Tektronix TLA6400 Series, TLA6403, TLA6404, TLA6401, TLA6402 Technical Reference

Download

Page 1

TLA6400 Series Logic Analyzer

ZZZ

Product Speciﬁcations & Performance Veriﬁcation

Technical Reference

This document supports TLA Application Software V6.0 and above.

Warning

These servicing instructions are for use by qualiﬁed personnel only. To avoid personal injury, do not perform any servicing unless you are qualiﬁed to do so. Refer to all safety summaries before performing service.

www.tektronix.com

P077063401*

077-0634-01

Page 2

Copyright © Tektronix. All rights reserved. Licensed software products are owned by Tektronix or its subsidiaries or suppliers, and are protected by national copyright laws and international treaty provisions.

Tektronix products are covered by U.S. and foreign patents, issued and pending. Information in this publication supersedes that in all previously published material. Speciﬁcations and price change privileges reserved.

TEKTRONIX and TEK are registered trademarks of Tektronix, Inc.

MagniVu and iView are registered trademarks of Tektronix, Inc.

Contacting Tektronix

Tektronix, Inc. 14150 SW Karl Braun Drive P.O . B o x 5 0 0 Beaverton, OR 97077 USA

For product information, sales, service, and technical support:

In North America, call 1-800-833-9200. World wide , visi t www.tektronix.com to ﬁnd contacts in your area.

Page 3

Table of Contents

General safety summary ............ ................................ ................................ .............. iii

Service safety summary............................................................................................ v

Preface ............................................................................................................. vii

Related doc

Speciﬁcations .......... ................................ .................................. ........................... 1

Atmospheric characteristics ............... ................................ ................................ ... 2

System characteristics......................................................................................... 2

Performance veriﬁcation procedures ............................................................................ 13

Summary veriﬁcation............... ................................ ................................ .......... 13

Test e q u

Functional veriﬁcation ......... ................................ ................................ .............. 14

Certiﬁcation ............. .................................. ................................ .................... 16

Performance veriﬁcation procedures ....................................................................... 16

Threshold accuracy test ...................................................................................... 17

Setup and hold .......................... .................................. ................................ .... 21

ﬁxtures .. ................................ ................................ .................................. .... 25

Test

Threshold accuracy test ﬁxture.............................................................................. 25

Setup and hold test ﬁxture ... ................................ ................................ ................ 26

Calibration data report ............................................................................................ 28

TLA6400 test record ......................................................................................... 28

Test data.................................. .................................. ................................ .... 28

umentation............... .................................. ................................ ..... vii

ipment.... .................................. ................................ .......................... 14

TLA6400 Series Product Speciﬁcations & Performance Veriﬁcation i

Page 4

Table of Contents

List of Figure

Figure 1: Setting trigger parameters . .. .. . .. . .. .. . .. .. . .. .. . .. . .. .. . .. .. . .. .. . .. .. . .. ... .. . .. .. . .. .. . .. .. . .. . .. .. 19

Figure 2: Se

Figure 3: Threshold accuracy test ﬁxture................. .................................. .................... 25

Figure 4: Solder square pins to the SMA connector....... ................................ .................... 26

Figure 5: Solder the SMA connectors together .................. ................................ .............. 27

Figure 6: Completed ﬁxture with termination and coupler . ................................ .................. 27

List of T

Table 1: Atmospheric characteristics............................................................................. 2

Table 2

Table 3: PC controller......................... ................................ ................................ ..... 4

Table 4: External PC controller interfaces....................................................................... 4

Table 5: Display system .................. ................................ ................................ ......... 5

Table 6: Front-panel interface........................ .................................. ........................... 5

Table 7: AC power source ................................ ................................ ......................... 5

le 8: Probing speciﬁcations ........ ................................ .................................. ......... 6

Tab

Table 9: Sampling speciﬁcations .......... .................................. ................................ ..... 7

Table 10: Triggering speciﬁcations.......................................... ................................ ..... 8

Table 11: Record length speciﬁcations........ ................................ .................................. 10

Table 12: Symbolic support .............. ................................ .................................. ...... 10

Table 13: iView support .......................................................................................... 10

able 14: Mechanical ............................................................................................. 11

Table 15: Test equipment ..................... ................................ ................................ .... 14

Table 16: Parameters checked by veriﬁcation procedures .................................................... 16

t the trigger states ..................... ................................ .............................. 23

ables

: External signal interface.................. ................................ ............................... 2

ii TLA6400 Series Product Speciﬁcations & P erformance Veriﬁcation

Page 5

General safety summary

General safet

To avoid ﬁre or personal

injury

y summary

Review the fo this product or any products connected to it.

To avoid pot

Only qualiﬁed personnel should perform service procedures.

While using this product, you may need to access other parts of a larger system. Read the safety sections of the other component manuals for warnings and cautions r

Use proper power cord. Use only the power cord speciﬁed for this product and certiﬁed for the country of use.

Connect and disconnect properly. Do not connect or disconnect probes or test leads while they are connected to a voltage source.

Ground the product. This product is grounded through the grounding conductor of the power cord. To avoid electric shock, the grounding conductor must be connected to earth ground. Before making connections to the input or output terminals of the product, ensure that the product is properly grounded.

llowing safety precautions to avoid injury and prevent damage to

ential hazards, use this product only as speciﬁed.

elated to operating the system.

Observe all terminal ratings. To avoid ﬁre or shock hazard, observe all ratings and markings on the product. Consult the product manual for further ratings information b efore making connections to the product.

The inputs are not rated for connection to mains or Category II, III, or IV circuits.

Connect the probe reference lead to earth ground only.

Power disconnect. The power cord disconnects the product from the power source. Do not block the power cord; it must remain accessible to the user at all times.

Do not operate without covers. Do not operate this product with covers or panels removed.

Do not operate with suspected failures. If you suspect that there is damage to this product, have it inspected by qualiﬁed service personnel.

Avoid exposed circuitry. Do not touch exposed connections and components when power is present.

