SuccessiveApproximationRegister(SAR)
Comparator
CDAC
Ref
Buffer
BUF
ADC
REF
REF
CAP
R1
IN
40kW 20kW
2.5-V
InternalReference
6kW
Parallel
and
Serial
DataOut
and
Control
Clock
40kW
10kW
R2
IN
REFD
Parallel
Data
PWRD
BYTE
BUSY
CS
R/C
SB/BTC
TAG
SDATA
DATACLK
EXT/INT
ADS8517
www.ti.com
.......................................................................................................................................................................................... SLAS527 – SEPTEMBER 2008
16-Bit, 200-kSPS, Low-Power, Sampling ANALOG-TO-DIGITAL CONVERTER
with Internal Reference and Parallel/Serial Interface
1
FEATURES APPLICATIONS
23
• 200-kHz Minimum Sampling Rate
• 4-V, 5-V, and ± 10-V Input Ranges with
High-Impedance Input
• ± 1.5 LSB Max INL
• +1.5/ – 1 LSB Max/Min DNL, 16 Bits NMC
• ± 2-mV Max BPZ, ± 0.6 ppm/ ° C BPZ Drift
• ± 2-mV Max UPZ, ± 0.15 ppm/ ° C UPZ Drift
• 88.8-dB SINAD with 10-kHz Input
• SPI™-Compatible Serial Output With
Daisy-Chain (TAG), SPI Master/Slave Feature
• Full Parallel Interface
• Binary Twos Complement or Straight Binary
Output Code Formats
• Single 4.5-V to 5.5-V Analog Supply, 1.65-V to
5.5-V Interface Supply
• Uses Internal 2.5-V or External Reference
• No External Precision Resistors Required
• Low Power Dissipation (ADC+REF+BUF):
– 47 mW Typ, 60 mW Max at 200 kSPS
• 50- µ W Max Power-Down Mode
• Pin-Compatible with 16-Bit ADS7807 and
ADS8507 , and 12-Bit ADS7806 and ADS8506
• SO-28 Package (TSSOP-28 Available Q2, 2009)
• Portable Test Equipment
• USB Data Acquisition Module
• Medical Equipment
• Industrial Process Control
• Digital Signal Processing
• Instrumentation
DESCRIPTION
The ADS8517 is a complete low-power, single 5-V
supply, 16-bit sampling analog-to-digital (A/D)
converter. It contains a complete, 16-bit,
capacitor-based, successive approximation register
(SAR) A/D converter with sample-and-hold, clock,
reference, and data interface. The converter can be
configured for a variety of input ranges including ± 10
V, 4 V, and 5 V. For most input ranges, the input
voltage can swing to 25 V or – 25 V without damage
to the device.
An SPI-compatible serial interface allows data to be
synchronized to an internal or external clock. A full
parallel interface using the selectable BYTE pin is
also provided to allow the maximum system design
flexibility. The ADS8517 is specified at a 200-kHz
sampling rate over the industrial – 40 ° C to +85 ° C
temperature range.
1
2 SPI is a trademark of Motorola, Inc.
3 All other trademarks are the property of their respective owners.
PRODUCTION DATA information is current as of publication date.
Products conform to specifications per the terms of the Texas
Instruments standard warranty. Production processing does not
necessarily include testing of all parameters.
Please be aware that an important notice concerning availability, standard warranty, and use in critical applications of Texas
Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet.
Copyright © 2008, Texas Instruments Incorporated
ADS8517
SLAS527 – SEPTEMBER 2008 ..........................................................................................................................................................................................
www.ti.com
These devices have limited built-in ESD protection. The leads should be shorted together or the device placed in conductive foam
during storage or handling to prevent electrostatic damage to the MOS gates.
