Texas Instruments 74ACT11543DWR, 74ACT11543DW, 74ACT11543NT Datasheet

74ACT11543

OCTAL REGISTERED TRANSCEIVER

WITH 3-STATE OUTPUTS

SCAS136 – D3608, JULY 1990 – REVISED APRIL 1993

POST OFFICE BOX 655303 • DALLAS, TEXAS 75265

Copyright  1993, Texas Instruments Incorporated

2–1

• Inputs Are TTL-Voltage Compatible

• 3-State True Outputs

• Back-to-Back Registers for Storage

• Flow-Through Architecture Optimizes

PCB Layout

• Center-Pin V

CC

and GND Configurations

Minimize High-Speed Switching Noise

•

EPIC

t

(Enhanced-Performance Implanted

CMOS) 1-mm Process

• 500-mA T ypical Latch-Up Immunity at 125°C

description

This 8-bit registered transceiver contains two sets
of D-type latches for temporary storage of data
flowing in either direction. Separate latch enable
(LEAB

or LEBA) and output enable (GAB or GBA)
inputs are provided for each register to permit
independent control in either direction of data flow.

The A-to-B enable (CEAB) input must be low in order to enter data from A or to output data to B. Having CEAB
low and LEAB low makes the A-to-B latches transparent; a subsequent low-to-high transition of LEAB puts the
A latches in the storage mode. With CEAB and GAB both low, the 3-state B outputs are active and reflect the
data present at the output of the A latches. Data flow from B-to-A is similar, but requires the use of CEBA, LEBA,
and GBA inputs.

The 74ACT11543 is characterized for operation from – 40°C to 85°C.

FUNCTION TABLE

INPUTS

LATCH

OUTPUT BUFFERS

CEAB LEAB GAB

STATUS

A TO B

†

B1 THRU B8

H X X Storing Z
X H Storing
X H Z
L L L Transparent Current A Data
L H L Storing Previous} A Data

†

A-to-B data flow is shown: B-to-A flow control is the same except uses
CEBA

, LEBA, and GBA.

‡

Data present before low-to-high transition of LEAB

.

DW PACKAGE

(TOP VIEW)

1
2
3
4
5
6
7
8
9
10
11
12
13
14

28
27
26
25
24
23
22
21
20
19
18
17
16
15

CEBA

A1
A2
A3

A4
GND
GND
GND
GND

A5

A6

A7

A8

CEAB

GBA
LEBA
B1
B2
B3
B4
V

CC

V

CC

B5
B6
B7
B8
LEAB
GAB

PRODUCTION DATA information is current as of publication date.
Products conform to specifications per the terms of Texas Instruments
standard warranty. Production processing does not necessarily include
testing of all parameters.

EPIC is a trademark of Texas Instruments Incorporated.

74ACT11543
OCTAL REGISTERED TRANSCEIVER
WITH 3-STATE OUTPUTS

SCAS136 – D3608, JULY 1990 – REVISED APRIL 1993

POST OFFICE BOX 655303 • DALLAS, TEXAS 75265

2–2

logic symbol

†

logic diagram (positive logic)

A1

LEAB

CEAB

GAB

LEBA

CEBA

GBA

2

16

14

15

27

1

28

B1

26

C1
1D

1D

C1

A8

A7

A6

A5

A4

A3

A2

A1

LEAB

CEAB

GAB

LEAB

CEBA

GBA

13

12

11

10

5

4

3

2

16

14

15

27

1

28

6D

3

2C6

G2

2EN4

1C5

G1

1EN

4

5D

B8

B7

B6

B5

B4

B3

B2

B1

17

18

19

20

23

24

25

26

To Seven Other Transceivers

†

This symbol is in accordance with ANSI/IEEE Std 91-1984
and IEC Publication 617-12.

absolute maximum ratings over operating free-air temperature range (unless otherwise noted)

‡

Supply voltage range, V

CC

–0.5 V to 7 V. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .

Input voltage range, V

I

(see Note 1) –0.5 V to VCC+ 0.5 V. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .

Output voltage range, VO (see Note 1) –0.5 V to VCC+ 0.5 V. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .

Input clamp current, I

IK

(V

I

< 0 or VI > VCC) ± 20 mA. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .

Output clamp current, I

OK

(V

O

< 0 or VO > VCC) ± 50 mA. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .

Continuous output current, I

O

(V

O

= 0 to VCC) ± 50 mA. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .

Continuous current through VCC or GND ± 200 mA. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .

Storage temperature range –65°C to 150°C. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .

‡

Stresses beyond those listed under “absolute maximum ratings” may cause permanent damage to the device. These are stress ratings only and
functional operation of the device at these or any other conditions beyond those indicated under “recommended operating conditions” is not
implied. Exposure to absolute-maximum-rated conditions for extended periods may affect device reliability.

NOTE 1: The input and output voltage ratings may be exceeded if the input and output current ratings are observed.

recommended operating conditions

MIN NOM MAX UNIT

V

CC

Supply voltage 4.5 5 5.5 V

V

IH

High-level input voltage 2 V

V

IL

Low-level input voltage 0.8 V

V

I

Input voltage 0 V

CC

V

V

O

Output voltage 0 V

CC

V

I

OH

High-level output current –24 mA

I

OL

Low-level output current 24 mA

Dt/D

v Input transition rise or fall rate 0 10 ns/V

T

A

Operating free-air temperature –40 85 °C

74ACT11543

OCTAL REGISTERED TRANSCEIVER

WITH 3-STATE OUTPUTS

SCAS136 – D3608, JULY 1990 – REVISED APRIL 1993

POST OFFICE BOX 655303 • DALLAS, TEXAS 75265

2–3

electrical characteristics over recommended operating free-air temperature range

TA = 25°C

PARAMETER

TEST CONDITIONS

V

CC

MIN TYP MAX

MIN

MAX

UNIT

4.5 V 4.4 4.4

I

OH

= –50

m

A

5.5 V 5.4 5.4

V

OH

4.5 V 3.94 3.8

V

I

OH

= –

24 mA

5.5 V 4.94 4.8

IOH = – 75 mA

†

5.5 V 3.85

4.5 V 0.1 0.1

I

OL

= 50

m

A

5.5 V 0.1 0.1

V

OL

4.5 V 0.36 0.44

V

I

OL

= 24

mA

5.5 V 0.36 0.44

IOL = 75 mA

†

5.5 V 1.65

I

I

Control inputs VI = VCC or GND 5.5 V ± 0.1 ±1

m

A

I

OZ

A or B ports

‡

VO = VCC or GND 5.5 V ± 0.5 ±5

m

A

I

CC

VI = VCC or GND, IO = 0 5.5 V 8 80

m

A

D

I

CC

§

One input at 3.4 V , Other inputs at GND or V

CC

5.5 V 0.9 1 mA

C

i

Control inputs VI = VCC or GND 5 V 4.5 pF

C

io

A or B ports VO = VCC or GND 5 V 12 pF

†

Not more than one output should be tested at a time, and the duration of the test should not exceed 10 ms.

‡

For I/O ports, the parameter IOZ includes the input leakage current.

§

This is the increase in supply current for each input that is at one of the specified TTL voltage levels rather than 0 V or VCC.

timing requirements over recommended ranges of supply voltage and operating free-air
temperature (unless otherwise noted) (see Figure 1)

TA = 25°C
MIN MAX

MIN

MAX

UNIT

t

w

Pulse duration, LEAB or LEBA low 4 4 ns

p

Data after LEAB or LEBA↑

2.5 2.5

tsuSetup time

Data before CEAB or CEBA↑

3 3

ns

Data after LEAB or LEBA↑

2 2

thHold time

Data after CEAB or CEBA↑

1.5 1.5

ns