Datasheet 74ACT11373NT, 74ACT11373DWR, 74ACT11373DW, 74ACT11373DBR Datasheet (Texas Instruments)

74ACT11373
OCTAL TRANSPARENT D-TYPE LATCH
WITH 3-STATE OUTPUTS
SCAS015B – JUNE 1987 – REVISED APRIL 1996
1
POST OFFICE BOX 655303 DALLAS, TEXAS 75265
D
D
3-State Bus Driving True Outputs
D
Full Parallel Access for Loading
D
Buffered Input and Output-Enable Pins
D
Inputs Are TTL-Voltage Compatible
D
Flow-Through Architecture Optimizes PCB Layout
D
Center-Pin VCC and GND Configurations Minimize High-Speed Switching Noise
D
EPIC
t
(Enhanced-Performance Implanted
CMOS) 1-mm Process
D
500-mA Typical Latch-Up Immunity at 125°C
D
Package Options Include Plastic Small-Outline (DW) and Shrink Small-Outline (DB) Packages, and Standard Plastic 300-mil DIPs (NT)
description
This 8-bit latch features 3-state outputs designed specifically for driving highly-capacitive or relatively low-impedance loads. It is particularly suitable for implementing buffer registers, I/O ports, bidirectional bus drivers, and working registers.
The eight latches of the 74ACT1 1373 are transparent D-type latches. While the latch-enable (LE) input is high, the Q outputs follow the data (D) inputs. When the enable is taken low, the Q outputs are latched at the levels that were set up at the D inputs.
A buffered output-enable (OE) input can be used to place the eight outputs in either a normal logic state (high or low logic levels) or a high-impedance state. In the high-impedance state, the outputs neither load nor drive the bus lines significantly . The high-impendance third state and increased drive provide the capability to drive the bus lines in a bus-organized system without need for interface or pullup components.
OE
does not affect the internal operations of the latches. Old data can be retained or new data can be entered
while the outputs are off. The 74ACT11373 is characterized for operation from –40°C to 85°C.
FUNCTION TABLE
(each latch)
INPUTS
OUTPUT
OE
LE
D
Q
L H H H L HL L L LX Q
0
H X X Z
Copyright 1996, Texas Instruments Incorporated
PRODUCTION DATA information is current as of publication date. Products conform to specifications per the terms of Texas Instruments standard warranty. Production processing does not necessarily include testing of all parameters.
Please be aware that an important notice concerning availability, standard warranty, and use in critical applications of Texas Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet.
EPIC is a trademark of Texas Instruments Incorporated.
DB, DW, OR NT PACKAGE
(TOP VIEW)
1 2 3 4 5 6 7 8 9 10 11 12
24 23 22 21 20 19 18 17 16 15 14 13
1Q 2Q 3Q
4Q GND GND GND GND
5Q
6Q
7Q
8Q
OE 1D 2D 3D 4D V
CC
V
CC
5D 6D 7D 8D LE
74ACT11373 OCTAL TRANSPARENT D-TYPE LATCH WITH 3-STATE OUTPUTS
SCAS015B – JUNE 1987 – REVISED APRIL 1996
2
POST OFFICE BOX 655303 DALLAS, TEXAS 75265
logic symbol
This symbol is in accordance with ANSI/IEEE Std 91-1984 and IEC Publication 617-12.
8D
7D
6D
5D
4D
3D
2D
1D
LE
OE
14
16
17
20
21
22
23
13
24
8Q
7Q
6Q
5Q
4Q
3Q
2Q
1Q
12
11
10
9
4
3
2
1
1D
C1
EN
15
logic diagram (positive logic)
8D
7D
6D
5D
4D
3D
2D
1D
LE
OE
14
15
16
17
20
21
22
23
13
24
8Q
7Q
6Q
5Q
4Q
3Q
2Q
1Q
12
11
10
9
4
3
2
1
C1 1D
C1 1D
C1 1D
C1 1D
C1 1D
C1 1D
C1 1D
C1 1D
74ACT11373
OCTAL TRANSPARENT D-TYPE LATCH
WITH 3-STATE OUTPUTS
SCAS015B – JUNE 1987 – REVISED APRIL 1996
3
POST OFFICE BOX 655303 DALLAS, TEXAS 75265
absolute maximum ratings over operating free-air temperature range (unless otherwise noted)
Supply voltage range, V
CC
–0.5 V to 6 V. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Input voltage range, VI (see Note 1) –0.5 V to V
CC
+ 0.5 V. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Output voltage range, VO (see Note 1) –0.5 V to V
CC
+ 0.5 V. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Input clamp current, I
IK
(V
I
< 0 or VI > VCC) ±20 mA. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Output clamp current, I
OK
(V
O
< 0 or VO > VCC) ±50 mA. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Continuous output current, I
O
(V
O
= 0 to VCC) ±50 mA. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Continuous current through VCC or GND ±200 mA. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Maximum power dissipation at TA = 55°C (in still air) (see Note 2):DB package 0.65 W. . . . . . . . . . . . . . . . . .
