Tektronix DSA8200 DATASHEET

Digital Serial Analyzer Sampling Oscilloscope
DSA8200 Data Sheet
Jitter, Noise, BER, and Serial Data Link Analysis
Measures and Separates Deterministic Data-dependent Jitter from Random Jitter
tical Noise, Separating Deterministic Data-dependent
er for Fixture De-embedding, Linear Filtering
at 50 GHz
RMS
rd
party Software
Features & Benets
State-of-the-Art Sampling Oscilloscope for Communication Signal Analysis, TDR / TDT / Serial Data Network Analysis, Acquisition, and Measurements of Repetitive Ultrafast Signals
Acquisition of Spread Spectrum Clocking (SSC) Signals
Industr Increased Flexibility and Throughput Four Color-graded, Variable Persistence Waveform Databases Measurement System with Over 100 Automated Measurements Complete Suite of Communications Measurements includes Both Types of OMA, SSC Pro le, and Many Others
ted ITU/ANSI/IEEE Mask Testing
Automa Masks and Measurements for SONET/SDH, FC, Ethernet, and Other Standards Built-in Mask Updates can be Loa ded from Factory-supplied File Mask Margin Testing for Guard Banding Production Testing
Acquisition Modules
Fully Integrated Multirate Optical Modules Optical Modules up to 80 GHz 80C10B
ccuracy "ER Calibrated" Measurement Available in Some
High-a Modules Electrical Modules up to 70+ GHz Bandwidth and 5 ps Measured Rise Time (10-90%) Flexible Rate Clock Recovery Clock Recovery with SSC (Spread Spectrum Clocking) Support
able
Avail
Measures Ver Noise from Random Noise Highly Accurate BER and Eye Contour Estimation, Support for DDPWS FFE/DFE Equalization, Transmitter Equalization Channel Emulation for Channels with >30 dB of Loss Linear Filt
TDR (Time Domain Reectometry)
Up to 50 GHz TDR Ba ndwidth with 15 ps Reected Rise Time and 12 ps Incident Rise Time Lowest Noise for Accurate Repeatable TDR Measurement R esults – 600 μV Independent Sampler Deskew ensures Easy Fixture and Probe De-embedding Industry’s Only Mainframe to Accommodate up to Four True-differential TDR or Electrical Channel Pairs for Increased System Versatility
S-parameters Measurements
Up to 50 GHz Differential, Single Ended, Mixed Mode; Insertion, Return Loss, Frequency Domain Crosstalk PCI Express, Serial ATA, Inniband, Gigabit Ethernet Manufacturing, and Standard Compliance Testing for Gigabit Signal Path and Interconnects – Including Eye Mask Tests Intuitive, Easy, and Accurate for S erial Data, Gigabit Digital Design, and Signal Integrity Fast and Accurate Automated Multiport S-parameter Measurements with Command Line Interface
Industry’s Best Standard Time-base Jitter Perform ance, 800 fs
Industry-leading Time-base Jitter Performance, <200 fs with Phase Reference Mode
Fast Acquisition Rate and High Throu ghput
True-differential Remote Sampler enabling Placement Near DUT for Superior Signal Fidelity
FrameScan™ Acquisition Mode with Eye Diagram Averaging:
Isolate Data-dependent Faults Examine Low-power Signals
MS Windows XP Operating System
ced Connectivity to 3
Advan
*1Available
RMS
RMS
Data Sheet
Applications
Design/Verication of Telecom and Datacom Components and Systems
Manufacturing/Testing for ITU/ANSI/IEEE/SON ET/SDH Compliance
High-performance True-differential TDR Measurements
Advanced Jitter, Noise, and BER Analysis
Impedance Characterization and Network A nalysis for Serial Data Applications including S -parameters
Channel and Eye Diagram Simulation and Measurement-based SPICE Modeling
*1Typical, with the Phase Reference module, some conditions apply. Without the module, the jitter is
<800 fs
(typical).
RMS
Superior Performance with Extraordinary Versatility
For developing today’s high-speed serial devices, the DSA8200 D igital Serial Analyzer sampling oscilloscope is the most versatile tool for communication, computer and consumer electronics gigabit transmitter and signal path characterization, and compliance verication. With exceptional bandwidth, signal delity, and the most extensible modular architecture, the DSA8200 provides the highest performance TDR and inte rconnect analysis, most accurate ana lysis of signal impairments, and BER calculations for current and emerging serial data technology.
The DSA8200 provides unmatch ed measurement system delity with ultra-low jitter oor that ensures the most accurate acquisition of high-speed signals. You get advanced analysis benets from the 200 fs acquisition jitter with the Phase Reference module. And in another step forward for a sampling oscilloscope, with the help of the Phase R efe rence module the DSA8200 can acquire and measure SSC (Spread Spectrum Clocking) signals.
The multiprocessor architecture, with dedicated per-slot digital signal processors (DSPs), provides fast waveform acquisition rates, reducing the test times necessary for reliable characterization and compliance verication.
The DSA8200’s versatile modular architecture supports a large and growing family of plug-ins enabling you to congure your measurement syst a wide variety of electrical, optical, and accessory modules that best suit your application now an d in the future. With 6 module slots, the DSA8200 can simultaneously accommodate a Clock Recovery module, a pre cision Phase Reference modu le, and multiple acquisition modules, electrical or optical, so you can match system performance to your evolving needs.
Featuring industry-leading signal delity, the family of electrical modules includes bandwidth performance from 12 GHz to 70+ GHz. Two
ferential Time Domain Reecto meter (TDR) modules, with remote
true-dif
em with
samplers, offer up to 50 GHz bandwidth and 15 ps reected rise time and 12 ps incident rise time. The family of low-noise variable-bandwidth electrical mod remote samplers, featuring 450 μV
ules provides the industry’s best noise perfo rmance with
noise at 60 GHz, and 300 μV
RMS
RMS
at
30 GHz.
DSA8200 optical modules provide complete optical test solutions with superior system delity from 125 Mb/s to 43 Gb/s and beyond. The modules cover a range of waveleng ths for both single- a nd multi-mode bres. Each module can be option ally congured with a number of selectable data rate lters, optical reference receivers (ORR), and/or a full bandwidth path. The 80C07B, 80C08
C, and 80C11 can be congured with a number o f available exible integrated clock recovery options. The 80C12 Multirate mod ule clock recovery support is achieved with an electrical output for use with the 80A05 or 80A07 Electrical Clock Recovery modules.
The DSA8200’s popular Fram eScan™ acquisition m ode can be used with patterns from DUTs, BERTs, and other sources, to isolate pattern-dependent e ffects in transmitters or show the bit sequence preceding a mask violation. FrameScan automatically sequences the time base so that e
ach bit of the data s tream is acquired in time order. When used in combination with mask-testing conditional acquisition features of the DSA8200, such as stop after mask hits, FrameScan can automatically identify at which bit a pattern-dependent failure occurred.
In addition, specialized modules supporting features such as single-ended and differential electrical clock recovery, electrostatic protection for the TDR, and connectivity to the popular TekConnect probing system brings you the performance of Tektronix state-of-the-art probes for high-impedance and
al probing. Low-impedance probes for 50 probing an d for TDR
differenti probing are also available.
Jitter, Noise, BER, and Serial Data Link Analysis
High-speed serial data link m easurements and analysis are supp orted with three software solution s: 80SJARB, 80SJNB Essentials,and80SJNB
Advanced.
80SJARB is a basic jitter measurement tool capable of measuring jitter on
any wavefo the amount of analysis possible so only the simplest decomposition can be used; repeatability is pattern de pendent.
80SJNB Essentials offers complete analysis of jitter, noise, and BER, with decomposition of components for clear understanding of a signal’s problems and margins. The acquisition methodology requires a repetitive pattern. Both accuracy and repeatability are improved relative to 80SJARB since the tool has access to the complete signal pattern.
80SJNB Advanced ad ds features to 80SJNB Essentials for Serial Data Link Analysis – de-embedding of xture, channel emulation, FFE/DFE equaliza
rm – random or repetitive. The simplicity of acquisition limits
tion, pre-emphasis/de-emphasis.
2 www.tektronix.com
TDR and electrical modules with fully integrated remote sampler.
Digital Serial Analyzer Sampling Oscilloscope — DSA8200
TDR (Time Domain Reectometry)
The DSA8200 is the industry’s highest performance fully integrated Time Domain Reecto metry (TDR) measurement system. Offering true-differential TDR measurements up to 50 GHz bandwidth with 15 ps reected rise time and 12 ps incident rise time, you are able to keep pace with today’s most demanding Serial Data Network Analysis (SDNA) requirements.
The new 80E10 and 80E08 TDR modules feature a fully integrated independent dual-channel 2-meter remote sampler system to minimize xturing and assure optimal system delity. Independent sampler deskew ensures fast and easy xture and probe de-embedding. The user can
erize differential crosstalk by using TDR steps from a differential
charact module to drive one line pair while monitoring a second line pair with a second differential module.
Small form factor remote sampler enables placement near DUT assuring optimal signal delity.
The DSA8200 is the industry’s most versatile TDR measurement system, accommodating up to 4 dual-channel true-differential TDR modules for fast accurate
The P80318 True-differential TDR probe and P8018 Single-ended Passive Handheld board impedance and electrical signal characterization. The P80318, an 18 GHz 100 input impedance differential TDR hand probe , enables high-delity impedance measurements of d ifferential transmission lines. The adjustable probe pitch enables a wide variety of differential line spacing and impedances. The P8018 is a 20 GHz Single-ended Passive Handheld TDR prob probes but are especially designed to work with the 80A02 for the control of EOS/ESD protection.
multilane impedance characterization.
TDR probe provide high-perform ance probing solutions for circuit
e. Both the P80318 and P8018 can be used as stand-alone
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Data Sheet
Gigabit Signal Path Characterization and Analysis – Serial Data Network Analysis (SDNA)
As clock speeds and rise times of digital circuits increase, interconnect signal integrity dramatically affects digital system performance. Accurate and efcient Serial Da ta Network Analysis (SDNA) of the signal path and interconnects in time and frequency domains is critical to predict signal losses, jitter, crosstalk, terminations and ringing, digital bit errors, and eye diagram degradation, ensuring reliable system operation.
Tektronix offers several true-differential TDR modules, which in co mbination with IConnect –70 dB of dynamic range. This performance assures accurate repeatable measurement in serial data analysis, digital design, signal integrity, and electrical compliance testing applications.
The table below summarizes th e S-parameter measurement bandwidth performance when IConnect and the true-differential TDR modules are used in combination.
®
software, allow S-parameters measurements with up to
entify the exact location of faults with the 80E10’s sub-millimeter resolution and
Quickly id IConnect T
rue Impedance Prole.
TDR Module
80E10 80E08 80E04
S-parameter Measurement Bandwidth Performance
50 GHz 30 GHz 20 GHz
With the long record length acquisitions, IConnect®provides great exibility for obtaining the desired freq uency range and frequency st ep when performing S-parameter measurements. Up to 1,000,000 points can be acquired*
When you employ IConnect
2
.
®
Signal Integrity TDR and S-parameter software with the DSA8200 you have an efcient, easy-to-use, and cost-effective solution for measurement-based performance evaluation of multi-gigabit interconnect links and devices, including signal integrity analysis, impedance, S-parameter, and eye-diagram tests, and fault isolation. IConnect can help you complete interconnect analysis tasks in minutes instead of days, resulting in faster system design time and lower design costs. IConnect also enables impedance, S-parameters, and eye-diagram compliance testing as required by many serial data standards, as well as full channel analysis, Touchstone (SnP) le output, and SPICE modeling for gigab it interconnects.
