Distributed VCC and GND Pin
Configurations Minimize High-Speed
Switching Noise
D
EPIC
t
(Enhanced-Performance Implanted
CMOS) 1-mm Process
D
500-mA Typical Latch-Up Immunity at
125°C
D
Package Options Include Plastic Thin
Shrink Small-Outline (DGG) and 300-mil
Shrink Small-Outline (DL) Packages Using
25-mil Center-to-Center Pin Spacings, and
380-mil Fine-Pitch Ceramic Flat (WD)
Packages Using 25-mil Center-to-Center
Pin Spacings
description
The ’ACT16543 are 16-bit registered transceivers
that contain two sets of D-type latches for
temporary storage of data flowing in either
direction. The ’ACT16543 can be used as two
8-bit transceivers or one 16-bit transceiver.
Separate latch enable (LEAB
output-enable (OEAB or OEBA) inputs are
provided for each register to permit independent
control in either direction of data flow.
The A-to-B enable (CEAB) and OEAB inputs must
be low to enter data from A or to output data to B.
Having CEAB low and LEAB low makes the
A-to-B latches transparent; a subsequent low-tohigh transition at LEAB
puts the A latches in the
storage mode. Data flow from B to A is similar, but
requires using the CEBA, LEBA, and OEBA
inputs.
The 74ACT16543 is packaged in TI’s shrink small-outline package, which provides twice the functionality of
standard small-outline packages in the same printed-circuit-board area.
The 54ACT16543 is characterized for operation over the full military temperature range of –55°C to 125°C. The
74ACT16543 is characterized for operation from –40°C to 85°C.
Please be aware that an important notice concerning availability, standard warranty, and use in critical applications of
Texas Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet.
EPIC and Widebus are trademarks of Texas Instruments Incorporated.
UNLESS OTHERWISE NOTED this document contains PRODUCTION
DATA information current as of publication date. Products conform to
specifications per the terms of Texas Instruments standard warranty.
Production processing does not necessarily include testing of all
parameters.
POST OFFICE BOX 655303 • DALLAS, TEXAS 75265
Copyright 1996, Texas Instruments Incorporated
1
54ACT16543, 74ACT16543
STATUS
BUFFERS
16-BIT REGISTERED TRANSCEIVERS
WITH 3-STATE OUTPUTS
SCAS126B – MARCH 1990 – REVISED APRIL 1996
INPUTS
CEABLEABOEAB
HXXStoringZ
XHXStoring
XXHZ
LLLTransparentCurrent A data
LHLStoringPrevious A data
†
A-to-B data flow is shown: B-to-A flow control is the same except that
it uses CEBA
‡
Data present before low-to-high transition of LEAB
CEAB
Stresses beyond those listed under “absolute maximum ratings” may cause permanent damage to the device. These are stress ratings only, and
functional operation of the device at these or any other conditions beyond those indicated under “recommended operating conditions” is not
implied. Exposure to absolute-maximum-rated conditions for extended periods may affect device reliability.
NOTES: 1. The input and output voltage ratings may be exceeded if the input and output current ratings are observed.
2. The maximum package power dissipation is calculated using a junction temperature of 150_C and a board trace length of 750 mils.
4. All VCC and GND pins must be connected to the proper voltage power supply.
CC
CC
0V
0V
CC
CC
V
V
†
PRODUCT PREVIEW information concerns products in the formative or
design phase of development. Characteristic data and other
specifications are design goals. Texas Instruments reserves the right to
change or discontinue these products without notice.
POST OFFICE BOX 655303 • DALLAS, TEXAS 75265
5
54ACT16543, 74ACT16543
PARAMETER
TEST CONDITIONS
V
UNIT
I
A
OH
I
mA
I
A
OL
I
24 mA
pF
UNIT
16-BIT REGISTERED TRANSCEIVERS
WITH 3-STATE OUTPUTS
SCAS126B – MARCH 1990 – REVISED APRIL 1996
electrical characteristics over recommended operating free-air temperature range (unless
otherwise noted)
CC
= –50
= –24
= 50
=
m
{
m
{
CC
OH
V
OH
V
OL
I
I
I
OZ
I
CC
D
C
C
†
Not more than one output should be tested at a time, and the duration of the test should not exceed 10 ms.
