Tektronix CSA7000B, TDS7000B,TDS6000B Series User Manual

User Manual
CSA7000B Series Serial Mask Testing & Serial Pattern Trigger
TDS7000B & TDS6000B Series Option SM Serial Mask Testing Option ST Serial Pattern Trigger
071-1228-01
www.tektronix.com
Copyright © Tektronix, Inc. All rights reserved.
Tektronix products are covered by U.S. and foreign patents, issued and pending. Information in this publication supercedes that in all previously published material. Specifications and price change privileges reserved.
Tektronix, Inc., P.O. Box 500, Beaverton, OR 97077-0001
TEKTRONIX and TEK are registered trademarks of Tektronix, Inc.
MultiView Zoom is a trademark of Tektronix, Inc.

Table of Contents

Preface iii...................................................
Manual Structure iii................................................
Related Manuals iii.................................................
Contacting Tektronix v.............................................
Getting Started 1............................................
Product Description 1..............................................
Installing Optional Serial Mask Testing and Serial Pattern Trigger Functions
on TDS6000B and TDS7000B Series Instruments 3...................
Operating Basics 5..........................................
Serial Mask Testing Functions 5......................................
Accessing Serial Pattern Trigger Functions 8............................
Reference 9.................................................
Mask Testing 9....................................................
Communication (Comm) Triggering 30.................................
Serial Pattern Trigger 34.............................................
Appendix A: Supported Mask Types and Standards 37............
Appendix B: Supported Communication Trigger
Codes and Standards 41...................................
Appendix C: Automatic Communication Signal Measurements 43...
Levels Used in Taking Eye Measurements 44............................
Index 47....................................................

List of Figures

Figure 1: Masks control window 5.............................
Figure 2: Communication signal trigger functions 6..............
Figure 3: Communication measurement functions 7..............
Figure 4: Serial pattern trigger control window 8.................
Figure 5: Eye-diagram and optical values 44......................
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Table of Contents

List of Tables

Table 1: Masks control window functions 5.....................
Table 2: Communication trigger functions 6....................
Table 3: Serial trigger functions 8.............................
T able 4: ITU-T masks 37......................................
Table 5: ANSI T1.102 masks 37................................
T able 6: Ethernet masks 37....................................
Table 7: SONET/SDH masks 38................................
Table 8: Fibre Channel masks 38...............................
T able 9: Fibre Channel Electrical masks 38......................
Table 10: InfiniBand masks 39.................................
Table 11: Serial ATA masks 39.................................
Table 12: USB 1.1/2.0 masks 39................................
Table 13: 1394b masks 39.....................................
Table 14: Rapid IO LP-LVDS masks 39.........................
Table 15: Rapid IO Serial masks 39............................
Table 16: IOF masks 40.......................................
Table 17: PCI-Express masks 40...............................
Table 18: SAS masks 40......................................
Table 19: AMI trigger standards 41.............................
Table 20: B3ZS trigger standards 41............................
Table 21: B6ZS trigger standards 41............................
Table 22: B8ZS trigger standards 41............................
Table 23: CMI trigger standards 42.............................
Table 24: HDB3 trigger standards 42...........................
Table 25: MLT3 trigger standards 42...........................
Table 26: NRZ trigger standards 42............................
Table 27: Supported communications measurements
and their definition 43.......................................
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Serial Mask Testing & Serial Pattern Trigger User Manual

Preface

Manual Structure

This is the user manual for Serial Mask Testing and Serial Pattern Trigger functions. These functions are standard on the CSA7000B Series instruments. Some of these functions are standard and others are available as options for the TDS6000B and TDS7000B Series instruments.
This manual:
H Describes the capabilities of the Serial Mask Testing and Serial Pattern
Trigger functions, and how to install the optional functions on the instru­ments
H Explains how to access and operate the features
This manual is organized into the following chapters:
H Getting Started provides an overview of the Serial Mask Testing and Serial
Pattern Trigger functions and shows you how to install the optional functions on TDS6000B and TDS7000B instruments.