PACKAGE/ORDERING INFORMATION
MINIMUM
RELATIVE NO MINIMUM SPECIFIED
PRODUCT (LSB) CODE (dB) RANGE LEAD DESIGNATOR NUMBER MEDIA, QTY
ADS8517IB ± 1.5 16 87 -40 ° C to +85 ° C
ADS8517I ± 3 15 85 -40 ° C to +85 ° C
ACCURACY MISSING SINAD TEMPERATURE PACKAGE- PACKAGE ORDERING TRANSPORT
SO-28 DW
TSSOP-28
TSSOP-28
(2)
SO-28 DW
(2)
(1)
ADS8517IBDW Tube, 20
ADS8517IBDWR Tape and Reel, 1000
PW
PW
ADS8517IBPW Tube, 50
ADS8517IBPWR Tape and Reel, 2000
ADS8517IDW Tube, 20
ADS8517IDWR Tape and Reel, 1000
ADS8517W Tube, 50
ADS8517IPWR Tape and Reel, 2000
(1) For the most current package and ordering information, see the Package Option Addendum at the end of this document, or see the TI
website at www.ti.com.
(2) TSSOP-28 (PW) package available Q2, 2009.
ABSOLUTE MAXIMUM RATINGS
(1) (2)
Over operating free-air temperature range (unless otherwise noted).
PARAMETER UNIT
R1
IN
Analog inputs R2
IN
REF +V
ANA
DGND, AGND2 ± 0.3 V
V
Ground voltage differences
ANA
V
to V
DIG
ANA
V
DIG
Digital inputs -0.3 V to +V
Maximum junction temperature +165 ° C
Storage temperature range – 65 ° C to +150 ° C
Internal power dissipation 700 mW
Lead temperature (soldering, 1.6 mm from case, 10 seconds) +260 ° C
(1) Stresses above those listed under Absolute Maximum Ratings may cause permanent damage to the device. Exposure to absolute
maximum conditions for extended periods may affect device reliability.
(2) All voltage values are with respect to network ground terminal.
± 25 V
± 25 V
+ 0.3 V to AGND2 – 0.3 V
6 V
0.3 V
6 V
+ 0.3 V
DIG
ELECTRICAL CHARACTERISTICS
At TA= -40 ° C to +85 ° C, fS= 200 kHz, V
PARAMETER TEST CONDITIONS MIN TYP MAX MIN TYP MAX UNIT
Resolution 16 16 Bits
ANALOG INPUT
Voltage ranges See Table 1 0 5 0 5 V
Impedance See Table 1
Capacitance 45 45 pF
(1) Shaded cells indicate different specifications for high-grade version of the device.
2 Submit Documentation Feedback Copyright © 2008, Texas Instruments Incorporated
= V
DIG
= 5 V, using internal reference (see Figure 39 ), unless otherwise noted.
ANA
ADS8517I ADS8517IB
– 10 10 – 10 10
0 4 0 4
Product Folder Link(s): ADS8517
(1)
ADS8517
www.ti.com
.......................................................................................................................................................................................... SLAS527 – SEPTEMBER 2008
ELECTRICAL CHARACTERISTICS (continued)
At TA= -40 ° C to +85 ° C, fS= 200 kHz, V
PARAMETER TEST CONDITIONS MIN TYP MAX MIN TYP MAX UNIT
THROUGHPUT SPEED
Conversion time 2.5 2.5 µ s
Complete cycle Acquire and convert 5 5 µ s
Throughput rate 200 200 kHz
DC ACCURACY
INL Integral linearity error – 3 3 – 1.5 1.5 LSB
DNL Differential linearity error – 2 3 – 1 1.5 LSB
No missing codes 15 16 Bits
Transition noise
Gain error ± 0.2 ± 0.1 %
Full-scale error
Full-scale error drift
BPZ Bipolar zero error ± 10 V range – 5 ± 1 5 – 2 ± 1 2 mV
Bipolar zero error drift ± 10 V range ± 0.6 ± 0.6 ppm/ ° C
UPZ Unipolar zero error 0 V to 5 V, 0 V to 4 V ranges – 3 ± 0.1 3 – 2 ± 0.1 2 mV
Unipolar zero error drift 0 V to 5 V, 0 V to 4 V ranges ± 0.15 ± 0.15 ppm/ ° C
Recovery time to rated accuracy
from power down
Power-supply sensitivity
(V
= V
DIG
AC ACCURACY
SFDR Spurious-free dynamic range fIN= 10 kHz, ± 10 V 92 100 96 101 dB
THD Total harmonic distortion fIN= 10 kHz, ± 10 V – 97 – 92 – 98 – 95 dB
SINAD Signal-to-(noise+distortion) dB
SNR Signal-to-noise ratio fIN= 10 kHz, ± 10 V 85 88 88 89 dB
SNR usable bandwidth
SNR full-power bandwidth ( – 3 dB) fIN= 10 kHz, ± 10 V 600 600 kHz
SAMPLING DYNAMICS
Aperture delay 40 40 ns
Aperture jitter 20 20 ps
Transient response FS step 5 5 µ s
Overvoltage recovery
(2) LSB means Least Significant Bit. One LSB for the ± 10 V input range is 305 µ V.
