TEXAS INSTRUMENTS ADS8517 Technical data

ADS8517
ADS8517
SuccessiveApproximationRegister(SAR)
CDAC
Ref
Buffer
BUF
ADC
REF
REF
CAP
R1
IN
40kW20kW
2.5-V
InternalReference
6kW
Parallel
and
Serial
DataOut
and
Control
Clock
40kW
10kW
R2
IN
REFD
Parallel Data
PWRD BYTE BUSY CS R/C SB/BTC TAG SDATA DATACLK
EXT/INT
ADS8517
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.......................................................................................................................................................................................... SLAS527 – SEPTEMBER 2008
16-Bit, 200-kSPS, Low-Power, Sampling ANALOG-TO-DIGITAL CONVERTER
with Internal Reference and Parallel/Serial Interface
1

FEATURES APPLICATIONS

23
200-kHz Minimum Sampling Rate
4-V, 5-V, and ± 10-V Input Ranges with
High-Impedance Input
± 1.5 LSB Max INL
+1.5/ 1 LSB Max/Min DNL, 16 Bits NMC
± 2-mV Max BPZ, ± 0.6 ppm/ ° C BPZ Drift
± 2-mV Max UPZ, ± 0.15 ppm/ ° C UPZ Drift
88.8-dB SINAD with 10-kHz Input
SPI™-Compatible Serial Output With
Daisy-Chain (TAG), SPI Master/Slave Feature
Full Parallel Interface
Binary Twos Complement or Straight Binary
Output Code Formats
Single 4.5-V to 5.5-V Analog Supply, 1.65-V to
5.5-V Interface Supply
Uses Internal 2.5-V or External Reference
No External Precision Resistors Required
Low Power Dissipation (ADC+REF+BUF):
47 mW Typ, 60 mW Max at 200 kSPS
50- µ W Max Power-Down Mode
Pin-Compatible with 16-Bit ADS7807 and
ADS8507 , and 12-Bit ADS7806 and ADS8506
SO-28 Package (TSSOP-28 Available Q2, 2009)
Portable Test Equipment
USB Data Acquisition Module
Medical Equipment
Industrial Process Control
Digital Signal Processing
Instrumentation

DESCRIPTION

The ADS8517 is a complete low-power, single 5-V supply, 16-bit sampling analog-to-digital (A/D) converter. It contains a complete, 16-bit, capacitor-based, successive approximation register (SAR) A/D converter with sample-and-hold, clock, reference, and data interface. The converter can be configured for a variety of input ranges including ± 10 V, 4 V, and 5 V. For most input ranges, the input voltage can swing to 25 V or 25 V without damage to the device.
An SPI-compatible serial interface allows data to be synchronized to an internal or external clock. A full parallel interface using the selectable BYTE pin is also provided to allow the maximum system design flexibility. The ADS8517 is specified at a 200-kHz sampling rate over the industrial 40 ° C to +85 ° C temperature range.
1
2 SPI is a trademark of Motorola, Inc. 3 All other trademarks are the property of their respective owners.
PRODUCTION DATA information is current as of publication date. Products conform to specifications per the terms of the Texas Instruments standard warranty. Production processing does not necessarily include testing of all parameters.

Please be aware that an important notice concerning availability, standard warranty, and use in critical applications of Texas Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet.

Copyright © 2008, Texas Instruments Incorporated
ADS8517
SLAS527 – SEPTEMBER 2008 ..........................................................................................................................................................................................
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These devices have limited built-in ESD protection. The leads should be shorted together or the device placed in conductive foam during storage or handling to prevent electrostatic damage to the MOS gates.
PACKAGE/ORDERING INFORMATION
MINIMUM
RELATIVE NO MINIMUM SPECIFIED
PRODUCT (LSB) CODE (dB) RANGE LEAD DESIGNATOR NUMBER MEDIA, QTY
ADS8517IB ± 1.5 16 87 -40 ° C to +85 ° C
ADS8517I ± 3 15 85 -40 ° C to +85 ° C
ACCURACY MISSING SINAD TEMPERATURE PACKAGE- PACKAGE ORDERING TRANSPORT
SO-28 DW
TSSOP-28
TSSOP-28
(2)
SO-28 DW
(2)
(1)
ADS8517IBDW Tube, 20
ADS8517IBDWR Tape and Reel, 1000
PW
PW
ADS8517IBPW Tube, 50
ADS8517IBPWR Tape and Reel, 2000
ADS8517IDW Tube, 20
ADS8517IDWR Tape and Reel, 1000
ADS8517W Tube, 50
ADS8517IPWR Tape and Reel, 2000
(1) For the most current package and ordering information, see the Package Option Addendum at the end of this document, or see the TI
website at www.ti.com.
(2) TSSOP-28 (PW) package available Q2, 2009.

