Instructions
DAS MTIF
For the 92A96 Acquisition Module
070-9798-00
There are no current European directives that
apply to this product. This product provides
cable and test lead connections to a test object of
electronic measuring and test equipment.
Warning
The servicing instructions are for use by
qualified personnel only. To avoid personal
injury, do not perform any servicing unless you
are qualified to do so. Refer to all safety
summaries prior to performing service.
Copyright © Tektronix, Inc. All rights reserved.
T ektronix products are covered by U.S. and foreign patents, issued and pending. Information in this publication supercedes
that in all previously published material. Specifications and price change privileges reserved.
Printed in the U.S.A.
T ektronix, Inc., P.O. Box 1000, Wilsonville, OR 97070–1000
TEKTRONIX and TEK are registered trademarks of T ektronix, Inc.
WARRANTY
T ektronix warrants that the products that it manufactures and sells will be free from defects in materials and
workmanship for a period of one (1) year from the date of shipment. If a product proves defective during this
warranty period, T ektronix, at its option, either will repair the defective product without charge for parts and labor,
or will provide a replacement in exchange for the defective product.
In order to obtain service under this warranty, Customer must notify Tektronix of the defect before the expiration
of the warranty period and make suitable arrangements for the performance of service. Customer shall be
responsible for packaging and shipping the defective product to the service center designated by T ektronix, with
shipping charges prepaid. Tektronix shall pay for the return of the product to Customer if the shipment is to a
location within the country in which the T ektronix service center is located. Customer shall be responsible for
paying all shipping charges, duties, taxes, and any other charges for products returned to any other locations.
This warranty shall not apply to any defect, failure or damage caused by improper use or improper or inadequate
maintenance and care. T ektronix shall not be obligated to furnish service under this warranty a) to repair damage
resulting from attempts by personnel other than T ektronix representatives to install, repair or service the product;
b) to repair damage resulting from improper use or connection to incompatible equipment; c) to repair any
damage or malfunction caused by the use of non-T ektronix supplies; or d) to service a product that has been
modified or integrated with other products when the effect of such modification or integration increases the time
or difficulty of servicing the product.
THIS WARRANTY IS GIVEN BY TEKTRONIX IN LIEU OF ANY OTHER WARRANTIES, EXPRESS
OR IMPLIED. TEKTRONIX AND ITS VENDORS DISCLAIM ANY IMPLIED WARRANTIES OF
MERCHANTABILITY OR FITNESS FOR A PARTICULAR PURPOSE. TEKTRONIX’
RESPONSIBILITY TO REPAIR OR REPLACE DEFECTIVE PRODUCTS IS THE SOLE AND
EXCLUSIVE REMEDY PROVIDED TO THE CUST OMER FOR BREACH OF THIS WARRANTY.
TEKTRONIX AND ITS VENDORS WILL NOT BE LIABLE FOR ANY INDIRECT , SPECIAL,
INCIDENTAL, OR CONSEQUENTIAL DAMAGES IRRESPECTIVE OF WHETHER TEKTRONIX OR
THE VENDOR HAS ADVANCE NOTICE OF THE POSSIBILITY OF SUCH DAMAGES.
Table of Contents
General Safety Summary iii. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Service Safety Summary v. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Preface vii. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Contacting Tektronix vii. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Operating Basics 1. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Product Description 1. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Connecting the DAS MTIF to the SUT 2. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Direct Connection 2. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Low-Profile Extender Connection 4. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Disconnecting the DAS MTIF Probe from the SUT 5. . . . . . . . . . . . . . . . . . . . . .
Designing an Interface Between a DAS MTIF and a SUT 6. . . . . . . . .
Mictor Connectors and Latch Housings 6. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Dimensions and Placement of Compatible Mictor Connectors 7. . . . . . . . . . . . . .
Direct Connection 7. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Low-Profile Extender Connection 7. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Mechanical Layout and Pinout of Compatible Mictor Connectors 8. . . . . . . . . . .
Pin 1 Indicator 10. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Loading and Equivalent Circuits 10. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
DAS MTIF Channel Assignments 12. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Service Information 15. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Maintenance 15. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Circuit Description 16. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Specifications 16. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Disassembling the DAS MTIF 18. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Probe Tip or Interface End 18. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Latch Release Grip 18. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
DAS MTIF Adapter 19. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Reassembling the DAS MTIF 19. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Probe Tip or Interface End 19. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Latch Release Grip 20. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
DAS MTIF Adapter 21. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Labels 22. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Functional Verification 23. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Replaceable Parts 25. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Parts Ordering Information 25. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Using the Replaceable Parts List 25. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
DAS MTIF Instructions
i
Table of Contents
List of Figures
Figure 1: DAS MTIF for the 92A96 Acquisition Module 1. . . . . . . . . .
Figure 2: Connecting to a surface-mounted or straddle-mounted
connector 3. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Figure 3: Connecting the Low-Profile Extender 4. . . . . . . . . . . . . . . . .
Figure 4: Releasing the probe tip from the latch housing 5. . . . . . . . . .
Figure 5: Dimensions and placement of a surface-mounted Mictor
connector with latch housing 7. . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Figure 6: Surface-mounted connector layout (component side) 8. . . . .
Figure 7: Straddle-mounted connector layout (component side) 9. . . .
Figure 8: Pin assignments for a Mictor connector (component
side) 9. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Figure 9: Equivalent circuit for the DAS MTIF 11. . . . . . . . . . . . . . . . . .
Figure 10: Equivalent circuit for the DAS MTIF with a Low-Profile
Extender 12. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Figure 11: Vertical dimension of the DAS MTIF probe 17. . . . . . . . . . . .
