Technical Reference
P7313
12.5 GHz Z-Activet
Differential Probe
071-1704-03
www.tektronix.com
Copyright © Tektronix. All rights reserved. Licensed software products are owned by Tektronix or its subsidiaries or
suppliers, and are protected by national copyright laws and international treaty provisions.
Tektronix products are covered by U.S. and foreign patents, issued and pending. Information in this publication supercedes
that in all previously published material. Specifications and price change privileges reserved.
TEKTRONIX, TEK, and Z-Active are registered trademarks of Tektronix, Inc.
Velcro is a registered trademark of Velcro Industries B.V.
Tip-Clip is a trademark of Tektronix, Inc.
Contacting Tektronix
Tektronix, Inc.
14200 SW Karl Braun Drive
P.O. Box 500
Beaverton, OR 97077
USA
For product information, sales, service, and technical support:
H In North America, call 1-800-833-9200.
H Worldwide, visit www.tektronix.com to find contacts in your area.
Table of Contents
General Safety Summary iii...................................
Introduction 1..............................................
Theory of Operation 3.......................................
Input Voltage Limits 3..............................................
Maximum Input Voltage 3.......................................
Operating Voltage Window 4.....................................
Differential-Mode Signal Range 4.................................
Common-Mode Rejection 4.........................................
Probing Techniques to Maximize Bandwidth 5..........................
Input Impedance and Probe Loading 6.................................
Electrical Effects of Accessories 8....................................
Reference 9.................................................
Single-Ended Measurements 9.......................................
Differential Measurements 10.........................................
Common-Mode Rejection Ratio 10.................................
Assessing CMRR Error 11........................................
Input Impedance Effects on CMRR 11..............................
Serial Bus Standards 11..............................................
Specifications 13.............................................
Warranted Characteristics 13..........................................
Typical Characteristics 14............................................
Nominal Characteristics 17...........................................
Tip-Clip Assembly Specifications 19...................................
Performance Verification 27...................................
Equipment Required 27..............................................
Special Adapters Required 29.........................................
Equipment Setup 30................................................
Output Offset Voltage 32.............................................
DC Gain Accuracy 33...............................................
Gain Check at 5X Attenuation 33..................................
Gain Check at 25X Attenuation 34.................................
Rise Time 35......................................................
Connecting to the Probe Calibration Fixture 35.......................
Rise Time Check at 25X Attenuation 37.............................
Test Record 41.....................................................
User Service 43..............................................
Probe/Adapter/Oscilloscope Compatibility 43............................
Error Condition 43..................................................
Replacement Parts 43...............................................
Preparation for Shipment 44..........................................
P7313 Z-Active Differential Probe
i
Table of Contents
List of Figures
Figure 1: Dynamic range 4....................................
Figure 2: HBW Straight Flex, 8 mil Wire Tip-Clip assembly 5......
Figure 3: Typical probe input model 6..........................
Figure 4: Symmetric coupled line 7............................
Figure 5: Transmission line equivalent 7........................
Figure 6: Lumped element equivalent 7.........................
Figure 7: Simplified model of a differential amplifier 10............
Figure 8: Typical Common-Mode Rejection Ratio (5X attenuation) 15
Figure 9: Probe and Tip-Clip dimensions 16......................
Figure 10: Z-Active probe dynamic range verses frequency
5X gain setting 17.........................................
Figure 11: Z-Active probe dynamic range verses frequency
25X gain setting 18........................................
Figure 7: TekConnect-to-SMA Adapter 29.......................
Figure 8: Probe Calibration Fixture 29..........................
Figure 9: Preliminary test setup 30..............................
Figure 10: Setup for the output offset zero test 32..................
Figure 11: DC Gain Accuracy setup 33..........................
Figure 12: Reverse the power supply polarity on the probe inputs 34.
Figure 13: Tip-Clip Ejector 35..................................
Figure 14: Probe calibration fixture and probe 36.................
Figure 15: Test system rise time setup 37.........................
Figure 16: Setting the TDR parameters 38.......................
Figure 17: Test probe rise time setup 39..........................
List of Tables
ii
T able 1: Offset ranges 9......................................
T able 3: Warranted electrical characteristics 13.................
T able 4: Typical electrical characteristics 14......................
Table 5: Typical mechanical characteristics 16....................
T able 6: Nominal electrical characteristics 17.....................
Table 7: Test equipment 25....................................
Table 8: Differential probe compatibility issues 41................
P7313 Z-Active Differential Probe
General Safety Summary
Review the following safety precautions to avoid injury and prevent damage to
this product or any products connected to it. To avoid potential hazards, use this
product only as specified.
Only qualified personnel should perform service procedures.
While using this product, you may need to access other parts of the system. Read
the General Safety Summary in other system manuals for warnings and cautions
related to operating the system.
ToAvoidFireor
Personal Injury
Connect and Disconnect Properly. Connect the probe output to the measurement
instrument before connecting the probe to the circuit under test. Disconnect the
probe input from the circuit under test before disconnecting the probe from the
measurement instrument.
Observe All Terminal Ratings. To avoid fire or shock hazard, observe all ratings
and markings on the product. Consult the product manual for further ratings
information before making connections to the product.
Do not apply a potential to any terminal, including the common terminal, that
exceeds the maximum rating of that terminal.
Do Not Operate Without Covers. Do not operate this product with covers or panels
removed.
Avoid Exposed Circuitry. Do not touch exposed connections and components
when power is present.
Do Not Operate With Suspected Failures. If you suspect there is damage to this
product, have it inspected by qualified service personnel.
Do Not Operate in Wet/Damp Conditions.
Do Not Operate in an Explosive Atmosphere.
Keep Product Surfaces Clean and Dry.
