Tektronix products are covered by U.S. and foreign patents, issued and pending. Information in this publication
supersedes that in all previously published material. Specifications and price change privileges reserved.
TEKTRONIX and TEK are registered trademarks of Tektronix, Inc.
MagniVu and iView are registered trademarks of Tektronix, Inc.
Contacting Tektronix
Tektronix, Inc.
14200 SW Karl Braun Drive
P.O. B o x 5 0 0
Beaverton, OR 97077
USA
For product information, sales, service, and technical support:
In North America, call 1-800-833-9200.
Worl dwid e, vis it www.tektronix.com to find contacts in your area.
Warranty 2
Tektronix warrants that this product will be free from defects in materials and workmanship for a period of one (1)
year from the date of shipment. If any such product proves defective during this warranty period, Tektronix, at its
option, either will repair the defective product w ithout charge for parts and labor, or will provide a replacement
in exchange for the defective product. Parts, modules and replacement products used by Tektronix for warranty
work may be n
the property of Tektronix.
ew or reconditioned to like new performance. All replaced parts, modules and products become
In order to o
the warranty period and make suitable arrangements for the performance of service. Customer shall be responsible
for packaging and shipping the defective product to the service center designated by Tektronix, with shipping
charges prepaid. Tektronix shall pay for the return of the product to Customer if the shipment is to a location within
the country in which the Tektronix service center is located. C ustomer shall be responsible for paying all shipping
charges, duties, taxes, and any other charges for products returned to any other locations.
This warranty shall not apply to any defect, failure or damage caused by improper use or improper or inadequate
maintenance and care. Tektronix shall not be obligated to furnish service under this warranty a) to repair damage
result
b) to repair damage resulting from improper use or connection to incompatible equipment; c) to repair any damage
or malfunction caused by the use of non-Tektronix supplies; or d) to service a product that has been modified or
integrated with other products when the effect of such modification or integration increases the time or difficulty
of servicing the product.
THIS WARRANTY IS GIVEN BY TEKTRONIX WITH RESPECT TO THE PRODUCT IN LIEU OF A NY
OTHER WARRANTIES, EXPRESS OR IMPLIED. TEKTRONIX AND ITS VENDORS DISCLAIM ANY
IMPLIED WARRANTIES OF MERCHANTABILITY OR FITNESS FOR A PARTICULAR PURPOSE.
TRONIX’ RESPONSIBILITY TO REPAIR OR REPLACE DEFECTIVE PRODUCTS IS THE SOLE
TEK
AND EXCLUSIVE REMEDY PROVIDED TO THE CUSTOMER FOR BREACH OF THIS WARRANTY.
TEKTRONIX AND ITS VENDORS WILL NOT BE LIABLE FOR ANY INDIRECT, SPECIAL, INCIDENTAL,
OR CONSEQUENTIAL DAMAGES IRRESPECTIVE OF WHETHER TEKTRONIX OR THE VENDOR HAS
ADVANCE NOTICE OF THE POSSIBILITY OF SUCH DAMAGES.
btain service under this warranty, Customer must notify Tektronix of the defect before the expiration of
ing from attempts by personnel other than Tektronix representatives to install, repair or service the product;
This document lists characteristics and specifications of the following Tektronix
Logic Analyzer Family products:
TLA7000 series mainframes
TLA7PC1 Controller
TL708EX TekLink 8-Port Hub
TLA700 series mainframes
lated Documentation
Re
TLA600 se
TLA7Axx/TLA7Nx series logic analyzer modules
TLA7Lx/Mx/Nx/Px/Qx series logic analyzer modules
TLA7PG2 pattern generation modules
DSO digital storage oscilloscope modules
Other Tektronix Logic Analyzer modules, microprocessor-related products, and
individual logic analyzer probes have their own documentation for characteristics
and specifications.
This document also contains performance verification procedures for the
TLA7000 Series mainframes.
To prevent personal injury or damage consider the following requirements before
attempting service:
Read the General Safety Summary and Service Safety Summary found in the
Tektronix Logic Analyzer Family Product Safety & Compliance Instructions
(Tektronix part number 071-2591-xx).
ries logic analyzers
Refer to the individual service manuals for the performance verification
procedures and adjustment procedures for earlier TLA products.
The following table lists related documentation available for your logic analyzer.
The documentation is available on the TLA Documentation CD and on the
Tektronix Web site (www.tektronix.com/manuals).
You can also check the release notes on the instrument for additional information.
To access the release notes, select Start > All Programs > Tektronix Logic
Analyzer > TLA Release Notes.
This document lists the specifications for the Tektronix Logic Analyzer
mainframes and other logic analyzer products. Additional specification
documents ar
Web site. For the most current documentation, refer to the Tektronix Web site
(http://www.Tektronix.com).
Characteristic Tables
All specifications are guaranteed unless noted Typical . Typical characteristics
describe typical or average performance and provide useful reference information.
e available on the TLA Documentation CD or on the Tektronix
Specifications that are marked with the
indirectly) using performance verification procedures.
For mainframes and modules, the performance limits in this specification are valid
with these conditions:
The logic analyzer must be in an environment with temperature, altitude,
humidity, and vibration within the operating limits described in these
specifications.
The logic analyzer must have had a warm-up period of at least 30 minutes.
For modules, the performance limits in this specification are valid with these
conditions:
The modules must be installed in a Logic Analyzer Mainframe.
The module must have been calibrated/adjusted at an ambient temperature
between +20 °C and +30 °C.
The DSO module must have had its signal-path-compensation routine (self
calibration or self cal) last executed after at least a 30 minute warm-up period.
After the warm-up period, the DSO module must have had its
signal-path-compensation routine last executed at an ambient temperature
within ±5 °C of the current ambient temperature.
symbol are checked directly (or
For optimum performance using an external oscilloscope, please consult the
documentation for any external oscilloscopes used with your Tektronix Logic
Analyzer to determine the warm-up period and signal-path compensation
requirements.
haracteristics for the Tektronix Logic Analyzer Family
The following table lists the Atmospheric characteristics of components in the
Tektronix Logic Analyzer family.
Table 1: Atm
CharacteristicDescription
Temperatur
Relative Humidity
tude
Alti
1
For TLA7012 instruments, the operating temperature is +5 °C to +45 °C, 11 °C/hr maximum gradient, noncondensing (derated 1 °C per 1000 ft above
5000 ft (1524 m) altitude)
2
TLA7Axx series module operating temperature is +40 °C maximum.
3
A7Axx series module operating humidity is 5% to 90% up to +30 °C, 75% from +30 to +40 °C, noncondensing. Maximum wet-bulb temperature is +29.4 °C.
TL
4
TLA7NAx series module operating humidity is 5% to 90% up to +30 °C, 75% from +30 to +40 °C, 45 % from +40 to +50 °C, noncondensing. Maximum
wet-bulb temperature is +29.4 °C.
5
TLA7Axx/TLA7NAx series module nonoperating humidity is 5% to 90% limited by a wet bulb temperature of +40 °C.
ospheric characteristics
e
Operating (no media in CD or DVD drive)
+5 °C to +50 °C, 15 °C/hr maximum gradient, noncondensing (derated 1 °C per 305 m (1000 ft) above
1524 m (5000 ft) altitude)
Nonoperating (no media in drive)
-20 °C to +60 °C, 15 °C/hr maximum gradient, noncondensing
Operating (no media in drive)
20% to 80% relative humidity, noncondensing. Maximum wet bulb temperature: +29 °C (derates relative
humidi
Nonop
8% to 8
humidity to approximately 22% at +50 °C).
Operating
To 3000 m (9843 ft), (derated 1 °C per 305 m (1000 ft) above 1524 m (5000 ft) altitude.
Non
190 m (40,000 ft )
12,
12
ty to approximately 22% at +50 °C).
34
erating (no media in drive)
0% relative humidity, noncondensing. Maximum wet bulb temperature: +29 °C (derates relative
g tables list the specifications common to the TLA7000 series logic
analyzers.
Table 2: TLA7000 Backplane interface
CharacteristicDescription
Number of SlotsPortable mainframe
Benchtop m
CLK10 Frequency
Relative Time Correlation
12
Error
1
2
(Typical)
Includes typical jitter, slot-to-slot skew, and probe-to-probe variations to provide a "typical" number for the measurement. Assumes standard accessory
probes are utilized.
r time intervals longer than 1 ms between modules, add 0.01% of the difference between the absolute time measurements to the relative time correlation
Fo
error to account for the inaccuracy of the CLK10 source.
TLA7Nx/Px/Qx to TLA7Lx/Mx/Nx/Px/Qx "MagniVu" data
TLA7Axx/TLA7NAx to TLA7AxxTLA7NAx "MagniVu" data
TLA7Axx/TLA7NAx to TLA7Nx/Px/Qx "MagniVu" data
TLA7Nx/Px/Qx to TLA7Nx/Px/Qx "normal" data using an
internal clock
TLA7Axx/TLA7NAx to TLA7Axx "normal" data using an
internal clock
TLA7Axx/TLA7NAx to TLA7Nx/Px/Qx "normal" data using
an internal clock
TLA7Nx/Px/Qx to TLA7Nx/Px/Qx "normal" data using an
external clock
TLA7Axx/TLA7NAx to TLA7Axx/TLA7NAx "normal" data
using an e xternal clock
TLA7Axx/TLA7NAx to TLA7Nx/Px/Qx "normal" data using
an external clock
trigger and external signal input latencies (Typical)
1
em trigger input to LA probe tip
x modules
A7NAx modules
2
Same mainframeTo expansion frame
–266 ns–202 ns
–626 ns–562 ns
TLA7BBx modules–1202 ns–1143 ns
TLA7Sxx modules
External Signal In to LA probe tip via Signals 3, 4 (TTLTRG 0,1)
3
–958 ns ±30 ns–1221 ns ±30 ns
TLA7Nx/Px/Qx modules–212 ns + Clk–148 ns + Clk
TLA7AAx/TLA7NAx modules–535 ns + Clk–471 ns + Clk
TLA7BBx modules
TLA7Sxx modules
External Signal In to LA probe tip via Signals 1, 2(ECLTRG 0,1)
34
–1190 ns + Clk–1118 ns + Clk
–950 ns ±30 ns–1220 ns ±30 ns
TLA7Nx/Px/Qx modules–208 ns + Clk–144 ns + Clk
TLA7AAx/TLA7NAx modules–627 ns + Clk–556 ns + Clk
TLA7BBx modules
TLA7Sxx modules
1
All system trigger and signal input latencies were measured from a falling edge transition (active true low) with signals in the wired-OR configuration.
