Tektronix DSA8200 DATASHEET

Digital Serial Analyzer Sampling Oscilloscope

DSA8200 Data Sheet

Jitter, Noise, BER, and Serial Data Link Analysis

Measures and Separates Deterministic Data-dependent Jitter from
Random Jitter

tical Noise, Separating Deterministic Data-dependent

er for Fixture De-embedding, Linear Filtering

at 50 GHz

RMS

rd

party Software

Features & Benefits

State-of-the-Art Sampling Oscilloscope for Communication Signal
Analysis, TDR / TDT / Serial Data Network Analysis, Acquisition, and
Measurements of Repetitive Ultrafast Signals

Acquisition of Spread Spectrum Clocking (SSC) Signals

y’s Only M ainframe to Support up to 8 Input Channels for

Industr
Increased Flexibility and Throughput
Four Color-graded, Variable Persistence Waveform Databases
Measurement System with Over 100 Automated Measurements
Complete Suite of Communications Measurements includes Both
Types of OMA, SSC Pro file, and Many Others

ted ITU/ANSI/IEEE Mask Testing

Automa
Masks and Measurements for SONET/SDH, FC, Ethernet, and Other
Standards Built-in
Mask Updates can be Loa ded from Factory-supplied File
Mask Margin Testing for Guard Banding Production Testing

Acquisition Modules

Fully Integrated Multirate Optical Modules
Optical Modules up to 80 GHz 80C10B

ccuracy "ER Calibrated" Measurement Available in Some

High-a
Modules
Electrical Modules up to 70+ GHz Bandwidth and 5 ps Measured Rise
Time (10-90%)
Flexible Rate Clock Recovery
Clock Recovery with SSC (Spread Spectrum Clocking) Support

able

Avail

Measures Ver
Noise from Random Noise
Highly Accurate BER and Eye Contour Estimation, Support for
DDPWS
FFE/DFE Equalization, Transmitter Equalization
Channel Emulation for Channels with >30 dB of Loss
Linear Filt

TDR (Time Domain Reflectometry)

Up to 50 GHz TDR Ba ndwidth with 15 ps Reflected Rise Time and
12 ps Incident Rise Time
Lowest Noise for Accurate Repeatable TDR Measurement R esults –
600 μV
Independent Sampler Deskew ensures Easy Fixture and Probe
De-embedding
Industry’s Only Mainframe to Accommodate up to Four
True-differential TDR or Electrical Channel Pairs for Increased
System Versatility

S-parameters Measurements

Up to 50 GHz Differential, Single Ended, Mixed Mode; Insertion,
Return Loss, Frequency Domain Crosstalk
PCI Express, Serial ATA, Infiniband, Gigabit Ethernet Manufacturing,
and Standard Compliance Testing for Gigabit Signal Path and
Interconnects – Including Eye Mask Tests
Intuitive, Easy, and Accurate for S erial Data, Gigabit Digital Design,
and Signal Integrity
Fast and Accurate Automated Multiport S-parameter Measurements
with Command Line Interface

Industry’s Best Standard Time-base Jitter Perform ance, 800 fs

Industry-leading Time-base Jitter Performance, <200 fs
with Phase Reference Mode

Fast Acquisition Rate and High Throu ghput

True-differential Remote Sampler enabling Placement Near DUT for
Superior Signal Fidelity

FrameScan™ Acquisition Mode with Eye Diagram Averaging:

Isolate Data-dependent Faults
Examine Low-power Signals

MS Windows XP Operating System

ced Connectivity to 3

Advan

*1Available

RMS

RMS

Data Sheet

Applications

Design/Verification of Telecom and Datacom Components and Systems

Manufacturing/Testing for ITU/ANSI/IEEE/SON ET/SDH Compliance

High-performance True-differential TDR Measurements

Advanced Jitter, Noise, and BER Analysis

Impedance Characterization and Network A nalysis for Serial Data
Applications including S -parameters

Channel and Eye Diagram Simulation and Measurement-based SPICE
Modeling

*1Typical, with the Phase Reference module, some conditions apply. Without the module, the jitter is

<800 fs

(typical).

