Tektronix 8007 Instruction Manual

Model 8007
Semiconductor Test Fixture
Instruction Manual
Contains Operating and Servicing Information
WARRANTY
Keithley Instruments, Inc. warrants this product to be free from defects in material and workmanship for a period of I year from date of shipment.
Keithley Instruments, Inc. warrants the following items for 90 days from the date of shipment: probes, cables, rechargeable batteries, diskettes, and documentation.
During the warranty period, we will, at our’option, either repair or replace any product that proves to be defective,
To exercise this warranty, write or call your local Keithley representative, or contact Keithley headquarters in Cleveland, Ohio. You will he given prompt assistance and return instructions. Send the product, transportation prepaid, to the indicated service facility. Repairs will be made and the product returned, transportation prepaid. Repaired or replaced products are warranted for the balance of the original warranty period, or at least 90 days.
LIMITATION OF WARRANTY
This warranty does not apply to defects resulting from product modification without Keithley’s express written consent, or misuse of any product or part. This warranty also does not apply to fuses, software, non-rechargeable batteries, damage from battery leakage, or problems arising from normal wear or failure to follow instructions.
THIS WARRANTY IS IN LIEU OF ALL OTHER WARRANTIES, EXPRESSED OR IMPLIED, INCLUDING ANY IMPLIED WARRANTY OF MERCHANTABILITY OR FITNESS FOR A PARTICULAR USE. THE REMEDIES PRO­VIDED HEREIN ARE BUYER’S SOLE AND EXCLUSIVE REMEDIES.
NEITHER KEITHLEY INSTRUMENTS, INC. NOR ANY OF ITS EMPLOYEES SHALL BE LIABLE FOR ANY DIRECT, INDIRECT, SPECIAL, INCIDENTAL OR CONSEQUENTIAL DAMAGES ARISING OUT OF THE USE OF ITS INSTRUMENTS AND SOFTWARE EVEN IF KEITHLEY INSTRUMENTS, INC., HAS BEEN ADVISED IN ADVANCE OFTHE POSSIBILITY OF SUCH DAMAGES. SUCH EXCLUDED DAMAGES SHALL INCLUDE, BUT ARE NOT LIM­ITED TO: COSTS OF REMOVAL AND INSTALLATION, LOSSES SUSTAINED AS THE RESULT OF INJURY TO ANY PERSON, OR DAMAGE TO PROPERTY.
Model 8007
Semiconductor Test Fixture
Instruction Manual
01989, Keith@ Instruments, Inc.
All rights reserved.
Cleveland, Ohio, U.S.A.
Second Printing, October 2000
Document Number: 8007-901-01 Rev. B
Manual Print History
The print history shown hclow lists the printing dates of all Revisions and Addenda created for this manual. The Revision Level letter increases alphabetically as the manual undergoes subsequent updates. Addenda, which are released between Revisions, contain important change information that the user should incorporate immediately into the manual. Addenda are numbered sequentially. When a new Revision is crcatcd, all Addenda associated with the previous Revision of the manual arc incorporated into the new Revision of the manual. Each new Revi­sion includes a revised copy of this print history page.
Revision A (Document Number 8007-901-01) . Janunry 1989
Addendum A (Document Number 8007-901-02) .._....,,,,,,,,,,,,,,,,,,,,,,,,,.,,,,,....,. Mnrch 1989
Revision B (Document Number X007-901-01) October2000
SAFETY PRECAUTIONS
The following safety precautions should be observed before using the Model 8007 and the associated instruments.
This test fixture is intended for use by qualified personnel who recognize shock hazards and are familiar with the safety precautions required to avoid possible injury. Read over this manual carefully before using the test fixture.
Exercise extreme caution when a shock hazard is present at the test fixture. User-supplied lethal voltages may be present on the fixture or the connector jacks. The American National Standards Institute (ANSI) states that R shock hazard exists when voltage levels greater than 30V RMS or 42.4V peak are present. A good safety practice is to expect that hazardous voltage is present in any unknown circuit before measuring.