(3) Typical rms noise at worst-case transitions.
(4) Full-scale error is the worst case of – Full Scale or +Full Scale untrimmed deviation from ideal first and last code transitions, divided by
the transition voltage (not divided by the full-scale range) and includes the effect of offset error.
(5) This is the time delay after the ADS8517 is brought out of Power-Down mode until all internal settling occurs and the analog input is
acquired to rated accuracy. A Convert command after this delay will yield accurate results.
(6) All specifications in dB are referred to a full-scale input.
(7) Usable bandwidth defined as full-scale input frequency at which Signal-to-(Noise + Distortion) degrades to 60 dB.
(8) Recovers to specified performance after 2 x FS input overvoltage.
(3)
(4)
(5)
= VS)
ANA
(7)
(8)
= V
DIG
Internal reference – 0.75 0.75 – 0.75 0.75 %
External 2.5-V reference – 0.75 0.75 – 0.75 0.75 %
Internal reference ± 9 ± 9 ppm/ ° C
External 2.5-V reference ± 1 ± 1 ppm/ ° C
2.2- µ F capacitor to CAP 1 1 ms
+4.75 V < V
+4.5 V < V
fIN= 10 kHz, ± 10 V 85 88 87 88.5
– 60 dB Input 29 29
fIN= 10 kHz, ± 10 V 130 130 kHz
= 5 V, using internal reference (see Figure 39 ), unless otherwise noted.
ANA
ADS8517I ADS8517IB
0.9 0.8 LSB
< +5.25 V – 8 +8 – 6 +6
ANA
< +5.5 V – 20 +20 – 12 +12
ANA
750 750 ns
(1)
(2)
LSB
(6)
Copyright © 2008, Texas Instruments Incorporated Submit Documentation Feedback 3
Product Folder Link(s): ADS8517
ADS8517
SLAS527 – SEPTEMBER 2008 ..........................................................................................................................................................................................
