User Manual
CSA7000B Series
Serial Mask Testing &
Serial Pattern Trigger
TDS7000B & TDS6000B Series
Option SM Serial Mask Testing
Option ST Serial Pattern Trigger
071-1228-01
This document applies to firmware version 3.0.5
and above.
www.tektronix.com
Copyright © Tektronix, Inc. All rights reserved.
Tektronix products are covered by U.S. and foreign patents, issued and pending. Information in this publication supercedes
that in all previously published material. Specifications and price change privileges reserved.
Tektronix, Inc., P.O. Box 500, Beaverton, OR 97077-0001
TEKTRONIX and TEK are registered trademarks of Tektronix, Inc.
MultiView Zoom is a trademark of Tektronix, Inc.
Table of Contents
Preface iii...................................................
Manual Structure iii................................................
Related Manuals iii.................................................
Contacting Tektronix v.............................................
Getting Started 1............................................
Product Description 1..............................................
Installing Optional Serial Mask Testing and Serial Pattern Trigger Functions
on TDS6000B and TDS7000B Series Instruments 3...................
Operating Basics 5..........................................
Serial Mask Testing Functions 5......................................
Accessing Serial Pattern Trigger Functions 8............................
Reference 9.................................................
Mask Testing 9....................................................
Communication (Comm) Triggering 30.................................
Serial Pattern Trigger 34.............................................
Appendix A: Supported Mask Types and Standards 37............
Appendix B: Supported Communication Trigger
Codes and Standards 41...................................
Appendix C: Automatic Communication Signal Measurements 43...
Levels Used in Taking Eye Measurements 44............................
Index 47....................................................
List of Figures
Figure 1: Masks control window 5.............................
Figure 2: Communication signal trigger functions 6..............
Figure 3: Communication measurement functions 7..............
Figure 4: Serial pattern trigger control window 8.................
Figure 5: Eye-diagram and optical values 44......................
Serial Mask Testing & Serial Pattern Trigger User Manual
i
Table of Contents
List of Tables
Table 1: Masks control window functions 5.....................
Table 2: Communication trigger functions 6....................
Table 3: Serial trigger functions 8.............................
T able 4: ITU-T masks 37......................................
Table 5: ANSI T1.102 masks 37................................
T able 6: Ethernet masks 37....................................
Table 7: SONET/SDH masks 38................................
Table 8: Fibre Channel masks 38...............................
T able 9: Fibre Channel Electrical masks 38......................
Table 10: InfiniBand masks 39.................................
Table 11: Serial ATA masks 39.................................
Table 12: USB 1.1/2.0 masks 39................................
Table 13: 1394b masks 39.....................................
Table 14: Rapid IO LP-LVDS masks 39.........................
Table 15: Rapid IO Serial masks 39............................
Table 16: IOF masks 40.......................................
Table 17: PCI-Express masks 40...............................
Table 18: SAS masks 40......................................
Table 19: AMI trigger standards 41.............................
Table 20: B3ZS trigger standards 41............................
Table 21: B6ZS trigger standards 41............................
Table 22: B8ZS trigger standards 41............................
Table 23: CMI trigger standards 42.............................
Table 24: HDB3 trigger standards 42...........................
Table 25: MLT3 trigger standards 42...........................
Table 26: NRZ trigger standards 42............................
Table 27: Supported communications measurements
and their definition 43.......................................
ii
Serial Mask Testing & Serial Pattern Trigger User Manual
Preface
Manual Structure
This is the user manual for Serial Mask Testing and Serial Pattern Trigger
functions. These functions are standard on the CSA7000B Series instruments.
Some of these functions are standard and others are available as options for the
TDS6000B and TDS7000B Series instruments.
This manual:
H Describes the capabilities of the Serial Mask Testing and Serial Pattern
Trigger functions, and how to install the optional functions on the instruments
H Explains how to access and operate the features
This manual is organized into the following chapters:
H Getting Started provides an overview of the Serial Mask Testing and Serial
Pattern Trigger functions and shows you how to install the optional functions
on TDS6000B and TDS7000B instruments.
Related Manuals
H Operating Basics describes how to access the functions using the front panel
and the instrument graphical user interface.
H Reference provides detailed steps for doing the most common Serial Mask
Testing and Serial Pattern Trigger tasks.
The following table lists other documents that support the operation and service
of the CSA7000B, TDS6000B, and TDS7000B Series instruments. The part
numbers of these documents are listed in the Accessories section of your
instrument user manual.
Serial Mask Testing & Serial Pattern Trigger User Manual
iii
Preface
Manual name Description
Online Help An online help system that is integrated with the User Interface application that ships
with the CSA7000B, TDS6000B, and TDS7000B instruments
References A quick reference to the major features of the instrument and how they operate
User Manual
Programmer Online Guide An alphabetical listing of the programming commands and other information related to
Service Manual A description of how to service the instrument to the module level. This optional
1
You can insert this user manual behind the Appendices section of your instrument user manual.
1
The user manual for the CSA7000B, TDS6000B, and TDS7000B instruments
controlling the instrument over the GPIB and TekVISA interfaces
manual must be ordered separately
iv
Serial Mask Testing & Serial Pattern Trigger User Manual
Contacting Tektronix
Preface
Phone 1-800-833-9200*
Address Tektronix, Inc.
Department or name (if known)
14200 SW Karl Braun Drive
P.O. Box 500
Beaverton, OR 97077
USA
Web site www.tektronix.com
Sales support 1-800-833-9200, select option 1*
Service support 1-800-833-9200, select option 2*
Technical support Email: techsupport@tektronix.com
1-800-833-9200, select option 3*
6:00 a.m. -- 5:00 p.m. Pacific time
* This phone number is toll free in North America. After office hours, please leave a
voice mail message.
Outside North America, contact a Tektronix sales office or distributor; see the
Tektronix web site for a list of offices.
Serial Mask Testing & Serial Pattern Trigger User Manual
v
Preface
vi
Serial Mask Testing & Serial Pattern Trigger User Manual
Getting Started
Product Description
This section of the user manual provides a high-level description of the Serial
Mask Testing and Serial Triggering functions. These functions are standard with
CSA7000B Series instruments. Some of these functions are standard and some
of the functions are options for the TDS6000B Digital Storage Oscilloscope and
TDS7000B Series Digital Phosphor Oscilloscopes.
This section also describes how to install the optional Serial Mask Testing and
Serial Triggering functions on TDS6000B and TDS7000B Series instruments.
The following text is an overview of the Serial Mask Testing and Serial
Triggering features.
Serial Mask Testing
The Serial Mask Testing feature provides optical and electrical mask testing,
communication triggering, and automatic communication signal measurements.
Mask testing consists of two tasks: signal violation detection and pass/fail
testing. Signal violation detection lets you test communications signals for time
or amplitude violations against a predefined mask. Each mask consists of one or
more polygonal regions called segments. The signal waveform data should stay
outside of the segments defined by the mask. Any signal data that occurs inside a
mask segment is called a mask segment violation or “hit.”
You can select from any of the included standard telecommunications masks
(optional on TDS6000B and TDS7000B Series instruments) or you can define
your own custom masks. Selecting a mask automatically sets the instrument
communications triggers to properly display most communication signals in the
mask.
Pass/Fail testing defines the mask testing parameters, including the number of
waveforms to test, how many mask hits are allowed before failing a test, setting
a mask margin tolerance value, and what action to perform at the completion of a
test.
Communication triggering enables you to trigger on and display waveforms for
industry-standard communications signals. Appendix B lists the supported
standards on which you can trigger.
Automatic communication signal measurements enable you to make automatic
measurements on communications signals. Appendix C lists the available
measurements.
Serial Mask Testing & Serial Pattern Trigger User Manual
1
Getting Started
The Serial Mask Testing key features are:
H Predefined masks for testing or triggering on industry-standard signals, such
as ITU--T G.703, ANSI T1.102, Fibre Channel, Ethernet, InfiniBand,
SONET, Serial ATA, USB, IEEE 1394b, RapidIO, OIF, PCI--Express, and
their subsets
H On CSA7000B instruments, optical mask standards have calibrated digital
filters, enabling operation as an optical reference receiver
H Autoset, which quickly adjusts the instrument vertical and horizontal
parameters to display a waveform in a mask
H Autofit, which positions the signal on each acquisition to minimize mask
segment hits
H Mask margins, which allow you to adjust the default mask margin tolerances
H Pass/Fail testing to continuously test a specified number of waveforms
against a mask
H A mask editor for creating, saving, and recalling user-defined masks
H Waveform database technology to do mask testing based on waveforms
accumulated in a database, rather than a single waveform stored in acquisition memory
H Communications triggers to trigger the instrument on industry-standard
communications signals
H Automatic measurements on communications signals
H Clock recovery from the serial data stream
NOTE. If a standard or function listed in this manual is not available on your
instrument, it is because it is optional or the configuration or bandwidth of your
instrument cannot test that standard.