RMS

Superior Performance with Extraordinary
Versatility

For developing today’s high-speed serial devices, the DSA8200 D igital
Serial Analyzer sampling oscilloscope is the most versatile tool for
communication, computer and consumer electronics gigabit transmitter and
signal path characterization, and compliance verification. With exceptional
bandwidth, signal fidelity, and the most extensible modular architecture, the
DSA8200 provides the highest performance TDR and inte rconnect analysis,
most accurate ana lysis of signal impairments, and BER calculations for
current and emerging serial data technology.

The DSA8200 provides unmatch ed measurement system fidelity with
ultra-low jitter floor that ensures the most accurate acquisition of high-speed
signals. You get advanced analysis benefits from the 200 fs acquisition
jitter with the Phase Reference module. And in another step forward for a
sampling oscilloscope, with the help of the Phase R efe rence module the
DSA8200 can acquire and measure SSC (Spread Spectrum Clocking)
signals.

The multiprocessor architecture, with dedicated per-slot digital signal
processors (DSPs), provides fast waveform acquisition rates, reducing
the test times necessary for reliable characterization and compliance
verification.

The DSA8200’s versatile modular architecture supports a large and growing
family of plug-ins enabling you to configure your measurement syst
a wide variety of electrical, optical, and accessory modules that best suit
your application now an d in the future. With 6 module slots, the DSA8200
can simultaneously accommodate a Clock Recovery module, a pre cision
Phase Reference modu le, and multiple acquisition modules, electrical or
optical, so you can match system performance to your evolving needs.

Featuring industry-leading signal fidelity, the family of electrical modules
includes bandwidth performance from 12 GHz to 70+ GHz. Two

ferential Time Domain Reflecto meter (TDR) modules, with remote

true-dif

em with

samplers, offer up to 50 GHz bandwidth and 15 ps reflected rise time
and 12 ps incident rise time. The family of low-noise variable-bandwidth
electrical mod
remote samplers, featuring 450 μV

ules provides the industry’s best noise perfo rmance with

noise at 60 GHz, and 300 μV

RMS

RMS

at

30 GHz.

DSA8200 optical modules provide complete optical test solutions with
superior system fidelity from 125 Mb/s to 43 Gb/s and beyond. The modules
cover a range of waveleng ths for both single- a nd multi-mode fibres. Each
module can be option ally configured with a number of selectable data rate
filters, optical reference receivers (ORR), and/or a full bandwidth path. The
80C07B, 80C08

C, and 80C11 can be configured with a number o f available
flexible integrated clock recovery options. The 80C12 Multirate mod ule
clock recovery support is achieved with an electrical output for use with the
80A05 or 80A07 Electrical Clock Recovery modules.

The DSA8200’s popular Fram eScan™ acquisition m ode can be
used with patterns from DUTs, BERTs, and other sources, to isolate
pattern-dependent e ffects in transmitters or show the bit sequence
preceding a mask violation. FrameScan automatically sequences the time
base so that e

ach bit of the data s tream is acquired in time order. When
used in combination with mask-testing conditional acquisition features of
the DSA8200, such as stop after mask hits, FrameScan can automatically
identify at which bit a pattern-dependent failure occurred.

In addition, specialized modules supporting features such as single-ended
and differential electrical clock recovery, electrostatic protection for the TDR,
and connectivity to the popular TekConnect probing system brings you the
performance of Tektronix state-of-the-art probes for high-impedance and

al probing. Low-impedance probes for 50 Ω probing an d for TDR

differenti
probing are also available.

Jitter, Noise, BER, and Serial Data Link
Analysis

High-speed serial data link m easurements and analysis are supp orted with
three software solution s: 80SJARB, 80SJNB Essentials,and80SJNB

Advanced.

80SJARB is a basic jitter measurement tool capable of measuring jitter on

any wavefo
the amount of analysis possible so only the simplest decomposition can be
used; repeatability is pattern de pendent.

80SJNB Essentials offers complete analysis of jitter, noise, and BER,
with decomposition of components for clear understanding of a signal’s
problems and margins. The acquisition methodology requires a repetitive
pattern. Both accuracy and repeatability are improved relative to 80SJARB
since the tool has access to the complete signal pattern.