P7313 Z-Active Differential Probe
iii
General Safety Summary
Symbols and Terms
Terms in this Manual. These terms may appear in this manual:
WARNING. Warning statements identify conditions or practices that could result
in injury or loss of life.
CAUTION. Caution statements identify conditions or practices that could result in
damage to this product or other property.
Symbol on the Product. The following symbol may appear on the product:
CAUTION
Refer to Manual
iv
P7313 Z-Active Differential Probe
Introduction
This manual discusses topics not covered or otherwise mentioned briefly in the
P7313 12.5 GHz, P7380A 8 GHz, P7360A 6 GHz, and P7340A 4 GHz Z-Active
Differential Probe Family User Manual.
The following is a list of brief explanations:
H Theory of Operation — Contains probe details not mentioned in the user
manual.
H Reference — Contains information about differential measurements and how
to increase measurement accuracy.
H Specifications — Contains warranted, typical, and nominal characteristics
for the probe and probe Tip-Clip Assemblies.
H Performance Verification — Describes the procedures for verifying the
warranted specifications.
H User Service — Describes troubleshooting and probe maintenance.
P7313 Z-Active Differential Probe
1
Introduction
2
P7313 Z-Active Differential Probe
Theory of Operation
This section discusses operating considerations and probing techniques. For
more detailed information about differential measurements and common-mode
rejection ratio (CMRR), see the Reference sectiononpage9.
The P7313 Probe is optimized for high bandwidth; it is not a general purpose
probe. The probe head and tips are miniaturized for electrical characteristics and
access to dense circuitry, and must be handled carefully.
CAUTION. To prevent damage to the probe, use care when handling the probe.
Rough or careless use can damage the probe.
Input Voltage Limits
The P7313 Differential Probe is designed to probe low-voltage circuits. B efore
probing a voltage, take into account the limits for maximum input voltage, the
common-mode signal range, and the differential-mode signal range. For specific
limits, refer to page 14.
Maximum Input Voltage
The maximum input voltage is the maximum voltage to ground that the inputs
can withstand without damaging the probe input circuitry.
CAUTION. To avoid damaging the inputs of the P7313 Differential Probe, do not
apply more than ±15 V (DC + peak AC) between each input or between either
probe inputs and ground.
P7313 Z-Active Differential Probe
3
Theory of Operation
Operating Voltage Window
Differential-Mode Signal
Range
The operating voltage window defines the maximum voltage that you can apply to
each input, with respect to earth ground, without saturating the probe input circuitry.
See Figure 1. A common-mode voltage that exceeds the operating voltage window
may produce an erroneous output waveform even when the differe ntial- mode
specification is met. For specifications, refer to page 14.
The differential-mode signal range is the maximum voltage difference between
the plus and minus inputs that the probe can accept without distorting the signal.
The distortion from a voltage that is too large can result in a clipped or otherwise
inaccurate measurement. The differential-mode signal range (the probe dynamic
range) has a different value in the 5x and 25x attenuator settings, as shown in
Figure 1. For specifications, refer to page 14.
1.3 V
+4.0 V
5X
25X
Figure 1: Dynamic range
Common-Mode Rejection
The common-mode rejection ratio (CMRR) is the ability of a probe to reject
signals that are common to both inputs. More precisely, CMRR is the ratio of the
differential gain to the common-mode gain. The higher the ratio, the greater the
ability to reject common-mode signals. CMRR varies with frequency, usually
decreasing at higher frequencies. For additional information about CMRR, see
page 15.
4.0 V
-- 3 .0 V
4
P7313 Z-Active Differential Probe
Probing Techniques to Maximize Bandwidth
The bandwidth of the probe is highest when the probe is applied directly to the
circuit with the HBW Straight Flex, 8 mil Wire, Tip-Clip assembly shown in
Figure 2. This Tip-Clip assembly achieves the highest bandwidth when the
Tip-Clip lead length is trimmed to about 50 to 75 mils. However, some probing
tasks are made easier using other accessories included with the probe, particularly for probing applications when full bandwidth is not needed. See the Tip-Clip
assembly specifications starting on page 18 for the bandwidth performance of
each Tip-Clip.
Theory of Operation
Flex straight tip
Flex bent tip
Figure 2: HBW Straight Flex, 8 mil Wire Tip-Clip assembly
P7313 Z-Active Differential Probe
5
Theory of Operation
Input Impedance and Probe Loading
When you connect the probe inputs to a circuit, you are introducing a new
resistance, capacitance, and inductance into the circuit. Each input of the
differential probe has a characteristic input impedance of 50 kΩ to ground.
60 fF
3.12 pF
3.12 pF
60 fF
Input
+
Input
--
1
See the following figures for an explanation of cpl.
2
Short Tip-Clip (blue) length
38 Ω
38 Ω
37 Ω
20 fF
20 fF
37 Ω
1
Cpl
Zodd=95
Zeven=190
2
L=3.7
mm
Kodd ~ Keven ~ 1
140 Ω
50 kΩ
310 Ω
310 Ω
50 kΩ
140 Ω
Figure 3: Typical probe input model
For signals with low source impedance and frequency, the 50 kΩ input impedance on each input is large enough to prevent the inputs from loading the signal
sources. As the signal source impedance on an input increases, the more the
probe loads the source and reduces the signal amplitude. The greater the source
impedances and the higher the signal frequencies, the more you must take these
factors into account. See Figure 3.
The frequency of the signal also affects signal measurement. As the frequency of
the signal increases, the input impedance of the probe decreases. The lower the
impedance of the probe relative to that of the source, the more the probe loads
the circuit under test and reduces the signal amplitude. For graphs of input
impedance versus frequency, refer to the Tip-Clip assembly specifications
startingonpage18.
