12−Bit
Pipeline
ADC Core
S&H
CLK+
CLK
−
CLKOUT
VIN+
V
IN
−
Digital
Error
Correction
Timing Circuitry
Internal
Reference
Control Logic
Serial Programming Register
Output
Control
AV
DD
D0
.
.
.
D11
CM
OVR
DFS
ADS5521
A
GND
DR
GND
SEN SDATA
SCLK
DRV
DD
Analog-To-Digital Converter
ADS5521
SBAS309A – MAY 2004 – REVISED APRIL 2005
12-Bit, 105MSPS
FEATURES
• 12-Bit Resolution
• 105MSPS Sample Rate
• High SNR: 70dBFS at 100MHz f
• High SFDR: 86dBc at 100MHz f
• 2.3V
• Internal Voltage Reference
• 3.3V Single-Supply Voltage
• Analog Power Dissipation: 571mW
– Output Buffer Power: 165mW
• Pin-Compatible with:
ADS5500 (14-Bit, 125MSPS)
ADS5541 (14-Bit, 105MSPS)
ADS5542 (14-Bit, 80MSPS)
ADS5520 (12-Bit, 125MSPS)
ADS5522 (12-Bit, 80MSPS)
Differential Input Voltage
PP
IN
IN
• TQFP-64 PowerPAD™ Package
• Recommended Op Amps:
THS3201, THS3202, THS4503, THS4509,
THS9001, OPA695, OPA847
APPLICATIONS
• Wireless Communication
– Communication Receivers
– Base Station Infrastructure
• Test and Measurement Instrumentation
• Single and Multichannel Digital Receivers
• Communication Instrumentation
– Radar
– Infrared
• Video and Imaging
• Medical Equipment
• Military Equipment
DESCRIPTION
The ADS5521 is a high-performance, 12-bit, 105MSPS analog-to-digital converter (ADC). To provide a complete
converter solution, it includes a high-bandwidth linear sample-and-hold stage (S&H) and internal reference.
Designed for applications demanding the highest speed and highest dynamic performance in very little space,
the ADS5521 has excellent analog power dissipation of 571mW and output buffer power dissipation of 165mW
from a 3.3V single-supply voltage. This allows an even higher system integration density. The provided internal
reference simplifies system design requirements. Parallel CMOS-compatible output ensures seamless interfacing
with common logic.
The ADS5521 is available in a 64-pin TQFP PowerPAD package and is pin-compatible with the ADS5500,
ADS5541, ADS5542, ADS5520, and ADS5522. This device is specified over the full temperature range of –40°C
to +85°C.
PowerPAD is a trademark of Texas Instruments.
PRODUCTION DATA information is current as of publication date.
Products conform to specifications per the terms of the Texas
Instruments standard warranty. Production processing does not
necessarily include testing of all parameters.
Please be aware that an important notice concerning availability, standard warranty, and use in critical applications of Texas
Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet.
Copyright © 2004–2005, Texas Instruments Incorporated
ADS5521
SBAS309A – MAY 2004 – REVISED APRIL 2005
This integrated circuit can be damaged by ESD. Texas Instruments recommends that all integrated
circuits be handled with appropriate precautions. Failure to observe proper handling and installation
procedures can cause damage.
ESD damage can range from subtle performance degradation to complete device failure. Precision
integrated circuits may be more susceptible to damage because very small parametric changes could
cause the device not to meet its published specifications.
ORDERING INFORMATION
(1)
SPECIFIED
PACKAGE TEMPERATURE PACKAGE ORDERING TRANSPORT
PRODUCT PACKAGE-LEAD DESIGNATOR RANGE MARKING NUMBER MEDIA, QUANTITY
ADS5521 PAP –40C to +85C ADS5521I
HTQFP-64
PowerPAD
(2)
ADS5521IPAP Tray, 160
ADS5521IPAPR Tape and Reel, 1000
(1) For the most current package and ordering information, see the Package Option Addendum, or see the TI web site at www.ti.com .
(2) Thermal pad size: 3.5mm x 3.5mm (min), 4mm x 4mm (max). θJA= 21.47 ° C/W and θJC= 2.99 ° C/W, when used with 2 oz. copper trace
and pad soldered directly to a JEDEC standard, four-layer, 3 in x 3 in PCB.