Related Manuals

H Operating Basics describes how to access the functions using the front panel
and the instrument graphical user interface.
H Reference provides detailed steps for doing the most common Serial Mask
Testing and Serial Pattern Trigger tasks.
The following table lists other documents that support the operation and service of the CSA7000B, TDS6000B, and TDS7000B Series instruments. The part numbers of these documents are listed in the Accessories section of your instrument user manual.
Serial Mask Testing & Serial Pattern Trigger User Manual
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Preface
Manual name Description
Online Help An online help system that is integrated with the User Interface application that ships
with the CSA7000B, TDS6000B, and TDS7000B instruments
References A quick reference to the major features of the instrument and how they operate
User Manual
Programmer Online Guide An alphabetical listing of the programming commands and other information related to
Service Manual A description of how to service the instrument to the module level. This optional
1
You can insert this user manual behind the Appendices section of your instrument user manual.
1
The user manual for the CSA7000B, TDS6000B, and TDS7000B instruments
controlling the instrument over the GPIB and TekVISA interfaces
manual must be ordered separately
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Serial Mask Testing & Serial Pattern Trigger User Manual

Contacting Tektronix

Preface
Phone 1-800-833-9200*
Address Tektronix, Inc.
Department or name (if known) 14200 SW Karl Braun Drive P.O. Box 500 Beaverton, OR 97077 USA
Web site www.tektronix.com
Sales support 1-800-833-9200, select option 1*
Service support 1-800-833-9200, select option 2*
Technical support Email: techsupport@tektronix.com
1-800-833-9200, select option 3*
6:00 a.m. -- 5:00 p.m. Pacific time
* This phone number is toll free in North America. After office hours, please leave a
voice mail message. Outside North America, contact a Tektronix sales office or distributor; see the Tektronix web site for a list of offices.
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Preface
vi
Serial Mask Testing & Serial Pattern Trigger User Manual

Getting Started

Product Description

This section of the user manual provides a high-level description of the Serial Mask Testing and Serial Triggering functions. These functions are standard with CSA7000B Series instruments. Some of these functions are standard and some of the functions are options for the TDS6000B Digital Storage Oscilloscope and TDS7000B Series Digital Phosphor Oscilloscopes.
This section also describes how to install the optional Serial Mask Testing and Serial Triggering functions on TDS6000B and TDS7000B Series instruments.
The following text is an overview of the Serial Mask Testing and Serial Triggering features.
Serial Mask Testing
The Serial Mask Testing feature provides optical and electrical mask testing, communication triggering, and automatic communication signal measurements.
Mask testing consists of two tasks: signal violation detection and pass/fail testing. Signal violation detection lets you test communications signals for time or amplitude violations against a predefined mask. Each mask consists of one or more polygonal regions called segments. The signal waveform data should stay outside of the segments defined by the mask. Any signal data that occurs inside a mask segment is called a mask segment violation or “hit.”
You can select from any of the included standard telecommunications masks (optional on TDS6000B and TDS7000B Series instruments) or you can define your own custom masks. Selecting a mask automatically sets the instrument communications triggers to properly display most communication signals in the mask.
Pass/Fail testing defines the mask testing parameters, including the number of waveforms to test, how many mask hits are allowed before failing a test, setting a mask margin tolerance value, and what action to perform at the completion of a test.
Communication triggering enables you to trigger on and display waveforms for industry-standard communications signals. Appendix B lists the supported standards on which you can trigger.
Automatic communication signal measurements enable you to make automatic measurements on communications signals. Appendix C lists the available measurements.
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Getting Started
The Serial Mask Testing key features are:
H Predefined masks for testing or triggering on industry-standard signals, such
as ITU--T G.703, ANSI T1.102, Fibre Channel, Ethernet, InfiniBand, SONET, Serial ATA, USB, IEEE 1394b, RapidIO, OIF, PCI--Express, and their subsets
H On CSA7000B instruments, optical mask standards have calibrated digital
filters, enabling operation as an optical reference receiver
H Autoset, which quickly adjusts the instrument vertical and horizontal
parameters to display a waveform in a mask
H Autofit, which positions the signal on each acquisition to minimize mask
segment hits
H Mask margins, which allow you to adjust the default mask margin tolerances
H Pass/Fail testing to continuously test a specified number of waveforms
against a mask
H A mask editor for creating, saving, and recalling user-defined masks
H Waveform database technology to do mask testing based on waveforms
accumulated in a database, rather than a single waveform stored in acquisi­tion memory
H Communications triggers to trigger the instrument on industry-standard
communications signals
H Automatic measurements on communications signals
H Clock recovery from the serial data stream
NOTE. If a standard or function listed in this manual is not available on your instrument, it is because it is optional or the configuration or bandwidth of your instrument cannot test that standard.
The CSA7000B Series instruments, when used with the O/E Electrical Out-to­CH1 Input Adapter (013-0327-xx), are calibrated optical reference receivers with digital filtering, enabling you to do mask standard compliance testing.
Although the TDS6000B and TDS7000B Series instruments are not calibrated optical reference receivers, you can use them with mask testing to evaluate general optical signal characteristics and waveshape, using an external O/E converter.
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Serial Mask Testing & Serial Pattern Trigger User Manual
Getting Started
Serial Pattern Trigger
Serial Pattern Trigger lets you define a serial data pattern on which to trigger the instrument.
The Serial Pattern Trigger key features are:
H User-defined serial data pattern of up to 64 bits on NRZ data streams up to
1.25 GBaud
H Clock recovery from the serial data stream

