TEXAS INSTRUMENTS ADS1258 Technical data

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24−Bit
ADC
Digital
Internal
Monitoring
16:1
Analog
Input MUX
1
16
AINCOM
ADC
In
Extclk In/Out
AVSS DGND
AVDD DVDD
MUX
Out
SPI
Interface
CS DRDY SCLK DIN DOU T
ControlOscillator
GPIO
START RESET PWDN
GPIO[7:0]V
REF
ADS1258
Analog Inputs
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SBAS297A – JUNE 2005 – REVISED SEPTEMBER 2005
16-Channel, 24-Bit Analog-to-Digital Converter
FEATURES DESCRIPTION
24 Bits, No Missing Codes
Fixed-Channel or Automatic Channel Scan
Fixed-Channel Data Rate: 125kSPS
Auto-Scan Data Rate: 23.7kSPS
Single-Conversion Settled Data multiplexer accepts combinations of eight differential
16 Single-Ended or 8 Differential Inputs
Unipolar (+5V) or Bipolar ( ± 2.5V) Operation
Low Noise: 2.8µV
at 1.8kSPS
RMS
0.0003% Integral Nonlinearity
DC Stability (typical): The differential output of the multiplexer is accessible
0.02µV/ ° C Offset Drift, 0.4ppm/ ° C Gain Drift
Open-Sensor Detection
Conversion Control (Pin and Commands)
Multiplexer Output for External Signal
Conditioning
On-Chip Temperature, Reference, Offset,
Gain, and Supply Voltage Readback
42mW Power Dissipation
Standby, Sleep, and Power-Down Modes
8 General-Purpose Inputs/Outputs (GPIO)
32.768kHz Crystal Oscillator or External Clock
The ADS1258 is a 16-channel (multiplexed), low-noise, 24-bit, delta-sigma ( Σ ) analog-to-digital converter (ADC) that provides single-cycle settled data at channel scan rates from 1.8k to 23.7k samples per second (SPS). A flexible input
or 16 single-ended inputs with a full-scale differential range of 5V or true bipolar range of ± 2.5V when operating with a 5V reference. The fourth-order delta-sigma modulator is followed by a fifth-order sinc digital filter optimized for low-noise performance.
to allow signal conditioning prior to the input of the ADC. Internal system monitor registers provide supply voltage, temperature, reference voltage, gain, and offset data.
An onboard PLL generates the system clock from a
32.768kHz crystal, or can be overridden by an external clock source. A buffered system clock output (15.7MHz) is provided to drive a microcontroller or additional converters.
Serial digital communication is handled via an SPI™-compatible interface. A simple command word structure controls channel configuration, data rates, digital I/O, monitor functions, etc.
ADS1258
APPLICATIONS
Medical, Avionics, and Process Control
Machine and System Monitoring
Fast Scan Multi-Channel Instrumentation
Industrial Process Controls
Test and Measurement Systems
SPI is a trademark of Motorola, Inc. All trademarks are the property of their respective owners.
PRODUCTION DATA information is current as of publication date. Products conform to specifications per the terms of the Texas Instruments standard warranty. Production processing does not necessarily include testing of all parameters.
Please be aware that an important notice concerning availability, standard warranty, and use in critical applications of Texas Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet.
Programmable sensor bias current sources can be used to bias sensors or verify sensor integrity.
The ADS1258 operates from a unipolar +5V or bipolar ± 2.5V analog supply and a digital supply compatible with interfaces ranging from 2.7V to
5.25V. The ADS1258 is available in a QFN-48 package.
Copyright © 2005, Texas Instruments Incorporated
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ADS1258
SBAS297A – JUNE 2005 – REVISED SEPTEMBER 2005
This integrated circuit can be damaged by ESD. Texas Instruments recommends that all integrated circuits be handled with appropriate precautions. Failure to observe proper handling and installation procedures can cause damage.
ESD damage can range from subtle performance degradation to complete device failure. Precision integrated circuits may be more susceptible to damage because very small parametric changes could cause the device not to meet its published specifications.
ORDERING INFORMATION
For the most current package and ordering information see the Package Option Addendum at the end of this document, or see the TI web site at www.ti.com .
ABSOLUTE MAXIMUM RATINGS
Over operating free-air temperature range (unless otherwise noted).