6
P7313 Z-Active Differential Probe
Cpl
ZOO= 100 Ω
ZOE= 190 Ω
L=3.7mm(air)
Figure 4: Symmetric coupled line
Z0 = ZOE= 190 Ω,
Td = 12.1 ps
Z0 = 2(ZOOZOE)/(ZOE-- ZOO) =211 Ω,
Td = 12.1 ps
Theory of Operation
Z0 = ZOE= 190 Ω,
Td = 12.1 ps
TD = 12.1 ps
(3.7 mm in air)
Figure 5: Transmission line equivalent
Cg = (C11+C12)/2
= 31.9 ff
Cg = --0.5C
= 14.4ff
12
Lp = Ls = L11=1.76nH
= 0.545 nH
M=L
12
11+C12
)/2
Cg = (C
= 31.9ff
Cg = --0.5C
= 14.4 ff
12
Figure 6: Lumped element equivalent
P7313 Z-Active Differential Probe
7
Theory of Operation
Electrical Effects of Accessories
The Tip-Clip accessories included with your probe help connect to different
types of components. The Tip-Clip accessories are designed to provide optimum
performance as a system. Each Tip-Clip accessory has distinct characteristics.
While these accessories make connections easier, be aware that the Tip-Clip
accessory you choose affects the signal you are measuring, depending on a
variety of factors, including signal frequency, source impedance, and lead length.
Refer to Specifications on page 13 for more Tip-Clip information.
8
P7313 Z-Active Differential Probe
Reference
This section contains important reference information about differential
measurements and how to increase measurement accuracy.
Single-Ended Measurements
A differential probe, for example the P7313 Differential Probe, can be used for
single-ended measurements within the limits of its dynamic and offset voltage
ranges. Single-ended probes such as the P7260 typically have a wider offset
range than corresponding differential probes (see Table 1).
Table 1: Offset ranges
Probe DC Offset, 5X Dynamic
Range, 5X
P7260 ± 5V 1.5 V
P7313 Differential Probe
+4 V, --3 V 1.25 V
PP
PP
DC Offset, 25X Dynamic
Range, 25X
± 5V 5V
+4 V, --3 V 4V
PP
PP
Differential probes are ideal for a class of single-ended measurements where the
reference voltage is not ground:
H SSTL_1,2: V
H PECL: V
TT,VREF=VDD
REF=VCC
/2
--1.3
To measure single-ended signals in this class, connect the negative input of the
P7313 Differential Probe to V
REF
.
A differential probe in these applications displays the true signal despite any AC
or DC variation in V
which is ground referenced, displays the signal plus the variation in V
from its nominal value. While a single-ended probe,
REF
REF
.
Differential probes can also be used to make ground referenced single-ended
measurements on either single-ended signals or differential signals like PCI Express or Serial ATA. To measure ground referenced single-ended signals, connect
the negative input of the P7313 Probe to ground.
Single-ended measurements on differential signals are used to measure common
mode voltage and check for differential signal symmetry.
P7313 Z-Active Differential Probe
9
Reference
Differential Measurements
A differential probe does not need to be referenced to ground. The balanced
inputs of a differential probe provide greater flexibility and performance in most
measurement applications.
Devices designed for differential measurements avoid common-mode noise
problems presented by single-ended systems. These devices include a variety of
differential probes, differential amplifiers, and isolators.
The differential amplifier (Figure 7), is used to make differential measurements
that reject any voltage that is common to the inputs and amplifies any difference
between the inputs. Voltage that is common to both inputs is often referred to as
the Common-Mode Voltage (VCM) and voltage that is different as the Differential-Mode Voltage (VDM).
Common-Mode Rejection
Ratio
Common
mode
V
CM
V
DM
2
+
V
DM
2
Differential
+
+
Differential
mode
mode
+
V
--
out
Figure 7: Simplified m odel of a differential amplifier
Differential amplifiers cannot reject all of the common-mode signal. The ability
of a differential amplifier to reject the common-mode signal is expressed as the
Common-Mode Rejection Ratio (CMRR). The CMRR is the differential-mode
gain (A
) divided by the common-mode gain (ACM). It is expressed either as a
DM
ratio or in dB.
A
DM
A
CM
CMRR =
A
DM
A
CM
dB = 20 log
10
CMRR generally is highest (best) at DC and degrades with increasing frequency.
P7313 Z-Active Differential Probe
Reference
Assessing CMRR Error
Input Impedance Effects
on CMRR
Figure 8 on page 15 shows the CMRR of the P7313 Differential Probe. This
derating graph assumes a sinusoidal common-mode signal.
A quick way to assess the magnitude of CMRR error when the common-mode
signal is not sinusoidal is to connect both leads to the same point in the circuit.
The oscilloscope displays only the common-mode component that is not fully
rejected by the probe. While this technique may not give you accurate measurements, it does allow you to determine if the magnitude of the common-mode
error signal is significant. Make the probe Tip-Clip wires the same length to
maximize the probe CMRR.
The lower the input impedance of the probe relative to the source impedance, the
lower the CMRR for a given source impedance imbalance. Differences in the
source impedance driving the two inputs lowers the CMRR. Note that single-ended measurements generally result in asymmetric source impedances which tend
to reduce the differential mode CMRR.
P7313 Z-Active Differential Probe
11
Reference
12
P7313 Z-Active Differential Probe
Specifications
The specifications in Tables 2 through 5 apply to the P7313 Differential Probe
installed on any TekConnect instrument or Tektronix 80A03 TekConnect adapter.
When the probe is used with another oscilloscope, the oscilloscope must have an
input impedance of 50 Ω. The probe must have a warm-up period of at least
20 minutes and be in an environment that does not exceed the limits described in
Table 2. Specifications for the P7313 Differential Probe fall into three categories:
warranted, typical, and nominal characteristics.