The CSA7000B Series instruments, when used with the O/E Electrical Out-toCH1 Input Adapter (013-0327-xx), are calibrated optical reference receivers
with digital filtering, enabling you to do mask standard compliance testing.
Although the TDS6000B and TDS7000B Series instruments are not calibrated
optical reference receivers, you can use them with mask testing to evaluate
general optical signal characteristics and waveshape, using an external O/E
converter.
2
Serial Mask Testing & Serial Pattern Trigger User Manual
Getting Started
Serial Pattern Trigger
Serial Pattern Trigger lets you define a serial data pattern on which to trigger the
instrument.
The Serial Pattern Trigger key features are:
H User-defined serial data pattern of up to 64 bits on NRZ data streams up to
1.25 GBaud
H Clock recovery from the serial data stream
Installing Optional Serial Mask Testing and Serial Pattern Trigger Functions on TDS6000B and TDS7000B Series Instruments
To enable the optional Serial Mask Testing and/or Serial Triggering functions on
TDS6000B and TDS7000B instruments, you must have a valid Option Installation Key. Do the following steps:
1. From the oscilloscope menu bar, touch the Utilities menu, select Option
Installation, and then touch Continue.
2. Enter the authorization key using the instrument keyboard.
3. Touch Continue.
4. Reboot your instrument to enable the new option(s).
5. Attach the option configuration label(s) on the rear panel of the instrument to
indicate that the option(s) is installed on this instrument.
Serial Mask Testing & Serial Pattern Trigger User Manual
3
Getting Started
4
Serial Mask Testing & Serial Pattern Trigger User Manual
Operating Basics
This chapter describes how to access the Serial Mask Testing and Serial Pattern
Triggering features, and provides a brief description of each function’s settings.
See the Reference section in this manual for detailed instructions on using the
Serial Mask Testing and Serial Pattern Triggering functions.
Serial Mask Testing Functions
Serial Mask Testing provides three sets of functions: optical and electrical serial
mask testing, communications triggering, and automatic communication signal
measurements. This section describes how to access these functions.
Accessing Serial Mask
Testing Functions
Table 1: Masks control window functions
To access the Serial Mask Test functions, touch the Masks tool bar button. The
instrument displays the Masks control window, as shown in Figure 1.
Figure 1: Masks control window
Table 1 describes the Masks control window tab functions. Refer to the
Reference chapter beginning on page 9 of this manual, as well as the online help,
for more information about these functions.
Tab Function
Mask Set the mask type, communications standard, polarity, mask on/off, and autofit/autoset alignment
parameters
Source Set the input waveform source
Tolerance Set the mask margin tolerance values
Serial Mask Testing & Serial Pattern Trigger User Manual
5
Operating Basics
Table 1: Masks control window functions (cont.)
Tab Function
Pass/Fail Setup Set the mask test pass/fail parameters
Pass/Fail Results Display the pass/fail test results
Accessing Serial Mask
Testing Communications
Trigger Functions
To access the Serial Mask Testing communication trigger functions, do the
following steps:
1. Touch the Trig tool bar button. The instrument displays the Trigger control
window.
2. Select the AEventtab.
3. Touch either of the Trigger Type buttons. Select the Comm Trigger Type.
The instrument displays the communication signal trigger functions, as
shown in Figure 2.
Figure 2: Communication signal trigger functions
Table 2 describes the communication trigger functions. Refer to the Reference
chapter beginning on page 9 of this manual, as well as the online help, for more
information about these functions.
Table 2: Communication trigger functions
Menu Function
Source Sets the waveform data source (Ch1--Ch4)
Type Sets the waveform source type (Data, Clock, or Recovered Clock); the recovered clock function is only
available for NRZ coded signals
Polarity Sets the edge (positive or negative) on which to trigger; this function is only available when Type is set to
Clock
Coding Sets the communications code type from a drop--down menu (AMI, BZ3S, B6ZS, B8ZS, CMI, HDB3,
MLT3, NRZ)
6
Serial Mask Testing & Serial Pattern Trigger User Manual
Operating Basics
Table 2: Communication trigger functions (cont.)
Menu Function
Standard Sets the signal standard for the selected code from a drop--down menu
Bit Rate Sets or displays the bit rate for the selected standard; if you change the default bit rate, the signal
standard changes to Custom
Comm Trigger
Upper/Lower Level
Pulse Form Sets the comm signal pulse format on which to trigger; this function is displayed when required by a
Accessing Serial Mask
Testing Automatic
Measurement Functions
Sets the source signal threshold levels for the selected code; this function displays a single level field or
upper/lower level fields depending on the selected code and standard
selected standard
Serial Mask Testing also provides a number of communications-related
automatic measurements.
To access the communications signal automatic measurements, do the following
steps:
1. Touch the Meas tool bar button. The instrument displays the Measurement
control window.
2. Select the Comm tab. The instrument displays the communication measurement functions, as shown in Figure 3.
Figure 3: Communication measurement functions
Refer to the user manual for your instrument for information on setting up and
taking automatic measurements. Refer to Appendix C of this manual for a list
and description of the communication measurements.
Serial Mask Testing & Serial Pattern Trigger User Manual
7
Operating Basics
Accessing Serial Pattern Trigger Functions
To access the Serial Pattern Trigger functions, do the following steps:
1. Touch the Trig tool bar button. The instrument displays the Trigger control
window.
2. Select the AEventtab.
3. Touch either of the Trigger Type buttons. Select the Serial Trigger Type. The
instrument displays the serial pattern trigger functions, as shown in Figure 4.
Figure 4: Serial pattern trigger control window
Table 3 describes the Serial Pattern Trigger functions. Refer to the Reference
chapter beginning on page 9 of this manual, as well as the online help, for more
information about these functions.
Table 3: Serial t rigger functions
Menu Function
Data Src Sets the serial trigger waveform data source (Ch1-Ch4)
Clk Src Sets the serial trigger clock source (Ch1-Ch4, Recovered Clock); the recovered clock function is only
available for NRZ coded signals
Clk Polarity Sets the source waveform polarity (positive or negative); this function is available only when Clk Src is set
to a different value than Data Src
Coding Shows the serial trigger communications code type, which is always NRZ
Standard Sets the serial trigger signal standard
Bit Rate Sets or displays the bit rate for the selected standard
Data Level
Clk Level
Editor Opens the serial pattern data editor which lets you define the serial pattern on which to trigger
Sets the data and clock source threshold levels for the selected code
Format Displays the serial trigger pattern data in binary or hexadecimal format
8
Serial Mask Testing & Serial Pattern Trigger User Manual
Reference
Mask Testing
This chapter contains instructions for performing the following tasks:
H Mask Testing (starting on this page) describes how to set up and run mask
tests, as well as how to create, edit, and save user masks.
H Communication (Comm) Triggering (page 30) describes how to trigger on
industry-standard communication signals, and provides information on the
recovered clock (R Clk) feature.
H Serial Pattern Trigger (page 34) describes how to trigger on user-defined
serial data.
Mask testing sets the instrument to test communications signals against
industry-standard or user defined masks to verify the timing, amplitude, and
waveform shape of the signal. This section provides step-by-step instructions on
how to access and operate the mask test features.
The mask testing instructions cover the following subjects:
H Mask test setup
H Running a mask test
H Creating a user mask from a defined mask
H Saving a user mask to disk
H Recalling a user mask from disk
H Editing a user mask
H Creating a new user mask
H Mask testing key points (general and optical)
Serial Mask Testing & Serial Pattern Trigger User Manual
9
Reference
Mask Test Setup
Overview To mask test a waveform Related control elements and resources
Prerequisites 1. Connect the instrument to the source signal, or save the
source signal to a math or reference waveform memory
location.
Access the
Mask Setup
window
Select a mask
test signal
source
2. From the button bar, touch Masks.
The instrument displays the Mask control window.
3. Select the Source tab and then the channel, math, or
reference tab and then select the waveform source to
use as the mask test source. You can only mask test
one waveform at a time.
To set the instrument to perform mask tests, do the following procedure.
10
Serial Mask Testing & Serial Pattern Trigger User Manual
Overview Related control elements and resourcesTo mask test a waveform (cont.)
