The ADS1217 is a precision, wide dynamic range, deltasigma, Analog-to-Digital (A/D) converter with 24-bit resolution operating from 2.7V to 5.25V supplies. The delta-sigma,
A/D converter provides up to 24 bits of no missing code
performance and effective resolution of 22 bits.
The eight input channels are multiplexed. Internal buffering
can be selected to provide a very high input impedance for
direct connection to transducers or low-level voltage signals.
Burnout current sources are provided that allow for the
detection of an open or shorted sensor. An 8-bit Digital-toAnalog Converter (DAC) provides an offset correction with a
range of 50% of the FSR (Full-Scale Range).
The PGA (Programmable Gain Amplifier) provides selectable
gains of 1 to 128 with an effective resolution of 19 bits at a gain
of 128. The A/D conversion is accomplished with a 2nd-order,
delta-sigma modulator and programmable sinc filter. The
reference input is differential and can be used for ratiometric
measurements. The onboard current DACs operate independently with the maximum current set by an external resistor.
The serial interface is SPI compatible. Eight bits of digital I/O
are also provided that can be used for input or output. The
ADS1217 is designed for high-resolution measurement applications in smart transmitters, industrial process control, weigh
scales, chromatography, and portable instrumentation.
V
AGND AV
R
REFOUTVRCAPVREF+VREF–
8-Bit
IDAC
8-Bit
IDAC
DAC
Voltage
Reference
DD
X
X
IN
Clock Generator
OUT
Please be aware that an important notice concerning availability, standard warranty, and use in critical applications of
Texas Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet.
All trademarks are the property of their respective owners.
PRODUCTION DATA information is current as of publication date.
Products conform to specifications per the terms of Texas Instruments
standard warranty. Production processing does not necessarily include
testing of all parameters.
AVDD to AGND ...................................................................... –0.3V to +6V
DV
to DGND...................................................................... –0.3V to +6V
DD
Input Current ............................................................... 100mA, Momentary
Input Current ................................................................. 10mA, Continuous
A
................................................................... GND –0.5V to AVDD + 0.5V
IN
AV
to DVDD........................................................................... –6V to +6V
DD
AGND to DGND ................................................................. –0.3V to +0.3V
Digital Input Voltage to GND.................................... –0.3V to DV
Digital Output Voltage to GND ................................. –0.3V to DV
Maximum Junction Temperature ................................................... +150°C
+ 0.3V
DD
+ 0.3V
DD
Operating Temperature Range ......................................... –40°C to +85°C
Storage Temperature Range .......................................... –60°C to +150°C
Lead Temperature (soldering, 10s) .............................................. +300°C
NOTE: (1) Stresses above those listed under “Absolute Maximum Ratings” may
cause permanent damage to the device. Exposure to absolute maximum
conditions for extended periods may affect device reliability.
ELECTROSTATIC
DISCHARGE SENSITIVITY
This integrated circuit can be damaged by ESD. Texas Instruments recommends that all integrated circuits be handled with
appropriate precautions. Failure to observe proper handling
and installation procedures can cause damage.
ESD damage can range from subtle performance degradation
to complete device failure. Precision integrated circuits may be
more susceptible to damage because very small parametric
changes could cause the device not to meet its published
specifications.