‡
For I/O ports, the parameter IOZ includes the input leakage current.
§
This is the increase in supply current for each input that is at one of the specified TTL voltage levels rather than 0 V or VCC.
Control inputsVI = VCC or GND5.5 V±0.1±1±1
A or B ports
w
I
CC
Control inputsVI = VCC or GND5 V4.5
i
A or B portsVO = VCC or GND5 V12
io
OH
IOH = –75 mA
OL
OL
IOL = 75 mA
}
VO = VCC or GND5.5 V±0.5±5±5
VI = VCC or GND,IO = 05.5 V88080
One input at 3.4 V ,
Other inputs at GND or V
4.5 V4.44.44.4
5.5 V5.45.45.4
4.5 V3.943.83.8
5.5 V4.944.84.8
5.5 V3.853.85
4.5 V0.10.10.1
5.5 V0.10.10.1
4.5 V0.360.440.44
5.5 V0.360.440.44
5.5 V1.651.65
5.5 V0.911mA
TA = 25°C54ACT1654374ACT16543
MINTYPMAXMINMAXMINMAX
V
V
m
A
m
A
m
A
p
timing requirements over recommended operating free-air temperature range (unless otherwise
noted) (see Figure 1)
TA = 25°C54ACT1654374ACT16543
MINMAXMINMAXMINMAX
t
w
t
su
t
h
Pulse duration, LEAB or LEBA low7.57.57.5ns
Setup time, data before LEAB or LEBA↑2.52.52.5ns
Hold time, data after LEAB or LEBA↑444ns
PRODUCT PREVIEW information concerns products in the formative or
design phase of development. Characteristic data and other
specifications are design goals. Texas Instruments reserves the right to
change or discontinue these products without notice.
6
POST OFFICE BOX 655303 • DALLAS, TEXAS 75265
PARAMETER
UNIT
A or B
B or A
ns
LEBA
LEAB
A or B
ns
OEBA
OEAB
A or B
ns
OEBA
OEAB
A or B
ns
CEBA
CEAB
A or B
ns
CEBA
CEAB
A or B
ns
CpdPower dissipation capacitance per transceiver
C
f
pF
54ACT16543, 74ACT16543
16-BIT REGISTERED TRANSCEIVERS
WITH 3-STATE OUTPUTS
SCAS126B – MARCH 1990 – REVISED APRIL 1996
switching characteristics over recommended ranges of supply voltage and operating free-air
temperature range (unless otherwise noted) (see Figure 1)
TA = 25°C54ACT1654374ACT16543
MINTYPMAXMINMAXMINMAX
3.56.99.53.510.53.510.5
3.17.310.73.111.63.111.6
3.98.612.33.913.83.913.8
3.98.712.23.913.53.913.5
2.67.110.32.611.42.611.4
3.58.311.93.513.23.513.2
4.18.210.54.111.14.111.1
57.39.359.659.6
3.17.310.73.111.73.111.7
3.98.512.23.913.53.913.5
4.68.5114.611.64.611.6
5.27.49.75.210.55.210.5
t
PLH
t
PHL
t
PLH
t
PHL
t
PZH
t
PZL
t
PHZ
t
PLZ
t
PZH
t
PZL
t
PHZ
t
PLZ
FROMTO
(INPUT)(OUTPUT)
or
or
or
or
or
operating characteristics, V
p
p
= 5 V, T
CC
PARAMETERTEST CONDITIONSTYPUNIT
p
= 25°C
A
Outputs enabled
Outputs disabled
= 50 pF,
L
p
= 1 MHz
45
12
p
PRODUCT PREVIEW information concerns products in the formative or
design phase of development. Characteristic data and other
specifications are design goals. Texas Instruments reserves the right to
change or discontinue these products without notice.