80SJNB Advanced ad ds features to 80SJNB Essentials for Serial Data
Link Analysis – de-embedding of fixture, channel emulation, FFE/DFE
equaliza

rm – random or repetitive. The simplicity of acquisition limits

tion, pre-emphasis/de-emphasis.

2 www.tektronix.com

TDR and electrical modules with fully integrated remote sampler.

Digital Serial Analyzer Sampling Oscilloscope — DSA8200

TDR (Time Domain Reflectometry)

The DSA8200 is the industry’s highest performance fully integrated
Time Domain Reflecto metry (TDR) measurement system. Offering
true-differential TDR measurements up to 50 GHz bandwidth with 15 ps
reflected rise time and 12 ps incident rise time, you are able to keep
pace with today’s most demanding Serial Data Network Analysis (SDNA)
requirements.

The new 80E10 and 80E08 TDR modules feature a fully integrated
independent dual-channel 2-meter remote sampler system to minimize
fixturing and assure optimal system fidelity. Independent sampler deskew
ensures fast and easy fixture and probe de-embedding. The user can

erize differential crosstalk by using TDR steps from a differential

charact
module to drive one line pair while monitoring a second line pair with a
second differential module.

Small form factor remote sampler enables placement near DUT assuring optimal signal
fidelity.

The DSA8200 is the industry’s most versatile TDR measurement system,
accommodating up to 4 dual-channel true-differential TDR modules for fast
accurate

The P80318 True-differential TDR probe and P8018 Single-ended Passive
Handheld
board impedance and electrical signal characterization. The P80318, an
18 GHz 100 Ω input impedance differential TDR hand probe , enables
high-fidelity impedance measurements of d ifferential transmission lines.
The adjustable probe pitch enables a wide variety of differential line spacing
and impedances. The P8018 is a 20 GHz Single-ended Passive Handheld
TDR prob
probes but are especially designed to work with the 80A02 for the control of
EOS/ESD protection.

multilane impedance characterization.

TDR probe provide high-perform ance probing solutions for circuit

e. Both the P80318 and P8018 can be used as stand-alone

www.tektronix.com 3

Data Sheet

Gigabit Signal Path Characterization and
Analysis – Serial Data Network Analysis
(SDNA)

As clock speeds and rise times of digital circuits increase, interconnect
signal integrity dramatically affects digital system performance. Accurate
and efficient Serial Da ta Network Analysis (SDNA) of the signal path and
interconnects in time and frequency domains is critical to predict signal
losses, jitter, crosstalk, terminations and ringing, digital bit errors, and eye
diagram degradation, ensuring reliable system operation.

Tektronix offers several true-differential TDR modules, which in co mbination
with IConnect
–70 dB of dynamic range. This performance assures accurate repeatable
measurement in serial data analysis, digital design, signal integrity, and
electrical compliance testing applications.

The table below summarizes th e S-parameter measurement bandwidth
performance when IConnect and the true-differential TDR modules are used
in combination.

®

software, allow S-parameters measurements with up to

entify the exact location of faults with the 80E10’s sub-millimeter resolution and

Quickly id
IConnect T

rue Impedance Profile.

TDR Module

80E10
80E08
80E04

S-parameter Measurement Bandwidth
Performance

50 GHz
30 GHz
20 GHz

With the long record length acquisitions, IConnect®provides great flexibility
for obtaining the desired freq uency range and frequency st ep when
performing S-parameter measurements. Up to 1,000,000 points can be
acquired*

When you employ IConnect

2

.

®

Signal Integrity TDR and S-parameter
software with the DSA8200 you have an efficient, easy-to-use, and
cost-effective solution for measurement-based performance evaluation
of multi-gigabit interconnect links and devices, including signal integrity
analysis, impedance, S-parameter, and eye-diagram tests, and fault
isolation. IConnect can help you complete interconnect analysis tasks in
minutes instead of days, resulting in faster system design time and lower
design costs. IConnect also enables impedance, S-parameters, and
eye-diagram compliance testing as required by many serial data standards,
as well as full channel analysis, Touchstone (SnP) file output, and SPICE
modeling for gigab it interconnects.