Warranted Characteristics
Warranted characteristics (Table 2) describe guaranteed performance within
tolerance limits or certain type-tested requirements. Warranted characteristics
that have checks in Table 2 are marked with the n symbol.
Table 2: Warranted electrical characteristics
Characteristic Description
n DC attenuation accuracy ±2%
n Output Zero ±3mV(+20to+30_C,+68to+86_F) (5X) ±15 mV on oscilloscope
±3mV(+20to+30_C,+68to+86_F) (25X) ±75 mV on oscilloscope
n Rise time <40 ps (probe only, HBW Straight Flex, 8 mil Wire, Tip-Clip assembly), all other Tip-Clip
assemblies are typical
Temperature Operating: 0 to +40 _C(+32to+104_F),
Nonoperating: --55 to +75 _C (--131 to +167 _F)
Humidity Operating: 0--90% RH, tested at +0 to +40 _C(+32to+104_F)
Nonoperating: 0--90% RH, tested at --55 to +75 _C (+67 to +167 _F)
1
See warning that follows.
1
WARNING. To avoid a burn hazard at high ambient temperatures, do not touch
the probe with bare hands at nonoperating temperatures above +75 _C
(+167 _F). Allow sufficient time for the probe to cool before handling.
P7313 Z-Active Differential Probe
13
Specifications
Typical Characteristics
Typical characteristics (Tables 3 and 4) describe typical but not guaranteed
performance.
Table 3: Typical electrical characteristics
Characteristic Description
Differential input resistance, DC coupled 104 kΩ ±2%
Common-mode input resistance, DC
coupled
Differential offset range -- 3 . 0 V t o + 4 V
52 kΩ ±1kΩ
Noise
Input impedance See Tip-Clip assemblies starting on page 18 for more detailed information.
Bandwidth See Tip-Clip assemblies starting on page 18 for more detailed information.
Small signal rise time See Tip-Clip assemblies starting on page 18 for more detailed information.
Common-mode rejection ratio SeeFigure8
Maximum non destructive input voltage ±15 V
Differential signal range (DC coupled)
Operating Voltage Window --3.0 V to +4.0 V at (5X or 25X)
Linearity ±0.75% over a dynamic range of --0.625 V to +0.625 V for 5X
DC offset drift 50 μV/_C (at the output of the probe)
DC voltage measurement accuracy ±〈2% of input + (2% of offset) + 50 mV + 7.5 mV) 5X
< 31 nV Hz(5X)
< 75 nV Hz(25X)
(+ 2.0dB, --3 dB) for an ambient temperature range of 20 _Cto30_C
Ambient temperature range of 20 _Cto30_C
>50dBatDC—1MHz(testedatDC)
>35 dB at 1 GHz
>20 dB at 6 GHz
>15dBat12.5GHz
(DC + peak AC)
±0.625 V at attenuation setting of 5X
±2.0 V at attenuation setting of 25X
±1.0% over a dynamic range of --2.0 V to +2.0 V for 25X
0.25 mV/_C (displayed on screen with t he TekConnect interface)
±〈2% of input + (2% of offset) + 50 mV + 40 mV) 25X
between each input or between either probe inputs and ground.
14
P7313 Z-Active Differential Probe
Differential Mode
Gain (5X)
dB
-- 1 4
-- 2 4
-- 3 4
-- 4 4
-- 5 4
Specifications
CMRR
Common Mode
Gain (5X)
-- 6 4
-- 7 4
-- 8 4
50 MHz
Note: HBW Straight Flex, 8 mil Wire, Tip-Clip assembly graph
Frequency
Figure 8: Typical Common-Mode Rejection Ratio (5X attenuation)
10 GHz
P7313 Z-Active Differential Probe
15
Specifications
Table 4: Typical mechanical characteristics
Characteristic Description
Dimensions, compensation box 107 mm × 41 mm × 26 mm (4.2 in × 1.6 in × 1.0 in)
Dimensions, probe head 19.43 mm × 3.30 mm × 7.6 mm (0.765 in × 0.130 in × 0.300 in)
Dimensions, cable length 1.2 m (47 in) (from the probe head to the compensation box)
Unit weight 1.406 kg (3.1 lbs) (probe, accessories and packaging)
3.30 mm
(.130 in)
4.77 mm
(.188 in)
7.6 mm
(.300 in)
19.43 mm
(.765 in)
124.46 mm
(.490 in)
≈0.67 mm
(≈0.026 in)
33.02 mm
(1.3 in)
89.78 mm
(3.53in)
2.03 mm
(.080 in)
26.0 mm
(1.00 in)
41.0 mm
(1.60 in)
107 mm
(4.2 in)
5.08 mm
(.20 in)
25.4 mm
(1.00 in)
3.683 mm
(0.145 in)
HBW Right-Angle, Flex
Tip-Clips
Figure 9: Probe and Tip-Clip dimensions
16
HBW Straight, Flex Tip-Clips
3.683 mm
(0.145 in)
Small Resistor, Flex
Tip-Clips, 8 mil dia wire
P7313 Z-Active Differential Probe
Nominal Characteristics
Nominal characteristics (Table 5) describe guaranteed traits, but the traits do not
have tolerance limits.
Table 5: Nominal electrical characteristics
Characteristic Description
Input configuration Differential (two inputs, + and --)
Output coupling DC
Attenuation settings 5X and 25X
Termination Terminate output into 50 Ω
Specifications
P7313 Z-Active Differential Probe
17
Specifications
Tip-Clip Assembly Specifications
Note. All specifications are typical in the
following Tip-Clip assemblies, unless otherwise indicated.
