Datasheet TC835CPI, TC835CKW, TC835CBU Datasheet (TelCom Semiconductor)

PERSONAL COMPUTER DATA ACQUISITION A/D CONVERTER
1
TC835

FEATURES

Upgrade of Pin-Compatible TC7135, ICL7135,
Guaranteed 200 kHz Operation
Single 5V Operation With TC7660
Multiplexed BCD Data Output
UART and Microprocessor Interface
Control Outputs for Auto-Ranging
Input Sensitivity ............................................ 100 µV
No Sample and Hold Required

APPLICATIONS

Personal Computer Data Acquisition
Scales, Panel Meters, Process Controls
HP-IL Bus Instrumentation

ORDERING INFORMATION

Temperature
Part No. Package Range
TC835CBU 64-Pin PQFP 0°C to +70°C TC835CKW 44-Pin PQFP 0°C to +70°C TC835CPI 28-Pin Plastic DIP 0°C to +70°C
NOTE: Tape and reel available for 44-pin PQFP packages.

TYPICAL APPLICATION

GENERAL DESCRIPTION

The TC835 is a low-power, 4-1/2 digit (0.005% resolu­tion), BCD analog-to-digital converter (ADC) that has been characterized for 200 kHz clock rate operation. The five conversions per second rate is nearly twice as fast as the ICL7135 or TC7135. The TC835 (like the TC7135) does not use the external diode-resistor roll-over error compen­sation circuits required by the ICL7135.
The multiplexed BCD data output is perfect for interfac­ing to personal computers. The low-cost, greater than 14­bit high-resolution, and 100 µV sensitivity makes the TC835 exceptionally cost-effective.
Microprocessor-based data acquisition systems are supported by the BUSY and STROBE outputs, along with the RUN/HOLD input of the TC835. The overrange, under­range, busy, and run/hold control functions and multiplexed BCD data outputs make the TC835 the ideal converter for µP-based scales and measurement systems and intelligent panel meters.*
The TC835 interfaces with full-function LCD and LED display decoder/drivers. The UNDERRANGE and OVERRANGE outputs may be used to implement an auto­ranging scheme or special display functions.
*See Application Notes 16 and 17 for microprocessor interface tech­niques.
2
3
4
5
ADDRESS BUS
CONTROL
DATA BUS
PA0 PA1 PA2
PB0 PB3PB2PB1
6522
-VIA-
PA3 PA4 PA5 PA6 PA7 CA1 CA2
GAIN SELECTION
PB5 PB4
CHANNEL SELECTION
TELCOM SEMICONDUCTOR, INC.
+
5V
+
REF CAP
V
1B
1Y
2B
2Y 3Y
3B
SEL
1A
157
2A 3A
POL OR UR D5 B8 B4 B2
B1 D1 D2 D3 D4 STB R/H
f
IN
TC835
COMMON
f
IN
BUF
+
INPUT
INPUT
ANALOG
DGND
AZ
INT
V
R
5V
GAIN: 10, 20, 50, 100
REF VOLTAGE
10
14
8
LH0084
16
+
15V 15V
11
DG529
+
3
D
A
9
D
B
WR
15
A1A
EN
0
DIFFERENTIAL MULTIPLEXER
CHANNEL 1
CHANNEL 2
CHANNEL 3
CHANNEL 4
6
7
8
TC835-8 11/5/96
3-65
TC835
PERSONAL COMPUTER
DA TA ACQUISITION A/D CONVERTER

ABSOLUTE MAXIMUM RATINGS* (Note 1)