*2Long record lengths are supported only on DSA8200, CSA8200, TDS8200, CSA8000, and TDS8000
platforms.
Failure Analysis – Quickly Identify Fault Location
The 80E10 provides superior resolution enabling the fastest and most efcient fault isolation in package, circuit board, and on-chip failure analysis applications.
Advanced Communication Signal Analysis
ally designed for ultra high-performance optical and electrical serial
Specific data applications, the DSA8200 is the ideal tool for design characterization and validation, as well as manufacturing test of datacom and telecom components, transceiver suba sse m blies, and transmission systems. The DSA8200 generates measurement results, not just raw data, with time and amplitude histograms, mask testing, and statistical measurements. It
s a communications-tailored measurement set that includes jitter,
provide noise, duty cycle, overshoot, undershoot, OMA, extinction ratio, Q-factor, mean optical power, and amplitude. In add ition, you can do mask testing of SONET/SDH, 100 Gigabit (4× 25), 10 Gigabit, Gigabit Ethernet, and other electrical and optical standards compliance verication. Color grading and grayscale grading of waveform data adds a third dimension, sample density,
signal acquisitions and analysis to provide visual insight. In addition,
to your the variable persistence database feature enables exact data aging to all of the functions, and facilitates eye measurements on DUTs under adjustment.
4 www.tektronix.com
Digital Serial Analyzer Sampling Oscilloscope — DSA8200
OpenChoice Software Enables Familiar Tools to Extend Your Measurement System
The DSA8200 provides an open Windows environment offering ne w levels of data analysis on the instrument using your favorite commercially available third-party software packages. Additionally, TekVISA™, a standard software accessory, al applications (such as LabVIEW, LabWindows, Visual Basic, Microsoft Excel, C, etc.) running on the instrument or on an external PC workstation’s network connected to the instrument without the need of a GPIB hardware interface. Plug-and-play drivers for LabVIEW and other programs are also supplied.
The DSA8200 combines the familiarity of Microso ft’s Windows XP operating system with world-class waveform acquisition technology. This platform provides a wi interfaces, including: GPIB, parallel printer port, RS-232-C, USB serial ports, and an Ethernet LAN connection. In addition, the platform includes a DVD-CD/RW combo drive and removable hard drive for storage of waveforms, setups, and analysis results.
lows the instrument to be placed under the control of software
de array of standard instrumentation and communications
155 Mb/s to 12+ Gb/s Optical Test
Tektronix optical modules for DSA8200 offer highest level of integration in the industry, with corresponding higher repeatability and transferability of the result. A particularly method-sensitive measurement, Extinction Ratio (ER) is now also available as ER Calibrated, with an additional layer of improvement to the portability of the result (80C08C and 80C11 modules only).
Fibre Channel applications at 8.5 Gb/s, 10.51, and 11.3 Gb/s. The 80C12 also provides telecom rate te sting at 9.95, 10.66, and 10.70 Gb/s. With its amplied O/ performance and high optical sensitivity, allowing users to examine low power level optical signals. Clock recovery for the 80C12 is provided through the 80A05 or 80A07 Clock Recovery modules (sold separately).
E design, this module provides excellent signal-to-noise
80C11 30 GHz Long Wavelength Multirate 10 Gb/s Optical Module
The 80C11 is optimized for testing of long wavelength signals (1100 to 1650 nm) at a number of rates around 10 Gb/s with a highly exible multirate lter. Additionally the high optical bandwidth of 30 GHz (typical) and the excellent frequency response of its full bandwidth path is well suited for general purpose high-performance optical component testing. The 80C11 can be congured with clock recovery options that supports any standard or user-dened rate from 9.8 to 12.6 Gb/s.
80C07B 2.5 GHz Broad Wavelength Multirate 155 Mb/s to 2.5 Gb/s Optical Module
The 80C07B is a broad-wavelength (7 00 to 1650 nm) multirate optical sampling module optimized for testing datacom /telecom signals from 155 to 2500 Mb/s. With its amplied O/E design, this module provides excellent signal-to-noise performance, allowing users to examine low-power optical signals. The 80C07B can be optionally congured with multirate clock recovery that operates from 155 to 2.7 M b/s.
40 Gb/s and 100 Gb/s Optical Test
80C08C 10 GH
z Broad Wavelength Multirate 10 G b/ s
Optical Module
The 80C08C is a broad-wavelength (700 to 1650 nm) mu ltirate optical sampling module providing datacom rate testing for 10GbE applications at
9.95, 10.31, 11.09 Gb/s and 10G Fibre C hanne l applications at 10.51 Gb/s. The 80C08C also provides telecom rate testing with several lters between
9.95 and 11.3 Gb/s. With its amplied O/E design, this module provides excellent users to examine low power level optical signals. The 80C08C can be optionally congured with clock recovery option s that can support any standard or user-dened rate in a continuous range from 9.8 to 12.6 Gb/s.
signal-to-noise performance and high optical sensitivity, allowing
80C12 Up to 10 GHz Broad Wavelength Multirate 1 Gb/s to 10 Gb/s Optical Module
The 80C012 is a broad-wavelength (700 to 1650 nm) multirate optical sampling module providing 1G, 2G, and 4G te lecom and datacom testing. This high rate applications (1 to 4 Gb/s) or a wide variety of 10 Gb/s applications. The low data rate applications include: 1, 2, 4, and 8 Fibre Channel and “by 4” wavelength d ivision multiplex standards such as 10GBASE-X4 and 4-Lane 10 Gb/s Fibre Cha nnel. The supported 10 Gb/s applications include both datacom and telecom. The supported 10 Gb/s datacom applications include 1
ly exible module can be congured to support either lower data
0GbE at 9.95, 10.31, 11.09 Gb/s, 8G Fibre Channel, and 10G
80C10B Multirate Datacom and Telecom 40 Gb/s and 100 Gb/s
The 80C10B module provides integrat ed and selectable reference receiver ltering, enabling compliance testing at either 1310 nm or 1550 nm for
39.813 Gb/s (OC-768/STM-256, VSR2000 G.693, 40G NRZ G.959.1),
41.25 Gb/s (40GBASE-FR), and 43.018 Gb/s [G.709 FEC, OTU3, (4x10G LAN PHY)] rates. In addition to the lter rates, the user may also choose selectable bandwidths of 30 GHz, 65 GHz, and 80 GHz for 80C10B for optimal noise vs. bandwidth performance for accura te signal characterization. The 80C10B is optionally available with Option F1 which extends lter selection s to include 27.739 Gb/s (100GBASE-LR4 + FEC and 100GBASE-ER4 + FEC), and 25.781 Gb/s (100GBASE-LR4 and 100GBASE-ER4). When equipped with Option CRTP, an electrical signal pickoff is provided for clock recovery using an external module (such as the Tektronix CR286A-HS). The 80C10B is also optionally available in a bundled ordering conguration which includes a 70+ GHz electrical sampling channel.
80C25GBE Multirate Datacom 100 Gb/s
80C25GBE module provides 65 GHz full bandwidth with integrated selectable reference receiver ltering, enabling compliance testing at either 1310 nm or 1550 nm for 27.739G (100GBASE-LR4 + FEC and 100GB
ASE-ER4 + FEC), and 25.781G (100GBASE-LR4 and
www.tektronix.com 5
Data Sheet
100GBASE-ER4). When equipped with Option CRTP, an electrical signal pickoff is provided for clock recovery using an external module (such as
the Tektronix CR286A-HS).
Optical Modules: 80C07B
Module
Opt.
Bandwidth
F1 F2 F3 F4 F5 F6 F7 F8 F9 F10
2.52.52.52.52.52.52.52.52.52.52.5
(GHz) Wavelength
700-1650 700-1650 700-1650 700-1650 700-1650 700-1650 700-1650 700-1650 700-1650 700-1650 700-1650
Range (nm) Fibre Input
(μm) Mask Test
9or50or
62.5
9or50or
62.5
9or50or
62.5
9or50or
62.5
9or50or
62.5
–22 –22 –22 –22 –22 –22 –22 –22 –22 –22 –22 Sensitivity (dBm)
Number of
11111111111
Channels Rates Supported: =Filter, =Optical Clock Recovery, =Electrical Clock Recovery
125 Mb/s* 155 Mb/s 622 Mb/s 1063 Mb/s 1250 Mb/s 2125 Mb/s 2488 Mb/s 2500 Mb/s
3
■■■■
■■■■
■■■
■■■
■■■
■■
■■■■■■■■■■
■■■■■■■■■■
3.125 Gb/s
3.188 Gb/s
3.32 Gb/s
4.25 Gb/s
9.95 Gb/s
*3125 Mb/s is supported by selecting 155 Mb/s rate.
80C07B
9or50or
62.5
9or50or
62.5
9or50or
62.5
9or50or
62.5
9or50or
62.5
CR1
9or50or
62.5
♦ ♦ ♦ ♦ ♦ ♦ ♦ ♦
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Optical Modules: 80C08C, 80C10B, 80C11, and 80C25GBE
Module
Opt. CR1 CR2 CR4 CRTP
Bandwidth
10 10 10 10 80 65 30 30 30 30 30 65
80C08C 80C10B*
5
(GHz) Wavelength
Range
700-1650 700-1650 700-1650 700-1650 1290-1330
1520-1620
(nm) Fibre
Input (μm) Mask Test
9or50or
62.5
9or50or
62.5
9or50or
62.5
–16 –15 –15 –15
9or50or
62.5
9 9999999
–7 Sensitivity (dBm)
Number
11111 1111111 of Channels
Rates Supported: =Filter, =Optical Clock Recovery, =Electrical Clock Recovery
9.95 Gb/s
10.31 Gb/s
10.52 Gb/s
10.66 Gb/s
10.71 Gb/s
11.1 Gb/s
11.3 Gb/s
25.78 Gb/s ♦*
27.74 Gb/s ♦*
39.81 Gb/s
41.25 Gb/s
43.02 Gb/s
tact Tektronix for details.
*4Con
5
*
Option CRTP reduces sensitivity by 0.6 dB (max) and increases noise by 15% (max).
6
Clock recovery with CR286A-HS (sold separately).
*
♦♦ ♦ ♦♦♦
♦♦
♦ ♦ ♦ ♦
6
6
4
*
4
*
4
*
Digital Serial Analyzer Sampling Oscilloscope — DSA8200
80C11 80C25GBE
F1
1290-1330
1100-1650 1100-1650 1100-1650 1100-1650 1100-1650 1290-1330
1520-1620
–8 –9 –9 –9 –9 –9 –8
■■
■■
CR1 CR2 CR3 CR4 CRTP
1520-1620
♦ ♦
♦♦
♦♦♦
♦ ♦
6
*
6
*
4
*
4
*
4
*
www.tektronix.com 7
Data Sheet
Optical Modules: 80C12
Module
Opt.
