Texas Instruments BQ20Z45DBT Schematics

bq20z45
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.................................................................................................................................................................................................. SLUS800 – MARCH 2009
SBS 1.1-Compliant Gas Gauge and Protection Enabled With Impedance Track™
1

FEATURES

2
Technology Accurately Measures Available Charge in Li-Ion and Li-Polymer Batteries
Better Than 1% Error Over the Lifetime of
the Battery
Supports the Smart Battery Specification
SBS V1.1
Flexible Configuration for 2 to 4 Series Li-Ion
and Li-Polymer Cells
Powerful 8-Bit RISC CPU With Ultralow Power
Modes
Full Array of Programmable Protection
Features – Voltage, Current, and Temperature
Satisfies JEITA Guidelines
Added Flexibility to Handle More Complex
Charging Profiles
Lifetime Data Logging
Supports SHA-1 Authentication
Complete Battery Protection and Gas Gauge
Solution in One Package
Available in a 38-Pin TSSOP (DBT) package

DESCRIPTION

The bq20z45 SBS-compliant gas gauge and protection IC is a single IC solution designed for battery-pack or in-system installation. The bq20z45 measures and maintains an accurate record of available charge in Li-ion or Li-polymer batteries using its integrated high-performance analog peripherals, monitors capacity change, battery impedance, open-circuit voltage, and other critical parameters of the battery pack as well and reports the information to the system host controller over a serial-communication bus. Together with the integrated analog front-end (AFE) short-circuit and overload protection, the bq20z45 maximizes functionality and safety while minimizing external component count, cost, and size in smart battery circuits.
The implemented Impedance Track™ gas gauging technology continuously analyzes the battery impedance, resulting in superior gas-gauging accuracy. This enables remaining capacity to be calculated with discharge rate, temperature, and cell aging all accounted for during each stage of every cycle with high accuracy.

APPLICATIONS

Notebook PCs
Medical and Test Equipment
Portable Instrumentation
AVAILABLE OPTIONS
T
A
– 40 ° C to 85 ° C bq20z45DBT
(1) For the most current package and ordering information, see the Package Option Addendum at the end of this document, or see the TI
website at www.ti.com . (2) A single tube quantity is 50 units. (3) A single reel quantity is 2000 units
1
Please be aware that an important notice concerning availability, standard warranty, and use in critical applications of Texas Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet.
2 Impedance Track is a trademark of Texas Instruments.
PRODUCTION DATA information is current as of publication date. Products conform to specifications per the terms of the Texas Instruments standard warranty. Production processing does not necessarily include testing of all parameters.
38-PIN TSSOP (DBT) Tube 38-PIN TSSOP (DBT) Tape and Reel
(2)
PACKAGE
(1)
Copyright © 2009, Texas Instruments Incorporated
bq20z45DBTR
(3)
Coloumb
Counter
HWOver
Current&
ShortCircuit
Protection
CellVoltage
Multiplexer
N-ChannelFET
Drive
PreChargeFET
& GPODDrive
PowerMode
Control
SMBD
GSRN
GSRP
ASRN
ASRP
GPOD
ZVCHG
CHG
DSG
VC5
VC4
VC3
VC2
VC1
SMBC
CellBalancing
Temperature Measurement
DataFlash
Memory
SMB1.1
Impedance
Track™
GasGauging
SHA-1
Authentication
Over &Under
Voltage
Protection
Voltage
Measurement
OverCurrent
Protection
Oscillator
Charging Algorithm
FuseBlow
Detectionand
Logic
Over
Temperature
Protection
SAFE
PFIN
TS2
TS1
TOUT
PMS
Watchdog
Regulators
RESET
ALERT
REG33
REG25
VCELL+
BA
T
P
ACK
VCC
VSS
MSRT
RBI
SystemControl AFEHWControl
Pack-
RSNS 5m -20m typ.W W
Pack+
SMBC
SMBD
bq20z45
GND
VC4
VC3
VC2
VC1
VDD
OUT
CD
bq294xx
1
DSG
2
PACK
3
11
VCC
ALERT
4
12
ZVCHG
PRES
5
13
6
14
PMS
TS2
7
15
VSS
PFIN
8
16
REG33
SAFE
9
17
TOUT
SMBD
10
18 19
VCELL+
SMBC
NC
CHG
38
BAT
37
VC1
VSS
36
28
VC2
RBI
35
27
VC3
REG25
34
26
VC4
VSS
33
25
VC5
MRST
32
24
ASRP
GSRN
31
23
ASRN
GSRP
30
22
RESET
VSS VSS
29
21
20
GPOD
TS1
bq20z45
SLUS800 – MARCH 2009 ..................................................................................................................................................................................................
These devices have limited built-in ESD protection. The leads should be shorted together or the device placed in conductive foam during storage or handling to prevent electrostatic damage to the MOS gates.