Reference
Select the mask
type
Select the mask
standard
4. To specify the mask Type, select the Masks tab. Touch
the appropriate button in the Type field. Touch the More
button to display further selections.
The window lists mask types and standards that are
available on your instrument, which depends on the
bandwidth, options, and configuration of your
instrument.
Selecting a mask type and standard adjusts the
instrument horizontal, vertical, and trigger settings to
those appropriate for displaying a waveform of the
specified type. If the signal is not within the mask, touch
the Autoset button to center the waveform in a mask. If
Autoset did not align the signal in the mask, adjust the
instrument vertical and horizontal controls.
If you touch the Autoset button and the Autoset Undo
preference is On, the instrument will display an Autoset
Undo window. Touch the Undo button to return to the
previous settings, or touch the Close button to remove
the window.
5. To specify the mask standard, select a standard from the
drop--down list.
(CSA7000B Series only) Optical mask type/standard
combinations also display an optical Bessel-Thompson
Filter button that lets you turn on or off the fourth-order
Bessel-Thompson frequency filter (default is On). When
the filter is On, the CSA7000B series is an Optical
Reference Receiver.
CAUTION. Do not exceed the maximum nondestructive
optical input specified in your instrument user manual.
Verify that your optical input signal is within the linear
operating range of the optical-to-electrical converter and
the optical reference receiver.
Serial Mask Testing & Serial Pattern Trigger User Manual
11
Reference
Overview Related control elements and resourcesTo mask test a waveform (cont.)
Select
display
parameters
Autoset the
signal
6. In the Masks tab, touch the Display button to toggle
mask display on or off. The mask must be turned on to
do mask testing.
7. Touch the Hit Count button to turn on or off hit counting.
The hit count is shown in the Pass/Fail Results tab.
8. Touch the Display Config button to set mask hit
highlighting and to lock the mask to the waveform. Lock
Mask to Waveform resizes the mask to reflect changes
in the horizontal or vertical settings of the instrument.
This control is also on the main mask setup window.
9. In the Masks tab, touch the Autoset button to have the
instrument automatically adjust instrument settings to
align the waveform to the mask based on the
characteristics of the input signal. Autoset is done on the
first waveform acquired after touching the Autoset
button.
If the Autoset Undo preference is On, the instrument will
display an Autoset Undo window. Touch the Undo button
to return to the previous settings, or touch the Close
button to remove the window.
The Autoset Config button opens a configuration
window that lets you set the vertical, horizontal, and
trigger autoset parameters, activate autofit or autoset,
choose the autoset mode, return to the default autoset
configuration, or return to the Mask Setup control
window.
On CSA7000B series instruments when using the O/E
Electrical Out-to-CH1 Input Adapter, autoset defaults to
CH 1, and the instrument will ignore the other channels.
12
Serial Mask Testing & Serial Pattern Trigger User Manual
Overview Related control elements and resourcesTo mask test a waveform (cont.)
Reference
Enable and set
waveform
autofit
parameters
Set mask test
tolerance
margins
10. In the Masks tab, touch the Autofit button to enable the
waveform autofit function. Autofit checks each waveform
for any mask hits. If there are hits, autofit reposi tions the
waveform to minimize hits. The number of hits reported
is the number after autofit has minimized hits.
The Autofit Config button lets you set the autofit
maximum waveform repositioning parameters (as a
percentage of the horizontal and vertical divisions),
return to default settings, or return to the Mask Setup
control window. Use the keypad to change the vertical or
horizontal autofit parameters.
11. Touch the Masks button to return to the Mask control
window.
12. Touch the Masks Setup window Tolerance tab to set the
percentage of margin used in the mask test. Use the
control knob, keypad, pop-up keypad, or up and down
arrow buttons to enter the mask margin tolerance
percentage. The range of values is --50% to 50%.
Margin tolerance settings greater than 0% expand the
size of the segments, making the mask test harder to
pass; margin tolerance settings less than 0% (negative
percent) reduces the size of the segments, making the
mask test easier to pass.
Serial Mask Testing & Serial Pattern Trigger User Manual
13
Reference
Overview Related control elements and resourcesTo mask test a waveform (cont.)
Set mask test
pass and fail
parameters
13. Select the Pass/Fail Setup tab of the Masks control
window.
14. Use the control knob, keypad, or pop-up keypad to enter
the number of waveforms to test (number of samples in
some modes), the failure threshold (the number of
waveforms that must fail to fail the test), and the delay
time (the time from when mask test starts to when the
instrument begins sampling).
15. Use the Failure field buttons to set what the instrument
does when a mask test fails; have the instrument beep
(BEEP), send an SRQ out on the GPIB bus (SRQ), send
a trigger pulse out on the AUX OUT connector (AUX
Out), stop signal acquisition immediately (Stop Acq),
and/or print the instrument screen image to a printer
(Print).
14
16. Touching the More button displays more failure
functions. Save Wfm saves the waveform data of the
first waveform that causes the test to fail to a .wfm file.
Log Date saves time, date, and basic test information of
the first waveform that causes the test to fail to an ASCII
text (.txt) file.
Both files are saved to the location specified by the Path
button. The file name format is YYMMDD--HHMMSS,
where YY is year, MM is month, DD is day, HH is hour,
MM is minutes, and SS is seconds.
17. Use the Completion field buttons to set what the
instrument does at the completion of a mask test.
Serial Mask Testing & Serial Pattern Trigger User Manual
Overview Related control elements and resourcesTo mask test a waveform (cont.)
Reference
Set mask test
pass and fail
parameters
(cont.)
18. Use the Polarity buttons to set mask and waveform
polarity. Positive tests the positive waveform pulses.
Negative inverts the mask and tests the negative
waveform pulses. Both tests the first half of the tested
waveforms in positive polarity mode, then tests the
remaining waveforms in negative polarity mode.
19. Toggle the Repeat button to On to set the instrument to
repeat (continue) mask testing on the completion of
each test.
Serial Mask Testing & Serial Pattern Trigger User Manual
15
Reference
Running a Mask Test
Overview Running a mask test Control elements and resources
Prerequisites 1. You must have set up the instrument to perform mask
testing as described in Mask Test Setup on page 10.
Start the mask
pass/fail test
2. From the button bar, touch Masks and select the
Pass/Fail Results tab. The instrument opens the
Pass/Fail Results control window.
3. Touch the Pass/Fail Test On/Off button to turn on mask
pass/fail testing. You can touch Reset prior to running
tests to clear the Pass/Fail Test Summary fields.
You can also use the Pass/Fail Test button in the
Pass/Fail Setup control window.
To start and stop mask tests, do the following procedure.
Stop the mask
pass/fail test
The instrument begins mask testing and displays the
test summary information in the Pass/Fail Test Summary
fields. If a mask has more than three segments, the
window displays a horizontal scroll bar below the Hits
per Segment field that lets you scroll the field to view
other segment hit data.
4. Touch the Pass/Fail test button to turn off mask pass/fail
testing. Testing will also stop when the testing meets the
parameters in the Pass/Fail Setup control window.
16
Serial Mask Testing & Serial Pattern Trigger User Manual
Reference
Creating a User Mask from
a Defined Mask
Overview Creating a user mask from a defined mask Control elements and resources
Access the
mask setup
window
Select the mask
type and
standard
1. From the button bar, touch Masks and select the
Masks tab.
The instrument displays the Mask control window.
2. Touch the appropriate button in the Type field to select a
mask type. Touch the More button to display further
selections.
Refer to Mask Key Points on page 28 before creating or editing a mask. To create
a user mask from a defined mask, do the following procedure.
3. Select a standard from the drop--down list.
The control window lists mask types and standards that
are available on your instrument, which depend on the
bandwidth, options, and configuration of your
instrument.
Serial Mask Testing & Serial Pattern Trigger User Manual
17
Reference
Overview Control elements and resourcesCreating a user mask from a defined mask (cont.)
Copy the cur-
rent mask
Edit the user
mask
Save the user
mask to disk
4. Touch the User Mask button.
5. Touch the Copy Current Mask to User Mask button. The
instrument copies the current mask to the user mask
memory.
6. Refer to Editing a User Mask on page 19.
7. Refer to Saving a User Mask to Disk on page 21. You do
not need to save the edited user mask to disk, as the
instrument retains the current user mask in nonvolatile
memory. However, if you plan on creating a number of
user masks, you will need to store the user masks on
disk, as the instrument can only load one user mask at a
time.