Bandwidth
F1 F2 F3 F4 F5 F6
4.25 9 9 4.25 9 9 9 10
(GHz) Wavelength
700-1650 700-1650 700-1650 700-1650 700-1650 700-1650 700-1650 700-1650
Range (nm) Fibre Input
9 or 50 or 62.5 9 or 50 or 62.5 9 or 50 or 62.5 9 or 50 or 62.5 9 or 50 or 62.5 9 or 50 or 62.5 9 or 50 or 62.5 9 or 50 or 62.5 (μm)
Mask Test
–19 –19 –19 –19 –19 –19 –19 –14 Sensitivity (dBm)
Number of
11111111
Channels Rates Supported: =Filter, =Optical Clock Recovery, =Electrical Clock Recovery
155 Mb/s 622 Mb/s 1063 Mb/s
■■
1250 Mb/s 2125 Mb/s
■■■■
2488 Mb/s 2500 Mb/s
3.125 Gb/s
3.188 Gb/s
■■■■
■■■■
3.32 Gb/s
4.25 Gb/s
8.5 Gb/s*
9
■■ ■■
■■ ■■■■
9.95 Gb/s
10.31 Gb/s*
9
10.52 Gb/s
10.66 Gb/s
10.71 Gb/s
11. 1 Gb/s
11. 3 Gb/s
*7With 80A05 or 80A07.
8
With 80A05 Option 10G or 80A07.
*
9
*
Draft version of the 8.5GFC lter. T11 committee redened this lter at the April 2008 meeting. New 8.5GFC lter, as denedbyT11committeeinApri 80C12 Option 10G modules only; and is identied as 10BASE-R.
80C12
FC 10G CR*
7
CR*
♦♦ ♦♦ ♦♦ ♦♦ ♦♦ ♦♦ ♦♦ ♦♦ ♦♦
♦♦ ♦♦
80A07
l 2009, is identical to the 10BASE-R 10.313G lter and is available for
8
♦ ♦ ♦ ♦ ♦ ♦ ♦
8 www.tektronix.com
Digital Serial Analyzer Sampling Oscilloscope — DSA8200
DSA8200 Electrical Modules
TDR Modules: 80E10, 80E08, and 80E04
The 80E10, 80E08, and 80E04 are dual-channel Time Domain Reectometry (TDR) sampling modules, providing up to 12 ps incident and 15 ps reected rise time. Each channel of these m odules is capable of generating a fast impulse for use in TDR mode and the acquisition portion of the sampling module monitors the incident step and any reected energy. The polarity of each channel’s step can be selected independently. This allows for true-differential or common-mode TDR or S-parameters testing of two coupled lines, in addition to the independent testing of isolated lines. The independent step generation for each channel allows true-differential measurements, which ensures measurement accuracy of nonlinear differential devices.
80E10 and 80E08 fe ature a small form factor, fully integrated independent 2-meter remote sampler syst em, enabling the location of the sampler near the DUT for th
TDR Module Summary
80E10 12 ps 15 ps
80E08 18 ps 20 ps
80E04 23 ps 28 ps
es shown are warranted unless printed in an italic typeface which represents a typical value.
*10Valu
11
*
Calculated from .35 bandwidth rise time product.
e best system delity. The modules characterize crosstalk by
Typical TDR Rise Time at Full BandwidthModule
Incident*
10
Reected*
10
using TDR steps to drive one line (or line pair for differential crosstalk) while monitoring a second line (or line pair) with the other channel (or another module for diff
erential crosstalk). The "rise time lter" function on the DSA8200 mainframe can be used with TDR or crosstalk measurements to characterize expected system performance with slower edge speeds. An optional 2-meter extender cable for the 80E04 is available, which enables placement of the module near the DUT for the be st system delity.
All modules have independent incident step and receiver deskew to remove the effect of xtures and probes, enabling faster and easier deskew. The 80E10 Sampling module provides an acquisition rise time of 7 ps, with up
to 50 GHz user-selectable equivalent bandwidth (with 50 GHz, 40 GHz, and 30 GHz settings). 80E08 sampling bandwidth is 30 GHz (user-selectable with 30 GHz and 20 GHz settings) and 80E04 sampling bandwidth is 20 GHz. The 20 GHz P8018 single-ended and the 18 GHz P80318 differential variable pitch TDR handheld probes provide excellent performance, ensuring e asy and accurate backplane and package meas
urements.
Bandwidth
Performance*
50 GHz, 40 GHz,
and 30 GHz
(user selectable)
30 GHz, 20 GHz (user
selectable)
20 GHz
11
RMS N oise at
Bandwidth*
50 GHz: 600 μV 40 GHz: 370 μV 30 GHz: 300 μV
30 GHz: 300 μV 20 GHz: 280 μV
600 μV No, optional 80N01
Remote Sampler
11
Yes, fully integrated
Yes, fully integrated
– 2-meter extender
2-meter cable
2-meter cable
cable
www.tektronix.com 9
Data Sheet
Electrical Modules: 80E09, 80E07, 80E06, 80E03, and 80E01
The 80E09 and 80E07 are dual-channel modules with remote samplers, capable o f noi 300 μV
noise at 30 GHz bandwidth. Each small form factor remote
RMS
se as low as 450 μV
at 60 GHz bandwidth and
RMS
sampler is attach ed to a 2-meter cable to minimize the effects of cables, probes, and xtures to ensure the best system delity. User-selectable bandwidth settings (60/40/30 on 80E09 and 30/20 on 80E07) offer optimal noise/bandwidth trade-off.
80E06 and 80E01 are single-channel 70+ and 50 GHz bandwidth sampling modules respectively. 80E06 provides the widest bandwidth and fastest rise time with
world-class system delity. Both 80E06 and 80E01 provide a
superior maximum operating range of ±1.6 V. Both modules can be used
Electrical Module Summary
Electrical Module
80E09 5.8 ps 2
80E07 11.7 ps 2
80E06 5.0 ps 1
80E03 17.5 ps 2
80E01
*10Values shown are warranted unless printed in an italic typeface which represents a typical value.
12
*
Now obsolete module useful with older versions of the mainframe, but not needed with the 8200 Series mainframes.
Step Response at Full
Bandwidth
(10-90%)*
10
7ps
Number Of Channels Bandwidth*
1
with the optional 2-meter extender cable, ensuring superior system delity and measurement exibility.
The 80E03 is a dual-channel 20 GHz sampling module. This module provides an acquisition rise time of 17.5 ps or less. An optional 2-meter extender cable is available.
When used with
Tektronix 80SJNB Jitter, Noise, and BER Analysis software, these modules enable separation of both jitter and noise into their constituent components, for insight into the underlying causes of eye closure and obtain highly accurate calculation of BER and 3-D eye contour. When used with the 82A04 Phase Reference module, time-base accuracy canbeimproveddownto200fs noise oor and
14 bits of resolution, ensures the highest signal delity for
jitter which, together with the 300 μV
RMS
RMS
your measurements.
10, 12
60/40/30 GHz (user
selectable)
30/20 GHz (user
selectable)
70+ GHz
20 GHz
50 GHz
RMS N oise at Bandwidth*
60 GHz: 450 μV 40 GHz: 330 μV 30 GHz: 300 μV
30 GHz: 300 μV 20 GHz: 280 μV
1.8 mV No, optional 80N01
600 μV No, optional 80N01
1.8 mV No, optional 80N01
Remote Sampler
10
Yes, fully integrated
Yes, fully integrated
– 2-meter extender
– 2-meter extender
– 2-meter extender
2-meter cable
2-meter cable
cable
cable
cable
10 www.tektronix.com
Digital Serial Analyzer Sampling Oscilloscope — DSA8200
DSA8200 Accessory Modules
82A04 Phase Reference Module
The 82A04 Phase Reference module enhances the DSA8200 sampling oscilloscope from the industry’s standard time-base jitter performance of 800 f s application for the Phase R eference module is the acquisition and analysis of very high-speed optical a nd electrical signals in communication devices and systems. T which is similar to usual acquisition, and the untriggered Free Run mode where all timing information comes from the customer-supplied clock alone (no trigger signal necessary). When the external clock is not available the module can accept the clock signal from the clock recovery output of the 80Cxx modules, as well as from the 80A05 or 80A07 Clock Recovery modules. Add operation.
80A05 Electrical Clock Recovery Module
The 80A05 Electrical Clock Recovery module enables clock re covery for electrical signals, as well as internal triggering on the recovered clock. The module reco electrical standards in the 50 Mb/s to 4.25 Gb/s, around 5 to 6 Gb/s, and from 9.953 Gb/s to 12.5 Gb/s ranges. The module accepts either single-ended or differential signals as its input, providing clock recovery for both. The signal(s) is/are then passed on to the output connectors (at about 50% of the input level) and can be connected to sampling module(s) for differenti standard rates from 9.953 Gb/s to 12.6 Gb/s. The 80A05 and 80A07 can also serve as the Clock Recovery module for the 80C12 Op tical Sampling module.
80A06 PatternSync Module
The 80A06 P with 80SJNB software, enables characterizing jitter, noise, and BER performance of high-speed serial designs from 1 Gb/s to 60 Gb/s data rates. It extends the capability of the DSA8200 sampling oscilloscope by creating a pattern trigger from any data-related clock – a recovered clock, user-supplied clock, sub-clock, or super-clock. The PatternSync Trigger module is p user-supplied clock signal from 150 MHz to 12.5 GHz. The 80A06 module is required with the DSA8200 when using 80SJNB Advanced Jitter, Noise, and BER Analysis software package. This module can be used in combination with the 82A04 Phase Reference module for the best time-base accuracy or for acquisition of signals under SSC (Spread Spectrum Clocking).
, to the extremely low time-base jitter of <200 fs
RMS
.Typical
RMS
he 82A04 supports both the Triggered mode of operation,
itionally 82A04 supports SSC (Spread Spectrum Clocking)
vers clocks from serial data streams for all of the most common
al or single-ended sampling. Option 10G is required for suppo rt of
atternSync Trigger module, when used in combination
rogrammable to pattern lengt hs of up to 2
23
bits and accepts a
80A07 Clock Recovery Module
80A07 recovers clocks from serial data streams for all of the most common electrical standards in the continuous 100 Mb/s to 12.5 GB/s range. Auto-locking capability is selectable from the user interface or programmatic interface, so t
he design and test engineers can search and lock onto signals of undened or unknown data rate. The module accepts either single-e nded or differential signals as its input, providing clock recovery for both. The signal(s) is/are then passed on to the output connectors and can be connected to sampling module(s) for differential or single-ended sampling. 80A07 offers complete congurability and state-of-the-art specications and is the pref
erred solution for most serial data standards due to excellent stability, superior jitter and slew rate tolerance fo r recovering clocks f rom stressed or degraded signals, and unequaled PLL bandwidth and roll-off shape control for either Golden PLL compliance testing or custom PLL response. 80A07 also locks on spread-spectrum signals. The 80A07 can also serve as the Clock Recovery module for the 80C12 Optical Sampling module.
P80318 Diffe
rential Handheld TDR Probe
The P80318 is an 18 GHz 100 input impedance differential TDR hand probe. This p
robe enables high-delity impedance measurements of
differential transmission lines. The adjustable probe pitch from 0.5 mm to
4.2 mm enables a wide variety of differential line spacing and impedan ces. The P80318 probe also includes two precision SMA cables with parallel control lines that provides the 80A02 module the control for EOS/ESD protection.
P8018 Single-ended Handheld TDR Probe
The P8018 Handheld TDR Probe is a 20 GHz, 50 input impedance, single-ended passive probe t hat provides a high-performance solution for electrical
sampling, TDR circuit board impedance characterization, and high-speed electrical signal analysis applications. The P8018 probe also includes a precision SMA cable and parallel control line that provides the 80A02 module the control for EOS/ESD protection.
80A02 EOS/ESD Protection Module
The 80A02 EOS/ESD Protection module protects the sampling bridge of Tektronix electrical sampling module inputs from damage by electrostatic charge. The 80A02 is intended for use in applications such as electrical TDR circuit board testing and cable testing where large static charges can be stored i
ntheDUT.
