Tektronix DSA8200 DATASHEET

Digital Serial Analyzer Sampling Oscilloscope

DSA8200 Data Sheet

Jitter, Noise, BER, and Serial Data Link Analysis

Measures and Separates Deterministic Data-dependent Jitter from
Random Jitter

tical Noise, Separating Deterministic Data-dependent

er for Fixture De-embedding, Linear Filtering

at 50 GHz

RMS

rd

party Software

Features & Benefits

State-of-the-Art Sampling Oscilloscope for Communication Signal
Analysis, TDR / TDT / Serial Data Network Analysis, Acquisition, and
Measurements of Repetitive Ultrafast Signals

Acquisition of Spread Spectrum Clocking (SSC) Signals

y’s Only M ainframe to Support up to 8 Input Channels for

Industr
Increased Flexibility and Throughput
Four Color-graded, Variable Persistence Waveform Databases
Measurement System with Over 100 Automated Measurements
Complete Suite of Communications Measurements includes Both
Types of OMA, SSC Pro file, and Many Others

ted ITU/ANSI/IEEE Mask Testing

Automa
Masks and Measurements for SONET/SDH, FC, Ethernet, and Other
Standards Built-in
Mask Updates can be Loa ded from Factory-supplied File
Mask Margin Testing for Guard Banding Production Testing

Acquisition Modules

Fully Integrated Multirate Optical Modules
Optical Modules up to 80 GHz 80C10B

ccuracy "ER Calibrated" Measurement Available in Some

High-a
Modules
Electrical Modules up to 70+ GHz Bandwidth and 5 ps Measured Rise
Time (10-90%)
Flexible Rate Clock Recovery
Clock Recovery with SSC (Spread Spectrum Clocking) Support

able

Avail

Measures Ver
Noise from Random Noise
Highly Accurate BER and Eye Contour Estimation, Support for
DDPWS
FFE/DFE Equalization, Transmitter Equalization
Channel Emulation for Channels with >30 dB of Loss
Linear Filt

TDR (Time Domain Reflectometry)

Up to 50 GHz TDR Ba ndwidth with 15 ps Reflected Rise Time and
12 ps Incident Rise Time
Lowest Noise for Accurate Repeatable TDR Measurement R esults –
600 μV
Independent Sampler Deskew ensures Easy Fixture and Probe
De-embedding
Industry’s Only Mainframe to Accommodate up to Four
True-differential TDR or Electrical Channel Pairs for Increased
System Versatility

S-parameters Measurements

Up to 50 GHz Differential, Single Ended, Mixed Mode; Insertion,
Return Loss, Frequency Domain Crosstalk
PCI Express, Serial ATA, Infiniband, Gigabit Ethernet Manufacturing,
and Standard Compliance Testing for Gigabit Signal Path and
Interconnects – Including Eye Mask Tests
Intuitive, Easy, and Accurate for S erial Data, Gigabit Digital Design,
and Signal Integrity
Fast and Accurate Automated Multiport S-parameter Measurements
with Command Line Interface

Industry’s Best Standard Time-base Jitter Perform ance, 800 fs

Industry-leading Time-base Jitter Performance, <200 fs
with Phase Reference Mode

Fast Acquisition Rate and High Throu ghput

True-differential Remote Sampler enabling Placement Near DUT for
Superior Signal Fidelity

FrameScan™ Acquisition Mode with Eye Diagram Averaging:

Isolate Data-dependent Faults
Examine Low-power Signals

MS Windows XP Operating System

ced Connectivity to 3

Advan

*1Available

RMS

RMS

Data Sheet

Applications

Design/Verification of Telecom and Datacom Components and Systems

Manufacturing/Testing for ITU/ANSI/IEEE/SON ET/SDH Compliance

High-performance True-differential TDR Measurements

Advanced Jitter, Noise, and BER Analysis

Impedance Characterization and Network A nalysis for Serial Data
Applications including S -parameters

Channel and Eye Diagram Simulation and Measurement-based SPICE
Modeling

*1Typical, with the Phase Reference module, some conditions apply. Without the module, the jitter is

<800 fs

(typical).

RMS

Superior Performance with Extraordinary
Versatility

For developing today’s high-speed serial devices, the DSA8200 D igital
Serial Analyzer sampling oscilloscope is the most versatile tool for
communication, computer and consumer electronics gigabit transmitter and
signal path characterization, and compliance verification. With exceptional
bandwidth, signal fidelity, and the most extensible modular architecture, the
DSA8200 provides the highest performance TDR and inte rconnect analysis,
most accurate ana lysis of signal impairments, and BER calculations for
current and emerging serial data technology.

The DSA8200 provides unmatch ed measurement system fidelity with
ultra-low jitter floor that ensures the most accurate acquisition of high-speed
signals. You get advanced analysis benefits from the 200 fs acquisition
jitter with the Phase Reference module. And in another step forward for a
sampling oscilloscope, with the help of the Phase R efe rence module the
DSA8200 can acquire and measure SSC (Spread Spectrum Clocking)
signals.

The multiprocessor architecture, with dedicated per-slot digital signal
processors (DSPs), provides fast waveform acquisition rates, reducing
the test times necessary for reliable characterization and compliance
verification.

The DSA8200’s versatile modular architecture supports a large and growing
family of plug-ins enabling you to configure your measurement syst
a wide variety of electrical, optical, and accessory modules that best suit
your application now an d in the future. With 6 module slots, the DSA8200
can simultaneously accommodate a Clock Recovery module, a pre cision
Phase Reference modu le, and multiple acquisition modules, electrical or
optical, so you can match system performance to your evolving needs.

Featuring industry-leading signal fidelity, the family of electrical modules
includes bandwidth performance from 12 GHz to 70+ GHz. Two

ferential Time Domain Reflecto meter (TDR) modules, with remote

true-dif

em with

samplers, offer up to 50 GHz bandwidth and 15 ps reflected rise time
and 12 ps incident rise time. The family of low-noise variable-bandwidth
electrical mod
remote samplers, featuring 450 μV

ules provides the industry’s best noise perfo rmance with

noise at 60 GHz, and 300 μV

RMS

RMS

at

30 GHz.

DSA8200 optical modules provide complete optical test solutions with
superior system fidelity from 125 Mb/s to 43 Gb/s and beyond. The modules
cover a range of waveleng ths for both single- a nd multi-mode fibres. Each
module can be option ally configured with a number of selectable data rate
filters, optical reference receivers (ORR), and/or a full bandwidth path. The
80C07B, 80C08

C, and 80C11 can be configured with a number o f available
flexible integrated clock recovery options. The 80C12 Multirate mod ule
clock recovery support is achieved with an electrical output for use with the
80A05 or 80A07 Electrical Clock Recovery modules.

The DSA8200’s popular Fram eScan™ acquisition m ode can be
used with patterns from DUTs, BERTs, and other sources, to isolate
pattern-dependent e ffects in transmitters or show the bit sequence
preceding a mask violation. FrameScan automatically sequences the time
base so that e

ach bit of the data s tream is acquired in time order. When
used in combination with mask-testing conditional acquisition features of
the DSA8200, such as stop after mask hits, FrameScan can automatically
identify at which bit a pattern-dependent failure occurred.

In addition, specialized modules supporting features such as single-ended
and differential electrical clock recovery, electrostatic protection for the TDR,
and connectivity to the popular TekConnect probing system brings you the
performance of Tektronix state-of-the-art probes for high-impedance and

al probing. Low-impedance probes for 50 Ω probing an d for TDR

differenti
probing are also available.

Jitter, Noise, BER, and Serial Data Link
Analysis

High-speed serial data link m easurements and analysis are supp orted with
three software solution s: 80SJARB, 80SJNB Essentials,and80SJNB

Advanced.

80SJARB is a basic jitter measurement tool capable of measuring jitter on

any wavefo
the amount of analysis possible so only the simplest decomposition can be
used; repeatability is pattern de pendent.

80SJNB Essentials offers complete analysis of jitter, noise, and BER,
with decomposition of components for clear understanding of a signal’s
problems and margins. The acquisition methodology requires a repetitive
pattern. Both accuracy and repeatability are improved relative to 80SJARB
since the tool has access to the complete signal pattern.

80SJNB Advanced ad ds features to 80SJNB Essentials for Serial Data
Link Analysis – de-embedding of fixture, channel emulation, FFE/DFE
equaliza

rm – random or repetitive. The simplicity of acquisition limits

tion, pre-emphasis/de-emphasis.

2 www.tektronix.com

TDR and electrical modules with fully integrated remote sampler.

Digital Serial Analyzer Sampling Oscilloscope — DSA8200

TDR (Time Domain Reflectometry)

The DSA8200 is the industry’s highest performance fully integrated
Time Domain Reflecto metry (TDR) measurement system. Offering
true-differential TDR measurements up to 50 GHz bandwidth with 15 ps
reflected rise time and 12 ps incident rise time, you are able to keep
pace with today’s most demanding Serial Data Network Analysis (SDNA)
requirements.

The new 80E10 and 80E08 TDR modules feature a fully integrated
independent dual-channel 2-meter remote sampler system to minimize
fixturing and assure optimal system fidelity. Independent sampler deskew
ensures fast and easy fixture and probe de-embedding. The user can

erize differential crosstalk by using TDR steps from a differential

charact
module to drive one line pair while monitoring a second line pair with a
second differential module.

Small form factor remote sampler enables placement near DUT assuring optimal signal
fidelity.

The DSA8200 is the industry’s most versatile TDR measurement system,
accommodating up to 4 dual-channel true-differential TDR modules for fast
accurate

The P80318 True-differential TDR probe and P8018 Single-ended Passive
Handheld
board impedance and electrical signal characterization. The P80318, an
18 GHz 100 Ω input impedance differential TDR hand probe , enables
high-fidelity impedance measurements of d ifferential transmission lines.
The adjustable probe pitch enables a wide variety of differential line spacing
and impedances. The P8018 is a 20 GHz Single-ended Passive Handheld
TDR prob
probes but are especially designed to work with the 80A02 for the control of
EOS/ESD protection.

multilane impedance characterization.

TDR probe provide high-perform ance probing solutions for circuit

e. Both the P80318 and P8018 can be used as stand-alone

www.tektronix.com 3

Data Sheet

Gigabit Signal Path Characterization and
Analysis – Serial Data Network Analysis
(SDNA)

As clock speeds and rise times of digital circuits increase, interconnect
signal integrity dramatically affects digital system performance. Accurate
and efficient Serial Da ta Network Analysis (SDNA) of the signal path and
interconnects in time and frequency domains is critical to predict signal
losses, jitter, crosstalk, terminations and ringing, digital bit errors, and eye
diagram degradation, ensuring reliable system operation.

Tektronix offers several true-differential TDR modules, which in co mbination
with IConnect
–70 dB of dynamic range. This performance assures accurate repeatable
measurement in serial data analysis, digital design, signal integrity, and
electrical compliance testing applications.

The table below summarizes th e S-parameter measurement bandwidth
performance when IConnect and the true-differential TDR modules are used
in combination.

®

software, allow S-parameters measurements with up to

entify the exact location of faults with the 80E10’s sub-millimeter resolution and

Quickly id
IConnect T

rue Impedance Profile.

TDR Module

80E10
80E08
80E04

S-parameter Measurement Bandwidth
Performance

50 GHz
30 GHz
20 GHz

With the long record length acquisitions, IConnect®provides great flexibility
for obtaining the desired freq uency range and frequency st ep when
performing S-parameter measurements. Up to 1,000,000 points can be
acquired*

When you employ IConnect

2

.