Figure 12: Disassembling the DAS MTIF probe 18. . . . . . . . . . . . . . . . .
Figure 13: Disassembling the latch release grip 19. . . . . . . . . . . . . . . . . .
Figure 14: Reattaching the latch releases and case halves 20. . . . . . . . .
Figure 15: Reattaching the latch release cords to the latch
releases 21. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Figure 16: Reattaching the latch release cords and reconnecting the
latch release grip 21. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Figure 17: Applying new labels 22. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Figure 18: Jumper and connector locations on the test fixture 23. . . . .
Figure 19: DAS MTIF probe exploded view 28. . . . . . . . . . . . . . . . . . . . .
Figure 20: DAS MTIF interface adapter exploded view 29. . . . . . . . . . .
List of Tables
ii
Table 1: Compatible Mictor connectors 6. . . . . . . . . . . . . . . . . . . . . . . .
Table 2: Lossy1 delay line values 10. . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Table 3: Lossy2 delay line values 10. . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Table 4: Pin 1 side DAS MTIF probe channel assignments 13. . . . . . . .
Table 5: Pin 38 side DAS MTIF probe channel assignments 14. . . . . . .
Table 6: Electrical specifications 16. . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Table 7: Environmental specifications 17. . . . . . . . . . . . . . . . . . . . . . . . . .
Table 8: Certifications and compliances 17. . . . . . . . . . . . . . . . . . . . . . . .
Table 9: Probe tip channel sections and label colors 22. . . . . . . . . . . . . .
DAS MTIF Instructions
General Safety Summary
Review the following safety precautions to avoid injury and prevent damage to
this product or any products connected to it. To avoid potential hazards, use this
product only as specified.
Only qualified personnel should perform service procedures.
While using this product, you may need to access other parts of the system. Read
the General Safety Summary in other system manuals for warnings and cautions
related to operating the system.
To Avoid Fire or
Personal Injury
Connect and Disconnect Properly . Do not connect or disconnect probes or test
leads while they are connected to a voltage source.
Observe All Terminal Ratings. To avoid fire or shock hazard, observe all ratings
and markings on the product. Consult the product manual for further ratings
information before making connections to the product.
Do not apply a potential to any terminal, including the common terminal, that
exceeds the maximum rating of that terminal.
Use Proper AC Adapter. Use only the AC adapter specified for this product.
Do Not Operate Without Covers. Do not operate this product with covers or panels
removed.
Use Proper Fuse. Use only the fuse type and rating specified for this product.
Avoid Exposed Circuitry. Do not touch exposed connections and components
when power is present.
Do Not Operate With Suspected Failures. If you suspect there is damage to this
product, have it inspected by qualified service personnel.
Do Not Operate in Wet/Damp Conditions.
Do Not Operate in an Explosive Atmosphere.
DAS MTIF Instructions
Keep Product Surfaces Clean and Dry .
Provide Proper Ventilation. Refer to the manual’s installation instructions for
details on installing the product so it has proper ventilation.
iii
General Safety Summary
Symbols and Terms
T erms in this Manual. These terms may appear in this manual:
WARNING. Warning statements identify conditions or practices that could result
in injury or loss of life.
CAUTION. Caution statements identify conditions or practices that could result in
damage to this product or other property.
T erms on the Product. These terms may appear on the product:
DANGER indicates an injury hazard immediately accessible as you read the
marking.
WARNING indicates an injury hazard not immediately accessible as you read the
marking.
CAUTION indicates a hazard to property including the product.
Symbols on the Product. The following symbols may appear on the product:
WARNING
High Voltage
Protective Ground
(Earth) T erminal
CAUTION
Refer to Manual
Double
Insulated
iv
DAS MTIF Instructions
Service Safety Summary
Only qualified personnel should perform service procedures. Read this Service
Safety Summary and the General Safety Summary before performing any service
procedures.
Do Not Service Alone. Do not perform internal service or adjustments of this
product unless another person capable of rendering first aid and resuscitation is
present.
Disconnect Power. To avoid electric shock, disconnect the mains power by means
of the power cord or, if provided, the power switch.
Use Care When Servicing With Power On. Dangerous voltages or currents may
exist in this product. Disconnect power, remove battery (if applicable), and
disconnect test leads before removing protective panels, soldering, or replacing
components.
To avoid electric shock, do not touch exposed connections.
DAS MTIF Instructions
v
Preface
These instructions cover the following topics:
H
Operating basics
H
Designing an interface between a DAS MTIF and a SUT
H
Service information
H
Replaceable parts list
Information in these instructions assumes that your system under test (SUT) is
based on a microprocessor. If your SUT is not based on a microprocessor, you
should substitute the type of device on which your system is based for the term
“microprocessor” throughout these instructions.
For information on how to connect a DAS MTIF for the 92A96 Acquisition
Module to a Tektronix microprocessor support (TMS) probe adapter, refer to the
instruction manual for the TMS product.
References to 92A96 include all variations of the 92A96 and 92C96 modules.
Contacting Tektronix
Product
Support
Service
Support
For other
information
To write us Tektronix, Inc.
For application-oriented questions about a Tektronix measurement product, call toll free in North America:
1-800-TEK-WIDE (1-800-835-9433 ext. 2400)
6:00 a.m. – 5:00 p.m. Pacific time
Or, contact us by e-mail:
tm_app_supp@tek.com
For product support outside of North America, contact your
local Tektronix distributor or sales office.
Contact your local Tektronix distributor or sales office. Or, visit
our web site for a listing of worldwide service locations.
http://www.tek.com
In North America:
1-800-TEK-WIDE (1-800-835-9433)
An operator will direct your call.