2
In the Waveform window, triggers are always marked immediately except when delayed to the first sample. In the Listing window, triggers are always
marked on the next sample period following their occurrence.
3
Clk represents the time to the next master clock at the destination logic analyzer module. With asynchronous clocking this represents the delta time to the next
sample clock. With synchronous sampling this represents the time to the next master clock generated by the setup of the clocking state machine and the
plied SUT clocks and qualification data.
sup
4
Signals 1 and 2 (ECLTRG0, 1) are limited to a broadcast mode where only one source can drive the signal node at any one time. The signal source can be
used to drive any combination of destinations.
LA probe tip to external system trigger out (skid)
trigger and external signal output latencies (Typical)
1
2
Same mainframeTo expansion frame
TLA7Nx/Px/Qx modules376 ns + Smpl437 ns + Smpl
TLA7AAx/TLA7NAx modules794 ns + Smpl854 ns + Smpl
TLA7BBx mod
TLA7Sxx modules
LA probe tip to External Signal Out via Signal 3, 4 (TTLTRG 0,1)
ules
1332 ns + Smpl1392 ns + Smpl
1170 ns ±30
3
ns
1230 ns ±30
ns
OR function
TLA7Nx/Px/Qx modules366 ns + S mpl428 ns + Smpl
TLA7AAx/TLA7NAx modules793 ns + S mpl854 ns + Smpl
TLA7BBx modules
TLA7Sxx modules
1328 ns + Smpl1390 ns + Smpl
950 ns ±30 ns1011 ns ±30 ns
AND function
TLA7Nx/Px/Qx modules379 ns + S mpl457 ns + Smpl
TLA7AAx/TLA7NAx modules803 ns + S mpl881 ns + Smpl
TLA7BBx modules
TLA7Sxx modules
LA probe tip to External Signal Out via Signals 1, 2 (ECLTRG0,1)
34
1340 ns + Smpl1418 ns + Smpl
950 ns ±30 ns1028 ns ±30 ns
TLA7Nx/Px/Qx modules374 ns + Smpl444 ns + Smpl
TLA7AAx/TLA7NAx modules793 ns + Smpl863 ns + Smpl
TLA7BBx modules
TLA7Sxx modules
1
SMPL represents the time from the event to the next valid data sample at the probe tip of the LA module. With asynchronous sampling, this represents the delta
time to the next sample clock. With MagniVu asynchronous sampling, this represents 500 ps or less. With synchronous sampling, this represents the timetothe
next master clock generated by the setup of the clocking state machine, the system-under-test supplied clocks, and the qualification data.
2
Skid is commonly referred to as the system level system trigger and signaling output latency. This is the absolute time from when the event first appears at the
input probe tips of a module to when the corresponding event that it generates appears at the system trigger or external signal outputs.
3
All signal output latencies are validated to the rising edge of an active (true) high output.
4
Signals 1 and 2 (ECLTRG0, 1) are limited to a broadcast mode where only one source can drive the signal node at any one time. The signal source can be
used to drive any combination of destinations.
In the Waveform window, triggers are always marked immediately except when delayed to the first sample. In the Listing window, triggers are always
marked on the next sample period following their occurrence.
2
SMPL represents the time from the event to the next valid data sample at the probe tip of the LA module. With asynchronous sampling, this represents the delta
time to the next sample clock. With MagniVu asynchronous sampling, this represents 500 ps or less. With synchronous sampling, this represents the timetothe
next master clock generated by the setup of the clocking state machine, the system-under-test supplied clocks, and the qualification data.
3
Clk represents the time to the next master clock at the destination logic analyzer module. With ascynchronous clocking this represents the delta time to the next
sample clock. With synchronous sampling this represents the time to the next master clock generated by the setup of the clocking state machine and the
supplied SUT clocks and qualification data.
4
Signals 1 and 2 (ECLTRG0, 1) are limited to a broadcast mode where only one source can drive the signal node at any one time. The signal source can be
used to drive any combination of destinations.
The Input Bandwidth specification only applies to signals to the modules; it does not apply to signals applied to the External Signal Input and sent back to the
External Signal Output.
2
The Output Bandwidth specification only applies to signals from the modules; it does not apply to signals applied to the External Signal Input and sent
back to the External Signal Output.
TTL compatible outputs via rear panel mounted BNC connectors (portable
mainframe) or front panel mounted SMB connectors (benchtop mainframe)
g tables describe the specifications for the TLA7012 Portable
Mainframe.
Table 7: TLA7012 Internal controller
CharacteristicD escription
Operating systemMicrosoft Windows XP Professional
Motherboard
Microprocessor
Chip setIntel 915GM GMCH with an Intel ICH6-M I/O hub. Supports dual channel
Main memory
Cache memory2 MB Level 2 (L2) write-back cache
RTC, CMOS setup, & PNP NVRAM retention time
ical)
(Typ
Bootable replaceable
ddiskdrive
har
rmatted capacity
Fo
nterface
I
Average seek timeRead 9 ms
DVD-RW drive
The AB915GM motherboard is an ATX-family board that meets the
FlexATX a
Intel Mobil Celeron M or Pentium M processor and an Intel 915GM chipset,
integrating video, system monitoring, and Ethernet controllers on a 9.0 X
7.5 inch b
Intel 2 G
processor package
memory for higher performance.
Two 200 pin SO DIMM sockets for DDR2-400/533 (PC2-3200/4300)
modul
Maximum 2 GB (two modules, Gbit technology), minimum 128 MB
Installed Configuration 1 GB
> 5 years battery life, lithium battery
Sta
drive residing on an EIDE interface.
80 GB
Continually subject to change due to the fast-moving PC component
en
ATA, native
S
W
Standard PC compatible IDE (Integrated Device Electronics) DVD-RW
drive residing on an EIDE interface.
Continually subject to change due to the fast-moving PC component
environment.
nd microATX form-factor specifications. It is based around an
oard.
Hz/533 Dothan microprocessor; 479-pin PGA socket for uFC-PGA
es.
ndard PC compatible IDE (Integrated Device Electronics) hard disk
vironment. These storage capacities valid at product introduction.
The TLA7012 Portable Mainframe motherboard can drive 3 video
displays.
Two DVI conne
connectors has both the DVI digital signals and the analog signals
while the other connector has only DVI digital signals available.
The third di
This connection is via LVDS. This port drives the internal 15-inch
display. One of the external connectors and the internal connection are
connected t
One VGA, SV
Primary video port with DVI
nly
digital o
Secondary video port with
ital and analog
DVI dig
VGA signalling through an
adapter
ClassificationColor LCD (NEC TFT NL10276BC30-24D)
Resolution/Refresh rate and
area
lor scale
Co
on (Pixels)
Resoluti
640 x 480
1024 x 768
1280 x 1024
1600 x 1200
Resolution (Pixels)ColorsRefresh Rates
640 x 480
1024 x 768
1280 x 1
1600 x 1200
Maximum resolution on the analog VGA is 1600 x 1200 with 32-bit
color at 75 Hz.
Colo
silicon thin film transistor liquid crystal display (a-Si TFT LCD) panel
structure with driver LSIs for driving the TFT (Thin Film Transistor)
arr
motherboard via LVDS signaling.
1024 pixels horizontal by 768 pixels vertical (1024X 768) at 60 Hz
refresh rate
Ar
26
NTSC
024
r LCD module NL10276BC30-24D is composed of the amorphous
ay and a backlight. This LCD display will be driven directly by the
ea of 304 mm (11.7 in) by 228 mm (9 in) of viewing area.
2, 144 colors (6-bit RGB) with a color gamut of 42% at center to
ctors connect to the external world. One of the
splay connector is available only as an internal connection.
On/Sleep indicatorGreen/yellow front panel LED located left of the On/Standby switch
provides visual feedback when the switch is actuated. When the LED is
green, the instrument is powered and the processor is not sleeping. When
the LED is yellow, the instrument is powered, but the processor is sleeping.
On/Standby switch and indicatorFront panel On/Standby switch allows users to turn the instrument on. A
soft power down is implemented so that users can turn the instrument off
without going through the Windows shutdown process; the instrument
powers down normally.
The power cord provides main power disconnect
Table 12: TLA7012 Portable mainframe transportation and storage
Charact
Transportation Package MaterialTransportation Package material meets recycling criteria as described
Configuration for TransportationThe system can be shipped with or without modules installed. Only
eristic
Descrip
in Envi
063-1290-00) and Environmentally Responsible Packaging Handbook
(Tektronix part number 063-1302-00).
modul
60g shock (per Tektronix Standard part number 062-2858-00, Rev B, Class
5 subassembly requirement) can be shipped installed in this mainframe
and i
tion
ronmental Guidelines for Package Design (Tektronix part number
es weighing less than 5lbs/slot which have been qualified to meet
ts standard shipping package.
Table 13: TLA7012 Cooling
CharacteristicDescription
Cooling systemForced air circulation system with no removable filters using eight fans
operating in parallel
PressurizationNegative pressurization system in all chambers including modules
Slot activationInstalling a module activates cooling for the corresponding occupied slots
by opening the airflow shutter mechanism. Optimizes cooling efficiency by
only applying airflow to installed modules.
Air intakeFront sides and bottom
Air exhaustBack rear
Cooling clearance6 inches (152 mm) front, sides, top, and rear. Prevent blockage of airflow
to bottom of instrument by placing on a solid, noncompressable surface;
can be operated on rear feet.
Fan speed and operation
All fans operational at half their rated potential and speed (12 VDC)
g tables list the specifications for the TLA7016 Benchtop Mainframe.
The mainframe includes the interface module. The interface module provides the
interface between an external controller and the mainframe. All communication
between the controller and the mainframe is via GB LAN.
