Page 1
xx
TLA6400 Series Logic Analyzer
ZZZ
Product Specifications & Performance Verification
Technical Reference
This document supports TLA Application Software V6.0 and
above.
Warning
These servicing instructions are for use by qualified personnel
only. To avoid personal injury, do not perform any servicing
unless you are qualified to do so. Refer to all safety summaries
before performing service.
www.tektronix.com
P077063401*
*
077-0634-01
Page 2
Copyright © Tektronix. All rights reserved. Licensed software products are owned by Tektronix or its subsidiaries
or suppliers, and are protected by national copyright laws and international treaty provisions.
Tektronix products are covered by U.S. and foreign patents, issued and pending. Information in this publication
supersedes that in all previously published material. Specifications and price change privileges reserved.
TEKTRONIX and TEK are registered trademarks of Tektronix, Inc.
MagniVu and iView are registered trademarks of Tektronix, Inc.
Contacting Tektronix
Tektronix, Inc.
14150 SW Karl Braun Drive
P.O . B o x 5 0 0
Beaverton, OR 97077
USA
For product information, sales, service, and technical support:
In North America, call 1-800-833-9200.
World wide , visi t www.tektronix.com to find contacts in your area.
Page 3
Table of Contents
General safety summary ............ ................................ ................................ .............. iii
Service safety summary............................................................................................ v
Preface ............................................................................................................. vii
Related doc
Specifications .......... ................................ .................................. ........................... 1
Atmospheric characteristics ............... ................................ ................................ ... 2
System characteristics......................................................................................... 2
Performance verification procedures ............................................................................ 13
Summary verification............... ................................ ................................ .......... 13
Test e q u
Functional verification ......... ................................ ................................ .............. 14
Certification ............. .................................. ................................ .................... 16
Performance verification procedures ....................................................................... 16
Threshold accuracy test ...................................................................................... 17
Setup and hold .......................... .................................. ................................ .... 21
fixtures .. ................................ ................................ .................................. .... 25
Test
Threshold accuracy test fixture.............................................................................. 25
Setup and hold test fixture ... ................................ ................................ ................ 26
Calibration data report ............................................................................................ 28
TLA6400 test record ......................................................................................... 28
Test data.................................. .................................. ................................ .... 28
umentation............... .................................. ................................ ..... vii
ipment.... .................................. ................................ .......................... 14
TLA6400 Series Product Specifications & Performance Verification i
Page 4
Table of Contents
List of Figure
Figure 1: Setting trigger parameters . .. .. . .. . .. .. . .. .. . .. .. . .. . .. .. . .. .. . .. .. . .. .. . .. ... .. . .. .. . .. .. . .. .. . .. . .. .. 19
Figure 2: Se
Figure 3: Threshold accuracy test fixture................. .................................. .................... 25
Figure 4: Solder square pins to the SMA connector....... ................................ .................... 26
Figure 5: Solder the SMA connectors together .................. ................................ .............. 27
Figure 6: Completed fixture with termination and coupler . ................................ .................. 27
List of T
Table 1: Atmospheric characteristics............................................................................. 2
Table 2
Table 3: PC controller......................... ................................ ................................ ..... 4
Table 4: External PC controller interfaces....................................................................... 4
Table 5: Display system .................. ................................ ................................ ......... 5
Table 6: Front-panel interface........................ .................................. ........................... 5
Table 7: AC power source ................................ ................................ ......................... 5
le 8: Probing specifications ........ ................................ .................................. ......... 6
Tab
Table 9: Sampling specifications .......... .................................. ................................ ..... 7
Table 10: Triggering specifications.......................................... ................................ ..... 8
Table 11: Record length specifications........ ................................ .................................. 10
Table 12: Symbolic support .............. ................................ .................................. ...... 10
Table 13: iView support .......................................................................................... 10
able 14: Mechanical ............................................................................................. 11
T
Table 15: Test equipment ..................... ................................ ................................ .... 14
Table 16: Parameters checked by verification procedures .................................................... 16
t the trigger states ..................... ................................ .............................. 23
ables
: External signal interface.................. ................................ ............................... 2
s
ii TLA6400 Series Product Specifications & P erformance Verification
Page 5
General safety summary
General safet
To avoid fire or personal
injury
y summary
Review the fo
this product or any products connected to it.
To avoid pot
Only qualified personnel should perform service procedures.
While using this product, you may need to access other parts of a larger system.
Read the safety sections of the other component manuals for warnings and
cautions r
Use proper power cord. Use only the power cord specified for this product and
certified for the country of use.
Connect and disconnect properly. Do not connect or disconnect probes or test
leads while they are connected to a voltage source.
Ground the product. This product is grounded through the grounding conductor
of the power cord. To avoid electric shock, the grounding conductor must be
connected to earth ground. Before making connections to the input or output
terminals of the product, ensure that the product is properly grounded.
llowing safety precautions to avoid injury and prevent damage to
ential hazards, use this product only as specified.
elated to operating the system.
Observe all terminal ratings. To avoid fire or shock hazard, observe all ratings
and markings on the product. Consult the product manual for further ratings
information b efore making connections to the product.
The inputs are not rated for connection to mains or Category II, III, or IV circuits.
Connect the probe reference lead to earth ground only.
Power disconnect. The power cord disconnects the product from the power source.
Do not block the power cord; it must remain accessible to the user at all times.
Do not operate without covers. Do not operate this product with covers or panels
removed.
Do not operate with suspected failures. If you suspect that there is damage to this
product, have it inspected by qualified service personnel.
Avoid exposed circuitry. Do not touch exposed connections and components when
power is present.
Use proper fuse. Use only the fuse type and rating specified for this product.