Positive Supply Voltage ............................................. +6V
Negative Supply Voltage............................................ - 9V
Analog Input Voltage (Pin 9 or 10) ........ V+ to V– (Note 2)
Reference Input Voltage (Pin 2).......................... V+ to V
Clock Input Voltage ............................................. 0V to V
Operating Temperature Range ....................0°C to +70°C
Storage Temperature Range ................– 65°C to +150°C
Lead Temperature (Soldering, 10 sec) .................+300°C
ELECTRICAL CHARACTERISTICS:
TA = +25°C, f
Package Power Dissipation (TA 70°C)
28-Pin Plastic DIP.............................................1.14W
44-Pin PQFP ....................................................1.00W
64-Pin PFP .......................................................1.14W
*Static-sensitive device. Unused devices must be stored in conductive
material. Protect devices from static discharge and static fields. Stresses
+
above those listed under Absolute Maximum Ratings may cause perma­nent damage to the device. These are stress ratings only and functional operation of the device at these or any other conditions above those indicated in the operational sections of the specifications is not implied. Exposure to Absolute Maximum Rating Conditions for extended periods may affect device reliability.
= 200 kHz, V+ = +5V, V– = – 5V, unless otherwise specified.
CLOCK
Symbol Parameter Test Conditions Min Typ Max Unit
Analog
Display Reading With Notes 3 and 4 –0.0000 ±0.0000 +0.0000 Display Zero Volt Input Reading
TC
Z
TC
FS
NL Nonlinearity Error Note 7 0.5 1 Count DNL Differential Linearity Error Note 7 0.01 LSB
±FSE ± Full-Scale Symmetry –VIN = +V
I
IN
e
N
Digital
I
IL
I
IH
V
OL
V
OH
f
CLK
Power Supply
+
V
V
+
I
I PD Power Dissipation f
NOTES: 1. Functional operation is not implied.
Zero Reading VIN = 0V 0.5 2 µV/°C Temperature Coefficient Note 5
Full-Scale VIN = 2V 5 ppm/°C Temperature Coefficient Notes 5 and 6
Display Reading in VIN = V
REF
+0.9996 +0.9998 +1.0000 Display
Ratiometric Operation Note 3 Reading
IN
0.5 1 Count
Error (Roll-Over Error) Note 8 Input Leakage Current Note 4 1 10 pA Noise
Peak-to-Peak Value Not Exceeded 95% of Time
—15—µV
P-P
Input Low Current VIN = 0V 10 100 µA Input High Current VIN = +5V 0.08 10 µA Output Low Voltage IOL = 1.6 mA 0.2 0.4 V Output High Voltage
B
, B2, B4, B8, D1–D
1
Busy, Polarity, Overrange, I
IOH = 1 mA 2.4 4.4 5 V
5
= 10 µA 4.9 4.99 5 V
OH
Underrange, Strobe
Clock Frequency Note 10 0 200 1200 kHz
Positive Supply Voltage 4 5 6 V Negative Supply Voltage – 3 – 5 – 8 V Positive Supply Current f Negative Supply Current f
2. Limit input current to under 100 µA if input voltages exceed supply voltage.
3. Full-scale voltage = 2V.
4. VIN = 0V.
5. 0°C TA ≤ +70°C.
6. External reference temperature coefficient less than 0.01 ppm/°C.
= 0 Hz 1 3 mA
CLK
= 0 Hz 0.7 3 mA
CLK
= 0 Hz 8.5 30 mW
CLK
7. – 2V VIN ≤ +2V. Error of reading from best fit straight line.
8. |VIN| = 1.9959.
9. Test circuit shown in Figure 1.
10. Specification related to clock frequency range over which the TC835 correctly performs its various functions. Increased errors result at higher operating frequencies.
3-66
TELCOM SEMICONDUCTOR, INC.
PERSONAL COMPUTER DA TA ACQUISITION A/D CONVERTER