When used with the matching P8018 20 GHz single-ended handheld probe or t
he P80318 differential hand held probe (both with probe tip pressure actuating feature) the 80A02 provides a superior technique and performance capability for electrical module EOS/ESD protection of acquired electrical signals and TDR measurements (two 80A02 modules required for differential applications).
www.tektronix.com 11
Data Sheet
80A03 TekConnect Probe Interface Module
The 80A03 provides probe power and control for up to two Tektronix P7000 Series probes. The 80A03 is powered through the o scilloscope and requires no user adjustments or external powe r cords. An Electrical Sampling modul
e can be plugged directly into the slot on the 80A03 to provide the optimum system delity and a short electrical path. Using the 80A03, designers can benet from industry-leading Tektronix active and differential probes to measure signals on SMD pins and other challenging circuit features.
SlotSaver Small Module Extender Cable
This cable can be u sed to power and operate one 80A01*12,80A02,or 80A06 accessory modules, eliminating the need to consume a small form factor mainframe slot. The SlotSaver extender cable plugs into the ‘Trigger Power’ conne
ctor on the mainframe or (for 80A01 and 80A02) into the
‘Probe Power’ connector on most Electrical Sampling modules.
*12Now obsolete module useful with older versions of the mainframe, but not needed with the 8200 Series
mainframes.
DSA8200 Application Software
Jitter, Noise, BER, and Serial Data Link Analysis (SD LA) Software
80SJNB speeds the identication of the underlying causes of both horizontal and vertical eye closure through separation of jitter and noise. With its uni noise, 80SJNB provides a highly accurate and complete BER calculation and eye contour analysis.
Additionally available in the software package is the rst-ever set of features addressing the design issues of modern Serial Data Links: equalization with either FFE or DFE, channel emulation, support for xture de-embedding, as well as full support for SSC – Spread Spectrum Clocking. When you combine jitter, noise, and BER analysis with the DSA8200 modular exibility, uncomprom ideal solution for next-generation high-speed serial data design validation and compliance testing. 80SJNB requires the 80A06 PatternSync module, which creates a trigger pulse on each complete pattern. 80SJNB may be used with the 82 A04 Phase Reference module for enhanced accuracy or for SSC signals, or without it depe nding on your requ irements. SSC max. amplitude 80SJNB supports save and recall of the complete signal description. Also added is a new measurement DDPWS (Data Dependent Pulse Width Shrinkage) and a corresponding graph.
que insight into the constituent components of both jitter and
ised performance, and unmatched signal delity you get the
5000 ppm (6000 ppm) at 30 ±3 kHz. Current version V2.1 of
80SJNB Jitter and Noise Analysis Measurements
Jitter Analysis
Measurements Description
TJ at BER J2 J9 RJ Random jitter RJ(h) Horizontal component of random jitter RJ(v) Vertical component of random jitter RJ(d-d) DJ Deterministic jitter DDJ Data-dependent jitter DDPWS Data-dependent Pulse Width Shrinkage DCD DJ(d-d) PJ Periodic jitter PJ(h) Horizontal component of periodic jitter PJ(v) Vertical component of periodic jitter EO at BER Horizontal eye opening at specied BER
80SJNB Noise Analysis
Measurements Description
RN Random noise RN(v) Vertical component of random noise RN(h) Horizontal component of random noise DN Deterministic noise DDN1 Data-dependent noise on logical level 1 DDN0 Data-dependent noise on logical level 0 PN Periodic noise PN(v) Vertical component of periodic noise PN(h) Horizontal component of periodic noise EO at BER Vertical eye opening at specied BER SSC Magnitude Magnitude of SSC modulation in ppm SSC Frequency Frequency of SSC modulation in ppm
80SJNB Advanced Supports:
Total jitter at specied BER Total jitter for BER = 2.5e Total jitter for BER = 2.5e
Random jitter according to the Dual Dirac model
Duty cycle distortion Deterministic jitter computed in the Dual Dirac model
–3
–10
FFE (Feed Forward Equalization) to 100 Taps
DFE (Decision Feedback Equalization) to 40 Taps
Filter for sup port of linear lters f rom xture de-embed to transmitter equalization. Channel emulation supported for channels with >30 dB
st
of loss at 1
harmonic frequency
12 www.tektronix.com
Jitter Analysis of Arbitrary Data
The 80SJARB jitter measurement application software for the DSA8200 Series addresses IEEE 80 2.3ba applications requiring the J2 and J9 jitter measurements. It also ena bles basic jitter measurements for NRZ data signals including PRBS31, random trafc, and scrambled data. This provides an entry-level jitter analysis capability with simple Dual Dirac model jitt
er analysis and no hardware module requirements. 80SJARB can acquire continuously in “free run” mode, delivering acquisitions and updates beyond the IEEE minimum requirement of 10,000 data points. Plots include jitter bathtub curves for both measured and extrapolated data, as well as a histogram of the acquired data.
Measurement Description
J2 J9 Tj DJdd RJdd
Total jitter for BER = 2.5e Total jitter for BER = 2.5e Total jitter for BER = 1.0e Deterministic jitter (Dual Dirac model) Random jitter (Dual Dirac model)
–3
–10
–12
Free Run Mode: For continuous acquisitions and update beyond the IEEE minimum requirement of 10,000 data points
Plots: Jitter / Eye Opening B athtub, Histogram of Acquired Data
Digital Serial Analyzer Sampling Oscilloscope — DSA8200
IConnect®Signal Integrity TDR and S-parameter Software
Operating on the DSA8200 TDR platform, IConnect®S-parameters is the most cost-effective and highest throughput approach for S-parameter measurements in digital design, signal integrity analysis, and interconnect compliance te similar bandwidth VNAs, and dramatically speeding up measurements. You can also take advantage of the IConnect line interface, which automates the S-parameter measurements, to the overall suite of manufacturing tests you perform using your TDR instrument, signicantly reducing test time while increasing measurement r epeat ability.
The simplicity of S-parameter calibration using a reference (open, short, or through), and an optional 50 load makes the measurement, xture de-embeddin le format output enables easy S-parameter le sharing for further data analysis and simulations.
Tektronix offers several true-differential TDR modules, which in combination with IConnect to –70 dB of dynamic range. This performance exceeds requirements for serial data analysis, digital design, and signal integrity a pplications, resolving down to 1% (–40 dB) accuracy of crosstalk, whereas electrical compliance t to –30 dB range.
IConnect and IBIS models for your PCBs, ex boards, connectors, cables, packages, sockets, and I/O buffer inputs directly from TDR/T or VNA S-parameter measurements. IConnect degradation, jitter, loss, crosstalk, reections, and ringing in your digital system. IConnect interconne domain performance, and eye diagram of the overall channel. IConnect substantially simplies the signal integrity analysis of the interconnect link, equalization and emphasis component design, and analysis of the interconnect link with transmitter and receiver.
sting, providing as much as 50% cost savings compared to
®
S-parameters command
g, and moving the reference plane a snap. Touchstone
®
offers S-parameter measurements to 50 GHz with up
esting masks typically call for the measurements in the –10
®
ftware allows you to quickly and easily generate SPICE
so
®
allows you to display eye diagram
®
Linear Simulator allows the designer to link several
ct channels together to evaluate the total time, frequency
®
www.tektronix.com 13
Data Sheet
Characteristics
Signal Acquisition
Acquisition Modes
Mode
Number of Sampling Modules Accommodated
Number of Simultaneously Acquired Inputs
Acquisition Characteristics
Characteristic
Vertical Systems
Rise Time / Bandwidth Vertical Resolution 14 bits over the sampling modules’ dynamic range
Horizontal System
Four time-base modes are available:
Triggered Phase Reference*13Time Base Mode
Free Run Phase Reference*13Time Base Mode
Short-term Optimized Sequential*14Time Base Mode
Locked to 10 MHz Reference Sequential Time Base
Main and Magnication View Time Bases 100 fs/div to 5 ms/div in 1-2-5 sequence or 100 fs increments
ximum Trigger Rate
Ma
pical Acquisition Rate
Ty
Time Interval Accuracy (Standard Time Base) and Timing Deviation (Phase Reference Modes)
Phase Reference Time Base: Triggered Maximum timing deviation relative to phase reference signal:
Horizontal position after trigger event:
>40 ns 40 ns
Phase Reference Time Base: Free Run Maximum timing deviation relative to phase reference signal: 0.1% or better of phase reference signal period (typical) Sequential Time Base*
14
Time interval accuracy, horizontal scale:
<21 ps/div 1 ps + 1% of interval
Horizontal Deskew Range Available (Sequential time base only)
DSA8200 Record Length
®
IConnect 80SJNB Jitter, Noise, and BER Analysis
software
Waveform Databases 4 independently accumulated waveform records of up to 4 G waveform points. Variable waveform database mode with true
Magnication Views In addition to the main time base, the DSA8200 supports two magnication views. These magnications are independently
*13When using the 82A04 Phase Reference module.
14
*
Traditional mode – not using the 82A04 Phase Reference module.
Sample (Normal), Envelope, and Average
Up to four dual-channel electrical; up to two optical sampling modules. (Both single- and dual-channel modules are appropriate for the two channels associated with the slot)
Population of the CH1/CH2 large slot with any module other than one requiring power only displaces functionality of the CH1/CH2 small slot; population of the CH3/CH4 large slot with any module other than one requiring power only displaces functionality of the CH3/CH4 small slot
Eight channels maximum
Description
Determined by the sampling modules used
Timing information extracted from a user-supplied or clock recovery signal signicantly improves time-base accuracy and jitter performance of the triggered acquisition. Horizontal position is referenced to the trigger signal as with a traditional time base
All timing is b ased on a phase reference signal; accuracy and jitter as above; no trigger is needed, and correspondingly there is no timing relation to trigger signal
Best short-delay performance for acquisitions without the external phase reference signal
Provides the best long-delay performance for acquisitions without the external phase reference signal. The Lock is selectable between Lock to Internal 10 MHz and Lock to External 10 MHz for highest frequency accuracy
200 kHz; in Phase Reference mode: 50 kHz 150 kS/s per channel (standard sequential time base); 50 kS/s (Phase Reference modes)
0.2% of phase reference signal period (typical)
0.4% of phase reference signal period (typical) Note: The performance depends on stable clock supplied to the Phase Reference module. Performance under SSC is lower and depends on modulation shape
8 ps + 0.1% of interval (short-term optimized mode)≥21 ps /di v 8ps+0.01%ofinterval(lockedto10MHzmode) –500 ps to +100 ns on any individual channel in 100 fs increments
20, 50, 100, 250, 500, 1000, 2000, or 4000 samples; Longer records available as follows:
1,000,000 points 3,200,000 points
rst-in/rst-out of 2000 waveforms available on each of 4 waveform databases
acquired using separate time-base settings which allow same or faster time/div than that of the main time base
14 www.tektronix.com
Digital Serial Analyzer Sampling Oscilloscope — DSA8200
Tri gger System
Trigger Sources
External dire External pre-scaled trigger. Internal clock trigger: Internally connected to direct trigger.
Trigg er S ens
ct trigger.
itivity
Clock recovery triggers from Optical Sampling modules and from the 80A05 or 80A07 Rlectrical Clock Recovery modules; signal from the 80A05 module (pre-scaled a
Phase Reference*
bove 2.7 Gb/s) internally connected.
13
time base supports acquisitions without a trigger signal in its
Free Run mode.
*13When using the 82A04 Phase Reference module.