Use proper fuse. Use only the fuse type and rating speciﬁed for this product.

TLA6400 Series Product Speciﬁcations & Performance Veriﬁcation iii

Page 6

General safety summary

Termsinthismanual

Symbols and terms on t he

product

Do not operate i

Do not operate in an explosive atmosphere.

Keep product surfaces clean and dry.

Provide prop

on installing the product so it has proper ventilation.

These terms may appear in this manual:

WARNING.

in injury or loss of life.

CAUTION

damage to this product or other property.

These t

erms may appear on the product:

DANGER indicates an injury hazard immediately accessible as you read the ma

n wet/damp conditions.

er ventilation. Refer to the manual's installation instructions for details

Warning statements identify conditions or practices that could result

. Caution statements identify conditions or practices that could result in

rking.

WARNING indicates an injury hazard not immediately accessible as you

the marking.

read

CAUTION indicates a hazard to property including the product.

The following symbol(s) may appear on the product:

iv TLA6400 Series Product Speciﬁcations & Performance Veriﬁcation

Page 7

Service safety summary

Service safet

ysummary

Only qualiﬁe safety summary and the General safety summary before performing any service procedures.

Do not service alone. Do not perform internal service or adjustments of this product unless another person capable of rendering ﬁrst aid and resuscitation is present.

Disconnect power. To avoid electric shock, switch off the instrument power, then disconnect the power cord from the mains power.

Use care when servicing with power on. Dangerous voltages or currents may exist in this p test leads before removing protective panels, soldering, or replacing components.

To avoi

d pe rsonnel should perform service procedures. Read this Service

roduct. Disconnect power, remove battery (if applicable), and disconnect

d electric shock, do not touch exposed connections.

TLA6400 Series Product Speciﬁcations & Performance Veriﬁcation v

Page 8

Service safety summary

vi TLA6400 Series Product Speciﬁcations & Performance Veriﬁcation

Page 9

Preface

This document lists the characteristics and speciﬁcations of the TLA6400 series logic analyzers. It also includes the performance veriﬁcation procedures. Microproces

sor-related products and individual logic analyzer probes have their

own d ocumentation for characteristics and speciﬁcations.

Related documentation

Item Purpose

TLA Quick Start User Manuals

Online Help

Installation Reference Sheets High-level installation information

Installation Manuals

XYZs of Logic Analyzers

Declassiﬁcation and Securities instructions Data security concerns speciﬁc to sanitizing

Application notes

Product Speciﬁcations & Performance Veriﬁcation Procedures

TPI.NET Documentation

Field upgrade kits

Optional Service Manuals Self-service documentation for modules and

High-level operational overview

In-depth operation and UI help

Detailed ﬁrst-time installation information

Logic analyzer basics

or removing memory devices from Tektronix products

Collection of logic analyzer application speciﬁc notes

TLA Product speciﬁcations and performance veriﬁcation procedures

Detailed information for controlling the logic analyzer using .NET

Upgrade information for your logic analyzer

mainframes

TLA6400 Series Product Speciﬁcations & Performance Veriﬁcation vii

Page 10

Preface

viii TLA6400 Series Product Speciﬁcations & Performance Veriﬁcation

Page 11

Speciﬁcations

The following tables list the speciﬁcations for the TLA6400 series logic analyzers. Typical char acteristics describe typical or average performance and provide useful reference in

formation.

Speciﬁcations that are marked with the indirectly

The performance limits in this speciﬁcation are valid with these conditions:

For optimum performance using an external oscilloscope, please consult the documentation for any external oscilloscopes used with your Tektronix logic analy requirements.

)inthePerformance Veriﬁcation chapter of this document.

The instrument must be in an environment with temperature, altitude, humidity, and vibration within the operating limits described in these speciﬁca

The instrument must have had a warm-up period of at least 30 minutes.

The instrument must have been calibrated/adjusted at an ambient temperature between +18 °C and +28 °C.

zer to determine the warm-up period and signal-path compensation

tions.

symbol are checked directly (or

TLA6400 Series Product Speciﬁcations & Performance Veriﬁcation 1

Page 12

Speciﬁcations

Atmospheric characteristics

The following table lists the Atmospheric characteristics of components in the TLA6400 series logic analyzers.

Table 1: Atmospheric characteristics

eHumidity

tude

stic

Descriptio

Operating (

+5 °C to +40 1 °C (34 °F) per 300 m (984 ft) above 1500 m (4921 ft) altitude)

Nonoperating (no media in drive)

-20 °C to +60 °C (-4 °F to +104 °F), 15 °C/hr (59 °F/hr) maximum gradient

Operating (no media in drive)

20% to 80% relative humidity, noncondensing

Nonoperating (no media in drive)

8% to 80% relative humidity, noncondensing

Maxim

C (84.2 °F), derates relative humidity to approximately 22% at 50 °C (122 °F) and 10% at

+29 ° 60 °C (140 °F)

Operating

To 3000 m (9843 ft), derated 1 °C (34 °F) per 300 m (984 ft) above 1500 m (4921 ft) altitude.

operating

Non

12,000 m (39,370 ft )

Characteri

Temperature

Relativ

Alti

System characteristics

no media in CD or DVD drive)

°C (+41 °F to +101 °F), 15 °C/hr (59 °F/hr) maximum gradient, noncondensing (derated

um wet bulb temperature

Table 2: External signal interface

Characteristic Description

System Trigger Input

Input destination

Threshold voltage range (Vth)

Maximum input voltage 0 V to +5.0 V

Minimum input voltage Vth ±900 mV

Input mode

Minimum pulse width 12 ns

Active period Accepts system triggers during valid acquisition periods via real-time

TTL compatible input via rear panel mounted BNC connector

System trigger

Variablefrom0.5Vto1.5V

peak

Falling edge sensitive, latched (active low)

gating, resets system trigger input latch between valid acquisition periods

2 TLA6400 Series Product Speciﬁcations & Performance Veriﬁcation

Page 13

Table 2: External signal interface (cont.)