Filter–3dB0.262f
Programmable Gain AmplifierUser Selectable Gain Ranges1128
Burnout Current Sources2µA
OFFSET DAC
Offset DAC Range±V
Offset DAC Monotonicity8Bits
Offset DAC Gain Error±1%
Offset DAC Gain Error Drift1ppm/°C
SYSTEM PERFORMANCE
Resolution24Bits
No Missing CodesSinc
3
Filter24Bits
Integral NonlinearityEnd Point Fit, Differential Input,0.00030.0012% of FSR
Buffer Off
Offset ErrorBefore Calibration7.5ppm of FSR
Offset Drift0.02ppm of FSR/°C
Gain ErrorBefore Calibration0.005%
Gain Error Drift0.5ppm/°C
Common-Mode Rejectionat DC100dB
f
= 60Hz, f
CM
f
= 50Hz, f
CM
f
= 60Hz, f
Normal-Mode Rejectionf
Output NoiseSee Typical Characteristics
CM
SIG
f
SIG
= 50Hz, f
= 60Hz, f
DATA
DATA
DATA
DATA
DATA
Power-Supply Rejectionat DC, dB = –20log(∆V
NOTES: (1) FSR is Full-Scale Range. (2) ∆V
is change in digital result. (3) 12pF switched capacitor at f
Filter–3dB0.262f
Programmable Gain AmplifierUser Selectable Gain Ranges1128
Burnout Current Sources2µA
OFFSET DAC
Offset DAC Range±V
Offset DAC Monotonicity8Bits
Offset DAC Gain Error±1%
Offset DAC Gain Error Drift2ppm/°C
SYSTEM PERFORMANCE
Resolution24Bits
No Missing CodesSinc
3
Filter24Bits
Integral NonlinearityEnd Point Fit, Differential Input,0.00030.0012% of FSR
Buffer Off, T = 25°C
Offset ErrorBefore Calibration15ppm of FSR
Offset Drift0.04ppm of FSR/°C
Gain ErrorBefore Calibration0.010%
Gain Error Drift1.0ppm/°C
Common-Mode Rejectionat DC100dB
f
= 60Hz, f
CM
f
= 50Hz, f
CM
f
= 60Hz, f
Normal-Mode Rejectionf
Output NoiseSee Typical Characteristics
CM
SIG
f
SIG
= 50Hz, f
= 60Hz, f
DATA
DATA
DATA
DATA
DATA
Power-Supply Rejectionat DC, dB = –20 log(∆V
VOLTAGE REFERENCE INPUT
Reference Input (V
Negative Reference Input (V
Positive Reference Input (V
Common-Mode Rejectionat DC120dB
Common-Mode Rejectionf
Bias Current
(3)
)V
REF
)AGND – 0.1(V
REF–
)(V
REF+
REF
VREFCM
≡ (V
) – (V
REF+
= 60Hz, f
DATA
V
= 1.25V0.65µA
REF
ON-CHIP VOLTAGE REFERENCE
Output VoltageREF HI = 01.21.251.3V
Short-Circuit Current Source3mA
Short-Circuit Current Sink50µA
Drift15ppm/°C
NoiseV
Output ImpedanceSourcing 100µA3Ω
= 0.1µF, BW = 0.1Hz to 100Hz10µVrms
RCAP
Startup Time5ms
IDAC
Full-Scale Output CurrentR
Current Setting Resistance (R
MonotonicityR
)10kΩ
DAC
Compliance Voltage0AV
= 75kΩ, Range = 10.5mA
DAC
R
= 75kΩ, Range = 21mA
DAC
R
= 75kΩ, Range = 32mA
DAC
R
= 15kΩ, Range = 320mA
DAC
= 75kΩ8Bits
DAC
Output ImpedanceSee Typical Characteristics
PSRRV
Gain ErrorIndividual IDAC5%
= AVDD/ 2, Code > 16600ppm/V
OUT
Gain Error DriftIndividual IDAC75ppm/°C
Gain Error Mismatch
Gain Error Mismatch Drift
NOTES: (1) FSR is Full-Scale Range. (2) ∆V
Between IDACs, Same Range and Code
Between IDACs, Same Range and Code
is change in digital result. (3) 12pF switched capacitor at f
OUT
= 19.2kHz, PGA = 1, Buffer ON, R
MOD
= 75kΩ, f
DAC
= 10Hz, and V
DATA
= +1.25V,
REF
ADS1217
)
±2V
/PGAV
REF
DATA
DATA
DATA
/(PGA)V
REF
+ 0.1V
DD
– 1.5V
DD
= 10Hz130dB
= 50Hz120dB
= 60Hz120dB
= 50Hz100dB
= 60Hz100dB
(2)
/∆VDD)
OUT
)0.11.251.3V
REF–
7590dB
) – 0.1V
) + 0.1AVDD + 0.1V
REF–
REF+
= 60Hz120dB
– 1V
DD
0.25%
15ppm/°C
clock frequency.
SAMP
Hz
Hz
Hz
(1)
4
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ADS1217
SBAS260B
ELECTRICAL CHARACTERISTICS: AVDD = 3V (Cont.)
All specifications at –40°C to +85°C, AVDD = +3V, DVDD = +2.7V to 5.25V, f
unless otherwise specified.