®

Signal Integrity TDR and S-parameter
software with the DSA8200 you have an efficient, easy-to-use, and
cost-effective solution for measurement-based performance evaluation
of multi-gigabit interconnect links and devices, including signal integrity
analysis, impedance, S-parameter, and eye-diagram tests, and fault
isolation. IConnect can help you complete interconnect analysis tasks in
minutes instead of days, resulting in faster system design time and lower
design costs. IConnect also enables impedance, S-parameters, and
eye-diagram compliance testing as required by many serial data standards,
as well as full channel analysis, Touchstone (SnP) file output, and SPICE
modeling for gigab it interconnects.

*2Long record lengths are supported only on DSA8200, CSA8200, TDS8200, CSA8000, and TDS8000

platforms.

Failure Analysis – Quickly Identify Fault
Location

The 80E10 provides superior resolution enabling the fastest and most
efficient fault isolation in package, circuit board, and on-chip failure analysis
applications.

Advanced Communication Signal Analysis

ally designed for ultra high-performance optical and electrical serial

Specific
data applications, the DSA8200 is the ideal tool for design characterization
and validation, as well as manufacturing test of datacom and telecom
components, transceiver suba sse m blies, and transmission systems. The
DSA8200 generates measurement results, not just raw data, with time
and amplitude histograms, mask testing, and statistical measurements. It

s a communications-tailored measurement set that includes jitter,

provide
noise, duty cycle, overshoot, undershoot, OMA, extinction ratio, Q-factor,
mean optical power, and amplitude. In add ition, you can do mask testing of
SONET/SDH, 100 Gigabit (4× 25), 10 Gigabit, Gigabit Ethernet, and other
electrical and optical standards compliance verification. Color grading and
grayscale grading of waveform data adds a third dimension, sample density,

signal acquisitions and analysis to provide visual insight. In addition,

to your
the variable persistence database feature enables exact data aging to all of
the functions, and facilitates eye measurements on DUTs under adjustment.

4 www.tektronix.com

Digital Serial Analyzer Sampling Oscilloscope — DSA8200

OpenChoice Software Enables Familiar Tools
to Extend Your Measurement System

The DSA8200 provides an open Windows environment offering ne w levels
of data analysis on the instrument using your favorite commercially available
third-party software packages. Additionally, TekVISA™, a standard software
accessory, al
applications (such as LabVIEW, LabWindows, Visual Basic, Microsoft
Excel, C, etc.) running on the instrument or on an external PC workstation’s
network connected to the instrument without the need of a GPIB hardware
interface. Plug-and-play drivers for LabVIEW and other programs are also
supplied.

The DSA8200 combines the familiarity of Microso ft’s Windows XP operating
system with world-class waveform acquisition technology. This platform
provides a wi
interfaces, including: GPIB, parallel printer port, RS-232-C, USB serial
ports, and an Ethernet LAN connection. In addition, the platform includes
a DVD-CD/RW combo drive and removable hard drive for storage of
waveforms, setups, and analysis results.

lows the instrument to be placed under the control of software

de array of standard instrumentation and communications

155 Mb/s to 12+ Gb/s Optical Test

Tektronix optical modules for DSA8200 offer highest level of integration in
the industry, with corresponding higher repeatability and transferability of
the result. A particularly method-sensitive measurement, Extinction Ratio
(ER) is now also available as ER Calibrated, with an additional layer of
improvement to the portability of the result (80C08C and 80C11 modules
only).

Fibre Channel applications at 8.5 Gb/s, 10.51, and 11.3 Gb/s. The 80C12
also provides telecom rate te sting at 9.95, 10.66, and 10.70 Gb/s. With
its amplified O/
performance and high optical sensitivity, allowing users to examine low
power level optical signals. Clock recovery for the 80C12 is provided
through the 80A05 or 80A07 Clock Recovery modules (sold separately).

E design, this module provides excellent signal-to-noise

80C11 30 GHz Long Wavelength Multirate 10 Gb/s
Optical Module

The 80C11 is optimized for testing of long wavelength signals (1100 to 1650
nm) at a number of rates around 10 Gb/s with a highly flexible multirate
filter. Additionally the high optical bandwidth of 30 GHz (typical) and the
excellent frequency response of its full bandwidth path is well suited for
general purpose high-performance optical component testing. The 80C11
can be configured with clock recovery options that supports any standard or
user-defined rate from 9.8 to 12.6 Gb/s.

80C07B 2.5 GHz Broad Wavelength Multirate 155 Mb/s
to 2.5 Gb/s Optical Module

The 80C07B is a broad-wavelength (7 00 to 1650 nm) multirate optical
sampling module optimized for testing datacom /telecom signals from 155 to
2500 Mb/s. With its amplified O/E design, this module provides excellent
signal-to-noise performance, allowing users to examine low-power optical
signals. The 80C07B can be optionally configured with multirate clock
recovery that operates from 155 to 2.7 M b/s.

40 Gb/s and 100 Gb/s Optical Test

80C08C 10 GH

z Broad Wavelength Multirate 10 G b/ s

Optical Module

The 80C08C is a broad-wavelength (700 to 1650 nm) mu ltirate optical
sampling module providing datacom rate testing for 10GbE applications at

9.95, 10.31, 11.09 Gb/s and 10G Fibre C hanne l applications at 10.51 Gb/s.
The 80C08C also provides telecom rate testing with several filters between

9.95 and 11.3 Gb/s. With its amplified O/E design, this module provides
excellent
users to examine low power level optical signals. The 80C08C can be
optionally configured with clock recovery option s that can support any
standard or user-defined rate in a continuous range from 9.8 to 12.6 Gb/s.

signal-to-noise performance and high optical sensitivity, allowing

80C12 Up to 10 GHz Broad Wavelength Multirate 1 Gb/s
to 10 Gb/s Optical Module

The 80C012 is a broad-wavelength (700 to 1650 nm) multirate optical
sampling module providing 1G, 2G, and 4G te lecom and datacom testing.
This high
rate applications (1 to 4 Gb/s) or a wide variety of 10 Gb/s applications.
The low data rate applications include: 1, 2, 4, and 8 Fibre Channel and
“by 4” wavelength d ivision multiplex standards such as 10GBASE-X4 and
4-Lane 10 Gb/s Fibre Cha nnel. The supported 10 Gb/s applications include
both datacom and telecom. The supported 10 Gb/s datacom applications
include 1

ly flexible module can be configured to support either lower data

0GbE at 9.95, 10.31, 11.09 Gb/s, 8G Fibre Channel, and 10G

80C10B Multirate Datacom and Telecom 40 Gb/s and
100 Gb/s

The 80C10B module provides integrat ed and selectable reference receiver
filtering, enabling compliance testing at either 1310 nm or 1550 nm for

39.813 Gb/s (OC-768/STM-256, VSR2000 G.693, 40G NRZ G.959.1),

41.25 Gb/s (40GBASE-FR), and 43.018 Gb/s [G.709 FEC, OTU3,
(4x10G LAN PHY)] rates. In addition to the filter rates, the user may
also choose selectable bandwidths of 30 GHz, 65 GHz, and 80 GHz for
80C10B for optimal noise vs. bandwidth performance for accura te signal
characterization. The 80C10B is optionally available with Option F1 which
extends filter selection s to include 27.739 Gb/s (100GBASE-LR4 + FEC
and 100GBASE-ER4 + FEC), and 25.781 Gb/s (100GBASE-LR4 and
100GBASE-ER4). When equipped with Option CRTP, an electrical signal
pickoff is provided for clock recovery using an external module (such as
the Tektronix CR286A-HS). The 80C10B is also optionally available in
a bundled ordering configuration which includes a 70+ GHz electrical
sampling channel.

80C25GBE Multirate Datacom 100 Gb/s

80C25GBE module provides 65 GHz full bandwidth with integrated
selectable reference receiver filtering, enabling compliance testing
at either 1310 nm or 1550 nm for 27.739G (100GBASE-LR4 + FEC
and 100GB

ASE-ER4 + FEC), and 25.781G (100GBASE-LR4 and

www.tektronix.com 5

Data Sheet

100GBASE-ER4). When equipped with Option CRTP, an electrical signal pickoff is provided for clock recovery using an external module (such as

the Tektronix CR286A-HS).

Optical Modules: 80C07B

Module

Opt.

Bandwidth

F1 F2 F3 F4 F5 F6 F7 F8 F9 F10

2.52.52.52.52.52.52.52.52.52.52.5

(GHz)
Wavelength

700-1650 700-1650 700-1650 700-1650 700-1650 700-1650 700-1650 700-1650 700-1650 700-1650 700-1650

Range (nm)
Fibre Input

(μm)
Mask Test

9or50or

62.5

9or50or

62.5

9or50or

62.5

9or50or

62.5

9or50or

62.5

–22 –22 –22 –22 –22 –22 –22 –22 –22 –22 –22
Sensitivity
(dBm)

Number of

11111111111

Channels
Rates Supported: ■=Filter, ♦=Optical Clock Recovery, ⊕=Electrical Clock Recovery

125 Mb/s*
155 Mb/s
622 Mb/s
1063 Mb/s
1250 Mb/s
2125 Mb/s
2488 Mb/s
2500 Mb/s

3

■■■■

■■■■

■ ■■■

■■■■

■ ■■■

■■■■

■■■■■■■■■■

■■■■■■■■■■

3.125 Gb/s

3.188 Gb/s

3.32 Gb/s

4.25 Gb/s

9.95 Gb/s

*3125 Mb/s is supported by selecting 155 Mb/s rate.

80C07B

9or50or

62.5

9or50or

62.5

9or50or

62.5

9or50or

62.5

9or50or

62.5

CR1

9or50or

62.5

♦
♦
♦
♦
♦
♦
♦
♦

6 www.tektronix.com

Optical Modules: 80C08C, 80C10B, 80C11, and 80C25GBE

Module

Opt. CR1 CR2 CR4 CRTP

Bandwidth

10 10 10 10 80 65 30 30 30 30 30 65

80C08C 80C10B*

5

(GHz)
Wavelength

Range

700-1650 700-1650 700-1650 700-1650 1290-1330

1520-1620

(nm)
Fibre

Input (μm)
Mask Test

9or50or

62.5

9or50or

62.5

9or50or

62.5

–16 –15 –15 –15

9or50or

62.5

9 9999999

–7
Sensitivity
(dBm)

Number

11111 1111111
of
Channels

Rates Supported: ■=Filter, ♦=Optical Clock Recovery, ⊕=Electrical Clock Recovery

9.95 Gb/s

10.31 Gb/s

10.52 Gb/s

10.66 Gb/s

10.71 Gb/s

11.1 Gb/s

11.3 Gb/s

■

■

■

■

■

■

■

25.78 Gb/s ♦*

27.74 Gb/s ♦*

39.81 Gb/s

41.25 Gb/s

43.02 Gb/s

tact Tektronix for details.

*4Con

5

*

Option CRTP reduces sensitivity by 0.6 dB (max) and increases noise by 15% (max).

6

Clock recovery with CR286A-HS (sold separately).

*

♦♦ ♦■♦♦♦♦
♦♦♦

♦♦

♦
♦
♦
♦

6

6

■

■

■

4

♦*

4

♦*

4

♦*

Digital Serial Analyzer Sampling Oscilloscope — DSA8200

80C11 80C25GBE

F1

1290-1330

1100-1650 1100-1650 1100-1650 1100-1650 1100-1650 1290-1330

1520-1620

–8 –9 –9 –9 –9 –9 –8

■

■

■

■

■

■

■■

■■

■

■

■

CR1 CR2 CR3 CR4 CRTP

1520-1620

♦
♦

♦♦

♦♦♦

♦
♦

6

♦*

6

♦*

4

♦*

4

♦*

4

♦*

www.tektronix.com 7

Data Sheet

Optical Modules: 80C12

Module

Opt.