50 mV, DC - 4 GHz (typical)External Direct Trigger Output
100 mV, DC - 3 GHz (guaranteed) Trigger Level Range ±1.0 V Trigger Input Range ±1.5 V Trigger Holdoff External Trigger Gate (Optional) Pre-scaled Trigger Input
Time-base Jitter
Phase Reference*15Time Base
Adjustable 5 μs to 100 ms in 0.5 ns increments
TTL logic 1 enables gate, a TTL logic 0 disables gate, maximum nondestruct input level ±5 V
200 mV
System jitter of 200 fs
signal
Jitter: System jitter of 280 fs
0.6 V VREF 1.8 V phase reference signal
to 800 mV
p-p
, 2 to 12.5 GHz (guaranteed)
p-p
typical on a 10 GHz or faster acquisition module, with f 8GHz,0.6VVREF 1.8 V phase reference
RMS
typical on a 10 GHz or faster acquisition module, in DSA8200 mainframe, with 2 GHz ≤ f ≤ 8GHz,
RMS
The phase reference time base remains operational to 100 mV (typical) with increased jitter
Mode
800 fs
1.2 ps
1.6 ps
2.5 ps
+5 ppm of position (typical)Short-term Jitter Optimized Sequential Mode
RMS
+10 ppm of position (max.)
RMS
+0.04 ppm of position (typical)Locked to 10 MHz Reference Sequential
RMS
+0.01 ppm of position (max.)
RMS
Internal Clock Adjustable from 25 to 200 kHz (drives TDR, internal clock output and calibrator)
*15When using the 82A04 Phase Reference module performance under SSC is lower and depends on modulation shape, clock recovering setting, and cabling lengths.
Display Features
Touch Screen Display 264 mm / 10.4 in. diagonal, color Colors 16,777,216 (24 bits) Video Monit
Resolution
or Type
rizontal by 480 vertical displayed pixels
640 ho
LCD
www.tektronix.com 15
Data Sheet
Math/Measurement
Characteristic
System Measurements
Description
The DSA8200 supports up to eight simultaneous measurements, updated three times per second with optional display of per-measurement statistics (min, max, mean, and standard deviation)
Measurement Set
Automated measurements include RZ, NRZ, and Pulse signal types, and the following:
Amplitude measurements
High, Low, Amplitude, Max, Mid, Min, +Width, Eye Height, Eye Opening Factor, Pulse Symmetry, Peak-to-Peak, OMA, +Overshoot, –Overshoot, Mean, +Duty Cycle, Cycle Mean, RMS, Cycle RMS, AC RMS, Gain, Extinction Ratio (Ratio, %, dB), Suppression Ratio (Ratio, %, dB), Peak-to-Peak Noise, RMS Noise, Q-Factor, SNR, Average Optical Power (dBm, watts), OMA
Timing measurements
Rise,Fall,Period,BitRate,BitTime,Frequency,Crossing (%, Level, Time), +Cross, –Cross, Jitter (P-P, RMS), Eye Width, +Width, –Width, Burst Width, +Duty Cycle, –Duty Cycle, Duty Cycle Distortion, Delay, Phase
Area
Area, Cycle Area
measurements
Cursors Waveform
Processing
Dot, vertical bar, and horizontal bar cursors Up to eight math waveforms can be dened and displayed
using the following math functions: Add, Subtract, Multiply, Divide, Average, Differentiate, Exponentiate, Integrate, Natural Log, Log, Magnitude, Min, Max, Square Root, and Filter. In addition, measurement values can be utilized as scalars in math waveform denitions
Characteristic
Mask Testing – Standard rate (Gb/s) unless othe rwise noted
Description
Custom masks (a new FW feature) can be used to distribute new, Tektronix factory created, NRZ, updated masks as a le loadable by the rmware. User-dened masks allow the user to create (through UI or PI) user masks. For most applications mask will be found in the following list of predened, built-in masks:
STM-0/OC-1 51 Mb/s STM-1/OC-3 155 Mb/s STM-4/OC-12 622 Mb/s STM-16/OC-48 2.488 STM-64/OC-192 9.953 STM-256/OC-768 39.813 FEC 2.666 2.666 FEC 10.66 10.664 FEC 10.709 FEC 11.100 FEC 27.739 Gb/s (100GBASE-LR4 100GBASE-ER4) FEC 42.66 42.657 FEC 43 Gb/s G.709 43.018 FC-10 G 10.5188 – optical only FC-16 17.0 – optical and electrical FC-133 132.813 Mb/s – optical and electrical FC-266 265.6 Mb/s – optical and electrical FC-531 531.2 Mb/s – optical and electrical FC-10631.063–opticalandelectrical FC-2125 2.125 – optical and electrical FC-42504.250–opticalandelectrical FC-8500 8.500 – optical and electrical, optical 10GFC, FEC
9
11. 3* 10GBASE-X4 3.125
10GBASE-W 9.953 10GBASE-R 10.313, FEC 11.1, 8.5 GFC 40GBASE-LR4 41.25 OTU3+ 44.50 Gb/s 4x10G LAN PHY 100GBASE-LR4 and 100GBASE-ER4 25.781 Gb/s InniBand 2.500 – optical and electrical Gigabit Ethernet 1.250 Gigabit Ethernet 2.5 Gb/s XAUI, XFI PCI-Express 2.5G PCI-Express 5.0G SAS XR 3.0G SAS XR AASJ 3.0G SATA G1Tx 1.5G SATA G1Rx 1.5G SATA G2Tx 3.0G SATA G2Rx 3.0G SATA G3Tx 6.0G SATA G3Rx 6.0G Rapid I/O 1.25G Rapid I/O 2.50G Rapid I/O 3.125
*9Draft version of the 8.5GFClter. T11committee redened this lter at the April 2008 meeting. New 8.5GFC
lter, as dened by T11 committee in April 2009, is identical to the 10BASE-R 10.313G lter and is available for 80C12 Option 10G modules only; and is identied as 10BASE-R.
16 www.tektronix.com
Digital Serial Analyzer Sampling Oscilloscope — DSA8200
Optical Sampling Module Characteristics
Refer to Optica
Optical Sampling Mo d ule Characteristics
Module Application Type
80C07B Tributary Datacom/Telecom Standard Included: OC-48/STM-16 (2.488 Gb/s),
80C08C 10 Gb/s Datacom/Telecom OC-192/STM-64 (9.953 Gb/s), 10GBASE-W
80C10B 100 Gb/s and 40 Gb/s
80C11 10 Gb/s Datacom/Telecom OC-192/STM-64 (9.953 Gb/s), 10GBASE-W
80C12
80C25GBE 100 Gb/s Datacom 100GBASE-LR4 (25.781 Gb/s, FEC 27.739 Gb/s),
*9Draft version of the 8.5GFC lter. T11 committee redened this lter at the April 2008 meeting. New 8.5GFC lter, as dened by T11 committee in April 2009, is identical to the 10BASE-R 10.313G lter and is available for
80C12 Option 10G modules only; and is identied as 10BASE-R.
16
Bandwidths shown are warranted unless printed in an italic typeface which represents a typical value. 80C08C, 80C12: Bandwidths and optical lters valid for OMA 500 μW (1550/1310 nm), OMA 860 μW (850 nm), OMA
*
1020 μW (780 nm).
Note: Refer to Optical Sampling module’s User Manual for more detailed information.
l Sampling module’s User Manual for more detailed information.
Standards and Supported Filte ring
Rates*
16
Inniband SDR, 2 GbE (2.500 Gb/s);
Optional (choose any two): OC-3/STM-1
(155 Mb/s), OC-12/STM-4 (622 Mb/s),
Fibre Channel (1.063 Gb/s), GbE (1.250 Gb/s),
2G Fibre Channel (2.125 Gb/s)
(9.953 Gb/s), 10GBASE-R, 40GBASE-R4,
100GBASE-SR10 (10.31 Gb/s), 10G Fibre
Channel (10.52 Gb/s), ITU-T G.975 FEC
(10.664 Gb/s), ITU-T G.709 (10.709 Gb/s),
10 GbE FEC (11.1 Gb/s), 10 GFC FEC
(11.3 Gb/s), 10GBASE-LRM, 40GBASE-SR4,
100GBASE-SR10, 40GBASE-LR4
OC-768/STM-256 (39.813 Gb/s), OTU3, VSR-2000
Telecom and Datacom
G.693, 40G NRZ G.959.1, FEC (43.018 Gb/s),
OTU3 (44.5 Gb/s), 40GBASE-FR (41.25 Gb/s),
100GBASE-LR4 (25.781 Gb/s, FEC 27.739 Gb/s),
100GBASE-ER4 (25.781 Gb/s, FEC 27.739 Gb/s)
(9.953 Gb/s), 10GBASE-R, 40GBASE-LR4
(10.31 Gb/s), 10G Fibre Channel (10.52 G b/s),
ITU-T G.975 FEC (10.664 Gb/s), ITU-T G.709
(10.709 Gb/s), 10 GbE FEC (11.1 Gb/s), 10 GFC
FEC (11.3 Gb/s), 40GBASE-LR4
1 to 8.5 Gb/s
Datacom/Telecom
Fibre Channel (1.063 Gb/s), 2G Fibre Channel
(2.125 Gb/s), 4G Fibre Channel (4.250 Gb/s),
10GBASE-X4 (3.125 Gb/s), 8G Fibre Channel
(8.50 Gb/s)*
9
, 10GFC-X4 (3.1875 Gb/s), VSR5-3318 (3.318 Gb/s), 1x Inniband SDR (2.5 Gb/s), 10GBASE-LRM, 4 0GBASE-SR4,
100GBASE-SR10, 40GBASE-LR4
10 Gb/s Datacom/Telecom OC-192/STM-64 (9.953 Gb/s), 10GBASE-W
(9.953 Gb/s), 10GBASE-R*
9
, 40GBASE-R4,
100GBASE-SR10 (10.31 Gb/s), 10G Fibre Channel
(10.52 Gb/s), ITU-T G.975 FEC (10.664 Gb/s),
ITU-T G.709 (10.709 Gb/s), 10 GbE FEC
(11.1 Gb/s), 10 GFC FEC (11.3 Gb/s)
100GBASE-ER4 (25.781 Gb/s, FEC 27.739 Gb/s)
Number of Input
Channels
Effective
Wavelength Range
1 700 nm to 1650 nm 780 nm, 850 nm,
1 700 nm to 1650 nm 780 nm, 850 nm,
1 1310 nm and 1550 nm 1310 nm and 1550 nm
1 1100 nm to 1650 nm 1310 nm and 1550 nm
1 700 nm to 1650 nm 850 nm, 1310 nm, and
1 1310 nm and 1550 nm 1310 nm and 1550 nm
Calibrated
Wavelengths
1310 nm, and
1550 nm (±20 nm)
1310 nm, and
1550 nm (±20 nm)
(±20 nm)
(±20 nm)
1550 nm (±20 nm)
(±20 nm)
www.tektronix.com 17
Data Sheet
Optical Sampling Module Characteristics (Cont.)
Module
80C07B Option CR1: 155 Mb/s,
Clock Recovery
(Optional)
Clock Recovery Outputs Unltered Optical
Bandwidth*
16
±Clock, ±Data 2.5 GHz
622 Mb/s, 1.063 Gb/s,
1.250 Gb/s, 2.125 Gb/s,
2.488 Gb/s, 2.500 Gb/s,
2.666 Gb/s
80C08C*
18
Option CR1: 9.953 Gb/s,
Clock, Clock/16 10 GHz
10.31 Gb/s;
Option CR2: 10.31 Gb/s,
10.52 Gb/s;
Option CR4: Continuous from
9.8 Gb/s to 12.6 Gb/s
80C10B Provided by CR286A-HS or
other compatible external
CR units*
4
80C11 Option CR1: 9.953 Gb/s;
Option CR2: 9.953 Gb/s,
10.664 Gb/s;
ELECTRICAL SIGNAL OUT
(to44.5Gb/s,50,AC
coupled, differential 2.92 mm
female connectors, max.