ABSOLUTE MAXIMUM RATINGS

(1) (2)
Over operating free-air temperature range (unless otherwise noted).
PARAMETER UNIT
R1
IN
Analog inputs R2
IN
REF +V
ANA
DGND, AGND2 ± 0.3 V V
Ground voltage differences
ANA
V
to V
DIG
ANA
V
DIG
Digital inputs -0.3 V to +V Maximum junction temperature +165 ° C Storage temperature range – 65 ° C to +150 ° C Internal power dissipation 700 mW Lead temperature (soldering, 1.6 mm from case, 10 seconds) +260 ° C
(1) Stresses above those listed under Absolute Maximum Ratings may cause permanent damage to the device. Exposure to absolute
maximum conditions for extended periods may affect device reliability.
(2) All voltage values are with respect to network ground terminal.
± 25 V ± 25 V
+ 0.3 V to AGND2 0.3 V
6 V
0.3 V 6 V
+ 0.3 V
DIG

ELECTRICAL CHARACTERISTICS

At TA= -40 ° C to +85 ° C, fS= 200 kHz, V
PARAMETER TEST CONDITIONS MIN TYP MAX MIN TYP MAX UNIT
Resolution 16 16 Bits
ANALOG INPUT
Voltage ranges See Table 1 0 5 0 5 V
Impedance See Table 1 Capacitance 45 45 pF
(1) Shaded cells indicate different specifications for high-grade version of the device.
2 Submit Documentation Feedback Copyright © 2008, Texas Instruments Incorporated
= V
DIG
= 5 V, using internal reference (see Figure 39 ), unless otherwise noted.
ANA
ADS8517I ADS8517IB
– 10 10 – 10 10
0 4 0 4
Product Folder Link(s): ADS8517
(1)
ADS8517
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.......................................................................................................................................................................................... SLAS527 – SEPTEMBER 2008
ELECTRICAL CHARACTERISTICS (continued)
At TA= -40 ° C to +85 ° C, fS= 200 kHz, V
PARAMETER TEST CONDITIONS MIN TYP MAX MIN TYP MAX UNIT
THROUGHPUT SPEED
Conversion time 2.5 2.5 µ s Complete cycle Acquire and convert 5 5 µ s Throughput rate 200 200 kHz
DC ACCURACY
INL Integral linearity error – 3 3 – 1.5 1.5 LSB DNL Differential linearity error – 2 3 – 1 1.5 LSB
No missing codes 15 16 Bits Transition noise Gain error ± 0.2 ± 0.1 %
Full-scale error
Full-scale error drift
BPZ Bipolar zero error ± 10 V range – 5 ± 1 5 – 2 ± 1 2 mV
Bipolar zero error drift ± 10 V range ± 0.6 ± 0.6 ppm/ ° C
UPZ Unipolar zero error 0 V to 5 V, 0 V to 4 V ranges – 3 ± 0.1 3 – 2 ± 0.1 2 mV
Unipolar zero error drift 0 V to 5 V, 0 V to 4 V ranges ± 0.15 ± 0.15 ppm/ ° C Recovery time to rated accuracy
from power down Power-supply sensitivity
(V
= V
DIG
AC ACCURACY
SFDR Spurious-free dynamic range fIN= 10 kHz, ± 10 V 92 100 96 101 dB THD Total harmonic distortion fIN= 10 kHz, ± 10 V – 97 – 92 – 98 – 95 dB
SINAD Signal-to-(noise+distortion) dB
SNR Signal-to-noise ratio fIN= 10 kHz, ± 10 V 85 88 88 89 dB
SNR usable bandwidth SNR full-power bandwidth ( – 3 dB) fIN= 10 kHz, ± 10 V 600 600 kHz
SAMPLING DYNAMICS
Aperture delay 40 40 ns Aperture jitter 20 20 ps Transient response FS step 5 5 µ s Overvoltage recovery
(2) LSB means Least Significant Bit. One LSB for the ± 10 V input range is 305 µ V. (3) Typical rms noise at worst-case transitions. (4) Full-scale error is the worst case of – Full Scale or +Full Scale untrimmed deviation from ideal first and last code transitions, divided by
the transition voltage (not divided by the full-scale range) and includes the effect of offset error.
(5) This is the time delay after the ADS8517 is brought out of Power-Down mode until all internal settling occurs and the analog input is
acquired to rated accuracy. A Convert command after this delay will yield accurate results. (6) All specifications in dB are referred to a full-scale input. (7) Usable bandwidth defined as full-scale input frequency at which Signal-to-(Noise + Distortion) degrades to 60 dB. (8) Recovers to specified performance after 2 x FS input overvoltage.