P.O. Box 1000
Wilsonville, OR 97070-1000
DAS MTIF Instructions
vii
Operating Basics
Product Description
The DAS Mass Termination Interface (MTIF) allows you to connect 100 logic
analyzer channels to a Tektronix Microprocessor Support (TMS) probe adapter or
directly to your system under test (SUT) in one fourth the physical area needed to
connect standard probes. The vertical clearance dimension is less than a half inch
when used with the Low-Profile Extender.
To connect directly to your SUT, you must include compatible Mictor connectors
in your circuit board design. To do this, be sure you understand the requirements
and conform to the guidelines in these instructions for designing an interface.
This section contains a product description and information on how to connect
the DAS MTIF to and disconnect it from a SUT.
The DAS MTIF has four parts: one DAS MTIF adapter and three DAS MTIF
probes. Connectors on one side of the adapter accommodate four 92AC96 cables.
The connectors on the other side of the adapter accommodate the probes.
One end of each probe is called the probe tip and connects to your SUT. The
other end is called the interface end. Figure 1 shows the DAS MTIF.
DAS MTIF adapter
92A96 cable connector
DAS MTIF probes (3)
Interface end
Probe tip
Figure 1: DAS MTIF for the 92A96 Acquisition Module
DAS MTIF Instructions
1
Operating Basics
Connecting the DAS MTIF to the SUT
Each DAS MTIF probe can connect to surface-mounted or straddle-mounted
Mictor connectors. You can use the Low-Profile Extender (available as an
optional accessory) to connect the probe to systems with as little as a half inch of
clearance between circuit boards. You can also install an optional latch housing
around the connector to provide positive retention of the probe.
In the following procedures, a surface-mounted Mictor connector is shown in the
figures. These procedures are the same for the straddle-mounted connector.
Direct Connection
To connect the DAS MTIF to a Mictor connector in your SUT (or on a TMS
probe adapter), follow these steps:
1. Line up the pin 1 indicator on the probe tip with pin 1 on the connector in
your SUT. The Mictor connector is keyed to prevent incorrect connections.
CAUTION. Incorrect handling of the probe while connecting it to the SUT can
result in damage to the DAS MTIF probe or to the mating connector in the SUT.
To avoid damaging the probe and SUT, always position the probe perpendicular
to the mating connector and gently connect the probe.
2. Position the probe tip perpendicular to the mating connector and gently
connect the probe as shown in Figure 2.
3. When connected, push down the latch releases on the probe to set the latch.
2
DAS MTIF Instructions
Push down to
latch after probe
is connected
Operating Basics
Push down to
latch after probe
is connected
Pin 1
Pin 1
Figure 2: Connecting to a surface-mounted or straddle-mounted connector
4. Line up the pin 1 indicator on the interface end with the pin 1 indicator on
the corresponding A, D or C probe connectors on the adapter.
5. Position the interface end perpendicular to the mating connector and gently
connect the end.
6. When connected, push down the latch releases on the probe to set the latch.
7. Connect the 92A96 cables. Match the label colors on the 92A96 cables to the
colors printed on the adapter. The cable connectors are keyed.
DAS MTIF Instructions
3
Operating Basics
Low-Profile Extender
Connection
You can use the Low-Profile Extender to connect the DAS MTIF to systems with
as little as a half inch of clearance between circuit boards. The extender connects
to Mictor connectors with or without a latch housing.
To connect the DAS MTIF probe using the extender, follow these steps:
1. Line up the pin 1 indicator on the low-profile end of the extender with pin 1
on the connector in your SUT. The Mictor connector is keyed to prevent
incorrect connections.
2. Position the low-profile end perpendicular to the connector and gently
connect the extender as shown in Figure 3.
3. To connect the DAS MTIF probe to the other end of the extender, follow
steps 1 through 3 in the Direct Connection procedure on page 2.
Pin 1
Pin 1
Figure 3: Connecting the Low-Profile Extender
4
DAS MTIF Instructions
Disconnecting the DAS MTIF Probe from the SUT
To disconnect the DAS MTIF probe, follow these steps:
1. Gently pull the latch release grip to release the probe tip from the latch
housing as shown in Figure 4.
Grasp sides
and gently pull
Operating Basics
Latch release grip
Figure 4: Releasing the probe tip from the latch housing
CAUTION. Do not tilt the probe in any direction when disconnecting it. Tilting the
probe can damage the probe and mating connector. To avoid damage to the
probe and mating connector, hold on to the latch release grip and gently pull the
probe straight out of the connector.
2. Continue to gently pull the probe tip straight out of the mating connector
using the latch release grip.
If you are using an extender, grip the corners of the circuit board end
attached to the SUT and gently pull it straight out of the connector.
DAS MTIF Instructions
5
Designing an Interface Between a DAS MTIF and a SUT
This section provides you with some guidelines for designing your own DAS
MTIF interface on the SUT. The guidelines contain information on the following
topics:
H
Mictor connectors and latch housings
H
Dimensions and placement of connectors
H
Mechanical layout and pinout of connectors
H
Loading and equivalent circuits
H
Probe channel assignments
Mictor Connectors and Latch Housings
The DAS MTIF probe contains a 38-pin Mictor connector. Table 1 lists Mictor
connectors you can purchase from AMP, Inc. that are compatible with the probe.
T able 1: Compatible Mictor connectors
AMP part
number
767054-1* Palladium-nickel plated, 0.054 inch long ground pins, surface mount connector
2-767004-2 30 microinches gold plating, 0.054 inch long ground pins, surface mount connector
767044-1* Palladium-nickel plated, straddle mount connector (0.062 inch circuit board
* Recommended
You can contact AMP for more detailed information on the Mictor connectors.
For the address, refer to the Replaceable Parts section.