Inspect the connecting cables and test leads for possible wear, cracks, or breaks before each use
For maximum safety, do not touch the test fixture, test cables or any instruments while power is applied to the circuit under test. Turn off the power and discharge any capacitors before connecting or disconnecting cables from the test fix-
ture. Also, keep the test fixture lid closed while power is applied to the device under test. Safe operation requires the use of the lid interlock (see paragraph 22.1).
Do not touch any object which could provide a current path to the common side of the circuit under test or power line (earth) ground. Always make measurements with dry hands while standing on a dry, insulated surface capable of with­standing the voltage being measured.
Do not exceed the maximum signal levels of the test fixture, as defined in the specifications and operation section of this manual.
Connect the fixture
Instrumentation and accessories should not be connected to humans.
0 = screw terminal to safety earth ground using #18 AWG or larger wire (supplied accessory).
Safety Precautions
The following safety precautions should be observed before using
this product and any associated instrumentation. Although some
instruments and accessories would normally be used with non­hazardous voltages, there are situations where hazardous conditions may be present.
This product is intended for use by qualified personnel who recog­nize shock hazards and are familiar with the safety precautions re-
quired to avoid possible injury. Read the operating infomntion
carefully before using the product. The types of product users are: Responsible body is the individual or group responsible for the use
and maintenance of equipment, for ensuring that the equipment is operated within its specifications and operating limits, and for en-
suring that operators are adequately trained.
Operators use the product for its intended function. They must be
trained in electrical safety procedures and proper use of the instru-
ment. They must be protected from electric shock and contact with
hazardous live circuits.
Maintenance personnel perform routine procedures on the product
to keep it operating, for example, setting the line voltage or replac-
ing consumable materials. Maintenance procedures are described in the manual. Tbe procedures explicitly state if the operator may per­form them. Otherwise, they should be performed only by service
pW3tlllti
Service personnel arc trained to work on live circuits, and
safe installations and repairs of products. Only properly trained ser-
vice personnel may perfoorm installation and service procedures.
perform
Users of this product must be protected from electric shock at all times. The responsible body must enwre that users are prevented access and/or insulated from every connection point. In home cases, connections must be exposed to potential human contact. Product users in these circumstances most be trained to protect themselves from the risk ofelectric shock. If the circuit is capable of operating at or above IO00 volts, no conductive part of the circuit may be CQXXXi.
As described in the International Electrotechnical Commission (IEC) Standard IEC 664, digital multimeter measuring circuits (e.g.. Keithley Models 175A, 199,2000,2001,2002, and 2010) are Installation Category Il. All other instruments’ signal temtinals are Installation Category I and must not be connected to mains.
Do not connect switchingcards directly tounlimited power circuits. They are intended to be used with impedance limited sources. NEVER connect switching cards directly to AC mains. When coo­netting sources to switching cards, install protective devices to lim­it fault current and voltage to the card.
Before operating an instrument. make sore the line cord is connect­ed to a properly grounded power receptacle. Inspect the connecting cables, test leads, and jumpers for possible wear, cracks, or breaks before each use.
For maximum safety, do not touch the product, test cables, or any other instruments while power is applied to the circuit under test. ALWAYS remove power from the entire test system and discharge
any capacitors before: connecting or disconnecting cables or jump­ers, installing or removing switching cards, or making internal changes, such as installing or removing jumpers.
Exercise extreme caution when a shock hazard is present. Lethal
voltage may be present on cable connector jacks or test fixtures. The
American National Standards btstitute (ANSI) states that a shock
hazard exists when voltage levels greater than 30V RMS, 42.4V
peak, or 60VDC are present. A good safety practice is to expect that hazardous voltage is present
in
any
unknown
circuit
before
measuring.
Do not touch any object that could provide a current path to the common side of the circuit under test or power line (earth) ground.
Always make measttrement8 with dry hands while standing on a dry, insulated surface
measured.
capable
of withstanding the voltage being
The instrument and accessories must be used in accordance with its specifications and operating instructions or the safety of the equip ment may be impaired.
The WARNING heading in a manual explains dangers that might result in personal injury or death. Always read the associated infor­mation very carefully before performing the indicated procedure.
Do not exceed the maximum signal levels of the instruments and ac­cessories. as defined in the specifications and operating informa-
tion, and as shown on the instrument or test fixture panels, or switching card.
When fuses are used in a product, replace with same type and rating for continued protection against fire hazard.