Table 15: TLA7016 Benchtop mainframe AC power source (Serial numbers B020000 and higher)
CharacteristicDescription
Source voltage & Maximum power consumption
100 V
120 V
115 V
to 120 V
RMS
to 240 V
RMS
, 440 Hz; 1450 W line power
RMS
, 50 Hz to 60 Hz; 1450 W line power
RMS
, 50 Hz to 60 Hz; 1900 W line power
RMS
1
Inrush surge current70 A maximum
Steady state input current17.6 A
10 A
Powerfactorcorrection(Typical)
0.99 at 60 Hz operation and 0.95 at 400 Hz operation
maximum at 108 VAC
RMS
maximum at 207 VAC
RMS
RMS
RMS
ON/Standby switch and indicatorFront Panel On/Standby switch with integral power indicator.
Switch allows users to turn the instrument on. A soft power down is
implemented so that users c an turn off the instrument without going
through the Windows shutdown process; the instrument powers down
normally.
1
Maximum power consumed by a fully loaded six-module instrument.
1
1
Table 16: TLA7016 Benchtop mainframe AC power source (Serial numbers B01000 – B019999)
CharacteristicDescription
Source voltage100 V
100 V
Maximum power consumption
1450 W line power (the maximum power consumed by a fully loaded,
6-module instrument)
Fuse rating (Current and
voltage ratings and type
of fuse used to fuse the
source line voltage)
Table 16: TLA7016 Benchtop mainframe AC power source (Serial numbers B01000 – B019999) (cont.)
CharacteristicDescription
Inrush surge current70 A maximum
Steady state input current16.5 A
6.3 A
Power factor correction (Typical)
0.99 at 60 Hz operation and 0.95 at 400 Hz operation
maximum at 90 VAC
RMS
maximum at 207 VAC
RMS
RMS
RMS
ON/Standby switch and indicatorFront Panel On/Standby switch with integral power indicator.
Switch allows users to turn the instrument on. A soft power down is
implemented so that users can turn off the instrument without going
through the Windows shutdown process; the instrument powers down
normally.
Table 17: TLA7016 Benchtop mainframe transportation and storage
CharacteristicDescription
Transportation Package MaterialTransportation Package material meets recycling criteria as described
in Environmental Guidelines for Package Design (Tektronix part number
063-1290-00) and Environmentally Responsible Packaging Handbook
(Tektronix part number 063-1302-01).
Configuration for TransportationThe system can be shipped with or without modules installed. Only
modules weighing less than 5lbs/slot which have been qualified to meet
60g shock (per Tektronix Standard part number 062-2858-00, Rev B, Class
5 ’subassembly’ requirement) can be shipped installed in this mainframe
and its standard shipping package.
Table 18: TLA7016 Benchtop mainframe cooling
CharacteristicDescription
Cooling systemForced air circulation system (positive pressurization) using a single
low-noise centripetal (squirrel cage) fan configuration with no filters for the
power supply and 13 module slots.
Fan speed control
Slot activationInstalling a module activates the cooling for the corresponding occupied
PressurizationPositive pressurization system, all chambers including modules
Slot airflow directionP2 to P1, bottom of module to top of module
Mainframe air intakeLower fan-pack rear face and bottom
Mainframe air exhaust
D Temperature readout sensitivity (Typical)100 mV/ °C with 0 °C corresponding to 0 V output
Temperature sense range (Typical)-10 °C to + 90 °C, delta temperature ≤ 50 °C
Clearance2 in (51 mm), rear, top, and sides
Rear panel switch selects between full speed and variable speed. Slot
exhaust temperature and ambient air temperature are monitored such that
a constant delta temperature is maintained.
slots by opening the air flow shutter mechanism. Optimizes cooling
efficiency by only applying airflow to modules that are installed.
Top-sides and top-rear back. Top rear-back exhaust redirected to the sides
by the fan pack housing to minimize reentry into the intake.
s released different motherboards for the TLA7PC1 controllers. The
motherboards are indicated by the following serial number ranges.
B010000toB
019999
B020000 to B029999
B030000 to B039999
The following tables list the specifications for the TLA7PC1 Controllers. The
serial number ranges are designated by prefixes, such as: B01, B02, and B03.
NOTE. To access the BIOS Setups for TLA7PC1 controllers with serial numbers
B020000
and higher, restart the instrument and hold down the Delete key. For
controllers with serial numbers B010000 to B019999, restart the instrument and
holddownfunctionkeyF2.
Table 22: TLA7PC1 Internal specifications
CharacteristicDescription
Operating systemMicrosoft Windows XP Professional
Motherboard
B01
B02
B03
Microprocessor
Chip set
Main memory
Cache memoryLevel 2 (L2) write-back cache 1 MB
RTC, CMOS setup, &
PNP NVRAM retention
time (Typical)
B01
B02, B03
B01, B02
B03
B01
B02
B03
B01
B02, B03
ATX-family board, integrating video, system monitoring, IDE and Ethernet
controllers on a single board.
AB915GM - Flex-ATX-family board, 9.0 X 8.0 in.
AIMB-760G2 - RoHS compliant, ATX-family board, 12.0 X 9.6 in.
AIMB-762G2 - RoHS compliant, ATX-family board, 12.0 X 9.6 in.
Intel 2 GHz/533 MHz FSB Pentium M, 479-pin PGA socket for uFC-PGA
processor package
Intel 3.4 GHz/800 MHz FS B Pentium 4, LGA775 socket
Intel 915G GMCH with an Intel ICH6 PCI Express I/O hub
Intel 945G GMCH with an Intel ICH7R PCI Express I/O hub
Maximum configuration: 4 GB (four 1 GB DIMMs)
Installed configuration: 1 GB (two 512 MB DIMMs)
Two 200-pin SO-DIMM sockets for DDR2-400/533 MHz (PC2-3200/4300)
Two 240-pin DIMM sockets for DDR2-400/533 MHz (PC2-3200/4300)
SDRAM
Two 240-pin DIMM sockets for DDR2-533/667 MHz (PC2-4300/5400)
SDRAM
Size80 GB, continually subject to change due to the fast-moving P C component
InterfaceSATA, native
Average seek timeRead 9 ms
DVD-ROM/CD-RW driveStandard PC compatible IDE DVD/CD-RW drive residing on an EIDE
External display drive
B01
B02, B03
Source voltage and frequency100 V
FuseInternal
Maximum power consumption400 W
Steady-state input current8 A
Standard PC compatible IDE hard disk drive residing on an EIDE interface.
environment.
Write10ms
interface. The initial drive was a Teac DV-W28E793 with +R/RW and
–R/RW.
Continually subject to change due to the fast-moving PC component
environment.
Can drive two external video displays via DVI connectors. One DVI port
with DVI digital only, other port with DVI digital and analog VGA signaling
via an adapter. DVI has maximum resolution of 1600 x 1200 pixels; with
256, 16-bit, or 32-bit colors; and refresh rates of 60 Hz, 75 Hz, or 85 Hz.
Analog VGA has maximum resolution of 1600 x 1200 with 32-bit colors
at 75 Hz refresh rate.
One VGA, SVGA, or XGA-compatible analog output port, with maximum
resolution of 2048 x 1536 pixels at 85 Hz refresh rate
to 240 V
RMS
maximum at 100 VAC
RMS
±10%,50Hzto60Hz
RMS
RMS,5ARMS
maximum at 240 VAC
RMS
Table 23: External controls and connectors
CharacteristicDescription
USB portsFour USB 2.0 ports
PS2 ports
On/Standby switchSwitch used to power on the instrument
I/O IndicatorsLEDs for power on/off, HDD activity, and fan alarm
CPU reset switchHardware reset for the PC
Alarm reset switch
Video Ports
LAN Ports
Audio Ports
B01None
B02
Keyboard and mouse connectors in rear; one common PS2 connector
in front
Reset switch for the system fan and over temperature monitor circuitry
B01
B02, B03
One DVI-I connector and one DVI-D connector
One analog SVG A connector
Two RJ45 with integrated green and yellow/amber LEDs located above
the USB connectors
Two vertical 3.5 mm audio-jack stack. Line Output (top, lime) capable of
driving headphones, Microphone Input (bottom, pink)
Cooling systemForced-air circulation system with no removable filters using two fans
operating in parallel
Transportation Package MaterialTransportation Package material meets recycling criteria as described
in Environmental Guidelines for Package Design (Tektronix part number
063-1290-00) and Environmentally Responsible Packaging Handbook
(Tektronix part number 063-1302-00).
Cooling clearance153 mm (6 in) on back for adequate cooling
Table 29: TL708EX TekLink 8-Port Hub mechanical
acteristics
Char
ssification
Cla
ensions
Dim
ight
He
Width
Depth
Weight
hipping weight
S
Construction materialChassis parts are constructed of aluminum alloy; circuit boards constructed
Finish typeTektronix silver-gray
ription
Desc
table instrument intended for design and development bench and lab
Por
based applications
Benchtop ConfigurationRackmount Configuration
50.8 mm (2.0 in)
444.5 mm (17.5 in)
7.5 mm (12.5 in)
31
.7 kg (5 lbs 14 oz) minimum configuration with power cord and accessories
g tables list the specifications common to the TLA715 and TLA721
logic analyzers. Refer to the individual logic analyzers section for detailed
specifications.
Table 30: TLA700 Backplane interface
CharacteristicDescription
Slots
CLK10 Frequency
Relative Time
Correlation
Error
12
(Typical)
1
Includes typical jitter, slot-to-slot skew, and probe-to-probe variations to provide a "typical" number for the measurement. Assumes standard accessory
probes are utilized.