*2Long record lengths are supported only on DSA8200, CSA8200, TDS8200, CSA8000, and TDS8000

platforms.

Failure Analysis – Quickly Identify Fault
Location

The 80E10 provides superior resolution enabling the fastest and most
efficient fault isolation in package, circuit board, and on-chip failure analysis
applications.

Advanced Communication Signal Analysis

ally designed for ultra high-performance optical and electrical serial

Specific
data applications, the DSA8200 is the ideal tool for design characterization
and validation, as well as manufacturing test of datacom and telecom
components, transceiver suba sse m blies, and transmission systems. The
DSA8200 generates measurement results, not just raw data, with time
and amplitude histograms, mask testing, and statistical measurements. It

s a communications-tailored measurement set that includes jitter,

provide
noise, duty cycle, overshoot, undershoot, OMA, extinction ratio, Q-factor,
mean optical power, and amplitude. In add ition, you can do mask testing of
SONET/SDH, 100 Gigabit (4× 25), 10 Gigabit, Gigabit Ethernet, and other
electrical and optical standards compliance verification. Color grading and
grayscale grading of waveform data adds a third dimension, sample density,

signal acquisitions and analysis to provide visual insight. In addition,

to your
the variable persistence database feature enables exact data aging to all of
the functions, and facilitates eye measurements on DUTs under adjustment.

4 www.tektronix.com

Digital Serial Analyzer Sampling Oscilloscope — DSA8200

OpenChoice Software Enables Familiar Tools
to Extend Your Measurement System

The DSA8200 provides an open Windows environment offering ne w levels
of data analysis on the instrument using your favorite commercially available
third-party software packages. Additionally, TekVISA™, a standard software
accessory, al
applications (such as LabVIEW, LabWindows, Visual Basic, Microsoft
Excel, C, etc.) running on the instrument or on an external PC workstation’s
network connected to the instrument without the need of a GPIB hardware
interface. Plug-and-play drivers for LabVIEW and other programs are also
supplied.

The DSA8200 combines the familiarity of Microso ft’s Windows XP operating
system with world-class waveform acquisition technology. This platform
provides a wi
interfaces, including: GPIB, parallel printer port, RS-232-C, USB serial
ports, and an Ethernet LAN connection. In addition, the platform includes
a DVD-CD/RW combo drive and removable hard drive for storage of
waveforms, setups, and analysis results.

lows the instrument to be placed under the control of software

de array of standard instrumentation and communications

155 Mb/s to 12+ Gb/s Optical Test

Tektronix optical modules for DSA8200 offer highest level of integration in
the industry, with corresponding higher repeatability and transferability of
the result. A particularly method-sensitive measurement, Extinction Ratio
(ER) is now also available as ER Calibrated, with an additional layer of
improvement to the portability of the result (80C08C and 80C11 modules
only).

Fibre Channel applications at 8.5 Gb/s, 10.51, and 11.3 Gb/s. The 80C12
also provides telecom rate te sting at 9.95, 10.66, and 10.70 Gb/s. With
its amplified O/
performance and high optical sensitivity, allowing users to examine low
power level optical signals. Clock recovery for the 80C12 is provided
through the 80A05 or 80A07 Clock Recovery modules (sold separately).

E design, this module provides excellent signal-to-noise

80C11 30 GHz Long Wavelength Multirate 10 Gb/s
Optical Module

The 80C11 is optimized for testing of long wavelength signals (1100 to 1650
nm) at a number of rates around 10 Gb/s with a highly flexible multirate
filter. Additionally the high optical bandwidth of 30 GHz (typical) and the
excellent frequency response of its full bandwidth path is well suited for
general purpose high-performance optical component testing. The 80C11
can be configured with clock recovery options that supports any standard or
user-defined rate from 9.8 to 12.6 Gb/s.

80C07B 2.5 GHz Broad Wavelength Multirate 155 Mb/s
to 2.5 Gb/s Optical Module

The 80C07B is a broad-wavelength (7 00 to 1650 nm) multirate optical
sampling module optimized for testing datacom /telecom signals from 155 to
2500 Mb/s. With its amplified O/E design, this module provides excellent
signal-to-noise performance, allowing users to examine low-power optical
signals. The 80C07B can be optionally configured with multirate clock
recovery that operates from 155 to 2.7 M b/s.