1 ps diff. skew)*
17
CR1: C lock, Clock/16, Data;
CR2, CR3, CR4: Clock,
Clock/16
80 GHz
28 GHz
Option CR3: 9.953 Gb/s,
10.709 Gb/s;
Option CR4: Continuous
between 9.8 Gb/s to
12.6 Gb/s
80C12
Provided by 80A05 or 80A07
(sold separately)
ELECTRICAL SIGNAL OUT 9GHz(for all options
except 10G)
10 GHz (Option 10G)
80C25GBE Provided by CR286A-HS ELECTRICAL SIGNAL OUT
65 GHz
(to44.5Gb/s,50,AC
coupled, differential 2.92 mm
female connectors, max.
1 ps diff. skew)*
*4Contact Tektronix for details.
16
Bandwidths shown are warranted unless printed in an italic typeface which represents a typical value. 80C08C, 80C12: Bandwidths and optical lters valid for OMA 500 μW (1550/1310 nm), OMA 860 μW (850 nm), OMA
*
1020 μW (780 nm).
17
With Option CRTP.
*
18
*
Frequency characteristic and ORR guaranteed for signals up to 500 μW
(80C08C, 80C12), respectively200 μW (80C07B) at 1550 nm; pro-rated (hig
p-p
17
Absolute Maximum
Nondestructive Optical
Input
5mWaverage;10mW
peak power at wavelength of
highest responsivity
1mWaverage;10mW
peak power at wavelength of
highest responsivity
20 mW average; 60 mW
peak power at wavelength of
highest relative responsivity
5mWaverage;10mW
peak power at wavelength of
highest responsivity
1mWaverage;10mW
peak power at wavelength of
highest responsivity
20 mW average; 60 mW
peak power at wavelength of
highest relative responsivity
her power) for other wavelengths.
Internal Fibre Diameter
62.5/125 μm
Multi Mode
62.5/125 μm
Multi Mode
9/125 μm
Single Mode
9/125 μm
Single Mode
62.5/125 μm
Multi Mode
9 μm/125 μm
Single Mode
18 www.tektronix.com
Optical Sampling Module Characteristics (Cont.)
Module
Optical Return
Loss
80C07B >14 dB (Multi Mode)
Fibre Input
Accepted
Single or Multi Mode 0.50 μW at 155 Mb/s, 622 Mb/s,
>24 dB (Single
Mode)
80C08C >14 dB (Multi Mode)
Single or Multi Mode 1.7 μWatalllter rates (1550/1310 nm,
>24 dB (Single
Mode)
5
80C10B*
80C11
80C12 >14 dB (Multi Mode)
>30 dB
>30 dB
Single Mode
Single Mod e 5.5 μWatalllter rates;
Single or Multi Mode 1.3 μW(alllters except Option 10G)
>24 dB (Single
Mode)
80C25GBE
*5Option CRTP reduces sensitivity by 0.6 dB (max) and increases noise by 15% (max).
>30 dB
Single Mode
Digital Serial Analyzer Sampling Oscilloscope — DSA8200
RMS Optical Noise (Typical) RMS Optical Noise (Maximum)
1063 Mb/s, 1250 Mb/s;
0.70 μW at 2.488/2.500 Gb/s
no CR)
1310 nm 1550 nm 1310 nm 1550 nm
21 μW(25.8,
27.7 Gb/s)
26 μW(30GHz)
28 μW (39.8 Gb/s
- 43.0 Gb/s)
44 μW(65GHz) 72 μW(80GHz)
15 μW(25.8,
27.7 Gb/s)
19 μW(30GHz)
20 μW(39.8Gb/s
- 43.0 Gb/s)
33 μW(65GHz) 55 μW(80GHz)
10.0 μWat20GHz
20.0 μWat30GHz
2.4 μW (’Full BW’ and Option 10G lters)
1310 nm 1550 nm 1310 nm 1550 nm
21 μW(25.8,
27.7 Gb/s)
44 μW(65GHz)
15 μW(25.8,
27.7 Gb/s)
33 μW(65GHz)
1.0 μW at 155 Mb/s, 622 Mb/s,
1063 Mb/s, 1250 Mb/s;
1.5 μW at 2.488/2.500 Gb/s
3.0 μWatalllter rates (1550/1310 nm) Standard
38 μW(25.8,
27.7 Gb/s)
45 μW(30GHz)
50 μW(39.8Gb/s
- 43.0 Gb/s)
75 μW(65GHz)
130 μW(80GHz)
28 μW(25.8,
27.7 Gb/s)
35 μW(30GHz)
38 μW (39.8 Gb/s
- 43.0 Gb/s)
60 μW(65GHz)
105 μW(80GHz)
8.0 μWatalllter rates;
14.0 μWat20GHz
30.0 μWat30GHz
2.5 μW(alllters except Option 10G)
5.0 μW (’Full BW’ and Option 10G lters)
38 μW(25.8,
27.7 Gb/s)
75 μW(65GHz)
28 μW(25.8,
27.7 Gb/s)
60 μW(65GHz)
Independent
Channel Deskew
Standard
Standard
Standard
Standard
Standard
Optical Sampling Module Characteristics (Cont.)
Module
Offset Capability
80C07B Standard Standard
80C08C Standard Standard 80C10B*5,
Standard Standard
Power Meter Power Meter Ran ge Power Meter Accuracy
+4 dBm to –30 dBm
0dBmto–30dBm
+13dBmto–21dBm
80C25GBE
80C11 Standard Standard
80C12 Standard Standard
*5Option CRTP reduces sensitivity by 0.6 dB (max) and increases noise by 15% (max).
19
*
Smallest power level for mask test. Values represent theoretical typical sensitivity of NRZ eyes for comparison purposes. Assumes i
+4 dBm to –30 dBm
0dBmto–30dBm
Mask Test Optical
5% of reading –22 dBm at 155 Mb/s,
–20 dBm at 2488/2500 Mb/s
5% of reading –16 dBm at all lter rates 5% of reading 25.8 and 27.7 Gb/s:
–8 dBm (1550 nm) and
39.813 to 43.018 Gb/s:
–7 dBm (1550 nm) and
5% of reading –10 dBm at all lter rates;
5% of reading –19 dBm (for all options
–14 dBm (for Option 10G)
nstrument peak-peak noiseconsumes most of the mask margin.
Sensitivity*
19
622 Mb/s;
–7 dBm (1310 nm);
–6 dBm (1310 nm)
–7 dBm at 20 GHz;
–4 dBm at 30 GHz
except Option 10G)
www.tektronix.com 19
Data Sheet
Optical Sampling Module Characteristics (Cont.)
Module
80C07B 80C08C
80C10B 80C11
80C25GBE
*20Low ER signals (ER 6 dB): signal passes 802.3ae-like mask (scaled horizontally for bit rate); 105samples
in mask. High ER signals (ER > 6 dB): signal passes OC-192-like mask (scaled horizontally for bit rate);
5
10
samples in mask.
Extinction Ratio Calib rated Accuracy (Opt.
Reference Filter
in Range [Gb/s]
01 ER Calibrated)*
Repeatability
(Typical) (to i tself
and to other
80Cxx-Opt. 01)
9.9…11.3
±0.6% (–0.39 dB /
+0.42dBat12dB)
9.9…11.3
±0.6% (–0.39 dB / +0.42dBat12dB)
20
Option not available
±1.2% (–0.76 dB / +0.92dBat12dB)
Option not available
±1.2% (–0.76 dB / +0.92dBat12dB)
Option not available
Accuracy
TDR System (80E10, 80E08, 80E04 only)
Characteristic
Channels Input Impedance Channel Input
80E10 80E08 80E04
222
50 nominal 50 nominal 50 nominal
1.85 mm 2.92 mm 3.5 mm
Connector Bandwidth
TDR Step Amplitude
TDR System
50 GHz 30 GHz 20 GHz
250 mV (polarity
of either step may
be inverted)
250 mV (polarity
of either step may
be inverted)
15 ps 20 ps 28 ps
Reected Rise Time
TDR System
12 ps 18 ps 23 ps
Incident Rise Time TDR Step Deskew
±250 ps ±250 ps ±50 ps
Range TDR Sampler
±250 ps ±250 ps +100 ns – 500 ps
Deskew Range TDR Step
200kHz 200kHz 200kHz
250 mV (polarity
of either step may
be inverted)
(slot deskew only)
Maximum Repetition Rate
Physical Characteristics
Module
Width Height Depth Net
Dimensions (mm/in.) Weight (kg/lb.)
80C07B 165/6.5 25/1.0 305/12.0 <1.36/<3.0 80C08C 165/6.5 25/1.0 305/12.0 <1.22/<2.7 80C10B 165/6.5 25/1.0 305/12.0 <2.61/<5.75 80C11 165/6.5 25/1.0 305/12.0 <1.22/<2.7 80C12 165/6.5 25/1.0 305/12.0 <2.61/<5.75 80C25GBE 165/6.5 25/1.0 305/12.0 <2.61/<5.75
Electrical Sampling Module Characteristics
Module Application Type
80E10
True-differential TDR, S-parameters
and fault isolation
Ch
annels
2
Input Impedance
50 ±1.0 1.85 mm female, precision
adapter to 2.92 mm included
with 50 SMA termination
80E09
High-frequency, low-noise signal
acquisition and jitter characterization
2
50 ±1.0 1.85 mm female, precision
adapter to 2.92 mm included
with 50 SMA termination
80E08 80E07
True-differential TDR and S-parameters
Optimal noise/performance trade-off
2 2
50 ±1.0 2.92 mm female 30/20 GHz* 50 ±1.0 2.92 mm female 30/20 GHz*
for jitter characterization
80E06 High-speed electrical device
characterization
1
50 ±0.5 1.85 mm female, precision
adapter to 2.92 mm included
with 50 SMA termination
80E04 TDR impedance and crosstalk
2
50 ±0.5 3.5 mm female 20 GHz*
characterization
80E03 Device characterization 2 80E01
High-frequency, high maximum
operating range signal acquisition
1
50 ±0.5 3.5 mm female 20 GHz* 50 ±0.5 2.4 mm female, precision
adapter to 2.92 mm included
with 50 SMA termination
*11Calculated from .35 bandwidth rise time product.
21
Values shown are warranted unless printed in an italic typeface which represents an unwarranted characteristic value that the instrument will typically perform to.
*
22
User selectable.
*
annel Input
Ch
nnector
Co
ndwidth*
Ba
50/40/30 GHz*
60/40/30 GHz*
70+ GHz
50 GHz
21
11, 2 2
11, 2 2
11, 2 2
11, 2 2
11
11
20 www.tektronix.com
Electrical Sampling Module Characteristics (Cont.)
Module Rise Time
(10-90%)
80E10 80E09 80E08 80E07 80E06
7ps*
5.8 ps*
11. 7 ps*
11. 7 ps*
5.0 ps*
11
11
11
11
23
80E04 17.5 ps 1.0 V 80E03 17.5 ps 1.0 V 80E01
*11Calculated from .35 bandwidth rise time product.
23
ted from formula rise time = 0.35/(typical bandwidth).
