Designed to Be interchangeable With
National Semiconductor and Signetics
ADC0803 and ADC0805
description
ADC0803, ADC0805
8-BIT ANALOG-TO-DIGITAL CONVERTERS
WITH DIFFERENTIAL INPUTS
SLAS034 – NOVEMBER 1983 – REVISED SEPTEMBER 1986
N PACKAGE
(TOP VIEW)
CS
RD
WR
CLK IN
INTR
IN+
IN–
ANLG GND
REF/2
DGTL GND
1
2
3
4
5
6
7
8
9
10
V
20
CLK OUT
19
DB0 (LSB)
18
DB1
17
DB2
16
DB3
15
DB4
14
DB5
13
DB6
12
DB7 (MSB)
11
(OR REF)
CC
DATA
OUTPUTS
The ADC0803 and ADC0805 are CMOS 8-bit, successive-approximation, analog-to-digital converters that use
a modified potentiometric (256R) ladder. These devices are designed to operate from common microprocessor
control buses with the 3-state output latches driving the data bus. The devices can be made to appear to the
microprocessor as a memory location or an I/O port. Detailed information on interfacing to most popular
microprocessors is readily available from the factory.
A differential analog voltage input allows increased common-mode rejection and offset of the zero-input analog
voltage value. Although a reference input (REF/2) is available to allow 8-bit conversion over smaller analog
voltage spans or to make use of an external reference, ratiometric conversion is possible with the REF/2 input
open. Without an external reference, the conversion takes place over a span from V
to ANLG GND. The
CC
devices can operate with an external clock signal or with an additional resistor and capacitor, using an on-chip
clock generator.
The ADC0803C and ADC0805C are characterized for operation from 0°C to 70°C. The ADC0803I and
ADC0805I are characterized for operation from –40°C to 85°C.
PRODUCTION DATA information is current as of publication date.
Products conform to specifications per the terms of Texas Instruments
standard warranty. Production processing does not necessarily include
testing of all parameters.
POST OFFICE BOX 655303 • DALLAS, TEXAS 75265
Copyright 1986, Texas Instruments Incorporated
1
ADC0803, ADC0805
8-BIT ANALOG-TO-DIGITAL CONVERTERS
WITH DIFFERENTIAL INPUTS
SLAS034 – NOVEMBER 1983 – REVISED SEPTEMBER 1986
functional block diagram (positive logic)
2
RD
Start
Flip-Flop
CS
1
WR
CLK
OUT
CLK IN
DGTL
GND
V
CC
REF/2
ANLG
GND
IN +
IN –
3
19
4
10
20
9
8
6
7
SAR
Latch
LE
1D
C1R
CLK B
8-Bit
Shift
Register
D
Interrupt
Flip-Flop
R
R
R
5
1D
C1CLK A
S
INTR
S
CLK A
CLK A
Clk
CLK
Gen
Clk Osc
Ladder
and
Decoder
V
CC
DAC
CLK B
CLK
Σ
Comp
ENLE
3-State
Output
Latch
2
POST OFFICE BOX 655303 • DALLAS, TEXAS 75265
18
17
16
15
14
13
12
11
DB0 (LSB)
DB1
DB2
DB3
DB4
DB5
DB6
DB7 (MSB)
Operating free–air temperature, T
°C
ADC0803, ADC0805
8-BIT ANALOG-TO-DIGITAL CONVERTERS
WITH DIFFERENTIAL INPUTS
SLAS034 – NOVEMBER 1983 – REVISED SEPTEMBER 1986
absolute maximum ratings over operating free-air temperature range (unless otherwise noted)
Lead temperature 1,6 mm (1/16 inch) from case for 10 seconds 260°C. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
NOTE 1: All voltage values are with respect to digital ground (DGTL GND) with DGTL GND and ANLG GND connected together unless otherwise
noted.
recommended operating conditions
Supply voltage, V
Analog input voltage (see Note 2)–0.05VCC = 0.05V
Voltage at REF/2 (see Note 3), V
High-level input voltage at CS, RD, or WR, V
Low-level input voltage at CS, RD, or WR, V
Analog ground voltage (see Note 4)–0.0501V
Clock iput frequency (see Note 5), f
Duty cycle for f
Pulse durartion, clock input (high or low) for f
Pulse durartion, WR input low, tW(WR)100ns
p
NOTES: 2. When the differential input voltage (VI+ – VI–) is less than or equal to 0 V, the output code is 0000 0000.
CC
above 640 kHz (see Note 5)40%60%
clock
p
3. The internal reference voltage is equal to the voltage applied to REF/2 or approximately equal to one-half of the VCC when REF/2
is left open. The voltage at REF/2 should be one-half the full-scale differential input voltage between the analog inputs. Thus, the
differential input voltage range when REF/2 is open and VCC = 5 V is 0 V to 5 V . V
(full-scale differential voltage of 3 V) is 1.5 V.
4. These values are with respect to DGTL GND.
5. Total unadjusted error is specified only at an f
For frequencies above this limit or pulse duration below 625 ns, error may increase. The duty cycle limits should be observed for
an f
greater than 640 kHz. Below 640 kHz, this duty cycle limit can be exceeded provided t
8. All errors are measured with reference to an ideal straight line through the end-points of the analog-to-digital transfer characteristics.
9. Although internal conversion is completed in 64 clock periods, a CS
before conversion starts. After conversion is complete, part of another clock period is required before a high-to-low transition of INTR
completes the cycle.