40 Gb/s and 100 Gb/s Optical Test

80C08C 10 GH

z Broad Wavelength Multirate 10 G b/ s

Optical Module

The 80C08C is a broad-wavelength (700 to 1650 nm) mu ltirate optical
sampling module providing datacom rate testing for 10GbE applications at

9.95, 10.31, 11.09 Gb/s and 10G Fibre C hanne l applications at 10.51 Gb/s.
The 80C08C also provides telecom rate testing with several filters between

9.95 and 11.3 Gb/s. With its amplified O/E design, this module provides
excellent
users to examine low power level optical signals. The 80C08C can be
optionally configured with clock recovery option s that can support any
standard or user-defined rate in a continuous range from 9.8 to 12.6 Gb/s.

signal-to-noise performance and high optical sensitivity, allowing

80C12 Up to 10 GHz Broad Wavelength Multirate 1 Gb/s
to 10 Gb/s Optical Module

The 80C012 is a broad-wavelength (700 to 1650 nm) multirate optical
sampling module providing 1G, 2G, and 4G te lecom and datacom testing.
This high
rate applications (1 to 4 Gb/s) or a wide variety of 10 Gb/s applications.
The low data rate applications include: 1, 2, 4, and 8 Fibre Channel and
“by 4” wavelength d ivision multiplex standards such as 10GBASE-X4 and
4-Lane 10 Gb/s Fibre Cha nnel. The supported 10 Gb/s applications include
both datacom and telecom. The supported 10 Gb/s datacom applications
include 1

ly flexible module can be configured to support either lower data

0GbE at 9.95, 10.31, 11.09 Gb/s, 8G Fibre Channel, and 10G

80C10B Multirate Datacom and Telecom 40 Gb/s and
100 Gb/s

The 80C10B module provides integrat ed and selectable reference receiver
filtering, enabling compliance testing at either 1310 nm or 1550 nm for

39.813 Gb/s (OC-768/STM-256, VSR2000 G.693, 40G NRZ G.959.1),

41.25 Gb/s (40GBASE-FR), and 43.018 Gb/s [G.709 FEC, OTU3,
(4x10G LAN PHY)] rates. In addition to the filter rates, the user may
also choose selectable bandwidths of 30 GHz, 65 GHz, and 80 GHz for
80C10B for optimal noise vs. bandwidth performance for accura te signal
characterization. The 80C10B is optionally available with Option F1 which
extends filter selection s to include 27.739 Gb/s (100GBASE-LR4 + FEC
and 100GBASE-ER4 + FEC), and 25.781 Gb/s (100GBASE-LR4 and
100GBASE-ER4). When equipped with Option CRTP, an electrical signal
pickoff is provided for clock recovery using an external module (such as
the Tektronix CR286A-HS). The 80C10B is also optionally available in
a bundled ordering configuration which includes a 70+ GHz electrical
sampling channel.

80C25GBE Multirate Datacom 100 Gb/s

80C25GBE module provides 65 GHz full bandwidth with integrated
selectable reference receiver filtering, enabling compliance testing
at either 1310 nm or 1550 nm for 27.739G (100GBASE-LR4 + FEC
and 100GB

ASE-ER4 + FEC), and 25.781G (100GBASE-LR4 and

www.tektronix.com 5

Data Sheet

100GBASE-ER4). When equipped with Option CRTP, an electrical signal pickoff is provided for clock recovery using an external module (such as

the Tektronix CR286A-HS).

Optical Modules: 80C07B

Module

Opt.

