A True System-on-Chip Solution for 2.4-GHz IEEE 802.15.4 and ZigBee Applications
Check for Samples: CC2530F32, CC2530F64, CC2530F128, CC2530F256
1
FEATURES
2345
• RF/Layout
– 2.4-GHz IEEE 802.15.4 Compliant RF
– IEEE 802.15.4 MAC Timer, General-Purpose
Timers (One 16-Bit, Two 8-Bit)
– IR Generation Circuitry
Transceiver– 32-kHz Sleep Timer With Capture
– Excellent Receiver Sensitivity and– CSMA/CA Hardware Support
Robustness to Interference
– Programmable Output Power Up to 4.5 dBm
– Very Few External Components
– Accurate Digital RSSI/LQI Support
– Battery Monitor and Temperature Sensor
– 12-Bit ADC With Eight Channels and
– Only a Single Crystal Needed forConfigurable Resolution
Asynchronous Networks
– 6-mm × 6-mm QFN40 Package
– AES Security Coprocessor
– Two Powerful USARTs With Support for
– Suitable for Systems Targeting ComplianceSeveral Serial Protocols
With Worldwide Radio-Frequency
Regulations: ETSI EN 300 328 and EN 300
440 (Europe), FCC CFR47 Part 15 (US) and
ARIB STD-T-66 (Japan)
•Low Power
– Active-Mode RX (CPU Idle): 24 mA
– Active Mode TX at 1 dBm (CPU Idle): 29 mA
– Power Mode 1 (4 μs Wake-Up): 0.2 mA
– Power Mode 2 (Sleep Timer Running): 1 μA
– Power Mode 3 (External Interrupts): 0.4 μA
– Wide Supply-Voltage Range (2 V–3.6 V)
– 21 General-Purpose I/O Pins
(19 × 4 mA, 2 × 20 mA)
– Watchdog Timer
•Development Tools
– CC2530 Development Kit
– CC2530 ZigBee®Development Kit
– CC2530 RemoTI™ Development Kit for
RF4CE
– SmartRF™ Software
– Packet Sniffer
– IAR Embedded Workbench™ Available
•Microcontroller
– High-Performance and Low-Power 8051APPLICATIONS
Microcontroller Core With Code Prefetch
– 32-, 64-, 128-, or 256-KB
In-System-Programmable Flash
– 8-KB RAM With Retention in All Power
Modes
– Hardware Debug Support
•2.4-GHz IEEE 802.15.4 Systems
•RF4CE Remote Control Systems (64-KB Flash
and Higher)
•ZigBee Systems (256-KB Flash)
•Home/Building Automation
•Lighting Systems
•Industrial Control and Monitoring
•Peripherals
– Powerful Five-Channel DMA
– Integrated High-Performance Op-Amp and
•Low-Power Wireless Sensor Networks
•Consumer Electronics
•Health Care
Ultralow-Power Comparator
1
Please be aware that an important notice concerning availability, standard warranty, and use in critical applications of Texas
Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet.
2RemoTI, SmartRF, Z-Stack are trademarks of Texas Instruments.
3IAR Embedded Workbench is a trademark of IAR Systems AB.
4ZigBee is a registered trademark of the ZigBee Alliance.
5All other trademarks are the property of their respective owners.
PRODUCTION DATA information is current as of publication date.
Products conform to specifications per the terms of the Texas
Instruments standard warranty. Production processing does not
necessarily include testing of all parameters.
The CC2530 is a true system-on-chip (SoC) solution for IEEE 802.15.4, Zigbee and RF4CE applications. It
enables robust network nodes to be built with very low total bill-of-material costs. The CC2530 combines the
excellent performance of a leading RF transceiver with an industry-standard enhanced 8051 MCU, in-system
programmable flash memory, 8-KB RAM, and many other powerful features. The CC2530 comes in four different
flash versions: CC2530F32/64/128/256, with 32/64/128/256 KB of flash memory, respectively. The CC2530 has
various operating modes, making it highly suited for systems where ultralow power consumption is required.