HBW Straight Flex, 8 mil wire,
Tip-Clip Assembly
Tektronix part number:
020-2639-XX (Qty 10)
020-2657-XX (Qty 5)
Bandwidth: >12.5 GHz
10/90 Rise time: <40 ps*
20/80 Rise time: <25 ps
*Guaranteed
Note: Probe response
(10/90) to a 50 ps
input step signal.
Loading: Differential Z
>200 Ω to 10 GHz
MIN
High bandwidth and good signal fidelity, ideal
for connecting to large components.
6
3
-- 0
dB
-- 3
-- 6
-- 9
-- 1 2
100 MHz 1 GHz 10 GHz
100 K
10 K
Frequency (Hz)
18
Differential
Impedance (Ohms)
1K
100 K
100 KHz 1 MHz 10 MHz 100 MHz 1 GHz 10 GHz
Frequency
Zmin > 200 Ω
P7313 Z-Active Differential Probe
HBW Right-Angle Flex, 8 mil Wire,
Tip-Clip Assembly
Tektronix part number: 020-2638-XX (Qty 10)
020-2656-XX (Qty 5)
Bandwidth: >12 GHz
10/90 Rise time: <42 ps
20/80 Rise time: <27 ps
Loading: To be announced
Specifications
Best probe loading for HBW Tip-Clip
assemblies. Using the Wire Replacement
Kit allows you the flexibility to solder
8 mil or 4 mil wires to small circuit board vias.
CAUTION. Avoid overstressing the flex by
not pushing the flex past 90°. May cause
the flex to become intermittent.
90°
Note: Probe response
(10/90) to a 50 ps
input step signal.
6
3
-- 0
-- 3
dB
-- 6
-- 9
-- 1 2
100 MHz 1 GHz 10 GHz
Frequency (Hz)
P7313 Z-Active Differential Probe
19
Specifications
Short Flex, Small Resistor,
Tip-Clip Assembly
Tektronix part number: 020-2600-XX
Bandwidth: >8.0 GHz
10/90 Rise time: <55 ps
*
20/80 Rise time: <35 ps
*
Guaranteed
Loading: Differential Z
290 Ω to 8 GHz
MIN
Best overall signal fidelity. The small
resistors are ideal for connecting to small
circuit board vias and fine pitch circuitry.
20
P7313 Z-Active Differential Probe
Medium Flex, Small Resistor,
Tip-Clip Assembly
Tektronix part number: 020-2602-XX
Bandwidth: >7.0 GHz
10/90 Rise time: <55 ps
20/80 Rise time: <35ps
Specifications
Loading: Differential Z
Good compromise between ease-of-use
and maximum performance when
attaching to smaller devices or circuit
board vias.
290 Ω to8GHz
MIN
P7313 Z-Active Differential Probe
21
Specifications
Long Flex, Small Resistor,
Tip-Clip Assembly
Tektronix part number: 020-2604-XX
Bandwidth: >6.0 GHz
10/90 Rise time: <130 ps
20/80 Rise time: <40 ps
Loading: Differential Z
8GHz
Extended reach with good step response.
Useful for connecting to hard to reach
small circuit board vias and fine-pitch
circuitry. Conveniently sized to fit between
DIMM modules. Not recommended for
signals faster than 4 GHz.
MIN
360 Ω to
22
P7313 Z-Active Differential Probe
Square Pin,
d
B
Tip-Clip Assembly
Tektronix part number: 020-2701-XX
Bandwidth: >6.0 GHz
10/90 Rise time: <70 ps
20/80 Rise time: <50 ps
Use the Square-Pin Tip-Clip assembly for
probing 0.025-in diameter square pins
spaced 0.1-in on center. Square pins are
not an ideal transmission path for high
speed electrical signals. Square pins are
not recommended for signals faster than
100 ps or 3 GHz.
Specifications
Square Pin Tip-Clip assembly measuring differential 100 ps risetime
signal with 0.34-in long square pins.
6
3
0
-- 3
-- 6
-- 9
-- 1 2
1.00E+08 1.00E+09 1.00E+10
Frequency (Hz)
Square Pin Tip-Clip assembly frequency response with 0.34-in
long square pins.
P7313 Z-Active Differential Probe
23
Specifications
Variable Spacing Tip-Clip Assembly
Tektronix part number: 020-2596-XX
Bandwidth: >8 GHz
: 10/90 <55 ps, 20/80 <35 ps
T
R
Loading: Differential Z
8GHz
Use the Variable Spacing Tip-Clip
assembly for probing test points spaced
from 0.020-in to 0.180-in apart.
Exercise care when handling the articulated pins.
MIN
220 Ω to
24
P7313 Z-Active Differential Probe
Performance Verification
The following procedures verify the warranted output offset voltage, DC
attenuation accuracy, and rise time specifications of the P7313 Differential
Probe. The recommended calibration interval is one year.
CAUTION. To avoid ESD damage to the probe, always use an antistatic
wrist strap (provided with your probe), and work at a static-approved
workstation when handling the probe.
Equipment Required
Table 6 lists the equipment required for the performance verification procedure.
The types and quantities of connectors depends on the specific equipment you
use.