Portable mainframe
Benchtop mainframe10 (three slots taken up by the controller module)
Expansion mainframe
TLA7Lx/Mx/Nx/Px/Qx to TLA7Lx/Mx/Nx/Px/Qx
"MagniVu" data
TLA7Axx/TLA7NAx to TLA7AxxTLA7NAx "MagniVu"
data
TLA7Axx/TLA7NAx to TLA7Lx/Mx/Nx/Px/Qx "MagniVu"
data
TLA7Lx/Mx/Nx/Px/Qx to TLA 7Lx/Mx/Nx/Px/Qx "normal"
data using asynchronous sampling
TLA7Axx/TLA7NAx to TLA7Axx "normal" data using
asynchronous sampling
TLA7Axx/TLA7NAx to TLA7Lx/Mx/Nx/Px/Qx "normal"
data using asynchronous sampling
TLA7Lx/Mx/Nx/Px/Qx to TLA 7Lx/Mx/Nx/Px/Qx "normal"
data using an external clock
TLA7Axx/TLA7NAx to TLA7Axx/TLA7NAx "normal"
data using an external clock
TLA7Axx/TLA7NAx to TLA7Lx/Mx/Nx/Px/Qx "normal"
data using an external clock
TLA7Lx/Mx/Nx/Px/Qx "MagniVu" to DSO data
TLA7Axx/TLA7NAx "MagniVu" to DSO data
TLA7Lx/Mx/Nx/Px/Qx to DSO "normal" data using
asynchronous sampling
TLA7Axx/TLA7NAx to DSO "normal" data using
asynchronous sampling
TLA7Lx/Mx/Nx/Px/Qx to DSO "normal" data using an
external clock
TLA7Axx/TLA7NAx to DSO "normal" data using an
external clock
TLA7Lx/Mx/Nx/Px/Qx to TLA7Lx/Mx/Nx/Px/Qx inter-module ARM
TLA7Axx/TLA7NAx to TLA7Lx/Mx/Nx/Px/Qx inter-module ARM
TLA7Axx/TLA7NAx to TLA7Axx inter-module ARM
TLA7Lx/Mx/Nx/Px/Qx to TLA7Lx/Mx/Nx/Px/Qx inter-module via Signal 1, 2
156
TLA7Axx/TLA7NAx to TLA7Axx inter-module via Signal 1, 2
TLA7Axx/TLA7NAx to TLA7Lx/Mx/Nx/Px/Q x inter-module via Signal 1, 2
TLA7Lx/Mx/Nx/Px/Q to TLA7Lx/Mx/Nx/Px/Qx inter-module via Signal 3, 4
TLA7AxxTLA7NAx to TLA7Axx inter-module via Signal 3, 4
TLA7Axx/TLA7NAx to TLA7Lx/Mx/Nx/Px/Qx inter-module via Signal 3, 4
TLA7Lx/Mx/Nx/Px/Qx to TLA7Axx/TLA7NAx inter-module System Trigger
DSO to TLA7Lx/Mx/Nx/Px/Qx inter-module S ystem Trigger
DSO to TLA7Axx/TLA7NAx inter-module System Trigger
DSO to DSO inter-module System Trigger
TLA7Lx/Mx/Nx/Px/Qx to TLA7Axx/TLA7NAx inter-module ARM
DSO to TLA7Lx/Mx/Nx/Px/Qx inter-module ARM
DSO to TLA7Axx/TLA7NAx inter-module ARM
DSO to DSO inter-module ARM
DSO to TLA7Lx/Mx/Nx/Px/Qx inter-module via Signal 1, 2
TLA7Lx/Mx/Nx/Px/Qx to TLA7Axx/TLA7NA x inter-module via Signal 1, 2
DSO to TLA7Axx/TLA7NAx inter-module via Signal 1, 2
TLA7Lx/Mx/Nx/Px/Qx to TLA7Axx/TLA7NAx inter-module via Signal 3, 4
DSO to TLA7Lx/Mx/Nx/Px/Qx inter-module via Signal 3, 4
DSO to TLA7Axx/TLA7NAx inter-module via Signal 3, 4
1
SMPL represents the time from the event at the probe tip inputs to the next valid data sample of the LA module. With Normal asynchronous sampling, this
represents the delta time to the next sample clock. With MagniVu asynchronous sampling, this represents 500 ps or less. With synchronous sampling,
this represents the time to the next master clock generated by the setup of the clocking state m achine, the system-under-test supplied clocks, and the
qualification data.
2
All system trigger and external signal input latencies are measured from a falling-edge transition (active true low) with signals measured in the wired-OR
configuration.
3
All signal output latencies are validated to the rising edge of a n active (true) high output.
4
In the Waveform window, triggers are always marked immediately except when delayed to the first sample. In the Listing window, triggers are always
marked on the next sample period following their occurrence.
5
"Clk" represents the time to the next master clock at the destination logic analyzer. With asynchronous sampling, this represents the delta time to the next
sample clock beyond the minimum asynchronous rate of 4 ns. With the synchronous sampling, this represents the time to the next master clock generated bythe
setup of the clock ing state machine and the supplied system under test clocks and qualification data.
6
Signals 1 and 2 are limited to a "broadcast" mode of operation, where only one source is allowed to drive the signal node at any one time. That single source
may be utilized to drive any combination of destinations.
e Input Bandwidth sp ecification only applies to signals to the modules; it does not apply to signals applied to the External Signal Input and sent back to the
Th
External Signal Output.
2
The Output Bandwidth specification only applies to signals from the modules; it does not apply to signals applied to the External Signal Input and sent
back to the External Signal Output.
TTL compatible outputs via rear panel mounted BNC connectors (portable
mainframe) or front panel mounted SMB connectors (benchtop mainframe)
ClassificationStandard PC graphics-accelerator technology capable of supporting both
Display memory
Display selection
External display drive
Internal display
5 display system
video port with Silicon
n chip)
motio
(Secondary video port
h 815E chip set)
wit
ClassificationTFT (Thin Film Transistor) 26 cm active-matrix color LCD display, CCFL
Resolution
Color scale262, 144 colors (6-bit RGB) with a color gamut of 42% at center to NTSC
internal color LCD display and two external color VGA, SVGA, or XGA
monitors
4MBSDRAMcl
Hardware se
defaults to internal color LCD display (indicated by two beeps);
automatically switches to external SVGA monitor, if attached (indicated by
one beep).
Dual (simultaneous) display of external SVGA monitor and internal color
LCD is possible via special CMOS "simulscan" setup, as long as internal
and exter
current LCD) and display rates (simulscan mode indicated by three beeps).
Four beeps during the BIOS boot indicates a monochrome LCD was found
(not supp
monitor was found.
Dynamic Display Configuration 1 (DDC1) support for external SVGA
monitor
On/Sleep indicatorGreen/yellow front panel LED located next to On/Standby switch provides
visual feedback when the On/Off switch is actuated. When the LED is
green, the instrument is powered and the processor is not sleeping. When
the LED is yellow, the instrument is powered, but the processor is sleeping.
On/Standby switch and indicatorFront panel On/Standby switch. Users can push the switch to power down
the instrument without going through the Windows shutdown process; the
instrument normally powers down.
The power cord provides main power disconnect.
Table 38: TLA715 cooling
CharacteristicDescription
Cooling systemForced air circulation system with no removable filters using six fans
ing in parallel
operat
PressurizationNegative pressurization system in all chambers including modules
Slot activationInstalling a module activates the cooling for the corresponding occupied
by opening the airflow shutter mechanism. Optimizes cooling
slots
efficiency by only applying airflow to installed modules.
take
Air in
Air exhaustBack rear
Cooling clearance2 inches (51 mm) front, sides, top, and rear. Prevent blockage of airflow
speed and operation
Fan
sides and bottom
Front
ottom of instrument by placing on a solid, noncompressable surface;
to b
can be operated on rear feet.
All fans operational at half their rated potential and speed (12 VDC)
Table 39: TLA715 mechanical
CharacteristicDescription
Overall dimensions
Height (with feet)
Width
Depth
Weight
Shipping configuration60 lbs 13 oz (27.58 kg) minimum configuration (no modules), with all
g tables list the specifications for the TLA721 Benchtop mainframe
and the TLA7XM expansion mainframe.
Table 40: Benchtop and expansion mainframe AC power source
CharacteristicDescription
Source Voltage100 V
100 V
Maximum Power Consumption1450 W line power (the maximum power consumed by a fully loaded
13-slot instrument)
Fuse Rating (Current
and voltage ratings and
type of fuse used to fuse
the source line voltage)
90 V - 132 VAC
RMS
Operation
High-power/Low Line
(159-0379-00)
103 V - 250 VAC
RMS
Operation
(159-0256-00)
Safety: UL198G/CSA C22.2
Size: 0.25 in × 1.25 in
Style: Slow acting
Rating: 20 A/250 V
Safety: UL198G/CSA C22.2
Size: 0.25 in × 1.25 in
Style: No. 59/Fast acting
Rating: 15 A/250 V
207 V - 250 VAC
Operation
(159-0381-00)
RMS
Safety: IEC 127/Sheet 1
Size: 5 mm × 20 mm
Style: Fast acting "F", high-breaking capacity
Rating: 6.3 A/250 V
Inrush Surge Current
70 A maximum
Steady State Input Current16.5 A
6.3 A
PowerFactorCorrection(Typical)
0.99 at 60 Hz operation and 0.95 at 400 Hz operation
ON/Standby Switch and IndicatorFront Panel On/Standby switch with integral power indicator
to 240 V
RMS
RMS
RMS
maximum at 207 VAC
RMS
RMS
to 120 V
RMS,
maximum at 90 VAC
±10%,45 Hz to 66 Hz
360 Hz to 440 Hz
RMS
RMS
Table 41: Benchtop and expansion mainframe cooling
CharacteristicDescription
Cooling systemForced air circulation system (positive pressurization) using a single
low-noise centripetal (squirrel cage) fan configuration with no filters for the
power supply and 13 module slots.
Fan speed control
Rear panel switch selects between full speed and variable speed. Slot
exhaust temperature and ambient air temperature are monitored such that
a constant delta temperature is maintained.
Slot activationInstalling a module activates the cooling for the corresponding occupied
slots by opening the air flow shutter mechanism. Optimizes cooling
efficiency by only applying airflow to modules that are installed.
PressurizationPositive pressurization system, all chambers including modules
Table 43: Benchtop and expansion mainframe mechanical (cont.)