18
Serial Mask Testing & Serial Pattern Trigger User Manual
Reference
Editing a User Mask
Overview Editing a user mask Control elements and resources
Access the
mask edit
window
Enable the
mask edit
controls
1. From the button bar, touch Masks and select the
Masks tab.
2. Touch the User Mask button.
3. Touch the Edit User Mask button. The instrument
displays the Mask Edit control window.
4. Touch the Controls button to open the mask edit controls
window on the right side of the screen. This provides the
maximum area to display the mask, making editing
easier.
To edit a user mask, do the following procedure.
Select a
segment
Select a
vertex
5. Touch the Segment field and use the arrow buttons,
multipurpose knob, or keypad to select a segment to
edit. The selected (active) segment is highlighted. Each
maskcanhaveupto16segments.
6. Touch the Vertex field and use the arrow buttons,
multipurpose knob, or keypad to select the vertex to
edit.TheactivevertexisindicatedwithanXonthe
template segment. Each segment can have up to 50
vertices.
Serial Mask Testing & Serial Pattern Trigger User Manual
19
Reference
Overview Control elements and resourcesEditing a user mask (cont.)
Move a
vertex
Add or delete a
vertex
7. Touch the Horizontal field and use the multipurpose
knob or keypad to change the selected vertex horizontal
position.
8. Touch the Vertical field and use the multipurpose knob
or keypad to change the selected vertex vertical
position.
9. To add a vertex, select the closest vertex that is
clockwise from where you want to place a new vertex.
Touch Add to add a vertex midway between the selected
vertex and the next counter-clockwise vertex.
10. To delete a vertex, enter or select the vertex number.
Then touch Delete to delete the selected vertex. The
remaining vertices located counter-clockwise from the
deleted vertex are renumbered.
Vertex clockwise
from vertex you
want to add
Save the user
mask to disk
20
Added vertex
11. Refer to Saving a User Mask to Disk on page 21.
Serial Mask Testing & Serial Pattern Trigger User Manual
Reference
Saving a User Mask to
To save a mask to a folder on the instrument disk, do the following procedure.
Disk
Overview Saving a user mask to disk Control elements and resources
Access the
Mask Setup
window
Save the user
mask to disk
1. From the button bar, touch Masks and select the Masks
tab.
2. Touch the User Mask button.
3. Touch the Edit User Mask button. The instrument
displays the Mask Edit control window.
4. Touch the Mask Save button.
The instrument opens the Save Mask As dialog. The
default save location is in the TekScope/Masks folder.
5. Enter the mask name in the File Name field. The default
save type is User Mask Files (*.msk).
6. Touch Save to save the mask to disk.
Serial Mask Testing & Serial Pattern Trigger User Manual
21
Reference
Recalling a User Mask
To recall a mask that was stored on disk, do the following procedure.
From Disk
Overview Recalling a user mask Control elements and resources
Access the
Mask Setup
window
Recall the user
mask from disk
1. From the button bar, touch Masks and select the Masks
tab.
2. Touch the User Mask button.
3. Touch the Edit User Mask button. The instrument
displays the Mask Edit control window.
4. Touch the Mask Recall button.
The instrument opens the Recall Mask dialog. The
default recall location is the TekScope/Masks folder. If
the mask files are in another folder, use the navigation
controls to access the appropriate folder.
5. Select the mask name.
6. Touch Recall to load the user mask into user mask
memory on the instrument.
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Serial Mask Testing & Serial Pattern Trigger User Manual
Reference
Creating a New User Mask
To create a new user mask that is not based on an existing mask, do the
following procedure.
Overview Creating a new mask Control elements and resources
Set instrument
settings
Create an empty
user mask
1. Use the communications trigger features to trigger the
instrument on a signal. The instrument saves these
settings with the mask information.
See the instrument user manual for
information on displaying waveforms.
2. From the button bar, touch Masks and select the
Masks tab.
3. Touch the User Mask button.
4. Touch the mask standard field to display the drop-down
list.
5. Select None from the list.
6. Touch the Copy Current Mask to User Mask button. If
you are asked if you want to overwrite the current user
mask, touch the Yes button.
Serial Mask Testing & Serial Pattern Trigger User Manual
23
Reference
Overview Control elements and resourcesCreating a new mask (cont.)
Create and edit
new mask
segments
Save the user
mask to disk
7. Touch the Edit User Mask button to display the user
mask edit functions.
8. Touch the Segment field and use the arrow buttons,
multipurpose knob, or keypad to enter or select
segment 1.
9. Touch the Vertex Add button. The instrument draws the
default new segment shape, a triangle.
10. Use the instructions in Editing a User Mask,startingat
step 5 on page 19, to edit a segment.
11. Repeat steps 8 through 10, selecting an unused and
sequential segment number, to create and edit more
segments.
12. Refer to Saving a User Mask to Disk on page 21.
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Serial Mask Testing & Serial Pattern Trigger User Manual
Reference
Mask Testing Example
The following procedure is an example of setting up the instrument to perform
mask testing on a DS1A signal. This example uses a DS1A signal and a
CSA7000B Instrument, but the example can easily be modified for other
communications signals and other instruments.
Overview Creating a new mask Control elements and resources
Install the test
hookup
Set instrument
settings
1. Connect your DS1A signal to CH 1 through suitable
cables, probes, or adapters.
Signal Source
Output
2. Press DEFAULT SETUP.
3. From the button bar, touch Masks and select the
Masks tab.
CSA7000B Instrument
4. Touch the ANSI T1.102 button.
If not using an DS1A signal, touch the button
appropriate for the signal that you are using.
5. Touch the mask standard field to display the drop-down
list.
6. Select DS1A (2.048 Mb/s) from the list (if not using a
DS1A signal, select the standard appropriate for the
signal that you are using).
The mask is displayed, but may not be aligned with the
signal.
Serial Mask Testing & Serial Pattern Trigger User Manual
25
Reference
Overview Control elements and resourcesCreating a new mask (cont.)
Align the mask
and the signal6
Select the
source
7. To align the signal with the mask, touch the Alignment
Autoset button.
The signal is aligned with the mask. If you need to
minimize the number of mask hits on each acquisition,
touch Autofit.
This display assumes that the autoset undo preference
is off or that you touch Close to close the Autoset Undo
control window.
8. In this example, we are using the default source, Ch 1.
26
Change the
tolerance
9. Set the Mask Margin Tolerance to the percentage of
margin used in the mask test (this example uses the
default OFF):
H OFF to test the signal to the selected mask
standard
H On with greater than 0% to expand the size of the
mask segments, making the test harder to pass
H On with less than 0% to reduce the size of the
mask segments, making the test easier to pass
Serial Mask Testing & Serial Pattern Trigger User Manual
Overview Control elements and resourcesCreating a new mask (cont.)
Reference
Setup pass/fail
testing
View the test
results
10. Select the pass/fail test controls (this example uses the
defaults, except Pass/Fail Test Repeat is selected):
H The number of samples or waveforms to test, the
minimum number of waveforms to test, and the
delay before the test begins
H Notifications/actions when the test fails or
completes
H Polarity of the signal to test
H Start the test and cause the test to repeat
11. View the results of the pass/fail test (in this example
there have been no hits, and the current test is passing):
H Pass/Fail Test Summary displays the number of
samples/waveforms tested, the total number of hits
(failures), and settings that you selected for the test
H Hits per segment displays the number of hits in
each segment of the mask
H Pass/Fail Test allows you to reset the test and to
turn the test on and off
Triggers set
automatically
For more
information
12. When you turn on masks, the instrument automatically
sets up the triggers. To see the trigger settings used by
this example, do the following step:
From the button bar, touch Trig. The instrument selected
Comm triggers, the Ch 1 source, HDB3 coding, the Data
type, and the DS1A standard, and set the bit rate and
pulse form.
13. For additional information on setting up and using serial
mask testing, refer to other sections of this user manual
and the instrument online help.
Serial Mask Testing & Serial Pattern Trigger User Manual
27
Reference
Mask Key Points
There are a number of mask test key points to be aware of prior to using, editing,
or creating a mask.
Mask Testing. Only one mask standard is active at any time. If you have a mask
selected/enabled and then select a new mask, the new mask replaces the previous
mask. You cannot test to multiple standards simultaneously.
Autofit and Persistence Interaction. The Autofit function moves the waveform
vertically and horizontally in a mask to reduce the number of segment hits within
a mask. If persistence is set to infinite or variable, each Autofit waveform
movement clears existing persistence data. If Autofit makes frequent waveform
movements, there may be little or no displayed waveform persistence data.
