Digital Phosphor Oscilloscopes
and Digital Serial Analyzers
DPO/DSA70000 Series
Unmatched Performance for Greater Insight Into
Your Design to Get Your Work Done Faster
The DPO70000 and the DSA70000 Series
are the new generation of real-time digital
phosphor oscilloscopes and are the
industry’s best solution to the challenging
signal integrity issues faced by designers
verifying, characterizing, debugging and
testing sophisticated electronic designs.
The specialized DSA70000 Series
provides a complete and dedicated
solution to address the challenges of
high-speed serial designs.
The family features exceptional performance
in signal acquisition and analysis,
operational simplicity and unmatched
debugging tools to accelerate your dayto-day
tasks. The largest screen in the
industry and the intuitive user interface
provide easy access to the maximum
amount of information.
Unmatched Acquisition
Performance
Signal Fidelity of Tektronix
Oscilloscopes Ensures Confidence
in Your Measurement Results
High bandwidth up to 20 GHz matched
across 2, 3 or 4 channels and enabled by
Tektronix proprietary DSP enhancement. The
user-selectable DSP filter on each channel
provides magnitude and phase correction
plus bandwidth extension to 20 GHz for more
accurate representation of extremely fast
signals. The DSP filter on each channel can
a
lso be switched off to take advantage of true
analog bandwidth for applications needing
the highest available raw data capture
Bandwidth Enhance to the probe tip, extended
to support bandwidth steps, gives you an oscilloscope with bandwidth adjustable to capture
transitions accurately without excess frequencies and noise
User-selectable bandwidth limiting choices.
Features & Benefits
On All Four Channels
Simultaneously
– 20, 16, 12.5, 8, 6 and 4 GHz
Bandwidth Models
– Up to 50 GS/s Real-time
Sample Rate
– Up to 200 Msamples Record
Length with MultiView Zoom
Feature for Quick Navigation
– Fastest Waveform Capture Rate
with >300,000 wfm/s Maximum
per Channel
Digital Serial Analyzer Models
with Dedicated Configuration for
High-speed Serial Design and
Compliance Testing
Enhanced Bandwidth to the
Probe Tip Extended to Support
Multiple Bandwidth Steps for
Advanced Signal Integrity
Pinpoint®Triggering with Over
1400 Combinations to Address
Virtually Any Triggering Situation
Unique Serial Pattern Triggering
Up to 3.125 Gb/s and 8b/10b
Standard Protocol Triggering for
Isolation of Pattern-dependent
E
ffects and NRZ Serial Test Pattern
Triggering up to 6.25 Gb/s
S
erial Data Analysis and Compliance
f
or PCI Express, Serial ATA, FB-DIMM,
SAS, Fibre Channel, IEEE 1394b,
R
apidIO, XAUI, HDMI, DVI, Ethernet,
USB 2.0
Most Popular Jitter and Timing
M
easurement and Analysis Package
12.1" Largest XGA Touch Screen
Display in the Industry
E
vent Search and Mark to Facilitate
the Comprehension of Event
Relationships
MyScope®Custom Windows and
Right Mouse Click Menus for
Exceptional Efficiency
OpenChoice®Software with
Microsoft Windows XP OS
Enables Built-in Networking
and Extended Analysis
™
Applications
Signal Integrity, Jitter and
Timing Analysis
Verification, Debug and Characterization of Sophisticated Designs
D
ebugging and Compliance Testing
o
f Serial Data Streams for Telecom
and Datacom Industry Standards
Investigation of Transient
Phenomena
Spectral Analysis
Digital Phosphor Oscilloscopes and Digital Serial Analyzers
DPO/DSA70000 Series
Zoom in on four areas of interest simultaneously to compare them.
H
ighest performance P7500 TriMode™probes.
High sample rate on all models, on all
channels, to capture more signal details
(transients, imperfections, fast edges)
– 50 GS/s on all four channels for the 12.5,
16 and 20 GHz models
– 25 GS/s on all four channels for the 4, 6
and 8 GHz models
Lowest jitter noise floor and vertical accuracy
for very accurate measurements
Longest acquisition of the industry to provide
more resolution and longer time sequence
– Standard 10 M samples per channel on the
DPO70000 Series and 20 M on the
DSA70000 Series
– Optional up to 100 M samples on all four
channels for the 4, 6 and 8 GHz models
– Optional up to 200 M samples on all four
channels for the 12.5, 16 and 20 GHz models
– Easily manage this deep record length,
provide detailed comparison and analysis
of multiple waveform segments with the
MultiView Zoom
scroll through deep records visually or
create a math expression to instantly
highlight differences
Highest performance probing solutions with
b
andwidth enhanced to the probe tip for differ-
ential
and single-ended voltage signals, because
accurate design verification depends on high
bandwidth access to critical signals and
high-fidelity signal capture
™
feature. Automatically
M
aximize the probability of capturing elusive
glitches and other infrequent events with
FastAcq acquisition mode.
