Tektronix DPOJET DATASHEET

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Jitter and Eye-diagram Analysis Tools
DPOJET Data Sheet
DPOJET Essentials or Advanced
Period, Frequency, and Time Interval Error Analysis
Timing Parametrics such as Rise/Fall Times, Pulse Width, and Duty Cycle
Many Graphical Tools such as Histogram s, Time Trends, and Spectrums
Programmable Software Clock Recovery including Software PLL*
User-selectable Golden PLL Support for Popular Sta ndards
Selectable H igh- and Low-limit Measurement Bounds Test
Comprehensive Statistics Logging, Reporting, and Remote Automation
Capture and Save Worst-case Signals for Detailed Analysis
TekWizard™ Interface for One-button and Guided Jitter Summaries
Applications
Features & Benets
DPOJET Advanced
nd Timing Analysis for Clocks and Data Signals
Jitter a
Real-time Eye-diagram (RT-Eye™) Analysis*
able High- and Low-pass Measurement Filters
Nine Plot Types to View and Analyze Jitter: Eye Diagram, CDF Bathtub, Spectrum, Histogram, Trend, Data, Phase Noise, and Transfer Function
Accurate Jitter Decomposition and TJ(BER) Estimation*2with Selectable Jitter Models Support P opular Standards; Fibre Channel or PCI Express Delta-Delta (Dual Dirac) and Convolved Results
ss/Fail Limits and Mask Testing with Comprehensive Standards
Full Pa Support Library; plus U ser Limit and Mask Files allows Support of Custom Test Congurations and New or Deve loping Standards
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Characterize Performance of High-spee d Serial and Parallel Bus Designs
Characterize Clock and Data Jitter and Signal Integrity
Characterize PLL Dynamic Performance
Characterize Modulat ion of Spread Spectrum Clock Circuits
Characterize Jitter Generation, Transfer, and Tolerance
Perform PHY Testing of PCI Express, Serial ATA, SAS, Fibre Channel, MIPI, DisplayPort, DDR, DDR2, DDR3, LPDDR, LPDDR2, USB 3.0, and other Electrical and Optical Systems
*1Patented USPTO #6,836,738
2
*
Patented USPTO #6,832,172, #6,853,933, #7,254,168
3
Patented USPTO #6,812,688
*
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Data Sheet
Real-time Jitter and Eye-diagram Analysis
DPOJET is the premiere eye-diagram, jitter, and timing analysis package available for real-time oscilloscopes. Operating in the Tektronix DPO/DSA70000B, MSO70000, and DP O7000 Series oscilloscopes, DPOJET provides engineers the highest sensitivity and accuracy available in real-time instruments. With comprehensive jitter and eye-diagram analysis and decomposition algorithms DPOJET simplies discovering signal integrity concerns and jitter and their related sources in today’s high-speed serial, digital, and communication system designs.
Analog and digital designers in the computer, semiconductor, and communications industries are facing new challenges as processor clock speeds race beyond 3 GHz and back-plane bus and serial link data ra tes exceed 8 GT/s. These increasing speeds mean reduced circuit tolerance, or margin, for jitter and related signal integrity problems. By using tools that help you rapidly characterize and discover sources of jitter and signal integrity concerns, you can bring new designs to market faster, with more condence that they operate reliably in today’s ultra high-speed environment.
Partial List of Measurements
Measurement Description
Period/Frequency Measurements
Time Measurements
Amplitude Measurements
Eye-diagram Measurements Eye Height, Eye Width, Width at BER, Mask Hits Jitter Measurements
Clock Recovery Methods Constant Clock Mean, Constant Clock Median, PLL,
Plots
Limit and Mask Testing
Measurement Source CH1 - CH4, MATH1 - MATH4, REF1 - REF4 Data Logging
Report Generation Export HTML Formatted Reports with Summary,
DPOJET Jitter and Eye-diagram Analysis Tools extend the capability o f
nix real-time oscilloscopes, performing complex measurements and
Tekt r o analysis of clock, serial, and parallel data signals captured in Single-shot Acquisition mode or in Continuous-run Acquisition mode. Providing jitter and timing measurements with pass/fail parameter testing, and eye
Frequency, P eriod, N-Period, Cycle-Cycle Period, Positive Width, Negative Width, Positive Duty Cycle, Negative Duty Cycle, Positive Cycle-Cycle Duty, Negative Cycle-Cycle Duty
Rise Time, Fall Time, High Time, Low Time, Setup, Hold, Skew
High, Low, High-Low, Common Mode, T/nT Ratio, Differential Crossover
TIE,RJ,DJ,TJ(BER),PJ,DCD,DDJ,RJ(δ-δ), DJ(δ-δ), Phase Noise
External, PLL External Histogram, Time Trend, Data Trend, Spectrum,
Phase Noise, Transfer Curve, E ye Diagram with Waveform Database, Eye-diagram Statistics (CDF Bathtub)
Pass/Fail Measurement Test Limits, Load and Test to Standard Masks
Measurements, Statistics, Worst-case Waveform, and Snapshots
Statistics, Plots, and Pass/Fail
Figure1–S
pectrum, Eye Diagram, and BER curve of SATA-2 3.0 Gb/s MFTP.
diagrams with mask testing fo r today’s most common industry standards, DPOJET is specically designed to meet the advanced measurement needs of today’s high-speed digital designers in the computer and communications industries.