ELECTRICAL CHARACTERISTICS (continued)
At TA= -40 ° C to +85 ° C, fS= 200 kHz, V
PARAMETER TEST CONDITIONS MIN TYP MAX MIN TYP MAX UNIT
REFERENCE
Internal reference voltage No load 2.48 2.5 2.52 2.48 2.5 2.52 V
Internal reference source current
(must use external buffer)
Internal reference drift 8 8 ppm/ ° C
External reference voltage range
for specified linearity
External reference current drain External 2.5-V reference 100 100 µ A
DIGITAL INPUTS
V
Low-level input voltage
IL
V
High-level input voltage
IH
I
Low-level input current VIL= 0 V ± 10 ± 10 µ A
IL
I
High-level input current VIH= 5 V ± 10 ± 10 µ A
IH
DIGITAL OUTPUTS
Data format - Parallel 16-bits in 2-bytes, Serial
Data coding - Binary twos complement or straight binary
V
Low-level output voltage 0.45 0.45 V
OL
V
High-level output voltage V
OH
Leakage current ± 5 ± 5 µ A
Output capacitance High-Z state 15 15 pF
DIGITAL TIMING
Bus access time RL= 3.3 k Ω , CL= 50 pF 83 83 ns
Bus relinquish time RL= 3.3 k Ω , CL= 10 pF 83 83 ns
POWER SUPPLIES
V
Interface voltage 1.65 1.8 5.5 1.65 1.8 5.5 V
DIG
V
ADC core voltage 4.5 5 5.5 4.5 5 5.5 V
ANA
I
Interface current V
DIG
I
ADC core current V
ANA
Power dissipation
TEMPERATURE RANGE
Specified performance – 40 +85 – 40 +85 ° C
Derated performance – 55 +125 – 55 +125 ° C
Storage temperature – 65 +150 – 65 +150 ° C
θ
Thermal impedance ° C/W
JA
(9) TTL-compatible at 5V supply.
(9)
(9)
www.ti.com
= V
DIG
= 5 V, using internal reference (see Figure 39 ), unless otherwise noted.
ANA
ADS8517I ADS8517IB
(1)
1 1 µ A
2.3 2.5 2.7 2.3 2.5 2.7 V
V
= 1.65 V to 5.5 V – 0.3 0.6 – 0.3 0.6 V
DIG
V
= 1.65 V to 5.5 V 0.5 x V
DIG
I
= 1.6mA,
SINK
V
= 1.65V to 5.5V
DIG
I
= 500 µ A,
SOURCE
V
= 1.65V to 5.5V
DIG
DIG
– 0.45 V
DIG
V
+ 0.3 0.5 x V
DIG
DIG
– 0.45 V
DIG
V
DIG
+ 0.3 V
High-Z state,
V
= 0 V to V
OUT
= 5 V 0.3 0.3 mA
DIG
= 5 V 9 9 mA
ANA
V
= V
ANA
fS= 200 kHz
DIG
= 5 V,
DIG
47 60 47 60 mW
REFD high with BUF on 42 42 mW
PWRD and REFD high 50 50 µ W
TSSOP 62 62
SO 46 46
Table 1. Analog Input Range Connections (see Figure 38 and Figure 39 )
ANALOG INPUT
RANGE CONNECT R1
± 10 V V
0 V to 5 V AGND V
0 V to 4 V V
4 Submit Documentation Feedback Copyright © 2008, Texas Instruments Incorporated
VIA 200 Ω TO CONNECT R2
IN
IN
IN
Product Folder Link(s): ADS8517
VIA 100 Ω TO IMPEDANCE
IN
CAP 45.7 k Ω
IN
V
IN
20.0 k Ω
21.4 k Ω
V
DIG
V
ANA
BUSY
CS
R/C
BYTE
TAG
SDATA
DATACLK
D0
D1
D2
R1
IN
AGND1
CAP
REF
AGND2
D7
D6
D5
D4
D3
DGND
1
2
3
4
5
6
7
8
9
10
11
12
13
14
28
27
26
25
24
23
22
21
20
19
18
17
16
15
ADS8517
R2
IN
SB/BTC
EXT/INT
REFD
PWRD
ADS8517
www.ti.com
.......................................................................................................................................................................................... SLAS527 – SEPTEMBER 2008
PIN CONFIGURATION
DW, PW PACKAGES
SO-28, TSSOP-28
(TOP VIEW)
(1)
(1) TSSOP-28 (PW) package available Q2, 2009.
Pin Assignments
PIN
NAME NO. I/O DESCRIPTION
R1
IN
1 Analog Input.
AGND1 2 Analog sense ground. Used internally as ground reference point. Minimal current flow
R2
IN
3 Analog Input.
CAP 4 Reference buffer output. 2.2- µ F tantalum capacitor to ground.