AVDD to AVSS –0.3 to +5.5 V AVSS to DGND –2.8 to +0.3 V DVDD to DGND –0.3 to +5.5 V Input Current 100, Momentary mA Input Current 10, Continuous mA Analog Input Voltage AVSS 0.3 to AVDD + 0.3 V Digital Input Voltage to DGND –0.3 to DVDD + 0.3 V Maximum Junction Temperature +150 ° C Operating Temperature Range –40 to +105 ° C Storage Temperature Range –60 to +150 ° C Lead Temperature (soldering, 10s) +300 ° C
(1) Stresses above these ratings may cause permanent damage. Exposure to absolute maximum conditions for extended periods may
degrade device reliability. These are stress ratings only, and functional operation of the device at these or any other conditions beyond those specified is not implied.
(1)
ADS1258 UNIT
2
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SBAS297A – JUNE 2005 – REVISED SEPTEMBER 2005
ELECTRICAL CHARACTERISTICS
All specifications at TA= –40 ° C to +105 ° C, AVDD = +2.5V, AVSS = –2.5V, DVDD = +3.3V, f OPA227 buffer between MUX outputs and ADC inputs, V
PARAMETER CONDITIONS MIN TYP MAX UNIT Analog Multiplexer Inputs
Absolute Input Voltage AVSS – 100mV AVDD + 100mV V
AINCOM with respect to DGND On-Channel Resistance 80 Crosstalk fIN= 1kHz –110 dB
Sensor Bias (Current Source) µA
1.5 µ A:24 µ A Ratio Error 1 %
ADC Input
Full-Scale Input Voltage (V
IN
Absolute Input Voltage (ADCINP, ADCINN) AVSS – 100mV AVDD + 100mV V Differential Input Impedance 65 k
System Performance
Resolution No Missing Codes 24 Bits Data Rate, Fixed-Channel Mode 1.953 125 kSPS Data Rate, Auto-Scan Mode 1.805 23.739 kSPS Integral Nonlinearity (INL)
(1)
Offset Error Shorted Inputs µ V
Offset Drift
(3)
Gain Error 0.1 0.5 % Gain Drift
(3)
Noise (see Table 4 ) Common-Mode Rejection fCM= 60Hz 90 100 dB
Power-Supply Rejection fPS= 60Hz dB
Voltage Reference Input
Reference Input Voltage (V
REF
Negative Reference Input (VREFN) AVSS – 0.1V VREFP – 0.5 V Positive Reference Input (VREFP) VREFN + 0.5 AVDD + 0.1V V Reference Input Impedance 40 k
System Parameters
External Reference Reading Error 1 3 % Analog Supply Reading Error 1 3 % Temperature Sensor Voltage TA= +25 ° C 168 mV
Reading
Digital Input/Output
Logic Levels: V
Input Leakage VIN= DVDD, GND 10 µA
Master Clock Input (CLKIO)
AIN0–AIN15,
= ADCINP ADCINN) ± 1.0 6V
Chopping Off 20 Chopping On 1 10 Chopping Off 0.5 Chopping On 0.02 0.1
AVDD, AVSS 70 85
DVDD 80 95
= VREFP VREFN) 0.5 4.096 AVDD AVSS V
Coefficient 394 µ V/ ° C
IH
V
IL
V
OH
V
OL
Frequency 0.1 16 MHz
Duty Cycle 40 60 %
= +4.096V, and VREFN = –2.5V, unless otherwise noted.
REF
ADS1258
SBCS[1:0] = 01 1.5 SBCS[1:0] = 11 24
Differential Input 0.0003 0.0010 % of FSR
Shorted Inputs µ V/ ° C
0.7DVDD DVDD V DGND 0.3DVDD V
IOH= 2mA 0.8DVDD DVDD V IOL= 2mA DGND 0.2DVDD V
= 16MHz (external clock),
CLK
REF
0.4 2 ppm/ ° C
ADS1258
V
(2)
(1) Best straight line fit method. (2) FSR = Full-scale range = 2.1 3V (3) Ensured by characterization.
.