Segments and Mask Hits. Each mask can have a maximum of 16 segments.
Segments can overlap. The number of mask hits is the sum of all hits in all
segments, regardless of whether or not segments overlap. For example, if a
waveform crosses over an area where two segments overlap, both segments will
count the waveform hit.
Vertices. Each segment can have a maximum of 50 vertices. Vertices are
numbered counterclockwise, with vertex one generally located at the bottom left
of each segment. The active (selected) vertex is indicated by an X. The instrument automatically assigns numbers to vertices during mask creation or editing.
Mask Margin Tolerance. Mask margin tolerance moves the mask segment
boundaries by the specified percentage. Negative margins reduce the size of the
segment, making it easier to pass a mask test. Turning mask margin tolerance off
redraws the mask segment margins to their default values, but leaves the numeric
value as it is, allowing you to quickly toggle between default and user-set margin
values.
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Serial Mask Testing & Serial Pattern Trigger User Manual
Reference
Standards and Bandwidth. When the instrument system bandwidth (which
includes the instrument, attached probes, and/or cabling) falls into the range of
1.5 to 1.8 (0.8 for optical signals) times the data signal bit rate, the third
harmonic of the data signal is significantly attenuated. The instrument displays
useful qualitative information, but quantitative rise-time measurements under
these conditions may not be accurate.
For example, a 1394b standard signal at the S800b rate has a bit rate of
983.0 Mb/s. 1.5 to 1.8 times this value is a range of 1.47 to 1.77 GHz. Therefore,
you should not use a 1.5 GHz measurement system for making quantitative
rise-time measurements of this standard.
When just the instrument bandwidth falls within 1.5-1.8 (0.8 for optical signals)
times the bit rate of a selected mask standard, the instrument displays the
message “Consider system bandwidth when testing at this bit rate.” in the status
area above the graticule.
Optical Mask Testing
Key Points
(CSA7000B Series Only)
There are a number of optical mask test key points to be aware of prior to doing
optical mask testing on the CSA7000B Series instruments.
H The CSA7000B Series instruments, when equipped with the O/E Electrical
Out-to-Ch1 Input Adapter, are calibrated optical reference receivers. This
means that the instrument optical to electrical converter and instrument input
channel have been tuned to have a fourth-order Bessel-Thompson response,
as well as the correct frequency response for each supported standard by use
of digital filters.
H When the O/E Electrical Out-to-Ch1 Input Adapter is installed, if you select
an optical mask, and the Bessel-Thompson filter mode is On, then only
channel 1 is available. Trying to turn on any other channels, or perform
certain functions such as changing the acquisition mode, results in an error
message. Turning the Bessel-Thompson filter mode to Off enables access to
the other instrument channels, though channel 1 is no longer in the calibrated
optical reference receiver (ORR) mode.
H Optical signal mask testing is available for Fibre Channel, InfiniBand,
SONET, 1394b, and 1G Ethernet standards.
H If a listed standard is not available on your instrument, it is because the
bandwidth of your instrument is not high enough to test that standard.
H You can use O/E Adapters on different CSA7000B instruments without
affecting the optical reference receiver calibration on an instrument.
H CSA7000B Series instruments provides recovered clock and recovered data
signal outputs on the instrument front panel, as well as using the signals for
internal triggering.
Serial Mask Testing & Serial Pattern Trigger User Manual
29
Reference
Communication (Comm) Triggering
Communication (Comm) triggering sets the instrument to trigger on industry-standard communication signals. This section describes how to access and
operate the communication trigger features.
Communication Triggering
To set the instrument to trigger on communication signals, do the following
procedure.
Overview Communication triggering Related control elements and resources
Access the
trigger control
window
Select a com-
munications
trigger
1. From the button bar, touch Trig and select the
A Event trigger tab.
The instrument opens the Trigger Setup control window.
2. Touch the Comm button.
The instrument displays the Comm Trigger controls.
Select comm
trigger source
30
3. Touch the Source button to select the signal source
channel. Select from channel 1 through channel 4.
Serial Mask Testing & Serial Pattern Trigger User Manual
Overview Related control elements and resourcesCommunication triggering (cont.)
Reference
Select comm
trigger coding
and standard
Select comm
trigger type
4. Touch the Coding button and select the appropriate
code type for your signal from the list. The code
selected determines which standards are available as
well as other parameters, such as trigger threshold and
pulse form.
5. Touch the Standard button, and select the appropriate
signal standard from the list. The standard selected
determines the bit rate.
6. The Bit Rate field shows the bit rate for the selected
standard. Touch the Bit Rate field, and use the
multipurpose knob or keypad to enter the serial data
stream bit rate for nonstandard bit rates.
Note. Changing the bit rate means the instrument is not
triggering in accordance with the standard. The
Standard type changes to Custom when you change the
bit rate value.
7. Touch the Type button to select the signal type. Select
from Data, Clock, and R Clk (recovered clock).
Recovered clock is only available for NRZ coded
signals. Data or clock sets the instrument to trigger on a
data stream or clock signal on the input source,
respectively.
Refer to Recovered Clock (R Clk) Key Points on
page 33 for information on the Recovered Clock
function.
8. If Type is set to Clock, the instrument displays the
Polarity button. Touch Polarity to set the clock signal
polarity for the instrument to trigger on Pos(itive) or
Neg(ative) clock edges.
Serial Mask Testing & Serial Pattern Trigger User Manual
31
Reference
Overview Related control elements and resourcesCommunication triggering (cont.)
Select comm
trigger pulse
form
Select comm
trigger
threshold levels
9. Depending on the code setting, the instrument displays
different sets of Pulse Form buttons. Touch the
appropriate Pulse form button to select a pulse form
setting, where each button means:
AMI: Isolated +1, Isolated --1, and eye diagram
CMI: +1 (binary 1), 0 (binary zero), --1 (inverse of
binary 1), and eye diagram
NRZ and MLT3: eye diagram only (no buttons displayed)
10. Depending on the code and standard setting, the
instrument displays the Clock Level field with one or two
threshold fields. Touch each Level field and use the
multipurpose knob or keypad to enter the comm signal
threshold level values.
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Serial Mask Testing & Serial Pattern Trigger User Manual
Reference
Recovered Clock (R Clk)
Key Points
The following are key recovered clock (R Clk) points:
H Recovered clock is a synchronous clock signal derived from the serial
communications signal by using a Phase Lock Loop (PLL) clock recovery
circuit.
H The recovered clock function only applies to NRZ source signals with a
signal bit rate that is less than or equal to 3.125 Gb/s. The recovered clock
and recovered data (up to 1.25 Gb/s) are also available at the front panel of a
CSA7000B Series instrument.
H When you select recovered clock, the instrument attempts to trigger on and
acquire a lock on the derived clock signal. If the source data stream is
interrupted or is very distorted, then the instrument may not acquire a lock or
may lose signal lock, causing an unstable waveform display.
If this occurs, verify that the source signal is correct, and then push the
LEVEL (Push to set 50%) front-panel knob to force the instrument to
reacquire a lock on the data stream.
Serial Mask Testing & Serial Pattern Trigger User Manual
33
Reference
Serial Pattern Trigger
Serial pattern trigger sets the instrument to trigger on a user-defined NRZ data
stream pattern. This section describes how to access and operate the serial pattern
trigger function.
Serial Pattern Trigger
Setup
Overview Serial trigger setup Related control elements and resources
Access the
trigger control
window
Select serial
trigger
1. From the button bar, touch Trig, and select the
A Event trigger tab.
The instrument opens the Trigger Setup control window.
2. Touch the Serial button.
The instrument displays the Serial Trigger controls.
To set the instrument to trigger on a user-defined serial data stream, do the
following procedure.
34
Serial Mask Testing & Serial Pattern Trigger User Manual
Overview Related control elements and resourcesSerial trigger setup (cont.)
Reference
Select data
source
Select serial
trigger coding
and standard
3. Touch the Data Src button to select the serial data
source. Select from channel 1 through channel 4.
4. Touch the Data Level field and use the multipurpose
knob or keypad to enter the serial data stream data
threshold level.
5. The Coding button always shows NRZ code type.
6. Touch the Standard button, and select the appropriate
standard from the list. The standard selected determines
the bit rate.
7. The Bit Rate field shows the bit rate for the selected
standard. Touch the Bit Rate field, and use the
multipurpose knob or keypad to enter the serial data
stream bit rate for nonstandard bit rates.
Select clock
source, polarity,
and level
Note: Changing the bit rate means the instrument is not
triggering in accordance with the standard.