Table 6: Test equipment
Description and quantity Performance requirement Recommended example
Sampling Oscilloscope Tektronix TDS8200 Series
Sampling Module 20 GHz bandwidth Tektronix 80E03 or 80E04
Pulse Generator <25 ps rise time Tektronix 80E04 TDR
Sampling Head Extender
Cable
TekConnect Probe Interface
Module with semi-rigid cable
TekConnect-to-SMA adapter See page 27 Tektronix TCA-SMA
DMM (2), with leads 0.1 mV Fluke 187 or equivalent
Dual Power Supply 5.0 VDC at 200 mA B+K Precision 1760A or
Coaxial cable
Test leads Banana plug ends, red 012-0031-XX
Test leads Banana plug ends, black 012-0039-XX
Test leads (2) Mini plunger with test clip Mueller BU-1120
1m 012-1568-00
Firmware version V2.0 and above Tektronix 80A03, with
174-4857-XX cable
equivalent
Male-to-Male BNC, 50 Ω
012-0057-XX
1
P7313 Z-Active Differential Probe
25
Performance Verification
Table 6: Test equipment (cont .)
Description and quantity Recommended example
Adapter BNC(M)-to-Minigrabbers 013-0342-XX
Adapter SMA Male-to-BNC female 015-1018-XX
Adapter SMA Male-to-Male 015-1011-XX
Feed through termination
Probe calibration fixture See page 27 067-1616-XX
Long Flex, Small Resistor,
Tip-Clip assembly
HBW Straight Flex, 8 mil
wire, Tip-Clip assembly
SMA torque wrench 5/16-in, 7 in-lb.
Performance requirement
BNC, 50 Ω ± 0.05 Ω
See page 22 020-2604-XX
See page 18 020-2639-XX
011-0129-XX
2
2
Tweezers For removing probe tips
(see page 34).
1
Nine-digit part numbers (xxx-xxxx-xx) are Tektronix part numbers.
2
Standard accessories included with the probe.
H Optional Tool. A torque wrench helps to ensure reliable connections by
meeting the nominal torque values listed in these instructions.
1
26
P7313 Z-Active Differential Probe
Special Adapters Required
Performance Verification
Some of the adapters listed in Table 6 are available only from Tektronix. These
adapters are described on the following pages.
TekConnect-to-SMA
Adapter
Probe Calibration Fixture
The TekConnect-to-SMA Adapter, Tektronix part number TCA-SMA, lets you
connect an SMA cable to a TekConnect input. See Figure 10. Connect and
disconnect the adapter the same way as you do the probe.
This adapter is an oscilloscope accessory that can be used for measurement
applications, as well as these performance verification procedures.
Figure 10: TekConnect-to-SMA Adapter
Some of the procedures in this manual use a probe calibration fixture, Tektronix
part number 067-1616-XX.
The calibration fixture provides a means to test the probe for the single-ended
rise time measurement. SMA connectors on the front and back of the fixture
allow you to apply stimulus signals to pass through the fixture for access by the
probe.
Figure 11: Probe Calibration Fixture
P7313 Z-Active Differential Probe
27
Performance Verification
Equipment Setup
CAUTION. To avoid ESD damage to the probe, always use an antistatic
wrist strap (provided with your probe), and work at a static-approved
workstation when handling the probe.
Before performing the following verification procedures in order, power off the
TDS 8200 oscilloscope.
Use the following procedure to set up and warm the equipment to test the probe.
TDS/CSA 8200 Series Oscilloscope
CH 7 and 8 (module slot)
Sampling-head module
extender cable
CH 3 and 4
(module slot)
AB
80A03
80A03 TekConnect probe
interface module
80E0X sampling
Module
P7313 Probe
80E0X sampling
Module
Figure 12: Preliminary test setup
1. Connect the 80A03 TekConnect probe interface to the channel 3 and 4 slot of
the TDS 8200 oscilloscope. See Figure 12.
2. Connect the 80E0X sampling module to the 80A03 TekConnect probe
interface. Do not attach the semi- rigid SMA cable at this time.
3. Connect the probe to one of the 80A03 TekConnect probe interface channels.
4. Connect the sampling-head module extender cable to the channel 7 and 8
slot of the TDS 8200 oscilloscope.
28
5. Connect the 80E0X sampling module to the end of the sampling module
extender cable. You may leave the sampling-head module extender cable and
module connected for the rest of the performance verification procedures.
P7313 Z-Active Differential Probe
Performance Verification
6. Turn on the oscilloscope and allow 20 minutes for the equipment to warm
up. The TekConnect Interface status LED lights green when the probe is
recognized and powered on.
7. From the Utilities menu, select Compensation, then follow the directions in
the oscilloscope display to compensate and save the compensation for
module channels 3 and 4. Complete the compensation procedure on both
Sampling modules.
8. Photocopy the test record on page 39 to record the performance test results.
P7313 Z-Active Differential Probe
29
Performance Verification
Output Offset Voltage
NOTE. Before beginning these procedures, refer to page 39 and photocopy the
test record (if you have not already done so) and use it to record the performance
test results.
Use the following procedure to test the Output Offset voltage.
1. After the probe is connected to the 80A03 module and warmed up, connect
the equipment as shown in Figure 13.
2. Use the BNC(m)-to-Minigrabber (black) Minigrabber clips to short the two
Tip-Clip leads together (See Figure 13).
TDS/CSA 8200 Series Oscilloscope
80A03
BNC-SMA
adapter
50 Ω Precision
termination
P7313 Probe
BNC cable
--
+
Long Flex, small
Resistor, Tip-Clip
assembly
Figure 13: Setup for the output offset zero test
3. Set the multimeter to read DC volts.
4. Verify that the output voltage is 0 V
±3.0 mV for both the 5X and 25X
attenuation settings.
5. Record the results on the test record.
DMM
BNC-to-dual
banana adapter
30
P7313 Z-Active Differential Probe
DC Gain Accuracy
Performance Verification
This test checks the DC gain accuracy of the probe at the 5X and 25X attenuation settings.
Gain Check at 5X
Attenuation
1. Set the probe attenuation to 5X.
2. Connect the probe with a Tip-Clip assembly to the power supply as shown in
Figure 14. Monitor the source voltage with one of the DMMs.