ABSOLUTE MAXIMUM RATINGS
over operating free-air temperature range (unless otherwise noted)
AV
to A
Supply Voltage
Analog input to A
Logic input to DR
Digital data output to DR
DD
A
GND
GND
GND
GND
, DRV
GND
to DR
GND
Operating temperature range –40 to +85 °C
Junction temperature +105 °C
Storage temperature range –65 to +150 °C
(1) Stresses above these ratings may cause permanent damage. Exposure to absolute maximum conditions for extended periods may
degrade device reliability. These are stress ratings only, and functional operation of the device at these or any other conditions beyond
those specified is not implied.
to DR
DD
(1)
ADS5521 UNIT
GND
–0.3 to +3.7 V
±0.1 V
–0.3 to minimum (AVDD + 0.3, 3.6) V
–0.3 to DRV
–0.3 to DRV
DD
DD
V
V
RECOMMENDED OPERATING CONDITIONS
PARAMETER MIN TYP MAX UNIT
Supplies
Analog supply voltage, AV
Output driver supply voltage, DRV
Analog input
Differential input range 2.3 V
Input common-mode voltage, V
Digital Output
Maximum output load 10 pF
Clock Input
ADCLK input sample rate (sine wave) 1/t
Clock amplitude, sine wave, differential
Clock duty cycle
Open free-air temperature range –40 +85 °C
(3)
DD
DD
(1)
CM
C
(2)
DLL ON 60 105 MSPS
DLL OFF 2 80 MSPS
(1) Input common-mode should be connected to CM.
(2) See Figure 48 for more information.
(3) See Figure 47 for more information.
2
3.0 3.3 3.6 V
3.0 3.3 3.6 V
1.45 1.55 1.65 V
1 3 V
50 %
PP
PP
ADS5521
SBAS309A – MAY 2004 – REVISED APRIL 2005
ELECTRICAL CHARACTERISTICS
Typical values given at TA= +25 ° C, min and max specified over the full temperature range of –40 ° C to +85 ° C, AV
DRV
= 3.3V, sampling rate = 105MSPS, 50% clock duty cycle, DLL On, 3V
DD
differential clock, and –1dBFS differential
PP
input, unless otherwise noted.
PARAMETER CONDITIONS MIN TYP MAX UNIT
Resolution 12 Bits
Analog Inputs
Differential input range 2.3 V
Differential input capacitance See Figure 39 4 pF
Analog input common-mode current
(per input)
Analog input bandwidth Source impedance = 50 Ω 750 MHz
Voltage overload recovery time 4
Internal Reference Voltages
Reference bottom voltage, V
Reference top voltage, V
REFM
REFP
Reference error –4 ±0.9 +4 %
Common-mode voltage output, V
CM
1.50 1.55 1.60 V
Dynamic DC Characteristics and Accuracy
No missing codes Tested
Differential nonlinearity error, DNL fIN= 55MHz –0.5 ±0.25 +0.5 LSB
Integral nonlinearity error, INL fIN= 55MHz –1.5 ±0.55 +1.5 LSB
Offset error ±1.5 mV
Offset temperature coefficient 0.02 %/°C
DC power-supply rejection ratio, DC PSRR 0.25 mV/V
∆ offset error/ ∆ AV
AV
= 3.6V
DD
from AV
DD
DD
= 3.0V to
Gain error ±0.3 %FS
Gain temperature coefficient –0.02 ∆ %/°C
Dynamic AC Characteristics
fIN= 10MHz 71 dBFS
fIN= 55MHz
+25°C to +85°C 68.0 70.5 dBFS
Full temp range 66.8 69.0 dBFS
Signal-to-noise ratio. SNR fIN= 70MHz 70.3 dBFS
fIN= 100MHz 70.0 dBFS
fIN= 150MHz 69.3 dBFS
fIN= 220MHz 67.8 dBFS
RMS idle channel noise Input tied to common-mode 0.32 LSB
fIN= 10MHz 83.0 dBc
fIN= 55MHz
Room temp 78.0 86.0 dBc
Full temp range 76.0 85.0 dBc
Spurious-free dynamic range, SFDR fIN= 70MHz 81.0 dBc
fIN= 100MHz 86.0 dBc
fIN= 150MHz 75.0 dBc
fIN= 220MHz 72.0 dBc
250 µA
1.0 V
2.15 V
=
DD
PP
Clock
cycles
3
ADS5521
SBAS309A – MAY 2004 – REVISED APRIL 2005
ELECTRICAL CHARACTERISTICS (continued)
Typical values given at TA= +25 ° C, min and max specified over the full temperature range of –40 ° C to +85 ° C, AV
DRV
input, unless otherwise noted.