TLA6400 Series Product Specifications & Performance Verification iii
Page 6
General safety summary
Termsinthismanual
Symbols and terms on t he
product
Do not operate i
Do not operate in an explosive atmosphere.
Keep product surfaces clean and dry.
Provide prop
on installing the product so it has proper ventilation.
These terms may appear in this manual:
WARNING.
in injury or loss of life.
CAUTION
damage to this product or other property.
These t
erms may appear on the product:
DANGER indicates an injury hazard immediately accessible as you read
the ma
n wet/damp conditions.
er ventilation. Refer to the manual's installation instructions for details
Warning statements identify conditions or practices that could result
. Caution statements identify conditions or practices that could result in
rking.
WARNING indicates an injury hazard not immediately accessible as you
the marking.
read
CAUTION indicates a hazard to property including the product.
The following symbol(s) may appear on the product:
iv TLA6400 Series Product Specifications & Performance Verification
Page 7
Service safety summary
Service safet
ysummary
Only qualifie
safety summary and the General safety summary before performing any service
procedures.
Do not service alone. Do not perform internal service or adjustments of this
product unless another person capable of rendering first aid and resuscitation is
present.
Disconnect power. To avoid electric shock, switch off the instrument power, then
disconnect the power cord from the mains power.
Use care when servicing with power on. Dangerous voltages or currents may exist
in this p
test leads before removing protective panels, soldering, or replacing components.
To avoi
d pe rsonnel should perform service procedures. Read this Service
roduct. Disconnect power, remove battery (if applicable), and disconnect
d electric shock, do not touch exposed connections.
TLA6400 Series Product Specifications & Performance Verification v
Page 8
Service safety summary
vi TLA6400 Series Product Specifications & Performance Verification
Page 9
Preface
This document lists the characteristics and specifications of the TLA6400 series
logic analyzers. It also includes the performance verification procedures.
Microproces
sor-related products and individual logic analyzer probes have their
own d ocumentation for characteristics and specifications.
Related documentation
To prevent p
ersonal injury or damage consider the following requirements before
attempting service:
The proced
ures in this manual should be performed only by qualified service
personnel.
Read the G
eneral Safety Summary and Service Safety Summary found at
the beginning of this manual.
Be sure t
The fol
o follow all warnings, cautions, and notes in this manual.
lowing list and table provide information on the related documentation
available for your Tektronix product. For additional information, refer to the
Tektronix Web site (www.tektronix.com/manuals).
Related documentation
Item Purpose
TLA Quick Start User Manuals
Online Help
Installation Reference Sheets High-level installation information
Installation Manuals
XYZs of Logic Analyzers
Declassification and Securities instructions Data security concerns specific to sanitizing
Application notes
Product Specifications & Performance
Verification Procedures
TPI.NET Documentation
Field upgrade kits
Optional Service Manuals Self-service documentation for modules and
High-level operational overview
In-depth operation and UI help
Detailed first-time installation information
Logic analyzer basics
or removing memory devices from Tektronix
products
Collection of logic analyzer application
specific notes
TLA Product specifications and performance
verification procedures
Detailed information for controlling the logic
analyzer using .NET
Upgrade information for your logic analyzer
mainframes
TLA6400 Series Product Specifications & Performance Verification vii
Page 10
Preface
viii TLA6400 Series Product Specifications & Performance Verification
Page 11
Specifications
The following tables list the specifications for the TLA6400 series logic analyzers.
Typical char acteristics describe typical or average performance and provide useful
reference in
formation.
Specifications that are marked with the
indirectly
The performance limits in this specification are valid with these conditions:
For optimum performance using an external oscilloscope, please consult the
documentation for any external oscilloscopes used with your Tektronix logic
analy
requirements.
)inthePerformance Verification chapter of this document.
The instrument must be in an environment with temperature, altitude,
humidity, and vibration within the operating limits described in these
specifica
The instrument must have had a warm-up period of at least 30 minutes.
The instrument must have been calibrated/adjusted at an ambient temperature
between +18 °C and +28 °C.
zer to determine the warm-up period and signal-path compensation
tions.
symbol are checked directly (or
TLA6400 Series Product Specifications & Performance Verification 1
Page 12
Specifications
Atmospheric characteristics
The following table lists the Atmospheric characteristics of components in the
TLA6400 series logic analyzers.
Table 1: Atmospheric characteristics
eHumidity
tude
stic
Descriptio
Operating (
+5 °C to +40
1 °C (34 °F) per 300 m (984 ft) above 1500 m (4921 ft) altitude)
Nonoperating (no media in drive)
-20 °C to +60 °C (-4 °F to +104 °F), 15 °C/hr (59 °F/hr) maximum gradient
Operating (no media in drive)
20% to 80% relative humidity, noncondensing
Nonoperating (no media in drive)
8% to 80% relative humidity, noncondensing
Maxim
C (84.2 °F), derates relative humidity to approximately 22% at 50 °C (122 °F) and 10% at
+29 °
60 °C (140 °F)
Operating
To 3000 m (9843 ft), derated 1 °C (34 °F) per 300 m (984 ft) above 1500 m (4921 ft) altitude.
operating
Non
12,000 m (39,370 ft )
To
Characteri
Temperature
Relativ
Alti
System characteristics
n
no media in CD or DVD drive)
°C (+41 °F to +101 °F), 15 °C/hr (59 °F/hr) maximum gradient, noncondensing (derated
um wet bulb temperature
Table 2: External signal interface
Characteristic Description
System Trigger Input
Input destination
Threshold voltage range
(Vth)
Maximum input voltage 0 V to +5.0 V
Minimum input voltage Vth ±900 mV
Input mode
Minimum pulse width 12 ns
Active period Accepts system triggers during valid acquisition periods via real-time
TTL compatible input via rear panel mounted BNC connector
System trigger
Variablefrom0.5Vto1.5V
peak
Falling edge sensitive, latched (active low)
gating, resets system trigger input latch between valid acquisition periods
2 TLA6400 Series Product Specifications & Performance Verification
Page 13
Table 2: External signal interface (cont.)