You can purchase latch housing mechanisms to use with Mictor connectors. The
latch housing surrounds the Mictor connector in your SUT and provides positive
retention of the DAS MTIF probe.
NOTE. Refer to the Optional Accessories list in the Replaceable Parts section for
information on ordering surface-mounted or straddle-mounted latch housings.
Description
thickness)
6
DAS MTIF Instructions
Designing an Interface Between a DAS MTIF and a SUT
Dimensions and Placement of Compatible Mictor Connectors
You can use compatible surface-mounted or straddle-mounted Mictor connectors
in your circuit board design. The connectors should be placed as close as possible
to the device under test.
The placement of Mictor connectors depends on whether you plan to connect the
DAS MTIF directly to the SUT or use the Low-Profile Extender with the probe.
Direct Connection
Figure 5 shows the dimensions and minimum placement of surface-mounted
connectors on a SUT. The side-to-side dimension between connectors also
applies to the straddle-mounted connector.
6.35 mm
(.250 in)
9.90 mm
(.390 in)
10.80 mm
(.425 in)
31.50 mm
(1.240 in)
31.75 mm
(1.250 in)
Figure 5: Dimensions and placement of a surface-mounted Mictor connector with
latch housing
Low-Profile Extender
Connection
DAS MTIF Instructions
The vertical clearance dimension for the probe is 1.25 inches. Figure 11 shows
this dimension.
When placing Mictor connectors in your SUT for use with an extender, you need
to keep one inch of clear space on the pin 1 side from the center of the Mictor
connector in your SUT.
NOTE. Be sure to orient pin 1 on the Mictor connector in your SUT to direct the
extender off the board as shown in Figure 3.
7
Designing an Interface Between a DAS MTIF and a SUT
Mechanical Layout and Pinout of Compatible Mictor Connectors
Each compatible Mictor connector has 43 pins; pins 39 through 43 are grounded.
Pins 1, 2, 37, and 38 are open. Figure 6 shows the positions and spacing between
the pins, the keyhole, and the latch housing mounting holes of a surface-mounted
connector. Figure 8 shows the pin assignments.
19X 0.43 mm
(.017 in)
18X 0.64 mm
(.025 in)
.85 mm
(.0335 in)
2X 2.39 mm dia. (.094" .002)
Unplated through
2X 1.27 mm (.050 in)
Pin 1
5X0 .89 mm dia.
(.035" .003)
Plated through
2X 1.40 mm dia. (.055 in)
Pad both sides
7.62 mm
(.300 in)
10.16 mm
(.400 in)
19.18 mm
(.755 in)
28.20 mm
(1.110 in)
2.54 mm
(.100 in)
5.08 mm
(.200 in)
6.35 mm
(.250 in)
9.02 mm
(.355 in)
Figure 6: Surface-mounted connector layout (component side)
Figure 7 shows the positions and spacing between the pins and latch housing
mounting holes of a straddle-mounted connector.
2X 2.97 mm
(.117 in)
2X 1.35 mm dia. (.053" .003) Plated
through mounting holes for latch housing
2X 2.03 mm dia. (.080 in)
Pad both sides
NOTE. The straddle-mounted connector does not have a keyhole. Be sure to
position pin 1 correctly when building the SUT to maintain the correct mapping
of signals from your SUT to the logic analyzer probe sections and channels.
8
DAS MTIF Instructions
Designing an Interface Between a DAS MTIF and a SUT
2.80 mm
(.110 in)
1.40 mm
(.055 in)
19X Contact pads
both sides
2.28 mm
(.090 in)
1.78 mm (.070 in)
Board edge
.28 mm
(.011 in)
.56 mm
(.022 in)
5X .99 mm dia.
(.039" .003)
Plated through
2X 1.40 mm dia. (.055 in)
19.18 mm
(.755 in)
Pad both sides
7.62 mm
(.300 in)
10.16 mm
(.400 in)
28.20 mm
(1.110 in)
19X 0.43 mm
(.017 in)
18X 0.64 mm
(.025 in)
0.85 mm
(.0335 in)
Pin 1
2.54 mm
(.100 in)
5.08 mm
(.200 in)
9.02 mm
(.355 in)
2X 1.35 mm dia.
(.053" .003)
Plated through
1.35 mm
(.053 in)
2X Solder pads
both sides
2.92 mm
(.115 in)
3.73 mm
(.147 in)
.81 mm
(.032 in)
Figure 7: Straddle-mounted connector layout (component side)
Figure 8 shows the pin assignments for the surface-mounted connector. Pin
assignments are the same for the straddle-mounted connector.
Pin 1
Pin 19
Figure 8: Pin assignments for a Mictor connector (component side)
Pin 38
Pin 20
DAS MTIF Instructions
9
Designing an Interface Between a DAS MTIF and a SUT
Pin 1 Indicator
Be sure to place a pin 1 indicator on your circuit board during design. If you
include the latch housing in your design, it will obscure the pin 1 indicator on the
Mictor connector. Although the Mictor connector is keyed, you still need to
know the location of pin 1 when connecting the DAS MTIF probe.
Loading and Equivalent Circuits
The load presented to the SUT by the DAS MTIF is low. The load is equivalent
to a 10 pF capacitance with 100 kW resistance returned to a +3.1 V supply. The
following approximation of the probe loading is sufficient for most circuit
simulation calculations.
Figure 9 shows the equivalent circuit of the DAS MTIF. Tables 2 and 3 show the
values you can use to calculate characteristics of the Lossy1 and Lossy2 delay
lines shown in the next two figures.