PIN CONFIGURATIONS

1
TC835
2
V
REF IN
ANALOG
COM
INT OUT
AZ IN
BUFF OUT
C
REF +
C
REF
INPUT
+
INPUT
V
(MSD) D5
(LSB) B1
B2
1 2 3 4 5 6 7 8 9
10
+
11 12 13 14
TC835CPI
NC NC
NC NC
NC NC
OVERRANGE
UNDERRANGE
SUB
REF IN
ANALOG COM
NC NC NC NC
NOTES:
UNDERRANGE
28
OVERRANGE
27 26
STROBE RUN/HOLD
25 24
DIGTAL GND
23
POLARITY CLOCK IN
22 21
BUSY
20
D1 (LSD)
19
D2
18
D3
17
D4
16
B8 (MSD) B4
15
NC
NC
STROBE
RUN/HOLD
NC
NC
63
64
1 2 3 4 5 6 7 8 9
10
V–
11 12 13 14 15 16
17 18
NC
1. NC = No internal connection.
2. Pins 9, 25, 40 and 56 are connected to the die substrate. The potential at these pins is approximately V+. No external connections should be made.
61 60 59 58
62
19 20 21 22
NC
AZ IN
INT OUT
DGND
TC835CBU
NOTES 1 & 2
23
NC
OUT
BUFF
BUF CAP–
57 56
24 25 26
NC
INT OUT
AZ IN
BUFF OUT
REF CAP– REF CAP+
–INPUT +INPUT
V+
NC
NC
POL
SUB
CLK IN
55 54
NC
SUB
BUF CAP+
1 2 3 4
5
6
7
8
9 10 11
BUSY
27 28
NC
NCNCNC
44 43 42 41 39 3840
ANALOG COM
REF INV–URORSTROBENCNC
TC835CKW
12 13 14 15 17 18
NC
NC
NC
D1
D2
53
51
52
29 30
NC
–INPUT
+INPUT
(MSD) D5
NC
50 49
31
32
NC
16
B2
(LSB) B1
NC
48 47 46 45 44 43 42 41 40 39 38 37 36 35 34 33
V+
NC
NC
NC D3
D4 B3
B4 B2 SUB
B1 D5 NC NC NC
NC
NC
B4
(MSB) B8
37 36 35 34
19 20 21 22
D4
D3
NC
33 32 31 30 29 28 27
26 25 24 23
NC
NC NC RUN/HOLD DGND POLARITY CLK IN
BUSY D1 (LSD) D2 NC NC
3
4
5
6
7
8
TELCOM SEMICONDUCTOR, INC.
3-67
TC835
PERSONAL COMPUTER
DA TA ACQUISITION A/D CONVERTER
SET V
REF
V
IN
REF
100 k
ANALOG GND
0.47 µF
SIGNAL INPUT
+
5V
LOGIC
INPUT
= 1V
100 k 100
k
0.1 µF
–5V
1
V
2
REF IN
3
ANALOG COMMON
4
1 µF
INT OUT
5
AZ IN
6
BUFF OUT
7
C
8
C
9
10
+
11
V
12
D5 (MSD)
13
B1 (LSB)
14
B2
– REF + REF
INPUT INPUT
+
1 µF
Figure 1. Test Circuit
+
V
UNDERRANGE
OVERRANGE
STROBE
RUN/HOLD
DIGTAL GND
POLARITY
CLOCK IN
BUSY
(LSD) D1
TC835
(MSB) B8
28 27
26 25 24 23
22 21 20 19
D2
18
D3
17
D4
16 15
B4
BUFFER
CLOCK INPUT 120 kHz
+
IN
REF
IN
ANALOG COM
IN
+
IN
REF
IN
ANALOG COM
IN
SW
SW
SW
SW
SW
SW
SW
SW
ANALOG
SW
C
REF
SW
INPUT BUFFER
+ RI
RI
SW
1
+
SWIZSW
SW
Z
R
Z
INT
C
INT
C
SZ
+
INTEGRATOR
SWITCH OPEN SWITCH CLOSED
COMPARATOR
+
TO DIGITAL SECTION
I
SW
RI
R
Z
+
SW
RI
I
Figure 3B. System Zero Phase
ANALOG
SW
C
REF
SW
INPUT BUFFER
+ RI
RI
SW
1
+
SWIZSW
SW
Z
R
Z
INT
C
INT
C
SZ
+
INTEGRATOR
SWITCH OPEN SWITCH CLOSED
COMPARATOR
+
TO DIGITAL SECTION
I
SW
RI
R
Z
+
SW
RI
I
+
REF
ANALOG COM
3-68
Figure 2. Digital Logic Input Figure 3C. Input Signal Integration Phase
REF
SW
+ RI
RI
ANALOG
INPUT BUFFER
+
SWIZSW
SW
1
SW
C
R
Z
Z
INT
INT
C
SZ
+
INTEGRATOR
SWITCH OPEN SWITCH CLOSED
COMPARATOR
+
TO DIGITAL SECTION
ANALOG
SW
C
REF
SW
INPUT BUFFER
+ RI
RI
SW
1
+
SWIZSW
SW
Z
R
INT
Z
C
INT
C
SZ
+
INTEGRATOR
COMPARATOR
+
TO DIGITAL SECTION
SW
I
IN
SW
RI
SW
R
IN
SW
Z
+
SW
RI
SW
I
IN
Figure 3A. Analog Circuit Function Diagram
+
IN
REF
IN
ANALOG COM
IN
SW
I
SW
SW
RI
C
R
+
SW
RI
I
SW
SW
Z
SW
Figure 3D. Reference Voltage Integration Cycle
TELCOM SEMICONDUCTOR, INC.
PERSONAL COMPUTER DA TA ACQUISITION A/D CONVERTER
1
TC835
ANALOG
SW
C
REF
SW
INPUT BUFFER
+ RI
RI
SW
1
+
SWIZSW
SW
Z
R
INT
Z
C
INT
C
SZ
+
INTEGRATOR
SWITCH OPEN SWITCH CLOSED
COMPARATOR
+
TO DIGITAL SECTION
+
IN
REF
IN
ANALOG COM
IN
SW
SW
I
SW
RI
SW
R
Z
+
SW
RI
SW
I
Figure 3E. Integrator Output Zero Phase

GENERAL THEORY OF OPERATION

(All Pin Designations Refer to 28-Pin DIP)