Characteristic Description

System Trigger Output

External Signal Input

External Signal Output

Source selection System trigger

Output levels 50 Ω back terminated TTL-compatible output

Source mode Active (true) low, falling edge latched

Active period

Output protection Short-circuit protected (to ground)

Input destinations

Threshold voltage range (Vth)

Maximum input voltage 0 V to +5.0 V

Minimum input voltage Vth ±900 mV

Input mode

Input bandwidth

Active period Accepts signals during valid acquisition periods via real-time gating.

Source selection Signal 1, 2 (high-speed)

Output modes

Level sensitive

Output levels 50 Ω back terminated TTL output

Active period

Output protection Short-circuit protected (to ground)

TTL compatible output via rear panel mounted BNC connector

≥4 V into open circuit ≥2Vinto50Ω to ground

≤0.7Vsinking10mA

Outputs system trigger state during valid acquisition period, resets system trigger output to false state between valid acquisitions via software

TTL compatible input via rear panel mounted BNC connector

Signal 1, 2 Signal 3, 4

Variablefrom0.5Vto1.5V

Active (true) low, level sensitive

Signal 1, 2 Signal 3, 4

50 MHz square wave minimum 10 MHz square wave minimum

TTL compatible outputs via rear panel mounted BNC connector

Signal 3, 4

10 MHz clock

User deﬁnable Active (true) low or active (true) high

≥4 V into open circuit ≥2Vinto50Ω to ground

≤0.7Vsinking10mA

Signal 1, 2 Signal 3, 4Output bandwidth

50 MHz square wave minimum 10 MHz square wave minimum

Outputs signals during valid acquisition periods. Resets signals to false state between valid acquisitions Outputs 10 MHz clock continuously when selected

Speciﬁcations

peak

TLA6400 Series Product Speciﬁcations & Performance Veriﬁcation 3

Page 14

Speciﬁcations

Table 2: External signal interface (cont.)

Characteristic Description

Chassis ground lug

CLK10 accur

The input bandwidth speciﬁcations only apply to signals to the External Signal input. It does not apply to round-trip signals applied to the External Signal Input and back out of the External Signal Output.

acy

Lower right side on rear panel

10 MHz ±50 PPM

Table 3: PC controller

Characteristic Description

CPU Intel Core i3-2120, 3.3 GHz, 3 M cache

DRAM

Hard disk drive

Optical drive Optical, CD-RW/DVD-R/RW

Boot from USB Instrument is capable of booting from USB

Operating system Microsoft Windows 7 Ultimate, 64-bit

2x2GBDIMM,4GBtotal DDR3, 1066 MHz, PC3-8500

500 GB or greater SATAII, 3.5-inch, 7200 RPM

DVD+R/RW, 16.7 MB/second, 650 M/8.5 GB , SATA

Table 4: External PC controller interfaces

Characteristic Description

USB ports

Front panel

Rear panel

S2 ports

3 USB 2.0

2 USB 2.0

SB 3.0

PS2 keyboard

1 1 PS2 mouse

2 (10/100/1000 Mbps)

4 TLA6400 Series Product Speciﬁcations & Performance Veriﬁcation

Page 15

Speciﬁcations

splay

y system

Internal + DVI, Internal + VGA, DVI + VGA

Resolution (Pixels) Colors Refresh Rates

2048 x 1536, maximum

Size & type 15 in. LCD

Resolutio

15.3 in. touch panel

Type Resistiv

1024 x 768

Included a ﬁeld upgrade available)

e, single point

Table 5: Displa

Characteristic Description

Dual screen & external display support

Internal di

Touchscreen

Table 6: Front-panel interface

Characteristic Description

Keypad

Special function knobs

Multi-function Knob Various increment, decrement functions dependent on screen/window

Vertical position

Vertical scale

Horizontal position

Horizontal scale

18 buttons allow user to perform the most common tasks required to operate the instrument

selected.

Scrolling and positioning dependent on display type.

Scales waveform displays only.

Scrolling and positioning dependent on display type.

Scales waveform displays only.

256, minimu

s an ordering option; available only at time of purchase (no

75 Hz

ble 7: AC power source

Characteristic Description

Mains / input voltage and frequency 100 to 240 VAC ±10%, 50 Hz to 60 Hz ±5%

ower consumption

n/Sleep indicator

On/Standby switch and indicator Front panel On/Standby switch allows users to turn the instrument on. A

00 W maximum

reen/yellow front panel LED located left of the On/Standby switch

G provides visual feedback when the switch is actuated. When the LED is green, the instrument is powered and the processor is not sleeping. When the LED is yellow, the instrument is powered, but the processor is sleeping.

soft power down is implemented so that users can turn the instrument off without going through the Windows shutdown process; the instrument powers down normally.

The power cord provides main power disconnect

TLA6400 Series Product Speciﬁcations & Performance Veriﬁcation 5

Page 16

Speciﬁcations

Table 8: Probin

Characteristic Description

Number of channels

TLA6401 34

TLA6402 68

TLA6403 102

TLA6404 136

Probe connector location

Probes user removable Remove probes by pressing button on the probe connector.

Analog outputs

Number of outputs Any four of the channels can be mapped to the four analog outputs with the appropriate

Attenuation1(Typical)

Bandwidth (Typical)

Accuracy (gain and offset)

cal)

(Typi

Chan

(Typical)

Delay time from probe tip to analog signal out (Typical)

PowerFlex

Input voltage range, dynamic

(Typical)

Input voltage range, absolute maximum (Typical)

Threshold range and step size

Threshold accuracy

(Certiﬁable parameter)

Number of thresholds

gspeciﬁcations

nel-to-channel skew

Lower righ

PowerFlex option. All four o A given input channel cannot be routed to more than one output at the same time.