Characteristic Description
System Trigger Output
External Signal Input
External Signal Output
Source selection System trigger
Output levels 50 Ω back terminated TTL-compatible output
V
OH
V
OL
Source mode Active (true) low, falling edge latched
Active period
Output protection Short-circuit protected (to ground)
Input destinations
Threshold voltage range
(Vth)
Maximum input voltage 0 V to +5.0 V
Minimum input voltage Vth ±900 mV
Input mode
Input bandwidth
1
Active period Accepts signals during valid acquisition periods via real-time gating.
Source selection Signal 1, 2 (high-speed)
Output modes
Level sensitive
Output levels 50 Ω back terminated TTL output
V
OH
V
OL
Active period
Output protection Short-circuit protected (to ground)
TTL compatible output via rear panel mounted BNC connector
≥4 V into open circuit
≥2Vinto50Ω to ground
≤0.7Vsinking10mA
Outputs system trigger state during valid acquisition period, resets system
trigger output to false state between valid acquisitions via software
TTL compatible input via rear panel mounted BNC connector
Signal 1, 2
Signal 3, 4
Variablefrom0.5Vto1.5V
Active (true) low, level sensitive
Signal 1, 2 Signal 3, 4
50 MHz square wave minimum 10 MHz square wave minimum
TTL compatible outputs via rear panel mounted BNC connector
Signal 3, 4
10 MHz clock
User definable
Active (true) low or active (true) high
≥4 V into open circuit
≥2Vinto50Ω to ground
≤0.7Vsinking10mA
Signal 1, 2 Signal 3, 4Output bandwidth
50 MHz square wave minimum 10 MHz square wave minimum
Outputs signals during valid acquisition periods. Resets signals to false
state between valid acquisitions Outputs 10 MHz clock continuously when
selected
Specifications
peak
TLA6400 Series Product Specifications & Performance Verification 3
Page 14
Specifications
Table 2: External signal interface (cont.)
Characteristic Description
Chassis ground lug
CLK10 accur
1
The input bandwidth specifications only apply to signals to the External Signal input. It does not apply to round-trip signals applied to the External Signal Input
and back out of the External Signal Output.
acy
Lower right side on rear panel
10 MHz ±50 PPM
Table 3: PC controller
Characteristic Description
CPU Intel Core i3-2120, 3.3 GHz, 3 M cache
DRAM
Hard disk drive
Optical drive Optical, CD-RW/DVD-R/RW
Boot from USB Instrument is capable of booting from USB
Operating system Microsoft Windows 7 Ultimate, 64-bit
2x2GBDIMM,4GBtotal
DDR3, 1066 MHz, PC3-8500
500 GB or greater SATAII, 3.5-inch, 7200 RPM
DVD+R/RW, 16.7 MB/second, 650 M/8.5 GB , SATA
Table 4: External PC controller interfaces
Characteristic Description
USB ports
Front panel
Rear panel
S2 ports
P
AN
L
3 USB 2.0
2 USB 2.0
SB 3.0
2U
PS2 keyboard
1
1 PS2 mouse
2 (10/100/1000 Mbps)
4 TLA6400 Series Product Specifications & Performance Verification
Page 15
Specifications
splay
y system
Internal + DVI, Internal + VGA, DVI + VGA
Resolution (Pixels) Colors Refresh Rates
2048 x 1536,
maximum
Size & type 15 in. LCD
Resolutio
15.3 in. touch panel
Type Resistiv
n
1024 x 768
Included a
field upgrade available)
e, single point
Table 5: Displa
Characteristic Description
Dual screen & external
display support
Internal di
Touchscreen
Table 6: Front-panel interface
Characteristic Description
Keypad
Special function knobs
Multi-function Knob Various increment, decrement functions dependent on screen/window
Vertical position
Vertical scale
Horizontal position
Horizontal scale
18 buttons allow user to perform the most common tasks required to
operate the instrument
selected.
Scrolling and positioning dependent on display type.
Scales waveform displays only.
Scrolling and positioning dependent on display type.
Scales waveform displays only.
256, minimu
s an ordering option; available only at time of purchase (no
m
75 Hz
ble 7: AC power source
Ta
Characteristic Description
Mains / input voltage and frequency 100 to 240 VAC ±10%, 50 Hz to 60 Hz ±5%
ower consumption
P
n/Sleep indicator
O
On/Standby switch and indicator Front panel On/Standby switch allows users to turn the instrument on. A
00 W maximum
4
reen/yellow front panel LED located left of the On/Standby switch
G
provides visual feedback when the switch is actuated. When the LED is
green, the instrument is powered and the processor is not sleeping. When
the LED is yellow, the instrument is powered, but the processor is sleeping.
soft power down is implemented so that users can turn the instrument off
without going through the Windows shutdown process; the instrument
powers down normally.
The power cord provides main power disconnect
TLA6400 Series Product Specifications & Performance Verification 5
Page 16
Specifications
Table 8: Probin
Characteristic Description
Number of channels
TLA6401 34
TLA6402 68
TLA6403 102
TLA6404 136
Probe connector location
Probes user removable Remove probes by pressing button on the probe connector.
Analog outputs
Number of outputs Any four of the channels can be mapped to the four analog outputs with the appropriate
Attenuation1(Typical)
Bandwidth (Typical)
Accuracy (gain and offset)
cal)
(Typi
Chan
(Typical)
Delay time from probe tip to
analog signal out (Typical)
PowerFlex
Input voltage range, dynamic
(Typical)
Input voltage range, absolute
maximum (Typical)
Threshold range and step size
Threshold accuracy
(Certifiable parameter)
Number of thresholds
gspecifications
nel-to-channel skew
Lower righ
PowerFlex option.