Short transition times between operating modes further ensure low energy consumption.
Combined with the industry-leading and golden-unit-status ZigBee protocol stack ( Z-Stack™) from Texas
Instruments, the CC2530F256 provides a robust and complete ZigBee solution.
Combined with the golden-unit-status RemoTI stack from Texas Instruments, the CC2530F64 and higher provide
a robust and complete ZigBee RF4CE remote-control solution.
This integrated circuit can be damaged by ESD. Texas Instruments recommends that all integrated circuits be handled with
appropriate precautions. Failure to observe proper handling and installation procedures can cause damage.
ESD damage can range from subtle performance degradation to complete device failure. Precision integrated circuits may be more
susceptible to damage because very small parametric changes could cause the device not to meet its published specifications.
Supply voltageAll supply pins must have the same voltage–0.33.9V
Voltage on any digital pinV
–0.3VDD + 0.3,
Input RF level10dBm
Storage temperature range–40125°C
ESD
(2)
All pads, according to human-body model, JEDEC STD 22, method A1142kV
According to charged-device model, JEDEC STD 22, method C101500V
(1) Stresses beyond those listed under Absolute Maximum Ratings may cause permanent damage to the device. These are stress ratings
only, and functional operation of the device at these or any other conditions beyond those indicated under Recommended OperatingConditions is not implied. Exposure to absolute-maximum-rated conditions for extended periods may affect device reliability.
(2) CAUTION: ESD sensitive device. Precaution should be used when handling the device in order to prevent permanent damage.
RECOMMENDED OPERATING CONDITIONS
MINMAXUNIT
Operating ambient temperature range, T
A
–40125°C
Operating supply voltage23.6V
ELECTRICAL CHARACTERISTICS
Measured on Texas Instruments CC2530 EM reference design with TA= 25°C and VDD = 3 V, unless otherwise noted.
Boldface limits apply over the entire operating range, TA= –40°C to 125°C, VDD = 2 V to 3.6 V, and fc= 2394 MHz to
2507 MHz.
PARAMETERTEST CONDITIONSMINTYP MAX UNIT
Digital regulator on. 16-MHz RCOSC running. No radio, crystals, or peripherals active.
Medium CPU activity: normal flash access
32-MHz XOSC running. No radio or peripherals active.
Medium CPU activity: normal flash access
32-MHz XOSC running, radio in RX mode, –50-dBm input power, no peripherals active, CPU
idle
32-MHz XOSC running, radio in RX mode at -100-dBm input power (waiting for signal), no
I
I
Core current
core
consumption
Peripheral Current Consumption (Adds to core current I
Timer 1Timer running, 32-MHz XOSC used90μA
Timer 2Timer running, 32-MHz XOSC used90μA
Timer 3Timer running, 32-MHz XOSC used60μA
Timer 4Timer running, 32-MHz XOSC used70μA
peripherals active, CPU idle
32-MHz XOSC running, radio in TX mode, 1-dBm output power, no peripherals active, CPU idle28.7mA
32-MHz XOSC running, radio in TX mode, 4.5-dBm output power, no peripherals active, CPU
idle
Power mode 1. Digital regulator on; 16-MHz RCOSC and 32-MHz crystal oscillator off;
32.768-kHz XOSC, POR, BOD and sleep timer active; RAM and register retention
Power mode 2. Digital regulator off; 16-MHz RCOSC and 32-MHz crystal oscillator off;
32.768-kHz XOSC, POR, and sleep timer active; RAM and register retention
Power mode 3. Digital regulator off; no clocks; POR active; RAM and register retention0.41μA
Erase1mA
Burst write peak current6mA
(1) Normal flash access means that the code used exceeds the cache storage, so cache misses happen frequently.
(1)
, no RAM access
(1)
, no RAM access
for each peripheral unit activated)
core
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≤ 3.9
3.4mA
6.58.9mA
20.5mA
24.329.6mA
33.539.6mA
0.20.3mA
12μA
GENERAL CHARACTERISTICS
Measured on Texas Instruments CC2530 EM reference design with TA= 25°C and VDD = 3 V, unless otherwise noted.