10 x, 5 x

P5910 General Purpose probe

2 Ghz (-3dB) 1.5 Ghz (-3dB) 2 Ghz (-3dB)

±(80 mV + 2% of signal amplitude)

±500 ps

11.9

Standard: 4 ﬁxed channels

Options:

-2.5Vto+5V

-4.5 V to +13 V

Can be set from -2.0 V to +4.5 V in 5 mV increments

±(50 mV + 1% of the threshold voltage setting)

Each channel has a n independent threshold control.

t side of the instrument

utputs can be used at the same time.

P5934 M

Any input channel to 4 channels

ictor probe

P5960 D

MAX probe

6 TLA6400 Series Product Speciﬁcations & Performance Veriﬁcation

Page 17

Table 8: Probing speciﬁcations (cont.)

Characteristic Description

Channel-to-

channel skew

(Maximum)

Channel-to-channel skew (maximum)

P5910 gene

ral purpose probe

P5960 D-Max probe Instrument channel-to-channel skew plus ±125 ps

P5934 Mictor probe Instrument channel-to-channel skew plus ±500 ps

Channel-to-channel skew (Typical)

P5910 gen

eral purpose probe

P5960 D-Max probe Instrument channel-to-channel skew plus ±40 ps

P5934 Mictor probe Instrument channel-to-channel skew plus ±250 ps

ggable probes

Hot-plu

m probe input voltage

Minimu

Characteristics are veriﬁed only at the 10 x attenuation

±40 ps instrument only

Instrumen

±40 ps ins

Instrume

t channel-to-channel skew plus ±125 ps

trument only

nt channel-to-channel skew plus ±40 ps

Probes can be added or removed from the instrument while the instrument is turned on.

300 mV

p-p

Speciﬁcations

Table 9: Sampling speciﬁcations

cteristic

Chara

MagniVu timing

Resolution Data is synchronously sampled and stored every 40 ps in a separate high resolution memory.

Record length 128 k per channel

Minimum pulse width (Typical)

Sampling (clocking) modes Internal, External, Custom

Internal clocking

1x mode

2x mode

4x mode

Minimum pulse width (Typical)

iption

Descr

The storage speed can be changed by software to 80 ps, 160 ps, 320 ps, or 640 ps (with no loss

mory depth) so that the high resolution m emory covers more time at a lower resolution.

in me

P5910 General Purpose

pro

P5934 Mictor probe P5960 DMAX probe

250 ps 500 ps 250 ps

1.25 ns (800 MS/s) maximum clocking period on all channels

625 ps (1.6 GS/s) maximum clocking period on all channels

312.5 ps (3.2 GS/s) maximum clocking period on half channels (using 2:1 demultiplex mode)

50 ms is the slowest clocking rate. A 1–2–5 sequence is supported, but it starts with 312.5 ps, 625 ps, 1.25 ns, 2.5 ns (PowerFlex), 5 ns, 10 ns, 20 ns, 5 0 ns, etc. It is possible to use storage control and only store data when it has changed (transitional storage).

P5910 General Purpose

P5934 Mictor probe P5960 DMAX probe

probe

250 ps 500 ps 250 ps

TLA6400 Series Product Speciﬁcations & Performance Veriﬁcation 7

Page 18

Speciﬁcations

Table 9: Sampling speciﬁcations (cont.)

Characteristic Description

External clocking

External clock rate

External d

ata rate

Clocks and qualiﬁers

TLA6401 2 clocks

TLA6402 4 clocks

TLA6403

TLA6404

Data valid w indow (Setup-and-hold window)

P5910 General Purpose

, P5960 DMAX probe

probe

P5934 Mictor probe 500 ps, single channel

Data valid window (Setup-and-hold window)1(Typical)

P5910 General Purpose

be, P5960 DMAX probe

pro

Mictor probe 500 ps, single channel

Data valid window (Setup-and-hold

ndow) adjustment resolution

ta valid window (Setup-and-hold

Da window) adjustment range

If the TLA application uses Auto Deskew, add another 20 ps (one over-sampler step size) to the numbers.

333 MHz, minimum (standard instrument) 667 MHz, maximum, optional via PowerFlex)

667 Mbs, minimum (standard instrument) 1333 Mbs, maximum (optional via PowerFlex)

4 clocks, 2 qualiﬁers. Clocks can be used as qualiﬁers.

4 clocks, 4 qualiﬁers. Clocks can be used as qualiﬁers.

300 ps maximum, single channel

260 ps, single channel

20 ps

+15nsto-7.5ns

able 10: Triggering speciﬁcations

Characteristic Description

Number of independent trigger

states

Independent If/Then clauses per

16 maximum

state

Events per If/Then clause

Actions per If/Then clause

Trigger events

8 maximum

26 maximum (two counter/timers plus any 24 other resources)

Word recognizers 24

Transition recognizers 24

8 TLA6400 Series Product Speciﬁcations & Performance Veriﬁcation

Page 19

Table 10: Triggering speciﬁcations (cont.)

Characteristic Description

Range recognizers 8 maximum

There are 24 word/channel-to-channel compare recognizers. Word recognizers can be traded off to form full-width, double-bounded range recognizers. The follo wing selections are available:

24 word, 0 range 21 word, 1 range 18 word, 2 range 15 word, 3 range 12 word, 4 range 9 word, 5 range 6 word, 6 range 3 word, 7 range 0 word, 8 range

Counter/timers

Trigger event types

Trigger action types

Maximum triggerable data

rate

Trigger state machine (TSM)

ence rate

sequ

Counter/timer range

Timer clock rate

Counter/timer test latency

Range recognizers

Range recognizer channel order

Setup-and-Hold violation recognizer — Setup/Hold time range

Trigger position

Word, Group, Channel, Transition, Range, Anything, Counter Value, Timer Value, Signal, Glitch, Setup-and-Hold Violation, Snapshot

Trigger, Trigger All, Trigger Main, Trigger MagniVu, Store, Don’t Store, Start Store, Stop Store, Increment Counter, Decrement Counter, Reset Counter, Start Timer, Stop Timer, Reset Timer, Snapshot Current Sample, Go to State, Set/Clear Signal, Do Nothing

The system can trigger and track at the maximum acquisition rate.