= 640 kHz (unless otherwise noted)
clock
PARAMETERTEST CONDITIONSMIN TYP†MAXUNIT
,
V
= 2.5 V,See Notes 7 and 8±1/2
REF/2
V
open,See Notes 7 and 8±1
REF/2
f
= 100 kHz to 1.46 MHz,
clock
TA = 25°C,See Note 9
or WR low-to-high transition is followed by 1 to 8 clock periods
±1/4
±1/2
clock
cycles
4
POST OFFICE BOX 655303 • DALLAS, TEXAS 75265
ADC0803, ADC0805
8-BIT ANALOG-TO-DIGITAL CONVERTERS
WITH DIFFERENTIAL INPUTS
SLAS034 – NOVEMBER 1983 – REVISED SEPTEMBER 1986
PARAMETER MEASUREMENT INFORMATION
CS
8 Clock Periods (Min)
RD
INTR
DATA
OUTPUTS
CS
WR
t
d(INTR)
50%
50%
t
d(INTR)
t
en
50%
50%
90%
10%
Figure 1. Read Operation Timing Diagram
50%50%
1 to 8
Clock Periods
t
w(WR)
50%
t
dis
High-Impedance State
64% Clock Periods
V
OH
V
OL
INTR
t
CONV
Figure 2. Write Operation Timing Diagram
50%50%
POST OFFICE BOX 655303 • DALLAS, TEXAS 75265
5
ADC0803, ADC0805
8-BIT ANALOG-TO-DIGITAL CONVERTERS
WITH DIFFERENTIAL INPUTS
SLAS034 – NOVEMBER 1983 – REVISED SEPTEMBER 1986
PRINCIPLES OF OPERATION
The ADC0803 and ADC0805 each contain a circuit equivalent to 256-resistor network. Analog switches are
sequenced by successive-approximation logic to match an analog differential input voltage (V
corresponding tap on the 256R network. The most significant bit (MSB) is tested first. After eight spelled out
comparisons (64 clock periods), an eight-bit binary code (1111 1111 = full scale) is transferred to an output latch and
the interrupt (INTR
output to the write (WR) input and holding the conversion start (CS) input at a low level. To ensure start up under all
conditions, a low-level WR
a conversion in process.
) output goes low. The device can be operated in a free-running mode by connecting the INTR
input is required during the power-up cycle. T aking CS low any time after that will interrupt
– VI–) to a
I+
When WR
as both CS
after CS
When CS
pulse transfers a logic high to the output of the start flip-flop. The logic high is ANDed with the next clock pulse, placing
a logic high on the reset input of the start flip-flop. If either CS
is removed, causing it to be reset. A logic high is placed on the D input of the eight-bit shift register and the conversion
process is started. If CS
This action allows for wide CS
the inputs goes high.
When the logic high input has been clocked through the 8-bit shift register, which completes the SAR search, it is
applied to an AND gate controlling the output latches and to the D input of a flip-flop. On the next clock pulse, the digital
word is transferred to the 3-state output latches and the interrupt flip-flop is set. The output of the interrupt flip-flop
is inverted to provide an INTR
When a low is at both CS
reset. When either CS
high-impedance state). The interrupt flip-flop remains reset.
goes low, the internal successive-approximation register (SAR) and 8-bit shift register are reset. As long
and WR remain low, the analog-to-digital converter remains in a reset state. One to eight clock periods
or WR makes a low-to-high transition, conversion starts.
and WR are low, the start flip-flop is set and the interrupt flip-flop and 8-bit register are reset. The next clock
or WR have gone high, the set signal to the start flip-flop
and WR are still low, the start flip-flop, the 8-bit shift register, and the SAR remain reset.
and WR inputs, with conversion starting from one to eight clock periods after one of
output that is high during conversion and low when the conversion is complete.
and RD, an output is applied to the DB0 through DB7 outputs and the interrupt flip-flop is
or RD return to a high state, the DB0 through DB7 outputs are disabled (returned to the
6
POST OFFICE BOX 655303 • DALLAS, TEXAS 75265
IMPORTANT NOTICE
T exas Instruments and its subsidiaries (TI) reserve the right to make changes to their products or to discontinue
any product or service without notice, and advise customers to obtain the latest version of relevant information
to verify, before placing orders, that information being relied on is current and complete. All products are sold
subject to the terms and conditions of sale supplied at the time of order acknowledgement, including those
pertaining to warranty, patent infringement, and limitation of liability.
TI warrants performance of its semiconductor products to the specifications applicable at the time of sale in
accordance with TI’s standard warranty. Testing and other quality control techniques are utilized to the extent
TI deems necessary to support this warranty . Specific testing of all parameters of each device is not necessarily
performed, except those mandated by government requirements.
CERT AIN APPLICATIONS USING SEMICONDUCTOR PRODUCTS MAY INVOL VE POTENTIAL RISKS OF
DEATH, PERSONAL INJURY, OR SEVERE PROPERTY OR ENVIRONMENTAL DAMAGE (“CRITICAL
APPLICATIONS”). TI SEMICONDUCTOR PRODUCTS ARE NOT DESIGNED, AUTHORIZED, OR
WARRANTED TO BE SUITABLE FOR USE IN LIFE-SUPPORT DEVICES OR SYSTEMS OR OTHER
CRITICAL APPLICA TIONS. INCLUSION OF TI PRODUCTS IN SUCH APPLICATIONS IS UNDERST OOD TO
BE FULLY AT THE CUSTOMER’S RISK.
In order to minimize risks associated with the customer’s applications, adequate design and operating
safeguards must be provided by the customer to minimize inherent or procedural hazards.
TI assumes no liability for applications assistance or customer product design. TI does not warrant or represent
that any license, either express or implied, is granted under any patent right, copyright, mask work right, or other
intellectual property right of TI covering or relating to any combination, machine, or process in which such
semiconductor products or services might be or are used. TI’s publication of information regarding any third
party’s products or services does not constitute TI’s approval, warranty or endorsement thereof.
Copyright 1998, Texas Instruments Incorporated
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