Tektronix P6960DBL, P6962DBL User Manual

xx
P6960DBL & P6962DBL High-Density Logic Analyzer Probes
ZZZ
with D-Max™ Probing Technology
Instruction Manual
There are no current European directives that apply to this product. This product provides cable and test lead connections to a test object of electronic measuring and test equipment.
Warning
The servicing instructions are for use by qualied personnel only. To avoid personal injury, do not perform any servicing unless you are qualied to do so. Refer to all safety summaries prior to performing service.
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Contacting Tektronix
Tektronix, Inc. 14200 SW Karl Braun Drive P.O . B ox 5 00 Beaverton, OR 97077 USA
For product information, sales, service, and technical support:
In North America, call 1-800-833-9200. World wi de, vis i t www.tektronix.com to nd contacts in your area.
Warranty
Tektronix warrants that this product will be free from defects in materials and workmanship for a period of one (1) year from the date of shipment. If any such product proves defective during this warranty period, Tektronix, at its option, either will repair the defective product without charge for parts and labor, or will provide a replacement in exchange for the defective product. Parts, modules and replacement products used by Tektronix for warranty work may be n the property of Tektronix.
ew or reconditioned to like new performance. All replaced parts, modules and products become
In order to o the warranty period and make suitable arrangements for the performance of service. Customer shall be responsible for packaging and shipping the defective product to the service center designated by Tektronix, with shipping charges prepaid. Tektronix shall pay for the return of the product to Customer if the shipment is to a location within the country in which the Tektronix service center is located. Customer shall be responsible for paying all shipping charges, duties, taxes, and any other charges for products returned to any other locations.
This warranty shall not apply to any defect, failure or damage caused by improper use or improper or inadequate maintenance and care. Tektronix shall not be obligated to furnish service under this warranty a) to repair damage result b) to repair damage resulting from improper u se or connection to incompatible equipment; c) to repair any damage or malfunction caused by the use of non-Tektronix supplies; or d) to service a product that has been modied or integrated with other products when the effect of such modication or integration increases the time or difculty of servicing the product.
THIS WARRANTY IS GIVEN BY TEKTRONIX WITH RESPECT TO THE PRODUCT IN LIEU OF ANY OTHER WARRANTIES, EXPRESS OR IMPLIED. TEKTRONIX AND ITS VENDORS DISCLAIM ANY IMPLIED WARRANTIES OF MERCHANTABILITY OR FITNESS FOR A PARTICULAR PURPOSE.
TRONIX’ RESPONSIBILITY TO REPAIR OR REPLACE DEFECTIVE PRODUCTS IS THE SOLE
TEK AND EXCLUSIVE REMEDY PROVIDED TO THE CUSTOMER FOR BREACH OF THIS WARRANTY. TEKTRONIX AND ITS VENDORS WILL NOT BE LIABLE FOR ANY INDIRECT, SPECIAL, INCIDENTAL, OR CONSEQUENTIAL DAMAGES IRRESPECTIVE OF WHETHER TEKTRONIX OR THE VENDOR HAS ADVANCE NOTICE OF THE POSSIBILITY OF SUCH DAMAGES.