DC to 800 MHz (1.25 ns)

ata rates of 800 Mb/s or less, the TSM evaluates one data sample per TSM clock. For

For d data rates greater than 800 Mb/s, the TSM evaluates multiple data samples per TSM clock up to the maximum acquired data rate.

2 fast (no latency) counter/timers.

imum count is 2

Max Maximum time is approximately 3.5 × 105 seconds, approximately four days Counter commands are reset, do nothing, increment, or decrement.

er command are reset, no change, start, or stop

Tim

0MHz(1.25ns)

Fast counter/timer latency is Zero clock TC latency

Double-bounded (136-channels maximum). Can be as wide as any group, but must be grouped accordingtospeciﬁed order of signiﬁcance.

From most-signiﬁcant probe group to least-signiﬁcant probe group: CK3 Q1 C3 C2 C 1 C0 Q3

2E3E2E1E0CK0Q0A3A2D3D2CK1CK2A1A0D1D0

Missing channels for instruments with fewer than 136 channels are omitted.

From 7.5 ns before to 7.5 ns after the clock edge in 20 ps increments. This range can be shifted towards the positive region by 0 ns, 2.5 ns, 5 ns, or 7.5 ns.

The main trigger position is programmable to any data sample (1.25 ns boundaries)

48–1

(including bit sign)

Speciﬁcations

TLA6400 Series Product Speciﬁcations & Performance Veriﬁcation 9

Page 20

Speciﬁcations

Table 10: Triggering speciﬁcations (cont.)

Characteristic Description

MagniVu trigger position The high resolution trigger position i s programmable within 1.25 ns boundaries and separate

from the main acquisition memory trigger position.

The MagniVu position can be set from 0% to 60% centered around the MagniVu trigger.

Storage Control (data qualiﬁcation)

All global (conditional), by state (start/stop), block, by trigger action, or transitional. Also force main preﬁll selection is available.

Table 11:

Record length speciﬁcations

Characteristic Description

Maximum

record length

64 Mb

Record length options

Standard

Options

Data vs. Time stamp vs. Violation storage

Time stamp bits and resolution

tion)

(dura

2Mb

4 Mb, 8 Mb, 16 Mb,32 Mb, 64 Mb

Enabling violation storage in either glitch (external) or Ts/Th (internal) does not impact record

lengt

s @ 20 ps

51 bit

(3.25 days)

Table 12: Symbolic support

Characteristic Description

Number of symbols or ranges Unlimited (limited by the amount of virtual memory available)

Object ﬁle formats supported IEEE695, OMF 51, OMF 86, OMF 166, OMF 286, OMF 386, COFF, Elf/Dwarf 1 and 2,

Elf/Stabs, TSF

the software development tools do not generate outputs in one of the listed formats, use TSF (Tektronix symbol ﬁle format)

Table 13: iView support

Characteristic Description

TLA-to-TDS connections for iView USB-to-USB, Trigger In, Trigger Out, Clock Out

Number of external oscilloscopes

connected to the logic analyzer

Number of external oscilloscopes

>100, please check the Tektronix Web site at www.tek.com/iview

supported

10 TLA6400 Series Product Speciﬁcations & Performance Veriﬁcation

Page 21

Speciﬁcations

Table 14: Mecha

Characteristic Description

Overall dimensions

(Typical)

Weight (Typical) Includes instrument with front cover and empty accessory pouch

nical

Dimensions are without front feet extended, front cover attached, pouch attached, nor power cord attached.

Height (with feet) 29.7 cm (11.7 in)

Width

Depth

TLA6401

TLA6402

TLA6403

TLA6404

Shipping 21.90 k g (48 lbs 4 oz)

43.7 cm (17.2 in)

38.7 cm (15.2 in)

13.52 kg (29 lbs 13 oz)

13.88 kg (30 lbs 10 oz)

14.29 kg (31 lbs 8 oz)

14.65 kg (32 lbs 5 oz)

TLA6400 Series Product Speciﬁcations & Performance Veriﬁcation 11

Page 22

Speciﬁcations

12 TLA6400 Series Product Speciﬁcations & Performance Veriﬁcation

Page 23

Performance veriﬁcation procedures

This chapter contains procedures for functional veriﬁcation, certiﬁcation, and performance veriﬁcation procedures for the TLA6400 series logic analyzers.

ou should perform these procedures once per year or following repairs

Summary veriﬁcation

Generally, y that affect certiﬁcation.

Functional veriﬁcation procedures verify the basic functionality of the instrument inputs, outputs, and basic instrument actions. These procedures include power-on diagnostics, extended diagnostics, and manual check procedures. These procedures can be used for incoming inspection purposes.

Performance veriﬁcation procedures conﬁrm that a product meets or exceeds the performance requirements for the published speciﬁcations documented in the Speciﬁcations chapter of this manual. The performance veriﬁcation procedures

y t he accuracy of an instrument and provide a traceability path to national

certif standards.

ﬁcation procedures certify the accuracy of an instrument and provide a

Certi traceability path to national standards. Certiﬁcation data is recorded on calibration data reports provided with this manual. The calibration data reports are intended to be copied and used for calibration/certiﬁcation procedures.

As you complete the performance veriﬁcation procedures, ﬁll out a calibration data report to keep on ﬁle with your instrument. A blank copy of the calibration data report is provided with this manual. The calibration data report is intended to be copied and used to record the results of the calibration/certiﬁcation procedures.