DW package 1.7 W. . . . . . . . . . . . . . . . . .
NT package 1.3 W. . . . . . . . . . . . . . . . . . .
Storage temperature range, T
stg
–65°C to 150°C. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Stresses beyond those listed under “absolute maximum ratings” may cause permanent damage to the device. These are stress ratings only, and functional operation of the device at these or any other conditions beyond those indicated under “recommended operating conditions” is not implied. Exposure to absolute-maximum-rated conditions for extended periods may affect device reliability.
NOTES: 1. The input and output voltage ratings may be exceeded if the input and output current ratings are observed.
2. The maximum package power dissipation is calculated using a junction temperature of 150_C and a board trace length of 750 mils, except for the NT package, which has a trace length of zero.
recommended operating conditions
MIN MAX UNIT
V
CC
Supply voltage 4.5 5.5 V
V
IH
High-level input voltage 2 V
V
IL
Low-level input voltage 0.8 V
V
I
Input voltage 0 V
CC
V
V
O
Output voltage 0 V
CC
V
I
OH
High-level output current –24 mA
I
OL
Low-level output current 24 mA
Dt/D
v Input transition rise or fall rate 0 10 ns/V
T
A
Operating free-air temperature –40 85 °C
74ACT11373 OCTAL TRANSPARENT D-TYPE LATCH WITH 3-STATE OUTPUTS
SCAS015B – JUNE 1987 – REVISED APRIL 1996
4
POST OFFICE BOX 655303 DALLAS, TEXAS 75265
electrical characteristics over recommended operating free-air temperature range (unless otherwise noted)
TA = 25°C
PARAMETER
TEST CONDITIONS
V
CC
MIN TYP MAX
MIN
MAX
UNIT
4.5 V 4.4 4.4
I
OH
= –50
m
A
5.5 V 5.4 5.4
V
OH
4.5 V 3.94 3.8
V
OH
I
OH
= –24
mA
5.5 V 4.94 4.8
IOH = –75 mA
{
5.5 V 3.85
4.5 V 0.1 0.1
I
OL
= 50
m
A
5.5 V 0.1 0.1
V
OL
4.5 V 0.36 0.44
V
OL
I
OL
=
24 mA
5.5 V 0.36 0.44
IOL = 75 mA
{
5.5 V 1.65
I
OZ
VO = VCC or GND 5.5 V ±0.5 ±5
m
A
I
I
VI = VCC or GND 5.5 V ±0.1 ±1
m
A
I
CC
VI = VCC or GND, IO = 0 5.5 V 8 80
m
A
D
I
CC
}
One input at 3.4 V , Other inputs at GND or V
CC
5.5 V 0.9 1 mA
C
i
VI = VCC or GND 5 V 4 pF
C
o
VO = VCC or GND 5 V 10 pF
Not more than one output should be tested at a time, and the duration of the test should not exceed 10 ms.
This is the increase in supply current for each input that is at one of the specified TTL voltage levels rather than 0 V or VCC.