Accelerate the Debug of
Complex Electrical Designs
FastAcq Acquisition Mode
Expedites Debugging by Clearly
Showing Imperfections
More than just color-grading, FastAcq’s
proprietary DPX
captures signals at more than 300,000
w
aveforms per second on all four channels
simultaneously, dramatically increasing
the probability of discovering infrequent
f
ault events. And with a simple turn of the
i
ntensity knob you can clearly “see a world
o
thers don’t see,” displaying the complete
picture of your circuit’s operation. Some
o
scilloscope vendors claim high waveform
c
apture rates for short bursts of time, but
o
nly Tektronix oscilloscopes, enabled by
DPX technology, can deliver these fast
waveform capture rates on a sustained
basis – saving minutes, hours or even
days by quickly revealing the nature of
faults so sophisticated trigger modes
can be applied to isolate them.
The Ability to Trigger an
Oscilloscope on Events of Interest
is Paramount in Complex Signal
Debug and Validation
Whether you’re trying to find a system
error or need to isolate a section of a
complex signal for further analysis,
Tektronix’ Pinpoint
t
he solution. The Pinpoint trigger system
u
ses Silicon Germanium (SiGe) technology
to provide very high trigger sensitivity
with very low trigger jitter and ability to
capture very narrow glitches. Pinpoint
®
acquisition technology
®
triggering provides
Isolate glitches down to 100 ps wide.
Isolate only the valid glitches.
triggering allows selection of virtually all
trigger types on both A and B trigger
events. Other trigger systems offer
multiple trigger types only on a single
event (A event), with delayed trigger (B
event) selection limited to edge type
t
riggering and often do not provide a way
to reset the trigger sequence if the B
event doesn’t occur. But Pinpoint trigg
ering provides the full suite of advanced
trigger types on both A and B triggers,
l
ogic qualification to control when to look
for these events and reset triggering to
begin the trigger sequence again after a
specified time, state or transition so that
e
ven events in the most complex signals
can be captured. Other oscilloscopes
t
ypically offer less than 20 trigger combina-
tions;
Pinpoint triggering offers over 1400
combinations, all at full performance.
With Enhanced Triggering, you can
choose to compensate for the difference
in time there is between the trigger path
and the display path and eliminate
virtually any trigger jitter at the trigger
point. In this mode, the trigger point can
be used as a measurement reference.
Oscilloscopes • www.tektronix.com/oscilloscopes
2
NRZ Pattern Lock Triggering of a 640-bit
long serial test pattern SATA 6Gb/s.
How does a 12.1" display compare to the
display size of other oscilloscopes?
Protocol and Serial Pattern Triggering
To debug serial architectures, use the
serial pattern triggering for NRZ serial
data stream with built-in clock recovery
and correlate events across physical and
link layer. This feature comes standard
on the DSA70000 series and is available
on DPO70000 models as Opt. PTH. The
instrument can recover the clock signal,
identify transitions and allow you to set
the desired encoded words for the serial
pattern trigger to capture. Opt. PTH
and the DSA70000 Series cover serial
standards up to 3.125 Gb/s.
Pattern Lock Triggering adds a new
dimension to NRZ serial pattern triggering
by enabling the oscilloscope to take
synchronized acquisitions of a long serial
test pattern with outstanding time base
accuracy. Pattern lock triggering can be
used to remove random jitter from long
serial data patterns. Effects of specific
bit transitions can be investigated and
averaging can be used with mask testing.
This feature supports up to 6.25 Gb/s
NRZ serial data stream and is standard
Digital Phosphor Oscilloscopes and Digital Serial Analyzers
Three modes of operation of the horizontal
time base.
on the DSA70000 instruments, or
included as part of Option PTH on the
DPO70000 models.
Large 12.1" XGA Display Screen
The DPO/DSA70000 Series have the
largest display in the industry with a 12.1"
XGA touch screen that gives up to 15
%
more waveform display than other
oscilloscopes of their classes.
Ten vertical divisions give you 25% more
vertical measurement resolution than
other oscilloscopes.
Unmatched Usability
T
he TekConnect™probe interface provides
versatility and ease of use enabled by
intelligent bi-directional oscilloscope-toprobe communication and maintain
signal fidelity.
The DPO/DSA70000 Series instruments
contain a comprehensive suite of features,
such as a touch screen, shallow menu
structures, intuitive graphical icons, knobper-channel vertical controls, support for
right mouse clicks, mouse wheel operation
and intuitive Export/Save/Recall menus.