SYSTEM PARTITIONING DIAGRAM

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bq20z45
DBT PACKAGE
(TOP VIEW)
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.................................................................................................................................................................................................. SLUS800 – MARCH 2009
PIN FUNCTIONS
PIN
NO. NAME
1 DSG O High side N-chan discharge FET gate drive 2 PACK IA, P
3 VCC P 4 ZVCHG O P-chan pre-charge FET gate drive 5 GPOD OD
6 PMS I connected at CHG pin. Connect to VSS to disable 0V pre-charge using charge FET connected at
7 VSS P Negative device power supply input. Connect all VSS pins together for operation of device 8 REG33 P 3.3V regulator output. Connect at least a 2.2 µ F capacitor to REG33 and VSS 9 TOUT P Thermistor bias supply output
10 VCELL+ - Internal cell voltage multiplexer and amplifier output. Connect a 0.1 µ F capacitor to VCELL+ and VSS
11 ALERT I/OD
12 PRES I/OD System / Host present input. Pull up to TOUT
13 TS1 IA Temperature sensor 1 input
14 TS2 IA Temperature sensor 2 input
15 PFIN I/OD Fuse blow detection input
16 SAFE I/OD blow fuse signal output
17 SMBD I/OD SMBus data line
18 SMBC I/OD SMBus clock line
19 NC - Not connected
20, 21, 25,
28
22 GSRP IA Coulomb counter differential input. Connect to one side of the sense resistor
23 GSRN IA Coulomb counter differential input. Connect to one side of the sense resistor
24 MRST I Reset input for internal CPU core. connect to RESET for correct operation of device
26 REG25 P 2.5V regulator output. Connect at least a 1 µ F capacitor to REG25 and VSS
27 RBI P
29 RESET O Reset output. Connect to MSRT.
30 ASRN IA Short circuit and overload detection differential input. Connect to sense resistor
31 ASRP IA Short circuit and overload detection differential input. Connect to sense resistor
32 VC5 IA, P
33 VC4 IA, P
34 VC3 IA, P
35 VC2 IA, P and the negative voltage of the highest cell in 4 cell applications. Connect to VC3 in 2 cell stack
36 VC1 IA, P
37 BAT I, P Battery stack voltage sense input
38 CHG O High side N-chan charge FET gate drive (1) I = Input, IA = Analog input, I/O = Input/output, I/OD = Input/Open-drain output, O = Output, OA = Analog output, P = Power
VSS P Negative device power supply input. Connect all VSS pins together for operation of device
(1)
I/O
Battery pack input voltage sense input. It also serves as device wake up when device is in shutdown mode.
Positive device supply input. Connect to the center connection of the CHG FET and DSG FET to ensure device supply either from battery stack or battery pack input
High voltage general purpose open drain output. Can be configured to be used in pre-charge condition
Pre-charge mode setting input. Connect to PACK to enable 0v pre-charge using charge FET CHG pin.
Alert output. In case of short circuit condition, overload condition and watchdog time out this pin will be triggered.
RAM backup input. Connect a capacitor to this pin and VSS to protect loss of RAM data in case of short circuit condition
Cell voltage sense input and cell balancing input for the negative voltage of the bottom cell in cell stack.
Cell voltage sense input and cell balancing input for the positive voltage of the bottom cell and the negative voltage of the second lowest cell in cell stack.
Cell voltage sense input and cell balancing input for the positive voltage of the second lowest cell in cell stack and the negative voltage of the second highest cell in 4 cell applications.
Cell voltage sense input and cell balancing input for the positive voltage of the second highest cell applications
Cell voltage sense input and cell balancing input for the positive voltage of the highest cell in cell stack in 4 cell applications. Connect to VC2 in 3 or 2 cell stack applications
DESCRIPTION
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ABSOLUTE MAXIMUM RATINGS