*
Calcula
11. 7 ps*
11
Dynamic Range
1.0 V
p-p
1.0 V
p-p
1.0 V
p-p
1.0 V
p-p
1.0 V
p-p
p-p
p-p
1.0 V
p-p
Digital Serial Analyzer Sampling Oscilloscope — DSA8200
Offset Range Maximum Operating
Vol t age
Voltage, DC+AC
±1.1 V ±1.1 V 2.0 V ±1.1 V ±1.1 V 2.0 V ±1.1 V ±1.1 V 2.0 V ±1.1 V ±1.1 V 2.0 V ±1.6 V ±1.6 V 2.0 V ±1.6 V ±1.6 V 3.0 V ±1.6 V ±1.6 V 3.0 V ±1.6 V ±1.6 V 2.0 V
Maximum
Nondestruct
Vertical Number of
Digitized Bits
p-p
14 bits full scale 14 bits full scale 14 bits full scale 14 bits full scale 14 bits full scale 14 bits full scale 14 bits full scale 14 bits full scale
www.tektronix.com 21
Data Sheet
Electrical Sampling Module Characteristics (Cont.)
Module
80E10
80E09
80E08
80E07
23
80E06*
E04
80
80E03
80E01
*10Values shown are warranted unless printed in an italic typeface which represents a typical value.
23
Calculated from formula rise time = 0.35/(typical bandwidth).
*
Vertical Sensitivity Range DC Vertical Voltage Accuracy,
Single Point, within ±2 °C of
Compensated Temperature
10 mV to 1.0 V full scale ±[2 mV + 0.007 (Offset) +
0.02 (Vertical Value – Offset)]
10 mV to 1.0 V full scale ±[2 mV + 0.007 (Offset) +
0.02 (Vertical Value – Offset)]
10 mV to 1.0 V full scale ±[2 mV + 0.007 (Offset) +
0.02 (Vertical Value – Offset)]
10 mV to 1.0 V full scale ±[2 mV + 0.007 (Offset) +
0.02 (Vertical Value – Offset)]
10 mV to 1.0 V full scale ±[2 mV + 0.007 (Offset) +
0.02 (Vertical Value – Offset)]
10 mV to 1.0 V full scale ±[2 mV + 0.007 (Offset) +
0.02 (Vertical Value – Offset)]
10 mV to 1.0 V full scale ±[2 mV + 0.007 (Offset) +
0.02 (Vertical Value – Offset)]
10 mV to 1.0 V full scale ±[2 mV + 0.007 (Offset) +
0.02 (Vertical Value – Offset)]
Typical Step Response Aberrations RMS Noise*
±1% or less over the zone 10 ns to 20 ps before step transition; +6%, –10% or less
for the rst 400 ps following step transition;
50 GHz: 600 μV, 700 μV 40 GHz: 370 μV, 480 μV 30 GHz: 300 μV, 410 μV
+0%, –4% or less over the zone 400 ps
to 3 ns following step transition; +1%,
–2% or less over the zone 3 ns to 100 ns
following step transition; ±1% after 100 ns
following step transition
±1% or less over the zone 10 ns to 20 ps before step transition; +6%, –10% or less
for the rst 400 ps following step transition;
60 GHz: 450 μV, 600 μV 40 GHz: 330 μV, 480 μV 30 GHz: 300 μV, 410 μV
+0%, –4% or less over the zone 400 ps
to 3 ns following step transition; +1%,
–2% or less over the zone 3 ns to 100 ns
following step transition; ±1% after 100 ns
following step transition
±1% or less over the zone 10 ns to 20 ps before step transition; +6%, –10% or less
30 GHz: 300 μV, 410 μV 20 GHz: 280 μV, 380 μV
for the rst 400 ps following step transition;
+0%, –4% or less over the zone 400 ps
to 3 ns following step transition; +1%,
–2% or less over the zone 3 ns to 100 ns
following step transition; ±1% after 100 ns
following step transition
±1% or less over the zone 10 ns to 20 ps before step transition; +6%, –10% or less
30 GHz: 300 μV, 410 μV 20 GHz: 280 μV, 380 μV
for the rst 400 ps following step transition;
+0%, –4% or less over the zone 400 ps
to 3 ns following step transition; +1%,
–2% or less over the zone 3 ns to 100 ns
following step transition; ±1% after 100 ns
following step transition
±5% or less for rst 300 ps following
1.8 mV, 2.4 mV (maximum)
step transition
±3% or less over the zone 10 ns to 20 ps
600 µV, 1.2 mV (maximum) before step transition; +10%, –5% or less for the rst 300 ps following step transition; ±3% or less over the zone 300 ps to 5 ns following
step transition; ±1% or less over the zone
5 ns to 100 ns following step transition; 0.5%
after 100 ns following step transition
±3% or less over the zone 10 ns to 20 ps
600 µV, 1.2 mV (maximum) before step transition; +10%, –5% or less for the rst 300 ps following step transition; ±3% or less over the zone 300 ps to 5 ns following
step transition; ±1% or less over the zone
5 ns to 100 ns following step transition;
±0.5% after 100 ns following step transition
±3% or less over the zone 10 ns to 20 ps
1.8 mV, 2.3 mV (maximum)
before step transition; +12%, –5% or
less for the rst 300 ps following step
transition; +5.5%, –3% or less over the
zone 300 ps to 3 ns following step transition;
±1% or less over the zone 3 ns to 100 ns
following step transition; ±0.5% after
100 ns following step transition
10
22 www.tektronix.com
S-parameter Performance Characteristics (80E10)
Measurement Conditions
All measurements were performed after proper warm up as specied in the DSA8200 manual
Standard S-parameter dynamic range measurement practices were used to determine the dynamic range of the m
Uncertainty results were derived from a wide range of devices, with 250 averages
Better dynamic range can be achieved by selecting lower bandwidth settings on the 80E10 modu le due to lower RMS noise oor
Results apply to single-ended or differential measurements
odule
Digital Serial Analyzer Sampling Oscilloscope — DSA8200
Dynamic Range
Uncertainty
www.tektronix.com 23
Data Sheet
Physical Characteristics for Electrical Sampling Modules
Module
24
80E10*
24
80E09*
24
80E08*
24
80E07* 80E06 80E04 80E03 80E01
*24Remote module characteristics.
80A05 and 80
Product Feature 80A05 80A07
Supported
A07 Electrical Clock Recovery Module
Specications
Dimensions (mm/in.)
Width Height Depth Net
55/2.2 25/1.0 75/3.0 0.175/0.37 55/2.2 25/1.0 75/3.0 0.175/0.37 55/2.2 25/1.0 75/3.0 0.175/0.37 55/2.2 25/1.0 75/3.0 0.175/0.37 79/3.1 25/1.0 135/5.3 0.4/0.87 79/3.1 25/1.0 135/5.3 0.4/0.87 79/3.1 25/1.0 135/5.3 0.4/0.87 79/3.1 25/1.0 135/5.3 0.4/0.87
Standard Option 10G
Weight (kg/lb.)
Enumerated Standards OC3/STM1 155.52 Mb/s OC12/STM4 622.08 Mb/s Fibre Channel 1.063 Gb/s Gigabit
1.25 Gb/s
■■
■■■
■■■
■■■
25
*
Ethernet SAS Gen I 1.50 Gb/s ♦*
2GBFibre
2.125 Gb/s
26
26
*
■■■
Channel OC48/STM16 2.488 Gb/s
2 GB Ethernet 2.50 Gb/s PCI Express I 2.50 Gb/s ♦* Inniband
2.5G G.709
®
2.50 Gb/s
2.666 Gb/s
■■■
■■■
26
26
*
■■
■■
25
*
25
*
FEC SAS Gen II 3.0 Gb/s ♦*
XAUI,
3.125 Gb/s
26
26
*
■■
25
*
10GBASE-X
GB Fibre
10
annel x4
Ch 4GBFibre
188 Gb/s
3.
4.25 Gb/s
■■
■■■
25
*
Channel FB-DIMM1 3.2, 4.0,
25, 26
*
4.8 Gb/s
PCI Express II 5.0 Gb/s ♦* FB-DIMM2 4.8, 6.4, 8.0,
25, 26
25, 26
*
9.6 Gb/s
OIF CEI 6+ Gb/s ♦* 2x XAUI 8GBFibre
9
Channel*
6.25 Gb/s
8.50 Gb/s
OC192/STM64 9.953 Gb/s XFP/XFI
9.95-11.2
25
■■
25
*
25
*
Product Feature 80A05 80A07
Standard Option 10G
10GBASE-W 9.953 Gb/s 10GBASE-R*910.31 Gb/s 10GB Fibre
10.51 Gb/s
■■
25
*
25
*
Channel G.975 FEC 10.66 Gb/s
G.709 FEC 10.71 Gb/s OIF CEI 11+ Gb/s ♦* 10 GbE w/
11. 10 Gb/s
25
25
*
25
*
25
*
FEC Super FEC 12.50 Gb/s
25
*
Additional enumerated standard
rates are supported with
8000 Series Firmware Releases
higher than 2.4.x
Clock Recovery Ranges for Custom (User specied) Rates (in addition to enumerated lists above)
50 Mb/s to
3.188 Gb/s
4.25 Gb/s
50 Mb/s to
3.188 Gb/s
3.267 to
4.25 Gb/s
100 Mb/s to
12.5 Gb/s
continuous
4.900 to
6.375 Gb/s
9.800 to
12.60 Gb/s
Sensitivity (Clock recovery will lock, differential data is given for each input) Lowest Supported Rate to
2.70 Gb/s
2.70 to 11.19 Gb/s Differential
Differential 8mV
Single Ended 10 mV
12 mV
Single Ended
15 mV
p-p
p-p
Differential
15 mV (typ)
Single Ended
30 mV (typ)
p-p
p-p
11.19 to 12.60 Gb/s Differential
15 mV
p-p
Single Ended
20 mV
p-p
*9Draft version of the 8.5GFClter. T11committee redened this lter at the April 2008 meeting. New 8.5GFC
lter, as dened by T11 committee in April 2009, is identical to the 10BASE-R 10.313G lter and is available for 80C12 Option 10G modules only; and is identied as 10BASE-R.
25
*
The standard is not enumerated but is supported as a custom rate.
26
*
No spread spectrum clocking support.
DSA8200 Mainframe Physical Characteristics
Dimensions (mm/in.) Weight (kg/lb.)