T able 2: Lossy1 delay line values
Characteristic Value
C (capacitance) 1.58 pF per inch
L (inductance) 8.9 nH per inch
R (resistance)
Z0 (impedance)
.067 W per inch
75
W
T able 3: Lossy2 delay line values
Characteristic Value
C (capacitance) 0.73 pF per inch
L (inductance) 20.9 nH per inch
R (resistance)
Z0 (impedance)
3.25 W per inch
169
W
10
DAS MTIF Instructions
Designing an Interface Between a DAS MTIF and a SUT
1.6 nH
0.005
0.7 pF
W
1 pF
1.6 nH
0.005
W
250
0.7 pF
1.6 nH
0.005
W
10 pF
W
90 k
W
Length = 10 inches
Length = 60 inches
LOSSY1
LOSSY2
12.5 k
3.1V
W
1.6 nH
0.005
W
Figure 9: Equivalent circuit for the DAS MTIF
The Low-Profile Extender used with the DAS MTIF increases the load. The
additional load is equivalent to a 100 W resistor connected in series with
approximately three inches of 75 W coaxial cable to the probe tip.
Although the extender can increase the loading significantly, using the extender
might be necessary in situations where there is as little as half an inch of
clearance.
The extender is useful in a SUT where signal risetimes are greater than one or
two nanoseconds. Faster risetimes cause transmission line reflections on signals.
Figure 10 shows the equivalent circuit for the DAS MTIF with a Low-Profile
Extender.
DAS MTIF Instructions
11
Designing an Interface Between a DAS MTIF and a SUT
1.6 nH
0.005
0.7 pF
W
1.6 nH
0.005
250
10 pF
90 k
0.7pF
1.6 nH
0.005
0.005
W
0.7 pF
W
W
LOSSY1
100
W
Length = 3 inches
W
1 pF
W
Length = 10 inches
1.6 nH
LOSSY1
1.6 nH
0.005
W
1.6 nH
0.005
W
Length = 60 inches
LOSSY2
12.5 k
W
Figure 10: Equivalent circuit for the DAS MTIF with a Low-Profile Extender
DAS MTIF Channel Assignments
The 100 channels to which the 92A96 cables connect on the logic analyzer
cannot be changed. When mapping signals from your SUT to channels on the
logic analyzer, you must keep the probe section and clock channels together for
the A, C and D DAS MTIF probes.
Each probe tip connector has 43 pins; pins 39 through 43 are the five ground
pins. Pins 1, 2, 37 and 38 are unused and should be connected to ground.
Tables 4 and 5 show the probe sections and channels and the probe tip pins to
which they connect.
3.1V
12
DAS MTIF Instructions
Designing an Interface Between a DAS MTIF and a SUT
T able 4: Pin 1 side DAS MTIF probe channel assignments
Probe pin
number
3 CLK:0 CLK:3 Not connected
4 A3:7 C3:7 D3:7
5 A3:6 C3:6 D3:6
6 A3:5 C3:5 D3:5
7 A3:4 C3:4 D3:4
8 A3:3 C3:3 D3:3
9 A3:2 C3:2 D3:2
10 A3:1 C3:1 D3:1
11 A3:0 C3:0 D3:0
12 A2:7 C2:7 D2:7
13 A2:6 C2:6 D2:6
14 A2:5 C2:5 D2:5
15 A2:4 C2:4 D2:4
16 A2:3 C2:3 D2:3
17 A2:2 C2:2 D2:2
Section and channel
A probe
C probe D probe
18 A2:1 C2:1 D2:1
19 A2:0 C2:0 D2:0
DAS MTIF Instructions
13
Designing an Interface Between a DAS MTIF and a SUT
T able 5: Pin 38 side DAS MTIF probe channel assignments
Probe pin
number
36 CLK:1 Not connected CLK:2
35 A1:7 C1:7 D1:7
34 A1:6 C1:6 D1:6
33 A1:5 C1:5 D1:5
32 A1:4 C1:4 D1:4
31 A1:3 C1:3 D1:3
30 A1:2 C1:2 D1:2
29 A1:1 C1:1 D1:1
28 A1:0 C1:0 D1:0
27 A0:7 C0:7 D0:7
26 A0:6 C0:6 D0:6
25 A0:5 C0:5 D0:5
24 A0:4 C0:4 D0:4
23 A0:3 C0:3 D0:3
22 A0:2 C0:2 D0:2
Section and channel
A probe
C probe D probe
21 A0:1 C0:1 D0:1
20 A0:0 C0:0 D0:0
14
DAS MTIF Instructions
WARNING
The following servicing instructions are for use only by qualified personnel. To
avoid injury, do not perform any servicing other than that stated in the operating
instructions unless you are qualified to do so. Refer to all Safety Summaries before
performing any service.
Service Information
This section contains information on the following topics and tasks:
H
H
H
H
H
H
Maintenance
The DAS MTIF does not require scheduled or periodic maintenance. To maintain
good electrical contact, keep the product free of dirt, dust, and contaminants.
Also, ensure that any electrically conductive contaminants are removed.
Maintenance
Circuit description
Specifications
Disassembly and reassembly procedures
Applying labels
Functional verification procedure
Dirt and dust can usually be removed with a soft brush. For more extensive
cleaning, use only a damp cloth. Abrasive cleaners and organic solvents should
never be used.
CAUTION. The component devices contained on the DAS MTIF are susceptible to
static-discharge damage. To prevent damage, service the probe only in a
static-free environment.
If the probe is connected to the SUT, grasp the ground connector on the back of
the logic analyzer to discharge your stored static electricity. If the probe is not
connected, touch the antistatic bag to discharge stored static electricity from the
probe.
Always wear a grounding wrist strap, or similar device, while servicing the
instrument.
