CY74FCT16652T
CY74FCT162652T
5
DC Electrical Characteristics Over the Operating Range
Parameter Description Test Conditions
[5]
Min. Typ.
[6]
Max. Unit
V
IH
Input HIGH Voltage Logic HIGH Level 2.0 V
V
IL
Input LOW Voltage Logic LOW Level 0.8 V
V
H
Input Hysteresis 100 mV
V
IK
Input Clamp Diode Voltage VCC=Min., IIN=−18 mA −0.7 −1.2 V
I
IH
Input HIGH Current VCC=Max., VI=V
CC
±1 µA
I
IL
Input LOW Current VCC=Max., VI=GND ±1 µA
I
OZH
High Impedance Output
Current
(Three-State Output pins)
VCC=Max., V
OUT
=2.7V ±1 µA
I
OZL
High Impedance Output
Current
(Three-State Output pins)
VCC=Max., V
OUT
=0.5V ±1 µA
I
OS
Short Circuit Current
[8]
VCC=Max., V
OUT
=GND −80 −140 −200 mA
I
O
Output Drive Current
[8]
VCC=Max., V
OUT
=2.5V −50 −180 mA
I
OFF
Power-Off Disable VCC=0V, V
OUT
≤4.5V
[7]
±1 µA
Output Drive Characteristics for CY74FCT16652T
Parameter Description Test Conditions
[5]
Min. Typ.
[6]
Max. Unit
V
OH
Output HIGH Voltage VCC=Min., IOH=−3 mA 2.5 3.5 V
VCC=Min., IOH=−15 mA 2.4 3.5
VCC=Min., IOH=−32 mA 2.0 3.0
V
OL
Output LOW Voltage VCC=Min., IOL=64 mA 0.2 0.55 V
Output Drive Characteristics for CY74FCT162652T
Parameter Description Test Conditions
[5]
Min. Typ.
[6]
Max. Unit
I
ODL
Output LOW Current
[8]
VCC=5V, VIN=VIH or VIL, V
OUT
=1.5V 60 115 150 mA
I
ODH
Output HIGH Current
[8]
VCC=5V, VIN=VIH or VIL, V
OUT
=1.5V −60 −115 −150 mA
V
OH
Output HIGH Voltage VCC=Min., IOH=−24 mA 2.4 3.3 V
V
OL
Output LOW Voltage VCC=Min., IOL=24 mA 0.3 0.55 V
Capacitance(T
A
= +25˚C, f = 1.0 MHz)
Parameter Description
[10]
Test Conditions Typ. Max. Unit
C
IN
Input Capacitance VIN = 0V 4.5 6.0 pF
C
OUT
Output Capacitance V
OUT
= 0V 5.5 8.0 pF
Notes:
5. For conditions shown as Max. or Min., use appropriate value specified under Electrical Characteristics for the applicable device type.
6. Typical values are at V
CC
=5.0V, +25°C ambient.
7. Tested at T
A
= +25°C.
8. Not more than one output should be tested at one time. Duration of the test should not exceed one second.
9. Duration of the condition cannot exceed one second.
10. This parameter is measured at characterization but not tested.