CharacteristicDescription
Weight
Size
Acoustic noise level
(Typ ical)
Construction materialsChassis parts, aluminum alloy Front panel and trim pieces,
Finish type
Mainframe with benchtop controller
and slot fillers (Typical)
Shipping configuration (Typical)60 lbs 11 oz. (26.7 kg) minimum configuration with controller
Benchtop controller
Expansion module
Maximum per slot
Rackmount kit adder
Benchtop controllerThree slots wide
Expansion module
Variable fan speed (at 860 RPM)43.2 dBA weighted (front)
Full speed fan (switched at rear)66.2 dBA weighted (front)
58 lbs 11 oz. (26.7 kg)
(only) and all standard accessories (two manuals, five dual-wide
and one single-wide slot filler panels, power cord, empty pouch,
front cover, keyboard, software, and cables)
187 lbs (85 kg) fully configured, same as above with the addition
of five LA modules (four TLA7P4 modules, one TLA7N4 module)
and all module standard accessories (probes and clips)
6 lbs 10 oz. (3.0 kg)
3lbs(1.4kg)
5lbs(2.27kg)
20 lbs (9.1 kg)
Single slot wide
43.8 dBA weighted (back)
66.2 dBA weighted (back)
plastic Circuit boards, glass laminate
Mainframes are Tektronix silver gray with dark gray trim on fan
pack and bottom feet support rails.
Benchtop controllers are Tektronix silver gray on front lexan
and injector/ejector assemblies with a black FDD and PC card
ejector buttons.
Figure 6: Dimensions of the benchtop and expansion mainframe
Display configurationHardware automatically senses a missing flat panel LCD in the benchtop
mainframe and defaults to the external SVGA monitor output during
the BIOS boot sequence (no internal TFT LCD display exists). This is
indicated by a single beep during the boot sequence.
Dynamic Display Configuration 1 (DDC1) support for the external monitor
is provided.
Display memory
Display drive
Display size
Silicon Motion Chip)
(Secondary video port
with 815E Chip set)
4 MB SDRAM is on board the video controller; no external video memory
Two VGA, SVGA, or XGA compatible analog output ports
User selected via Microsoft Windows
Plug and Play support for DDC1 and DDC2 A and B
Resolution (Pixels)ColorsRefresh Rates(Primary video port with
640 x 480
800 x 600
1024 x768
1280 x 1024
1600 x 600
1600 x 1200
Resolution (Pixels)ColorsRefresh Rates
640 x 480
800 x 600
1024 x768
1280 x 1024
1600 x 1200
256, 64 K, 16.8 M
256, 64 K, 16.8 M
256, 64 K, 16.8 M
256, 64 K, 16.8 M
256, 64 K
256, 64 K
256, 64 K, 16.8 M
256, 64 K, 16.8 M
256, 64 K, 16.8 M
256, 64 K, 16.8 M
256
60, 75, 85
60, 75, 85
60, 75, 85
60
60
60
60, 75, 85
60, 75, 85
60, 75, 85
60, 75, 85
60, 75
Table 45: Front panel characteristics
racteristic
Cha
GA output port (SVGA)
SV
ual USB ports
D
Mouse port
Keyboard port
Parallel interface port (LPT)36-pin high-density connector supports standard Centronics mode,
Serial interface port (COM)9-pin male sub-D connector to support an RS232 serial port
PC CardBus32 portStandard Type I and II PC compatible PC card slot
Type I, II, and III PC Card PortStandard Type I, II, and III PC compatible PC card slot
cription
Des
o 15-pin sub-D SVGA connectors
Tw
wo USB (Universal Serial Bus) compliant ports
T
ront panel mounted PS2 compatible mouse port utilizing a mini D IN
F
connector
Front panel mounted PS2 compatible keyboard port utilizing a mini DIN
connector
Enhanced Parallel Port (EPP), or Microsoft high-speed mode (ECP)
System Trigger and
External Signal Output
Latencies (Typical)
LA Probe Tip to External System Trigger Out
LA Probe Tip to External Signal Out via Signal 3, 4
LA Probe Tip to External Signal Out via Signal 1, 2
normal function364 ns + SMPL
inverted logic on backplane
1
All system trigger and external signal input latencies are measured from a falling-edge transition (active true low) with signals measured in the wired-OR
configuration.
2
In the Waveform window, triggers are always marked immediately except when delayed to the first sample. In the Listing window, triggers are always
marked on the next sample period following their occurrence.
3
"Clk" represents the time to the next master clock at the destination logic analyzer. In the asynchronous (or internal) clock mode, this represents the delta time to
the next sample clock beyond the minimum asynchronous rate of 4 ns. In the synchronous (or external) clock mode, this represents the time to the next master
clock generated by the setup of the clocking state machine and the supplied system under test clocks and qualification data.
4
Signals 1 and 2 (ECLTRG0, 1) are limited to a "broadcast" mode of operation, where only one source is allowed to drive the signal node at any one time. That
single source may be utilized to drive any combination of destinations.
5
SMPL represents the time from the event at the probe tip inputs to the next valid data sample. With asynchronous sampling, this represents the delta timetothe
next sample clock. With MagniVu asynchronous sampling, this represents 500 ps or less. With synchronous sampling, this represents the time to the next
ster clock generated by the setup of the clocking state machine, the system-under-test supplied clocks, and the qualification data.
ma
5
45
5
376 ns + SMPL
OR function
AND function
366 ns + SMPL
379 ns + SMPL
364 ns + SMPL
Table 48: TLA600 external signal interface
CharacteristicD escription
System Trigger Input
External Signal Input
Input Levels
V
IH
V
IL
Input Mode
Minimum Pulse Width12 ns
Active PeriodAccepts system triggers during valid acquisition periods via real-time
Maximum Input Voltage0 to +5 V peak
Input Destination
Input Levels
V
IH
V
IL
Input Mode
Input Bandwidth
1
Active PeriodAccepts signals during valid acquisition periods via real-time gating
Maximum Input Voltage0 to +5 V peak
TTL compatible input via rear panel mounted BNC connectors
TTL compatible input
≥2.0 V
≤ 0.8 V
Falling edge sensitive, latched (active low)
gating, resets system trigger input latch between valid acquisition periods
TTL compatible input via rear panel mounted BNC connectors
The Input Bandwidth specification only applies to signals to the modules; it does not apply to signals applied to the External Signal Input and sent back to the
External Signal Output.
2
The Output Bandwidth specification only applies to signals from the modules; it d oes not apply to signals applied to the External Signal Input and sent
back to the External Signal Output.
TTL compatible output via rear panel mounted BNC connectors
Outputs system trigger state during valid acquisition period, resets system
trigger output to false state between valid acquisitions
50 Ω back terminated TTL-compatible output
≥4 V into open circuit
≥2Vinto50Ω to ground
≤ 0.7 V sinking 10 mA
TTL compatible outputs via rear panel mounted BNC connectors
Missing channels for modules with fewer than 136 channels are omitted.
Each channel group can be enabled to detect a glitch.
Each channel can be enabled to detect a setup and hold violation. The
range is from 8 ns before the clock edge to 8 ns after the clock edge. The
range can be selected in 0.5 ns increments.
The setup and hold violation of each window can be individually
programmed.
Each channel group can be enabled or disabled to detect a transition
between the current valid data sample and the previous valid data sample.
This mode can be used to create transitional storage selections where all
channels are enabled.
51
Maximum count is 2
Maximum time is 9.007 X 10
.
6
seconds or 104 days.
Counters and timers can be set, reset, or tested and have zero reset
latency.
A backplane input signal
acquisition to trigger if they are not already triggered
16 maximum (excluding counter/timers)
Word recognizers are traded off one-by-one as External Signal In, glitch
detection, setup and hold detection, or transition detection resources are
added.
16
Same rate as valid data samples received, 250 MHz maximum
Trigger position is programmable to any data sample (4 ns boundaries)
Triggering of MagniV memory is controlled by the main acquisition trigger
separate from the main acquisition memory trigger position.
Either of the two counter/timers used as counters can be increased.
When a counter/timer is used as a timer and is reset, the timer continues
from the started or stopped state that it was in prior to the reset.
Trigger outA trigger out signal sent to the backplane to trigger other instruments
Storage Control
Global storageStorage is allowed only when a specific condition is met. This condition
By event
Block storage
Glitch violation storageThe acquisition memory can be enabled to store glitch violation information
Setup and hold violation storage
1
Each use of External Signal In, glitch detector, setup and hold violation detector, or transition detector requires a trade-off of one word recognizer resource.
2
Any glitch is subject to pulse width variation of up to the channel-to-channel skew specification + 0.5 ns.
3
Any setup value is subject to variation of up to 1.8 ns; any hold value is subject to variation of up to 1.2 ns.
A signal sent to the backplane to be used by other instruments
can use any of the trigger machine resources except for the counter/timers.
Storage commands defined in the current trigger state will override the
global storage control.
Global storage can be used to start the acquisition with storage initially
turned on (default) or turned off.
Storage can be turned on or off; only the current sample can be stored.
The event storage control overrides any global storage commands.
When enabled, 31 samples are stored before and after the valid sample.
Not allowed when glitch storage or setup and hold violation is enabled.
with each data sample when asynchronous sampling is used. The probe
data storage size is reduced by one half (the other half holds the violation
information). The fastest asynchronous sampling rate is reduced to 10 ns.
The acquisition memory can be enabled to store setup and hold violation
information with each data sample when synchronous sampling is used.
The probe data storage size is reduced by one half (the other half holds the
violation information). The maximum clock rate is reduced by half.
Table 52: TLA600 MagniVu feature
CharacteristicDescription
MagniVu memory depth2016 samples per channel
MagniVu sampling periodData is asynchronously sampled and stored every 500 ps in a separate
high resolution memory. There are no clocking options.
Table 53: TLA600 Data handling
CharacteristicDescription
Nonvolatile memory retention time (Typical)Battery is integral to the NVRAM. Battery life is > 10 years.
Real-Time Clock and CMOS Setups, Plug & Play
NVRAM Retention Time
Hard Disk Drive
SizeMinimum 10 GB
CD-RW DriveStandard PC compatible IDE (Integrated Device Electronics) 24x-10x-40x
Floppy Disk Drive
SDRAM
100 MHz
Minimum 256 MB loaded in one socket
Maximum 512 MB with both sockets loaded
Battery life is typically > 3 years when the logic analyzer is not connected
to line voltage. When connected to line voltage the life of the battery is
extended. Lithium battery, CR3032
Standard PC compatible IDE (Integrated Device Electronics) hard disk
driveresidingonanEIDEinterface.
Maximum 30 GB
Continually subject to change due to the fast-moving PC component
environment.