Bandwidth

F1 F2 F3 F4 F5 F6

4.25 9 9 4.25 9 9 9 10

(GHz)
Wavelength

700-1650 700-1650 700-1650 700-1650 700-1650 700-1650 700-1650 700-1650

Range (nm)
Fibre Input

9 or 50 or 62.5 9 or 50 or 62.5 9 or 50 or 62.5 9 or 50 or 62.5 9 or 50 or 62.5 9 or 50 or 62.5 9 or 50 or 62.5 9 or 50 or 62.5
(μm)

Mask Test

–19 –19 –19 –19 –19 –19 –19 –14
Sensitivity
(dBm)

Number of

11111111

Channels
Rates Supported: ■=Filter, ♦=Optical Clock Recovery, ⊕=Electrical Clock Recovery

155 Mb/s
622 Mb/s
1063 Mb/s

■■

1250 Mb/s
2125 Mb/s

■■■■ ■

2488 Mb/s
2500 Mb/s

3.125 Gb/s

3.188 Gb/s

■■■■

■■■■

3.32 Gb/s

4.25 Gb/s

8.5 Gb/s*

9

■■ ■■

■■ ■■■■

9.95 Gb/s

10.31 Gb/s*

9

10.52 Gb/s

10.66 Gb/s

10.71 Gb/s

11. 1 Gb/s

11. 3 Gb/s

*7With 80A05 or 80A07.

8

With 80A05 Option 10G or 80A07.

*

9

*

Draft version of the 8.5GFC filter. T11 committee redefined this filter at the April 2008 meeting. New 8.5GFC filter, as definedbyT11committeeinApri
80C12 Option 10G modules only; and is identified as 10BASE-R.

80C12

FC 10G CR*

7

CR*

♦♦
♦♦
♦♦
♦♦
♦♦
♦♦
♦♦
♦♦
♦♦

■

♦♦
♦♦

80A07

■

■

■

■

■

■

■

l 2009, is identical to the 10BASE-R 10.313G filter and is available for

8

♦
♦
♦
♦
♦
♦
♦

8 www.tektronix.com

Digital Serial Analyzer Sampling Oscilloscope — DSA8200

DSA8200 Electrical Modules

TDR Modules: 80E10, 80E08, and 80E04

The 80E10, 80E08, and 80E04 are dual-channel Time Domain
Reflectometry (TDR) sampling modules, providing up to 12 ps incident and
15 ps reflected rise time. Each channel of these m odules is capable of
generating a fast impulse for use in TDR mode and the acquisition portion of
the sampling module monitors the incident step and any reflected energy.
The polarity of each channel’s step can be selected independently. This
allows for true-differential or common-mode TDR or S-parameters testing
of two coupled lines, in addition to the independent testing of isolated lines.
The independent step generation for each channel allows true-differential
measurements, which ensures measurement accuracy of nonlinear
differential devices.

80E10 and 80E08 fe ature a small form factor, fully integrated independent
2-meter remote sampler syst em, enabling the location of the sampler near
the DUT for th

TDR Module Summary

80E10 12 ps 15 ps

80E08 18 ps 20 ps

80E04 23 ps 28 ps

es shown are warranted unless printed in an italic typeface which represents a typical value.

*10Valu

11

*

Calculated from .35 bandwidth rise time product.

e best system fidelity. The modules characterize crosstalk by

Typical TDR Rise Time at Full BandwidthModule

Incident*

10

Reflected*

10

using TDR steps to drive one line (or line pair for differential crosstalk) while
monitoring a second line (or line pair) with the other channel (or another
module for diff

erential crosstalk). The "rise time filter" function on the
DSA8200 mainframe can be used with TDR or crosstalk measurements to
characterize expected system performance with slower edge speeds. An
optional 2-meter extender cable for the 80E04 is available, which enables
placement of the module near the DUT for the be st system fidelity.

All modules have independent incident step and receiver deskew to
remove the effect of fixtures and probes, enabling faster and easier
deskew. The 80E10 Sampling module provides an acquisition rise time
of 7 ps, with up

to 50 GHz user-selectable equivalent bandwidth (with
50 GHz, 40 GHz, and 30 GHz settings). 80E08 sampling bandwidth
is 30 GHz (user-selectable with 30 GHz and 20 GHz settings) and
80E04 sampling bandwidth is 20 GHz. The 20 GHz P8018 single-ended
and the 18 GHz P80318 differential variable pitch TDR handheld probes
provide excellent performance, ensuring e asy and accurate backplane and
package meas

urements.

Bandwidth

Performance*

50 GHz, 40 GHz,

and 30 GHz

(user selectable)

30 GHz, 20 GHz (user

selectable)

20 GHz

11

RMS N oise at

Bandwidth*

50 GHz: 600 μV
40 GHz: 370 μV
30 GHz: 300 μV

30 GHz: 300 μV
20 GHz: 280 μV

600 μV No, optional 80N01

Remote Sampler

11

Yes, fully integrated

Yes, fully integrated

– 2-meter extender

2-meter cable

2-meter cable

cable

www.tektronix.com 9

Data Sheet

Electrical Modules: 80E09, 80E07, 80E06, 80E03, and
80E01

The 80E09 and 80E07 are dual-channel modules with remote samplers,
capable o f noi
300 μV

noise at 30 GHz bandwidth. Each small form factor remote

RMS

se as low as 450 μV

at 60 GHz bandwidth and

RMS

sampler is attach ed to a 2-meter cable to minimize the effects of cables,
probes, and fixtures to ensure the best system fidelity. User-selectable
bandwidth settings (60/40/30 on 80E09 and 30/20 on 80E07) offer optimal
noise/bandwidth trade-off.

80E06 and 80E01 are single-channel 70+ and 50 GHz bandwidth sampling
modules respectively. 80E06 provides the widest bandwidth and fastest
rise time with

world-class system fidelity. Both 80E06 and 80E01 provide a

superior maximum operating range of ±1.6 V. Both modules can be used

Electrical Module Summary

Electrical
Module

80E09 5.8 ps 2

80E07 11.7 ps 2

80E06 5.0 ps 1

80E03 17.5 ps 2

80E01

*10Values shown are warranted unless printed in an italic typeface which represents a typical value.

12

*

Now obsolete module useful with older versions of the mainframe, but not needed with the 8200 Series mainframes.

Step Response at Full

Bandwidth

(10-90%)*

10

7ps

Number Of Channels Bandwidth*

1

with the optional 2-meter extender cable, ensuring superior system fidelity
and measurement flexibility.

The 80E03 is a dual-channel 20 GHz sampling module. This module
provides an acquisition rise time of 17.5 ps or less. An optional 2-meter
extender cable is available.

When used with

Tektronix 80SJNB Jitter, Noise, and BER Analysis
software, these modules enable separation of both jitter and noise into
their constituent components, for insight into the underlying causes of eye
closure and obtain highly accurate calculation of BER and 3-D eye contour.
When used with the 82A04 Phase Reference module, time-base accuracy
canbeimproveddownto200fs
noise floor and

14 bits of resolution, ensures the highest signal fidelity for

jitter which, together with the 300 μV

RMS

RMS

your measurements.

10, 12

60/40/30 GHz (user

selectable)

30/20 GHz (user

selectable)

70+ GHz

20 GHz

50 GHz

RMS N oise at
Bandwidth*

60 GHz: 450 μV
40 GHz: 330 μV
30 GHz: 300 μV

30 GHz: 300 μV
20 GHz: 280 μV

1.8 mV No, optional 80N01

600 μV No, optional 80N01

1.8 mV No, optional 80N01

Remote Sampler

10

Yes, fully integrated

Yes, fully integrated

– 2-meter extender

– 2-meter extender

– 2-meter extender

2-meter cable

2-meter cable

cable

cable

cable

10 www.tektronix.com

Digital Serial Analyzer Sampling Oscilloscope — DSA8200

DSA8200 Accessory Modules

82A04 Phase Reference Module

The 82A04 Phase Reference module enhances the DSA8200 sampling
oscilloscope from the industry’s standard time-base jitter performance
of 800 f s
application for the Phase R eference module is the acquisition and analysis
of very high-speed optical a nd electrical signals in communication devices
and systems. T
which is similar to usual acquisition, and the untriggered Free Run mode
where all timing information comes from the customer-supplied clock alone
(no trigger signal necessary). When the external clock is not available the
module can accept the clock signal from the clock recovery output of the
80Cxx modules, as well as from the 80A05 or 80A07 Clock Recovery
modules. Add
operation.

80A05 Electrical Clock Recovery Module

The 80A05 Electrical Clock Recovery module enables clock re covery for
electrical signals, as well as internal triggering on the recovered clock. The
module reco
electrical standards in the 50 Mb/s to 4.25 Gb/s, around 5 to 6 Gb/s,
and from 9.953 Gb/s to 12.5 Gb/s ranges. The module accepts either
single-ended or differential signals as its input, providing clock recovery for
both. The signal(s) is/are then passed on to the output connectors (at about
50% of the input level) and can be connected to sampling module(s) for
differenti
standard rates from 9.953 Gb/s to 12.6 Gb/s. The 80A05 and 80A07 can
also serve as the Clock Recovery module for the 80C12 Op tical Sampling
module.

80A06 PatternSync Module

The 80A06 P
with 80SJNB software, enables characterizing jitter, noise, and BER
performance of high-speed serial designs from 1 Gb/s to 60 Gb/s data
rates. It extends the capability of the DSA8200 sampling oscilloscope by
creating a pattern trigger from any data-related clock – a recovered clock,
user-supplied clock, sub-clock, or super-clock. The PatternSync Trigger
module is p
user-supplied clock signal from 150 MHz to 12.5 GHz. The 80A06 module is
required with the DSA8200 when using 80SJNB Advanced Jitter, Noise, and
BER Analysis software package. This module can be used in combination
with the 82A04 Phase Reference module for the best time-base accuracy or
for acquisition of signals under SSC (Spread Spectrum Clocking).

, to the extremely low time-base jitter of <200 fs

RMS

.Typical

RMS

he 82A04 supports both the Triggered mode of operation,

itionally 82A04 supports SSC (Spread Spectrum Clocking)

vers clocks from serial data streams for all of the most common

al or single-ended sampling. Option 10G is required for suppo rt of

atternSync Trigger module, when used in combination

rogrammable to pattern lengt hs of up to 2

23

bits and accepts a

80A07 Clock Recovery Module

80A07 recovers clocks from serial data streams for all of the most common
electrical standards in the continuous 100 Mb/s to 12.5 GB/s range.
Auto-locking capability is selectable from the user interface or programmatic
interface, so t

he design and test engineers can search and lock onto signals
of undefined or unknown data rate. The module accepts either single-e nded
or differential signals as its input, providing clock recovery for both. The
signal(s) is/are then passed on to the output connectors and can be
connected to sampling module(s) for differential or single-ended sampling.
80A07 offers complete configurability and state-of-the-art specifications
and is the pref

erred solution for most serial data standards due to excellent
stability, superior jitter and slew rate tolerance fo r recovering clocks f rom
stressed or degraded signals, and unequaled PLL bandwidth and roll-off
shape control for either Golden PLL compliance testing or custom PLL
response. 80A07 also locks on spread-spectrum signals. The 80A07 can
also serve as the Clock Recovery module for the 80C12 Optical Sampling
module.

P80318 Diffe

rential Handheld TDR Probe

The P80318 is an 18 GHz 100 Ω input impedance differential TDR hand
probe. This p

robe enables high-fidelity impedance measurements of

differential transmission lines. The adjustable probe pitch from 0.5 mm to

4.2 mm enables a wide variety of differential line spacing and impedan ces.
The P80318 probe also includes two precision SMA cables with parallel
control lines that provides the 80A02 module the control for EOS/ESD
protection.

P8018 Single-ended Handheld TDR Probe

The P8018 Handheld TDR Probe is a 20 GHz, 50 Ω input impedance,
single-ended passive probe t hat provides a high-performance solution for
electrical

sampling, TDR circuit board impedance characterization, and
high-speed electrical signal analysis applications. The P8018 probe also
includes a precision SMA cable and parallel control line that provides the
80A02 module the control for EOS/ESD protection.