DPOJET provides the ability to make measurements of single-ended and differential signals, measurements between two separate inputs, and measurem
ents o n multiple input s simultaneously; with each input and each
measurement independently congurable for maximum exibility.
DPOJET su
pports displaying measurement results and plots on the internal display, on an external monitor, or both locations, thus making full use of the oscilloscope dual display ports.
DPOJET analysis plots, like Spectrum and Trend, go beyond simple measurements and results display. Trend analysis quickly shows engineers how timing parameters change over time, like frequency drift, PLL startup transients, or a circuit’s response to power supply changes. Spectrum analysis quickly shows the precise frequency and amplitude of jitter and
ion sources for easy, rapid identication. Finding sources like
modulat adjacent oscillators and clocks, power supply noise, or signal crosstalk is no longer a tedious chore. Unique in the industry, DPOJET also provides Phase Noise plots to sho w jitter in root/Hertz and Transfer Function plots that allow direct comparison of jitter spectrums between two signals of differing frequencies, providing the perfect tool for determining jitter in PLL
s like clock multipliers.
circuit
DPOJET provides complete jitter and eye-diagram analysis tools. With
e m easurement exibility, oscilloscope model support, limit testing,
premier results logging and reporting, and integrated remote progra mmability, DPOJET fully supports applications from device and system deb ug and characterization to short-run functional test and p roduction.
2 www.tektronix.com
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Jitter and Eye-diagram Analysis Tools — DPOJET
Characteristics
Characteristic
Jitter Noise Floor Jitter Measurement
Accuracy
Description
0.4 ps
1.5 ps
(typical with DSA72004B)
RMS
(typical with DSA72004B)
RMS
Ordering Information
DPOJET Advanced
Option DPO/DSA70000B, MSO70000, or DPO7000 S eries
Opt. DJA Order preinstalled on a new oscilloscope
Order an upgrade for existing oscilloscope:
DPO7UP Opt. DJAM DPO7054, DPO7104, DPO7254, DPO7354 DPO7UP Opt. DJAH DPO70604B, DPO70804B DPO7UP Opt. DJAU DPO71254B, DPO71604B, DPO72004B DPO7UP Opt. DJUP DSA70000B Series DPO-UP Opt. DJAH MSO70000 Series, 4-8 GHz DPO-UP Opt. DJAU MSO70000 Series, >12 GHz DPOFL-DJA
DPOJET Essentials
Option DPO7000 Series
Opt. DJE Order preinstalled on a new oscilloscope
Order an upgrade for your existing oscilloscope:
DPO7UP DPOFL-
Opt. DJEM
DJEM
Floating License
4, DPO7104, DPO7254, DPO7354
DPO705 Floating License
Physical Characteristics
Software is supplied on int ernal hard disk and on compact disk media, or can be downloaded from www.tektronix.com. Software installs and operates with DPO/DSA70000B, MSO70000, and DPO7000 Series oscilloscopes. Online documentation and printable manual in PDF format are supplied with the product.
Recommended Accessories
Accessory Description
Opt. D-PHY Opt. DDRA Opt. PCE PCI Express®Measurements for DPOJET or RTE Opt. USB-TX* Opt. USB3*
4
TriMode™ Probe TriMode™ Probe Differential Signal
Acquisition System Arbitrary Waveform
Generator
*4Requires Opt. DJA and 8 GHz oscilloscope.
MIPI D-PHY Essentials DDR Memory Bus Analysis
4
TekExpress Automated USB 3.0 Solution USB 3.0 Tx Essentials P7520, 20.0 GHz Probe P7516, 16.0 GHz Probe P7313SMA
AWG7122B, 24 GS/s AWG
Product(s) are manufactured in ISO registered facilities.
t(s) complies with IEEE Standard 488.1-1987, RS-232-C, and with Tektronix
Produc Standard Codes and Formats.
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Data Sheet
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Updated 25 May 2010
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For Further Information. Tektronix maintains a comprehensive, constantly expanding collection of application notes, technical briefs and other resources to help engineers working on the cutting edge of technology. Please visit www.tektronix.com
t © Tektronix, Inc. All rights reserved. Tektronix products are covered by U.S. a nd foreign patents,
Copyrigh
d pending. Information in this publication supersedes that in all previously published material.
issued an
tion and price change privileges reserved. TEKTRONIX and TEK are registered trademarks of
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x, Inc. All other trade names referenced are the service marks, trademarks, or registered trademarks
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espective companies.
of their r
18 Jun 2010 61W-21170-4
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