8. Touch the Clk Src button to select the serial data clock
source. Select from channel 1 through channel 4 and
R Clk (recovered clock). Recovered clock is only
available for NRZ coded signals.
Refer to Recovered Clock (R Clk) Key Points on
page 33 for information on the Recovered Clock
function.
9. If the clock source is different than the data source
(except for R Clk), the instrument displays the Clk
Polarity button and the Clk Level field. Touch Clk
Polarity to set the clock signal polarity to Pos(itive) or
Neg(ative). Touch the Clk Level field, and use the arrow
buttons, multipurpose knob, or keypad to enter the clock
signal threshold level.
Serial Mask Testing & Serial Pattern Trigger User Manual
35
Reference
Overview Related control elements and resourcesSerial trigger setup (cont.)
View the current
serial trigger
pattern
Edit the serial
trigger pattern
10. The Serial Pattern Data field shows the current serial
pattern. Touch the Format button to select the pattern
display format from the drop-down list. Available formats
are binary and hexadecimal.
11. Touch the Editor button. The instrument displays the
Serial Trigger edit controls.
12. To enter the serial data pattern in binary format, touch
the Format button, and select Binary. To enter the serial
data in hexadecimal format, touch the Format button,
and select Hex. The editor updates the keypad for the
selected format.
13. Touch the Home button to move the insertion cursor to
the right end of the pattern string.
14. Touch the left-arrow or right-arrow button to move the
insertion cursor left or right in the pattern field. You can
also use the mouse or the keyboard arrow keys to move
the insertion cursor.
15. Touch the Backspace button to erase the character to
the left of the insertion cursor.
Apply serial
trigger pattern
data
16. Touch the Clear button to erase all pattern data from the
pattern field.
17. Touch the appropriate keypad character to enter a
character. You can also use the keyboard to enter binary
or hexadecimal characters. You can enter a maximum of
64 binary characters or 16 hexadecimal characters.
18. Touch the Apply button to apply the serial pattern to
trigger the instrument. The instrument remains in the
serial pattern data editor window.
19. Touch the Cancel button to cancel any changes since
the last Apply action and return to the serial pattern
trigger control window.
20. Touch the OK button to apply the current serial pattern
data to the serial trigger and return to the serial pattern
trigger control window.
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Serial Mask Testing & Serial Pattern Trigger User Manual
Appendix A: Supported Mask Types and Standards
Tables 4 through 17 list all supported mask types and standards.
NOTE. The standards available for an instrument depend on the options,
bandwidth, and configuration of that instrument.
Table 4: ITU-T masks
None 32Mb
32.064 Mb/s
DS2RateSym
6.312 Mb/s
E1 Coax Pair
2.048 Mb/s
E4 Binary 1
139.26 Mb/s
DS2 Rate Coax
6.312 Mb/s
E2
8.448 Mb/s
STM1E
Binary 0 155.52 Mb/s
Table 5: ANSI T1.102 masks
None DS1
1.544 Mb/s
DS2
6.312 Mb/s
STS-1 Pulse
51.84 Mb/s
DS3
44.736 Mb/s
STS-1 Eye
51.84 Mb/s
97Mb
97.728 Mb/s
DS3 Rate
44.736 Mb/s
E3
34.368 Mb/s
STM1E
Binary 1 155.52 Mb/s
DS1A
2.048 Mb/s
DS4NA
139.26 Mb/s
STS-3
155.52 Mb/s
DS1 Rate
1.544 Mb/s
E1 Sym Pair
2.048 Mb/s
E4 Binary 0
139.26 Mb/s
DS1C
3.152 Mb/s
DS4NA
Max Output
139.26 Mb/s
STS-3
Max Output
155.52 Mb/s
Table 6: Ethernet masks
None 100Base-TX STP
125 Mb/s
1000B-CX Norm, TP2
1.25 Gb/s
XAUI, Far
3.125 Gb/s
1000B-CX Abs, TP2
1.25 Gb/s
EFM
125 Mb/s (draft)
Serial Mask Testing & Serial Pattern Trigger User Manual
100Base-TX UTP
125 Mb/s
1000B-CX Abs, TP3
1.25 Gb/s
1000B-SX/LX
1.25 Gb/s
XAUI, Near
3.125 Gb/s
37
Appendix A: Supported Mask Types and Standards
Table 7: SONET/SDH masks
None OC1/STM0
51.84 Mb/s
OC48-FEC
2.666 Gb/s
OC3/STM1
155.52 Mb/s
Table 8: Fibre Channel masks
None FC133 Optical
132.8 Mb/s
FC1063 Optical
1.0625 Gb/s
FC1063 Optical
Draft Rev 11
Table 9: Fibre Channel Electrical masks
None FC133E Elec.
132.8 Mb/s
FC1063E Elec.
1.0625 Gb/s
FC1063E
Abs, Beta, Transm
FC1063E
Abs, Delta, Recv
FC2125E
Norm,Gamma,Trans
FC2125E
Abs, Beta, Recv
FC4250E
Abs, Beta, Transm
FC4250E
Abs, Gamma, Transm
FC1063E
Norm, Beta, Transm
FC1063E
Abs, Delta, Transm
FC1063E
Abs, Gamma, Recv
FC2125E
Abs, Beta, Transm
FC2125E
Abs, Delta, Recv
FC4250E
Abs, Delta, Recv
FC4250E
Norm, Beta, Transm
OC12/STM4
622.08 Mb/s
FC266 Optical
265.6 Mb/s
FC2125 Optical
2.125 Gb/s
FC266E Elec.
265.6 Mb/s
FC1063E
Norm, Delta, Transm
FC1063E
Abs, Gamma, Transm
FC2125E
Norm, Beta, Transm
FC2125E
Abs, Delta, Transm
FC2125E
Abs, Gamma, Recv
FC4250E
Abs, Delta, Transm
FC4250E
Norm, Delta, Transm
OC48/STM16
2.4883 Gb/s
FC531 Optical
531.2 Mb/s
FC531E Elec.
531.2 Mb/s
FC1063E
Norm, Gamma,
Transm
FC1063E
Abs, Beta, Recv
FC2125E
Norm, Delta, Transm
FC2125E
Abs, Gamma, Transm
FC4250E
Abs, Beta, Recv
FC4250E
Abs, Gamma, Recv
FC4250E
Norm, Gamma,
Transm
38
Serial Mask Testing & Serial Pattern Trigger User Manual
Appendix A: Supported Mask Types and Standards
Table 10: InfiniBand masks
None 2.5 Optical 2.5 Gb/s 2.5 Electrical 2.5 Gb/s
Table 11: Serial ATA m asks
None G1 Tx 1.5 Gb/s G1 Rx 1.5 Gb/s
G2 Tx 3.0 Gb/s G2 Rx 3.0 Gb/s
Table 12: USB 1.1/2.0 masks
None FS 12 Mb/s HS:T1 480 Mb/s HS:T2 480 Mb/s
HS:T3 480 Mb/s HS:T4 480 Mb/s HS:T5 480 Mb/s HS:T6 480 Mb/s
Table 13: 1394b masks
None S400b T1
491.5 Mb/s
S800b T1
983.0 Mb/s
S1600b T2
1.966 Gb/s
S800b T2
983.0 Mb/s
S1600β Optical
1.966 Gb/s
Table 14: Rapid IO LP-LVDS masks
None Drv
500 Mb/s
Drv
1.5 Gb/s
Ext Drv
1.0 Gb/s
Rcv
750 Mb/s
Drv
2.0 Gb/s
Ext Drv
1.5 Gb/s
Rcv
1.0 Gb/s
S400b T2
491.5 Mb/s
S800β Optical
983.0 Mb/s
Drv
750 Mb/s
Ext Drv
500 Mb/s
Ext Drv
2.0 Gb/s
Rcv
1.5 Gb/s
S400β Optical
491.5 Mb/s
S1600b T1
1.966 Gb/s
Drv
1.0 Gb/s
Ext Drv
750 Mb/s
Rcv
500 Mb/s
Rcv
2.0 Gb/s
Table 15: Rapid IO Serial masks
None RIO Serial
1.25 Gb/s
Serial Mask Testing & Serial Pattern Trigger User Manual
RIO Serial
2.5 Gb/s
RIO Serial
3.125 Gb/s
39
Appendix A: Supported Mask Types and Standards
Table 16: IOF masks
None SFI/SPI-5 TA Data
2.488 Gb/s
SFI/SPI-5 TC Clock
2.488 Gb/s
SFI/SPI-5 RD Clock
2.488 Gb/s
SFI/SPI-5 TC Clock
3.125 Gb/s
SFI/SPI-5 RD Clock
3.125 Gb/s
SFI/SPI-5 RB Data
2.488 Gb/s
SFI/SPI-5 TA Data
3.125 Gb/s
SFI/SPI-5 RB Data
3.125 Gb/s
VSR OC192/STM64
1.24416 Gb/s
Table 17: PCI-Express masks
None PCI-Express Transm
2.5 Gb/s
Table 18: SAS masks
None SAS IR
1.5 Gb/s
SAS IR AASJ
1.5 Gb/s
SAS IR
3.0 Gb/s
SAS CR AASJ
3.0 Gb/s
SAS CR AASJ
1.5 Gb/s
SAS CR
3.0 Gb/s
SAS XR AASJ
3.0 Gb/s
SFI/SPI-5 TC Data
2.488 Gb/s
SFI/SPI-5 RD Data
2.488 Gb/s
SFI/SPI-5 TC Data
3.125 Gb/s
SFI/SPI-5 RD Data
3.125 Gb/s
TFI-5
2.488 Gb/s
PCI-Express Recv
2.5 Gb/s
SAS CR
1.5 Gb/s
SAS XR AASJ
1.5 Gb/s
SAS XR
3.0 Gb/s
SAS SATA
3.0 Gb/s
SFI/SPI-5 TA Clock
2.488 Gb/s
SFI/SPI-5 RB Clock
2.488 Gb/s
SFI/SPI-5 TA Clock
3.125 Gb/s
SFI/SPI-5 RB Clock
3.125 Gb/s
TFI-5
3.1104 Gb/s
SAS XR
1.5 Gb/s
SAS SATA
1.5 Gb/s
SAS IR AASJ
3.0 Gb/s
40
Serial Mask Testing & Serial Pattern Trigger User Manual
Appendix B: Supported Communication Trigger Codes and Standards
Tables 19 through 26 list all supported communication trigger standards. Note
that HDB3, B3ZS, B6ZS, and B8ZS are considered to be subsets of the AMI
code set.