These storage capacities valid at product introduction.
CD-RW drive residing on an EIDE interface.
Continually subject to change due to the fast-moving PC component
environment.
Standard 3.5 inch 1.44 MB PC compatible high-density, double-sided
floppy disk drive.
ble 55: TLA600 display system
Ta
CharacteristicD escription
ClassificationStandard PC graphics accelerator technology (bitBLT-based); capable of
supporting both internal color LCD display and external color SVGA/XGA
onitor
m
Display Memory
Size
Display SelectionBoth front panel and external displays can be used simultaneously, each
External Display Drive
Display Size
DRAM-based frame-buffer memory
2MB
with independent resolutions. Supports Windows dual-monitor capability.
16 threshold groups assigned to channels. Each probe has four threshold
settings, one for each of the clock/qualifier channels and one per group
of 16 data channels.
≤ 400 ps maximum
When merged, add the following for slave modules:
0.0 ns when data is acquired on the slave modules through local clocks
125 ps when data is acquired on the slave modules using the master
module’s clock and merge deskew has been performed.
375 ps when data is acquired on the slave modules using the master
module’s clock and merge deskew has NOT been performed.
≤ 300 ps
When merged, add the following for slave modules:
0.0 ns when data is acquired on the slave modules through local clocks
125 ps when data is acquired on the slave modules via the master
modules’ clock and merge deskew has been performed.
375 ps when data is acquired on the slave modules via the master
module’s clock and merge deskew has NOT been performed.
Asynchronous
Sample period
Single ended probes± 150 mV or ± 25% of signal swing minimum required beyond threshold,
Example using P6860 probe: 300 ps + 250 ps + 75 ps = 625 ps
typical) to -8.0 ns (Tstypical) in 0.125 ns steps (setup time).
The setup and hold window can be shifted toward the setup region by 0 ns, 4 ns, or
8ns. Witha0nsshift,therange is +8 ns to -8 ns; witha4nsshift,therange is
+12 ns to -4 ns; with an 8 ns shift, the range is +16 ns to 0 ns. The sample point
selection region is the same setup and hold window. Setup times are specified as
typical figures. Hold time follows the setup time by the setup and hold window size.
450 MHz in full-speed mode (2.2 ns minimum between active clock edges)
235 MHz in half-speed mode (4.25 ns minimum between active clock edges)
120 MHz in quarter-speed mode (8.3 ns minimum between active clock edges)
800 MHz on half channels
Software controls the selection between full-speed and half-speed modes.
450 MHz in full-speed mode (2.2 ns minimum between active clock edges)
235 MHz in full-speed mode (4.25 ns minimum between active clock edges)
120 MHz in quarter-speed mode (8.3 ns minimum between active clock edges)
Software controls the selection between full-speed and half-speed modes.
Any individual channel can be demultiplexed with its partner channel. If multiplexing
is enabled, all of the A and D channels are multiplexed; there is no individual
selection. Channels demultiplex as follows:
Any individual channel can be demultiplexed with its partner channel. If multiplexing
is enabled, all of the A and D channels are multiplexed; there is no individual
selection. Channels demultiplex as follows:
Same limitations as normal synchronous acquisition
Four
module. Including the local clocks, the total is six clocks.
above 235 MHz); this allows four (source synchronous or other) clocks to occur
before the clock that completes the Clock Group Valid signal for that group.
TLA7Axx/TLANAx Series Logic Analyzer Module Specifications
Table 64: Clocking (cont.)
Demultiplex c lo cking
Source synchronous clock resetThe Clock Group Valid FIFO can be reset in one of the two ways:
1.By the overflow of a presettable (0-255) 8-bit counter that counts one of the
following clocks: 2ns Clock or the master heartbeat clock (synchronous or
asynchronous). An active edge places the reset count to its preset value. An
active clock edge will clear the Clock Group Valid reset before the clock gets
to the FIFO so that no data is lost.
2.By enabling an external reset. In this mode, one of the clock channels must be
traded on the master module to act as a level-sensitive reset input. Any one
of the clocks can be selected. A polarity selection is available. This mode
affects all Clock G roup Complete circuits.
Neither one of the above modes can be intermixed; one or the other must be
selected.
Clocking state machine
Pipeline delays
1
2
3
cation only applies with asynchronous clocking. With synchronous sampling, the setup and hold window size applies.
Specifi
Any clock channel can be enabled. For enabled clock channels, either the rising, falling, or both edges can be selected as active clock edges; clock channels
are stored.
This is a special mode and has some limitations such as the clocking state machine and trigger state machine only running at 500 MHz.
Channel groups can be programmed with a pipeline delay of 0 through 7 active
clock changes.
Missing channels for modules with fewer than 136 channels are omitted. When
merged, the range recognition extends across the modules. The master module
contains
Channel
Glitches are subject to pulse width variations of up to ± 125ps
Minimum input pulse width (single channel)
P6860,
P6880, P6980 differential probe:
P6810 general purpose probe:
Any channel can be enabled to detect a setup or hold violation. The range is from
8.0 ns
channel setup and hold violation size can be individually programmed.
The range can be shifted towards the positive region by 0 ns, 4 ns, or 8 ns. With a
0nss
with an 8 ns shift, the range is +16 ns to 0 ns. The sample point selection region is
the same as the setup and hold window.
Any
hold value is subject to variation of up to the channel skew specification.
16 t
Any channel group can be enabled or disabled to detect a rising transition, a falling
transition, or both rising and falling transitions between the current valid data sample
an
2c
Maximum count is 2^50-1 (excluding sign bit)
Maximum time is 4.5 X 10
C
reset, do nothing, increased, or decreased. Timers can be reset, started, stopped,
or not changed. Counters and timers have zero reset latency and one clock terminal
c
A backplane input signal.
the most-significant groups.
groups can be enabled to detect glitches.
P6960 high density probe:
before the clock edge to 8.0 ns after the clock edge in 0.125 ns steps. The
hift, the range is +8 ns to -8 ns; witha4nsshift,therange is +12 ns to -4 n s;
setup value is subject to variation of up to the channel skew specification. Any
ransition detectors.
d the previous valid data sample.
ounter/timers, 51 bits wide, can be clocked up to 500 MHz
ounters can be used as Settable, resettable, and testable flags. Counters can be
ount latency.
gnizers can be combined to form full width, double bounded range
TLA7Axx/TLANAx Series Logic Analyzer Module Specifications
Table 65: TLA7Axx/TLA7NAx module trigger system (cont.)
CharacteristicDescription
Signal In 2
Trigger InA backplane input signal that causes the main acquisition and the MagniVu
Active trigger resources
Trigger states16
Trigger state sequence rate
Trigger
Main acquisition triggerTriggers the main acquisition memory
Main trigger position
MagniVu trigger
MagniVu trigger position
Incre
Star
Res
Reloadable word recognizer (snapshot)Loads the current acquired data sample into the reference value of the word
Re
S
T
Storage control
StorageStorage is allowed only if a specific condition is met. The condition can use any of
By event
Block storage (store stretch)When enabled, 31 samples are stored before and after the valid sample.
machine actions
ment/decrement counter
t/stop timer
et counter/timer
loadable word recognizer latency
ignal Out
rigger Out
A backplane input signal.
acquisition to trigger if they are not already triggered.
16 maximum (excluding counter/timers)
Word recognizers are traded off one-for-one as Signal In 1, Signal In 2, glitch
detection, setup and hold detection, or transition detection resources are added.
Same rate as valid data samples received. 500 MHz maximum.
Programmable to any data sample (2 ns boundaries)
Main acquisition machine controls the triggering of the MagniVu memory
Programmable within 2 ns boundaries and separate from the main acquisition
y trigger position
memor
er/timers used as counters can be increased or decreased.
Count
er of the two counter/timers used as timers can be started or stopped.
Eith
her of the two counter/timers can be reset.
Eit
When a counter/timer used as a timer is reset, the timer continues in the started or
stopped state that it was prior to the reset.
cognizer via a trigger machine action. All data channels are loaded into their
re
respective word recognizer reference register on a one-to-one manner.
8ns
37
A signal sent to the backplane to be used by other modules
A signal sent to the backplane to trigger other modules
the trigger resources except for counter/timers. Storage commands defined in the
current trigger state will override the global storage control.
Storage can be used to start the acquisition with storage initially turned on (default
setting) or off.
Storage can b e turned on or off; only the current sample can be stored. Event
storage control overrides any global storage commands.
This allows the storage of a group of samples around a valid data sample when
storage control is being used. This only has meaning when storage control is
used. Block storage is disallowed when glitch storage or setup and hold violation
storage is enabled.
TLA7Axx/TLANAx Series Logic Analyzer Module Specifications
Table 65: TLA7Axx/TLA7NAx module trigger system (cont.)
CharacteristicDescription
Glitch violation storageGlitch violation information can be stored to acquisition memory with each data
sample when asynchronous sampling is used. The acquisition data storage
size is reduced by half when this mode is enabled (the other half holds violation
information). The fastest asynchronous clock rate is reduced to 4 ns.
Setup and hold violation storageSetup and hold violation information can be stored to acquisition memory with each
data sample when synchronous sampling is used. The acquisition data storage
size is reduced by half when this mode is enabled (the other half holds violation
information). The maximum synchronous clock rate in this mode is 235 MHz.
Table 66: MagniVu acquisition
CharacteristicDescription
MagniVu sampling periodData is asynchronously sampled and stored every 125 ps in a separate
MagniVu (high-resolution) memory. The storage speed can be changed by
re to 250 ps, 500 ps, or 1000 ps with no loss in memory depth so
softwa
that the high resolution memory covers more time at a lower resolution.
u memory depth
MagniV
Approximately 16 K per channel. The MagniVu memory is separate from
the main acquisition memory.
Table 67: Merged modules
CharacteristicDescription
Number of merged modules2, 3, 4, or 5 adjacent modules can be merged. Only 102-channel modules
or 136-channel modules can be merged. Merged modules can have
unequal channel widths and channel depths.
Number of channels after mergingThe sum of all channels available on each of the merged modules including
clocks and qualifiers. No channels are lost when modules are merged.