(3)
(4)
(5)
= VS)
ANA
(7)
(8)
= V
DIG
Internal reference – 0.75 0.75 – 0.75 0.75 % External 2.5-V reference – 0.75 0.75 – 0.75 0.75 % Internal reference ± 9 ± 9 ppm/ ° C External 2.5-V reference ± 1 ± 1 ppm/ ° C
2.2- µ F capacitor to CAP 1 1 ms +4.75 V < V
+4.5 V < V
fIN= 10 kHz, ± 10 V 85 88 87 88.5 – 60 dB Input 29 29
fIN= 10 kHz, ± 10 V 130 130 kHz
= 5 V, using internal reference (see Figure 39 ), unless otherwise noted.
ANA
ADS8517I ADS8517IB
0.9 0.8 LSB
< +5.25 V – 8 +8 – 6 +6
ANA
< +5.5 V – 20 +20 – 12 +12
ANA
750 750 ns
(1)
(2)
LSB
(6)
Copyright © 2008, Texas Instruments Incorporated Submit Documentation Feedback 3
Product Folder Link(s): ADS8517
ADS8517
SLAS527 – SEPTEMBER 2008 ..........................................................................................................................................................................................
ELECTRICAL CHARACTERISTICS (continued)
At TA= -40 ° C to +85 ° C, fS= 200 kHz, V
PARAMETER TEST CONDITIONS MIN TYP MAX MIN TYP MAX UNIT
REFERENCE
Internal reference voltage No load 2.48 2.5 2.52 2.48 2.5 2.52 V Internal reference source current
(must use external buffer) Internal reference drift 8 8 ppm/ ° C External reference voltage range
for specified linearity External reference current drain External 2.5-V reference 100 100 µ A
DIGITAL INPUTS
V
Low-level input voltage
IL
V
High-level input voltage
IH
I
Low-level input current VIL= 0 V ± 10 ± 10 µ A
IL
I
High-level input current VIH= 5 V ± 10 ± 10 µ A
IH
DIGITAL OUTPUTS
Data format - Parallel 16-bits in 2-bytes, Serial Data coding - Binary twos complement or straight binary
V
Low-level output voltage 0.45 0.45 V
OL
V
High-level output voltage V
OH
Leakage current ± 5 ± 5 µ A Output capacitance High-Z state 15 15 pF
DIGITAL TIMING
Bus access time RL= 3.3 k , CL= 50 pF 83 83 ns Bus relinquish time RL= 3.3 k , CL= 10 pF 83 83 ns
POWER SUPPLIES
V
Interface voltage 1.65 1.8 5.5 1.65 1.8 5.5 V
DIG
V
ADC core voltage 4.5 5 5.5 4.5 5 5.5 V
ANA
I
Interface current V
DIG
I
ADC core current V
ANA
Power dissipation
TEMPERATURE RANGE
Specified performance – 40 +85 – 40 +85 ° C Derated performance – 55 +125 – 55 +125 ° C Storage temperature – 65 +150 – 65 +150 ° C
θ
Thermal impedance ° C/W
JA
(9) TTL-compatible at 5V supply.
(9)
(9)
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= V
DIG
= 5 V, using internal reference (see Figure 39 ), unless otherwise noted.
ANA
ADS8517I ADS8517IB
(1)
1 1 µ A
2.3 2.5 2.7 2.3 2.5 2.7 V
V
= 1.65 V to 5.5 V – 0.3 0.6 – 0.3 0.6 V
DIG
V
= 1.65 V to 5.5 V 0.5 x V
DIG
I
= 1.6mA,
SINK
V
= 1.65V to 5.5V
DIG
I
= 500 µ A,
SOURCE
V
= 1.65V to 5.5V
DIG
DIG
– 0.45 V
DIG
V
+ 0.3 0.5 x V
DIG
DIG
– 0.45 V
DIG
V
DIG
+ 0.3 V
High-Z state, V
= 0 V to V
OUT
= 5 V 0.3 0.3 mA
DIG
= 5 V 9 9 mA
ANA
V
= V
ANA
fS= 200 kHz
DIG
= 5 V,
DIG
47 60 47 60 mW
REFD high with BUF on 42 42 mW PWRD and REFD high 50 50 µ W
TSSOP 62 62 SO 46 46
Table 1. Analog Input Range Connections (see Figure 38 and Figure 39 )
ANALOG INPUT
RANGE CONNECT R1
± 10 V V 0 V to 5 V AGND V 0 V to 4 V V
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VIA 200 TO CONNECT R2
IN
IN
IN
Product Folder Link(s): ADS8517
VIA 100 TO IMPEDANCE
IN
CAP 45.7 k
IN
V
IN
20.0 k
21.4 k
V
DIG
V
ANA
BUSY
CS
R/C
BYTE
TAG
SDATA
DATACLK
D0
D1
D2
R1
IN
AGND1
CAP
REF
AGND2
D7
D6
D5
D4
D3
DGND
1
2
3
4
5
6
7
8
9
10
11
12
13
14
28
27
26
25
24
23
22
21
20
19
18
17
16
15
ADS8517
R2
IN
SB/BTC
EXT/INT
REFD
PWRD
ADS8517
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.......................................................................................................................................................................................... SLAS527 – SEPTEMBER 2008