TLA6400 Series Product Speciﬁcations & Performance Veriﬁcation 13

Page 24

Performance veriﬁcation procedures

Test equipment

These procedures use external, traceable signal sources to directly test characteristics that are designated as checked this manual. Always warm up the equipment for 30 minutes before beginning the procedures.

in the Speciﬁcations chapter of

Table 15: Te

Item number description Minimum requirements Example

Logic anal

Logic analyzer probe

Precision voltage referenc generator and precision digital voltmeter

Data Timing Generator Tektronix DTG 524 with a DTGM30 Output Module

Frequency counter

Test ﬁx Accuracy

Test ﬁxture, Setup and Hold

Cable, precision 50 Ω c

In addition to the P5910 probe, you will also need the ground extender accessory to connect the ground input to the test ﬁxture.

st equipment

and

yzer

e or a DC signal

ture, Threshold

oaxial

TLA6401, T

One requir

(accurat

Frequency accuracy: <0.0025% Frequency range: 1 kHz to 100 MHz

One req

Minimum of two test ﬁxtures required Refer to Setup and Hold Test

50 Ω , 36 in, male-to-male BNC connectors

LA6402, TLA6403, or TLA6404

etowithin±5mV)

uired

P5910

Hewlett Packard 5314A

o Threshold Accuracy Test

Refer t Fixture. (See page 25.)

Fixture. (See page 26.)

Tektronix part number 012-0482-XX

Functional veriﬁcation

The following list describes the functional veriﬁcation procedures for the TLA6400 series logic analyzer.

Power-on and fan operation

Power-on diagnostics

Extended diagnostics

Power-On and fan

operation

14 TLA6400 Series Product Speciﬁcations & Performance Veriﬁcation

Complete the following steps to check the power-on and fan operation of the logic analyzer:

1. Power on the instrument and observe that the On/Standby switch illuminates.

2. Check that the fans spin without undue noise.

Page 25

Performance veriﬁcation procedures

Extended diagnostics

3. If everything i

s properly connected and operational, you should see the

modules in the System window of the logic analyzer application.

4. If there are no

failures indicated in the System window, the power-on

diagnostics pass when you power o n the instrument.

Do the following steps to run the extended diagnostics:

NOTE. Runn

ing the extended diagnostics will invalidate any acquired data. If you want to save any of the acquired data, do so before running the extended diagnostics.

Prerequisites Warm-up time: 30 minutes

Perform the following tests to complete the functional veriﬁcation procedure:

1. If you have not already done so, power on the instrument and start the logic

analyzer application if it did not start by itself.

2. Go to the System menu and select Calibration and Diagnostics.

3. Verify that all power-on diagnostics pass.

4. Click the Extended Diagnostics tab.

5. Select All Modules, All Tests, and then click the Run button on the property

sheet.

All tests that displayed an "Unknown" status will change to a Pass or Fail status depending on the outcome of the tests.

6. Scroll through the tests and verify that all tests pass.

TLA6400 Series Product Speciﬁcations & Performance Veriﬁcation 15

Page 26

Performance veriﬁcation procedures

Certiﬁcation

The system clock is checked for accuracy, and the input probe channels are checked for threshold accuracy and setup and hold acc uracy. The instrument is certiﬁable i

f these parameters meet speciﬁcations. Complete the performance veriﬁcation procedures and record the certiﬁable parameters in a copy of the Calibration D ata Report at the end of this chapter.

Performance veriﬁcation procedures

This section contains procedures to verify that the instrument performs as warranted. Verify instrument performance whenever the accuracy or function of your instrument is in question.

Tests performed

Do the following tests to verify the performance of the instrument. You will need test equipment to complete the performance veriﬁcation procedures. (See Table 15 on page 14.) If you substitute equipment, always choose instruments that meet or exceed the minimum requirements speciﬁed.

16: Parameters checked by veriﬁcation procedures

Table

Parameter Veriﬁcation method

System clock (CLK10) accuracy

shold accuracy

Thre

nnel-to-channel skew

Cha

Internal sampling period (Internal clocking) Veriﬁed indirectly by the 10 MHz system

Synchronous clock rate, minimum and

aximum (External clock rate)

Synchronous data rate, minimum and maximum (External data rate)

Setup and hold window size (data and qualiﬁers)

Counters and timers Veriﬁed by diagnostics

Veriﬁed by the 10 MHz system clock test

Veriﬁed by the threshold accuracy test. Certiﬁed by running the certiﬁcation

cedure.

pro

iﬁed indirectly by the setup and hold

Ver procedure

clock test

Diagnostics verify the clock

etection/sampling circuitry. Bandwidth is

d veriﬁed indirectly by the at-speed diagnostics, the setup and hold test, and the clock test.

Diagnostics verify the clock detection/sampling circuitry. Bandwidth is veriﬁed indirectly by the at-speed diagnostics, the setup and hold test, and the clock test.

Veriﬁed directly by setup and hold procedure

16 TLA6400 Series Product Speciﬁcations & Performance Veriﬁcation

Page 27

Performance veriﬁcation procedures

Table 16: Parameters checked by veriﬁcation procedures (cont.)

Parameter Veriﬁcation method

Maximum triggerable data rate

Trigger state machine (TSM) sequence rate Veriﬁed indirectly by at-speed diagnostics

Certiﬁable parameter

Veriﬁed indirectly by at-speed diagnostics and internal sampling period

Checking the 10 MHz system clock (CLK10)

The following procedure checks the accuracy of the 10 MHz system clock:

Equipment required Frequency counter

Precision BNC cable

Prerequisites Warm-up time: 30 minutes

1. Verify that all of the prerequisites above are met for the procedure.

2. Connect the frequency counter to the External Signal Out BNC connector

on the instrument.

3. Go to the System window and select System Conﬁguration from the System menu.

4. In the System Conﬁguration dialog box, select 10 MHz Clock from the list of routable signals in the External Signal Out selection box and click OK.

5. Verify that the output frequency at the External Signal Out connector is 10 MHz ±500 Hz. Record the measurement on a copy of the calibration data report and disconnect the frequency counter.

6. In the System Conﬁguration dialog box, reset the External Signal Out signal to None.

Threshold accuracy test

This procedure veriﬁes the threshold voltage accuracy of the logic analyzer.