REF
3
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Top View QFN
36 35 34 33 32 31 30 29 28 27 26 25
AIN12 AIN13 AIN14 AIN15 AINCOM VREFP VREFN DGND DVDD CS START DRDY
AIN4
AIN5
AIN6
AIN7
MUXOUTP
MUXOUTN
ADCINP
ADCINN
AIN8
AIN9
AIN10
AIN11
CLKIO
GPIO0
GPIO1
GPIO2
GPIO3
GPIO4
GPIO5
GPIO6
GPIO7
SCLK
DIN
DOUT
1 2 3 4 5 6 7 8
9 10 11 12
AIN3 AIN2 AIN1 AIN0
AVSS
AVDD
PLLCAP
XTAL1 XTAL2 PWDN
RESET
CLKSEL
48 47 46 45 44 43 42 41 40 39 38
13 14 15 16 17 18 19 20 21 22 233724
ADS1258
ADS1258
SBAS297A – JUNE 2005 – REVISED SEPTEMBER 2005
ELECTRICAL CHARACTERISTICS (continued)
All specifications at TA= –40 ° C to +105 ° C, AVDD = +2.5V, AVSS = –2.5V, DVDD = +3.3V, f OPA227 buffer between MUX outputs and ADC inputs, V
PARAMETER CONDITIONS MIN TYP MAX UNIT
Crystal Frequency 32.768 kHz
Crystal Oscillator (see Crystal Oscillator section)
Start-Up Time (Clock Output Valid) 150 mS
Power Supply
DVDD 2.7 5.25 V AVSS –2.6 0 V AVDD AVSS + 4.75 AVSS + 5.25 V
DVDD Supply Current
AVDD, AVSS Supply Current
Power Dissipation
Clock Output Frequency 15.729 MHz
Clock Output Duty Cycle 40 60 %
= +4.096V, and VREFN = –2.5V, unless otherwise noted.
REF
ADS1258
External Clock
Operation
Internal Oscillator
Operation, Clock 0.04 mA
Output Disabled
Internal Oscillator
Operation, Clock 1.4 mA
Output Enabled
Power-Down
(4)
(5)
Converting 8.2 12 mA
Standby 5.6 mA
Sleep 2.1 mA
Power-Down 2 85 µA
Converting 42 62 mW
Standby 29 mW
Sleep 11 mW
Power-Down 14 µ W
= 16MHz (external clock),
CLK
0.25 0.6 mA
1 25 µA
(4) CLKIO load = 20pF. (5) No clock applied to CLKIO.
PIN CONFIGURATION
4
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SBAS297A – JUNE 2005 – REVISED SEPTEMBER 2005
PIN ASSIGNMENTS
PIN # NAME INPUT/OUTPUT DESCRIPTION
1 AIN3 Analog Input Analog Input 3: Single-Ended Channel 3, Differential Channel 1 (–) 2 AIN2 Analog Input Analog Input 2: Single-Ended Channel 2, Differential Channel 1 (+) 3 AIN1 Analog Input Analog Input 1: Single-Ended Channel 1, Differential Channel 0 (–) 4 AIN0 Analog Input Analog Input 0: Single-Ended Channel 0, Differential Channel 0 (+)
5 AVSS Analog 6 AVDD Analog Positive Analog Power Supply: +5V for unipolar operation, +2.5V for bipolar operation.
7 PLLCAP Analog PLL Bypass Capacitor: Connect 22nF capacitor to AVSS when using crystal oscillator. 8 XTAL1 Analog 32.768kHz Crystal Oscillator Input 1; see Crystal Oscillator section.
9 XTAL2 Analog 32.768kHz Crystal Oscillator Input 2; see Crystal Oscillator section. 10 PWDN Digital Input Power-Down Input: Hold low for minimum of two f 11 RESET Digital Input Reset Input: Hold low for minimum of two f
12 CLKSEL Digital Input 13 CLKIO Digital I/O System Clock Input/Output (See CLKSEL pin.)
14 GPIO0 Digital I/O General-Purpose Digital Input/Output 0 15 GPIO1 Digital I/O General-Purpose Digital Input/Output 1 16 GPIO2 Digital I/O General-Purpose Digital Input/Output 2 17 GPIO3 Digital I/O General-Purpose Digital Input/Output 3 18 GPIO4 Digital I/O General-Purpose Digital Input/Output 4 19 GPIO5 Digital I/O General-Purpose Digital Input/Output 5 20 GPIO6 Digital I/O General-Purpose Digital Input/Output 6 21 GPIO7 Digital I/O General-Purpose Digital Input/Output 7 22 SCLK Digital Input SPI Interface Clock Input: Data clocked in on rising edge, clocked out on falling edge. 23 DIN Digital Input SPI Interface Data Input: Data is input to the device. 24 DOUT Digital Output SPI Interface Data Output: Data is output from the device. 25 DRDY Digital Output Data Ready Output: Active low. 26 START Digital Input Start Conversion Input: Active high. 27 CS Digital Input SPI Interface Chip Select Input: Active low. 28 DVDD Digital Digital Power Supply: 2.7V to 5.25V 29 DGND Digital Digital Ground 30 VREFN Analog Input Reference Input Negative 31 VREFP Analog Input Reference Input Positive 32 AINCOM Analog Input Analog Input Common: Common input pin to all single-ended inputs. 