Bandwidth

F1 F2 F3 F4 F5 F6 F7 F8 F9 F10

2.52.52.52.52.52.52.52.52.52.52.5

(GHz)
Wavelength

700-1650 700-1650 700-1650 700-1650 700-1650 700-1650 700-1650 700-1650 700-1650 700-1650 700-1650

Range (nm)
Fibre Input

(μm)
Mask Test

9or50or

62.5

9or50or

62.5

9or50or

62.5

9or50or

62.5

9or50or

62.5

–22 –22 –22 –22 –22 –22 –22 –22 –22 –22 –22
Sensitivity
(dBm)

Number of

11111111111

Channels
Rates Supported: ■=Filter, ♦=Optical Clock Recovery, ⊕=Electrical Clock Recovery

125 Mb/s*
155 Mb/s
622 Mb/s
1063 Mb/s
1250 Mb/s
2125 Mb/s
2488 Mb/s
2500 Mb/s

3

■■■■

■■■■

■ ■■■

■■■■

■ ■■■

■■■■

■■■■■■■■■■

■■■■■■■■■■

3.125 Gb/s

3.188 Gb/s

3.32 Gb/s

4.25 Gb/s

9.95 Gb/s

*3125 Mb/s is supported by selecting 155 Mb/s rate.

80C07B

9or50or

62.5

9or50or

62.5

9or50or

62.5

9or50or

62.5

9or50or

62.5

CR1

9or50or

62.5

♦
♦
♦
♦
♦
♦
♦
♦

6 www.tektronix.com

Optical Modules: 80C08C, 80C10B, 80C11, and 80C25GBE

Module

Opt. CR1 CR2 CR4 CRTP

Bandwidth

10 10 10 10 80 65 30 30 30 30 30 65

80C08C 80C10B*

5

(GHz)
Wavelength

Range

700-1650 700-1650 700-1650 700-1650 1290-1330

1520-1620

(nm)
Fibre

Input (μm)
Mask Test

9or50or

62.5

9or50or

62.5

9or50or

62.5

–16 –15 –15 –15

9or50or

62.5

9 9999999

–7
Sensitivity
(dBm)

Number

11111 1111111
of
Channels

Rates Supported: ■=Filter, ♦=Optical Clock Recovery, ⊕=Electrical Clock Recovery

9.95 Gb/s

10.31 Gb/s

10.52 Gb/s

10.66 Gb/s

10.71 Gb/s

11.1 Gb/s

11.3 Gb/s

■

■

■

■

■

■

■

25.78 Gb/s ♦*

27.74 Gb/s ♦*

39.81 Gb/s

41.25 Gb/s

43.02 Gb/s

tact Tektronix for details.

*4Con

5

*

Option CRTP reduces sensitivity by 0.6 dB (max) and increases noise by 15% (max).

6

Clock recovery with CR286A-HS (sold separately).

*

♦♦ ♦■♦♦♦♦
♦♦♦

♦♦

♦
♦
♦
♦

6

6

■

■

■

4

♦*

4

♦*

4

♦*

Digital Serial Analyzer Sampling Oscilloscope — DSA8200

80C11 80C25GBE

F1

1290-1330

1100-1650 1100-1650 1100-1650 1100-1650 1100-1650 1290-1330

1520-1620

–8 –9 –9 –9 –9 –9 –8

■

■

■

■

■

■

■■

■■

■

■

■

CR1 CR2 CR3 CR4 CRTP

1520-1620

♦
♦

♦♦

♦♦♦

♦
♦

6

♦*

6

♦*

4

♦*

4

♦*

4

♦*

www.tektronix.com 7

Data Sheet

Optical Modules: 80C12

Module

Opt.

Bandwidth

F1 F2 F3 F4 F5 F6

4.25 9 9 4.25 9 9 9 10

(GHz)
Wavelength

700-1650 700-1650 700-1650 700-1650 700-1650 700-1650 700-1650 700-1650

Range (nm)
Fibre Input

9 or 50 or 62.5 9 or 50 or 62.5 9 or 50 or 62.5 9 or 50 or 62.5 9 or 50 or 62.5 9 or 50 or 62.5 9 or 50 or 62.5 9 or 50 or 62.5
(μm)

Mask Test

–19 –19 –19 –19 –19 –19 –19 –14
Sensitivity
(dBm)

Number of

11111111

Channels
Rates Supported: ■=Filter, ♦=Optical Clock Recovery, ⊕=Electrical Clock Recovery

155 Mb/s
622 Mb/s
1063 Mb/s

■■

1250 Mb/s
2125 Mb/s

■■■■ ■

2488 Mb/s
2500 Mb/s

3.125 Gb/s

3.188 Gb/s

■■■■

■■■■

3.32 Gb/s

4.25 Gb/s

8.5 Gb/s*

9

■■ ■■

■■ ■■■■

9.95 Gb/s

10.31 Gb/s*

9

10.52 Gb/s

10.66 Gb/s

10.71 Gb/s

11. 1 Gb/s

11. 3 Gb/s

*7With 80A05 or 80A07.