80A02 EOS/ESD Protection Module

The 80A02 EOS/ESD Protection module protects the sampling bridge of
Tektronix electrical sampling module inputs from damage by electrostatic
charge. The 80A02 is intended for use in applications such as electrical
TDR circuit board testing and cable testing where large static charges can
be stored i

ntheDUT.

When used with the matching P8018 20 GHz single-ended handheld
probe or t

he P80318 differential hand held probe (both with probe tip
pressure actuating feature) the 80A02 provides a superior technique
and performance capability for electrical module EOS/ESD protection of
acquired electrical signals and TDR measurements (two 80A02 modules
required for differential applications).

www.tektronix.com 11

Data Sheet

80A03 TekConnect Probe Interface Module

The 80A03 provides probe power and control for up to two Tektronix
P7000 Series probes. The 80A03 is powered through the o scilloscope
and requires no user adjustments or external powe r cords. An Electrical
Sampling modul

e can be plugged directly into the slot on the 80A03 to
provide the optimum system fidelity and a short electrical path. Using the
80A03, designers can benefit from industry-leading Tektronix active and
differential probes to measure signals on SMD pins and other challenging
circuit features.

SlotSaver Small Module Extender Cable

This cable can be u sed to power and operate one 80A01*12,80A02,or
80A06 accessory modules, eliminating the need to consume a small form
factor mainframe slot. The SlotSaver extender cable plugs into the ‘Trigger
Power’ conne

ctor on the mainframe or (for 80A01 and 80A02) into the

‘Probe Power’ connector on most Electrical Sampling modules.

*12Now obsolete module useful with older versions of the mainframe, but not needed with the 8200 Series

mainframes.

DSA8200 Application Software

Jitter, Noise, BER, and Serial Data Link Analysis (SD LA)
Software

80SJNB speeds the identification of the underlying causes of both
horizontal and vertical eye closure through separation of jitter and noise.
With its uni
noise, 80SJNB provides a highly accurate and complete BER calculation
and eye contour analysis.

Additionally available in the software package is the first-ever set of features
addressing the design issues of modern Serial Data Links: equalization with
either FFE or DFE, channel emulation, support for fixture de-embedding,
as well as full support for SSC – Spread Spectrum Clocking. When you
combine jitter, noise, and BER analysis with the DSA8200 modular flexibility,
uncomprom
ideal solution for next-generation high-speed serial data design validation
and compliance testing. 80SJNB requires the 80A06 PatternSync module,
which creates a trigger pulse on each complete pattern. 80SJNB may be
used with the 82 A04 Phase Reference module for enhanced accuracy or
for SSC signals, or without it depe nding on your requ irements. SSC max.
amplitude
80SJNB supports save and recall of the complete signal description. Also
added is a new measurement DDPWS (Data Dependent Pulse Width
Shrinkage) and a corresponding graph.

que insight into the constituent components of both jitter and

ised performance, and unmatched signal fidelity you get the

5000 ppm (6000 ppm) at 30 ±3 kHz. Current version V2.1 of

80SJNB Jitter and Noise Analysis Measurements

Jitter Analysis

Measurements Description

TJ at BER
J2
J9
RJ Random jitter
RJ(h) Horizontal component of random jitter
RJ(v) Vertical component of random jitter
RJ(d-d)
DJ Deterministic jitter
DDJ Data-dependent jitter
DDPWS Data-dependent Pulse Width Shrinkage
DCD
DJ(d-d)
PJ Periodic jitter
PJ(h) Horizontal component of periodic jitter
PJ(v) Vertical component of periodic jitter
EO at BER Horizontal eye opening at specified BER

80SJNB Noise Analysis

Measurements Description

RN Random noise
RN(v) Vertical component of random noise
RN(h) Horizontal component of random noise
DN Deterministic noise
DDN1 Data-dependent noise on logical level 1
DDN0 Data-dependent noise on logical level 0
PN Periodic noise
PN(v) Vertical component of periodic noise
PN(h) Horizontal component of periodic noise
EO at BER Vertical eye opening at specified BER
SSC Magnitude Magnitude of SSC modulation in ppm
SSC Frequency Frequency of SSC modulation in ppm

80SJNB Advanced Supports:

Total jitter at specified BER
Total jitter for BER = 2.5e
Total jitter for BER = 2.5e

Random jitter according to the Dual Dirac model

Duty cycle distortion
Deterministic jitter computed in the Dual Dirac model

–3

–10

FFE (Feed Forward Equalization) to 100 Taps

DFE (Decision Feedback Equalization) to 40 Taps

Filter for sup port of linear filters f rom fixture de-embed to transmitter
equalization. Channel emulation supported for channels with >30 dB

st

of loss at 1

harmonic frequency

12 www.tektronix.com

Jitter Analysis of Arbitrary Data

The 80SJARB jitter measurement application software for the DSA8200
Series addresses IEEE 80 2.3ba applications requiring the J2 and J9
jitter measurements. It also ena bles basic jitter measurements for NRZ
data signals including PRBS31, random traffic, and scrambled data. This
provides an entry-level jitter analysis capability with simple Dual Dirac
model jitt

er analysis and no hardware module requirements. 80SJARB can
acquire continuously in “free run” mode, delivering acquisitions and updates
beyond the IEEE minimum requirement of 10,000 data points. Plots include
jitter bathtub curves for both measured and extrapolated data, as well as a
histogram of the acquired data.

Measurement Description

J2
J9
Tj
DJdd
RJdd

Total jitter for BER = 2.5e
Total jitter for BER = 2.5e
Total jitter for BER = 1.0e
Deterministic jitter (Dual Dirac model)
Random jitter (Dual Dirac model)

–3

–10

–12

Free Run Mode: For continuous acquisitions and update beyond the
IEEE minimum requirement of 10,000 data points

Plots: Jitter / Eye Opening B athtub, Histogram of Acquired Data

Digital Serial Analyzer Sampling Oscilloscope — DSA8200

IConnect®Signal Integrity TDR and
S-parameter Software

Operating on the DSA8200 TDR platform, IConnect®S-parameters is
the most cost-effective and highest throughput approach for S-parameter
measurements in digital design, signal integrity analysis, and interconnect
compliance te
similar bandwidth VNAs, and dramatically speeding up measurements.
You can also take advantage of the IConnect
line interface, which automates the S-parameter measurements, to the
overall suite of manufacturing tests you perform using your TDR instrument,
significantly reducing test time while increasing measurement r epeat ability.

The simplicity of S-parameter calibration using a reference (open, short,
or through), and an optional 50 Ω load makes the measurement, fixture
de-embeddin
file format output enables easy S-parameter file sharing for further data
analysis and simulations.

Tektronix offers several true-differential TDR modules, which in combination
with IConnect
to –70 dB of dynamic range. This performance exceeds requirements
for serial data analysis, digital design, and signal integrity a pplications,
resolving down to 1% (–40 dB) accuracy of crosstalk, whereas electrical
compliance t
to –30 dB range.

IConnect
and IBIS models for your PCBs, flex boards, connectors, cables,
packages, sockets, and I/O buffer inputs directly from TDR/T or VNA
S-parameter measurements. IConnect
degradation, jitter, loss, crosstalk, reflections, and ringing in your digital
system. IConnect
interconne
domain performance, and eye diagram of the overall channel. IConnect
substantially simplifies the signal integrity analysis of the interconnect
link, equalization and emphasis component design, and analysis of the
interconnect link with transmitter and receiver.

sting, providing as much as 50% cost savings compared to

®

S-parameters command

g, and moving the reference plane a snap. Touchstone

®

offers S-parameter measurements to 50 GHz with up

esting masks typically call for the measurements in the –10

®

ftware allows you to quickly and easily generate SPICE

so

®

allows you to display eye diagram

®

Linear Simulator allows the designer to link several

ct channels together to evaluate the total time, frequency

®

www.tektronix.com 13

Data Sheet

Characteristics

Signal Acquisition

Acquisition Modes

Mode

Number of Sampling Modules
Accommodated

Number of Simultaneously Acquired Inputs

Acquisition Characteristics

Characteristic

Vertical Systems

Rise Time / Bandwidth
Vertical Resolution 14 bits over the sampling modules’ dynamic range

Horizontal System

Four time-base modes are available:

Triggered Phase Reference*13Time Base
Mode

Free Run Phase Reference*13Time Base
Mode

Short-term Optimized Sequential*14Time
Base Mode

Locked to 10 MHz Reference Sequential
Time Base

Main and Magnification View Time Bases 100 fs/div to 5 ms/div in 1-2-5 sequence or 100 fs increments

ximum Trigger Rate

Ma

pical Acquisition Rate

Ty

Time Interval Accuracy (Standard Time Base) and Timing Deviation (Phase Reference Modes)

Phase Reference Time Base: Triggered Maximum timing deviation relative to phase reference signal:

Horizontal position after trigger event:

>40 ns
≤40 ns

Phase Reference Time Base: Free Run Maximum timing deviation relative to phase reference signal: 0.1% or better of phase reference signal period (typical)
Sequential Time Base*

14

Time interval accuracy, horizontal scale:

<21 ps/div 1 ps + 1% of interval

Horizontal Deskew Range Available
(Sequential time base only)

DSA8200 Record Length

®

IConnect
80SJNB Jitter, Noise, and BER Analysis

software

Waveform Databases 4 independently accumulated waveform records of up to 4 G waveform points. Variable waveform database mode with true

Magnification Views In addition to the main time base, the DSA8200 supports two magnification views. These magnifications are independently

*13When using the 82A04 Phase Reference module.

14

*

Traditional mode – not using the 82A04 Phase Reference module.

Sample (Normal), Envelope, and Average

Up to four dual-channel electrical; up to two optical sampling modules. (Both single- and dual-channel modules are appropriate
for the two channels associated with the slot)

Population of the CH1/CH2 large slot with any module other than one requiring power only displaces functionality of the CH1/CH2
small slot; population of the CH3/CH4 large slot with any module other than one requiring power only displaces functionality
of the CH3/CH4 small slot

Eight channels maximum

Description

Determined by the sampling modules used

Timing information extracted from a user-supplied or clock recovery signal significantly improves time-base accuracy and jitter
performance of the triggered acquisition. Horizontal position is referenced to the trigger signal as with a traditional time base

All timing is b ased on a phase reference signal; accuracy and jitter as above; no trigger is needed, and correspondingly there is
no timing relation to trigger signal

Best short-delay performance for acquisitions without the external phase reference signal

Provides the best long-delay performance for acquisitions without the external phase reference signal. The Lock is selectable
between Lock to Internal 10 MHz and Lock to External 10 MHz for highest frequency accuracy

200 kHz; in Phase Reference mode: 50 kHz
150 kS/s per channel (standard sequential time base); 50 kS/s (Phase Reference modes)

0.2% of phase reference signal period (typical)

0.4% of phase reference signal period (typical)
Note: The performance depends on stable clock supplied to the Phase Reference module. Performance under SSC is lower
and depends on modulation shape

8 ps + 0.1% of interval (short-term optimized mode)≥21 ps /di v
8ps+0.01%ofinterval(lockedto10MHzmode)
–500 ps to +100 ns on any individual channel in 100 fs increments

20, 50, 100, 250, 500, 1000, 2000, or 4000 samples;
Longer records available as follows:

1,000,000 points
3,200,000 points

first-in/first-out of 2000 waveforms available on each of 4 waveform databases

acquired using separate time-base settings which allow same or faster time/div than that of the main time base

14 www.tektronix.com

Digital Serial Analyzer Sampling Oscilloscope — DSA8200

Tri gger System

Trigger Sources

External dire
External pre-scaled trigger.
Internal clock trigger: Internally connected to direct trigger.

Trigg er S ens

ct trigger.

itivity

Clock recovery triggers from Optical Sampling modules and from the 80A05
or 80A07 Rlectrical Clock Recovery modules; signal from the 80A05 module
(pre-scaled a

Phase Reference*

bove 2.7 Gb/s) internally connected.