33 AIN15 Analog Input Analog Input 15: Single-Ended Channel 15, Differential Channel 7 (–) 34 AIN14 Analog Input Analog Input 14: Single-Ended Channel 14, Differential Channel 7 (+) 35 AIN13 Analog Input Analog Input 13: Single-Ended Channel 13, Differential Channel 6 (–) 36 AIN12 Analog Input Analog Input 12: Single-Ended Channel 12, Differential Channel 6 (+) 37 AIN11 Analog Input Analog Input 11: Single-Ended Channel 11, Differential Channel 5 (–) 38 AIN10 Analog Input Analog Input 10: Single-Ended Channel 10, Differential Channel 5 (+) 39 AIN9 Analog Input Analog Input 9: Single-Ended Channel 9, Differential Channel 4 (–) 40 AIN8 Analog Input Analog Input 8: Single-Ended Channel 8, Differential Channel 4 (+) 41 ADCINN Analog Input ADC Differential Input (–) 42 ADCINP Analog Input ADC Differential Input (+) 43 MUXOUTN Analog Output Multiplexer Differential Output (–) 44 MUXOUTP Analog Output Multiplexer Differential Output (+) 45 AIN7 Analog Input Analog Input 7: Single-Ended Channel 7, Differential Channel 3 (–) 46 AIN6 Analog Input Analog Input 6 : Single-Ended Channel 6, Differential Channel 3 (+) 47 AIN5 Analog Input Analog Input 5: Single-Ended Channel 5, Differential Channel 2 (–) 48 AIN4 Analog Input Analog Input 4: Single-Ended Channel 4, Differential Channel 2 (+)
ANALOG/DIGITAL
Negative Analog Power Supply: 0V for unipolar operation, –2.5V for bipolar operation. (Internally connected to exposed thermal pad of QFN package.)
cycles to engage low-power mode.
CLK
cycles to reset the device.
CLK
Clock Select Input: Low = Activates Crystal Oscillator, f High = Disables Crystal Oscillator, apply f
to CLKIO.
CLK
output on CLKIO.
CLK
ADS1258
5
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SCLK
CS
(1)
DIN
DOUT
t
SCLK
t
CSSC
t
SPW
t
DIST
t
DIHD
t
SPW
t
CSDO
t
DOPD
t
DOHD
NOTE: (1) CS can be tied low.
DRDY
DOUT
t
DRDY
t
DDO
ADS1258
SBAS297A – JUNE 2005 – REVISED SEPTEMBER 2005
PARAMETER MEASUREMENT INFORMATION
Figure 1. Serial Interface Timing
SERIAL INTERFACE TIMING CHARACTERISTICS
SYMBOL DESCRIPTION MIN MAX UNITS
t
SCLK
t
SPW
t
CSSC
t
DIST
t
DIHD
t
DOPD
t
DOHD
t
CSDO
(1) τ
CLK
(2) Programmable to 256 τ (3) CS can be tied low. (4) DOUT load = 20 pF || 100k to DGND.
SCLK Period 2 τ SCLK High or Low Pulse Width (exceeding max resets SPI interface) 0.8 4096 CS Low to First SCLK: Setup Time
(3)
0.5 τ Valid DIN to SCLK Rising Edge: Setup Time 10 ns Valid DIN to SCLK Rising Edge: Hold Time 5 ns SCLK Falling Edge to Valid New DOUT: Propagation Delay
(4)
SCLK Falling Edge to Old DOUT Invalid: Hold Time 0 ns CS High to DOUT Invalid (tri-state) 5 τ
= master clock period = 1/f
CLK
.
CLK
.
(2)
5 ns
(1)
CLK
τ
CLK CLK
CLK
Figure 2. DRDY Update Timing
DRDY UPDATE TIMING CHARACTERISTICS
SYMBOL DESCRIPTION TYP UNITS
t
DRDY
t
DDO
6
DRDY High Pulse Width Without Data Read 1 τ Valid DOUT to DRDY Falling Edge ( CS = 0) 0.5 τ
CLK CLK
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TYPICAL CHARACTERISTICS
Number of Occurences
Offset (µV)
3000
2500
2000
1500
1000
500
0
50
45
40
35
30
25
20
15
10
505
10
15
20
25
30
35
40
45
50
DRATE[1:0] = 11 16384 Points
Number of Occurences
Offset (µV)
4500 4000 3500 3000 2500 2000 1500 1000
500
0
35
30
25
20
15
10
5
0
5
10
15
20
25
30
35
DRATE[1:0] = 10 16384 Points
Number of Occurences
Offset (µV)
3500
3000
2500
2000
1500
1000
500
0
20
16
12
8
4
0
4
8
12
16
20
DRATE[1:0] = 01 16384 Points
Number of Occurences
Offset (µV)
2500
2000
1500
1000
500
0
12
10
8
6
4
2
0
2
4
6
8
10
12
DRATE[1:0] = 00 16384 Points
RMS Noise (
µ
V)
Input Voltage (%FS)
20
15
10
5
0
100−75 10075
−50−
25 50250
DRATE[1:0] = 11
DRATE[1:0] = 10
DRATE[1:0] = 01
DRATE[1:0] = 00
Number of Occurences
RMS Noise (µV)
20
15
10
5
0
10.0
10.5
11.0
11.5
12.0
12.5
13.0
13.5
14.0
14.5
15.0
50 units from twoproduction lots. DRATE[1:0] = 11
At TA= +25 ° C, AVDD = +2.5V, AVSS = –2.5V, DVDD = +3.3V, f
outputs and ADC inputs, VREFP = +2.048V, and VREFN = –2.048V, unless otherwise noted.