Dual-Slope Conversion Principles

The TC835 is a dual-slope, integrating analog-to-digital converter. An understanding of the dual-slope conversion technique will aid in following the detailed TC835 opera­tional theory.
The conventional dual-slope converter measurement cycle has two distinct phases:
(1) Input signal integration
(2) Reference voltage integration (deintegration)
The input signal being converted is integrated for a fixed time period. Time is measured by counting clock pulses. An opposite polarity constant reference voltage is then inte­grated until the integrator output voltage returns to zero. The reference integration time is directly proportional to the input signal.
In a simple dual-slope converter, a complete conversion requires the integrator output to "ramp-up" and "ramp­down."
A simple mathematical equation relates the input signal, reference voltage, and integration time:
t
1 VR t
RC RC
where:
VR = Reference voltage tSI = Signal integration time (fixed) tRI = Reference voltage integration time (variable).
For a constant VIN:
VIN = V
SI
VIN(t) dt =
0
t
RI
.
R
]
[
t
SI
RI ,
The dual-slope converter accuracy is unrelated to the integrating resistor and capacitor values, as long as they are stable during a measurement cycle. An inherent benefit is noise immunity. Noise spikes are integrated, or averaged, to zero during the integration periods. Integrating ADCs are immune to the large conversion errors that plague succes­sive approximation converters in high-noise environments. (See Figure 4.)

TC835 Operational Theory

The TC835 incorporates a system zero phase and integrator output voltage zero phase to the normal two­phase dual-slope measurement cycle. Reduced system errors, fewer calibration steps, and a shorter overrange recovery time result.
The TC835 measurement cycle contains four phases:
(1) System zero
(2) Analog input signal integration
(3) Reference voltage integration
(4) Integrator output zero
Internal analog gate status for each phase is shown in Table 1.
ANALOG
INPUT
SIGNAL
REF
VOLTAGE
OUTPUT
INTEGRATOR
FIXED
SIGNAL
INTEGRATE
TIME
INTEGRATOR
+
SWITCH DRIVER
PHASE CONTROL
POLARITY CONTROL
DISPLAY
V
IN
V
IN
VARIABLE REFERENCE INTEGRATE TIME
Figure 4. Basic Dual-Slope Converter
COMPARATOR
+
'
V
FULL SCALE
1/2 V
'
CONTROL
LOGIC
COUNTER
FULL SCALE
CLOCK
2
3
4
5
6
7
8
TELCOM SEMICONDUCTOR, INC.
3-69
TC835
Table 1. Internal Analog Gate Status
PERSONAL COMPUTER
DA TA ACQUISITION A/D CONVERTER
Conversion Reference Cycle Phase SW
System Zero Closed Closed Closed 3B Input Signal Closed 3C
Integration Reference Voltage Closed* Closed 3D
Integration Integrator Closed Closed 3E
Output Zero
*NOTE: Assumes a positive polarity input signal. SWRI would be closed for a negative input signal.
SW
I
System Zero (Figure 3B)
During this phase, errors due to buffer, integrator, and comparator offset voltages are compensated for by charg­ing CAZ (auto-zero capacitor) with a compensating error voltage. With a zero input voltage the integrator output will remain at zero.
The external input signal is disconnected from the internal circuitry by opening the two SWI switches. The internal input points connect to ANALOG COMMON. The reference capacitor charges to the reference voltage poten­tial through SWR. A feedback loop, closed around the integrator and comparator, charges the CAZ capacitor with a voltage to compensate for buffer amplifier, integrator, and comparator offset voltages.
Analog Input Signal Integration (Figure 3C)
The TC835 integrates the differential voltage between the +INPUT and –INPUT pins. The differential voltage must be within the device common-mode range; - 1V from either supply rail, typically.
The input signal polarity is determined at the end of this phase.