13

time base supports acquisitions without a trigger signal in its

Free Run mode.

*13When using the 82A04 Phase Reference module.

50 mV, DC - 4 GHz (typical)External Direct Trigger Output

100 mV, DC - 3 GHz (guaranteed)
Trigger Level Range ±1.0 V
Trigger Input Range ±1.5 V
Trigger Holdoff
External Trigger Gate (Optional)
Pre-scaled Trigger Input

Time-base Jitter

Phase Reference*15Time Base

Adjustable 5 μs to 100 ms in 0.5 ns increments

TTL logic 1 enables gate, a TTL logic 0 disables gate, maximum nondestruct input level ±5 V

200 mV

System jitter of 200 fs

signal

Jitter: System jitter of 280 fs

0.6 V ≤ VREF ≤ 1.8 V phase reference signal

to 800 mV

p-p

, 2 to 12.5 GHz (guaranteed)

p-p

typical on a 10 GHz or faster acquisition module, with f ≥ 8GHz,0.6V≤ VREF ≤ 1.8 V phase reference

RMS

typical on a 10 GHz or faster acquisition module, in DSA8200 mainframe, with 2 GHz ≤ f ≤ 8GHz,

RMS

The phase reference time base remains operational to 100 mV (typical) with increased jitter

Mode

800 fs

1.2 ps

1.6 ps

2.5 ps

+5 ppm of position (typical)Short-term Jitter Optimized Sequential Mode

RMS

+10 ppm of position (max.)

RMS

+0.04 ppm of position (typical)Locked to 10 MHz Reference Sequential

RMS

+0.01 ppm of position (max.)

RMS

Internal Clock Adjustable from 25 to 200 kHz (drives TDR, internal clock output and calibrator)

*15When using the 82A04 Phase Reference module performance under SSC is lower and depends on modulation shape, clock recovering setting, and cabling lengths.

Display Features

Touch Screen Display 264 mm / 10.4 in. diagonal, color
Colors 16,777,216 (24 bits)
Video
Monit

Resolution

or Type

rizontal by 480 vertical displayed pixels

640 ho

LCD

www.tektronix.com 15

Data Sheet

Math/Measurement

Characteristic

System
Measurements

Description

The DSA8200 supports up to eight simultaneous
measurements, updated three times per second with optional
display of per-measurement statistics (min, max, mean, and
standard deviation)

Measurement Set

Automated measurements include RZ, NRZ, and Pulse
signal types, and the following:

Amplitude
measurements

High, Low, Amplitude, Max, Mid, Min, +Width, Eye Height,
Eye Opening Factor, Pulse Symmetry, Peak-to-Peak, OMA,
+Overshoot, –Overshoot, Mean, +Duty Cycle, Cycle Mean,
RMS, Cycle RMS, AC RMS, Gain, Extinction Ratio (Ratio, %,
dB), Suppression Ratio (Ratio, %, dB), Peak-to-Peak Noise,
RMS Noise, Q-Factor, SNR, Average Optical Power (dBm,
watts), OMA

Timing
measurements

Rise,Fall,Period,BitRate,BitTime,Frequency,Crossing
(%, Level, Time), +Cross, –Cross, Jitter (P-P, RMS), Eye
Width, +Width, –Width, Burst Width, +Duty Cycle, –Duty
Cycle, Duty Cycle Distortion, Delay, Phase

Area

Area, Cycle Area

measurements

Cursors
Waveform

Processing

Dot, vertical bar, and horizontal bar cursors
Up to eight math waveforms can be defined and displayed

using the following math functions: Add, Subtract, Multiply,
Divide, Average, Differentiate, Exponentiate, Integrate,
Natural Log, Log, Magnitude, Min, Max, Square Root, and
Filter. In addition, measurement values can be utilized as
scalars in math waveform definitions

Characteristic

Mask Testing –
Standard rate (Gb/s)
unless othe rwise
noted

Description

Custom masks (a new FW feature) can be used to distribute
new, Tektronix factory created, NRZ, updated masks as a
file loadable by the firmware. User-defined masks allow
the user to create (through UI or PI) user masks. For
most applications mask will be found in the following list of
predefined, built-in masks:

STM-0/OC-1 51 Mb/s
STM-1/OC-3 155 Mb/s
STM-4/OC-12 622 Mb/s
STM-16/OC-48 2.488
STM-64/OC-192 9.953
STM-256/OC-768 39.813
FEC 2.666 2.666
FEC 10.66 10.664
FEC 10.709
FEC 11.100
FEC 27.739 Gb/s (100GBASE-LR4 100GBASE-ER4)
FEC 42.66 42.657
FEC 43 Gb/s G.709 43.018
FC-10 G 10.5188 – optical only
FC-16 17.0 – optical and electrical
FC-133 132.813 Mb/s – optical and electrical
FC-266 265.6 Mb/s – optical and electrical
FC-531 531.2 Mb/s – optical and electrical
FC-10631.063–opticalandelectrical
FC-2125 2.125 – optical and electrical
FC-42504.250–opticalandelectrical
FC-8500 8.500 – optical and electrical, optical 10GFC, FEC

9

11. 3*
10GBASE-X4 3.125

10GBASE-W 9.953
10GBASE-R 10.313, FEC 11.1, 8.5 GFC
40GBASE-LR4 41.25 OTU3+ 44.50 Gb/s 4x10G LAN PHY
100GBASE-LR4 and 100GBASE-ER4 25.781 Gb/s
InfiniBand 2.500 – optical and electrical
Gigabit Ethernet 1.250
Gigabit Ethernet 2.5 Gb/s
XAUI, XFI
PCI-Express 2.5G
PCI-Express 5.0G
SAS XR 3.0G
SAS XR AASJ 3.0G
SATA G1Tx 1.5G
SATA G1Rx 1.5G
SATA G2Tx 3.0G
SATA G2Rx 3.0G
SATA G3Tx 6.0G
SATA G3Rx 6.0G
Rapid I/O 1.25G
Rapid I/O 2.50G
Rapid I/O 3.125

*9Draft version of the 8.5GFCfilter. T11committee redefined this filter at the April 2008 meeting. New 8.5GFC

filter, as defined by T11 committee in April 2009, is identical to the 10BASE-R 10.313G filter and is available
for 80C12 Option 10G modules only; and is identified as 10BASE-R.

16 www.tektronix.com

Digital Serial Analyzer Sampling Oscilloscope — DSA8200

Optical Sampling Module Characteristics

Refer to Optica

Optical Sampling Mo d ule Characteristics

Module Application Type

80C07B Tributary Datacom/Telecom Standard Included: OC-48/STM-16 (2.488 Gb/s),

80C08C 10 Gb/s Datacom/Telecom OC-192/STM-64 (9.953 Gb/s), 10GBASE-W

80C10B 100 Gb/s and 40 Gb/s

80C11 10 Gb/s Datacom/Telecom OC-192/STM-64 (9.953 Gb/s), 10GBASE-W

80C12

80C25GBE 100 Gb/s Datacom 100GBASE-LR4 (25.781 Gb/s, FEC 27.739 Gb/s),

*9Draft version of the 8.5GFC filter. T11 committee redefined this filter at the April 2008 meeting. New 8.5GFC filter, as defined by T11 committee in April 2009, is identical to the 10BASE-R 10.313G filter and is available for

80C12 Option 10G modules only; and is identified as 10BASE-R.

16

Bandwidths shown are warranted unless printed in an italic typeface which represents a typical value. 80C08C, 80C12: Bandwidths and optical filters valid for OMA ≤ 500 μW (1550/1310 nm), OMA ≤ 860 μW (850 nm), OMA

*

≤1020 μW (780 nm).

Note: Refer to Optical Sampling module’s User Manual for more detailed information.

l Sampling module’s User Manual for more detailed information.

Standards and Supported Filte ring

Rates*

16

Infiniband SDR, 2 GbE (2.500 Gb/s);

Optional (choose any two): OC-3/STM-1

(155 Mb/s), OC-12/STM-4 (622 Mb/s),

Fibre Channel (1.063 Gb/s), GbE (1.250 Gb/s),

2G Fibre Channel (2.125 Gb/s)

(9.953 Gb/s), 10GBASE-R, 40GBASE-R4,

100GBASE-SR10 (10.31 Gb/s), 10G Fibre

Channel (10.52 Gb/s), ITU-T G.975 FEC

(10.664 Gb/s), ITU-T G.709 (10.709 Gb/s),

10 GbE FEC (11.1 Gb/s), 10 GFC FEC

(11.3 Gb/s), 10GBASE-LRM, 40GBASE-SR4,

100GBASE-SR10, 40GBASE-LR4

OC-768/STM-256 (39.813 Gb/s), OTU3, VSR-2000

Telecom and Datacom

G.693, 40G NRZ G.959.1, FEC (43.018 Gb/s),

OTU3 (44.5 Gb/s), 40GBASE-FR (41.25 Gb/s),

100GBASE-LR4 (25.781 Gb/s, FEC 27.739 Gb/s),

100GBASE-ER4 (25.781 Gb/s, FEC 27.739 Gb/s)

(9.953 Gb/s), 10GBASE-R, 40GBASE-LR4

(10.31 Gb/s), 10G Fibre Channel (10.52 G b/s),

ITU-T G.975 FEC (10.664 Gb/s), ITU-T G.709

(10.709 Gb/s), 10 GbE FEC (11.1 Gb/s), 10 GFC

FEC (11.3 Gb/s), 40GBASE-LR4

1 to 8.5 Gb/s

Datacom/Telecom

Fibre Channel (1.063 Gb/s), 2G Fibre Channel

(2.125 Gb/s), 4G Fibre Channel (4.250 Gb/s),

10GBASE-X4 (3.125 Gb/s), 8G Fibre Channel

(8.50 Gb/s)*

9

, 10GFC-X4 (3.1875 Gb/s),
VSR5-3318 (3.318 Gb/s), 1x Infiniband SDR
(2.5 Gb/s), 10GBASE-LRM, 4 0GBASE-SR4,

100GBASE-SR10, 40GBASE-LR4

10 Gb/s Datacom/Telecom OC-192/STM-64 (9.953 Gb/s), 10GBASE-W

(9.953 Gb/s), 10GBASE-R*

9

, 40GBASE-R4,

100GBASE-SR10 (10.31 Gb/s), 10G Fibre Channel

(10.52 Gb/s), ITU-T G.975 FEC (10.664 Gb/s),

ITU-T G.709 (10.709 Gb/s), 10 GbE FEC

(11.1 Gb/s), 10 GFC FEC (11.3 Gb/s)

100GBASE-ER4 (25.781 Gb/s, FEC 27.739 Gb/s)

Number of Input

Channels

Effective

Wavelength Range

1 700 nm to 1650 nm 780 nm, 850 nm,

1 700 nm to 1650 nm 780 nm, 850 nm,

1 1310 nm and 1550 nm 1310 nm and 1550 nm

1 1100 nm to 1650 nm 1310 nm and 1550 nm

1 700 nm to 1650 nm 850 nm, 1310 nm, and

1 1310 nm and 1550 nm 1310 nm and 1550 nm

Calibrated

Wavelengths

1310 nm, and

1550 nm (±20 nm)

1310 nm, and

1550 nm (±20 nm)

(±20 nm)

(±20 nm)

1550 nm (±20 nm)

(±20 nm)

www.tektronix.com 17

Data Sheet

Optical Sampling Module Characteristics (Cont.)