READING HISTOGRAM READING HISTOGRAM
Figure 3. Figure 4.
SBAS297A – JUNE 2005 – REVISED SEPTEMBER 2005
= 16MHz (external), OPA227 buffer between MUX
CLK
ADS1258
READING HISTOGRAM READING HISTOGRAM
Figure 5. Figure 6.
NOISE HISTOGRAM NOISE vs INPUT VOLTAGE
Figure 7. Figure 8.
7
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RMS Noise (
µ
V)
V
REF
(V)
16 14 12 10
8 6 4 2 0
0.5 1.5 5.52.5 3.5 4.5
DRATE[1:0] = 11
DRATE[1:0] = 10
DRATE[1:0] = 01
DRATE[1:0] = 00
RMS Noise (
µ
V)
DVDD, AVDD−AVSS (V)
20 18 16 14 12 10
8 6 4
2.5 3.0 5.53.5 4.0 4.5 5.0
DRATE[1:0] = 11
from DVDD
from AVDD−AVSS
RMS Noise (
µ
V)
Temperature (C)
20 18 16 14 12 10
8 6 4
−40−
20 0
20 40 60 80 100
DRATE[1:0] = 11
RMS Noise (
µ
V)
Common−Mode Input Voltage(V)
20
15
10
5
0
Offset (
µ
V)
5
0
5
10
15
3
2 3
1 0 1 2
OFFSET
CHOP = 1
OFFSET
CHOP = 0
NOISE
Number of Occurences
Offset (µV)
200 180 160 140 120 100
80 60 40 20
0
10
8
6
4
2
0
2
4
6
8
10
311 units fromone production lot. CHOP = 1
Number of Occurences
Offset Drift (µV/C)
80
60
40
20
0
0.10
0.09
0.08
0.07
0.06
0.05
0.04
0.03
0.02
0.01
0
0.01
0.02
0.03
0.04
0.05
0.06
0.07
0.08
0.09
0.10
50 units from two production lots. Based on 20C intervals over the range of
40C to +105C.
CHOP = 1
ADS1258
SBAS297A – JUNE 2005 – REVISED SEPTEMBER 2005
TYPICAL CHARACTERISTICS (continued)
At TA= +25 ° C, AVDD = +2.5V, AVSS = –2.5V, DVDD = +3.3V, f outputs and ADC inputs, VREFP = +2.048V, and VREFN = –2.048V, unless otherwise noted.
= 16MHz (external), OPA227 buffer between MUX
CLK
NOISE vs V
REF
NOISE vs SUPPLY VOLTAGE
Figure 9. Figure 10.
NOISE AND OFFSET vs
NOISE vs TEMPERATURE COMMON-MODE INPUT VOLTAGE
8
Figure 11. Figure 12.
OFFSET HISTOGRAM OFFSET DRIFT HISTOGRAM
Figure 13. Figure 14.
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Normalized Offset (
µ
V)
Temperature (C)
20
0
20
40
60
40−20 100
0 20 806040
CHOP = 1
CHOP = 1, NoBuffer
CHOP = 0, No Buffer
50 Units from 2 Production Lots
Normalized Offset (
µ
V)
V
REF
(V)
0.5 1.0
10
8 6 4 2 0
2
4
6
8
10
5.51.5 2.0 2.5 3.0 3.5 4.0 4.5 5.0
Normalized Offset (
µ
V)
Time After Power−On (s)
10
8 6 4 2 0
2
4
6
8
10
0 10 6020 30 40 50
Free−Air
Number of Occurences
Absolute Gain Error (ppm)
80
60
40
20
0
100
300
500
700
900
1100
1300
1500
1700
1900
320 units from one production lot.
