Tektronix DPOJET DATASHEET

Jitter and Eye-diagram Analysis Tools

DPOJET Data Sheet

DPOJET Essentials or Advanced

Period, Frequency, and Time Interval Error Analysis

Timing Parametrics such as Rise/Fall Times, Pulse Width, and Duty
Cycle

Many Graphical Tools such as Histogram s, Time Trends, and Spectrums

Programmable Software Clock Recovery including Software PLL*

User-selectable Golden PLL Support for Popular Sta ndards

Selectable H igh- and Low-limit Measurement Bounds Test

Comprehensive Statistics Logging, Reporting, and Remote Automation

Capture and Save Worst-case Signals for Detailed Analysis

TekWizard™ Interface for One-button and Guided Jitter Summaries

Applications

Features & Benefits

DPOJET Advanced

nd Timing Analysis for Clocks and Data Signals

Jitter a

Real-time Eye-diagram (RT-Eye™) Analysis*

able High- and Low-pass Measurement Filters

Select

Nine Plot Types to View and Analyze Jitter: Eye Diagram, CDF Bathtub,
Spectrum, Histogram, Trend, Data, Phase Noise, and Transfer Function

Accurate Jitter Decomposition and TJ(BER) Estimation*2with Selectable
Jitter Models Support P opular Standards; Fibre Channel or PCI Express
Delta-Delta (Dual Dirac) and Convolved Results

ss/Fail Limits and Mask Testing with Comprehensive Standards

Full Pa
Support Library; plus U ser Limit and Mask Files allows Support of
Custom Test Configurations and New or Deve loping Standards

1

Characterize Performance of High-spee d Serial and Parallel Bus
Designs

Characterize Clock and Data Jitter and Signal Integrity

Characterize PLL Dynamic Performance

Characterize Modulat ion of Spread Spectrum Clock Circuits

Characterize Jitter Generation, Transfer, and Tolerance

Perform PHY Testing of PCI Express, Serial ATA, SAS, Fibre Channel,
MIPI, DisplayPort, DDR, DDR2, DDR3, LPDDR, LPDDR2, USB 3.0, and
other Electrical and Optical Systems

*1Patented USPTO #6,836,738

2

*

Patented USPTO #6,832,172, #6,853,933, #7,254,168

3

Patented USPTO #6,812,688

*

3

Data Sheet

Real-time Jitter and Eye-diagram Analysis

DPOJET is the premiere eye-diagram, jitter, and timing analysis
package available for real-time oscilloscopes. Operating in the Tektronix
DPO/DSA70000B, MSO70000, and DP O7000 Series oscilloscopes,
DPOJET provides engineers the highest sensitivity and accuracy available
in real-time instruments. With comprehensive jitter and eye-diagram
analysis and decomposition algorithms DPOJET simplifies discovering
signal integrity concerns and jitter and their related sources in today’s
high-speed serial, digital, and communication system designs.

Analog and digital designers in the computer, semiconductor, and
communications industries are facing new challenges as processor clock
speeds race beyond 3 GHz and back-plane bus and serial link data ra tes
exceed 8 GT/s. These increasing speeds mean reduced circuit tolerance,
or margin, for jitter and related signal integrity problems. By using tools
that help you rapidly characterize and discover sources of jitter and signal
integrity concerns, you can bring new designs to market faster, with
more confidence that they operate reliably in today’s ultra high-speed
environment.

Partial List of Measurements

Measurement Description

Period/Frequency
Measurements

Time Measurements

Amplitude Measurements

Eye-diagram Measurements Eye Height, Eye Width, Width at BER, Mask Hits
Jitter Measurements

Clock Recovery Methods Constant Clock Mean, Constant Clock Median, PLL,

Plots

Limit and Mask Testing

Measurement Source CH1 - CH4, MATH1 - MATH4, REF1 - REF4
Data Logging

Report Generation Export HTML Formatted Reports with Summary,

DPOJET Jitter and Eye-diagram Analysis Tools extend the capability o f

nix real-time oscilloscopes, performing complex measurements and

Tekt r o
analysis of clock, serial, and parallel data signals captured in Single-shot
Acquisition mode or in Continuous-run Acquisition mode. Providing
jitter and timing measurements with pass/fail parameter testing, and eye

Frequency, P eriod, N-Period, Cycle-Cycle Period,
Positive Width, Negative Width, Positive Duty Cycle,
Negative Duty Cycle, Positive Cycle-Cycle Duty,
Negative Cycle-Cycle Duty

Rise Time, Fall Time, High Time, Low Time, Setup,
Hold, Skew

High, Low, High-Low, Common Mode, T/nT Ratio,
Differential Crossover

TIE,RJ,DJ,TJ(BER),PJ,DCD,DDJ,RJ(δ-δ),
DJ(δ-δ), Phase Noise

External, PLL External
Histogram, Time Trend, Data Trend, Spectrum,

Phase Noise, Transfer Curve, E ye Diagram with
Waveform Database, Eye-diagram Statistics (CDF
Bathtub)

Pass/Fail Measurement Test Limits, Load and Test
to Standard Masks

Measurements, Statistics, Worst-case Waveform,
and Snapshots

Statistics, Plots, and Pass/Fail

Figure1–S

pectrum, Eye Diagram, and BER curve of SATA-2 3.0 Gb/s MFTP.

diagrams with mask testing fo r today’s most common industry standards,
DPOJET is specifically designed to meet the advanced measurement needs
of today’s high-speed digital designers in the computer and communications
industries.

DPOJET provides the ability to make measurements of single-ended and
differential signals, measurements between two separate inputs, and
measurem

ents o n multiple input s simultaneously; with each input and each

measurement independently configurable for maximum flexibility.

DPOJET su

pports displaying measurement results and plots on the internal
display, on an external monitor, or both locations, thus making full use of
the oscilloscope dual display ports.

DPOJET analysis plots, like Spectrum and Trend, go beyond simple
measurements and results display. Trend analysis quickly shows engineers
how timing parameters change over time, like frequency drift, PLL startup
transients, or a circuit’s response to power supply changes. Spectrum
analysis quickly shows the precise frequency and amplitude of jitter and

ion sources for easy, rapid identification. Finding sources like

modulat
adjacent oscillators and clocks, power supply noise, or signal crosstalk is
no longer a tedious chore. Unique in the industry, DPOJET also provides
Phase Noise plots to sho w jitter in root/Hertz and Transfer Function plots
that allow direct comparison of jitter spectrums between two signals of
differing frequencies, providing the perfect tool for determining jitter in PLL

s like clock multipliers.

circuit

DPOJET provides complete jitter and eye-diagram analysis tools. With

e m easurement fl exibility, oscilloscope model support, limit testing,

premier
results logging and reporting, and integrated remote progra mmability,
DPOJET fully supports applications from device and system deb ug and
characterization to short-run functional test and p roduction.

2 www.tektronix.com