All four o
A given input channel cannot be routed to more than one output at the same time.
10 x, 5 x
P5910 General Purpose
probe
2 Ghz (-3dB) 1.5 Ghz (-3dB) 2 Ghz (-3dB)
±(80 mV + 2% of signal amplitude)
±500 ps
11.9
Standard: 4 fixed channels
Options:
-2.5Vto+5V
-4.5 V to +13 V
Can be set from -2.0 V to +4.5 V in 5 mV increments
±(50 mV + 1% of the threshold voltage setting)
Each channel has a n independent threshold control.
t side of the instrument
utputs can be used at the same time.
P5934 M
ns
Any input channel to 4 channels
ictor probe
P5960 D
MAX probe
6 TLA6400 Series Product Specifications & Performance Verification
Page 17
Table 8: Probing specifications (cont.)
Characteristic Description
Channel-to-
channel skew
(Maximum)
Channel-to-channel skew (maximum)
P5910 gene
ral purpose probe
P5960 D-Max probe Instrument channel-to-channel skew plus ±125 ps
P5934 Mictor probe Instrument channel-to-channel skew plus ±500 ps
Channel-to-channel skew (Typical)
P5910 gen
eral purpose probe
P5960 D-Max probe Instrument channel-to-channel skew plus ±40 ps
P5934 Mictor probe Instrument channel-to-channel skew plus ±250 ps
ggable probes
Hot-plu
m probe input voltage
Minimu
1
Characteristics are verified only at the 10 x attenuation
±40 ps instrument only
Instrumen
±40 ps ins
Instrume
t channel-to-channel skew plus ±125 ps
trument only
nt channel-to-channel skew plus ±40 ps
Probes can be added or removed from the instrument while the instrument is turned on.
300 mV
p-p
Specifications
Table 9: Sampling specifications
cteristic
Chara
MagniVu timing
Resolution Data is synchronously sampled and stored every 40 ps in a separate high resolution memory.
Record length 128 k per channel
Minimum pulse width (Typical)
Sampling (clocking) modes Internal, External, Custom
Internal clocking
1x mode
2x mode
4x mode
Minimum pulse width (Typical)
iption
Descr
The storage speed can be changed by software to 80 ps, 160 ps, 320 ps, or 640 ps (with no loss
mory depth) so that the high resolution m emory covers more time at a lower resolution.
in me
P5910 General Purpose
be
pro
P5934 Mictor probe P5960 DMAX probe
250 ps 500 ps 250 ps
1.25 ns (800 MS/s) maximum clocking period on all channels
625 ps (1.6 GS/s) maximum clocking period on all channels
312.5 ps (3.2 GS/s) maximum clocking period on half channels (using 2:1 demultiplex mode)
50 ms is the slowest clocking rate. A 1–2–5 sequence is supported, but it starts with 312.5 ps,
625 ps, 1.25 ns, 2.5 ns (PowerFlex), 5 ns, 10 ns, 20 ns, 5 0 ns, etc. It is possible to use storage
control and only store data when it has changed (transitional storage).
P5910 General Purpose
P5934 Mictor probe P5960 DMAX probe
probe
250 ps 500 ps 250 ps
TLA6400 Series Product Specifications & Performance Verification 7
Page 18
Specifications
Table 9: Sampling specifications (cont.)
Characteristic Description
External clocking
External clock rate
External d
ata rate
Clocks and qualifiers
TLA6401 2 clocks
TLA6402 4 clocks
TLA6403
TLA6404
Data valid w indow (Setup-and-hold window)
P5910 General Purpose
, P5960 DMAX probe
probe
P5934 Mictor probe 500 ps, single channel
Data valid window (Setup-and-hold window)1(Typical)
P5910 General Purpose
be, P5960 DMAX probe
pro
Mictor probe 500 ps, single channel
Data valid window (Setup-and-hold
ndow) adjustment resolution
wi
ta valid window (Setup-and-hold
Da
window) adjustment range
1
If the TLA application uses Auto Deskew, add another 20 ps (one over-sampler step size) to the numbers.
333 MHz, minimum (standard instrument)
667 MHz, maximum, optional via PowerFlex)
667 Mbs, minimum (standard instrument)
1333 Mbs, maximum (optional via PowerFlex)
4 clocks, 2 qualifiers. Clocks can be used as qualifiers.
4 clocks, 4 qualifiers. Clocks can be used as qualifiers.
1
300 ps maximum, single channel
260 ps, single channel
20 ps
+15nsto-7.5ns
able 10: Triggering specifications
T
Characteristic Description
Number of independent trigger
16
states
Independent If/Then clauses per
16 maximum
state
Events per If/Then clause
Actions per If/Then clause
Trigger events
8 maximum
8 maximum
26 maximum (two counter/timers plus any 24 other resources)
Word recognizers 24
Transition recognizers 24
8 TLA6400 Series Product Specifications & Performance Verification
Page 19
Table 10: Triggering specifications (cont.)
Characteristic Description
Range recognizers 8 maximum
There are 24 word/channel-to-channel compare recognizers. Word recognizers can be traded
off to form full-width, double-bounded range recognizers. The follo wing selections are available:
24 word, 0 range
21 word, 1 range
18 word, 2 range
15 word, 3 range
12 word, 4 range
9 word, 5 range
6 word, 6 range
3 word, 7 range
0 word, 8 range
Counter/timers
Trigger event types
Trigger action types
Maximum triggerable data
rate
Trigger state machine (TSM)
ence rate
sequ
Counter/timer range
Timer clock rate
Counter/timer test latency
Range recognizers
Range recognizer channel order
Setup-and-Hold violation
recognizer — Setup/Hold time
range
Trigger position
2
Word, Group, Channel, Transition, Range, Anything, Counter Value, Timer Value, Signal, Glitch,
Setup-and-Hold Violation, Snapshot
Trigger, Trigger All, Trigger Main, Trigger MagniVu, Store, Don’t Store, Start Store, Stop Store,
Increment Counter, Decrement Counter, Reset Counter, Start Timer, Stop Timer, Reset Timer,
Snapshot Current Sample, Go to State, Set/Clear Signal, Do Nothing
The system can trigger and track at the maximum acquisition rate.