REF 5
AGND2 6 Analog ground
SB/ BTC 7 I high, data are output in a straight binary format. If low, data are output in a binary twos
EXT/ INT 8 I
D7 9 O
D6 10 O Data bit 6 if BYTE is high. Data bit 14 if BYTE is low. High-Z when CS is high and/or R/ C is low.
D5 11 O Data bit 5 if BYTE is high. Data bit 13 if BYTE is low. High-Z when CS is high and/or R/ C is low.
D4 12 O Data bit 4 if BYTE is high. Data bit 12 if BYTE is low. High-Z when CS is high and/or R/ C is low.
D3 13 O Data bit 3 if BYTE is high. Data bit 11 if BYTE is low. High-Z when CS is high and/or R/ C is low.
DGND 14 Digital ground
D2 15 O Data bit 2 if BYTE is high. Data bit 10 if BYTE is low. High-Z when CS is high and/or R/ C is low.
D1 16 O Data bit 1 if BYTE is high. Data bit 9 if BYTE is low. High-Z when CS is high and/or R/ C is low.
Copyright © 2008, Texas Instruments Incorporated Submit Documentation Feedback 5
DIGITAL
Reference input/output. Outputs internal 2.5-V reference. Can also be driven by external system
reference. In both cases, bypass to ground with a 2.2- µ F tantalum capacitor.
Output mode select. Selects straight binary or binary twos complement for output data format. If
complement format.
External/internal data select. Selects external/internal data clock for transmitting data. If high,
data is output synchronized to the clock input on DATACLK. If low, a convert command initiates
the transmission of the data from the previous conversion, along with 16-clock pulses output on
DATACLK.
Data bit 7 if BYTE is high. Data bit 15 (MSB) if BYTE is low. High-Z when CS is high and/or R/ C
is low. Leave unconnected when using serial output.
Product Folder Link(s): ADS8517
ADS8517
SLAS527 – SEPTEMBER 2008 ..........................................................................................................................................................................................
Pin Assignments (continued)
D0 17 O
DATACLK 18 I/O synchronized to this clock. If EXT/ INT is low, DATACLK transmits 16 pulses after each
SDATA 19 O TAG as long as CS is low and R/ C is high. If EXT/ INT is low, data are valid on both the rising
TAG 20 I
BYTE 21 I
R/ C 22 I into the hold state and starts a conversion. With EXT/ INT is low, the transmission of the data
CS 23 I conversion. If EXT/ INT is low, this same falling edge will start the transmission of serial data
BUSY 24 O
PWRD 25 I
REFD 26 I
V
ANA
V
DIG
27 ADC core supply. Nominally +5 V. Decouple with 0.1- µ F ceramic and 10- µ F tantalum capacitors.
28 I/O supply. Nominally +1.8 V.
Data bit 0 (LSB) if BYTE is high. Data bit 8 if BYTE is low. High-Z when CS is high and/or R/ C is
low.
Data clock. Either an input or an output, depending on the EXT/ INT level. Output data are
conversion, and then remains low between conversions.
Serial data output. Data are synchronized to DATACLK, with the format determined by the level
of SB/ BTC. In the external clock mode, after 16 bits of data, the ADC outputs the level input on
and falling edges of DATACLK, and between conversions SDATA stays at the level of the TAG
input when the conversion was started.
Tag input for use in the external clock mode. If EXT is high, digital data input from TAG is output
on DATA with a delay that depends on the external clock mode.
Byte select. Selects the eight most significant bits (low) or eight least significant bits (high) on
parallel output pins.
Read/convert input. With CS low, a falling edge on R/ C puts the internal sample-and-hold circuit
results from the previous conversion is initiated.
Chip select. Internally ORed with R/ C. If R/ C is low, a falling edge on CS initiates a new
results from the previous conversion.
Busy output. At the start of a conversion, BUSY goes low and stays low until the conversion is
completed and the digital outputs have been updated.
Power-down input. If high, conversions are inhibited and power consumption is significantly
reduced. Results from the previous conversion are maintained in the output shift register.