= 3.3V, sampling rate = 105MSPS, 50% clock duty cycle, DLL On, 3V
DD
PARAMETER CONDITIONS MIN TYP MAX UNIT
fIN= 10MHz 90.0 dBc
fIN= 55MHz
Second-harmonic, HD2 fIN= 70MHz 81.0 dBc
fIN= 100MHz 88.0 dBc
fIN= 150MHz 75.0 dBc
fIN= 220MHz 72.0 dBc
fIN= 10MHz 83.0 dBc
fIN= 55MHz
Third-harmonic, HD3 fIN= 70MHz 87.0 dBc
fIN= 100MHz 86.0 dBc
fIN= 150MHz 80.0 dBc
fIN= 220MHz 78.0 dBc
Worst-harmonic/spur (other than HD2 and
HD3)
Signal-to-noise + distortion, SINAD fIN= 70MHz 69.6 dBFS
Total harmonic distortion, THD fIN= 70MHz 78.0 dBc
Effective number of bits, ENOB fIN= 55MHz 11.3 Bits
Two-tone intermodulation distortion, IMD f = 50.1MHz, 55.1MHz (-7dBFS each tone) 96.6 dBFS
fIN= 55MHz 87.0 dBc
fIN= 10MHz 70.7 dBFS
fIN= 55MHz
fIN= 100MHz 69.3 dBFS
fIN= 150MHz 68.2 dBFS
fIN= 220MHz 65.8 dBFS
fIN= 10MHz 79.0 dBc
fIN= 55MHz
fIN= 100MHz 84.0 dBc
fIN= 150MHz 74.0 dBc
fIN= 220MHz 70.3 dBc
f = 10.1MHz, 15.1MHz (-7dBFS each tone) 94.6 dBFS
f = 150.1MHz, 155.1MHz (-7dBFS each tone) 84.7 dBFS
Room temp 78.0 86.0 dBc
Full temp range 76.0 85.0 dBc
Room temp 78.0 88.0 dBc
Full temp range 76.0 87.0 dBc
Room temp 67.0 70.0 dBFS
Full temp range 65.8 68.5 dBFS
Room temp 76.0 83.0 dBc
Full temp range 74.0 82.0 dBc
differential clock, and –1dBFS differential
PP
=
DD
4
ADS5521
SBAS309A – MAY 2004 – REVISED APRIL 2005
ELECTRICAL CHARACTERISTICS (continued)
Typical values given at TA= +25 ° C, min and max specified over the full temperature range of –40 ° C to +85 ° C, AV
DRV
= 3.3V, sampling rate = 105MSPS, 50% clock duty cycle, DLL On, 3V
DD
differential clock, and –1dBFS differential
PP
input, unless otherwise noted.
PARAMETER CONDITIONS MIN TYP MAX UNIT
Power Supply
Total supply current, ICC fIN= 55MHz 223 250 mA
Analog supply current, IAVDD fIN= 55MHz 173 185 mA
Output buffer supply current, IDRVDD fIN= 55MHz 50 65 mA
Analog only 571 611 mW
Power dissipation
Output buffer power with 10pF load on digital
output to ground
165 215 mW
Standby power With Clocks running 180 250 mW
DIGITAL CHARACTERISTICS
Valid over full temperature range of T
otherwise noted.
PARAMETER CONDITIONS MIN TYP MAX UNIT
Digital Inputs
High-level input voltage, V
Low-level input voltage, V
High-level input current, I
Low-level input current, I
Input current for RESET –20 µA
Input capacitance 4 pF
Digital Outputs
Low-level output voltage, V
High-level output voltage, V
Output capacitance 3 pF
IH
IL
IH
IL
OL
OH
= –40°C to T
MIN
MAX
= +85°C, AV
= DRV
DD
= 3.3V, and 3V
DD
differential clock, unless
PP
2.4 V
C
= 10pF 0.3 0.4 V
LOAD
C
= 10pF 2.4 3.0 V
LOAD
DD
0.8 V
10 µA
10 µA
=
5
NOTE: It isrecommended thattheloading at CLKOUTand all data lines areaccurately matched to ensure thattheabove timing
matchescloselywith the specifiedvalues.