DC to 800 MHz (1.25 ns)
ata rates of 800 Mb/s or less, the TSM evaluates one data sample per TSM clock. For
For d
data rates greater than 800 Mb/s, the TSM evaluates multiple data samples per TSM clock up to
the maximum acquired data rate.
2 fast (no latency) counter/timers.
imum count is 2
Max
Maximum time is approximately 3.5 × 105 seconds, approximately four days
Counter commands are reset, do nothing, increment, or decrement.
er command are reset, no change, start, or stop
Tim
0MHz(1.25ns)
80
Fast counter/timer latency is Zero clock TC latency
Double-bounded (136-channels maximum). Can be as wide as any group, but must be grouped
accordingtospecified order of significance.
From most-significant probe group to least-significant probe group: CK3 Q1 C3 C2 C 1 C0 Q3
2E3E2E1E0CK0Q0A3A2D3D2CK1CK2A1A0D1D0
Q
Missing channels for instruments with fewer than 136 channels are omitted.
From 7.5 ns before to 7.5 ns after the clock edge in 20 ps increments. This range can be shifted
towards the positive region by 0 ns, 2.5 ns, 5 ns, or 7.5 ns.
The main trigger position is programmable to any data sample (1.25 ns boundaries)
48–1
(including bit sign)
Specifications
TLA6400 Series Product Specifications & Performance Verification 9
Page 20
Specifications
Table 10: Triggering specifications (cont.)
Characteristic Description
MagniVu trigger position The high resolution trigger position i s programmable within 1.25 ns boundaries and separate
from the main acquisition memory trigger position.
The MagniVu position can be set from 0% to 60% centered around the MagniVu trigger.
Storage Control (data
qualification)
All global (conditional), by state (start/stop), block, by trigger action, or transitional. Also force
main prefill selection is available.
Table 11:
Record length specifications
Characteristic Description
Maximum
record length
64 Mb
Record length options
Standard
Options
Data vs. Time stamp vs. Violation
storage
Time stamp bits and resolution
tion)
(dura
2Mb
4 Mb, 8 Mb, 16 Mb,32 Mb, 64 Mb
Enabling violation storage in either glitch (external) or Ts/Th (internal) does not impact record
h
lengt
s @ 20 ps
51 bit
(3.25 days)
Table 12: Symbolic support
Characteristic Description
Number of symbols or ranges Unlimited (limited by the amount of virtual memory available)
Object file formats supported IEEE695, OMF 51, OMF 86, OMF 166, OMF 286, OMF 386, COFF, Elf/Dwarf 1 and 2,
Elf/Stabs, TSF
1
the software development tools do not generate outputs in one of the listed formats, use TSF (Tektronix symbol file format)
If
1
Table 13: iView support
Characteristic Description
TLA-to-TDS connections for iView USB-to-USB, Trigger In, Trigger Out, Clock Out
Number of external oscilloscopes
1
connected to the logic analyzer
Number of external oscilloscopes
>100, please check the Tektronix Web site at www.tek.com/iview
supported
10 TLA6400 Series Product Specifications & Performance Verification
Page 21
Specifications
Table 14: Mecha
Characteristic Description
Overall dimensions
(Typical)
Weight (Typical) Includes instrument with front cover and empty accessory pouch
nical
Dimensions are without front feet extended, front cover attached, pouch
attached, nor power cord attached.
Height (with feet) 29.7 cm (11.7 in)
Width
Depth
TLA6401
TLA6402
TLA6403
TLA6404
Shipping 21.90 k g (48 lbs 4 oz)
43.7 cm (17.2 in)
38.7 cm (15.2 in)
13.52 kg (29 lbs 13 oz)
13.88 kg (30 lbs 10 oz)
14.29 kg (31 lbs 8 oz)
14.65 kg (32 lbs 5 oz)
TLA6400 Series Product Specifications & Performance Verification 11
Page 22
Specifications
12 TLA6400 Series Product Specifications & Performance Verification
Page 23
Performance verification procedures
This chapter contains procedures for functional verification, certification, and
performance verification procedures for the TLA6400 series logic analyzers.
ou should perform these procedures once per year or following repairs
Summary verification
Generally, y
that affect certification.
Functional verification procedures verify the basic functionality of the instrument
inputs, outputs, and basic instrument actions. These procedures include power-on
diagnostics, extended diagnostics, and manual check procedures. These
procedures can be used for incoming inspection purposes.
Performance verification procedures confirm that a product meets or exceeds the
performance requirements for the published specifications documented in the
Specifications chapter of this manual. The performance verification procedures
y t he accuracy of an instrument and provide a traceability path to national
certif
standards.
fication procedures certify the accuracy of an instrument and provide a
Certi
traceability path to national standards. Certification data is recorded on calibration
data reports provided with this manual. The calibration data reports are intended
to be copied and used for calibration/certification procedures.
As you complete the performance verification procedures, fill out a calibration
data report to keep on file with your instrument. A blank copy of the calibration
data report is provided with this manual. The calibration data report is intended to
be copied and used to record the results of the calibration/certification procedures.