Module

80C07B Option CR1: 155 Mb/s,

Clock Recovery

(Optional)

Clock Recovery Outputs Unfiltered Optical

Bandwidth*

16

±Clock, ±Data 2.5 GHz

622 Mb/s, 1.063 Gb/s,

1.250 Gb/s, 2.125 Gb/s,

2.488 Gb/s, 2.500 Gb/s,

2.666 Gb/s

80C08C*

18

Option CR1: 9.953 Gb/s,

Clock, Clock/16 10 GHz

10.31 Gb/s;

Option CR2: 10.31 Gb/s,

10.52 Gb/s;

Option CR4: Continuous from

9.8 Gb/s to 12.6 Gb/s

80C10B Provided by CR286A-HS or

other compatible external

CR units*

4

80C11 Option CR1: 9.953 Gb/s;

Option CR2: 9.953 Gb/s,

10.664 Gb/s;

ELECTRICAL SIGNAL OUT

(to44.5Gb/s,50Ω,AC

coupled, differential 2.92 mm

female connectors, max.

1 ps diff. skew)*

17

CR1: C lock, Clock/16, Data;

CR2, CR3, CR4: Clock,

Clock/16

80 GHz

28 GHz

Option CR3: 9.953 Gb/s,

10.709 Gb/s;

Option CR4: Continuous

between 9.8 Gb/s to

12.6 Gb/s

80C12

Provided by 80A05 or 80A07

(sold separately)

ELECTRICAL SIGNAL OUT 9GHz(for all options

except 10G)

10 GHz (Option 10G)

80C25GBE Provided by CR286A-HS ELECTRICAL SIGNAL OUT

65 GHz

(to44.5Gb/s,50Ω,AC

coupled, differential 2.92 mm

female connectors, max.

1 ps diff. skew)*

*4Contact Tektronix for details.

16

Bandwidths shown are warranted unless printed in an italic typeface which represents a typical value. 80C08C, 80C12: Bandwidths and optical filters valid for OMA ≤ 500 μW (1550/1310 nm), OMA ≤ 860 μW (850 nm), OMA

*

≤1020 μW (780 nm).

17

With Option CRTP.

*

18

*

Frequency characteristic and ORR guaranteed for signals up to 500 μW

(80C08C, 80C12), respectively200 μW (80C07B) at 1550 nm; pro-rated (hig

p-p

17

Absolute Maximum

Nondestructive Optical

Input

5mWaverage;10mW

peak power at wavelength of

highest responsivity

1mWaverage;10mW

peak power at wavelength of

highest responsivity

20 mW average; 60 mW

peak power at wavelength of

highest relative responsivity

5mWaverage;10mW

peak power at wavelength of

highest responsivity

1mWaverage;10mW

peak power at wavelength of

highest responsivity

20 mW average; 60 mW

peak power at wavelength of

highest relative responsivity

her power) for other wavelengths.

Internal Fibre Diameter

62.5/125 μm

Multi Mode

62.5/125 μm

Multi Mode

9/125 μm

Single Mode

9/125 μm

Single Mode

62.5/125 μm

Multi Mode

9 μm/125 μm

Single Mode

18 www.tektronix.com

Optical Sampling Module Characteristics (Cont.)

Module

Optical Return

Loss

80C07B >14 dB (Multi Mode)

Fibre Input

Accepted

Single or Multi Mode 0.50 μW at 155 Mb/s, 622 Mb/s,

>24 dB (Single

Mode)

80C08C >14 dB (Multi Mode)

Single or Multi Mode 1.7 μWatallfilter rates (1550/1310 nm,

>24 dB (Single

Mode)

5

80C10B*

80C11

80C12 >14 dB (Multi Mode)

>30 dB

>30 dB

Single Mode

Single Mod e 5.5 μWatallfilter rates;

Single or Multi Mode 1.3 μW(allfilters except Option 10G)

>24 dB (Single

Mode)

80C25GBE

*5Option CRTP reduces sensitivity by 0.6 dB (max) and increases noise by 15% (max).

>30 dB

Single Mode

Digital Serial Analyzer Sampling Oscilloscope — DSA8200

RMS Optical Noise (Typical) RMS Optical Noise (Maximum)

1063 Mb/s, 1250 Mb/s;

0.70 μW at 2.488/2.500 Gb/s

no CR)

1310 nm 1550 nm 1310 nm 1550 nm

21 μW(25.8,

27.7 Gb/s)

26 μW(30GHz)

28 μW (39.8 Gb/s

- 43.0 Gb/s)

44 μW(65GHz)
72 μW(80GHz)

15 μW(25.8,

27.7 Gb/s)

19 μW(30GHz)

20 μW(39.8Gb/s

- 43.0 Gb/s)

33 μW(65GHz)
55 μW(80GHz)

10.0 μWat20GHz

20.0 μWat30GHz

2.4 μW (’Full BW’ and Option 10G filters)

1310 nm 1550 nm 1310 nm 1550 nm

21 μW(25.8,

27.7 Gb/s)

44 μW(65GHz)

15 μW(25.8,

27.7 Gb/s)

33 μW(65GHz)

1.0 μW at 155 Mb/s, 622 Mb/s,

1063 Mb/s, 1250 Mb/s;

1.5 μW at 2.488/2.500 Gb/s

3.0 μWatallfilter rates (1550/1310 nm) Standard

38 μW(25.8,

27.7 Gb/s)

45 μW(30GHz)

50 μW(39.8Gb/s

- 43.0 Gb/s)

75 μW(65GHz)

130 μW(80GHz)

28 μW(25.8,

27.7 Gb/s)

35 μW(30GHz)

38 μW (39.8 Gb/s

- 43.0 Gb/s)

60 μW(65GHz)

105 μW(80GHz)

8.0 μWatallfilter rates;

14.0 μWat20GHz

30.0 μWat30GHz

2.5 μW(allfilters except Option 10G)

5.0 μW (’Full BW’ and Option 10G filters)

38 μW(25.8,

27.7 Gb/s)

75 μW(65GHz)

28 μW(25.8,

27.7 Gb/s)

60 μW(65GHz)

Independent

Channel Deskew

Standard

Standard

Standard

Standard

Standard

Optical Sampling Module Characteristics (Cont.)

Module

Offset Capability

80C07B Standard Standard

80C08C Standard Standard
80C10B*5,

Standard Standard

Power Meter Power Meter Ran ge Power Meter Accuracy

+4 dBm to –30 dBm

0dBmto–30dBm

+13dBmto–21dBm

80C25GBE

80C11 Standard Standard

80C12 Standard Standard

*5Option CRTP reduces sensitivity by 0.6 dB (max) and increases noise by 15% (max).

19

*

Smallest power level for mask test. Values represent theoretical typical sensitivity of NRZ eyes for comparison purposes. Assumes i

+4 dBm to –30 dBm

0dBmto–30dBm

Mask Test Optical

5% of reading –22 dBm at 155 Mb/s,

–20 dBm at 2488/2500 Mb/s

5% of reading –16 dBm at all filter rates
5% of reading 25.8 and 27.7 Gb/s:

–8 dBm (1550 nm) and

39.813 to 43.018 Gb/s:

–7 dBm (1550 nm) and

5% of reading –10 dBm at all filter rates;

5% of reading –19 dBm (for all options

–14 dBm (for Option 10G)

nstrument peak-peak noiseconsumes most of the mask margin.

Sensitivity*

19

622 Mb/s;

–7 dBm (1310 nm);

–6 dBm (1310 nm)

–7 dBm at 20 GHz;

–4 dBm at 30 GHz

except Option 10G)

www.tektronix.com 19

Data Sheet

Optical Sampling Module Characteristics (Cont.)

Module

80C07B
80C08C

80C10B
80C11

80C25GBE

*20Low ER signals (ER ≤ 6 dB): signal passes 802.3ae-like mask (scaled horizontally for bit rate); 105samples

in mask. High ER signals (ER > 6 dB): signal passes OC-192-like mask (scaled horizontally for bit rate);

5

10

samples in mask.

Extinction Ratio Calib rated Accuracy (Opt.

Reference Filter

in Range [Gb/s]

01 ER Calibrated)*

Repeatability

(Typical)
(to i tself

and to other

80Cxx-Opt. 01)

—

9.9…11.3

±0.6% (–0.39 dB /

+0.42dBat12dB)

—

9.9…11.3

±0.6% (–0.39 dB /
+0.42dBat12dB)

—

20

Option not available

±1.2% (–0.76 dB /
+0.92dBat12dB)

Option not available

±1.2% (–0.76 dB /
+0.92dBat12dB)

Option not available

Accuracy

TDR System (80E10, 80E08, 80E04 only)

Characteristic

Channels
Input Impedance
Channel Input

80E10 80E08 80E04

222

50 Ω nominal 50 Ω nominal 50 Ω nominal

1.85 mm 2.92 mm 3.5 mm

Connector
Bandwidth

TDR Step
Amplitude

TDR System

50 GHz 30 GHz 20 GHz

250 mV (polarity

of either step may

be inverted)

250 mV (polarity

of either step may

be inverted)

15 ps 20 ps 28 ps

Reflected Rise
Time

TDR System

12 ps 18 ps 23 ps

Incident Rise Time
TDR Step Deskew

±250 ps ±250 ps ±50 ps

Range
TDR Sampler

±250 ps ±250 ps +100 ns – 500 ps

Deskew Range
TDR Step

200kHz 200kHz 200kHz

250 mV (polarity

of either step may

be inverted)

(slot deskew only)

Maximum
Repetition Rate

Physical Characteristics

Module

Width Height Depth Net

Dimensions (mm/in.) Weight (kg/lb.)

80C07B 165/6.5 25/1.0 305/12.0 <1.36/<3.0
80C08C 165/6.5 25/1.0 305/12.0 <1.22/<2.7
80C10B 165/6.5 25/1.0 305/12.0 <2.61/<5.75
80C11 165/6.5 25/1.0 305/12.0 <1.22/<2.7
80C12 165/6.5 25/1.0 305/12.0 <2.61/<5.75
80C25GBE 165/6.5 25/1.0 305/12.0 <2.61/<5.75

Electrical Sampling Module Characteristics

Module Application Type

80E10

True-differential TDR, S-parameters

and fault isolation

Ch

annels

2

Input Impedance

50 ±1.0 Ω 1.85 mm female, precision

adapter to 2.92 mm included

with 50 Ω SMA termination

80E09

High-frequency, low-noise signal

acquisition and jitter characterization

2

50 ±1.0 Ω 1.85 mm female, precision

adapter to 2.92 mm included

with 50 Ω SMA termination

80E08
80E07

True-differential TDR and S-parameters

Optimal noise/performance trade-off

2
2

50 ±1.0 Ω 2.92 mm female 30/20 GHz*
50 ±1.0 Ω 2.92 mm female 30/20 GHz*

for jitter characterization

80E06 High-speed electrical device

characterization

1

50 ±0.5 Ω 1.85 mm female, precision

adapter to 2.92 mm included

with 50 Ω SMA termination

80E04 TDR impedance and crosstalk

2

50 ±0.5 Ω 3.5 mm female 20 GHz*

characterization

80E03 Device characterization 2
80E01

High-frequency, high maximum

operating range signal acquisition

1

50 ±0.5 Ω 3.5 mm female 20 GHz*
50 ±0.5 Ω 2.4 mm female, precision

adapter to 2.92 mm included

with 50 Ω SMA termination

*11Calculated from .35 bandwidth rise time product.

21

Values shown are warranted unless printed in an italic typeface which represents an unwarranted characteristic value that the instrument will typically perform to.

*

22

User selectable.

*

annel Input

Ch

nnector

Co

ndwidth*

Ba

50/40/30 GHz*

60/40/30 GHz*

70+ GHz

50 GHz

21

11, 2 2

11, 2 2

11, 2 2

11, 2 2

11

11

20 www.tektronix.com

Electrical Sampling Module Characteristics (Cont.)

Module Rise Time

(10-90%)

80E10
80E09
80E08
80E07
80E06

7ps*

5.8 ps*

11. 7 ps*

11. 7 ps*

5.0 ps*

11

11

11

11

23

80E04 ≤17.5 ps 1.0 V
80E03 ≤17.5 ps 1.0 V
80E01

*11Calculated from .35 bandwidth rise time product.