If you connect and disconnect the DAS MTIF probes frequently, you should
occasionally use a magnifying glass to examine the contact points on the probe
tip, the interface end and on the mating connectors. If contacts have been
dislocated from their proper position, you can use a pair of small tweezers (such
as a #3 to #5 ), to carefully move the contacts back into place.
DAS MTIF Instructions
15
Service Information
Circuit Description
Specifications
The DAS MTIF contains 100 signal connections (96 used as data channels and
four used as clock channels).The probe tip connection is a 38-pin Mictor
connector by AMP, Inc. Each signal line has an input resistance of 100 k
W
connected to approximately +3.1 V.
The DAS MTIF maps the 100 channels of the 92A96 acquisition module to the
three DAS MTIF probes. The A probe contains 32 channels for the A3, A2, A1
and A0 probe sections plus the CK:1 and CK:0 clock channels. The C probe
contains 32 channels for the C3, C2, C1 and C0 probe sections plus the CK:3
clock channel. The D probe contains 32 channels for the D3, D2, D1 and D0
probe sections plus the CK:2 clock channel.
These specifications are for a DAS MTIF connected between a compatible
Tektronix logic analyzer and a SUT. Table 6 shows the electrical requirements of
the DAS MTIF.
T able 6: Electrical specifications
Characteristics Requirements
Number of input channels with all probes 100 (96 data and 4 clock channels)
Input impedance
Threshold accuracy
Channel-to-channel skew < 150 ps
Max. operating signal swing 10 V peak-to-peak
Probe overdrive 600 mV peak-to-peak minimum ECL signal
Max. nondestructive input signal to probe
Max. sync clock rate 100 MHz in full speed mode (10 ns between
Min. sampling period 4 ns
Measured typical signal loading* AC load DC load
* The 100 kW resistor is returned to approximately +3.1 V .
100 KW ± 1% in parallel with 10 pF ± 1 pF
± 75 mV
input using coaxial probe cables (centered on
threshold)
1.2 V peak-to-peak minimum TTL signal input
using ribbon probe cables (centered on
threshold)
± 15 V
active clock edges)
[
10 pF
[
100 kW*
16
DAS MTIF Instructions
Table 7 shows the environmental specifications.
Service Information
T able 7: Environmental specifications
Characteristic Description
Temperature
Maximum operating +50° C (+122° F)
Minimum operating 0° C (+32° F)
Non-operating –55 ° C to +75° C (–67° F to +167° F)
Humidity 10 to 95% relative humidity
Altitude
Operating 4.5 km (15,000 ft) maximum
Non-operating 15 km (50,000 ft) maximum
Electrostatic immunity The probe is not static sensitive
1
Designed to meet Tektronix standard 062-2847-00 class 5.
2
Not to exceed SUT thermal considerations. Forced air cooling might be required
across the CPU.
1
2
Table 8 shows the certifications and compliances that apply to the DAS MTIF.
T able 8: Certifications and compliances
EC Compliance There are no current European Directives that apply to this product.
Figure 11 shows the vertical dimension of the DAS MTIF probe.
32 mm
(1.250 in)
Figure 11: Vertical dimension of the DAS MTIF probe
DAS MTIF Instructions
17
Service Information
Disassembling the DAS MTIF
To replace damaged mechanical parts, you will need to disassemble the DAS
MTIF probe or the DAS MTIF adapter. If the DAS MTIF probe cable has been
damaged or if there is an electrical fault, the cable must be replaced.
Probe Tip or Interface End
To disassemble the probe tip or interface end of the DAS MTIF probe, follow
these steps:
1. Remove the four screws from the outside of the probe case using a .050 inch
Hex screwdriver, and open the case halves.
Remove screws (4)
Circuit board
18
Latch Release Grip
Figure 12: Disassembling the DAS MTIF probe
2. Replace damaged parts and follow the procedure to reassemble the probe tip
and interface ends.
To disassemble the latch release grip on the probe tip, follow these steps:
1. Use two small flat-bladed screwdrivers in the slots opposite the tabs on each
side of the grip as shown in Figure 13.
DAS MTIF Instructions
Service Information
2. With thumbs placed lightly on the tabs to be released, pry the grip open by
carefully levering the screwdrivers down. Do not overstress the tabs beyond
deflection required to release the tabs.
When you open the latch release grip, the latch release cord comes out of the
grip, thereby detaching the grip from the latch release on the probe.
Latch release cords
Slots
Figure 13: Disassembling the latch release grip
DAS MTIF Adapter
You can only disassemble the insulator and plastic standoffs from the DAS MTIF
Adapter board.
You can replace a latch housing on the board by desoldering the damaged
housing and replacing it with a new housing.
Reassembling the DAS MTIF
After damaged parts are replaced, you will need to resassemble the DAS MTIF
probe or the DAS MTIF adapter.
Probe Tip or Interface End
To reassemble the probe tip or interface ends, follow these steps:
1. Position a latch release on each side of the case half. See Figure 14.
Latch release grip
DAS MTIF Instructions
19
Service Information
Case halves (2)
Latch releases (2)
Latch Release Grip
Figure 14: Reattaching the latch releases and case halves
2. Align the pin 1 case half with the pin 1 side of the connector, attach the case
halves and reconnect the screws. Figure 17 shows how to identify the pin 1
side of the connector.
To reassemble the latch release grip on the probe tip, follow these steps:
1. Place the latch release cords into the latch releases as shown in Figure 15.
2. Push the latch release downward to force the latch release cord to snap
through the slot and into the small hole.
20
DAS MTIF Instructions
Service Information
Latch release fits
between these flanges
Figure 15: Reattaching the latch release cords to the latch releases
3. Place the other end of the latch release cords into the latch release grip and
reconnect the latch release grip as shown in Figure 16.