timing requirements over recommended ranges of supply voltage and operating free-air temperature (unless otherwise noted) (see Figure 1)
TA = 25°C MIN MAX
MIN
MAX
UNIT
t
w
Pulse duration, LE high 5 5 ns
t
su
Setup time, data before LE 3.5 3.5 ns
t
h
Hold time, data LE 3.5 3.5 ns
switching characteristics over recommended ranges of supply voltage and operating free-air temperature (unless otherwise noted) (see Figure 1)
FROM TO
TA = 25°C
PARAMETER
(INPUT) (OUTPUT)
MIN TYP MAX
MIN
MAX
UNIT
t
PLH
1.5 7.5 10.3 1.5 11.8
t
PHL
D
Q
1.5 6.5 9.3 1.5 10
ns
t
PLH
1.5 8.5 11.3 1.5 13
t
PHL
LE
Any Q
1.5 8.5 10.9 1.5 12.2
ns
t
PZH
1.5 7 10.7 1.5 12.5
t
PZL
OE
Any Q
1.5 7.5 10.9 1.5 12
ns
t
PHZ
1.5 10 12.1 1.5 12.2
t
PLZ
OE
Any Q
1.5 7.5 9.5 1.5 10.1
ns
74ACT11373
OCTAL TRANSPARENT D-TYPE LATCH
WITH 3-STATE OUTPUTS
SCAS015B – JUNE 1987 – REVISED APRIL 1996
5
POST OFFICE BOX 655303 DALLAS, TEXAS 75265
operating characteristics, V
CC
= 5 V, T
A
= 25°C
PARAMETER TEST CONDITIONS TYP UNIT
p
p
p
Outputs enabled
p
65
p
CpdPower dissipation capacitance per latch
Outputs disabled
C
L
= 50 pF,
f
= 1 MHz
54
pF
PARAMETER MEASUREMENT INFORMATION
50% V
CC
1.5 V
1.5 V
1.5 V
3 V
3 V
0 V
0 V
t
h
t
su
VOLTAGE WAVEFORMS
Data Input
t
PLH
t
PHL
t
PHL
t
PLH
V
OH
V
OH
V
OL
V
OL
1.5 V 1.5 V
3 V
0 V
50% V
CC
50% V
CC
Input
Out-of-Phase
Output
In-Phase
Output
Timing Input
50% V
CC
VOLTAGE WAVEFORMS
From Output
Under Test
CL = 50 pF
(see Note A)
LOAD CIRCUIT
S1
2 × V
CC
500
500
Output
Control (low-level enabling)
Output
Waveform 1
S1 at 2 × V
CC
(see Note B)
Output
Waveform 2
S1 at GND
(see Note B)
V
OL
V
OH
t
PZL
t
PZH
t
PLZ
t
PHZ
1.5 V
1.5 V
[
V
CC
0 V
50% V
CC
20% V
CC
50% V
CC
80% V
CC
[
0 V
3 V
GND
Open
VOLTAGE WAVEFORMS
t
PLH/tPHL
t
PLZ/tPZL
t
PHZ/tPZH
Open
2 × V
CC
GND
TEST S1
3 V
0 V
1.5 V 1.5 V
t
w
VOLTAGE WAVEFORMS
Input
NOTES: A. CL includes probe and jig capacitance.
B. Waveform 1 is for an output with internal conditions such that the output is low except when disabled by the output control.
Waveform 2 is for an output with internal conditions such that the output is high except when disabled by the output control. C. All input pulses are supplied by generators having the following characteristics: PRR 1 MHz, ZO = 50 Ω, tr = 3 ns, tf = 3 ns. D. The outputs are measured one at a time with one input transition per measurement.
Figure 1. Load Circuit and Voltage Waveforms
IMPORTANT NOTICE
T exas Instruments and its subsidiaries (TI) reserve the right to make changes to their products or to discontinue any product or service without notice, and advise customers to obtain the latest version of relevant information to verify, before placing orders, that information being relied on is current and complete. All products are sold subject to the terms and conditions of sale supplied at the time of order acknowledgement, including those pertaining to warranty, patent infringement, and limitation of liability.
TI warrants performance of its semiconductor products to the specifications applicable at the time of sale in accordance with TI’s standard warranty. Testing and other quality control techniques are utilized to the extent TI deems necessary to support this warranty. Specific testing of all parameters of each device is not necessarily performed, except those mandated by government requirements.
CERT AIN APPLICATIONS USING SEMICONDUCTOR PRODUCTS MAY INVOLVE POTENTIAL RISKS OF DEATH, PERSONAL INJURY, OR SEVERE PROPERTY OR ENVIRONMENTAL DAMAGE (“CRITICAL APPLICATIONS”). TI SEMICONDUCTOR PRODUCTS ARE NOT DESIGNED, AUTHORIZED, OR WARRANTED TO BE SUITABLE FOR USE IN LIFE-SUPPORT DEVICES OR SYSTEMS OR OTHER CRITICAL APPLICATIONS. INCLUSION OF TI PRODUCTS IN SUCH APPLICA TIONS IS UNDERSTOOD T O BE FULLY AT THE CUSTOMER’S RISK.
In order to minimize risks associated with the customer’s applications, adequate design and operating safeguards must be provided by the customer to minimize inherent or procedural hazards.
TI assumes no liability for applications assistance or customer product design. TI does not warrant or represent that any license, either express or implied, is granted under any patent right, copyright, mask work right, or other intellectual property right of TI covering or relating to any combination, machine, or process in which such semiconductor products or services might be or are used. TI’s publication of information regarding any third party’s products or services does not constitute TI’s approval, warranty or endorsement thereof.
Copyright 1998, Texas Instruments Incorporated
Loading...