PIN CONFIGURATION

DW, PW PACKAGES
SO-28, TSSOP-28
(TOP VIEW)
(1)
(1) TSSOP-28 (PW) package available Q2, 2009.
Pin Assignments
PIN
NAME NO. I/O DESCRIPTION
R1
IN
1 Analog Input.
AGND1 2 Analog sense ground. Used internally as ground reference point. Minimal current flow
R2
IN
3 Analog Input.
CAP 4 Reference buffer output. 2.2- µ F tantalum capacitor to ground. REF 5
AGND2 6 Analog ground
SB/ BTC 7 I high, data are output in a straight binary format. If low, data are output in a binary twos
EXT/ INT 8 I
D7 9 O D6 10 O Data bit 6 if BYTE is high. Data bit 14 if BYTE is low. High-Z when CS is high and/or R/ C is low.
D5 11 O Data bit 5 if BYTE is high. Data bit 13 if BYTE is low. High-Z when CS is high and/or R/ C is low. D4 12 O Data bit 4 if BYTE is high. Data bit 12 if BYTE is low. High-Z when CS is high and/or R/ C is low. D3 13 O Data bit 3 if BYTE is high. Data bit 11 if BYTE is low. High-Z when CS is high and/or R/ C is low.
DGND 14 Digital ground
D2 15 O Data bit 2 if BYTE is high. Data bit 10 if BYTE is low. High-Z when CS is high and/or R/ C is low. D1 16 O Data bit 1 if BYTE is high. Data bit 9 if BYTE is low. High-Z when CS is high and/or R/ C is low.
Copyright © 2008, Texas Instruments Incorporated Submit Documentation Feedback 5
DIGITAL
Reference input/output. Outputs internal 2.5-V reference. Can also be driven by external system reference. In both cases, bypass to ground with a 2.2- µ F tantalum capacitor.
Output mode select. Selects straight binary or binary twos complement for output data format. If complement format.
External/internal data select. Selects external/internal data clock for transmitting data. If high, data is output synchronized to the clock input on DATACLK. If low, a convert command initiates the transmission of the data from the previous conversion, along with 16-clock pulses output on DATACLK.
Data bit 7 if BYTE is high. Data bit 15 (MSB) if BYTE is low. High-Z when CS is high and/or R/ C is low. Leave unconnected when using serial output.
Product Folder Link(s): ADS8517
ADS8517
SLAS527 – SEPTEMBER 2008 ..........................................................................................................................................................................................
Pin Assignments (continued)
D0 17 O
DATACLK 18 I/O synchronized to this clock. If EXT/ INT is low, DATACLK transmits 16 pulses after each
SDATA 19 O TAG as long as CS is low and R/ C is high. If EXT/ INT is low, data are valid on both the rising
TAG 20 I
BYTE 21 I
R/ C 22 I into the hold state and starts a conversion. With EXT/ INT is low, the transmission of the data
CS 23 I conversion. If EXT/ INT is low, this same falling edge will start the transmission of serial data
BUSY 24 O
PWRD 25 I
REFD 26 I
V
ANA
V
DIG
27 ADC core supply. Nominally +5 V. Decouple with 0.1- µ F ceramic and 10- µ F tantalum capacitors. 28 I/O supply. Nominally +1.8 V.
Data bit 0 (LSB) if BYTE is high. Data bit 8 if BYTE is low. High-Z when CS is high and/or R/ C is low.
Data clock. Either an input or an output, depending on the EXT/ INT level. Output data are conversion, and then remains low between conversions.
Serial data output. Data are synchronized to DATACLK, with the format determined by the level of SB/ BTC. In the external clock mode, after 16 bits of data, the ADC outputs the level input on
and falling edges of DATACLK, and between conversions SDATA stays at the level of the TAG input when the conversion was started.
Tag input for use in the external clock mode. If EXT is high, digital data input from TAG is output on DATA with a delay that depends on the external clock mode.
Byte select. Selects the eight most significant bits (low) or eight least significant bits (high) on parallel output pins.
Read/convert input. With CS low, a falling edge on R/ C puts the internal sample-and-hold circuit results from the previous conversion is initiated.
Chip select. Internally ORed with R/ C. If R/ C is low, a falling edge on CS initiates a new results from the previous conversion.
Busy output. At the start of a conversion, BUSY goes low and stays low until the conversion is completed and the digital outputs have been updated.
Power-down input. If high, conversions are inhibited and power consumption is significantly reduced. Results from the previous conversion are maintained in the output shift register.
Reference disable. REFD high shuts down the internal reference. The external reference is required for conversions.
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Product Folder Link(s): ADS8517
10.0
9.5
9.0
8.5
8.0
Temperature( C)°
P
ower
-SupplyCurrent(mA)
-50 -25 0 25 50 75 100 125
2.520
2.515
2.510
2.505
2.500
2.495
2.490
2.485
2.480
Temperature( C)°
InternalReferenceV
oltage(V)
-50 -25 0 125100755025
10.0
9.5
9.0
8.5
8.0
SamplingFrequency(kHz)
Power
-SupplyCurrent(mA)
50 100 150 200
2
1
0
-1
-2
Temperature( C)°
Offset(mV)
-50 -25 1251007550250
Bipolar 10VRange±
0.10
0.05
0
Temperature(°C)
PositiveFull-ScaleError(%)
-40 -50 1251007550250
Bipolar10VRange
0
-0.05
-0.10
Temperature( C)°
NegativeFull-ScaleError(%)
-50 -45 1251007550250
Bipolar10VRange
ADS8517
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.......................................................................................................................................................................................... SLAS527 – SEPTEMBER 2008