Reference disable. REFD high shuts down the internal reference. The external reference is
required for conversions.
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6 Submit Documentation Feedback Copyright © 2008, Texas Instruments Incorporated
Product Folder Link(s): ADS8517
10.0
9.5
9.0
8.5
8.0
Temperature( C)°
P
ower
-SupplyCurrent(mA)
-50 -25 0 25 50 75 100 125
2.520
2.515
2.510
2.505
2.500
2.495
2.490
2.485
2.480
Temperature( C)°
InternalReferenceV
oltage(V)
-50 -25 0 125 100 75 50 25
10.0
9.5
9.0
8.5
8.0
SamplingFrequency(kHz)
Power
-SupplyCurrent(mA)
50 100 150 200
2
1
0
-1
-2
Temperature( C)°
Offset(mV)
-50 -25 125 100 75 50 25 0
Bipolar 10VRange±
0.10
0.05
0
Temperature(° C)
PositiveFull-ScaleError(%)
-40 -50 125 100 75 50 25 0
Bipolar10VRange
0
-0.05
-0.10
Temperature( C)°
NegativeFull-ScaleError(%)
-50 -45 125 100 75 50 25 0
Bipolar10VRange
ADS8517
www.ti.com
.......................................................................................................................................................................................... SLAS527 – SEPTEMBER 2008
TYPICAL CHARACTERISTICS
At fS= 200 kHz, V
POWER-SUPPLY CURRENT INTERNAL REFERENCE VOLTAGE
vs FREE-AIR TEMPERATURE vs FREE-AIR TEMPERATURE
POWER-SUPPLY CURRENT BIPOLAR OFFSET ERROR
vs SAMPLING FREQUENCY vs FREE-AIR TEMPERATURE
= V
DIG
= 5 V, and using internal reference (see Figure 39 ), unless otherwise specified.
ANA
Figure 1. Figure 2.
Figure 3. Figure 4.
BIPOLAR POSITIVE FULL-SCALE ERROR BIPOLAR NEGATIVE FULL-SCALE ERROR
vs FREE-AIR TEMPERATURE vs FREE-AIR TEMPERATURE
Copyright © 2008, Texas Instruments Incorporated Submit Documentation Feedback 7
Figure 5. Figure 6.
Product Folder Link(s): ADS8517
0.2
0.1
0
-0.1
-0.2
Temperature( C)°
Offset(mV)
-50 -25 125 100 75 50 25 0
Unipolar4VRange
0.2
0.1
0
-0.1
-0.2
Temperature( C)°
Offset(mV)
-50 -25 125 100 75 50 25 0
Unipolar5VRange
0.10
0.05
0
-0.05
-0.10
Temperature( C)°
Offset(mV)
-50 -25 125 100 75 50 25 0
Unipolar4VRange
0.10
0.05
0
-0.05
-0.10
Temperature( C)°
Offset(mV)
-50 -25 125 100 75 50 25 0
Unipolar5VRange
110
105
100
95
90
85
80
-80
-85
-90
-95
-100
-105
-110
Temperature( C)°
SFDR,SINAD,andSNR(dB)
THD(dB)
-50 -25 125 100 75 50 25 0
SINAD
SNR
SFDR
THD
f =10kHz,0dB
IN
89.5
89.0
88.5
88.0
87.5
Temperature( C)°
SINAD(dB)
-50 -25 125 100 75 50 25 0
f =100kHz
S
f =150kHz
S
f =10kHz,0dB
IN
f =200kHz
S
f =50kHz
S
ADS8517
SLAS527 – SEPTEMBER 2008 ..........................................................................................................................................................................................