Internal Analog Gate Status

+
RI
SW
RI
SW
Z

Analog Section Functional Description

(In Reference to the 28-Pin Plastic Package)
Differential Inputs
(+INPUT, Pin 10 and –INPUT, Pin 9) input amplifier common-mode range. The input amplifier
common-mode range extends from 0.5V below the positive supply to 1V above the negative supply. Within this com­mon-mode voltage range, an 86 dB common-mode rejec­tion ratio is typical.
voltage. The integrator output must not be allowed to satu­rate. A worst-case condition exists, for example, when a large positive common-mode voltage with a near full-scale negative differential input voltage is applied. The negative input signal drives the integrator positive when most of its swing has been used up by the positive common-mode voltage. For these critical applications the integrator swing can be reduced to less than the recommended 4V full-scale swing, with some loss of accuracy. The integrator output can swing within 0.3V of either supply without loss of linearity.
SW
R
SW
1
SW
IZ
Schematic
The TC835 operates with differential voltages within the
The integrator output also follows the common-mode
Reference Voltage Integration (Figure 3D)
The previously-charged reference capacitor is con­nected with the proper polarity to ramp the integrator output back to zero. The digital reading displayed is:
Reading = 10,000 .
Differential Input
V
REF
][
Integrator Output Zero (Figure 3E)
This phase guarantees the integrator output is at 0V when the system zero phase is entered and that the true system offset voltages are compensated for. This phase normally lasts 100 to 200 clock cycles. If an overrange condition exists, the phase is extended to 6200 clock cycles.
3-70
ANALOG COMMON Input (Pin 3)
ANALOG COMMON is used as the –INPUT return during auto-zero and deintegrate. If –INPUT is different from ANALOG COMMON, a common-mode voltage exists in the system. This signal is rejected by the excellent CMRR of the converter. In most applications, –INPUT will be set at a fixed, known voltage (power supply common, for instance). In this application, ANALOG COMMON should be tied to the same point, thus removing the common-mode voltage from the converter. The reference voltage is referenced to ANALOG COMMON.
REFERENCE Voltage Input (REF IN, Pin 2)
The REF IN input must be a positive voltage with respect to ANALOG COMMON. Two reference voltage circuits are shown in Figure 5.
TELCOM SEMICONDUCTOR, INC.
,
PERSONAL COMPUTER DA TA ACQUISITION A/D CONVERTER
1
TC835
+
V
+
V
REF
IN
6.8V ZENER
TC835
I
V
6.8 kΩΩ
TC04
1.25V REF
ANALOG GROUND
Z
+
V
ANALOG
COMMON
+
V
REF
IN
TC835
ANALOG
COMMON
Figure 5. Using an External Reference
20 k