Interoperability with Logic Analyzers
for Digital Design and Debug
Tektronix’ Integrated View (iView™) data
display enables digital designers to solve
signal integrity challenges and effectively
debug and verify their systems more
quickly and easily. This integration allows
designers to view time-correlated digital
and analog data in the same display
window, and isolate the analog characteristics of the digital signals that are
causing systems failures. No user calibra-
DPO/DSA70000 Series
tion
is required. And once set up, the
iView feature is completely automated.
Unmatched Versatility
Get the Most of Your Oscilloscope
by Fully Controlling its Waveform
Acquisition and Display Parameters
You have the choice of three horizontal
time base modes of operations. If you
are simply doing signal exploration and
want to interact with a lively signal, you
will use the Automatic or interactive
default mode that provides you with the
liveliest display update rate. If you want
a precise measurement and the highest
real-time sample rate that will give you
the most measurement accuracy, then
the Constant Sample Rate mode is for
you. It will maintain the highest sample
rate and provide the best real-time
resolution. The last mode is called the
Manual mode because it ensures direct
and independent control of the sample
rate and record length.
With the MyScope®Feature, Create
Your Own Control Windows with
Only the Controls, Features and
Capabilities that You Care About
Easily create your own personalized
“toolbox” of oscilloscope features in a
matter of minutes using a simple, visual,
drag-and-drop process. Once created,
these custom control windows are easily
accessed through a dedicated MyScope
button and menu selection on the oscilloscope button/menu bar, just like any
other control window. You can make an
unlimited number of custom control
windows, enabling each person who uses
the oscilloscope in a shared environment
to have their own unique control window.
MyScope control windows will benefit all
oscilloscope users, eliminating the rampup
time that many face when returning to
the lab after not using an oscilloscope for
a while, and enables the power user to
be far more efficient. Everything you need
is found in one control window rather than
having to constantly navigate through
menu after menu to repeat similar tasks.
Oscilloscopes • www.tektronix.com/oscilloscopes
3
Digital Phosphor Oscilloscopes and Digital Serial Analyzers
DPO/DSA70000 Series
Drag-and-drop menu items of interest to
create the MyScope
With OpenChoice®Software,
Customize Your Test and
Measurement System with
Familiar Analysis Tools
®
control window.
The analysis and networking features of
O
penChoice software add more flexibility
to Tektronix’ Windows XP oscilloscopes:
Using the fast embedded bus, waveform data can be moved directly from
acquisition to analysis applications on
the Windows desktop at much faster
speeds than conventional GPIB transfers.
Tektronix’ implementation of industry
standard protocols, such as TekVISA
™
interface and ActiveX controls, are
included for using and enhancing
Windows applications for data analysis
and documentation. IVI instrument
drivers are included to enable easy
communication with the oscilloscope
using GPIB, serial data and LAN
connections from programs running
on the instrument or an external PC.
Or, use the Software Developer’s Kit
(SDK) to help create custom software
to automate multi-step processes
in waveform collection and analysis
with Visual BASIC, C, C++, MATLAB,
LabVIEW, LabWindows/CVI and other
common Application Development
Environments (ADE). Integration of the
oscilloscope with external PCs and
non-Windows hosts is also supported.
In addition, the OpenChoice architecture provides a comprehensive software infrastructure for faster, more
versatile operations. Data transfer
programs, such as the Excel or Word
Capture data into Microsoft Excel using the
unique Excel toolbar, and create custom
reports using the Word toolbar.
toolbar are used to simplify analysis and
documentation on the Windows desktop
or on an external PC.
More Insight into Your Complex
Electrical Design for Characterization
Such as a simple math expression, waveform
test, event searching, event marking or
a custom application that you develop
yourself, the DPO/DSA70000 Series
offers the industry’s most comprehensive
set of analysis and compliance tools.
A Wide Range of Built-in Advanced
Waveform Analysis Tools
Waveform cursors make it easy to
measure trace-to-trace timing characteristics, while cursors that link between
YT and XY display modes make it easy
to investigate phase relationships and
Safe Operating Area violations. Select
from 53 automatic measurements using
a graphical palette that logically organizes
measurements into Amplitude, Time,
Combination, Histogram and Communications
into your measurement results with
statistical data such as mean, min, max
standard deviation and population.
Define and apply math expressions to
waveform data for on-screen results in
terms that you can use. Access common
waveform math functions with the touch
of a button. Or, for advanced applications,
create algebraic expressions consisting
of live waveforms, reference waveforms,
and Compliance Testing
mask testing, a pass/fail compliance
categories. Gather further insight
,
Basic spectral UI control window.
math functions, measurement values,
scalars and user-adjustable variables with
an easy-to-use calculator-style editor.
FFT – To analyze your signal in the spectral domain, use the basic spectral (provides
you with the best parameter), or use
advanced spectral with the manual time
base horizontal mode (to directly control
the frequency span, center frequency and
resolution bandwidth).