Merged system acquisition depth
Number of clock and qualifier channels after mergingThe qualifier channels on the slave modules can only be used as data
Merged system trigger resources
Merged range significanceMost significant Master, Slave 1, Slave 2
Channel depth is equal to that of the shallowest module.
channels. They cannot in fluence the actual clocking function of the logic
analyzer (for example, log strobe generation).
The clock channels on the slave TLA7Axx modules can capture data on
those modules for source-synchronous applications. Each slave module
contributes four additional clock channels to the merged set. All clock and
qualifier channels are stored to acquisition memory.
The same as a single module except for word recognizer width, setup and
hold violation detector width, glitch detector width, and transition detector
width has increased to equal that of the merged channel width. Range
recognizers will increase to the merged channel w idth up to three modules;
range recognition is not supported on the two outside slave modules.
Maximum window size =
Maximum channel-to-channel skew + (2 x sample uncertainty) + 0.4 ns
Maximum setup time = User interface setup time + 0.8 ns
Maximum hold time = User interface hold time + 0.2 ns
Maximum setup time for slave module of merged pair =
User Interface setup time + 0.8 ns
Maximum hold time for slave module of merged pair =
User Interface hold time + 0.7 ns
Examples: for a P6417, P6418, or P6434 probe and user interface setup and hold
of 2.0/0.0 typical:
Maximum window size = 1.6 ns + (2 x 500 ps) + 0.4ns = 3.0 ns
Maximum setup time = 2.0 ns + 0.8 ns = 2.8 ns
Maximum hold time = 0.0 ns + 0.2 ns = 0.2ns
Channel-to-channel skew (typical) + (2 x sample uncertainty)
Example: for P6417 or P6418 Probe = 1 ns + (2 x 500 ps) = 2 ns
window can be moved from +8.5 ns (Ts) to -7.0 ns (Ts) in 0.5 ns steps (setup time).
Hold time follows the setup time by the setup and hold window size.
For the TLA7Lx and TLAMx logic analyzer modules, the user interface restricts the
setup and hold window range to groups rather than individual channels.
200 MHz in full speed mode (5 ns minimum between active clock edges)
100 MHz in half speed mode (10 ns min imum between active clock edges)
Channels multiplex as follows:Demux Channels TLA7N3, TLA7N4,
A3(7:0) to
A2(7:0) to
A1(7:0) to
A0(7:0) to
D3(7:0)
D2(7:0)
D1(7:0)
D0(7:0)
Channels multiplex as follows:
A3(7:0) to
A2(7:0) to
A1(7:0) to
A0(7:0) to
C3(7:0)
C2(7:0)
D1(7:0) TLA7N2, TLA7P2, TLA7Q2, TLA7L2, TLA7M2 only
D0(7:0) TLA7N2, TLA7P2, TLA7Q2, TLA7L2, TLA7M2 only
between DeMux clock edges in half-speed mode
10 ns minimum between DeMux m aster clock edges in full-speed mode 20 ns
minimum between DeMux master clock edges in half-speed mode
400 MHz (200 MHz option required) half channel.
(Requires channels to be multiplexed.)
These multiplexed channels double the memory depth.
For the TLA7Nx/Px/Qx logic analyzer modules, each channel can be programmed
with a pipeline delay of 0 through 3 active clock edges.
For the TLA7Lx and TLAMx logic analyzer modules, the user interface restricts the
programming to groups rather than individual channels.
1
It is possible to use storage control and only store data when it has changed (transitional storage).
2
Applies to asynchronous sampling only. Setup and hold window specification applies to synchronous sampling only.
3
Any or all of the clock channels may be enabled. For an enabled clock channel, the rising edge, falling edge, or both edges can be selected as the active
clock edges. The clock channels are stored.
4
Full and half speed modes are controlled by PowerFlex options and upgrade kits.
Table 73: LA module trigger system
CharacteristicDescription
Triggering Resources
Word/Range recognizers
Range recognizer channel order
Glitch detector
12
Minimum detectable glitch pulse width
(Typical)
Setup and hold violation detector
Transition detector
14
13
16 word recognizers. The word recognizers can be combined to form full width,
double bounded, range recognizers. The following selections are available:
Missing channels for modules with fewer than 136 channels are omitted. When
merged, the range recognition extends across all the modules; the master module
contains the m ost-significant groups.
The master module is to the left (lower-numbered slot) of a merged pair.
The master module is in the center when three modules are merged. Slave module 1
is located to the right of the master module, and slave module 2 is located to the left
of the master module.
Each channel group can be enabled to detect a glitch
2.0 ns (single channel with a P6417, P6418, or P6434 probe)
Each channel can be enabled to detect a setup and hold violation. The range is
from 8 ns before the clock edge to 8 ns after the clock edge. The range can be
selected in 0.5 ns increments.
For the TLA7Lx and TLAMx logic analyzer modules, the user interface restricts the
setup and hold violation detector to groups rather than individual channels.
The setup and hold violation of each window can be individually programmed.
Each channel group can be enabled or disabled to detect a transition between the
current valid data sample and the previous valid data sample.
Counter/Timers2 counter/timers, 51 bits wide, can be clocked up to 250 MHz. Maximum count is 251.
Maximum time is 9.007 X 10
Counters and timers can be set, reset, or tested and have zero reset latency.
Signal In 1
Signal In 2
A backplane input signal
A backplane input signal
Trigger InA backplane input signal that causes the main acquisition and the MagniVu
acquisition to trigger if they are not already triggered
Active trigger resources
16 maximum (excluding counter/timers)
Word recognizers are traded off one-by-one as Signal In 1, Signal In 2, glitch
detection, setup and hold detection, or transition detection resources are added.
Trigger States
Trigger State sequence rate
r Machine Actions
Trigge
16
Same rate as valid data samples received, 250 MHz maximum
Main acquisition triggerTriggers the main acquisition memory
Main trigger position
Increment counter
Trigger position is programmable to any data sample (4 ns boundaries)
Either of the two counter/timers used as counters can be increased.
Start/Stop timerEither of the two counter/timers used as timers can be started or stopped.
Reset counter/timerEither of the two counter/timers can be reset.
n a counter/timer is used as a timer and is reset, the timer continues in the
Whe
started or stopped state that it was in prior to the reset.
ignal sent to the backplane to be used by other modules
Signal out
igger out
Tr
torage Control
S
lobal storage
G
As
rigger out signal sent to the backplane to trigger other modules
At
torage is allowed only when a specific condition is met. This condition can use any
S
of the trigger machine resources except for the counter/timers. Storage commands
defined in the current trigger state will override the global storage control.
Global storage can be used to start the acquisition with storage initially turned on
(default) or turned off.
By event
Storage can be turned on or off; only the current sample can be stored. The event
storage control overrides any global storage commands.
Block storage
When enabled, 31 samples are stored before and after the valid sample.
Block storage is disallowed when glitch storage or setup and hold violation is enabled.
Glitch violation storageThe acquisition memory can be enabled to store glitch violation information with each
data sample when asynchronous sampling is used. The probe data storage size is
reduced by one half (the other half holds the violation information). The fastest
asynchronous sampling rate is reduced to 10 ns.
1
Each use of a glitch detector, setup and hold violation detector, or transition detector requires a trade-off of one word recognizer resource.
2
Any glitch is subject to pulse width variation of up to the channel-to-channel skew specification + 0.5 ns.
3
For TLA7N1, TLA7N2, TLA7N3, TLA7N4, TLA7P2, TLA7P4, TLA7Q2, and TLA7Q4 Logic Analyzer modules, any setup value is subject to variation of up to
1.8 ns; any hold value is subject to variation of up to 1.2 ns. For TLA7L1, TLA7L2, TLA7L3, TLA7L4, TLA7M1, TLA7M2, TLA7M3, and TLA7M4 Logic Analyzer
modules, any setup value is subject to variation of up to 1.6 ns; any hold value is subject to variation of up to 1.4 ns.
g tables list the specifications for the pattern generator module. For
information on the individual pattern generator probes, refer to TLA7PG2 PatternGenerator Probe Instruction Manual.
StepPattern data output is synchronized by the software command
Output pattern
Maximum
Output level: 5 V
Load: 1 MΩ +1pF
Series
Maximu
Output level: 5 V
Load: 1 MΩ +1pF
s termination resistor: 75 Ω
Serie
mum Operating Frequency
Maxi
Pattern length
Data Output Rate
termination resistor: 75 W
m Clock Output Frequency
Pattern data output is synchronized by the internal/external clock input
134 MB/s in Full Channel Mode
268 MB/s in Half Channel Mode
134 MHz
134 MHz in Half Channel Mode
The m
level, output pattern and the load condition, including the series termination
resistor in the probe. Operating conditions exceeding this frequency may
resu
40 t
80 to 524,280 (2
40 to 1,048,572 (2
up
80 to 2,097,144 (2
upgrade)
in Full Channel Mode
aximum operating frequency of the module is a function of the output
Table 84: DSO module signal acquisition system (cont.)
CharacteristicDescription
Step response settling errors (Typical)
1
Net offset is the nominal voltage level at the digitizing oscilloscope input that corresponds to the center of the A/D Converter dynamic range. Offset accuracy is
the accuracy of this voltage level.
2
The limits given are for the ambient temperature range of 0 °C to +30 °C. Reduce the upper bandwidth frequencies by 5 MHz for each °C above +30 °C. The
bandwidth must be set to FULL.
3
Rise time (rounded to the nearest 50 ps) is calculated from the bandwidth when Full Bandwidth is selected. It is defined by the following formula:
Rise Time (ns) = 450 BW (MHz)
4
GND input coupling disconnects the input connector from the attenuator and connects a ground reference to the input of the attenuator.
5
The AC Coupled Lower Frequency Limits are reduced by a factor of 10 when 10X passive probes are used.
6
The sensitivity ranges from 10 mV to 100 V full scale in a 1-2-5 sequence of coarse settings. Between coarse settings, you can adjust the sensitivity witha
resolution equal to 1% of the more sensitive coarse setting. For example, between the 500 mV and 1 V ranges, the sensitivity can be set with 5 mV resolution.
7
The Full Bandwidth settling errors are typically less than the percentages from the table.