Digital Section Functional Description

The major digital subsystems within the TC835 are illustrated in Figure 6, with timing relationships shown in Figure 7. The multiplexed BCD output data can be displayed on LCD or LED display with the TC7211A (LCD) 4-digit display driver.
The digital section is best described through a discus­sion of the control signals and data outputs.
RUN/HOLD Input (Pin 25)
When left open, this pin assumes a logic "1" level. With a R/H = 1, the TC835 performs conversions continuously, with a new measurement cycle beginning every 40,002 clock pulses.
When R/H changes to a logic "0," the measurement cycle in progress will be completed, and data held and displayed as long as the logic "0" condition exists.
A positive pulse (>300nsec) at R/H initiates a new measurement cycle. The measurement cycle in progress when R/H initially assumed the logic "0" state must be completed before the positive pulse can be recognized as a single conversion run command.
POLARITY
FROM
ANALOG
SECTION
POLARITY
FF
ZERO
CROSS
DETECT
24 22 25 27 28 26 21
DIGITAL
CLOCKINRUN/
GND
Figure 6. Digital Section Functional Diagram
INTEGRATOR
OUTPUT
BUSY
OVERRANGE
WHEN
APPLICABLE
UNDERRANGE
WHEN
APPLICABLE
DIGIT SCAN
STROBE
DIGIT SCAN
FOR
OVERRANGE
D5 D4 D3 D2 D1
MSB DIGIT DRIVE SIGNAL LSB
MULTIPLEXER
LATCH LATCH LATCH LATCH LATCH
COUNTERS
CONTROL LOGIC
OVER–
HOLD
SYSTEM
ZERO
10,001
COUNTS
FULL MEASUREMENT CYCLE
EXPANDED SCALE
100
COUNTS
*
D5
D4
Figure 7. Timing Diagrams for Outputs
RANGE
SIGNAL
INTE
10,000
COUNTS
(FIXED)
40,002 COUNTS
BELOW
AUTO ZERO
D3
D2
D1
RANGE
REFERENCE
INTEGRATE
20,001
COUNTS (MAX)
*
SIGNAL
INTEGRATE
STROBE BUSYUNDER–
D5 D4 D3
D2
D1 FIRST D5 OF SYSTEM ZERO
AND REFERENCE INTEGRATE ONE COUNT LONGER.
OUTPUT
REFERENCE INTEGRATE
*
DATA
13 B1 14 B2
15 B4 16 B8
2
3
4
5
6
7
8
TELCOM SEMICONDUCTOR, INC.
3-71
TC835
PERSONAL COMPUTER
DA TA ACQUISITION A/D CONVERTER
The new measurement cycle begins with a 10,001­count auto-zero phase. At the end of this phase the busy signal goes high.
STROBE Output (Pin 26)
During the measurement cycle, the STROBE control line is pulsed low five times. The five low pulses occur in the center of the digit drive signals (D1, D2, D3, D5, Figure 8).
D5 (MSD) goes high for 201 counts when the measure­ment cycles end. In the center of the D5 pulse, 101 clock pulses after the end of the measurement cycle, the first STROBE occurs for one-half clock pulse. After the D5 digit strobe, D4 goes high for 200 clock pulses. The STROBE goes low 100 clock pulses after D4 goes high. This continues through the D1 digit drive pulse.
The digit drive signals will continue to permit display scanning. STROBE pulses are not repeated until a new measurement is completed. The digit drive signals will not continue if the previous signal resulted in an overrange condition.
The active low STROBE pulses aid BCD data transfer to UARTs, processors and external latches. (See Application Note 16.)
BUSY Output (Pin 21)
At the beginning of the signal-integration phase, BUSY goes high and remains high until the first clock pulse after the integrator zero crossing. BUSY returns to the logic "0" state after the measurement cycle ends in an overrange condi­tion. The internal display latches are loaded during the first clock pulse after BUSY, and are latched at the clock pulse end. The BUSY signal does not go high at the beginning of the measurement cycle, which starts with the auto-zero cycle.
OVERRANGE Output (Pin 27)
If the input signal causes the reference voltage integra­tion time to exceed 20,000 clock pulses, the OVERRANGE output is set to a logic "1." The overrange output register is set when BUSY goes low, and is reset at the beginning of the next reference-integration phase.
TC835 OUTPUTS
BUSY
B1–B8
STROBE
D5
D4
D3
D2
D1
Figure 8. Strobe Signal Pulses Low Five Times per Conversion
END OF CONVERSION
*
D3
DATAD2DATA
200
COUNTS
COUNTS
200
COUNTS
COUNTS
D4
DATA
200
D5 (MSD)
DATA
201
COUNTS
*
DELAY BETWEEN BUSY GOING LOW AND FIRST STROBE
PULSE IS DEPENDENT ON ANALOG INPUT.
200
D1 (LSD)
DATAD5DATA
NOTE ABSENCE OF STROBE
200
COUNTS
200
COUNTS
The polarity bit is valid even for a zero reading. Signals less than the converter's LSB will have the signal polarity determined correctly. This is useful in null applications.
DIGIT Drive Outputs (Pins 12, 17, 18, 19 and 20)
Digit drive signals are positive-going signals. The scan sequence is D5 to D1. All positive pulses are 200 clock pulses wide, except D5, which is 201 clock pulses wide.
All five digits are scanned continuously, unless an overrange condition occurs. In an overrange condition, all digit drives are held low from the final STROBE pulse until the beginning of the next reference-integrate phase. The scanning sequence is then repeated. This provides a blink­ing visual display indication.
UNDERRANGE Output (Pin 28)
If the output count is 9% of full scale or less (1800 counts), the underrange register bit is set at the end of BUSY. The bit is set low at the next signal-integration phase.
POLARITY Output (Pin 23)
A positive input is registered by a logic "1" polarity signal. The polarity bit is valid at the beginning of reference inte­grate and remains valid until determined during the next conversion.
3-72
BCD Data Outputs (Pins 13, 14, 15 and 16)
The binary coded decimal (BCD) bits B8, B4, B2, B1, are positive-true logic signals. The data bits become active simultaneously with the digit drive signals. In an overrange condition, all data bits are at a logic "0" state.
TELCOM SEMICONDUCTOR, INC.
PERSONAL COMPUTER DA TA ACQUISITION A/D CONVERTER
1
TC835
APPLICATIONS INFORMATION Component Value Selection
The integrating resistor is determined by the full-scale input voltage and the output current of the buffer used to charge the integrator capacitor. Both the buffer amplifier and the integrator have a class A output stage, with 100 µA of quiescent current. A 20 µA drive current gives negligible linearity errors. Values of 5 µA to 40 µA give good results. The exact value of an integrating resistor for a 20 µA current is easily calculated.
R
Integrating Capacitor
The product of integrating resistor and capacitor should be selected to give the maximum voltage swing that ensures the tolerance buildup will not saturate the integrator swing (approximately 0.3V from either supply). For ±5V supplies and ANALOG COMMON tied to supply ground, a ±3.5V to
±4V full-scale integrator swing is adequate. A 0.10 µF to 0.47 µF is recommended. In general, the value of C
C
A very important characteristic of the integrating capaci­tor is that it has low dielectric absorption to prevent rollover or ratiometric errors. A good test for dielectric absorption is to use the capacitor with the input tied to the reference. This ratiometric condition should read half-scale 0.9999, any deviation is probably due to dielectric absorption. Polypro­pylene capacitors give undetectable errors at reasonable cost. Polystyrene and polycarbonate capacitors may also be used in less critical applications.
Auto-Zero and Reference Capacitors
The size of the auto-zero capacitor has some influence on the noise of the system. A large capacitor reduces the noise. The reference capacitor should be large enough such that stray capacitance to ground from its nodes is negligible.
The dielectric absorption of the reference capacitor and auto-zero capacitor are only important at power-on, or when the circuit is recovering from an overload. Smaller or cheaper capacitors can be used if accurate readings are not required for the first few seconds of recovery.
full-scale voltage
=
INT
INT
=
=
20 µA
[10,000 × clock period] × I
Integrator output voltage swing
(10,000) (clock period) (20 µA)
Integrator output voltage swing
INT
is given by:
INT
The stability of the reference voltage is a major factor in the overall absolute accuracy of the converter. For this reason, it is recommended that a high-quality reference be used where high-accuracy absolute measurements are being made. Suitable references are:
Part Type Manufacturer
TC04A TelCom Semiconductor TC9491 TelCom Semiconductor