over operating free-air temperature (unless otherwise noted)
PIN UNIT
BAT, VCC – 0.3 V to 34 V PACK, PMS – 0.3 V to 34 V
V
Supply voltage range VC(n)-VC(n+1); n = 1, 2, 3, 4 – 0.3 V to 8.5 V
SS
VC1, VC2, VC3, VC4 – 0.3 V to 34 V VC5 – 0.3 V to 1 V PFIN, SMBD, SMBC – 0.3 V to 6 V
V
Input voltage range
IN
V
Output voltage range TOUT, ALERT, REG33 – 0.3 V to 6 V
OUT
I
Maximum combined sink current for input pins PRES, PFIN, SMBD, SMBC 50 mA
SS
T
Operating free-air temperature range – 40 ° C to 85 ° C
A
T
Functional temperature – 40 ° C to 100 ° C
F
T
Storage temperature range – 65 ° C to 150 ° C
stg
(1) Stresses beyond those listed under absolute maximum ratings may cause permanent damage to the device. These are stress ratings
only, and functional operation of the device at these or any other conditions beyond those indicated under recommended operating
conditions is not implied. Exposure to absolute-maximum-rated conditions for extended periods may affect device reliability.
TS1, TS2, SAFE, VCELL+, PRES; ALERT – 0.3 V to V MRST, GSRN, GSRP, RBI – 0.3 V to V ASRN, ASRP – 1 V to 1 V DSG, CHG, GPOD – 0.3 V to 34 V ZVCHG – 0.3 V to V
RESET – 0.3 V to 7 V REG25 – 0.3 V to 2.75 V
(1)
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+ 0.3 V
(REG25)
+ 0.3 V
(REG25)
(BAT)

RECOMMENDED OPERATING CONDITIONS

over operating free-air temperature range (unless otherwise noted)
PIN MIN NOM MAX UNIT
V
SS
V
(STARTUP)
V
IN
V
(GPOD)
A
(GPOD)
C
(REG25)
C
(REG33)
C
(VCELL+)
C
(PACK)
(1) Use an external resistor to limit the current to GPOD to 1mA in high voltage application. (2) Use an external resistor to limit the inrush current PACK pin required.
Supply voltage VCC, BAT 4.5 25 V Minimum startup voltage VCC, BAT, PACK 5.5 V
VC(n)-VC(n+1); n = 1,2,3,4 0 5 V VC1, VC2, VC3, VC4 0 V
Input Voltage Range VC5 0 0.5 V
ASRN, ASRP – 0.5 0.5 V
PACK, PMS 0 25 V Output Voltage Range GPOD 0 25 V Drain Current
(1)
GPOD 1 mA
2.5V LDO Capacitor REG25 1 µ F
3.3V LDO Capacitor REG33 2.2 µ F Cell Voltage Output Capacitor VCELL+ 0.1 µ F PACK input block resistor
(2)
PACK 1 k
SUP
V
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.................................................................................................................................................................................................. SLUS800 – MARCH 2009