8
The maximum absolute difference between the value at the end of a specified time interval after the mid-level crossing of the step, and the value one second
after the mid-level crossing of the step, expressed as a percentage of the step amplitude. See IEEE std. 1057, Section 4.8.1, Settling Time Parameters.
78
Full scale range
setting
10 mV - 1 V
1.01 V - 10 V
10.1 V - 100 V
± Step response
≤2V
≤20 V
≤200 V
Maximum setting error (%)
at
20 ns100 ns20 ms
0.5%
1.0%
1.0%
0.2%
0.5%
0.5%
0.1%
0.2%
0.2%
Table 85: DSO module timebase system
CharacteristicDescription
Range, Extended Real-time Sampling Rate5 S/s to 10 MS/s in a 1-2.5-5 sequence
Range, Real-time Sampling R ate
ProductsLimits
TLA7E1 and TLA7E2
25 MS/s to 5 GS/s on all channels simultaneously
in a 1-2.5-5 sequence
TLA7D1 and TLA7D2
25 MS/s to 2.5 GS/s on all channels
simultaneously in a 1-2.5-5 sequence
Record Length512, 1024, 2048, 4096, 8192, and 15000
Long Term Sample Rate
±100 ppm over any ≥ 1 ms interval
Table 86: DSO module trigger system
CharacteristicDescription
Accuracy (Time) for Pulse Glitch or Pulse Width
Triggering
Accuracy (DC) for Edge Trigger Level, DC Coupled
Range (Time) for Pulse Glitch and Pulse Width
Triggering
Range, Trigger Level
Time RangeAccuracy
2 ns to 500 ns
520 ns to 1 s
± (20% of setting + 0.5 ns)
± (104.5 ns + 0.01% of setting)
±( ( 2% × | Setting) | ) + 0.03 of Full Scale Range + Offset Accuracy) for
signals having rise and fall times ≥20 ns
Sensitivities, Pulse-Type Runt Trigger (Typical)10% of full scale, from DC to 500 MHz, for vertical settings >100 mV full
Sensitivities, Pulse-Type Trigger Width and Glitch
(Typical)
vity, Edge-Type Trigger, DC Coupled
Sensiti
Sensitivity, Edge-Type Trigger, Not DC Coupled
(Typical)
Time, Minimum Pulse or Rearm, and Minimum
Transition Time, for Pulse-Type Triggering (Typical)
Trigger Position Error, Edge Triggering (Typical)
1
The trigger position errors are typically less than the values given here. These values are for triggering signals having a slew rate at the trigger point of ³5%
of full scale/ns.
Minimum: 0%
Maximum: 100%
0.2% of full scale for any Channel source
One Sample Interval at any Sample Rate
scale and ≤10 V full scale at the BNC input
10% of full scale for vertical settings >100 mV full scale and ≤10 V full
scale at the BNC input
The minimum signal levels required for stable edge triggering of an
acquisition when the trigger source is DC-coupled
ProductsTrigger
Sensitivity
Source
TLA7E1 and TLA7E2
Any Channel2.5% of Full Scale Range
from DC to 50 MHz
increasing to 10% of Full
Scale Range at 1 GHz
TLA7D1 and TLA7D2
Any Channel2.5% of Full Scale Range
from DC to 50 MHz
increasing to 10% of Full
Scale Range at 500 MHz
Trigger CouplingTypical Signal Level for Stable Triggering
g table lists the characteristics for iView (Integrated View) and for the
Tektronix logic analyzer mainframe when connected to an external oscilloscope.
For detailed information on the individual specifications of the external
oscilloscope, refer to the documentation that accompanies the oscilloscope.
Table 89: External oscilloscope (Integrated View or iView) characteristics
Character
Supporte
TLA application software version
Minimum
Suppor
(For the latest list of supported external oscilloscopes,
visit our Web site at www.tektronix.com/la.)
Maximum number of external oscilloscopesOne per Tektronix logic analyzer mainframe
iVi
istic
d Tektronix logic analyzer instruments
recommended TLA controller RAM
ted external oscilloscopes as of May, 2008
ew cable length
6
Descripti
TLA5000 and TLA5000B series
TLA715, T
TLA7012, TLA7016
V5.6 or gr
1
512 MB
TDS100
TDS1000B and TDS2000B Series
TDS3000, TDS3000B, and TDS3000C Series (TDS3GM or TDS3GV
GPIB/R
Table 89: External oscilloscope (Integrated View or iView) characteristics (cont.)
CharacteristicD escription
Time correlation uncertainty7(Typical at system trigger)
1
If RAM is less than 256 MB, the record length of the external oscilloscope may be limited to 1 M.
2
A GPIB extender is needed to connect the iView cable to the oscilloscope. One end of a standard GPIB cable can be used.
3
If you encounter possible alignment problems with the logic analyzer and oscilloscope waveform edges, refer to Aligning Logic Analyzer and Oscilloscope
Waveform Edges. (See page 77, Aligning Logic Analyzer and Oscilloscope Waveform Edges.)
4
AGPIBtoU
5
There is a known timing offset between triggers when a TLA logic analyzer is triggered by the oscilloscope. Tektronix is correcting this problem.
6
When used with a TLA7016 mainframe and an external PC (such as TLA7PC1), the instruments must be physically located close together so that the iView
cable can span both instruments. Removing the sleeving from the iView cable assembly increases the spacing distance available between the external
PC and the TLA7016 mainframe.
7
Includes sampling uncertainty, typical jitter, slot-to-slot skew, and probe-to-probe variations to provide a typical number for the measurement.
SB adapter (TEK-USB-488) is required to connect the iView cable to the oscilloscope.
The first time that you take an acquisition after changing the horizontal scale
setting on TDS1000B, TDS2000B, TDS1000 or TDS2000 series oscilloscopes,
the logic analyzer and oscilloscope waveform edges may not be aligned within
sted specification. You can realign the waveform positions in the waveform
the li
window that contains the oscilloscope data (Menu bar > Data > Time A lignment).
Make sure that the external oscilloscope is the data source and then adjust the time
offset to align the waveforms. Use the following approximate offsets for various
horizontal scale settings. (See Table 90.)
Table 90: TDS1000B, TDS2000B, TDS1000, and TDS2000 Series oscilloscope
This chapter
performance verification procedures for the TLA7000 series logic analyzer
mainframes. Refer to the individual service manuals for performance verification
procedures for other Tektronix Logic Analyzer products. Generally, you
should p erform these procedures once per year or following repairs that affect
certification.
Functional verification procedures verify the basic functionality of the instrument
inputs, o
diagnostics, extended diagnostics, and manual check procedures. These
procedures can be used for incoming inspection purposes.
Certification procedures certify the accuracy of an instrument and provide a
traceability path to national standards. Certification data is recorded on calibration
data reports provided with this manual. The calibration data reports are intended
to be copied and used for calibration/certification procedures.
After completing the performance verification procedures or the certification
procedures, you can fill out a calibration data report to keep on file with your
instrument.
contains procedures for functional verification, certification, and
utputs, and basic instrument actions. These procedures include power-on
Performance verification procedures confirm that a product meets or exceeds the
performance requirements for the published specifications documented in the
cifications chapter of this manual.
Spe
Test Equipment
ese procedures us e external, traceable signal sources to directly test
Th
characteristics that are designated as checked
this manual. Always warm up the equipment for 30 minutes before beginning
the procedures.
Table 91: Test equipment
Item number and
descriptionMinimum requirementsExample
1.Benchtop MainframeTLA7016 Benchtop Mainframe with a logic analyzer module
installed and an external computer with TLA application
software installed.
2.Portable MainframeTLA7012 Portable Mainframe with a logic analyzer module
installed
Perform the following tests to complete the functional verification procedure:
NOTE. Installing a module in the mainframe provides a means of verifying
connectivity and communication between the module and the mainframe. Try
using a diff
mainframe or to the module.
1. If you hav
analyzer application if it did not start by itself.
2. Go to the
3. Verify that all power-on diagnostics pass.
4. Click the Extended Diagnostics tab.
5. Select All Modules, All Tests, and then clicktheRunbuttonontheproperty
sheet.
ainframe with an LA module installed in each mainframe.
erent module and repeat the tests to isolate the problem to the
e not already done so, power on the instrument and start the logic
System menu and select Calibration and Diagnostics.
TLA Mainframe
Diagnostics
CheckIt Utilities
All tests that displayed an "Unknown" status will change to a Pass or Fail
status depending on the outcome of the tests.
6. Scroll through the tests and verify that all tests pass.
The TLA Mainframe Diagnostics a re a comprehensive software test that checks
the functionality of the mainframes. To run these diagnostics, do the following
steps:
1. Quit the logic analyzer application.
2. Click the Windows Start button.
elect All Programs → Tektronix Logic Analyzer → TLA Mainframe
3.S
Diagnostics.
4. Select your instrument from the Connection dialog box (in most cases this
will be the [Local] selection).
5. Run the mainframe diagnostics.
CheckIt Utilities is a comprehensive software application used to check and verify
the operation of the PC hardware in the portable mainframe. To run the software,
you must have either a keyboard, mouse, or other pointing device.
the CheckIt Utilities. The test CD needs to contain a file with a size between
5 MB and 15 MB.
To run CheckIt Utilities, follow these instructions:
1. Quit the logic analyzer application.
2. Click the Windows Start button.
3. Select All Programs → CheckIt Utilities.
4. Run the tes
information on running the software and the individual tests.
The system clock of the controller is checked for accuracy. The instrument is
certifiable if this parameter meets specifications. Complete the performance
verification procedures and record the certifiable parameters in a copy of the
Calibration Data Report at the end of this chapter.
he DVD drive, you must have a test CD installed before starting
ts. If necessary, refer to the CheckIt Utilities online help for
Perfo
rmance Verification Procedures
This section contains procedures to verify that the TLA7012 Portable Mainframe
and the TLA7016 Benchtop Mainframe perform as warranted. Verify instrument
ormance whenever the accuracy or function of your instrument is in question.
perf
Tests Performed
Do the following tests to verify the performance of the TLA7012 Portable
MainframeandtheTLA7016BenchtopMainframe. (See Table 93.) You will
ed test equipment to complete the performance verification procedures. (See
ne
Table 91.) If you substitute equipment, always choose instruments that meet or
exceed the minimum requirements specified.