At fS= 200 kHz, V
TYPICAL CHARACTERISTICS (continued)
= V
DIG
UNIPOLAR OFFSET ERROR UNIPOLAR OFFSET ERROR
vs FREE-AIR TEMPERATURE vs FREE-AIR TEMPERATURE
UNIPOLAR FULL-SCALE ERROR UNIPOLAR FULL-SCALE ERROR
vs FREE-AIR TEMPERATURE vs FREE-AIR TEMPERATURE
= 5 V, and using internal reference (see Figure 39 ), unless otherwise specified.
ANA
Figure 7. Figure 8.
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8 Submit Documentation Feedback Copyright © 2008, Texas Instruments Incorporated
Figure 9. Figure 10.
AC PARAMETERS SIGNAL-TO-(NOISE+DISTORTION)
vs FREE-AIR TEMPERATURE vs FREE-AIR TEMPERATURE
Figure 11. Figure 12.
Product Folder Link(s): ADS8517
100
90
80
70
60
50
40
30
20
10
InputSignalFrequency(kHz)
SINAD(dB)
0 2 4 8 10 6 12 14 16 18 20
-60dB
-20dB
0dB
100
90
80
InputSamplingFrequency(kHz)
SNR(dB)
1 100 10
100
90
80
InputSamplingFrequency(kHz)
SINAD(dB)
1 100 10
110
100
90
80
70
InputSamplingFrequency(kHz)
SFDR(dB)
1 100 10
-70
-80
-90
-100
-110
-120
InputSamplingFrequency(kHz)
THD(dB)
1 100 10
110
105
100
95
90
85
80
-80
-85
-90
-95
-100
-105
-110
ESR( )W
SFDR,SINAD,andSNR(dB)
THD(dB)
0 1 4 5 6 7 8 9 10
THD
SNR
SFDR
SINAD
f =10kHz,0dB
IN
3 2
ADS8517
www.ti.com
.......................................................................................................................................................................................... SLAS527 – SEPTEMBER 2008
At fS= 200 kHz, V
vs INPUT FREQUENCY AND INPUT AMPLITUDE vs INPUT FREQUENCY
TYPICAL CHARACTERISTICS (continued)
= V
DIG
SIGNAL-TO-(NOISE+DISTORTION) SIGNAL-TO-NOISE RATIO
SIGNAL-TO-(NOISE+DISTORTION) SPURIOUS-FREE DYNAMIC RANGE
= 5 V, and using internal reference (see Figure 39 ), unless otherwise specified.
ANA
Figure 13. Figure 14.
vs INPUT FREQUENCY vs INPUT FREQUENCY
TOTAL HARMONIC DISTORTION AC PARAMETERS
vs INPUT FREQUENCY vs CAP PIN CAPACITOR ESR
Copyright © 2008, Texas Instruments Incorporated Submit Documentation Feedback 9
Figure 15. Figure 16.
Figure 17. Figure 18.
Product Folder Link(s): ADS8517
110
105
100
95
90
85
80
75
70
-70
-75
-80
-85
-90
-95
-100
-105
-110
Power-SupplyVoltage(V)
SFDR,SINAD,andSNR(dB)
THD(dB)
4.00 4.25 4.50 4.75 5.00 5.25 5.50
THD
SNR
SFDR
SINAD
f =10kHz,0dB
IN
-20
-30
-40
-50
-60
-70
-80
Power-SupplyRippleFrequency(Hz)
OutputRejection(dB)
10 1M 100 1k 10k 100k
2.40
2.35
2.30
2.25
2.20
Temperature( C)°
ConversionTime( s)m
-50 -25 125 100 75 50 25 0
2.0
1.5
1.0
0.5
0
-0.5
-1.0
-1.5
-2.0
Power-SupplyVoltage(V)
INL/DNLMaxandMin(LSB)
4.00 4.25 4.50 4.75 5.00 5.25 5.50
INLMax
INLMin
DNLMin
DNLMax
3
2
1
0
-1
-2
-3
Code
INL(LSB)
0 8192 16384 24576 32768 40960 49152 57344 65535
AllCodesINL
3
2
1
0
-1
-2
-3
Code
DNL(LSB)
0 8192 16384 24576 32768 40960 49152 57344 65535
AllCodesDNL
ADS8517
SLAS527 – SEPTEMBER 2008 ..........................................................................................................................................................................................