Width Height Depth Net
457/18.0 343/13.5 419/16.5 21/46
Computer System and Peripherals
Characteristic
Operating System
Description
Windows XP CPU Intel Celeron 2.93 GHz processor PC System Memory Hard Disk Drive DVD-ROM/CD-RW
Drive
512 MB
Rear-panel, removable hard disk drive, 40 GB capacity
Front-panel DVD-ReadOnly/CD-ReadWrite drive with
CD-creation software application
24 www.tektronix.com
Digital Serial Analyzer Sampling Oscilloscope — DSA8200
Input/Output Ports
Characteristic
Front Panel
USB 2.0 Port One USB 2.0 connector Anti-static
Connection Trigger Direct Input
Trigger Pre-scale Input
Internal Clock Output
External 10 MHz Reference Input
DC Calibration Output
Rear Panel
USB Ports 4 USB 2.0 connectors
lPort
Paralle LAN Port Serial Port DB-9 COM1 port GPIB VGA Video Port DB-15 female connector; connect a second monitor to use
Oscilloscope VGA Video Port
Gated Trigger Input (Option GT only); See Trigger System specication
Description
Banana-jack connector, 1 M
See Trigger System specication See Trigger System specication
See Trigger System specication
±5 V maximum
±1.25 V maximum
4, DB-25 connector
IEEE 128 RJ-45 connector, supports 10BASE-T, 100BASE-T
.2 connector
IEEE488
dual-monitor display mode DB-15 female connector, connect to show the oscilloscope
display, including live waveforms on an external monitor or projector
Operating Requirements
cription
Characteristic
er Requirements
Pow
e voltage and
Lin
quency
fre
Environmental Characteristics
perature
Tem
Operating +10 °C to +40 °C
noperating
No lative Humidity
Re
Operating (Floppy disk and CD-ROM not installed)
Nonoperating
Altitude
Operating 3,048 m (10,000 ft.) Nonoperating
Electromagnetic Compatibility
Safety UL3111-1, CSA1010.1, EN61010-1, IEC61010-1
Des
100 to 240 V AC ±10% 50/60 Hz 115 V AC ±10% 400 Hz
–22 °C to +60 °C
20% to 80% at or below 40 °C (upper limit de-rates to 45% relative humidity at 40 °C)
5% to 90% at or below 60 °C (upper limit de-rates to 20% relative humidity at +60 °C)
12,190 m (40,000 ft.) 89/336/EEC
Ordering Information
DSA8200 Digital Serial Analyzer Sampling Oscilloscope
Includes: Use
and mouse, tou With OpenCho analysis wit Windows osci and The MathW featured on a
Options
Option
Opt. GT Gated Trigger Opt. JARB Jitter Analysis of Arbitrary Data (included with purchase
Opt. JNB Opt. JNB01
Service Options
Option
Opt. C3 Calibration Service 3 Years Opt. C5 Calibration Service 5 Years Opt. D1 Calibration Data Report Opt. D3 Calibration Data Report 3 Years (with Opt. C3) Opt. D5 Calibration Data Report 5 Years (with Opt. C5) Opt. R3 Repair Service 3 Years Opt. R5 Repair Service 5 Years
International Power Plug Options
Option
Opt. A0 Opt. A1 Universal EURO Opt. A2 Opt. A3 Opt. A4 Opt. A5 Switzerland Opt. A10 China Opt. A99
r manual, quick reference card, MS Windows XP compatible keyboard
ch screen stylus, online help, programmer online guide, power cord.
ice™ software, Tektronix provides enhanced test and measurement
h the capability of full integration of third-party software o n the open
lloscopes. By working with the industry leaders, National Instruments
orks, examples of software programs from these companies are
ll Tektronix open Windows oscilloscopes.
Description
of Opt. JNB or Opt. JNB01). See 80SJARB for more
information
Essential and Advanced Jitter, Noise, and BER Analysis
Software. See 80SJNB Essentials and 80SJNB Advanced
for more information
Description
Description
North America
United Kingdom
Australia
240 V, North America
No power cord
www.tektronix.com 25
Data Sheet
Other Accessories
Accessory Description
Sampling Module Extender Cable (2 meter) Order 80N01 (not compatible with 80E10, 80E09, 80E08, or 80E07 modules) SlotSaver Adapter Extender Cable Brings power and control to the 80A06 when operated externally from the mainframe, saving slot space (compatible with 80A06
82A04 Filter 2 GHz Filter kit for non-sinusoidal phase reference clock signal with frequency between 2 GHz and 4 GHz. Order 020-2566-xx 82A04 Filter 4 GHz Filter kit for non-sinusoidal phase reference clock signal with frequency between 4 GHz and 6 GHz. Order 020-2567-xx 82A04 Filter 6 GHz Filter kit for non-sinusoidal phase reference clock signal with frequency between 6 GHz and 8 GHz. Order 020-2568-xx 2X Attenuator (SMA male-to-female) DC to 18 GHz. Order 015-1001-xx 5X Attenuator (SMA male-to-female) DC to 18 GHz. Order 015-1002-xx Connector Adapter (2.4 mm or 1.85 mm male to 2.92 mm female) DC to 40 GHz. Order 011-0157-xx Power Divider Rackmount Kit Wrist Strap (Anti-static) Order 006-3415-04 P7513/P7516 13 GHz and 16 GHz TriMode™ Differential probes. Requires 80A03 Interface module P7260 P7350 P7350SMA 5 GHz 50 Differential to Single-ended Active Probe. Requires 80A03 Interface module. Note that the P7380 probes are
P7380SMA 8 GHz 50 Differential to Single-ended Active Probe. Requires 80A03 Interface module P6150
P8018 P80318 80A01
80A02 80A03 82A04
80A05
The standard version of 80A05 supports signals in the following ranges:
The Option 10G adds the ranges of: 3.267 Gb/s - 4.250 Gb/s
80A06
80A07
80SJARB 80SJARB Jitter Analysis of Arbitrary Data software. Provides a basic jitter measurement tool capable of measuring jitter on
80SJNB Essentials 80SJNB Essentials with Jitter, Noise, and BER Analysis software. Provides separation of jitter and noise into their constituent
80SJNB Advanced 80SJNB Advanced adds equalization, channel emulation, xture de-embedding. Also see Opt. JNB/JNB01
and 80A02). Order 174-5230-xx
50 , impedance matching power divider, SMA male to two SMA females. Order 015-0705-xx Order 016-1791-xx
6 GHz Active FET Probe. Requires 80A03 Interface module 5 GHz Active FET Probe. Requires 80A03 Interface module
recommended over the P7350 probes for sampling purposes due to their higher bandwidth and signal delity
9 GHz Passive Probe; the probe consists of a very high-quality 20 GHz probe tips, plus an extremely exible SMA cable. For higher frequency performance the 015-0560-xx, or some of the accessory cables listed can be used
20 GHz Single-ended TDR Probe. 80A02 module recommended for static protection of the sampling or TDR module 18 GHz 100 Differential Impedance TDR Hand Probe Pre-scaled Trigger Amplier. Not required on the DSA8200, CSA8200, or TDS8200 mainframes with their increased sensitivity
pre-scaler. The amplier enhances pre-scaler sensitivity on the older TDS8000B and CSA8000B mainframes DSA8200 EOS/ESD Protection module (1 channel). P8018 TDR probe recommended Enables the use of two Tektronix P7000 Series TekConnect™ probes on the DSA8200 or 8000 Series sampling oscilloscopes Phase Reference module for low-jitter acquisition (with or without trigger). Accepts signals from 2 GHz to 25 GHz (external lter
might be required below 8 GHz), or to 60 GHz with Option 60G Electrical Clock Recovery module. Applicable to electrical signals and for the 80C12 50 Mb/s - 2.700 Gb/s
2.700 Gb/s - 3.188 Gb/s Rate of 4 Gigabit Fibre Channel 4.250 Gb/s
4.900 Gb/s - 6.375 Gb/s
9.800 Gb/s - 12.60 Gb/s PatternSync module for 80SJNB jitter analysis package. Programmable divider for creating a trigger pulse from patterns up to
23
2
in length
Electrical Clock Recovery module. 80A07 recovers clocks from serial data streams for all of the most common electrical standards in the continuous 100 Mb/s to 12.5 GB/s range. Applicable to electrical signals and for 80C12
any waveform – random or repetitive. Also see Opt. JARB
components and provides highly accurate eye-opening and BER calculations. Also see Opt. JNB/JNB01
26 www.tektronix.com
Digital Serial Analyzer Sampling Oscilloscope — DSA8200
Interconnect Cables (3rdParty)
Tektronix recommends using quality high-performance interconnect cables with these high-bandwidth products in order to minimize measurement degradation and variations. The W.L. Gore and Associates’ cable assemblies listed below are compatiblewiththe2.92mm,2.4mm,and1.85mmconnectorinterfaceofthe 80Exx modules. Assemblies can be ordered by contacting Gore by phone at (800) 356-4622, or on the Web at www.gore.com/tektronix
Calibration Kits and Accessories (3
To facilitate S-parameter measurements with the new 80E10, 80E08, and 80E04 electrical TDR modules and IConnect
rd
Party)
®
software, we recommend precision calibration kits, adapter kits, connector savers, airlines, torque wrenches, and connector gauges from Maury Microwave. These components, accessible at www.maurymw.com/tektronix.htm, are compatible with the 2.92 mm, 2.4 mm, and
1.85 mm connector interface of the 80Exx modules. Cal kits and other components can be ordered by contacting Maury Microwave.
Interconnect Cables
015-0560-xx (450 mm / 18 in.; 1 dB loss at 20 GHz) cable is a high-quality cable recommended for work up to 20 GHz.
Cable
Bench Top Test Cable Assemblies
TEK40PF18PP TEK50PF18PP TEK65PF18PP
High-frequency Interconnect Cables for Electrical Sampling Modules
TEK40HF06PP TEK40HF06PS 40 GHz
Frequency
40 GHz 50 GHz 65 GHz
40 GHz
Connectors
2.92 mm male 18.0 inches
2.4 mm male 18.0 inches
1.85 mm male 18.0 inches
2.92 mm male 6.0 inches
2.92 mm male;
Length
6.0 inches
2.92 mm female
TEK50HF06PP
50 GHz
TEK50HF06PS 50 GHz
2.4 mm male 6 .0 inches
2.4 mm male;
6.0 inches
2.4 mm female
TEK65HF06PP TEK65HF0
6PS
65 GHz 65 GHz
1.85 mm male 6.0 inches
1.85 mm male,
6.0 inches
1.85 mm female
Product(s) are manufactured in ISO registered facilities.
www.tektronix.com 27
Data Sheet
Contact Tektronix:
ASEAN / Australa
Balkans, Israel, South Africa and other ISE Countries +41 52 675 3777
Central East Eu
Mexico, Central/South America & Caribbean (52) 56 04 50 90
* European toll-free number. If not accessible, call: +41 52 675 3777
rope, Ukraine, and the Baltics +41 52 675 3777
Central Europe & Greece +41 52 675 3777
Asia, and North Africa +41 52 675 3777
Middle Eas t,
The Netherlands 00800 2255 4835*
People’s Rep
Republic of
Russia & CIS +7 (495) 7484900
United Kingdom & Ireland 00800 2255 4835*
sia (65) 6356 3900
Austria 00800 2255 4835*
Belgium 00800 22
Brazil +55(11)37597600
Canada 1 800 833 9200
Denmark +4580881401
Finland +41526
France 008 00 2255 4835*
Germany 00800 2255 4835*
Hong Kong 400 8
India 000 800 650 1835
Italy 00800 2255 4835*
Japan 81 (3) 67
Luxembourg +41526753777
ublic of China 400 820 5835
Poland +41 52 675 3777
Korea 001 800 8255 2835
South Africa +41526753777
Spain 00800
Sweden 008 00 2255 4835*
Switzerland 00800 2255 4835*
Tai wa n 886 (
55 4835*
75 3777
20 5835
14 3010
Norway 800 16098
Portugal 80 08 12370
2255 4835*
2) 2722 9622
USA 1 800 833 9200
Updated 25 May 2010
www.tektronix.com
For Further Information. Tektronix maintains a comprehensive, constantly expanding collection of application notes, technical briefs and othe r resources to help engineers working on the cutting edge of technology. Please visit www.tektronix.com
t © Tektronix, Inc. All rights reserved. Tektronix products are covered by U.S. and foreign patents,
Copyrigh
d pending. Information in this publication supersedes that in all previously published material.
issued an
tion and price change privileges reserved. TEKTRONIX and TEK are registered trademarks of
Specica
x, Inc. All other trade names referenced are the service marks, trademarks, or registered trademarks
Tek tro ni
espective companies.
of their r
21 Jun 2010 85W-17654-17
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