Conversion Timing

Line Frequency Rejection
A signal integration period at a multiple of the 60 Hz line
frequency will maximize 60 Hz "line noise" rejection.
A 200 kHz clock frequency will reject 60 Hz and 400 Hz
noise. This corresponds to five readings per second.
Conversion Rate vs Clock Frequency
Oscillator Frequency Conversion Rate
(kHz) (Conv/Sec)
100 2.5 120 3 200 5 300 7.5 400 10 800 20
1200 30
Oscillator Frequency
(kHz) 60 Hz 50 Hz 400 Hz
50.000
53.333
66.667
80.000
83.333
100.000
125.000
133.333
166.667
200.000
250.000
The conversion rate is easily calculated:
Line Frequency Rejection
2
3
4
5
6
7
Reference Voltage
The analog input required to generate a full-scale output
is VIN = 2 V
TELCOM SEMICONDUCTOR, INC.
REF
.
Conversion Rate
(Readings 1/sec) =
Clock Frequency (Hz)
4000
8
3-73
TC835
PERSONAL COMPUTER
DA TA ACQUISITION A/D CONVERTER

Power Supplies and Grounds

Power Supplies
The TC835 is designed to work from ±5V supplies. For
single +5V operation, a TC7660 can provide a – 5V supply.
Grounding
Systems should use separate digital and analog ground
systems to avoid loss of accuracy.

Displays and Driver Circuits

TelCom Semiconductor manufactures two display de­coder/driver circuits to interface the TC835 to an LCD or LED display. Each drive has 28 outputs for driving four 7-segment digit displays.
Device Package Description
TC7211AIPL 40-Pin Epoxy 4-Digit LCD Driver/Decoder
Several sources exist for LCD and LED display:
Display
Manufacturer Address Type
Hewlett Packard 640 Page Mill Rd. LED Components Palo Alto, CA 94304
Litronix, Inc. 19000 Homestead Rd. LED
Cupertino, CA 94010
AND 720 Palomar Ave. LCD and
Sunnyvale, CA 94086 LED
Epson America, Inc. 3415 Kanhi Kawa St. LCD
Torrance, CA 90505

High-Speed Operation

The maximum conversion rate of most dual-slope A/D converters is limited by the frequency response of the comparator. The comparator in this circuit follows the inte­grator ramp with a 3 µsec delay, and at a clock frequency of 200 kHz (5 µsec period), half of the first reference integrate clock period is lost in delay. This means that the meter reading will change from 0 to 1 with a 50 µV input, 1 to 2 with 150 µV, 2 to 3 at 250 µV, etc. This transition at midpoint is considered desirable by most users; however, if the clock frequency is increased appreciably above 200 kHz, the instrument will flash "1" on noise peaks even when the input is shorted.
For many dedicated applications where the input signal is always of one polarity, the delay of the comparator need not be a limitation. Since the nonlinearity and noise do not increase substantially with frequency, clock rates of up to ~1 MHz may be used. For a fixed clock frequency, the extra count or counts caused by comparator delay will be a constant and can be subtracted out digitally.
The clock frequency may be extended above 200 kHz without this error, however, by using a low-value resistor in series with the integrating capacitor. The effect of the resistor is to introduce a small pedestal voltage on to the integrator output at the beginning of the reference integrate phase. By careful selection of the ratio between this resistor and the integrating resistor (a few tens of ohms in the recommended circuit), the comparator delay can be com­pensated and the maximum clock frequency extended by approximately a factor of 3. At higher frequencies, ringing and second-order breaks will cause significant nonlinearities in the first few counts of the instrument.
The minimum clock frequency is established by leakage on the auto-zero and reference capacitors. With most de­vices, measurement cycles as long as 10 seconds give no measurable leakage error.
The clock used should be free from significant phase or frequency jitter. Several suitable low-cost oscillators are shown in the applications section. The multiplexed output means that if the display takes significant current from the logic supply, the clock should have good PSRR.