Equipment required

Prerequisites Warm-up time: 30 minutes

TLA6400 Series Product Speciﬁcations & Performance Veriﬁcation 17

Precision voltage reference or a DC signal generator and precision digital voltmeter (accurate to within ±5mV)

Threshold Accuracy test ﬁxture

P5910 Logic analyzer probe

Ambient temperature must be 23 °C ±5 °C (73°F±9°F)

Page 28

Performance veriﬁcation procedures

Test equipment setup

TLA6400 setup

Connect a P5910 Threshold Accuracy test ﬁxture. If the voltage source does not have the required output accuracy, use a multimeter with the required accuracy to verify the voltage output levels speciﬁed in the procedure.

To set up the logic analyzer for this test, you must deﬁne the characteristics of the channel that you are testing, and then set the trigger parameters:

1. Open the Setup window.

a. In the Grou

(“Test” in the example).

b. Deﬁne the

c. Set the sampling to Asynchronous, 2.0 n s.

d. Set the Acquisition Length to 128K or less.

e. Set Acquire to Samples.

2. Go to the Trigger window and select the Power Trigger tab. Create a trigger

program that triggers the logic analyzer when it does not see all highs or all lows:

probe from the logic analyzer to the voltage source, using the

p column, enter a name for the probe group that you are testing

signals for the group that you are testing.

a. Click the If Then button.

b. Set the channel deﬁnition to match the ﬁgure shown. (See Figure 1.)

c. After you set the channel deﬁnitions, click OK.

18 TLA6400 Series Product Speciﬁcations & Performance Veriﬁcation

Page 29

Performance veriﬁcation procedures

Figure 1: Setting trigger parameters

TLA6400 Series Product Speciﬁcations & Performance Veriﬁcation 19

Page 30

Performance veriﬁcation procedures

Veriﬁcation procedure

Complete the fo the copy of the Calibration Data Sheet.

1. Go to the Setup voltages to 2.5 V.

2. Set the volt

3. Start the logic analyzer and verify that it does not trigger.

4. Increase the voltage in 10 mV steps, waiting at least 3 seconds between steps

to make sure that the logic analyzer continues to run without triggering. Continue u

5. Set the voltage source to 2.700 V.

6. Start the logic analyzer and verify that it does not trigger.

7. Decrease the voltage in 10 mV steps, waiting at least 3 seconds between

steps to make sure that the logic analyzer continues to run without triggering. Continue until the logic analyzer triggers and then record the voltage.

8. Add the two voltage values and divide by two. Verify that the result is

2.50 V ±75 mV. Record the voltage on the Calibration Data Sheet.

9. Go to the Setup window and set the logic analyzer threshold voltages to –2.0 V.

llowing steps to complete this procedure. Record the results on

window of the logic analyzer and set the probe threshold

agesourceto2.300V.

ntil the logic analyzer triggers and then record the voltage.

10. Repeat steps 3 through 8 for -2.200 V and -1.800 V.

11. Add the two voltage values and divide by two. Verify that the result is

-2.00 V ±70 mV. Record the voltage on the Calibration Data Sheet.

12. Repeat the procedure for each probe channel group that you want to verify.

20 TLA6400 Series Product Speciﬁcations & Performance Veriﬁcation

Page 31

Setup and hold

Performance veriﬁcation procedures

This procedure veriﬁes the setup and hold speciﬁcations of the logic analyzer.

Digital timing generator

setup

Equipment re

Prerequisi

1. Verify tha

quired

tes

Tektronix DTG 524 Data Timing Generator with a DTGM30 Output Module

Precision B

Setup and Hold test ﬁxture

Warm-up tim

NC cable

e: 30 minutes

t the digital timing generator (DTG) has been calibrated so that the

channel-to-channel skew is minimized.

2. Set up the

DTG so that a channel (CH1 for example), is set to be a clock

pattern of alternating 1 and 0 (101010… binary) starting with 1 (rising edge).

3. Set the output frequency to 250 MHz. (This may require you to set the DTG base clock to 500 MHz for this pattern to represent 250 MHz at the channel output.)

4. Set another channel of the DTG (CH2 for example) to a data pattern representing half the period of CH1 (for example 001100110011...binary,

ing with 00).

start

5. Connect the setup and hold test ﬁxtures to the DTG channels that you have set

onnect 50 Ω SMA terminations to the test ﬁxtures.

up. C

6. Connect the DTG channel that you set up as a clock to the appropriate TLA

x] input.

CK[

7. Connect the other DTG channel to two of the TLA data channels that you

nt to test.

To test other TLA data channels simultaneously and your DTG has additional

utputs available, set up those DTG channels like the ﬁrst data channel, and

o connect them to the other logic analyzer channels that you want to test. (The channels must be in the same probe, and you will need another test ﬁxture for each additional channel pair.) Otherwise, repeat the procedure for each new pair of logic analyzer channels.

8. SettheterminationtoopenoneachDTGchannel.

9. Set the DTG output voltage levels to 2.0 V High and 0.0 V Low, with no offset.

TLA6400 Series Product Speciﬁcations & Performance Veriﬁcation 21

Page 32

Performance veriﬁcation procedures

TLA6400 setup

1. Start the TLA Ap

2. Click the DM button to default the module.

3. Click the Synchronous tab and set the following parameters:

a. Clock Signal: Choose the clock that you connected the DTG output to.

b. Max Clock Ra

c. Global Threshold: Set to 500 mV.

With the 50 Ω external termination a ttached at the SMA ﬁxture end, this sets the logic analyzer threshold voltage levels to one-half the resulting terminat

4. In the Acquisition Options box, select the following:

a. Acquisition Length: 1K or greater

b. Storage Options: Normal

5. Create a new group: right click in the Group Name column.

6. Select Add Group from the pop-up window. Rename the new group Test.

7. In the

Probe Channels column, enter the names of the two adjacent data

channels that will be used to connect to CH2 of the DTG.

plication and open the Setup Window.

te: 450 MHz

ion voltage, which should be about 500 mV (not 1 V).

NOTE. These procedures test two channels. To check more than two channels, be

sure to set the group and trigger word widths to the same amount.