TLA6400 Series Product Specifications & Performance Verification 13
Page 24
Performance verification procedures
Test equipment
These procedures use external, traceable signal sources to directly test
characteristics that are designated as checked
this manual. Always warm up the equipment for 30 minutes before beginning
the procedures.
in the Specifications chapter of
Table 15: Te
Item number
description Minimum requirements Example
Logic anal
Logic analyzer probe
Precision voltage
referenc
generator and precision
digital voltmeter
Data Timing Generator Tektronix DTG 524 with a DTGM30 Output Module
Frequency counter
Test fix
Accuracy
Test fixture, Setup and
Hold
Cable, precision
50 Ω c
1
In addition to the P5910 probe, you will also need the ground extender accessory to connect the ground input to the test fixture.
st equipment
and
yzer
e or a DC signal
ture, Threshold
oaxial
TLA6401, T
One requir
(accurat
Frequency accuracy: <0.0025% Frequency range: 1 kHz to
100 MHz
One req
Minimum of two test fixtures required Refer to Setup and Hold Test
50 Ω , 36 in, male-to-male BNC connectors
LA6402, TLA6403, or TLA6404
ed
etowithin±5mV)
uired
-
1
P5910
-
-
Hewlett Packard 5314A
o Threshold Accuracy Test
Refer t
Fixture. (See page 25.)
Fixture. (See page 26.)
Tektronix part number 012-0482-XX
Functional verification
The following list describes the functional verification procedures for the
TLA6400 series logic analyzer.
Power-on and fan operation
Power-on diagnostics
Extended diagnostics
Power-On and fan
operation
14 TLA6400 Series Product Specifications & Performance Verification
Complete the following steps to check the power-on and fan operation of the
logic analyzer:
1. Power on the instrument and observe that the On/Standby switch illuminates.
2. Check that the fans spin without undue noise.
Page 25
Performance verification procedures
Extended diagnostics
3. If everything i
s properly connected and operational, you should see the
modules in the System window of the logic analyzer application.
4. If there are no
failures indicated in the System window, the power-on
diagnostics pass when you power o n the instrument.
Do the following steps to run the extended diagnostics:
NOTE. Runn
ing the extended diagnostics will invalidate any acquired data. If
you want to save any of the acquired data, do so before running the extended
diagnostics.
Prerequisites Warm-up time: 30 minutes
Perform the following tests to complete the functional verification procedure:
1. If you have not already done so, power on the instrument and start the logic
analyzer application if it did not start by itself.
2. Go to the System menu and select Calibration and Diagnostics.
3. Verify that all power-on diagnostics pass.
4. Click the Extended Diagnostics tab.
5. Select All Modules, All Tests, and then click the Run button on the property
sheet.
All tests that displayed an "Unknown" status will change to a Pass or Fail
status depending on the outcome of the tests.
6. Scroll through the tests and verify that all tests pass.
TLA6400 Series Product Specifications & Performance Verification 15
Page 26
Performance verification procedures
Certification
The system clock is checked for accuracy, and the input probe channels are
checked for threshold accuracy and setup and hold acc uracy. The instrument is
certifiable i
f these parameters meet specifications. Complete the performance
verification procedures and record the certifiable parameters in a copy of the
Calibration D ata Report at the end of this chapter.
Performance verification procedures
This section contains procedures to verify that the instrument performs as
warranted. Verify instrument performance whenever the accuracy or function of
your instrument is in question.
Tests performed
Do the following tests to verify the performance of the instrument. You will
need test equipment to complete the performance verification procedures. (See
Table 15 on page 14.) If you substitute equipment, always choose instruments that
meet or exceed the minimum requirements specified.
16: Parameters checked by verification procedures
Table
Parameter Verification method
System clock (CLK10) accuracy
shold accuracy
Thre
nnel-to-channel skew
Cha
Internal sampling period (Internal clocking) Verified indirectly by the 10 MHz system
Synchronous clock rate, minimum and
aximum (External clock rate)
m
Synchronous data rate, minimum and
maximum (External data rate)
Setup and hold window size (data and
qualifiers)
Counters and timers Verified by diagnostics
1
1
Verified by the 10 MHz system clock test
Verified by the threshold accuracy test.
Certified by running the certification
cedure.
pro
ified indirectly by the setup and hold
Ver
procedure
clock test
Diagnostics verify the clock
etection/sampling circuitry. Bandwidth is
d
verified indirectly by the at-speed diagnostics,
the setup and hold test, and the clock test.
Diagnostics verify the clock
detection/sampling circuitry. Bandwidth is
verified indirectly by the at-speed diagnostics,
the setup and hold test, and the clock test.
Verified directly by setup and hold procedure
16 TLA6400 Series Product Specifications & Performance Verification
Page 27
Performance verification procedures
Table 16: Parameters checked by verification procedures (cont.)
Parameter Verification method
Maximum triggerable data rate
Trigger state machine (TSM) sequence rate Verified indirectly by at-speed diagnostics
1
Certifiable parameter
Verified indirectly by at-speed diagnostics
and internal sampling period
Checking the 10 MHz
system clock (CLK10)
The following procedure checks the accuracy of the 10 MHz system clock:
Equipment required Frequency counter
Precision BNC cable
Prerequisites Warm-up time: 30 minutes
1. Verify that all of the prerequisites above are met for the procedure.
2. Connect the frequency counter to the External Signal Out BNC connector
on the instrument.
3. Go to the System window and select System Configuration from the System
menu.
4. In the System Configuration dialog box, select 10 MHz Clock from the list of
routable signals in the External Signal Out selection box and click OK.
5. Verify that the output frequency at the External Signal Out connector is
10 MHz ±500 Hz. Record the measurement on a copy of the calibration data
report and disconnect the frequency counter.
6. In the System Configuration dialog box, reset the External Signal Out signal
to None.
Threshold accuracy test
This procedure verifies the threshold voltage accuracy of the logic analyzer.