23

ted from formula rise time = 0.35/(typical bandwidth).

*

Calcula

11. 7 ps*

11

Dynamic Range

1.0 V

p-p

1.0 V

p-p

1.0 V

p-p

1.0 V

p-p

1.0 V

p-p

p-p

p-p

1.0 V

p-p

Digital Serial Analyzer Sampling Oscilloscope — DSA8200

Offset Range Maximum Operating

Vol t age

Voltage, DC+AC

±1.1 V ±1.1 V 2.0 V
±1.1 V ±1.1 V 2.0 V
±1.1 V ±1.1 V 2.0 V
±1.1 V ±1.1 V 2.0 V
±1.6 V ±1.6 V 2.0 V
±1.6 V ±1.6 V 3.0 V
±1.6 V ±1.6 V 3.0 V
±1.6 V ±1.6 V 2.0 V

Maximum

Nondestruct

Vertical Number of

Digitized Bits

p-p

14 bits full scale
14 bits full scale
14 bits full scale
14 bits full scale
14 bits full scale
14 bits full scale
14 bits full scale
14 bits full scale

www.tektronix.com 21

Data Sheet

Electrical Sampling Module Characteristics (Cont.)

Module

80E10

80E09

80E08

80E07

23

80E06*

E04

80

80E03

80E01

*10Values shown are warranted unless printed in an italic typeface which represents a typical value.

23

Calculated from formula rise time = 0.35/(typical bandwidth).

*

Vertical Sensitivity Range DC Vertical Voltage Accuracy,

Single Point, within ±2 °C of

Compensated Temperature

10 mV to 1.0 V full scale ±[2 mV + 0.007 (Offset) +

0.02 (Vertical Value – Offset)]

10 mV to 1.0 V full scale ±[2 mV + 0.007 (Offset) +

0.02 (Vertical Value – Offset)]

10 mV to 1.0 V full scale ±[2 mV + 0.007 (Offset) +

0.02 (Vertical Value – Offset)]

10 mV to 1.0 V full scale ±[2 mV + 0.007 (Offset) +

0.02 (Vertical Value – Offset)]

10 mV to 1.0 V full scale ±[2 mV + 0.007 (Offset) +

0.02 (Vertical Value – Offset)]

10 mV to 1.0 V full scale ±[2 mV + 0.007 (Offset) +

0.02 (Vertical Value – Offset)]

10 mV to 1.0 V full scale ±[2 mV + 0.007 (Offset) +

0.02 (Vertical Value – Offset)]

10 mV to 1.0 V full scale ±[2 mV + 0.007 (Offset) +

0.02 (Vertical Value – Offset)]

Typical Step Response Aberrations RMS Noise*

±1% or less over the zone 10 ns to 20 ps
before step transition; +6%, –10% or less

for the first 400 ps following step transition;

50 GHz: 600 μV, ≤700 μV
40 GHz: 370 μV, ≤480 μV
30 GHz: 300 μV, ≤410 μV

+0%, –4% or less over the zone 400 ps

to 3 ns following step transition; +1%,

–2% or less over the zone 3 ns to 100 ns

following step transition; ±1% after 100 ns

following step transition

±1% or less over the zone 10 ns to 20 ps
before step transition; +6%, –10% or less

for the first 400 ps following step transition;

60 GHz: 450 μV, ≤600 μV
40 GHz: 330 μV, ≤480 μV
30 GHz: 300 μV, ≤410 μV

+0%, –4% or less over the zone 400 ps

to 3 ns following step transition; +1%,

–2% or less over the zone 3 ns to 100 ns

following step transition; ±1% after 100 ns

following step transition

±1% or less over the zone 10 ns to 20 ps
before step transition; +6%, –10% or less

30 GHz: 300 μV, ≤410 μV
20 GHz: 280 μV, ≤380 μV

for the first 400 ps following step transition;

+0%, –4% or less over the zone 400 ps

to 3 ns following step transition; +1%,

–2% or less over the zone 3 ns to 100 ns

following step transition; ±1% after 100 ns

following step transition

±1% or less over the zone 10 ns to 20 ps
before step transition; +6%, –10% or less

30 GHz: 300 μV, ≤410 μV
20 GHz: 280 μV, ≤380 μV

for the first 400 ps following step transition;

+0%, –4% or less over the zone 400 ps

to 3 ns following step transition; +1%,

–2% or less over the zone 3 ns to 100 ns

following step transition; ±1% after 100 ns

following step transition

±5% or less for first 300 ps following

1.8 mV, ≤2.4 mV (maximum)

step transition

±3% or less over the zone 10 ns to 20 ps

600 µV, ≤1.2 mV (maximum)
before step transition; +10%, –5% or less for
the first 300 ps following step transition; ±3%
or less over the zone 300 ps to 5 ns following

step transition; ±1% or less over the zone

5 ns to 100 ns following step transition; 0.5%

after 100 ns following step transition

±3% or less over the zone 10 ns to 20 ps

600 µV, ≤1.2 mV (maximum)
before step transition; +10%, –5% or less for
the first 300 ps following step transition; ±3%
or less over the zone 300 ps to 5 ns following

step transition; ±1% or less over the zone

5 ns to 100 ns following step transition;

±0.5% after 100 ns following step transition

±3% or less over the zone 10 ns to 20 ps

1.8 mV, ≤2.3 mV (maximum)

before step transition; +12%, –5% or

less for the first 300 ps following step

transition; +5.5%, –3% or less over the

zone 300 ps to 3 ns following step transition;

±1% or less over the zone 3 ns to 100 ns

following step transition; ±0.5% after

100 ns following step transition

10

22 www.tektronix.com

S-parameter Performance Characteristics (80E10)

Measurement Conditions

All measurements were performed after proper warm up as specified in
the DSA8200 manual

Standard S-parameter dynamic range measurement practices were
used to determine the dynamic range of the m

Uncertainty results were derived from a wide range of devices, with 250
averages

Better dynamic range can be achieved by selecting lower bandwidth
settings on the 80E10 modu le due to lower RMS noise floor

Results apply to single-ended or differential measurements

odule

Digital Serial Analyzer Sampling Oscilloscope — DSA8200

Dynamic Range

Uncertainty

www.tektronix.com 23

Data Sheet

Physical Characteristics for Electrical Sampling Modules

Module

24

80E10*

24

80E09*

24

80E08*

24

80E07*
80E06
80E04
80E03
80E01

*24Remote module characteristics.

80A05 and 80

Product Feature 80A05 80A07

Supported

A07 Electrical Clock Recovery Module

Specifications

Dimensions (mm/in.)

Width Height Depth Net

55/2.2 25/1.0 75/3.0 0.175/0.37
55/2.2 25/1.0 75/3.0 0.175/0.37
55/2.2 25/1.0 75/3.0 0.175/0.37
55/2.2 25/1.0 75/3.0 0.175/0.37
79/3.1 25/1.0 135/5.3 0.4/0.87
79/3.1 25/1.0 135/5.3 0.4/0.87
79/3.1 25/1.0 135/5.3 0.4/0.87
79/3.1 25/1.0 135/5.3 0.4/0.87

Standard Option 10G

Weight
(kg/lb.)

Enumerated Standards
OC3/STM1 155.52 Mb/s
OC12/STM4 622.08 Mb/s
Fibre Channel 1.063 Gb/s
Gigabit

1.25 Gb/s

■■

■■■

■■■

■■■

25

♦*

Ethernet
SAS Gen I 1.50 Gb/s ♦*

2GBFibre

2.125 Gb/s

26

26

♦*

■■■

■

Channel
OC48/STM16 2.488 Gb/s

2 GB Ethernet 2.50 Gb/s
PCI Express I 2.50 Gb/s ♦*
Infiniband

2.5G G.709

®

2.50 Gb/s

2.666 Gb/s

■■■

■■■

26

26

♦*

■■

■■

■

25

♦*

25

♦*

FEC
SAS Gen II 3.0 Gb/s ♦*

XAUI,

3.125 Gb/s

26

26

♦*

■■

■

25

♦*

10GBASE-X

GB Fibre

10

annel x4

Ch
4GBFibre

188 Gb/s

3.

4.25 Gb/s

■■

■■■

25

♦*

Channel
FB-DIMM1 3.2, 4.0,

25, 26

♦*

■

4.8 Gb/s

PCI Express II 5.0 Gb/s ♦*
FB-DIMM2 4.8, 6.4, 8.0,

25, 26

25, 26

♦*

■

■

9.6 Gb/s

OIF CEI 6+ Gb/s ♦*
2x XAUI
8GBFibre

9

Channel*

6.25 Gb/s

8.50 Gb/s

OC192/STM64 9.953 Gb/s
XFP/XFI

9.95-11.2

25

■

■■

25

♦*

■

25

♦*

■

■

Product Feature 80A05 80A07

Standard Option 10G

10GBASE-W 9.953 Gb/s
10GBASE-R*910.31 Gb/s
10GB Fibre

10.51 Gb/s

■

■■

■

25

♦*

25

♦*

Channel
G.975 FEC 10.66 Gb/s

G.709 FEC 10.71 Gb/s
OIF CEI 11+ Gb/s ♦*
10 GbE w/

11. 10 Gb/s

■

■

25

■

25

♦*

25

♦*

■

25

♦*

FEC
Super FEC 12.50 Gb/s

■

25

♦*

Additional enumerated standard

rates are supported with

8000 Series Firmware Releases

higher than 2.4.x

Clock Recovery Ranges for
Custom (User specified) Rates
(in addition to enumerated lists
above)

50 Mb/s to

3.188 Gb/s

4.25 Gb/s

50 Mb/s to

3.188 Gb/s

3.267 to

4.25 Gb/s

100 Mb/s to

12.5 Gb/s

continuous

4.900 to

6.375 Gb/s

9.800 to

12.60 Gb/s

Sensitivity (Clock recovery will lock, differential data is given for each input)
Lowest Supported Rate to

2.70 Gb/s

2.70 to 11.19 Gb/s Differential

Differential ≤8mV

Single Ended 10 mV

≤12 mV

Single Ended

15 mV

p-p

p-p

Differential

15 mV (typ)

Single Ended

30 mV (typ)

p-p

p-p

11.19 to 12.60 Gb/s Differential

≤15 mV

p-p

Single Ended

20 mV

p-p

*9Draft version of the 8.5GFCfilter. T11committee redefined this filter at the April 2008 meeting. New 8.5GFC

filter, as defined by T11 committee in April 2009, is identical to the 10BASE-R 10.313G filter and is available
for 80C12 Option 10G modules only; and is identified as 10BASE-R.

25

*

The standard is not enumerated but is supported as a custom rate.

26

*

No spread spectrum clocking support.

DSA8200 Mainframe Physical Characteristics

Dimensions (mm/in.) Weight (kg/lb.)