Normalized Gain Error (ppm)
Temperature (C)
30
20
10
0
10
40−20 100
0 20 806040
Number of Occurences
Gain Drift (ppm/C)
80
60
40
20
0
1.8
1.6
1.4
1.2
1.0
0.8
0.6
0.4
0.2
0
0.2
0.4
0.6
0.8
1.0
1.2
1.4
1.6
1.8
50 units from two production lots. Based on 20C intervals over the range of−40C to +105C.
TYPICAL CHARACTERISTICS (continued)
At TA= +25 ° C, AVDD = +2.5V, AVSS = –2.5V, DVDD = +3.3V, f outputs and ADC inputs, VREFP = +2.048V, and VREFN = –2.048V, unless otherwise noted.
= 16MHz (external), OPA227 buffer between MUX
CLK
ADS1258
SBAS297A – JUNE 2005 – REVISED SEPTEMBER 2005
OFFSET vs TEMPERATURE OFFSET vs V
Figure 15. Figure 16.
OFFSET POWER-ON WARMUP GAIN ERROR HISTOGRAM
REF
GAIN DRIFT HISTOGRAM GAIN ERROR vs TEMPERATURE
Figure 17. Figure 18.
Figure 19. Figure 20.
9
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Normalized Gain Error (ppm)
V
REF
(V)
20 15 10
5 0
5
10
15
20
0.5 1.0 5.01.5 2.0 2.5 3.0 3.5 4.0 4.5
Normalized Gain Error (ppm)
Time After Power−On (s)
10
8 6 4 2 0
2
4
6
8
10
0 10 6020 30 40 50
Free−Air
Linearity Error (ppm)
V
REF
(V)
10
8
6
4
2
0
0.5 1.0 5.01.5 2.0 2.5 3.0 3.5 4.0 4.5
Linearity Error (ppm)
VIN(V)
−5−
4
10
8 6 4 2 0
2
4
6
8
10
5
−3−2−
1 0 1 2 3 4
V
REF
= 5V
TA=−40C,−10C, +25C, +55C, +85C, +105C
INL (ppm)
Temperature (C)
8
6
4
2
0
−40−
20 120100
0 20 806040
Level (dBFS)
Frequency (Hz)
0
20
40
60
80
100
120
140
160
180
1 10 100k100 1k 10k
f = 1kHz,−0.5dBFs DRATE[1:0] = 11 65536 Points
ADS1258
SBAS297A – JUNE 2005 – REVISED SEPTEMBER 2005
TYPICAL CHARACTERISTICS (continued)
At TA= +25 ° C, AVDD = +2.5V, AVSS = –2.5V, DVDD = +3.3V, f outputs and ADC inputs, VREFP = +2.048V, and VREFN = –2.048V, unless otherwise noted.
= 16MHz (external), OPA227 buffer between MUX
CLK
GAIN ERROR vs V
REF
Figure 21. Figure 22.
INTEGRAL NONLINEARITY vs V
GAIN ERROR POWER-ON WARMUP
REF
INTEGRAL NONLINEARITY vs INPUT LEVEL
INTEGRAL NONLINEARITY vs TEMPERATURE OUTPUT SPECTRUM
10
Figure 23. Figure 24.
Figure 25. Figure 26.
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Temperature Sensor Voltage (mV)
Temperature (C)
210
200
190
180
170
160
150
140
−40−
20 12040
0 20 60 80 100
Number of Occurences
Temperature Reading (C)
8 7 6 5 4 3 2 1 0
12
13
14
15
16
17
18
19
20
21
22
23
24
25
26
27
28
29
30
31
32
33
34
35
36
50 units from two production lots. TA= +25C
Ratio (
µ
A/
µ
A)
Temperature (C)
18
17
16
15
14
−40−
20 120100
0 20 806040
Number of Occurences
Ratio (µA/µA)
25
20
15
10
5
0
14.0
14.5
15.0
15.5
16.0
16.5
17.0
17.5
18.0
18.5
19.0
50 units from two production lots.
AVDD, AVSS Current (mA)
Temperature (C)
10
8
6
4
2
0
DVDD Current (mA)
1.0
0.8
0.6
0.4
0.2
0
−40−
20 1200 20 40 60 80 100
AVDD, AVSS
DVDD
RMS Noise (
µ
V)
Master Clock (MHz)
20
16
12
8
4
0
Linearity Error (ppm)
20
16
12
8
4
0
0.1 1 10010
DRATE[1:0] = 11
Noise
Linearity
TYPICAL CHARACTERISTICS (continued)
At TA= +25 ° C, AVDD = +2.5V, AVSS = –2.5V, DVDD = +3.3V, f outputs and ADC inputs, VREFP = +2.048V, and VREFN = –2.048V, unless otherwise noted.