ELECTRICAL CHARACTERISTICS

over operating free-air temperature range (unless otherwise noted), TA= – 40 ° C to 85 ° C, V V
= 14 V, C
(BAT)
SUPPLY CURRENT
I
(NORMAL)
I
(SLEEP)
I
(SHUTDOWN)
Firmware running 550 µ A Sleep Mode CHG FET on; DSG FET on 124 µ A
Shutdown Mode 0.1 1 µ A
SHUTDOWN WAKE; TA= 25 ° C (unless otherwise noted)
I
(PACK)
Shutdown exit at V
SRx WAKE FROM SLEEP; TA= 25 ° C (unless otherwise noted)
Positive or negative wake threshold
V
(WAKE)
V
(WAKE_ACR)
V
(WAKE_TCO)
t
(WAKE)
with 1.00 mV, 2.25 mV, 4.5 mV and 9 1.25 10 mV mV programmable options
Accuracy of V
Temperature drift of V Time from application of current and
wake of bq8040
POWER-ON RESET
V
IT –
V
hys
t
RST
Negative-going voltage input Voltage at REG25 pin 1.70 1.80 1.90 V Hysteresis V
RESET active low time 100 250 560 µ s
WATCHDOG TIMER
t
WDTINT
t
WDWT
2.5V LDO; I
V
(REG25)
Δ V
(REG25TEMP)
Δ V
(REG25LINE)
Δ V
(REG25LOAD)
I
(REG25MAX)
3.3V LDO; I
V
(REG33)
Δ V
(REG33TEMP)
Δ V
(REG33LINE)
Δ V
(REG33LOAD)
Watchdog start up detect time 250 500 1000 ms Watchdog detect time 50 100 150 µ s
(REG33OUT)
Regulator output voltage I
Regulator output change with I temperature TA= – 40 ° C to 100 ° C
Line regulation 3 10 mV
Load Regulation mV
Current Limit 5 40 75 mA
(REG25OUT)
Regulator output voltage I
Regulator output change with I temperature TA= – 40 ° C to 100 ° C
Line regulation 3 10 mV
Load Regulation mV
= 1 µ F, C
(REG25)
= 2.2 µ F; typical values at TA= 25 ° C (unless otherwise noted)
(REG33)
PARAMETER TEST CONDITIONS MIN TYP MAX UNIT
CHG FET off; DSG FET on 90 µ A CHG FET off; DSG FET off 52 µ A
threshold 1 µ A
STARTUP
V
= 1 mV;
(WAKE)
I
= 0, RSNS1 = 0, RSNS0 = 1;
(WAKE)
V
= 2.25 mV;
(WAKE)
I
) = 1, RSNS1 = 0, RSNS0 = 1; -0.8 0.8
(WAKE
I
= 0, RSNS1 = 1, RSNS0 = 0;
(WAKE)
accuracy 0.5 %/ ° C
(WAKE)
(WAKE)
V
= 4.5 mV;
(WAKE)
I
= 1, RSNS1 = 1, RSNS0 = 1; -1.0 1.0
(WAKE)
I
= 0, RSNS1 = 1, RSNS0 = 0;
(WAKE)
V
= 9 mV;
(WAKE)
I
= 1, RSNS1 = 1, RSNS0 = 1;
(WAKE)
– V
IT+
IT-
active low time after power up or watchdog reset
= 0 mA; TA= 25 ° C (unless otherwise noted)
4.5 < VCC or BAT < 25 V; ) 16 mA; 2.41 2.5 2.59 V
(REG25OUT
TA= – 40 ° C to 100 ° C
(REG25OUT)
= 2 mA;
5.4 < VCC or BAT < 25 V;
I
(REG25OUT)
0.2 mA I
0.2 mA I
= 2 mA
(REG25OUT) (REG25OUT)
2 mA 7 2516 mA 25 50
drawing current until REG25 = 2 V to 0 V
= 0 mA; TA= 25 ° C (unless otherwise noted)
4.5 < VCC or BAT < 25 V;
(REG33OUT)
TA= – 40 ° C to 100 ° C
(REG33OUT)
25 mA; 3 3.3 3.6 V
= 2 mA;
5.4 < VCC or BAT < 25 V;
I
(REG33OUT)
0.2 mA I
0.2mA I
= 2 mA
(REG33OUT)
(REG33OUT)
2 mA 7 17
25 mA 40 100
= 2.41 V to 2.59 V,
(REG25)
-0.7 0.7
-1.4 1.4
1 10 ms
50 150 250 mV
± 0.2 %
± 0.2 %
mV
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ELECTRICAL CHARACTERISTICS (continued)
over operating free-air temperature range (unless otherwise noted), TA= – 40 ° C to 85 ° C, V V
= 14 V, C
(BAT)
I