Width Height Depth Net

457/18.0 343/13.5 419/16.5 21/46

Computer System and Peripherals

Characteristic

Operating System

Description

Windows XP
CPU Intel Celeron 2.93 GHz processor
PC System Memory
Hard Disk Drive
DVD-ROM/CD-RW

Drive

512 MB

Rear-panel, removable hard disk drive, 40 GB capacity

Front-panel DVD-ReadOnly/CD-ReadWrite drive with

CD-creation software application

24 www.tektronix.com

Digital Serial Analyzer Sampling Oscilloscope — DSA8200

Input/Output Ports

Characteristic

Front Panel

USB 2.0 Port One USB 2.0 connector
Anti-static

Connection
Trigger Direct Input

Trigger Pre-scale
Input

Internal Clock
Output

External 10 MHz
Reference Input

DC Calibration
Output

Rear Panel

USB Ports 4 USB 2.0 connectors

lPort

Paralle
LAN Port
Serial Port DB-9 COM1 port
GPIB
VGA Video Port DB-15 female connector; connect a second monitor to use

Oscilloscope VGA
Video Port

Gated Trigger Input (Option GT only); See Trigger System specification

Description

Banana-jack connector, 1 MΩ

See Trigger System specification
See Trigger System specification

See Trigger System specification

±5 V maximum

±1.25 V maximum

4, DB-25 connector

IEEE 128
RJ-45 connector, supports 10BASE-T, 100BASE-T

.2 connector

IEEE488

dual-monitor display mode
DB-15 female connector, connect to show the oscilloscope

display, including live waveforms on an external monitor or
projector

Operating Requirements

cription

Characteristic

er Requirements

Pow

e voltage and

Lin

quency

fre

Environmental Characteristics

perature

Tem

Operating +10 °C to +40 °C

noperating

No
lative Humidity

Re

Operating
(Floppy disk
and CD-ROM
not installed)

Nonoperating

Altitude

Operating 3,048 m (10,000 ft.)
Nonoperating

Electromagnetic
Compatibility

Safety UL3111-1, CSA1010.1, EN61010-1, IEC61010-1

Des

100 to 240 V AC ±10% 50/60 Hz
115 V AC ±10% 400 Hz

–22 °C to +60 °C

20% to 80% at or below 40 °C (upper limit de-rates to 45%
relative humidity at 40 °C)

5% to 90% at or below 60 °C (upper limit de-rates to 20%
relative humidity at +60 °C)

12,190 m (40,000 ft.)
89/336/EEC

Ordering Information

DSA8200 Digital Serial Analyzer Sampling Oscilloscope

Includes: Use

and mouse, tou
With OpenCho
analysis wit
Windows osci
and The MathW
featured on a

Options

Option

Opt. GT Gated Trigger
Opt. JARB Jitter Analysis of Arbitrary Data (included with purchase

Opt. JNB
Opt. JNB01

Service Options

Option

Opt. C3 Calibration Service 3 Years
Opt. C5 Calibration Service 5 Years
Opt. D1 Calibration Data Report
Opt. D3 Calibration Data Report 3 Years (with Opt. C3)
Opt. D5 Calibration Data Report 5 Years (with Opt. C5)
Opt. R3 Repair Service 3 Years
Opt. R5 Repair Service 5 Years

International Power Plug Options

Option

Opt. A0
Opt. A1 Universal EURO
Opt. A2
Opt. A3
Opt. A4
Opt. A5 Switzerland
Opt. A10 China
Opt. A99

r manual, quick reference card, MS Windows XP compatible keyboard

ch screen stylus, online help, programmer online guide, power cord.

ice™ software, Tektronix provides enhanced test and measurement

h the capability of full integration of third-party software o n the open

lloscopes. By working with the industry leaders, National Instruments

orks, examples of software programs from these companies are

ll Tektronix open Windows oscilloscopes.

Description

of Opt. JNB or Opt. JNB01). See 80SJARB for more

information

Essential and Advanced Jitter, Noise, and BER Analysis

Software. See 80SJNB Essentials and 80SJNB Advanced

for more information

Description

Description

North America

United Kingdom

Australia

240 V, North America

No power cord

www.tektronix.com 25

Data Sheet

Other Accessories

Accessory Description

Sampling Module Extender Cable (2 meter) Order 80N01 (not compatible with 80E10, 80E09, 80E08, or 80E07 modules)
SlotSaver Adapter Extender Cable Brings power and control to the 80A06 when operated externally from the mainframe, saving slot space (compatible with 80A06

82A04 Filter 2 GHz Filter kit for non-sinusoidal phase reference clock signal with frequency between 2 GHz and 4 GHz. Order 020-2566-xx
82A04 Filter 4 GHz Filter kit for non-sinusoidal phase reference clock signal with frequency between 4 GHz and 6 GHz. Order 020-2567-xx
82A04 Filter 6 GHz Filter kit for non-sinusoidal phase reference clock signal with frequency between 6 GHz and 8 GHz. Order 020-2568-xx
2X Attenuator (SMA male-to-female) DC to 18 GHz. Order 015-1001-xx
5X Attenuator (SMA male-to-female) DC to 18 GHz. Order 015-1002-xx
Connector Adapter (2.4 mm or 1.85 mm male to 2.92 mm female) DC to 40 GHz. Order 011-0157-xx
Power Divider
Rackmount Kit
Wrist Strap (Anti-static) Order 006-3415-04
P7513/P7516 13 GHz and 16 GHz TriMode™ Differential probes. Requires 80A03 Interface module
P7260
P7350
P7350SMA 5 GHz 50 Ω Differential to Single-ended Active Probe. Requires 80A03 Interface module. Note that the P7380 probes are

P7380SMA 8 GHz 50 Ω Differential to Single-ended Active Probe. Requires 80A03 Interface module
P6150

P8018
P80318
80A01

80A02
80A03
82A04

80A05

The standard version of 80A05 supports
signals in the following ranges:

The Option 10G adds the ranges of: 3.267 Gb/s - 4.250 Gb/s

80A06

80A07

80SJARB 80SJARB Jitter Analysis of Arbitrary Data software. Provides a basic jitter measurement tool capable of measuring jitter on

80SJNB Essentials 80SJNB Essentials with Jitter, Noise, and BER Analysis software. Provides separation of jitter and noise into their constituent

80SJNB Advanced 80SJNB Advanced adds equalization, channel emulation, fixture de-embedding. Also see Opt. JNB/JNB01

and 80A02). Order 174-5230-xx

50 Ω, impedance matching power divider, SMA male to two SMA females. Order 015-0705-xx
Order 016-1791-xx

6 GHz Active FET Probe. Requires 80A03 Interface module
5 GHz Active FET Probe. Requires 80A03 Interface module

recommended over the P7350 probes for sampling purposes due to their higher bandwidth and signal fidelity

9 GHz Passive Probe; the probe consists of a very high-quality 20 GHz probe tips, plus an extremely flexible SMA cable. For
higher frequency performance the 015-0560-xx, or some of the accessory cables listed can be used

20 GHz Single-ended TDR Probe. 80A02 module recommended for static protection of the sampling or TDR module
18 GHz 100 Ω Differential Impedance TDR Hand Probe
Pre-scaled Trigger Amplifier. Not required on the DSA8200, CSA8200, or TDS8200 mainframes with their increased sensitivity

pre-scaler. The amplifier enhances pre-scaler sensitivity on the older TDS8000B and CSA8000B mainframes
DSA8200 EOS/ESD Protection module (1 channel). P8018 TDR probe recommended
Enables the use of two Tektronix P7000 Series TekConnect™ probes on the DSA8200 or 8000 Series sampling oscilloscopes
Phase Reference module for low-jitter acquisition (with or without trigger). Accepts signals from 2 GHz to 25 GHz (external filter

might be required below 8 GHz), or to 60 GHz with Option 60G
Electrical Clock Recovery module. Applicable to electrical signals and for the 80C12
50 Mb/s - 2.700 Gb/s

2.700 Gb/s - 3.188 Gb/s
Rate of 4 Gigabit Fibre Channel 4.250 Gb/s

4.900 Gb/s - 6.375 Gb/s

9.800 Gb/s - 12.60 Gb/s
PatternSync module for 80SJNB jitter analysis package. Programmable divider for creating a trigger pulse from patterns up to

23

2

in length

Electrical Clock Recovery module. 80A07 recovers clocks from serial data streams for all of the most common electrical
standards in the continuous 100 Mb/s to 12.5 GB/s range. Applicable to electrical signals and for 80C12

any waveform – random or repetitive. Also see Opt. JARB

components and provides highly accurate eye-opening and BER calculations. Also see Opt. JNB/JNB01

26 www.tektronix.com

Digital Serial Analyzer Sampling Oscilloscope — DSA8200

Interconnect Cables (3rdParty)

Tektronix recommends using quality high-performance interconnect cables with
these high-bandwidth products in order to minimize measurement degradation
and variations. The W.L. Gore and Associates’ cable assemblies listed below are
compatiblewiththe2.92mm,2.4mm,and1.85mmconnectorinterfaceofthe
80Exx modules. Assemblies can be ordered by contacting Gore by phone at (800)
356-4622, or on the Web at www.gore.com/tektronix

Calibration Kits and Accessories (3

To facilitate S-parameter measurements with the new 80E10, 80E08, and 80E04
electrical TDR modules and IConnect

rd

Party)

®

software, we recommend precision
calibration kits, adapter kits, connector savers, airlines, torque wrenches, and
connector gauges from Maury Microwave. These components, accessible at
www.maurymw.com/tektronix.htm, are compatible with the 2.92 mm, 2.4 mm, and

1.85 mm connector interface of the 80Exx modules. Cal kits and other components
can be ordered by contacting Maury Microwave.

Interconnect Cables

015-0560-xx (450 mm / 18 in.; 1 dB loss at 20 GHz) cable is a high-quality cable
recommended for work up to 20 GHz.

Cable

Bench Top Test Cable Assemblies

TEK40PF18PP
TEK50PF18PP
TEK65PF18PP

High-frequency Interconnect Cables for
Electrical Sampling Modules

TEK40HF06PP
TEK40HF06PS 40 GHz

Frequency

40 GHz
50 GHz
65 GHz

40 GHz

Connectors

2.92 mm male 18.0 inches

2.4 mm male 18.0 inches

1.85 mm male 18.0 inches

2.92 mm male 6.0 inches

2.92 mm male;

Length

6.0 inches

2.92 mm female

TEK50HF06PP

50 GHz

TEK50HF06PS 50 GHz

2.4 mm male 6 .0 inches

2.4 mm male;

6.0 inches

2.4 mm female

TEK65HF06PP
TEK65HF0

6PS

65 GHz
65 GHz

1.85 mm male 6.0 inches

1.85 mm male,

6.0 inches

1.85 mm female

Product(s) are manufactured in ISO registered facilities.

www.tektronix.com 27

Data Sheet

Contact Tektronix:

ASEAN / Australa

Balkans, Israel, South Africa and other ISE Countries [phone]

Central East Eu

Mexico, Central/South America & Caribbean (52) 56 04 50 90

* European toll-free number. If not accessible, call: [phone]

rope, Ukraine, and the Baltics [phone]

Central Europe & Greece [phone]

Asia, and North Africa [phone]

Middle Eas t,

The Netherlands 00800 2255 4835*

People’s Rep

Republic of

Russia & CIS [phone]

United Kingdom & Ireland 00800 2255 4835*

sia (65) 6356 3900

Austria 00800 2255 4835*

Belgium 00800 22

Brazil [phone]

Canada 1 800 833 9200

Denmark [phone]

Finland +41526

France 008 00 2255 4835*

Germany 00800 2255 4835*

Hong Kong 400 8

India 000 800 650 1835

Italy 00800 2255 4835*

Japan 81 (3) 67

Luxembourg [phone]

ublic of China 400 820 5835

Poland [phone]

Korea 001 800 8255 2835

South Africa [phone]

Spain 00800

Sweden 008 00 2255 4835*

Switzerland 00800 2255 4835*

Tai wa n 886 (

55 4835*

75 3777

20 5835

14 3010

Norway 800 16098

Portugal 80 08 12370

2255 4835*

2) 2722 9622

USA 1 800 833 9200

Updated 25 May 2010

www.tektronix.com

For Further Information. Tektronix maintains a comprehensive, constantly expanding
collection of application notes, technical briefs and othe r resources to help engineers working
on the cutting edge of technology. Please visit www.tektronix.com

t © Tektronix, Inc. All rights reserved. Tektronix products are covered by U.S. and foreign patents,

Copyrigh

d pending. Information in this publication supersedes that in all previously published material.

issued an

tion and price change privileges reserved. TEKTRONIX and TEK are registered trademarks of

Specifica

x, Inc. All other trade names referenced are the service marks, trademarks, or registered trademarks

Tek tro ni

espective companies.

of their r

21 Jun 2010 85W-17654-17