TEMPERATURE SENSOR VOLTAGE vs TEMPERATURE TEMPERATURE SENSOR READING HISTOGRAM
Figure 27. Figure 28.
= 16MHz (external), OPA227 buffer between MUX
CLK
ADS1258
SBAS297A – JUNE 2005 – REVISED SEPTEMBER 2005
SENSOR BIAS CURRENT SOURCE RATIO SENSOR BIAS CURRENT SOURCE RATIO
HISTOGRAM vs TEMPERATURE
Figure 29. Figure 30.
SUPPLY CURRENT vs TEMPERATURE NOISE AND INL vs MASTER CLOCK
Figure 31. Figure 32.
11
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AIN0
AIN1 AIN2 AIN3 AIN4 AIN5
AIN6 AIN7 AIN8 AIN9
AIN10 AIN11 AIN12 AIN13 AIN14 AIN15
AINCOM
Control
Logic
VREFPVREFN
AVSS
PLLCAP XTAL1XTAL2
DRDY PWDN RESET START
SPI
Interface
CS SCLK DIN DOUT
Digital Filter
Clock Control
16−Channel
MUX
AVDD
Sensor
Bias
M
UXOUTP
MUX
OUTN
ADCINP GND
AD
CINN
ADC Channel Control
Supply Monitor
GPIO
G
PIO[7:0]
DVDD
Temperature
Ext Ref Monitor
Internal Ref
ADC
CLKSELCLKIO
ADS1258
SBAS297A – JUNE 2005 – REVISED SEPTEMBER 2005
The ADS1258 is a flexible, 24-bit, low-noise ADC optimized for fast multi-channel, high-resolution measurement systems. The converter provides a maximum channel scan rate of 23.7kSPS, providing a complete 16-channel scan in less than 700µs.
Figure 33 shows the block diagram of the ADS1258.
The input multiplexer selects the analog input pins connected to the multiplexer output pins (MUXOUTP/MUXOUTN). External signal conditioning can be used between the multiplexer output pins and the ADC input pins (ADCINP/ADCINN) or the multiplexer output can be routed internally to the ADC inputs without external circuitry. Selectable current sources within the input multiplexer can be used to bias sensors or detect for a failed sensor. On-chip system function readings provide readback of temperature, supply voltage, gain, offset, and external reference. The ADS1258 converter is comprised of a fourth-order, delta-sigma modulator followed by a programmable digital filter. The modulator measures the differential input signal V against the differential reference input V
IN
= (ADCINP ADCINN)
REF
OVERVIEW
(VREFP VREFN). The digital filter receives the modulator signal and provides a low-noise digital output. The ADC channel block controls the multiplexer Auto-Scan feature. Channel Auto-Scan occurs at a maximum rate of 23.7kSPS. Slower scan rates can be used with corresponding increases in resolution.
Communication is handled over an SPI-compatible serial interface with a set of simple commands providing control of the ADS1258. Onboard registers store the various settings for the input multiplexer, sensor detect bias, data rate selection, etc. Either an external 32.768kHz crystal, connected to pins XTAL1 and XTAL2, or an external clock applied to pin CLKIO can be used as the clock source. When using the external crystal oscillator, the system clock is available as an output for driving other devices or controllers. General-purpose digital I/Os (GPIO) provide input and output control of eight pins.
=
12
Figure 33. ADS1258 Block Diagram
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AVSS100mV VREFP or VREFN AVDD 100mV
ESD Diodes
ESD Diodes
3pF
R
eff
= 40k
(f
CLK
= 16MHz)
AVDD
AVSS
VREFP
VREFN
ADS1258
SBAS297A – JUNE 2005 – REVISED SEPTEMBER 2005
MULTIPLEXER INPUTS
A simplified diagram of the input multiplexer is illustrated in Figure 35 . The multiplexer connects one of 16 single-ended external inputs, one of eight differential external inputs, or one of the on-chip internal variables to the ADC inputs. The output of the channel multiplexer can be routed to external pins and then to the input of the ADC. This flexibility allows for use of external signal conditioning. See the
External Multiplexer Loop section.
