inputs, literature number SCBA004.
CC
CC
–40°C to
85°C
0V
0V
CC
CC
UNIT
V
V
2
POST OFFICE BOX 655303 • DALLAS, TEXAS 75265
CC
V
V
V
or V
V
V
V
V
or V
V
(INPUT)
(OUTPUT)
A or B
Y
ns
CD54ACT32, CD74ACT32
QUADRUPLE 2-INPUT POSITIVE-OR GATES
SCHS342 – MARCH 2003
electrical characteristics over recommended operating free-air temperature range (unless
otherwise noted)
PARAMETERTEST CONDITIONSV
IOH = –50 µA4.5 V4.44.44.4
=
OH
OL
I
I
I
CC
‡
D
I
CC
C
†
‡
i
T est one output at a time, not exceeding 1-second duration. Measurement is made by forcing indicated current and measuring voltage to minimize
power dissipation. T est verifies a minimum 50-Ω transmission-line drive capability at 85°C and 75-Ω transmission-line drive capability at 125°C.
Additional quiescent supply current per input pin, TTL inputs high, 1 unit load
I
IH
IL
=
I
IH
IL
VI = VCC or GND5.5 V±0.1±1±1µA
VI = VCC or GND,IO = 05.5 V48040µA
VI = VCC – 2.1 V
IOH = –24 mA4.5 V3.943.73.8
IOH = –50 mA
IOH = –75 mA
IOL = 50 µA4.5 V0.10.10.1
IOL = 24 mA4.5 V0.360.50.44
IOL = 50 mA
IOL = 75 mA
†
5.5 V3.85
†
5.5 V3.85
†
†
5.5 V1.65
5.5 V1.65
4.5 V to
5.5 V
TA = 25°C
MINMAXMINMAXMINMAX
–55°C to
125°C
2.432.8mA
101010pF
–40°C to
85°C
UNIT
ACT INPUT LOAD TABLE
INPUT
All0.42
Unit Load is ∆ICC limit specified in
electrical characteristics table
(e.g., 2.4 mA at 25°C).
UNIT LOAD
switching characteristics over recommended operating free-air temperature range,
= 5 V ± 0.5 V, CL = 50 pF (unless otherwise noted) (see Figure 1)
NOTES: A. CL includes probe and test-fixture capacitance.
B. Waveform 1 is for an output with internal conditions such that the output is low except when disabled by the output control.
Waveform 2 is for an output with internal conditions such that the output is high except when disabled by the output control.
C. All input pulses are supplied by generators having the following characteristics: PRR ≤ 1 MHz, ZO = 50 Ω, tr = 3 ns, tf = 3 ns.
Phase relationships between waveforms are arbitrary.
D. For clock inputs, f
E. The outputs are measured one at a time with one input transition per measurement.
F. t
G. t
H. t
and t
PLH
PZL
PLZ
I. All parameters and waveforms are not applicable to all devices.
and t
and t
PHL
PZH
PHZ
is measured with the input duty cycle at 50%.
max
are the same as tpd.
are the same as ten.
are the same as t
dis
.
Figure 1. Load Circuit and Voltage Waveforms
4
POST OFFICE BOX 655303 • DALLAS, TEXAS 75265
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