Measured on Texas Instruments CC2530 EM reference design with TA= 25°C, VDD = 3 V, and fc= 2440 MHz, unless
otherwise noted.
Boldface limits apply over the entire operating range, TA= –40°C to 125°C, VDD = 2 V to 3.6 V, and fc= 2394 MHz to
2507 MHz.
≥ 20 MHz802.15.4 modulated channel, stepped through all channels57dB
≤ –20 MHz57
Co-channel rejectionmodulated at the same frequency as the desired signal. Signal–3dB
Blocking/desensitization
5 MHz from band edgeWanted signal 3 dB above the sensitivity level, CW jammer,–33
10 MHz from band edgePER = 1%. Measured according to EN 300 440 class 2.–33
20 MHz from band edge–32
50 MHz from band edge–31
–5 MHz from band edge–35
–10 MHz from band edge–35
–20 MHz from band edge–34
–50 MHz from band edge–34
Spurious emission. Only largest spurious
emission stated within each band.
30 MHz–1000 MHz<
1 GHz–12.75 GHz
Frequency error tolerance
Symbol rate error tolerance
(1) Difference between center frequency of the received RF signal and local oscillator frequency.
(2) Difference between incoming symbol rate and the internally generated symbol rate
(1)
(2)
PER = 1%, as specified by [1]
[1] requires –85 dBm
PER = 1%, as specified by [1]
[1] requires –20 dBm
Wanted signal –82 dBm, adjacent modulated channel at
5 MHz, PER = 1 %, as specified by [1].
[1] requires 0 dB
Wanted signal –82 dBm, adjacent modulated channel
at –5 MHz, PER = 1 %, as specified by [1].
[1] requires 0 dB
Wanted signal –82 dBm, adjacent modulated channel at
10 MHz, PER = 1%, as specified by [1]
[1] requires 30 dB
Wanted signal –82 dBm, adjacent modulated channel
at –10 MHz, PER = 1 %, as specified by [1]
[1] requires 30 dB
Wanted signal at –82 dBm. Undesired signal is an IEEE
from 2405 to 2480 MHz. Signal level for PER = 1%.
Wanted signal at –82 dBm. Undesired signal is 802.15.4
level for PER = 1%.
Conducted measurement with a 50-Ω single-ended load.
Suitable for systems targeting compliance with EN 300 328,dBm
EN 300 440, FCC CFR47 Part 15 and ARIB STD-T-66.
Measured on Texas Instruments CC2530 EM reference design with TA= 25°C, VDD = 3 V and fc= 2440 MHz, unless
otherwise noted.
Boldface limits apply over the entire operating range, TA= –40°C to 125°C, VDD = 2 V to 3.6 V and fc= 2394 MHz to 2507
MHz.
PARAMETERTEST CONDITIONSMINTYPMAXUNIT
Delivered to a single-ended 50-Ω load through a balun using
Measured on Texas Instruments CC2530 EM reference design with TA= 25°C and VDD = 3 V, unless otherwise noted.
PARAMETERTEST CONDITIONSMINTYPMAX UNIT
Crystal frequency32MHz
Crystal frequency accuracy
requirement
ESREquivalent series resistance660Ω
C
0
C
L
(1) Including aging and temperature dependency, as specified by [1]
Crystal shunt capacitance17pF
Crystal load capacitance1016pF
Start-up time0.3ms
Power-down guard timerequirement is valid for all modes of operation. The3ms
(1)
The crystal oscillator must be in power down for a
guard time before it is used again. This
need for power-down guard time can vary with
crystal type and load.
–4040ppm
32.768-kHz CRYSTAL OSCILLATOR
Measured on Texas Instruments CC2530 EM reference design with TA= 25°C and VDD = 3 V, unless otherwise noted.