DAS MTIF Adapter
DAS MTIF Instructions
Figure 16: Reattaching the latch release cords and reconnecting the latch
release grip
4. You might need to apply new labels. Refer to the description of Labels for
information on how to apply labels.
To reassemble the DAS MTIF adapter, follow these steps:
1. Insert the permanent lock end of the plastic standoffs into the adapter board.
2. Install the insulator onto the releasable end of the plastic standoffs.
Figure 20 shows the permanent lock and releaseable ends of the standoffs.
21
Service Information
Labels
You might need to apply new labels after repairing a DAS MTIF probe. Table 9
shows the channel combinations and label colors for the probe tips.
T able 9: Probe tip channel sections and label colors
Probe Pin 1 side Color Pin 38 side Color
A CK:0, A3:7-0, A2:7-0 Tan CK:1, A1:7-0, A0:7-0 Orange
D D3:7-0, D2:7-0 Blue CK:2, D1:7-0, D0:7-0 Y ellow
C CK:3, C3:7-0, C2:7-0 White C1:7-0, C0:7-0 Gray
To apply labels to the probe tip, follow these steps:
1. Locate the small pin 1 recess on the probe tip and apply the appropriate pin 1
label on that side. See Figure 17.
2. Apply the associated label to the other side as listed in Table 9.
3. Match the color of the interface end labels to the probe tip labels and apply.
Pin 1
label
Recess on
pin 1 side
Pin 1 side
End view
Pin 38 side
22
Pin 38 side
Figure 17: Applying new labels
DAS MTIF Instructions
Functional Verification
Service Information
This procedure checks the basic functionality of the DAS MTIF by verifying that
the DAS MTIF probes recognize signal activity at the probe tips. No calibration
is necessary.
Refer to the DAS and TLA 500 Series Performance Verification and Adjustment
Technical Reference Manual for calibration of the logic analyzer module used
with the DAS MTIF.
The functional verification procedure requires the following test equipment:
H
Adjustment and verification test fixture, part number 671-3599-00
H
Power supply for the test fixture (refer to the Optional Accessories list in the
Replaceable Parts section for part number information)
H
DAS or TLA 500 Series mainframe
H
92A96 module
Refer to the user manual for the module for installation information.
To perform the functional verification procedure, follow these steps:
1. Connect the 92A96 cables to the logic analyzer and to the DAS MTIF.
2. Connect the interface ends of the DAS MTIF probes to the DAS MTIF
adapter.
3. Place J15 in the INT position to select the internal 50 MHz clock. Figure 18
shows the location of the jumper.
J15
J5
DAS MTIF Instructions
Figure 18: Jumper and connector locations on the test fixture
23
Service Information
4. Connect the power adapter to the test fixture and power on the test fixture.
5. Power on the logic analyzer and wait for the DAS or TLA 500 to start.
6. Verify that the logic analyzer passes the power-on diagnostics.
7. From the Main menu, select to the Channel menu for the 92A96 module to
which the probes are connected.
8. Click F5: Define Threshold to display the threshold settings, set the threshold
for all channels to be 0.7 volts and click F8: Exit and Save.
9. From the Main menu, select the State display.
10. Align pin 1 and connect the probe tip for the A probe to J5 on the test fixture.
Figure 18 shows the location of the connector.
11. Start acquiring data. The Address group will repeatedly display two lines of
all 0s then two lines of all Fs to show activity on the channels such as
follows:
00000000
00000000
FFFFFFFF
FFFFFFFF
00000000
00000000
FFFFFFFF
FFFFFFFF
Verify that none of the connected channels are stuck high or stuck low.
Other channels without probes connected should display all Fs.
12. Align pin 1 and connect the probe tip for the D probe to J5 on the test fixture.
13. Start acquiring data. The Data group will repeatedly display two lines of all
0s and two lines of all Fs to show activity on all the channels.
14. Align pin 1 and connect the probe tip for the C probe to J5 on the test fixture.
15. Start acquiring data. The Control group will repeatedly display two lines of
all 0s and two lines of all Fs to show activity on all the channels.
16. Repeat this procedure for additional DAS MTIFs if needed.
24
This completes the functional verification.
DAS MTIF Instructions
Replaceable Parts
This chapter contains a list of the replaceable components for the DAS MTIF.
Use this list to identify and order replacement parts.
Parts Ordering Information
Replacement parts are available through your local Tektronix field office or
representative.
Changes to Tektronix products are sometimes made to accommodate improved
components as they become available and to give you the benefit of the latest
improvements. Therefore, when ordering parts, it is important to include the
following information in your order:
H
H
H
H
Part number
Instrument type or model number
Instrument serial number
Instrument modification number, if applicable
If you order a part that has been replaced with a different or improved part, your
local Tektronix field office or representative will contact you concerning any
change in part number.
Change information, if any, is located at the rear of this manual.
Using the Replaceable Parts List
The tabular information in the Replaceable Parts List is arranged for quick
retrieval. Understanding the structure and features of the list will help you find
all of the information you need for ordering replacement parts. The following
table describes the content of each column in the parts list.
DAS MTIF Instructions
25
Replaceable Parts
Parts list column descriptions
Column Column name Description
1 Figure & index number Items in this section are referenced by figure and index numbers to the exploded view illustrations
that follow.
2 Tektronix part number Use this part number when ordering replacement parts from Tektronix.
3 and 4 Serial number Column three indicates the serial number at which the part was first effective. Column four
indicates the serial number at which the part was discontinued. No entries indicates the part is
good for all serial numbers.
5 Qty This indicates the quantity of parts used.
6 Name & description An item name is separated from the description by a colon (:). Because of space limitations, an
item name may sometimes appear as incomplete. Use the U.S. Federal Catalog handbook H6-1
for further item name identification.