TYPICAL CHARACTERISTICS

At fS= 200 kHz, V
POWER-SUPPLY CURRENT INTERNAL REFERENCE VOLTAGE
vs FREE-AIR TEMPERATURE vs FREE-AIR TEMPERATURE
POWER-SUPPLY CURRENT BIPOLAR OFFSET ERROR vs SAMPLING FREQUENCY vs FREE-AIR TEMPERATURE
= V
DIG
= 5 V, and using internal reference (see Figure 39 ), unless otherwise specified.
ANA
Figure 1. Figure 2.
Figure 3. Figure 4.
BIPOLAR POSITIVE FULL-SCALE ERROR BIPOLAR NEGATIVE FULL-SCALE ERROR
vs FREE-AIR TEMPERATURE vs FREE-AIR TEMPERATURE
Copyright © 2008, Texas Instruments Incorporated Submit Documentation Feedback 7
Figure 5. Figure 6.
Product Folder Link(s): ADS8517
0.2
0.1
0
-0.1
-0.2
Temperature( C)°
Offset(mV)
-50 -25 1251007550250
Unipolar4VRange
0.2
0.1
0
-0.1
-0.2
Temperature( C)°
Offset(mV)
-50 -25 1251007550250
Unipolar5VRange
0.10
0.05
0
-0.05
-0.10
Temperature( C)°
Offset(mV)
-50 -25 1251007550250
Unipolar4VRange
0.10
0.05
0
-0.05
-0.10
Temperature( C)°
Offset(mV)
-50 -25 1251007550250
Unipolar5VRange
110
105
100
95
90
85
80
-80
-85
-90
-95
-100
-105
-110
Temperature( C)°
SFDR,SINAD,andSNR(dB)
THD(dB)
-50 -25 1251007550250
SINAD
SNR
SFDR
THD
f =10kHz,0dB
IN
89.5
89.0
88.5
88.0
87.5
Temperature( C)°
SINAD(dB)
-50 -25 1251007550250
f =100kHz
S
f =150kHz
S
f =10kHz,0dB
IN
f =200kHz
S
f =50kHz
S
ADS8517
SLAS527 – SEPTEMBER 2008 ..........................................................................................................................................................................................
At fS= 200 kHz, V
TYPICAL CHARACTERISTICS (continued)
= V
DIG
UNIPOLAR OFFSET ERROR UNIPOLAR OFFSET ERROR
vs FREE-AIR TEMPERATURE vs FREE-AIR TEMPERATURE
UNIPOLAR FULL-SCALE ERROR UNIPOLAR FULL-SCALE ERROR
vs FREE-AIR TEMPERATURE vs FREE-AIR TEMPERATURE
= 5 V, and using internal reference (see Figure 39 ), unless otherwise specified.
ANA
Figure 7. Figure 8.
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Figure 9. Figure 10.
AC PARAMETERS SIGNAL-TO-(NOISE+DISTORTION)
vs FREE-AIR TEMPERATURE vs FREE-AIR TEMPERATURE
Figure 11. Figure 12.
Product Folder Link(s): ADS8517
100
90
80
70
60
50
40
30
20
10
InputSignalFrequency(kHz)
SINAD(dB)
0 2 4 8 106 12 14 16 18 20
-60dB
-20dB
0dB
100
90
80
InputSamplingFrequency(kHz)
SNR(dB)
1 10010
100
90
80
InputSamplingFrequency(kHz)
SINAD(dB)
1 10010
110
100
90
80
70
InputSamplingFrequency(kHz)
SFDR(dB)
1 10010
-70
-80
-90
-100
-110
-120
InputSamplingFrequency(kHz)
THD(dB)
1 10010
110
105
100
95
90
85
80
-80
-85
-90
-95
-100
-105
-110
ESR( )W
SFDR,SINAD,andSNR(dB)
THD(dB)
0 1 4 5 6 7 8 9 10
THD
SNR
SFDR
SINAD