PARAMETERTEST CONDITIONSMINTYPMAX UNIT
Crystal frequency32.768kHz
Crystal frequency accuracy
requirement
ESREquivalent series resistance40130kΩ
C
0
C
L
(1) Including aging and temperature dependency, as specified by [1]
Crystal shunt capacitance0.92pF
Crystal load capacitance1216pF
Start-up time0.4s
(1)
–4040ppm
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32-kHz RC OSCILLATOR
Measured on Texas Instruments CC2530 EM reference design with TA= 25°C and VDD = 3 V, unless otherwise noted.
PARAMETERTEST CONDITIONSMINTYPMAXUNIT
Calibrated frequency
Frequency accuracy after calibration±0.2%
Temperature coefficient
Supply-voltage coefficient
Calibration time
(1) The calibrated 32-kHz RC oscillator frequency is the 32-MHz XTAL frequency divided by 977.
(2) Frequency drift when temperature changes after calibration
(3) Frequency drift when supply voltage changes after calibration
(4) When the 32-kHz RC oscillator is enabled, it is calibrated when a switch from the 16-MHz RC oscillator to the 32-MHz crystal oscillator
Measured on Texas Instruments CC2530 EM reference design with TA= 25°C and VDD = 3 V, unless otherwise noted.
PARAMETERTEST CONDITIONSMINTYPMAXUNIT
Frequency
Uncalibrated frequency accuracy±18%
Calibrated frequency accuracy±0.6%±1%
Start-up time10μs
Initial calibration time
(1) The calibrated 16-MHz RC oscillator frequency is the 32-MHz XTAL frequency divided by 2.
(2) When the 16-MHz RC oscillator is enabled, it is calibrated when a switch from the 16-MHz RC oscillator to the 32-MHz crystal oscillator
(1)
(2)
is performed while SLEEPCMD.OSC_PD is set to 0.
RSSI/CCA CHARACTERISTICS
Measured on Texas Instruments CC2530 EM reference design with TA= 25°C and VDD = 3 V, unless otherwise noted.
Measured on Texas Instruments CC2530 EM reference design with TA= 25°C, VDD = 3 V and fc= 2440 MHz, unless
otherwise noted.
PARAMETERTEST CONDITIONSMINTYPMAXUNIT
At ±1-MHz offset from carrier–110
Phase noise, unmodulated carrierAt ±2-MHz offset from carrier–117dBc/Hz
At ±5-MHz offset from carrier–122
ANALOG TEMPERATURE SENSOR
Measured on Texas Instruments CC2530 EM reference design with TA= 25°C and VDD = 3 V, unless otherwise noted.
PARAMETERTEST CONDITIONSMINTYPMAXUNIT
Output at 25°C148012-bit ADC
Temperature coefficient4.5/1°C
Voltage coefficient1/0.1 V
Initial accuracy without calibration±10°C
Accuracy using 1-point calibration (entire
temperature range)
Current consumption when enabled (ADC
current not included)
Measured using integrated ADC using
internal bandgap voltage reference and
maximum resolution
Input voltageVDD is voltage on AVDD5 pin0VDDV
External reference voltageVDD is voltage on AVDD5 pin0VDDV
External reference voltage differentialVDD is voltage on AVDD5 pin0VDDV
Input resistance, signalUsing 4-MHz clock speed197kΩ
Full-scale signal
(1)
ENOB
THD
CMRRCommon-mode rejection ratio>84dB
DNL
(1)
INL
SINAD
(–THD+N)
Effective number of bitsbits
Useful power bandwidth7-bit setting, both single and differential0–20kHz
(1)
Total harmonic distortiondB
Signal to nonharmonic ratio
Crosstalk>84dB
OffsetMidscale–3mV
Gain error0.68%
(1)
Differential nonlinearityLSB
Integral nonlinearityLSB
(1)
Signal-to-noise-and-distortiondB
Conversion timeμs
Power consumption1.2mA
Internal reference voltage1.15V
Internal reference VDD coefficient4mV/V
Internal reference temperature coefficient0.4mV/10°C
(1) Measured with 300-Hz sine-wave input and VDD as reference.