Trigger logic. To complete the setup, you conﬁgure a trigger to occur whenever the two data lines are neither 00 nor 11 (binary). This will capture the condition when the two data signals are 01 or 10, as they transition to their common values. To set this up, do the following:

22 TLA6400 Series Product Speciﬁcations & Performance Veriﬁcation

Page 33

Performance veriﬁcation procedures

8. Open the LA Trig states as shown. (See Figure 2.)

ger window and select the Power Trigger tab. Set up three

Figure 2: Set the trigger states

TLA6400 Series Product Speciﬁcations & Performance Veriﬁcation 23

Page 34

Performance veriﬁcation procedures

Veriﬁcation procedure

Complete the fo on the Calibration Data Sheet.

1. Set the DTG seq

2. Press the RUN button on the TLA and wait a few seconds to verify that it

does not tri

3. Starting from 0.000 ns, increase the delay of the DTG clock channel in 100 ps steps until decrease the delay in 10 ps steps to ﬁnd the trigger threshold to within 10 ps. Record this delay amount.

Note that the logic analyzer might trigger because of a glitch when you make a delay change. If the data in the waveform window is correct (all data transitioning at the same time and at the correct frequency), then ignore this "false trigger" and start the logic analyzer again.

As an alternative, you may want to run the logic analyzer in continuous loop mode if the DTG causes a false trigger on the logic analyzer e ach time you change the delay. Then observe if the data is correct in the waveform window and ig waveform window displays data that was not acquired correctly. Record this delay.

4. Add 300 ps to the delay value that you recorded in step 3 and increase the DTG clock delay to match this cumulative value. (For example, if you measured 600 ps, increase the delay to 900 ps.)

llowing steps to complete this procedure. Record the results

uencer to RUN and the outputs ON.

gger.

triggering begins to occur. When the TLA begins to trigger,

nore any false triggers. Continue increasing the clock delay until the

5. Press Run and wait a few seconds to verify t hat it does not trigger. This veriﬁes that the setup and hold window is less than 300 ps, which is the guaranteed speciﬁcation for a single channel.

To measure the actual setup and hold window size for your application, slowly decrease the clock delay in steps (waiting a few seconds between steps to verify that it does not trigger), until the logic analyzer triggers. Record this

econd value. The difference between this second value and the value that you

s measured in step 3 is the measured setup and hold window size.

24 TLA6400 Series Product Speciﬁcations & Performance Veriﬁcation

Page 35

Test ﬁxtures

This section used in the performance veriﬁcation tests.

Threshold accuracy test ﬁxture

Use this ﬁxture to gain access to the logic analyzer probe pins. The ﬁxture connects all ground pins together, and all signal pins together.

Equipment required

Build procedure

You will need the following items to build the test ﬁxture:

Item Description Example part number

Square-pin strip

Wire 20 gauge

Soldering iron and solder

Use the following procedure to build the test ﬁxture.

1. Set the square-pin strip down and lay a wire across one row of pins on one side of the insulator as shown. Leave some extra wire at one end for

nnecting to a test lead. (See Figure 3.)

includes information and procedures for building the test ﬁxtures

0.100 x 0.100, 2 x 8 contacts (or two 1 x 8 contacts )

50 W

SAMTEC part number TSW-102-06-G-S

2. Solder the wire to each pin in the row.

3. Repeat for the other row of pins.

Figure 3: Threshold accuracy test ﬁxture

TLA6400 Series Product Speciﬁcations & Performance Veriﬁcation 25

Page 36

Test ﬁxtures

Setup and hold

Equipment required

Build procedure

test ﬁxture

This ﬁxture provides square-pin test points for logic analyzer probes when they are used to probe in-line SMA connections. Note that you need at least two test ﬁxtures to co

You will need the following items to build the test ﬁxture:

Item Descriptio

SMA connec required for each ﬁxture)

Square-pin strip

SMA termination 50 Ω, ≥2 GHz bandwidth

SMA adapter

Soldering iron and solder

Use the

mplete the procedure.

tor (two

Female, PC

0.100 x 0. (or two 1 x 2 contacts )

Male-to-male Johnson part number

50 W

B mount

100, 2 x 2 contacts

following procedure to build the test ﬁxture.

Example par

SV Microwa 2985-6035, -6036, or -6037

SAMTEC part number TSW-102-06-G-S

Johnson part number 142-0801-866

142-0901-811

t number

ve part number

1. Arrange one SMA connector as shown. (See Figure 4.)

2. Align the square pins at a right angle to the connector.

Figure 4: Solder square pins to the SMA connector

3. Solder one set of square pins to the SMA ground conductor.

4. Solder the other set of square pins to the SMA center conductor.

26 TLA6400 Series Product Speciﬁcations & Performance Veriﬁcation

Page 37

Test ﬁxtures

5. Align the secon conductors of the connectors together. (See Figure 5.)

Figure 5: Solder the SMA connectors together

6. Solder the ground conductors of the SMA connectors together.

7. Attach the termination and coupler to the ﬁxture.

d SMA connector to the ﬁrst as shown and solder the center

Figure 6: Completed ﬁxture with termination and coupler

TLA6400 Series Product Speciﬁcations & Performance Veriﬁcation 27

Page 38

Calibration data report

Calibration d

ata report

Photocopy th instrument.

is table and use it to record the performance test results for your

TLA6400 test record

Instrument model number:

Serial number:

Certiﬁcate number:

Veriﬁcation performed by:

Veriﬁcation date:

Test dat

Characteristic Speciﬁcation Tolerance Incoming data Outgoing data

Clock frequency

Threshold accuracy

Setup and hold window:

10 MHz ±500 Hz

+2.5 V ±75 mV

-2 V ±70 mV

single channel ≤300 ps

(9.9995 MHz-10.0005 MHz)

(2.425 V to 2.575 V)

(-1.930 V to –2.070 V)

none

28 TLA6400 Series Product Speciﬁcations & Performance Veriﬁcation