f =10kHz,0dB
IN
32
ADS8517
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.......................................................................................................................................................................................... SLAS527 – SEPTEMBER 2008
At fS= 200 kHz, V
vs INPUT FREQUENCY AND INPUT AMPLITUDE vs INPUT FREQUENCY
TYPICAL CHARACTERISTICS (continued)
= V
DIG
SIGNAL-TO-(NOISE+DISTORTION) SIGNAL-TO-NOISE RATIO
SIGNAL-TO-(NOISE+DISTORTION) SPURIOUS-FREE DYNAMIC RANGE
= 5 V, and using internal reference (see Figure 39 ), unless otherwise specified.
ANA
Figure 13. Figure 14.
vs INPUT FREQUENCY vs INPUT FREQUENCY
TOTAL HARMONIC DISTORTION AC PARAMETERS
vs INPUT FREQUENCY vs CAP PIN CAPACITOR ESR
Copyright © 2008, Texas Instruments Incorporated Submit Documentation Feedback 9
Figure 15. Figure 16.
Figure 17. Figure 18.
Product Folder Link(s): ADS8517
110
105
100
95
90
85
80
75
70
-70
-75
-80
-85
-90
-95
-100
-105
-110
Power-SupplyVoltage(V)
SFDR,SINAD,andSNR(dB)
THD(dB)
4.00 4.25 4.50 4.75 5.00 5.25 5.50
THD
SNR
SFDR
SINAD
f =10kHz,0dB
IN
-20
-30
-40
-50
-60
-70
-80
Power-SupplyRippleFrequency(Hz)
OutputRejection(dB)
10 1M100 1k 10k 100k
2.40
2.35
2.30
2.25
2.20
Temperature( C)°
ConversionTime( s)m
-50 -25 1251007550250
2.0
1.5
1.0
0.5
0
-0.5
-1.0
-1.5
-2.0
Power-SupplyVoltage(V)
INL/DNLMaxandMin(LSB)
4.00 4.25 4.50 4.75 5.00 5.25 5.50
INLMax
INLMin
DNLMin
DNLMax
3
2
1
0
-1
-2
-3
Code
INL(LSB)
0 8192 16384 24576 32768 40960 49152 57344 65535
AllCodesINL
3
2
1
0
-1
-2
-3
Code
DNL(LSB)
0 8192 16384 24576 32768 40960 49152 57344 65535
AllCodesDNL
ADS8517
SLAS527 – SEPTEMBER 2008 ..........................................................................................................................................................................................
At fS= 200 kHz, V
TYPICAL CHARACTERISTICS (continued)
= V
DIG
vs POWER-SUPPLY VOLTAGE vs POWER-SUPPLY RIPPLE FREQUENCY
vs FREE-AIR TEMPERATURE vs POWER-SUPPLY VOLTAGE
= 5 V, and using internal reference (see Figure 39 ), unless otherwise specified.
ANA
AC PARAMETERS OUTPUT REJECTION
Figure 19. Figure 20.
INTEGRAL LINEARITY ERROR AND
CONVERSION TIME DIFFERENTIAL LINEARITY ERROR
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Figure 21. Figure 22.
INTEGRAL LINEARITY ERROR DIFFERENTIAL LINEARITY ERROR
10 Submit Documentation Feedback Copyright © 2008, Texas Instruments Incorporated
Figure 23. Figure 24.
Product Folder Link(s): ADS8517
0
-10
-20
-30
-40
-50
-60
-70
-80
-90
-100
-110
-120
-130
Frequency(kHz)