Equipment required
Prerequisites Warm-up time: 30 minutes
TLA6400 Series Product Specifications & Performance Verification 17
Precision voltage reference or a DC signal
generator and precision digital voltmeter
(accurate to within ±5mV)
Threshold Accuracy test fixture
P5910 Logic analyzer probe
Ambient temperature must be 23 °C ±5 °C
(73°F±9°F)
Page 28
Performance verification procedures
Test equipment setup
TLA6400 setup
Connect a P5910
Threshold Accuracy test fixture. If the voltage source does not have the required
output accuracy, use a multimeter with the required accuracy to verify the voltage
output levels specified in the procedure.
To set up the logic analyzer for this test, you must define the characteristics of the
channel that you are testing, and then set the trigger parameters:
1. Open the Setup window.
a. In the Grou
(“Test” in the example).
b. Define the
c. Set the sampling to Asynchronous, 2.0 n s.
d. Set the Acquisition Length to 128K or less.
e. Set Acquire to Samples.
2. Go to the Trigger window and select the Power Trigger tab. Create a trigger
program that triggers the logic analyzer when it does not see all highs or
all lows:
probe from the logic analyzer to the voltage source, using the
p column, enter a name for the probe group that you are testing
signals for the group that you are testing.
a. Click the If Then button.
b. Set the channel definition to match the figure shown. (See Figure 1.)
c. After you set the channel definitions, click OK.
18 TLA6400 Series Product Specifications & Performance Verification
Page 29
Performance verification procedures
Figure 1: Setting trigger parameters
TLA6400 Series Product Specifications & Performance Verification 19
Page 30
Performance verification procedures
Verification procedure
Complete the fo
the copy of the Calibration Data Sheet.
1. Go to the Setup
voltages to 2.5 V.
2. Set the volt
3. Start the logic analyzer and verify that it does not trigger.
4. Increase the voltage in 10 mV steps, waiting at least 3 seconds between steps
to make sure that the logic analyzer continues to run without triggering.
Continue u
5. Set the voltage source to 2.700 V.
6. Start the logic analyzer and verify that it does not trigger.
7. Decrease the voltage in 10 mV steps, waiting at least 3 seconds between
steps to make sure that the logic analyzer continues to run without triggering.
Continue until the logic analyzer triggers and then record the voltage.
8. Add the two voltage values and divide by two. Verify that the result is
2.50 V ±75 mV. Record the voltage on the Calibration Data Sheet.
9. Go to the Setup window and set the logic analyzer threshold voltages to –2.0 V.
llowing steps to complete this procedure. Record the results on
window of the logic analyzer and set the probe threshold
agesourceto2.300V.
ntil the logic analyzer triggers and then record the voltage.
10. Repeat steps 3 through 8 for -2.200 V and -1.800 V.
11. Add the two voltage values and divide by two. Verify that the result is
-2.00 V ±70 mV. Record the voltage on the Calibration Data Sheet.
12. Repeat the procedure for each probe channel group that you want to verify.
20 TLA6400 Series Product Specifications & Performance Verification
Page 31
Setup and hold
Performance verification procedures
This procedure verifies the setup and hold specifications of the logic analyzer.
Digital timing generator
setup
Equipment re
Prerequisi
1. Verify tha
quired
tes
Tektronix DTG 524 Data Timing Generator
with a DTGM30 Output Module
Precision B
Setup and Hold test fixture
Warm-up tim
NC cable
e: 30 minutes
t the digital timing generator (DTG) has been calibrated so that the
channel-to-channel skew is minimized.
2. Set up the
DTG so that a channel (CH1 for example), is set to be a clock
pattern of alternating 1 and 0 (101010… binary) starting with 1 (rising edge).
3. Set the output frequency to 250 MHz. (This may require you to set the DTG
base clock to 500 MHz for this pattern to represent 250 MHz at the channel
output.)
4. Set another channel of the DTG (CH2 for example) to a data pattern
representing half the period of CH1 (for example 001100110011...binary,
ing with 00).
start
5. Connect the setup and hold test fixtures to the DTG channels that you have set
onnect 50 Ω SMA terminations to the test fixtures.
up. C
6. Connect the DTG channel that you set up as a clock to the appropriate TLA
x] input.
CK[
7. Connect the other DTG channel to two of the TLA data channels that you
nt to test.
wa
To test other TLA data channels simultaneously and your DTG has additional
utputs available, set up those DTG channels like the first data channel, and
o
connect them to the other logic analyzer channels that you want to test. (The
channels must be in the same probe, and you will need another test fixture
for each additional channel pair.) Otherwise, repeat the procedure for each
new pair of logic analyzer channels.
8. SettheterminationtoopenoneachDTGchannel.
9. Set the DTG output voltage levels to 2.0 V High and 0.0 V Low, with no offset.
TLA6400 Series Product Specifications & Performance Verification 21
Page 32
Performance verification procedures
TLA6400 setup
1. Start the TLA Ap
2. Click the DM button to default the module.
3. Click the Synchronous tab and set the following parameters:
a. Clock Signal: Choose the clock that you connected the DTG output to.
b. Max Clock Ra
c. Global Threshold: Set to 500 mV.
With the 50 Ω external termination a ttached at the SMA fixture end, this
sets the logic analyzer threshold voltage levels to one-half the resulting
terminat
4. In the Acquisition Options box, select the following:
a. Acquisition Length: 1K or greater
b. Storage Options: Normal
5. Create a new group: right click in the Group Name column.
6. Select Add Group from the pop-up window. Rename the new group Test.
7. In the
Probe Channels column, enter the names of the two adjacent data
channels that will be used to connect to CH2 of the DTG.
plication and open the Setup Window.
te: 450 MHz
ion voltage, which should be about 500 mV (not 1 V).