NOTE. The communications trigger standards available for an instrument
depend on the bandwidth and/or configuration of that instrument.
Table 19: AMI trigger standards
Custom 32Mb
32.064 Mb/s
DS1A
2.048 Mb/s
DS2 Rate Coax
6.312 Mb/s
E3
34.368 Mb/s
DS1C
3.152 Mb/s
DS3
44.736 Mb/s
STS-1
51.84 Mb/s
Table 20: B3ZS trigger standards
Custom DS3
44.736 Mb/s
Table 21: B6ZS trigger standards
Custom DS2
6.312 Mb/s
97Mb
97.728 Mb/s
DS2
6.312 Mb/s
E1
2.048 Mb/s
STS-1
51.84 Mb/s
DS2RateSym
6.312 Mb/s
DS1
1.544 Mb/s
DS2RateSym
6.312 Mb/s
E2
8.448 Mb/s
Table 22: B8ZS trigger standards
Custom DS1
1.544 Mb/s
Serial Mask Testing & Serial Pattern Trigger User Manual
DS1C
3.152 Mb/s
DS2 Rate Coax
6.312 Mb/s
41
Appendix B: Supported Communication Trigger Codes and Standards
Table 23: CMI trigger standards
Custom DS4NA
139.26 Mb/s
STM1E
155.52 Mb/s
STS-3
155.52 Mb/s
Table 24: HDB3 trigger standards
Custom E1
2.048 Mb/s
E3
34.368 Mb/s
DS1A
2.048 Mb/s
Table 25: MLT3 trigger st andards
Custom 100Base-TX
125 Mb/s
Table 26: NRZ trigger standards
E4
139.26 Mb/s
STM-0 CMI
51.84 Mb/s
E2
8.448 Mb/s
STM-0 HDBx
51.84 Mb/s
Custom 2.5 IBand
2.5 Gb/s
FC266
265.6 Mb/s
FC4250
4.25 Gb/s
G3 ATA
6.0 Gb/s
OC3/STM1
155.5 Mb/s
PCI-Express
2.5 Gb/s
RapidIO 1.5G
1.5 Gb/s
RIO Serial 3G
3.125 Gb/s
SFI/SPI-5 2.5G
2.5 Gb/s
VSR OC192
1.244 Gb/s
FC531
531.2 Mb/s
FS USB
12 Mb/s
GB Ethernet
1.25 Gb/s
OC12/STM4
622.1 Mb/s
RapidIO 500M
500 Mb/s
RapidIO 2.0G
2.0 Gb/s
S400b
491.5 Mb/s
SFI/SPI-5 3.1G
3.1 Gb/s
XAUI
3.125 Gb/s
EFU
125.0 Mb/s
FC1063
1.0625 Gb/s
G1 ATA
1.5 Gb/s
HS USB
480 Mb/s
OC48/STM16
2.488 Gb/s
RapidIO 750M
750 Mb/s
RIO Serial 1G
1.25 Gb/s
S800b
983.0 Mb/s
TFI-5 2.5G
1.488 Gb/s
FC133
132.8 Mb/s
FC2125E
2.125 Gb/s
G2 ATA
3.0 Gb/s
OC1/STM0
51.84 Mb/s
OC48-FEC
2.666 Gb/s
RapidIO 1.0G
1.0 Gb/s
RIO Serial 2G
2.5 Gb/s
S1600b
1.966 Gb/s
TFI-5 3.1G
3.11 Gb/s
42
Serial Mask Testing & Serial Pattern Trigger User Manual
Appendix C: Automatic Communication Signal
y
p
y
p
ExtinctionRatiodBTheratioofeyetoptobaseindB
ygy
g
y
y
ppg
j
P
P
use
r
pgp
y
o
r
Measurements
Table 27 lists the automatic communication signal measurements that are part of
the Serial Mask Testing features.
Table 27: Supported communications measurements and their definition
Name Definition
Ext Ratio The ratio of eye top to base.
Ext Ratio = PTop
mean
/PBase
mean
Extinction Ratio % The ratio of eye base to top in %.
Ext Ratio % = 100*(PBase
mean
/PTop
mean
)
.
Ext Ratio dB = 10*Log(PTop
mean
/PBase
mean
)
Eye Height The eye height in watts or volts.
Eye Height = (PTop
mean
-- 3*PTop
sigma
) -- (PBase
mean
+ 3*PBase
sigma
)
Eye Width The eye width in seconds.
Eye Width = (TCross2
mean
-- 3*TCross2
) -- (TCross1
sigma
mean
+ 3*TCross1
sigma
Crossing % The eye crossing point as a percentage of eye height.
Crossing % = 100*[(PCross1
mean
-- PBase
mean
)/(PTop
mean
-- PBase
mean
)]
Eye Top The top of the eye.
Eye Base The base of the eye.
Jitter Pk- Pk The peak-to-peak value for the edge jitter in the current horizontal units.
Jitter PP = TCross1
Jitter RMS The RMS value of the edge jitter in the current horizontal units.
Jitter RMS = TCross1
sigma
Jitter 6σ 6 x (Jitter RMS)
Noise Pk-Pk The peak-to-peak value of the noise of the top or base of the signal as specified by the
.
)
Noise Pk--Pk = PTop
pk--pk or
PBase
pk--pk
Noise RMS The RMS value of the noise of the top or base of the signal as specified by the user.
Noise RMS = PTop
Serial Mask Testing & Serial Pattern Trigger User Manual
sigma
PBase
sigma
43
Appendix C: Automatic Communication Signal Measurements
bytheuser
percentoftheeyeperiod
y
y
Table 27: Supported communications measurements and their definition (Cont.)
Name Definition
S/N Ratio Ratio of the signal amplitude to the noise of the top or base of the signal as specified
.
S/N Ratio = (PTop -- PBase)/(PTop
DutyCycleDistortion The peak-to-peak time variation of the 1st eye crossing measured at the MidRef as a
.
DCD (sec) = 100% x TDCD
Quality Factor Ratio of eye size to noise.
Quality Factor = (PTop
mean
Levels Used in Taking Eye Measurements
All eye-diagram measurements are based on the power level, the voltage level, or
the time locations of edges within each acquisition.
Figure 5 shows an eye-diagram and the areas from which values are taken that
are used to calculate measurements.