Amplitude(dB)
0 25 50 10075
4096PointFFT
f =1kHz,0dB
IN
Frequency(kHz)
0 25 50 10075
4096PointFFT
f =10kHz,0dB
IN
0
-10
-20
-30
-40
-50
-60
-70
-80
-90
-100
-110
-120
-130
Amplitude(dB)
Frequency(kHz)
0 25 50 10075
4096PointFFT
f =20kHz,0dB
IN
0
-10
-20
-30
-40
-50
-60
-70
-80
-90
-100
-110
-120
-130
Amplitude(dB)
ADS8517
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.......................................................................................................................................................................................... SLAS527 – SEPTEMBER 2008
At fS= 200 kHz, V
TYPICAL CHARACTERISTICS (continued)
= V
DIG
= 5 V, and using internal reference (see Figure 39 ), unless otherwise specified.
ANA
FFT FFT
Figure 25. Figure 26.
FFT
Copyright © 2008, Texas Instruments Incorporated Submit Documentation Feedback 11
Figure 27.
Product Folder Link(s): ADS8517
1
2
3
4
5
6
7
8
9
10
11
12
13
14
28
27
26
25
24
23
22
21
20
19
18
17
16
15
ADS8517
+5 V
+
+
ConvertPulse
40nsmin
0.1 mF 10 mF
+
NOTE:(1)NC=notconnected.
B11B12B13B1 4B15
(MSB)
Pin21
LOW
B3B4B5B6B7Pin21
HIGH
NC
(1)
B8B9B10
B0
(LSB)
B1B2
BUSY
R/C
BYTE
±10 V
2.2 Fm
+5V
2.2 Fm
+1.8V
0.1 Fm
ADS8517
SLAS527 – SEPTEMBER 2008 ..........................................................................................................................................................................................
www.ti.com

BASIC OPERATION

PARALLEL OUTPUT

Figure 28 shows a basic circuit for operating the ADS8517 with a ± 10-V input range and parallel output. Taking
R/ C (pin 22) low for a minimum of 40 ns (5 µ s max) initiates a conversion. BUSY (pin 24) goes low and stays low until the conversion completes and the output register updates. If BYTE (pin 21) is low, the eight most significant bits (MSBs) will be valid when BUSY rises; if BYTE is high, the eight least significant bits (LSBs) will be valid when BUSY rises. Data are output in binary twos complement (BTC) format. BUSY going high can be used to latch the data. After the first byte has been read, BYTE can be toggled, allowing the remaining byte to be read. All convert commands are ignored while BUSY is low.
The ADS8517 begins tracking the input signal at the end of the conversion. Allowing 5 µ s between convert commands assures accurate acquisition of a new signal.
Figure 28. Basic ± 10-V Operation, Both Parallel and Serial Output
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Product Folder Link(s): ADS8517
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