High Performance
Differential Probes
P7350 • P7330 • P6330
Features & Benefits
z
<100 ps Risetime (P7350 Guaranteed)
z
5 GHz to 3.5 GHz Bandwidths (Typical)
z
Low Input Capacitance:
z
<0.3 pF Differential (P7350 Typical)
z
≥
60 dB (1000:1) Common Mode Rejection Ratio
(CMRR) at 1 MHz (P7330,
z
Small Probe Head Allows Easy Probing of SMDs
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P7350, P7330 TekConnect® Interface (can be
P6330
used with CSA/TDS8000 Series via 80A03
TekConnect Interface Adapter)
z
P6330
TEKPROBE II® BNC interface (connects
to TEKPROBE II BNC interface on TDS series
oscilloscopes. Use 1103 TEKPROBE® power
supply to interface with other BNC instruments)
typical)
Applications
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Communications (Gigabit Ethernet, Fibre
Channel, InfiniBand)
z
Semiconductor Characterization & Validation
(PCI-Express, Serial ATA, IEEE 1394, USB 2.0,
RAMBUS, DDR)
z
Disk Drive Design
Tektronix’ proven expertise in probes brings you the
highest fidelity in high-speed differential probing. The
P7350, P7330,
P6330
high BW differential probes offer
excellent signal fidelity, meeting the needs of engineers
in design & debug of technologies with very fast clock
speeds and edge rates. They provide high-bandwidth,
low circuit loading, low noise differential probing
solutions for high-speed circuit designers.
P7350
The P7350 improves usability with variable spacing and
solder down capability, and a small form factor for ease
of use on densely packed circuit boards with difficultto-reach probe points. It employs the patented
TekConnect® Interface, which preserves signal integrity
to 10 GHz and beyond to meet present and future
p
bandwidth needs.
P7330 and P6330
The P7330 and
P6330
enable users to make time
domain or frequency domain measurements on high
bandwidth signals commonly found in digital IC
designs, communication applications, and disk drive
applications. The P7330 and
P6330
provide highbandwidth, low circuit loading, and low noise
differential probing solutions. The small probe head
geometry and assorted probe tip accessories allow these
robes to easily accommodate manual probing of
surface mount devices.
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