TCross
1
/(TCross2
p--p
-- PBase
sigma
mean
or PBase
-- TCross2
mean
)/(PTop
PTop
sigma
sigma
)
mean
+ PBase
TCross
)
)
sigma
2
PCross
1
PBase
Eye
Aperture
PCross
2
Figure 5: Eye-diagram and optical values
44
Serial Mask Testing & Serial Pattern Trigger User Manual
Appendix C: Automatic Communication Signal Measurements
P Values
T1 Values
The P values include the mean and standard deviation of the vertical location of
PTop and PBase. These areas are used with a specified sample size to statistically measure the following values:
H PTop
H PTop
H PTop
H PBase
H PBase
H PBase
1
The Eye Aperture defaults to the center 20% of the interval from TCross1to TCross2.
, the mean value of PTop
mean
, the standard deviation of PTop
sigma
, the vertical peak-to-peak deviation of PTop
pk-pk
, the mean value of PBase within the Eye Aperture
mean
, the standard deviation of PBase within the Eye Aperture
sigma
, the vertical peak-to-peak deviation of PBase
pk-pk
1
1
The T1 values are vertical and horizontal values associated with the leftmost
crossing point. These areas are used to establish the following directions:
H TCross1
H TCross1
at TCross
, the horizontal mean of the left crossing point at TCross
mean
, the horizontal standard deviation of the left crossing point
sigma
1
1
T2 Values
DCD Values
H TCross1
at TCross
H PCross1
, the horizontal peak-to-peak deviation of the left crossing point
pk-pk
1
, the vertical mean of the left crossing point at PCross
mean
1
The T2 values are vertical and horizontal values associated with the rightmost
crossing point. These areas are used to establish the following directions:
H TCross2
H TCross2
at TCross
H TCross2
point at TCross
, the horizontal mean of the right crossing point at TCross
mean
, the horizontal standard deviation of the right crossing point
sigma
2
, the horizontal peak-to-peak deviation of the right crossing
pk-pk
2
2
The duty cycle distortion (DCD) values are horizontal values associated with the
rightmost crossing point at 50% of the eye height. These areas are used to
establish the DCD
, the horizontal peak-to-peak deviation of the left crossing
pk-pk
point at half the height of the eye.
Serial Mask Testing & Serial Pattern Trigger User Manual
45
Appendix C: Automatic Communication Signal Measurements
46
Serial Mask Testing & Serial Pattern Trigger User Manual
Index
A
Address, Tektronix, v
Automatic measurements
levels used in taking, 44
reference levels defined (eye pattern/optical), 45
C
Comm trigger, 30
Communication trigger codes supported, 41
Communication trigger standards supported, 41
AMI, 41
B3ZS, 41
B6ZS, 41
B8ZS, 41
CMI, 42
HDB3, 42
ML T3, 42
NRZ, 42
Communications trigger, 30
accessing, 6
accessing the control window, 34
applying the serial pattern data, 36
binary format, 36
bit rate, 31, 35
clock source, 35
code type, 31
control window access, 30
display format, 36
edit controls, 36
edit the serial trigger pattern, 36
format, 36
functions, 6
hexadecimal format, 36
key points, 33
level, 35
mask testing, 23
phase lock loop, 33
polarity, 35
pulse form, 32
recovered clock, 31, 33, 35
recovered clock key points, 33
selecting, 30
selecting a code, 35
selecting a data source, 35
selecting a source, 30
selecting a standard, 31, 35
selecting a trigger, 34
selecting a type, 31
serial data, 35
serial data pattern, 36
serial pattern data, 36
threshold level, 35
threshold levels, 32
view the trigger pattern, 36
Contacting Tektronix, v
Crossing %, 43
Cycle Distortion, 44
D
Description, product, 1
Duty Cycle Distortion, 44
E
Extinction Ratio, 43
Extinction Ratio %, 43
Extinction Ratio DB, 43
Eye Base, 43
Eye Height, 43
Eye Top, 43
Eye Width, 43
G
Getting started, 1
I
Installation, 3
J
Jitter 6 sigma, 43
Jitter Pk-Pk measurement, 43
Jitter RMS, 43
K
Key features, 2
Serial Mask Testing & Serial Pattern Trigger User Manual
47
Index
M
Manual structure, iii
Manuals, related, iii
mask standards supported, 37
Mask testing, 1, 9
access the setup window, 17, 21, 22
accessing, 5
accessing the edit window, 19
adding a mask vertex, 20, 24
aligning the mask and signal, 26
aligning waveform and mask, 12
autofit, 12, 13
autofit and persistence interaction, 28
autoset, 11, 12
autoset parameters, 12
AUX OUT, 14
bandwidth, 29
beep, 14
Bessel--Thompson, 29
bit rate, 29
both polarities, 15
changing the tolerance, 26
completion, 14
control window functions, 5
copy a current mask, 18
create new mask segment, 24
creating a new mask, 23
creating a user mask, 17
creating an empty mask, 23
deleting a mask vertex, 20
display configuration, 12
display parameters, 12
easier to pass, 13
edit new mask segment, 24
edit user mask, 24
editing a user mask, 19
enable mask edit controls, 19
example, 25
failure, 14
functions, 5
harder to pass, 13
hookup, 25
image rescaling, 12
instrument settings, 25
interactions, 28
key points, 28
key points, optical, 29
log date, 14
margin tolerance, 13, 28
margins, 13, 28
mask hits, 28
mask type, 11
masks directory, 22
moving a mask vertex, 20
negative polarity, 15
number of waveforms to test, 14
O/E out to CH1 adapter, 29
optical, 29
pass and fail parameters, 14
polarity, 15
positive polarity, 15
print, 14
recall mask dialog, 22
recalling a user mask from disk, 22
received data, 29
recovered clock, 29
reference receiver, 29
reference receivers, 29
repeat, 15
reset, 16
results, 16
results viewing, 27
running, 16
samples to test, 14
save mask as dialog, 21
save waveform, 14
saving a user mask, 18
saving a user mask to disk, 21
segments, 24
segments and mask hits, 28
selecting a mask segment, 19
selecting a mask standard, 17
selecting a mask vertex, 19
selecting the mask type, 17
selecting the source, 26
setting instrument settings, 23
setup, 10, 27
setup window, 10
signal source, 10
SRQ, 14
standard, 11, 17
standards and bandwidth, 29
start testing, 16
stop test, 16
summary, 16
system bandwidth, 29
tolerance, 13, 26, 28
triggers, 27
vertex adding, 24
vertices, 28
waveform autofit, 13
waveform resizing, 12
Mask types
1394b, 39
ANSI T1.102, 37
48
Serial Mask Testing & Serial Pattern Trigger User Manual
Index
Ethernet, 37
Fibre Channel, 38
Fibre Channel Electrical, 38
InfiniBand, 39
IOF, 40
ITU--T, 37
PCI--Express, 40
Rapid IO LP--LVDS, 39
Rapid IO Serial, 39
SAS, 40
Serial ATA, 39
SONET/SDH, 38
USB 1.2/2.0, 39
Mask types supported, 37
Measurement
accessing, 7
comm, 7
Crossing %, 43
definitions, 43
Duty Cycle Distortion, 44
Extinction Ratio, 43
Extinction Ratio %, 43
Extinction Ratio DB, 43
Eye Base, 43
Eye Height, 43
Eye Top, 43
Eye Width, 43
functions, 7
Jitter 6 sigma, 43
Jitter Pk-Pk, 43
Jitter RMS, 43
mask, 7
Noise Pk-Pk, 43
Noise RMS, 43
Quality Factor, 44
S/N Ratio, 44
Measurements, 43
eye measurement levels, 44
levels used in taking, 44
reference levels defined (eye pattern/optical), 45
supported, 43
N
Product support, contact information, v
Q
Q Factor, 44
Quality Factor, 44
R
Recovered clock, 29, 31, 33, 35
key points, 33
Reference, 9
Reference receivers, 29
Related manuals, iii
S
S/N Ratio, 44
Serial pattern trigger, 34
setup, 34
Serial trigger, 3, 34
accessing, 8
bit rate, 8
clk level, 8
clk polarity, 8
clk src, 8
coding, 8
control window, 8
data level, 8
data src, 8
editor, 8
format, 8
functions, 8
key features, 3
standard, 8
Service support, contact information, v
T
Technical support, contact information, v
Tektronix, contacting, v
Noise Pk-Pk measurement, 43
Noise RMS, 43
P
Phone number, Tektronix, v
Preface, iii
Product description, 1
Serial Mask Testing & Serial Pattern Trigger User Manual
U
URL, Tektronix, v
W
Web site address, Tektronix, v
49
Index
50
Serial Mask Testing & Serial Pattern Trigger User Manual
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