[W2 – 15AUG04]
btain service under this warranty, Customer must notify Tektronix of the defect before the expiration of
ing from attempts by personnel other than Tektronix representatives to install, repair or service the product;
Table of Contents
Preface ............................................................................................................... v
Related Documentation ....................................................................................... v
Commonly Used Terms ...................................................................................... vi
Operating B
Product Description......................................... ................................ ................... 1
Connecting the Probes to the Logic Analyzer.............................................................. 6
Connecting the Probes to the Target System. .................................. ............................. 7
Dressing the Probe Cables ................................................................................... 12
Storing the Probe Heads . ................................ .................................. .................. 13
Referen
Designing an Interface Between the Probes and a Target System..... ................................ .. 15
Board Design.................................................................................................. 18
Probe Footprint Dimensions ................................................................................. 23
Other Design Considerations .......... ................................ ................................ ...... 24
Probe Pinout Denition and Channel Assignment . ... ... . ... ... . ... ... . ... ... . ... ... . ... . .. . ... .... ... . .. 25
ications ............................ ................................ .................................. ........ 31
Spec
Mechanical and Electrical Specications ................ ................................ .................. 31
Maintenance........................................................................................................ 33
Probe Calibration ......... ................................ ................................ .................... 33
Functional Check ............................................................................................. 33
Inspection and Cleaning...................... .................................. .............................. 33
Se
Repackaging Instructions .......... ................................ ................................ .......... 35
Replaceable Parts.................................................................................................. 37
Parts Ordering Information .................................................................................. 37
Using the Replaceable Parts List............................................................................ 38
Index
asics.................................................................................................... 1
ce ........................................................................................................... 15
rvice Strategy......................................... ................................ ...................... 34
P6960DBL & P6962DBL High-Density Logic Analyzer Probes Instruction Manual i
Table of Contents
List of Figure
Figure i: Differential input amplitude . . ... .... ... . ... ... . ... ... . ... . .. . ... . ... ... . ... ... . ... ... . ... . .. . ... . ... .. vi
Figure ii: F
Figure iii: Probe example.. ... . ... ... . ... ... . ... ... . ... . .. . ... .... ... . ... ... . ... ... . ... ... . ... ... . ... ... . ... .... . viii
Figure 1: P6960DBL High-Density probe with D-Max probing technology ................................ 2
Figure 2: P6962DBL High-Density probe with D-Max probing technology ................................ 4
Figure 3: Connecting the probes to the logic analyzer ...................... ................................ ... 6
Figure 4: Installing the probe retention a ssembly.. ... . ... ... . ... ... . ... . .. . ... . ... ... . ... ... . ... .... ... . ... ... . 8
Figure 5:
Figure 6: Connecting the probes to the target system ............... .................................. ........ 10
Figure 7: Proper dressing of the probe cables .................... ................................ .............. 12
Figure 8: Protecting the probe heads.......... ................................ .................................. 13
Figure 9: P6960DBL/P6962DBL probe dimensions .......................................................... 18
Figure 10: Retention assembly dimensions..................................................................... 19
Figur
Figure 12: Side-by-side layout................................................................................... 20
Figure 13: End-to-end layout ...... ................................ ................................ .............. 20
Figure 14: Signal routing on the target system................................................................. 21
Figure 15: High-Density probe load model................. ................................ .................... 22
Figure 16: Probe footprint dimensions on the PCB.............. ................................ .............. 23
gure 17: Optional Via-in-Pad placement recommendation ................................. ................ 24
Fi
Figure 18: P6960DBL single-ended PCB footprint pinout detail................ ............................ 25
Figure 19: P6962DBL single-ended PCB footprint pinout detail................ ............................ 27
Figure 20: Replacing the cLGA clip ................ .................................. .......................... 34
Figure 21: P6960DBL High-Density probe accessories .................... ................................ .. 39
Figure 22: P6962DBL High-Density probe accessories .................... ................................ .. 40
Figure 23: Optional accessories.................... ................................ .............................. 41
lying Lead Set .... .................................. ................................ ................. vii
Proper handling of the interface clip.................................................................. 9
e 11: Keepout area .......................................................................................... 19
s
ii P6960DBL & P6962DBL High-Density Logic Analyzer Probes Instruction Manual
List of Tables
Table 1: Logic analyzer clock and qualier availability . . ... ... . ... . ... ... . ... . ... ... . ... .... ... . ... ... . ... . . 16
Table 2: Cha
probe ........................................................................................................... 25
Table 3: Channel assignment for a P6962DBL single-ended data, differential clock logic analyzer
probe ........................................................................................................... 28
Table 4: Mechanical and electrical specications.................. ................................ ............ 31
Table 5: Environmental specications .......................... .................................. .............. 32
Table 6: P
Table 7: P6960DBL replaceable parts list ...................................................................... 39
Table 8: P6962DBL replaceable parts list ...................................................................... 40
Table 9: P696xDBLSeries Probes optional accessories....................................................... 41
nnel assignment for a P6960DBL single-ended data, differential clock logic analyzer
arts list column descriptions.......................... ................................ ................ 38
Table of Contents
P6960DBL & P6962DBL High-Density Logic Analyzer Probes Instruction Manual iii
Table of Contents
iv P6960DBL & P6962DBL High-Density Logic Analyzer Probes Instruction Manual
Preface
Related Documentation
This document provides information on using and servicing the P6960DBL & P6962DBL logic analyzer probes.