8

With 80A05 Option 10G or 80A07.

*

9

*

Draft version of the 8.5GFC filter. T11 committee redefined this filter at the April 2008 meeting. New 8.5GFC filter, as definedbyT11committeeinApri
80C12 Option 10G modules only; and is identified as 10BASE-R.

80C12

FC 10G CR*

7

CR*

♦♦
♦♦
♦♦
♦♦
♦♦
♦♦
♦♦
♦♦
♦♦

■

♦♦
♦♦

80A07

■

■

■

■

■

■

■

l 2009, is identical to the 10BASE-R 10.313G filter and is available for

8

♦
♦
♦
♦
♦
♦
♦

8 www.tektronix.com

Digital Serial Analyzer Sampling Oscilloscope — DSA8200

DSA8200 Electrical Modules

TDR Modules: 80E10, 80E08, and 80E04

The 80E10, 80E08, and 80E04 are dual-channel Time Domain
Reflectometry (TDR) sampling modules, providing up to 12 ps incident and
15 ps reflected rise time. Each channel of these m odules is capable of
generating a fast impulse for use in TDR mode and the acquisition portion of
the sampling module monitors the incident step and any reflected energy.
The polarity of each channel’s step can be selected independently. This
allows for true-differential or common-mode TDR or S-parameters testing
of two coupled lines, in addition to the independent testing of isolated lines.
The independent step generation for each channel allows true-differential
measurements, which ensures measurement accuracy of nonlinear
differential devices.

80E10 and 80E08 fe ature a small form factor, fully integrated independent
2-meter remote sampler syst em, enabling the location of the sampler near
the DUT for th

TDR Module Summary

80E10 12 ps 15 ps

80E08 18 ps 20 ps

80E04 23 ps 28 ps

es shown are warranted unless printed in an italic typeface which represents a typical value.

*10Valu

11

*

Calculated from .35 bandwidth rise time product.

e best system fidelity. The modules characterize crosstalk by

Typical TDR Rise Time at Full BandwidthModule

Incident*

10

Reflected*

10

using TDR steps to drive one line (or line pair for differential crosstalk) while
monitoring a second line (or line pair) with the other channel (or another
module for diff

erential crosstalk). The "rise time filter" function on the
DSA8200 mainframe can be used with TDR or crosstalk measurements to
characterize expected system performance with slower edge speeds. An
optional 2-meter extender cable for the 80E04 is available, which enables
placement of the module near the DUT for the be st system fidelity.

All modules have independent incident step and receiver deskew to
remove the effect of fixtures and probes, enabling faster and easier
deskew. The 80E10 Sampling module provides an acquisition rise time
of 7 ps, with up

to 50 GHz user-selectable equivalent bandwidth (with
50 GHz, 40 GHz, and 30 GHz settings). 80E08 sampling bandwidth
is 30 GHz (user-selectable with 30 GHz and 20 GHz settings) and
80E04 sampling bandwidth is 20 GHz. The 20 GHz P8018 single-ended
and the 18 GHz P80318 differential variable pitch TDR handheld probes
provide excellent performance, ensuring e asy and accurate backplane and
package meas

urements.

Bandwidth

Performance*

50 GHz, 40 GHz,

and 30 GHz

(user selectable)

30 GHz, 20 GHz (user

selectable)

20 GHz

11

RMS N oise at

Bandwidth*

50 GHz: 600 μV
40 GHz: 370 μV
30 GHz: 300 μV

30 GHz: 300 μV
20 GHz: 280 μV

600 μV No, optional 80N01

Remote Sampler

11

Yes, fully integrated

Yes, fully integrated

– 2-meter extender

2-meter cable

2-meter cable

cable

www.tektronix.com 9