ESD diodes protect the analog inputs. To keep these diodes from turning on, make sure the voltages on the input pins do not go below AVSS by more than 100mV, and likewise do not exceed AVDD by more than 100mV:
AVSS 100mV < (Analog Inputs) < AVDD + 100mV. The converter supports two modes of channel access
through the multiplexer: the Auto-Scan mode and the Fixed-Channel mode. These modes are selected by the MUXMOD bit of register CONFIG0. The Auto-Scan mode scans through the selected channels automatically, with break-before-make switching. The Fixed-Channel mode requires the user to set the channel address for each channel measured.
ESD diodes protect the reference inputs. To keep these diodes from turning on, make sure the voltages on the reference pins do not go below AVSS by more than 100mV, and likewise do not exceed AVDD by 100mV, as described in Equation 1 :
(1)
A high-quality reference voltage is essential for achieving the best performance from the ADS1258. Noise and drift on the reference degrade overall system performance. It is especially critical that special care be given to the circuitry that generates the reference voltages and the layout when operating in the low-noise settings (that is, with low data rates) to prevent the voltage reference from limiting performance. See the Reference Inputs description in the Hardware Considerations segment of the
Applications section.
VOLTAGE REFERENCE INPUTS (VREFP, VREFN)
The voltage reference for the ADS1258 ADC is the differential voltage between VREFP and VREFN: V
= VREFP VREFN. The reference inputs use a
REF
structure similar to that of the analog inputs with the circuitry on the reference inputs shown in Figure 34 . The load presented by the switched capacitor can be modeled with an effective resistance (R f
= 16MHz. Note that the effective impedance of
CLK
the reference inputs will load an external reference with a non-zero source impedance.
) of 40k for
eff
Figure 34. Simplified Reference Input Circuit
13
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ADC
AIN0
VREFN
VREFP
AIN1
AIN2
AIN3
AIN4
AIN5
AIN6
AIN7
AIN8
AIN9
AIN10
AIN11
AIN12
AIN13
AIN14
AIN15
AINCOM
Multiplexer
Reference/Gain Monitor
NOTE: ESD diodes not shown.
Supply Monitor
AVDD
AVSS
AVDD AVSS
Temperature Sensor Monitor
1x 2x
8x 1x
AVDD
(AVDD−AVSS)/2
AVSS
Sensor Bias Offset Monitor
MUXOUTP
MUXOUTN
ADCINP
ADCINN
Internal Reference
AVSS
ADS1258
SBAS297A – JUNE 2005 – REVISED SEPTEMBER 2005
Figure 35. Input Multiplexer
14
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t
SAMPLE
ON
OFF
S
1
S
2
OFF
ON
S
1
S
1
AVSS + 1.3V
R
AIN
= R
effB
|| 2R
effA
AVSS + 1.3V
R
effA
= 190k
R
effB
= 78kΩ(f
CLK
= 16MHz)
R
effA
= 190k
ADCINN
ADCINP
CA1= 0.65pF
CB= 1.6pF
C
A2
= 0.65pF
ADCINN
S
2
AVSS + 1.3V
S
2
AVSS + 1.3V
ADCINP
Equivalent
Circuit
R
eff
= t
SAMPLE/CX
NOTE: ESD input diodes not shown.
ADS1258
SBAS297A – JUNE 2005 – REVISED SEPTEMBER 2005
ADC INPUTS
The ADS1258 ADC inputs (ADCINP, ADCINN) measure the input signal using internal capacitors
R
= V
eff
with f
IN/IAVERAGE
. For example, if f
CLK
two, the impedances will double.
. These impedances scale inversely
is reduced by a factor of
CLK
that are continuously charged and discharged. The As with the multiplexer and reference inputs, ESD left side of Figure 37 shows a simplified schematic of diodes protect the ADC inputs. To keep these diodes the ADC input circuitry; the right side of Figure 37 from turning on, make sure the voltages on the input shows the input circuitry with the capacitors and pins do not go below AVSS by more than 100mV, switches replaced by an equivalent circuit. Figure 36 and likewise do not exceed AVDD by more than shows the ON/OFF timings of the switches shown in 100mV.
Figure 37 . S
sampling phase. With S ADCINP, C (ADCINP ADCINN). For the discharge phase, S opens first and then S to approximately AVSS + 1.3V and C
switches close during the input
1
charges to ADCINN, and C
A2
2
1
closes. C
closed, C
charges to
A1
charges to
B
and C
A1
discharge
A2
discharges to
B
1
0V. This two-phase sample/discharge cycle repeats with a period of t
SAMPLE
= 2/f
.
CLK
The charging of the input capacitors draws a transient current from the source driving the ADS1258 ADC inputs. The average value of this current can be used to calculate an effective impedance (R
) where
eff
Figure 36. S1and S
Switch Timing for Figure 37
2
Figure 37. Simplified ADC Input Structure
15
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