DMM (V in)
TDS/CSA 8200 Series Oscilloscope
+
--
Power supply
Banana
lead
red
80A03
BNC-SMA
adapter
50 Ω Precision
termination
P7313 Probe
Long Flex, Small
Resistor, Tip-Clip
black
--
+
assembly
BNC cable
Banana
lead
-- +
--
test leads (2),
w/mini plunger
BNC-to-dual
banana adapter
+
DMM (V out)
Figure 14: DC Gain Accuracy setup
3. Set the power supply to approximately +0.5 V. This represents 80% of the
4. Record the output voltage (on the second DMM) as V
5. Disconnect the test leads from the power supplies. Leave the DMM leads
6. Reverse the polarity of the voltage applied to the probe inputs by swapping
7. Record the actual source voltage (now a negative value), as V
P7313 Z-Active Differential Probe
probe dynamic range in this attenuation setting. Record this source voltage
1.
as V
in
1.
out
connected to the adapters.
both sets of banana leads at the power supply, as shown in Figure 15.
2.
in
31
Performance Verification
DMM (V in)
TDS/CSA 8200 Series Oscilloscope
80A03
BNC-SMA
adapter
50 Ω Precision
termination
P7313 Probe
Banana
lead
red
--
+
Long Flex, small
Resistor, Tip-Clip
assembly
BNC cable
--
+
Power supply
-- +
--
+
Test leads (2)
w/mini plunger
BNC-to-dual
banana adapter
Banana
lead
black
DMM (V out)
Figure 15: Reverse the power supply polarity on the probe inputs
8. Record the output voltage on the second DMM (now a negative value) as V
out
2.
32
Gain Check at 25X
Attenuation
9. Calculate the gain as follows: (V
out
1--V
2) ÷ (Vin1--Vin2).
out
10. Verify that the gain is 0.2, ±2.0%.
11. Record the calculated gain for the 5X setting on the test record.
1. Set the attenuation on the probe to 25X.
2. Repeat steps 2 through 9, but in step 3, set the power supply to 1.6 V.
3. Verify that the gain is 0.04, ±2.0%.
4. Record the calculated gain on the test record.
P7313 Z-Active Differential Probe
Rise Time
Performance Verification
This procedure verifies that the probe meets the rise time specification. Two rise
times are measured; the test system alone, and the test system with the probe
included. The probe rise time is calculated using the two measurements.
This test uses the TDR function of the 80E0X sampling module as a fast rise
time signal source. The rise time measurements are made using an 80A03
TekConnect probe interface with an 80E03 or 80E04 Sampling Head Module.
Although the following procedure assigns measurement functions to specific
oscilloscope channels, any valid channel combination can be used.
This test checks both of the probe attenuation settings.
Review Connecting to the Probe Calibration Fixture on page 33 if you have not
used the calibration fixture before.
Connecting to the Probe
Calibration Fixture
Follow these instructions to connect or disconnect the Probe Calibration Fixture.
CAUTION. To prevent damage to the probe tip when removing it from the fixture,
a Tip-Clip Ejector must be attached to the probe tip before connecting to the
calibration fixture. Removal is difficult without a Tip-Clip Ejector in place on
the probe tip. See Figure 16.
Tip-Clip
Ejector
Figure 16: Tip-Clip Ejector
1. Loosen the plastic screw and swing the retainer bar out of the way. See
Figure 17 on page 34.
2. Position the probe tip so that the Tip-Clip Ejector is visible. Note that the
3. Slide the probe tip in to the probe Tip-Clip assembly embedded in the probe
P7313 Z-Active Differential Probe
+ polarity marking goes to the signal trace on the calibration fixture.
calibration fixture. You will feel the probe tip click into place.
33
Performance Verification
P7313 Probe tip_Embedded
Tip-Clip assembly_Tip-Clip
Probe calibration fixture
(straight-through side)
Ejector is visible
Figure 17: Probe calibration fixture and probe
Screw and
retainer bar
Signal
source
50 Ω
Termination
4. Swing the retainer bar back over the probe and gently tighten the plastic
screw.
Removing the Probe Tip.
1. Loosen the plastic screw and swing the retainer bar out of the way. See
Figure 17.
2. Using tweezers, push the Tip-Clip Ejector towards the probe and away from
the embedded Tip-Clip assembly. You will feel the Tip-Clip Ejector click
past a ridge on the probe tip and the probe tip will loosen.
3. Remove the loosened probe tip from the calibration fixture.
34
P7313 Z-Active Differential Probe
Performance Verification
Rise Time Check at 25X
Attenuation
1. Connect the test equipment as shown in Figure 18. Provide support under the
80E04 Pulser to avoid stressing the connectors.
2. Connect the semi-rigid SMA connector between the 80A03 probe output and
the 80E0X module input. Provide support under the 80E04 Pulser to avoid
stressing the connectors.
NOTE. To prevent mechanical strain on the connectors, use care when working
with SMA connectors: Support equipment and use a torque wrench to tighten
connections to 7 in-lbs.
TDS/CSA 8000 Series Oscilloscope
CH 7 and 8 (module slot)
CH 4 (measurement
channel)
80A03
80E0X sampling
Module
SMA male-to-male
connector
TekConnect-to-SMA Adapter
SMA male connector
Calibration fixture
(straight--through side
80E04 TDR pulser
Figure 18: Test system rise time setup
NOTE. The 80A03 firmware version must be version V 2.0 or above. The
firmware version label is on the rear panel of the instrument.
3. Turn on Channel 4, and set the vertical scale to 50 mV/div.
P7313 Z-Active Differential Probe
Sampling module extender cable
35
Performance Verification
4. Set the Channel 8 sampling head to TDR mode:
Press the SETUP DIALOGS button and select the TDR tab. See Figure 19.