NOTE. These procedures test two channels. To check more than two channels, be
sure to set the group and trigger word widths to the same amount.
Trigger logic. To complete the setup, you configure a trigger to occur whenever
the two data lines are neither 00 nor 11 (binary). This will capture the condition
when the two data signals are 01 or 10, as they transition to their common values.
To set this up, do the following:
22 TLA6400 Series Product Specifications & Performance Verification
Page 33
Performance verification procedures
8. Open the LA Trig
states as shown. (See Figure 2.)
ger window and select the Power Trigger tab. Set up three
Figure 2: Set the trigger states
TLA6400 Series Product Specifications & Performance Verification 23
Page 34
Performance verification procedures
Verification procedure
Complete the fo
on the Calibration Data Sheet.
1. Set the DTG seq
2. Press the RUN button on the TLA and wait a few seconds to verify that it
does not tri
3. Starting from 0.000 ns, increase the delay of the DTG clock channel in 100 ps
steps until
decrease the delay in 10 ps steps to find the trigger threshold to within 10 ps.
Record this delay amount.
Note that the logic analyzer might trigger because of a glitch when you make
a delay change. If the data in the waveform window is correct (all data
transitioning at the same time and at the correct frequency), then ignore this
"false trigger" and start the logic analyzer again.
As an alternative, you may want to run the logic analyzer in continuous loop
mode if the DTG causes a false trigger on the logic analyzer e ach time you
change the delay. Then observe if the data is correct in the waveform window
and ig
waveform window displays data that was not acquired correctly. Record this
delay.
4. Add 300 ps to the delay value that you recorded in step 3 and increase the
DTG clock delay to match this cumulative value. (For example, if you
measured 600 ps, increase the delay to 900 ps.)
llowing steps to complete this procedure. Record the results
uencer to RUN and the outputs ON.
gger.
triggering begins to occur. When the TLA begins to trigger,
nore any false triggers. Continue increasing the clock delay until the
5. Press Run and wait a few seconds to verify t hat it does not trigger. This
verifies that the setup and hold window is less than 300 ps, which is the
guaranteed specification for a single channel.
To measure the actual setup and hold window size for your application, slowly
decrease the clock delay in steps (waiting a few seconds between steps to
verify that it does not trigger), until the logic analyzer triggers. Record this
econd value. The difference between this second value and the value that you
s
measured in step 3 is the measured setup and hold window size.
24 TLA6400 Series Product Specifications & Performance Verification
Page 35
Test fixtures
Test fixtures
This section
used in the performance verification tests.
Threshold accuracy test fixture
Use this fixture to gain access to the logic analyzer probe pins. The fixture
connects all ground pins together, and all signal pins together.
Equipment required
Build procedure
You will need the following items to build the test fixture:
Item Description Example part number
Square-pin strip
Wire 20 gauge
Soldering iron and solder
Use the following procedure to build the test fixture.
1. Set the square-pin strip down and lay a wire across one row of pins on
one side of the insulator as shown. Leave some extra wire at one end for
nnecting to a test lead. (See Figure 3.)
co
includes information and procedures for building the test fixtures
0.100 x 0.100, 2 x 8 contacts
(or two 1 x 8 contacts )
50 W
SAMTEC part number
TSW-102-06-G-S
2. Solder the wire to each pin in the row.
3. Repeat for the other row of pins.
Figure 3: Threshold accuracy test fixture
TLA6400 Series Product Specifications & Performance Verification 25
Page 36
Test fixtures
Setup and hold
Equipment required
Build procedure
test fixture
This fixture provides square-pin test points for logic analyzer probes when they
are used to probe in-line SMA connections. Note that you need at least two test
fixtures to co
You will need the following items to build the test fixture:
Item Descriptio
SMA connec
required for each fixture)
Square-pin strip
SMA termination 50 Ω, ≥2 GHz bandwidth
SMA adapter
Soldering iron and solder
Use the
mplete the procedure.
n
tor (two
Female, PC
0.100 x 0.
(or two 1 x 2 contacts )
Male-to-male Johnson part number
50 W
B mount
100, 2 x 2 contacts
following procedure to build the test fixture.
Example par
SV Microwa
2985-6035, -6036, or -6037
SAMTEC part number
TSW-102-06-G-S
Johnson part number
142-0801-866
142-0901-811
t number
ve part number
1. Arrange one SMA connector as shown. (See Figure 4.)
2. Align the square pins at a right angle to the connector.
Figure 4: Solder square pins to the SMA connector
3. Solder one set of square pins to the SMA ground conductor.
4. Solder the other set of square pins to the SMA center conductor.
26 TLA6400 Series Product Specifications & Performance Verification
Page 37
Test fixtures
5. Align the secon
conductors of the connectors together. (See Figure 5.)
Figure 5: Solder the SMA connectors together
6. Solder the ground conductors of the SMA connectors together.
7. Attach the termination and coupler to the fixture.
d SMA connector to the first as shown and solder the center
Figure 6: Completed fixture with termination and coupler
TLA6400 Series Product Specifications & Performance Verification 27
Page 38
Calibration data report
Calibration d
ata report
Photocopy th
instrument.
is table and use it to record the performance test results for your
TLA6400 test record
Instrument model number:
Serial number:
Certificate number:
Verification performed by:
Verification date:
Test dat
Characteristic Specification Tolerance Incoming data Outgoing data
Clock frequency
Threshold accuracy
Setup and hold window:
a
10 MHz ±500 Hz
+2.5 V ±75 mV
-2 V ±70 mV
single channel ≤300 ps
(9.9995 MHz-10.0005 MHz)
(2.425 V to 2.575 V)
(-1.930 V to –2.070 V)
none
28 TLA6400 Series Product Specifications & Performance Verification
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