At fS= 200 kHz, V
TYPICAL CHARACTERISTICS (continued)
= V
DIG
vs POWER-SUPPLY VOLTAGE vs POWER-SUPPLY RIPPLE FREQUENCY
vs FREE-AIR TEMPERATURE vs POWER-SUPPLY VOLTAGE
= 5 V, and using internal reference (see Figure 39 ), unless otherwise specified.
ANA
AC PARAMETERS OUTPUT REJECTION
Figure 19. Figure 20.
INTEGRAL LINEARITY ERROR AND
CONVERSION TIME DIFFERENTIAL LINEARITY ERROR
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Figure 21. Figure 22.
INTEGRAL LINEARITY ERROR DIFFERENTIAL LINEARITY ERROR
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Figure 23. Figure 24.
Product Folder Link(s): ADS8517
0
-10
-20
-30
-40
-50
-60
-70
-80
-90
-100
-110
-120
-130
Frequency(kHz)
Amplitude(dB)
0 25 50 100 75
4096PointFFT
f =1kHz,0dB
IN
Frequency(kHz)
0 25 50 100 75
4096PointFFT
f =10kHz,0dB
IN
0
-10
-20
-30
-40
-50
-60
-70
-80
-90
-100
-110
-120
-130
Amplitude(dB)
Frequency(kHz)
0 25 50 100 75
4096PointFFT
f =20kHz,0dB
IN
0
-10
-20
-30
-40
-50
-60
-70
-80
-90
-100
-110
-120
-130
Amplitude(dB)
ADS8517
www.ti.com
.......................................................................................................................................................................................... SLAS527 – SEPTEMBER 2008
At fS= 200 kHz, V
TYPICAL CHARACTERISTICS (continued)
= V
DIG
= 5 V, and using internal reference (see Figure 39 ), unless otherwise specified.
ANA
FFT FFT
Figure 25. Figure 26.
FFT
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Figure 27.
Product Folder Link(s): ADS8517
1
2
3
4
5
6
7
8
9
10
11
12
13
14
28
27
26
25
24
23
22
21
20
19
18
17
16
15
ADS8517
+5 V
+
+
ConvertPulse
40nsmin
0.1 m F 10 m F
+
NOTE:(1)NC=notconnected.
B11 B12 B13 B1 4 B15
(MSB)
Pin21
LOW
B3 B4 B5 B6 B7 Pin21
HIGH
NC
(1)
B8 B9 B10
B0
(LSB)
B1 B2
BUSY
R/C
BYTE
± 10 V
2.2 Fm
+5V
2.2 Fm
+1.8V
0.1 Fm
ADS8517
SLAS527 – SEPTEMBER 2008 ..........................................................................................................................................................................................
www.ti.com
BASIC OPERATION
PARALLEL OUTPUT
Figure 28 shows a basic circuit for operating the ADS8517 with a ± 10-V input range and parallel output. Taking
R/ C (pin 22) low for a minimum of 40 ns (5 µ s max) initiates a conversion. BUSY (pin 24) goes low and stays low
until the conversion completes and the output register updates. If BYTE (pin 21) is low, the eight most significant
bits (MSBs) will be valid when BUSY rises; if BYTE is high, the eight least significant bits (LSBs) will be valid
when BUSY rises. Data are output in binary twos complement (BTC) format. BUSY going high can be used to
latch the data. After the first byte has been read, BYTE can be toggled, allowing the remaining byte to be read.
All convert commands are ignored while BUSY is low.
The ADS8517 begins tracking the input signal at the end of the conversion. Allowing 5 µ s between convert
commands assures accurate acquisition of a new signal.
Figure 28. Basic ± 10-V Operation, Both Parallel and Serial Output
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Product Folder Link(s): ADS8517