N
Sample
Analog
Input
Signal
Input Clock
Data Invalid
Output Clock
Data Out
(D0 to D11)
N−17 N−16 N−15 N−14 N−13 N−3 N−2 N−1 N
16.5 Clock Cycles
N + 2
N + 3
N + 4
N + 14
t
HOLD
t
A
t
START
t
END
t
SETUP
t
PDI
= t
START
+ t
SETUP
N + 15
N + 16
N + 17
ADS5521
SBAS309A – MAY 2004 – REVISED APRIL 2005
TIMING CHARACTERISTICS
Typical values given at TA= +25 ° C, min and max specified over the full temperature range of –40 ° C to +85 ° C, AV
DRV
otherwise noted.
(1) Timing parameters are ensured by design and characterization, and not tested in production.
(2) See Table 5 through Table 8 in the Application Information section for timing information at additional sampling frequencies.
(3) Data valid refers to 2.0V for LOGIC HIGH and 0.8V for LOGIC LOW.
(4) Refer to the Output Information section for details on using the input clock for data capture.
(5) Data outputs are available within a clock from assertion of OE; however, it takes 1000 clock cycles to ensure stable timing with respect
= 3.3V, sampling rate = 105MSPS, 50% clock duty cycle, 3V
DD
PARAMETER DESCRIPTION MIN TYP MAX UNIT
Switching Specification
Aperture delay, t
A
Aperture jitter (uncertainty) Uncertainty in sampling instant 300 fs
Data setup time, t
Data hold time, t
Input clock to output data valid start, Input clock rising edge to data valid start delay 1.9 2.8 ns
(4)
t
START
Input clock to output data valid end, Input clock rising edge to data valid end delay 5.8 7.3 ns
(4)
t
END
Output clock jitter, t
Output clock rise time, t
Output clock fall time, t
Data rise time, t
Data fall time, t
SETUP
HOLD
JIT
RISE
FALL
r
f
Output enable(OE) to data output delay Time required for outputs to have stable timings 1000 Clock
Wakeup time Time to valid data after coming out of software 1000 Clock
to input clock.
(1) (2)
differential clock, and –1dBFS differential input, unless
PP
Input CLK falling edge to data sampling point 1 ns
Data valid
50% of CLKOUT rising edge to data becoming 2.2 2.5 ns
invalid
(3)
to 50% of CLKOUT rising edge 2.2 2.8 ns
(3)
Uncertainty in CLKOUT rising edge, peak-to-peak 175 250 ps
Rise time of CLKOUT from 20% to 80% of DRV
Fall time of CLKOUT from 80% to 20% of DRV
DD
DD
2.0 2.2 ns
1.7 1.8 ns
Data rise time measured from 20% to 80% of 4.4 5.1 ns
DRV
DD
Data fall time measured from 80% to 20% of 3.3 3.8 ns
DRV
DD
with regard to input clock
(5)
after OE is activated cycles
power down, after stopping and restarting the input cycles
clock
DD
=
PP
6
Figure 1. Timing Diagram
t
1
≥
10ms
t
3
≥2µ
st
2
≥2µ
s SEN Active
Power Supply
(AVDD, DRVDD)
RESET (Pin 35)
A3
ADDRESS
SDATA
MSB
DATA
A2 A1 A0 D11 D10 D9 D0
SBAS309A – MAY 2004 – REVISED APRIL 2005
RESET TIMING CHARACTERISTICS
Typical values given at TA= +25 ° C, min and max specified over the full temperature range of –40 ° C to +85 ° C, AV
DRV
= 3.3V, and 3V
DD
PARAMETER DESCRIPTION MIN TYP MAX UNIT
Switching Specification
Power-on delay, t
Reset pulse width, t
Register write delay, t
Power-up time Delay from power-up of AV
1
differential clock, unless otherwise noted.
PP
2
3
Delay from power-on of AVDD and 10 ms
DRVDD to RESET pulse active
Pulse width of active RESET signal 2 µs
Delay from RESET disable to SEN 2 µs
active
DRV
to output stable
DD
and 40 ms
DD
ADS5521
=
DD
Figure 2. Reset Timing Diagram
SERIAL PROGRAMMING INTERFACE CHARACTERISTICS
The ADS5521 has a three-wire serial interface. The • Data is loaded at every 16th SCLK falling edge
ADS5521 latches serial data SDATA on the falling while SEN is low.
edge of serial clock SCLK when SEN is active.