The following table lists related documentation available for your instrument. The documenta
tion is available on the TLA Documentation CD and on the Tektronix
Web site www.Tektronix.com/manuals.
For docum
entation not specied in the table, contact your local Tektronix
representative.
Related Documentation
Item Purpose Location
vel operational overview
TLA Quick Start User Manuals
Online Help
Installation Quick Reference Cards High-level installation information
Installation Manuals
XYZs of Logic Analyzers
Declassication and Securities instructions
High-le
In-depth operation and UI help
Detailed rst-time installation information
Logic analyzer basics
Data security concerns specicto sanitizing or removing memory devices from Tektronix products
Application notes
Product Specications & Performance Verication Procedures
TPI.NET Documentation
Field upgrade kits
Optional Service Manuals Self-service documentation for modules
Collection of logic analyzer application
cic notes
spe
TLA Product specications and performance verication procedures
tailed information for controlling the
De logic analyzer using .NET
Upgrade information for your logic analyzer
and mainframes
P6960DBL & P6962DBL High-Density Logic Analyzer Probes Instruction Manual v
Preface
Commonly Used
Compression Footprint
Differential Input
Amplitude Denition
Terms
cLGA
Refer to the following list of commonly used terms throughout the manual.
An acronym for compression Land Grid Array, a connector that provides an electrical connection between a PCB and the probe input circuitry.
A connectorless, solderless contact between your PCB and the P69XX Series probes. Connection is obtained by applying pressure between your PCB and the probe through a cLGA c-spring.
For differential signals, the magnitude of the difference voltage Vmax-Vmin (and Vmin-Vmax) must be greater than or equal to 150 mV. Refer to the following gure.
Figure i: Differential input amplitude
ademark name that describes the technology used in the P69xx Series
D-Max probing technology
Flying Lead Set
vi P6960DBL & P6962DBL High-Density Logic Analyzer Probes Instruction Manual
Tr high-density logic analyzer probes.
A lead set designed to attach to a P6960 Probe to provide general-purpose probing capability. Refer to the following gure.
Figure ii: Flying Lead Set
Preface
Functional Check
Procedure
Keepout
Area
Module
Module End
PCB
be
Pro
Functional check procedures verify the basic functionality of the probes by conrming that the probes recognize signal activity at the probe tips.
An area on a printed circuit board in which component, trace, and/or via placement may be restricted.
The unit that plugs into a mainframe that provides instrument capabilities such as logic analysis.
The end of the probe that plugs into the module unit.
An acronym for Printed Circuit Board; also known as Etched Circuit Board (ECB).
The device that connects a module with a target system. Refer to the following gure.
P6960DBL & P6962DBL High-Density Logic Analyzer Probes Instruction Manual vii
Preface
Figure iii: Probe example
Probe Adapter
Probe Head
SMT Kli
pChip
A device that connects the LA module probe to a target system.
The end of the probe that connects to the target system or probe adapter.
An interface device for attaching logic analyzer probes to components with a maximum lead diameter of 2.413 mm (0.095 in) and stackable on lead centers of 1.27 mm (0.050 in).
viii P6960DBL & P6962DBL High-Density Logic Analyzer Probes Instruction Manual
Operating Basics
Product Description
This section provides a brief description of the Tektronix P696xDBL Series High-Density Logic Analyzer Probes, information on attaching color-coded probe labels, and p the target system.
The P696xDBL Series Probes connect TLA7BBx Series Logic Analyzer modules to a target system.
The P6960DBL probe consists of 34 single-ended channels in one probe head, distributed over two 34-channel module end connectors.