7 Mfr. code This indicates the code of the actual manufacturer of the part.
8 Mfr. part number This indicates the actual manufacturer’s or vendor’s part number.
Abbreviations
Chassis Parts
Mfr. Code to Manufacturer
Cross Index
Abbreviations conform to American National Standard ANSI Y1.1–1972.
Chassis-mounted parts and cable assemblies are located at the end of the
Replaceable Electrical Parts List.
The table titled Manufacturers Cross Index shows codes, names, and addresses of
manufacturers or vendors of components listed in the parts list.
26
DAS MTIF Instructions
Replaceable Parts
Manufacturers cross index
Mfr.
code
80009 TEKTRONIX INC 14150 SW KARL BRAUN DR
00779 AMP INC. CUSTOMER SERVICE DEPT
0GV90 GLOBTEK INC 186 VETERANS DRIVE NORTHVALE, NJ 07647–2303
60381 PRECISION INTERCONNECT CORP. 16640 SW 72ND AVE PORTLAND, OR 97224
Manufacturer Address City, state, zip code
PO BOX 500
PO BOX 3608
BEAVERT ON, OR 97077–0001
HARRISBURG, PA 17105–3608
Replaceable parts list
Fig. &
index
number
Tektronix part
number
010–0601–00 1 DAS MTIF; 100 CHANNEL (DAS MTIF PROBES,3, & DAS MTIF
Serial no.
effective
Serial no.
discont’d
Qty Name & description
ADAPTER; SEE FIGURES 19 & 20)
Mfr.
code
80009 010–0601–00
Mfr. part number
19–0 118–9488–00 1 DAS MTIF PROBE; 34 CHANNEL; CABLE REPLACEMENT KIT
INCLUDES:
–1 1 LABEL SHEET ; DAS MTIF PROBE, PROBE TIP & INTERFACE
ENDS
118–9479–00 1 SERVICE KIT ; MECHANICAL PARTS INCLUDES: 80009 118–9479–00
–1 1 LABEL SHEET ; DAS MTIF PROBE, PROBE TIP & INTERFACE
ENDS
–2 2 PROBE TIP CASE HALVES
–3 2 LATCH RELEASES
–4 4 SCREWS, #1–72 x 0.375 BUTTON HEAD
–5 4 NUTS, #1–72 HEX
–6 2 PULL GRIP HALVES
–7 2 PULL CORDS
STANDARD ACCESSORIES
070–9798–00 1 MANUAL,TECH:INSTRUCTIONS, DAS MTIF 80009 070–9798–00
OPTIONAL ACCESSORIES
–8 010–0612–00 1 LOW–PROFILE EXTENDER, 4.25 INCH OVERALL 80009 010–0612–00
105–1088–00* 1 LATCH HOUSING; STRADDLE MOUNT (NOT SHOWN) 80009 105–1088–00
105–1089–00* 1 LATCH HOUSING; SURF ACE MOUNT (NOT SHOWN) 80009 105–1089–00
671–3599–00 1 TEST FIXTURE (NOT SHOWN) 80009 671–3599–00
119–4855–00 1 POWER SUPPLY (US):18W ,W ALL MOUNT,120VAC 60HZ
INPUT,12VDC 1.5A OUTPUT ,UNREGULATED,183CM
CABLE,STR C (NOT SHOWN)
80009 118–9488–00
0GV90 WD1E1500C12CP
DAS MTIF Instructions
27
Replaceable Parts
Replaceable parts list (cont.)
Fig. &
index
number
*Contact your Tektronix representative for pricing of larger quantities of latch housings or Precision Interconnect as listed in the manufacturers cross index.
Tektronix part
number
119–4856–00 1 POWER SUPPLY (EC):18W,WALL MOUNT,220VAC 50HZ
119–4859–00 1 POWER SUPPLY (JP):18W ,W ALL MOUNT,100VAC 60HZ
Serial no.
effective
Serial no.
discont’d
Name & descriptionQty
INPUT,12VDC 1.5A OUTPUT ,UNREGULATED,183CM
CABLE,STR C (NOT SHOWN)
INPUT ,12VDC 1.5A INPUT,UNREGULATED,183CM
CABLE,STR CO (NOT SHOWN)
Mfr.
code
Mfr. part number
0GV90 WD13E1500C12CP
0GV90 WD49E1500C12CP
3
2
1
8
4
5
6
7
28
Figure 19: DAS MTIF probe exploded view
DAS MTIF Instructions
Replaceable Parts
Replaceable parts list
Fig. &
index
number
20–0 118–9490–00 1 SERVICE KIT; ADAPTER PARTS INCLUDES: 80009 118–9490–00
–1 1 INTERFACE ADAPTER BOARD
–2 5 PLASTIC STANDOFFS
–3 1 LEXAN INSULATOR P ANEL
–2 5 PLASTIC STANDOFFS
–3 1 LEXAN INSULATOR P ANEL
Tektronix part
number
010–0601–00 1 DAS MTIF; 100 CHANNEL (DAS MTIF PROBES,3, & DAS MTIF
118–9489–00 1 SERVICE KIT; INSULATOR PARTS INCLUDES: 80009 118–9489–00
Serial no.
effective
Serial no.
discont’d
Qty Name & description
ADAPTER; SEE FIGURES 19 & 20)
Mfr.
code
80009 010–0601–00
Mfr. part number
1
2
Permanent lock end
3
Releaseable end
The surface-mounted latch housing can be
replaced; see the Optional Accessories list
DAS MTIF Instructions
Figure 20: DAS MTIF interface adapter exploded view
29
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