Installing Optional Serial Mask Testing and Serial Pattern Trigger Functions on TDS6000B and TDS7000B Series Instruments

To enable the optional Serial Mask Testing and/or Serial Triggering functions on TDS6000B and TDS7000B instruments, you must have a valid Option Installa­tion Key. Do the following steps:
1. From the oscilloscope menu bar, touch the Utilities menu, select Option Installation, and then touch Continue.
2. Enter the authorization key using the instrument keyboard.
3. Touch Continue.
4. Reboot your instrument to enable the new option(s).
5. Attach the option configuration label(s) on the rear panel of the instrument to
indicate that the option(s) is installed on this instrument.
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Getting Started
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Serial Mask Testing & Serial Pattern Trigger User Manual

Operating Basics

This chapter describes how to access the Serial Mask Testing and Serial Pattern Triggering features, and provides a brief description of each function’s settings. See the Reference section in this manual for detailed instructions on using the Serial Mask Testing and Serial Pattern Triggering functions.

Serial Mask Testing Functions

Serial Mask Testing provides three sets of functions: optical and electrical serial mask testing, communications triggering, and automatic communication signal measurements. This section describes how to access these functions.
Accessing Serial Mask
Testing Functions
Table 1: Masks control window functions
To access the Serial Mask Test functions, touch the Masks tool bar button. The instrument displays the Masks control window, as shown in Figure 1.
Figure 1: Masks control window
Table 1 describes the Masks control window tab functions. Refer to the Reference chapter beginning on page 9 of this manual, as well as the online help, for more information about these functions.
Tab Function
Mask Set the mask type, communications standard, polarity, mask on/off, and autofit/autoset alignment
parameters
Source Set the input waveform source
Tolerance Set the mask margin tolerance values
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Operating Basics
Table 1: Masks control window functions (cont.)
Tab Function
Pass/Fail Setup Set the mask test pass/fail parameters
Pass/Fail Results Display the pass/fail test results
Accessing Serial Mask
Testing Communications
Trigger Functions
To access the Serial Mask Testing communication trigger functions, do the following steps:
1. Touch the Trig tool bar button. The instrument displays the Trigger control window.
2. Select the AEventtab.
3. Touch either of the Trigger Type buttons. Select the Comm Trigger Type.
The instrument displays the communication signal trigger functions, as shown in Figure 2.
Figure 2: Communication signal trigger functions
Table 2 describes the communication trigger functions. Refer to the Reference chapter beginning on page 9 of this manual, as well as the online help, for more information about these functions.
Table 2: Communication trigger functions
Menu Function
Source Sets the waveform data source (Ch1--Ch4)
Type Sets the waveform source type (Data, Clock, or Recovered Clock); the recovered clock function is only
available for NRZ coded signals
Polarity Sets the edge (positive or negative) on which to trigger; this function is only available when Type is set to
Clock
Coding Sets the communications code type from a drop--down menu (AMI, BZ3S, B6ZS, B8ZS, CMI, HDB3,
MLT3, NRZ)
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Serial Mask Testing & Serial Pattern Trigger User Manual
Operating Basics
Table 2: Communication trigger functions (cont.)
Menu Function
Standard Sets the signal standard for the selected code from a drop--down menu
Bit Rate Sets or displays the bit rate for the selected standard; if you change the default bit rate, the signal
standard changes to Custom
Comm Trigger Upper/Lower Level
Pulse Form Sets the comm signal pulse format on which to trigger; this function is displayed when required by a
Accessing Serial Mask
Testing Automatic
Measurement Functions
Sets the source signal threshold levels for the selected code; this function displays a single level field or upper/lower level fields depending on the selected code and standard
selected standard
Serial Mask Testing also provides a number of communications-related automatic measurements.
To access the communications signal automatic measurements, do the following steps:
1. Touch the Meas tool bar button. The instrument displays the Measurement control window.
2. Select the Comm tab. The instrument displays the communication measure­ment functions, as shown in Figure 3.
Figure 3: Communication measurement functions
Refer to the user manual for your instrument for information on setting up and taking automatic measurements. Refer to Appendix C of this manual for a list and description of the communication measurements.
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Operating Basics