The P6962DBL probe consists of 34 single-ended channels in one probe head, distributed over four 17-channel module-end connectors.
robe and adapter connection instructions from the logic analyzer to
Attaching Probe Labels
If you p color-coded labels. You will nd instructions on how to attach the labels to the probes on a color reference card that is included with the probes:
urchase probes for the logic analyzer module, you will need to apply the
P6960DBL High-Density Single-Ended Logic Analyzer Probe with D-Max Probing Technology Labeling and Installation Instructions
P6962DBL High-Density Single-Ended Logic Analyzer Probe with D-Max Probing Technology Labeling and Installation Instructions
P6960DBL & P6962DBL High-Density Logic Analyzer Probes Instruction Manual 1
Operating Basics
P6960DBL High-Density
Probe
The P6960DBL pr D-Max probing technology. (See Figure 1.) The probe consists of one probe head that has 34 channels (32 data and 2 clock/qual). The P6960DBL probe double-probes the signals from the device under test. The probe uses double back end connectors to the TLA logic analyzer module for double probing the signals with a single probe head.
obe is a 34-channel, high-density connectorless probe with
Figure 1: P6960DBL High-Density probe with D-Max probing technology
2 P6960DBL & P6962DBL High-Density Logic Analyzer Probes Instruction Manual
Operating Basics
The following l
Differential or single-ended clock and qualication inputs
Single-ended data inputs
cLGA contact eliminates need for built-in connector
Footprint supports direct signal pass-through
Supports PCB thickness of 1.27 mm to 6.35 mm (0.050 in to 0.250 in)
Consists o clock/quals), and two 34-channel module end connectors
Narrow 34
2X mode, (for example, 1:2 demultiplexing) uses one-half of the probe head. For appl might be a better alternative. With the P6962DBL probe, 2X sampling speed can be achieved without giving up half the channels at the probe tip.
Color-coded keyed attachment
–1.25
–1.0 V to +2.25 V threshold range
ist details the capabilities and qualities of the P6960DBL probe:
f one independent probe head of 34 channels (32 data and 2
-channel probe head makes for easier placement and layout
ications requiring 2X mode for faster sampling, the P6962DBL probe
V to +2.5 V input operating range
200 mV minimum single-ended signal amplitude
100 mV amplitude each side minimum differential signal
Minimal loading of 0.7 pF at 11.7 kto ground
Operation in normal or inverted p olarity is acceptable (clock only)
y common mode voltage is acceptable, as long as the maximum positive
An voltage does not exceed +2.5 V and the maximum negative voltage does not exceed –1.25 V
NOTE. For P6960DBL probe routing and pinout information, refer to the gure.
(See Figure 14 on page 21.)
P6960DBL & P6962DBL High-Density Logic Analyzer Probes Instruction Manual 3
Operating Basics
P6962DBL High-Density
Probe
The P6962DBL pr D-Max probing technology. (See Figure 2.) The probe consists of one probe head that has 34 channels (32 data and 2 clock/qual), distributed over 4 module-end connectors with 17 channels each.
The P6962DBL probe is optimized for use with the TLA7BB4 logic analyzer module when running in 2X Demux (half channel acquisition) mode. The probe uses double back end connectors to the TLA logic analyzer module for double probing the signals with a single probe head.
obe is a 34-channel, high-density connectorless probe with
re 2: P6962DBL High-Density probe with D-Max probing technology
Figu
4 P6960DBL & P6962DBL High-Density Logic Analyzer Probes Instruction Manual
Operating Basics
The following l
Differential or single-ended clock and qualication inputs
Single-ended data inputs
cLGA contact eliminates need for a built-in connector
Footprint supports direct signal pass-through
Supports PCB thickness of 1.27 mm to 6.35 mm (0.050 in to 0.250 in)
Consists o clock/quals), and four 17-channel module end connectors.
Narrow 34
Optimized for 2X mode (1:2 demultiplexing) to minimize board real estate. 2X mode i
Color-coded keyed attachment
–1.25 V to +2.5 V input operating range
–1.0 V to +2.25 V threshold range
200 mV minimum single-ended signal amplitude
ist details the capabilities and qualities of the P6962DBL probe:
f one independent probe head of 34 channels (32 data and 2
-channel probe head makes for easier placement and layout
s also called half-channel mode.
100 mV amplitude each side minimum differential signal
mal loading of 0.7 pF at 11.7 kto ground
Mini
Operation in normal or inverted p olarity is acceptable (clock only)
Any common mode voltage is acceptable as long as the maximum positive voltage does not exceed +2.5 V and the maximum negative voltage does not
ceed –1.25 V.
ex
NOTE. For P6962DBL probe routing and pinout information, refer to the gure.
(See Figure 19 on page 27.)
P6960DBL & P6962DBL High-Density Logic Analyzer Probes Instruction Manual 5
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