(REG33MAX)
Current Limit mA
THERMISTOR DRIVE
V
(TOUT)
R
DS(on)
Output voltage I TOUT pass element resistance 50 100
VCELL+ HIGH VOLTAGE TRANSLATION
V
(VCELL+OUT)
V
(VCELL+REF)
V
(VCELL+PACK)
V
(VCELL+BAT)
Translation output 0.965 0.975 0.985 V
CMMR Common mode rejection ratio VCELL+ 40 dB
K Cell scale factor
I
(VCELL+OUT)
V
(VCELL+O)
I
VCnL
Drive Current to VCELL+ capacitor 12 18 µ A
CELL offset error -18 -1 18 mV VC(n) pin leakage current VC1, VC2, VC3, VC4, VC5 = 3 V -1 0.01 1 µ A
CELL BALANCING
R
(BAL)
internal cell balancing FET resistance 200 400 600
HARDWARE SHORT CIRCUIT AND OVERLOAD PROTECTION; TA= 25 ° C (unless otherwise noted)
V
(OL)
V
(SCC)
V
(SCD)
t
da
t
pd
OL detection threshold voltage accuracy
SCC detection threshold voltage accuracy
SCD detection threshold voltage accuracy
Delay time accuracy ± 15.25 µ s Protection circuit propagation delay 50 µ s
FET DRIVE CIRCUIT; TA= 25 ° C (unless otherwise noted)
V
(DSGON)
V
(CHGON)
V
(DSGOFF)
V
(CHGOFF)
DSG pin output on voltage V
CHG pin output on voltage V
DSG pin output off voltage V CHG pin output off voltage V
= 1 µ F, C
(REG25)
= 2.2 µ F; typical values at TA= 25 ° C (unless otherwise noted)
(REG33)
PARAMETER TEST CONDITIONS MIN TYP MAX UNIT
drawing current until REG33 = 3 V 25 100 145 short REG33 to VSS, REG33 = 0 V 12 65
= 0 mA; TA= 25 ° C V
(TOUT)
I
= 1 mA; R
(TOUT)
V
)/ 1 mA; TA= – 40 ° C to 100 ° C
(TOUT)
VC(n) - VC(n+1) = 0 V; TA= – 40 ° C to 100 ° C
VC(n) - VC(n+1) = 4.5 V; TA= – 40 ° C to 100 ° C
= (V
DS(on)
-
(REG25)
0.950 0.975 1
0.275 0.3 0.375
internal AFE reference voltage ; TA= – 40 ° C to 100 ° C
Voltage at PACK pin; 0.98 × 1.02 × TA= – 40 ° C to 100 ° C V
/18 V
(PACK)
Voltage at BAT pin; 0.98 × TA= – 40 ° C to 100 ° C V
/18
(BAT)
K= {VCELL+ output (VC5=0V; VC4=4.5V) - VCELL+ output (VC5=0V; 0.147 0.150 0.153 VC4=0V)}/4.5
K= {VCELL+ output (VC2=13.5V; VC1=18V) - VCELL+ output 0.147 0.150 0.153 (VC5=13.5V; VC1=13.5V)}/4.5
VC(n) - VC(n+1) = 0V; VCELL+ = 0 V; TA= – 40 ° C to 100 ° C
CELL output (VC2 = VC1 = 18 V) ­CELL output (VC2 = VC1 = 0 V)
R
for internal FET switch at
DS(on)
VDS= 2 V; TA= 25 ° C
VOL= 25 mV (min) 15 25 35 VOL= 100 mV; RSNS = 0, 1 90 100 110 mV VOL= 205 mV (max) 185 205 225 V
= 50 mV (min) 30 50 70
(SCC)
V
= 200 mV; RSNS = 0, 1 180 200 220 mV
(SCC)
V
= 475 mV (max) 428 475 523
(SCC)
V
= – 50 mV (min) – 30 – 50 – 70
(SCD)
V
= – 200 mV; RSNS = 0, 1 – 180 – 200 – 220 mV
(SCD)
V
= – 475 mV (max) – 428 – 475 – 523
(SCD)
V
= V
- V
(DSGON) (GS)
TA= – 40 ° C to 100 ° C V
(CHGON) (GS)
TA= – 40 ° C to 100 ° C
(DSGOFF) (CHGOFF)
(DSG)
= 10 M ; DSG and CHG on; 8 12 16 V
= V
(CHG)
= 10 M ; DSG and CHG on; 8 12 16 V
= V
(DSG)
= V
(CHG)
;
(PACK)
- V
;
(BAT)
- V
(PACK)
- V
(BAT)
(REG25)
V
= 2.41 V to 2.59 V,
(REG25)
/18
(PACK)
V
/18 1.02 × V
(BAT)
/18
(PACK)
/18
(BAT)
0.2 V
0.2 V
V
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