Zero-Crossing Flip-Flop

The flip-flop interrogates the data once every clock pulse after the transients of the previous clock pulse and half-clock pulse have died down. False zero-crossings caused by clock pulses are not recognized. Of course, the flip-flop delays the true zero-crossing by up to one count in every instance, and if a correction were not made, the display would always be one count too high. Therefore, the counter is disabled for one clock pulse at the beginning of the reference integrate (deintegrate) phase. This one-count delay compensates for the delay of the zero-crossing flip­flop, and allows the correct number to be latched into the display. Similarly, a one-count delay at the beginning of auto-zero gives an overload display of 0000 instead of 0001. No delay occurs during signal integrate, so that true ratiometric readings result.
3-74
TELCOM SEMICONDUCTOR, INC.
PERSONAL COMPUTER
+5V
V
OUT
390 pF
30 k
7
8
2
3
16 k
0.22 µF
16 k
4
1 k
1
+5V
V
OUT
2
3
1
4
7
6
R2
100 k
R2
100 k
R3 50 k
C2
10 pF
R4
2 k
C1
0.1 µF
+
LM311
+
LM311
56 k
DA TA ACQUISITION A/D CONVERTER
TYPICAL APPLICATIONS DIAGRAMS
1
TC835
0.33µF
200 kHz
+
ANALOG
INPUT
100 k
1 µF
100 k
4-1/2 Digit ADC With Multiplexed Common Anode LED Display
20 19 18 17 12
D1 D2 D3 D4 D5
4
INT OUT
5
1 µF
6
22
10
9
3
AZ IN BUFF
OUT f
IN
+INPUT
–INPUT
ANALOG COMMON
V
21
–5V
100 k
REF IN
TC835
C
C
6.8 k
TC04
POL –
REF +
REF
4.7 k
23
7
1 µF
8
16
B8
15
B4
14
B2
13
B1
+
V
11
BLANK MSD ON ZERO
bc
6
D
2
C
1
B
7
A
7777
5
RBI
7447
X7
9–15
+5V
2
3
16
+5V
4
RC Oscillator Circuit
R
2
C
GATES ARE 74C04
1. fO = , RP = 2 C(0.41 RP + 0.7 R1)
a. If R1 = R2 = R1, f 0.55/RC b. If R2 >> R1, f 0.45/R1C c. If R2 << R1, f 0.72/R1C
2. Examples:
1
a. f = 120 kHz, C = 420 pF
R1 = R2 10.9 k
b. f = 120 kHz, C = 420 pF, R2 = 50 k
R1 = 8.93 k
c. f = 120 kHz, C = 220 pF, R2 = 5 k
R1 = 27.3 k
TELCOM SEMICONDUCTOR, INC.
Comparator Clock Circuits
R
1
f
O
5
6
R1 R
2
R1 + R
2
7
8
3-75
TC835
TC04
28 27 26
25 24 23 22 21
9 8 7 6 5 4 3 2 1
REF IN ANALOG
GND
INT OUT
AZ IN BUFF
OUT C
REF
+5V
–5V
6.8V
UR
DGND
POLARITY
OR
STROBE
RUN/HOLD
CLK IN
BUSY
1 2 3
4 5 6 7 8 9
SET V
REF
= 1V
1.22V
100
k
ANALOG
GND
0.33 µF
100 k 1 µF
47 k
150
+5V
150
10 11
12 13 14 15 16 17
18
+5V
CD4513
BE
1 µF
20
19 18 17
16 15
–INPUT +INPUT
V
+
D5 (MSD)
B1 (LSB) B2
(LSD) D1
D2 D3 D4
B4
(MSB) B8
10 11 12
13 14
100
k
SIG
IN
+
0.1 µF
+5V
f
OSC
= 200 kHz
+
C
REF
V
TC835
TC7660
11
1
+5V
8
23
(–5V)
V
+
V
24
10 µF
5
4
10 µF
+
+
TC835
TYPICAL APPLICATIONS DIAGRAMS
4-1/2 Digit ADC with Multiplexed Common Cathode LED Display
PERSONAL COMPUTER
DA TA ACQUISITION A/D CONVERTER
3-76
200 kHz
+ ANALOG
100 k
INPUT
0.33 µF
100 k
1 µF
4
5
6
22
10
9
3
–5V
1
V
INT OUT
AZ IN
BUFF OUT
f
IN
+INPUT
–INPUT
ANALOG COMMON
REF
IN
2
100 k
TC835
23
POL
STROBE
OR
20
D1
19
D2
18
D3
17
D4
16
B8
15
B4
14
B2
13
B1
12
D5
26 27
+
V
6.8 k
TC04
+5V
1/2 CD4030
+5V
1/4 CD4030
CD4081
CD4071
+5V
1/4 CD4081
4-1/2 DIGIT LCD
1/4 CD4030
D
Q
1/2
CD4013
CLK
RS
31
32 33
34
30 29 28
27
5
BP
D1
D2 D3
D4
TC7211A
B3 B2
B1
B0
SEGMENT DRIVE
+
V
GND
1 35
Negative Supply Voltage Generator
TELCOM SEMICONDUCTOR, INC.
Loading...