TDR tab
Enable outputs
Preset
Step polarity
Figure 19: Setting the TDR parameters
5. Set the Preset of Channel 8. The sampling module turns on a red light next
to the SELECT channel button, indicating that TDR is activated for that
channel.
TDR Preset sets Internal Clock in the Trigger menu, turns on the TDR Step
in the TDR Setups menu, turns on the channel and selects the acquisition
units in the TDR Setups menu, and sets the horizontal scale, position, and
reference.
36
P7313 Z-Active Differential Probe
Performance Verification
6. Turn off the display for Channels 3 and 8, then only Channel 4 is shown on
the screen.
7. Set trigger mode to Internal Clock.
8. Adjust the oscilloscope horizontal and vertical position controls to display a
signal similar to that shown in Figure 18.
9. Set the oscilloscope horizontal scale to 100 ps/div and center the waveform.
10. Use the oscilloscope measurement capability to display rise time. Increase
the stability of the pulse-edge measurement by using averaging, if available.
Rise time is measured from the 10% and 90% amplitude points on the
waveform. Rise time can be measured using the automatic measurement
capability of the TDS8200 series oscilloscopes. Record the system rise time
as t
This value is used to calculate both the 5X and 25X probe rise times.
s.
The following steps instruct you to assemble the test setup that includes the
probe, as shown in Figure 20. The system and probe rise time (t
measure in step 17 is used to calculate the probe rise time (t
p
) that you
s+p
)instep18.
TDS/CSA 8000 Series Oscilloscope
CH 4 (measurement
channel)
80E0X sampling
Module
50 Ω Terminations
Embedded
Tip-Clip assembly
SMA male-to-male
connector between 80E04
and calibration fixture
CH 7 and 8
(module slot)
P7313
TekConnect
80A03
Calibration
fixture
80E04 TDR
pulser
Sampling module
extender cable
Figure 20: Test probe r ise time setup
P7313 Z-Active Differential Probe
37
Performance Verification
11. Connect the probe to the 80A03 TekConnect probe interface.
12. Check that an SMA 50
Ω termination included with the probe calibration
fixture is connected to the open SMA input on the fixture.
13. Set the attenuation on the probe to 25X.
14. Connect the probe input to the probe calibration fixture as shown in
Figure 17 on page 34. Check that the TDR function is still active.
The test setup should now be connected as shown in Figure 20.
15. Adjust the vertical scale to 50 mV/div, averaging on.
16. Expand the horizontal scale to help locate the step edge, then adjust the
horizontal range to 100 ps/div while centering the edge view. For a more
stable measurement display, turn averaging on.
17. Use the oscilloscope measurement capability to display rise time. Rise time
is measured from the 10% and 90% amplitude points on the waveform.
Record the rise time as t
s+p.
18. Calculate the probe rise time using the following formula:
2
Ꭹ
tp= t
(s+p)
− t
2
s
19. Record the calculated probe rise time on the test record.
Rise Time Check at 5X
Attenuation
20. Set the attenuation on the probe to 5X.
21. Repeat steps 16 through 19 for the 5X attenuation setting.
38
P7313 Z-Active Differential Probe
Performance Verification
Test Record
Probe Model/Serial Number: Certificate Number:
Temperature: RH %:
Date of Calibration: Technician:
Performance test Minimum Results Maximum
Output offset voltage 25X
± 3mV(20_Cto30_C)
-- 3 m V +3mV
5X
± 3mV(20_Cto30_C)
DC attenuation accuracy 25X 0.0392 0.0408
5X 0.196 0.204
Rise time 25X N/A 40 ps
10--90 % 5X N/A 40 ps
-- 3 m V +3mV
P7313 Z-Active Differential Probe
39
Performance Verification
40
P7313 Z-Active Differential Probe
User Service
This section covers troubleshooting and probe maintenance.
Probe/Adapter/Oscilloscope Compatibility
The P7313 Differential Probe is designed to work with all TekConnect interface
oscilloscopes and adapters. However, there may be some cases where probe
features may not work properly.
Table 7: Differential probe compatibility issues
Symptom Likely cause
P7313 Differential Probe
does not work with an 80A03
TekConnect Probe Interface
Adapter
The LED on the 80A03 Adapter glows red, indicating an
incompatible probe.
The 80A03 Adapter requires firmware version V2.0 or above.
The firmware version label is on the rear panel of the
instrument. Contact Tektronix for information on updating the
adapter firmware.
Error Condition
Replacement Parts
The LEDs on the probe alert you to error or status conditions affecting the probe.
If the probe LEDs flash or otherwise appear to be malfunctioning, an error
condition may exist. Call your Tektronix representative for service.
When the probe is functioning correctly there is a quick flash of the LEDs on the
probe just after connecting to the oscilloscope.
There are no user replaceable parts within the probe. Refer to your product user
manual for a list of replaceable accessories for your probe.
If your probe does not meet the specifications tested in the Performance
Verification, you can send the probe to Tektronix for repair. See page 42,
Preparation for Shipment.
P7313 Z-Active Differential Probe
41
User Service
Preparation for Shipment
If the original packaging is unfit for use or not available, use the following
packaging guidelines:
1. Use a corrugated cardboard shipping carton having inside dimensions at least
2. Put the probe into an antistatic bag or wrap to protect it from dampness.
3. Place the probe into the box and stabilize it with light packing material.
4. Seal the carton with shipping tape.
5. Refer to Contacting Tektronix on the copyright page of this manual for the
one inch greater than the probe dimensions. The box should have a carton
test strength of at least 200 pounds.
shipping address.
42
P7313 Z-Active Differential Probe
Loading...