• Serial shift of bits is enabled when SEN is low. bits, the excess bits are ignored.
SCLK shifts serial data at the falling edge.
• Minimum width of data stream for a valid loading within a single active SEN pulse.
is 16 clocks
Figure 3. DATA Communication is 2-Byte, MSB First
• In case the word length exceeds a multiple of 16
• Data can be loaded in multiples of 16-bit words
7
t
SLOADS
t
WSCLK
t
OS
t
OH
t
WSCLK
t
SCLK
16 x M
MSB LSB LSBMSB
t
SLOADH
SCLK
SEN
SDATA
4
12
AVDD V
DFS
5
12
AV
DD
7
12
AVDD V
DFS
8
12
AV
DD
ADS5521
SBAS309A – MAY 2004 – REVISED APRIL 2005
Figure 4. Serial Programming Interface Timing Diagram
Table 1. Serial Programming Interface TIming Characteristics
SYMBOL PARAMETER MIN
t
SCLK
t
WSCLK
t
SLOADS
t
SLOADH
t
DS
t
DH
(1) Typ, min, and max values are characterized, but not production tested.
SCLK period 50 ns
SCLK duty cycle 25 50 75 %
SEN to SCLK setup time 8 ns
SCLK to SEN hold time 6 ns
Data setup time 8 ns
Data hold time 6 ns
(1)
(1)
TYP
(1)
MAX
UNIT
Table 2. Serial Register Table
A3 A2 A1 A0 D11 D10 D9 D8 D7 D6 D5 D4 D3 D2 D1 D0 DESCRIPTION
1 1 0 1 0 0 0 0 0 0 0 0 0 0 DLL 0 DLL OFF = 0: Internal DLL is on; recommended for 60MSPS
OFF to 105MSPS clock speeds.
1 1 1 0 0 TP<1> TP<0> 0 0 0 0 0 0 0 0 0 TP<1:0> - Test modes for output data capture
1 1 1 1 PDN 0 0 0 0 0 0 0 0 0 0 0 PDN = 0: Normal mode of operation
(1)
DLL OFF = 1: Internal DLL is off; recommended for 2MSPS to
80MSPS clock speeds.
TP<1:0> = 00: Normal mode of operation
TP<1:0> = 01: All outputs forced to 0
TP<1:0> = 10: All outputs forced to 1
TP<1:0> = 11: Each output bit toggles between 0 and 1.
There is no ensured relationship between the bits.
PDN = 1: Device is put in power-down (low-current) mode.
(1) All register contents default to zero on reset.
(2) The patterns given are applicable to the straight offset binary output format. If two's complement output format is selected, the test mode
outputs will be the binary two's complement equivalent of these patterns.
Table 3. Data Format Select (DFS) Table
DFS-PIN VOLTAGE (V
) DATA FORMAT CLOCK OUTPUT POLARITY
DFS
Straight Binary Data valid on rising edge
Two's Complement Data valid on rising edge
Straight Binary Data valid on falling edge
(2)
8
Two's Complement Data valid on falling edge
48
47
46
45
44
43
42
41
40
39
38
37
36
35
34
33
DR
GND
D1
D0 (LSB)
NC
NC
CLKOUT
DR
GND
OE
DFS
AV
DD
A
GND
AV
DD
A
GND
RESET
AV
DD
AV
DD
1
2
3
4
5
6
7
8
9
10
11
12
13
14
15
16
DR
GND
SCLK
SDATA
SEN
AV
DD
A
GND
AV
DD
A
GND
AV
DD
CLKP
CLKM
A
GND
A
GND
A
GND
AV
DD
A
GND
OVR
D11 (MSB)
D10
D9
D8
DR
GND
DRV
DD
DR
GND
D7
D6
D5
D4
D3
D2
DR
GND
DRV
DD
CM
A
GND
INP
INM
A
GND
AV
DD
A
GND
AV
DD
A
GND
AV
DD
A
GND
AV
DD
REFP
REFM
IREF
A
GND
64 63 62 61 60 59 58 57 56 55 54
17 18 19 20 21 22 23 24 25 26 27
53 52 51 50 49
28 29 30 31 32
PowerPAD
(Connected to Analog Ground)
ADS5521
ADS5521
SBAS309A – MAY 2004 – REVISED APRIL 2005
PIN CONFIGURATION
PAP PACKAGE
HTQFP-64
(TOP VIEW)
9