Filtering – Enhance your ability to isolate
or remove some important component of
your signal (noise or specific harmonics of
the signal) by creating your own filters or
using the filters provided as standard with
the instrument. These customizable FIR
filters can be used to implement today’s
preferred signal-filtering techniques, including
Decision Feedback Equalization (DFE) or to
minimize the effects of fixtures and cables
connected to the device under test.
A Breadth of Tools to Extend
Waveform Analysis Even Further
Jitter and Timing Measurement and
A
nalysis – Tight timing margins demand
stable, low jitter designs. This feature
extends the oscilloscope capability by
making jitter measurements over
contiguous clock cycles from every valid
pulse in a single-shot acquisition. Multiple
measurements and trend plots quickly
show system timing under variable
conditions. It also provides Rj/Dj on signals
without a repeating pattern and without
requiring the pattern length. You can get
insight into the signal and noise characteristics
like SSC modulation range and profile.
4
Oscilloscopes • www.tektronix.com/oscilloscopes
Digital Phosphor Oscilloscopes and Digital Serial Analyzers
DPO/DSA70000 Series
Jitter and Timing Measurement. Accelerating the research of specific events
in an acquired waveform.
This analysis tool is standard on the
DSA70000 Series and comes as Opt.
JA3 or Opt. JE3 on the DPO70000
Series. JE3 provides a subset of the
measurements.
Advanced Event Search and Mark
(Opt. ASM) – Event Search and Mark will
relieve the user from the tedious task of
examining data by highlighting important
events, skipping the unimportant ones,
Test eye diagram in equivalent time against
the standard mask.
and enhancing the comprehension of
event relationships. You can navigate
between the events of interest effortlessly
A basic event (edge-only) search and mark
is provided as a standard feature; and
support for more advanced event types
like transition, setup and hold or logic
pattern, is provided with the ASM option
on the DPO70000 Series, standard on
the DSA70000.
Waveform Limit Testing (Opt. LT) –
This feature
acquired wave
boundaries are
user to specify a
a reference waveform.
consists of comparing an
form
to boundaries. These
typically defined by the
tolerance band around
If any part of the
acquired waveform falls outside the
limit, the software
message and the location
returns a failure
of the failure
on the waveform.
Communications Mask Testing –
This feature provides a complete portfolio of masks for verifying compliance
to serial communications standards.
It supports 156 Standards Masks.
.
ITU-T (1.544 Mb/s to 155 Mb/s)
ANSI T1.102 (1.544 Mb/s to 155 Mb/s)
Ethernet IEEE 802.3, ANSI X3.263
(1.544 Mb/s to 3.125 Gb/s XAUI)
Sonet/SDH (51.84 Mb/s to 2.4883 Gb/s)
Fibre Channel (133 Mb/s to 4.25 Gb/s
InfiniBand (2.5 Gb/s)
USB (12 Mb/s to 480 Mb/s)
Serial ATA (1.5 Gb/s, 3 Gb/s)
Serial Attached SCSI (1.5 Gb/s, 3 Gb/s)
IEEE 1394b (491.5 Mb/s to 1.966 Gb/s)
Rapid I/O (1.25 Gb/s to 3.125 Gb/s)
OIF Standards (2.488 Gb/s to 3.11 Gb/s)
PCI Express (2.5 Gb/s)
Serial Data Compliance and Analysis –
Patented Real-time Eye (RT-Eye®clock
recovery and eye-rendering) provides highspeed serial data domain expertise to
enable analysis and compliance measurements for testing high-speed serial
*1
A
4.25 Gb/s mask supported using Glitch Trigger. It is standard
on the DSA70000 Series and optional as Opt. MTH on
DPO70404, DPO70604 and DPO70804.
RT-Eye®version 2.0 – PCI Express Rev1.1
Compliance test.
HDMI compliance testing.
standards like PCI Express, Serial ATA,
SAS, InfiniBand and FB-DIMM, as well
as Front Side Bus (FSB), XAUI, Fibre
Channel, IEEE 1394b and RapidIO. It
recovers the clock of the serial stream
to ≥10 Gb/s and generates very high
*1
)
precision eye diagrams with an accumulated waveform database. Serial data
compliance and analysis comes standard
on the DSA70000 Series and optional
on the DPO70404, DPO70604 and
DPO70804 as Opt. RTE. The compliance
modules for PCI Express, Serial ATA, SAS,
InfiniBand and FB-DIMM are options on
both DSA70000 Series and DPO70000
Series (Opt. PCE, SST, IBA or FBD).
Optional HDMI Compliance Testing
(Opt. HT3) –
Compliance testing: This
is your complete solution for HDMI
compliance testing, enabling unprecedented efficiency by offering a complete
solution of unmatched reliable automation
to support the widest range of tests in
the industry.
Oscilloscopes • www.tektronix.com/oscilloscopes
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