Accessing Serial Pattern Trigger Functions

To access the Serial Pattern Trigger functions, do the following steps:
1. Touch the Trig tool bar button. The instrument displays the Trigger control window.
2. Select the AEventtab.
3. Touch either of the Trigger Type buttons. Select the Serial Trigger Type. The
instrument displays the serial pattern trigger functions, as shown in Figure 4.
Figure 4: Serial pattern trigger control window
Table 3 describes the Serial Pattern Trigger functions. Refer to the Reference chapter beginning on page 9 of this manual, as well as the online help, for more information about these functions.
Table 3: Serial t rigger functions
Menu Function
Data Src Sets the serial trigger waveform data source (Ch1-Ch4)
Clk Src Sets the serial trigger clock source (Ch1-Ch4, Recovered Clock); the recovered clock function is only
available for NRZ coded signals
Clk Polarity Sets the source waveform polarity (positive or negative); this function is available only when Clk Src is set
to a different value than Data Src
Coding Shows the serial trigger communications code type, which is always NRZ
Standard Sets the serial trigger signal standard
Bit Rate Sets or displays the bit rate for the selected standard
Data Level Clk Level
Editor Opens the serial pattern data editor which lets you define the serial pattern on which to trigger
Sets the data and clock source threshold levels for the selected code
Format Displays the serial trigger pattern data in binary or hexadecimal format
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Serial Mask Testing & Serial Pattern Trigger User Manual

Reference

Mask Testing

This chapter contains instructions for performing the following tasks:
H Mask Testing (starting on this page) describes how to set up and run mask
tests, as well as how to create, edit, and save user masks.
H Communication (Comm) Triggering (page 30) describes how to trigger on
industry-standard communication signals, and provides information on the recovered clock (R Clk) feature.
H Serial Pattern Trigger (page 34) describes how to trigger on user-defined
serial data.
Mask testing sets the instrument to test communications signals against industry-standard or user defined masks to verify the timing, amplitude, and waveform shape of the signal. This section provides step-by-step instructions on how to access and operate the mask test features.
The mask testing instructions cover the following subjects:
H Mask test setup
H Running a mask test
H Creating a user mask from a defined mask
H Saving a user mask to disk
H Recalling a user mask from disk
H Editing a user mask
H Creating a new user mask
H Mask testing key points (general and optical)
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Reference
Mask Test Setup
Overview To mask test a waveform Related control elements and resources
Prerequisites 1. Connect the instrument to the source signal, or save the
source signal to a math or reference waveform memory location.
Access the
Mask Setup
window
Select a mask
test signal
source
2. From the button bar, touch Masks.
The instrument displays the Mask control window.
3. Select the Source tab and then the channel, math, or reference tab and then select the waveform source to use as the mask test source. You can only mask test one waveform at a time.
To set the instrument to perform mask tests, do the following procedure.
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