POST OFFICE BOX 655303 • DALLAS, TEXAS 75265
7
54ACT16543, 74ACT16543
16-BIT REGISTERED TRANSCEIVERS
WITH 3-STATE OUTPUTS
SCAS126B – MARCH 1990 – REVISED APRIL 1996
PARAMETER MEASUREMENT INFORMATION
From Output
Under Test
CL = 50 pF
(see Note A)
Input
500 Ω
500 Ω
LOAD CIRCUIT
t
w
1.5 V1.5 V
VOLTAGE WAVEFORMS
S1
3 V
0 V
2 × V
Open
GND
CC
Timing Input
(see Note B)
Data Input
TESTS1
t
PLH/tPHL
t
PLZ/tPZL
t
PHZ/tPZH
t
su
1.5 V
VOLTAGE WAVEFORMS
1.5 V
Open
2 × V
GND
t
1.5 V
CC
3 V
0 V
h
3 V
0 V
Input
t
PLH
In-Phase
Output
t
PHL
Out-of-Phase
Output
NOTES: A. CL includes probe and jig capacitance.
B. Waveform 1 is for an output with internal conditions such that the output is low except when disabled by the output control.
Waveform 2 is for an output with internal conditions such that the output is high except when disabled by the output control.
C. All input pulses are supplied by generators having the following characteristics: PRR ≤ 1 MHz, ZO = 50 Ω, tr = 3 ns, tf = 3 ns.
D. The outputs are measured one at a time with one input transition per measurement.
1.5 V1.5 V
50% V
CC
50% V
CC
VOLTAGE WAVEFORMS
Figure 1. Load Circuit and Voltage Waveforms
t
PHL
50% V
t
PLH
50% V
CC
CC
3 V
0 V
V
V
V
V
OH
OL
OH
OL
Output
Control
(low-level
enabling)
Output
Waveform 1
S1 at 2 × V
(see Note B)
Output
Waveform 2
S1 at GND
(see Note B)
CC
t
PZL
t
1.5 V
50% V
PZH
50% V
VOLTAGE WAVEFORMS
t
PLZ
t
PHZ
CC
CC
1.5 V
20% V
80% V
CC
CC
3 V
0 V
[
V
V
[
V
OL
OH
0 V
CC
8
POST OFFICE BOX 655303 • DALLAS, TEXAS 75265
IMPORTANT NOTICE
T exas Instruments and its subsidiaries (TI) reserve the right to make changes to their products or to discontinue
any product or service without notice, and advise customers to obtain the latest version of relevant information
to verify, before placing orders, that information being relied on is current and complete. All products are sold
subject to the terms and conditions of sale supplied at the time of order acknowledgement, including those
pertaining to warranty, patent infringement, and limitation of liability.
TI warrants performance of its semiconductor products to the specifications applicable at the time of sale in
accordance with TI’s standard warranty. Testing and other quality control techniques are utilized to the extent
TI deems necessary to support this warranty . Specific testing of all parameters of each device is not necessarily
performed, except those mandated by government requirements.
CERTAIN APPLICA TIONS USING SEMICONDUCT OR PRODUCTS MAY INVOLVE POTENTIAL RISKS OF
DEATH, PERSONAL INJURY, OR SEVERE PROPERTY OR ENVIRONMENTAL DAMAGE (“CRITICAL
APPLICATIONS”). TI SEMICONDUCTOR PRODUCTS ARE NOT DESIGNED, AUTHORIZED, OR
WARRANTED TO BE SUITABLE FOR USE IN LIFE-SUPPORT DEVICES OR SYSTEMS OR OTHER
CRITICAL APPLICA TIONS. INCLUSION OF TI PRODUCTS IN SUCH APPLICATIONS IS UNDERST OOD TO
BE FULLY AT THE CUSTOMER’S RISK.
In order to minimize risks associated with the customer’s applications, adequate design and operating
safeguards must be provided by the customer to minimize inherent or procedural hazards.
TI assumes no liability for applications assistance or customer product design. TI does not warrant or represent
that any license, either express or implied, is granted under any patent right, copyright, mask work right, or other
intellectual property right of TI covering or relating to any combination, machine, or process in which such
semiconductor products or services might be or are used. TI’s publication of information regarding any third
party’s products or services does not constitute TI’s approval, warranty or endorsement thereof.
Copyright 1998, Texas Instruments Incorporated
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