Chassis connections must only be used as shield connections for
measuring circuits, NOT as safety earth ground connections. If you are using a test fixture, keep the lid closed while power is ap-
plied to the device under test. Safe operation requires the use of a
lid interlock. ,fa@
wire recommended in the user documentation.
Then fer to the operating instructions located in the manual.
Then
sore 1000 volts or more, including the combined effect of normal and common mode voltages. Use standard safety precautions to avoid personal contact with these voltages.
screw is present. connect it to safety earth ground using the
symbol on an instrument indicates that the user should re-
symbol on an instrument shows that it can source or mea-
The CAUTION heading in a manual explains hazards that could damage the instrument. Such damage may invalidate the warranty.
instrumentation and accessories shall not be connected to humans.
Before performing any maintenance, disconnect the line cord and all test cables.
To maintain protection from electric shock and iirc, replacement components in mains circuits, including the power transformer, test leads, and input jacks, must be purchased from Keithley Instm­merits. Standard fuses, with applicable national safety approvals, may be used if the rating and type are the same. Other components that are not safety related may be purchased from other suppliers as loog as they are equivalent to the original component. (Note that se­lected parts should be purchased only through Keithley Instruments to maintain accuracy and functionality of the product.) If you are tmsore about the applicability of a replacement component, call a Keithley Instruments oflice for information.
To clean an instrument. use a damp cloth or mild, water based cleaner. Clean the cxterior of the instrument only. Do not apply cleaner directly to the instrument or allow liquids to enter or spill on the instrument. Products that consist of a circuit board with no case or chassis (e.g., data acquisition board for installation into a computer) should never require cleaning if handled according to in­structions. If the board becomes contaminated and operation is af­fected, the board should be returned to the factory for proper cleaning/servicing.
Rev. 10199
Specifications
DEVICE SOCKET CONFIGURATION: 1 each, 24- and 48-pin gold contact DIP
sockets (0.100 in. pin spacing, 0.300 to 0.600 in. wide, zero insertion force, replaceable).
CONNECTOR ,TYPE: 6 mass termination connectors (12 coaxial connections each, 72
total measurement pathways).
MAXIMUM SIGNAL VOLTAGE: ZOOV peak, signal or guard to any signal, guard, sub-
chassis, or chassis. MAXIMUM SIGNAL CURRENT: 1A peak. OFFSET CURRENT (18’C-ZS’C, ~60% R.H.): <1 pA (0.1 pA typical @ ~40% R.H.). PATH ISOLATION (ltl’=C -28’C, < 60% R.H.):
Resistance: >lTQ (1OTQ typical @I <40% R.H.).
Capacitance (nominal): 2pF. CROSSTALK @ 1MHz (typical): -6OdB (5Oa scurce and measure). 3 dB BANDWIDTH (typical): 4MH.z (5On source and measure). INSERTION LOSS @ 1MHz (typical): O.ldB (50.Q source and 1 MQ measure). PATH RESISTANCE: <la. ENVIRONMENT:
Operating: 0°C to 5O”C, <SO% non-condensing R.H. up to 35’C.
Storage: -25°C to t7O”C.
GENERAL:
Socket Operating Life: >25,000 open-close cycles.
Lid Interlock Switching: <28VDC, 50mA.
Dimensions, Weight: 140mm high x 305mm wide x 292mm deep (5.5 in. x 12 in. x
11.5 in.). Net weight 3.5kg (7 Ibs., 12 oz.).
ACCESSORIES SUPPLIED:
Instruction manual
Model 8007-MTC-3:
Model 8007-PTB:
Model 8007-GND-3:
Model 236~ILC-3: ACCESSORIES AVAILABLE:
Model 8007-MTC-3:
Model 8007~PTB: Prototyping PC board
Model 236-ILC-3: Interlock cable, 3m (loft.1
3-lug triax to mass termination connector cable assembly, 3m (IO ft.), two supplied Prototyping PC board Safety grounding cable Interlock cable, 3m (10 ft.)
3-1~s hiax to mass termination connector cable assemblv, 3m rloft.)
Specifications are for guarded measurement configuration, including external cables. Prices and specifications subject to change without notice.
HOW TO USE THIS MANUAL
Contains information on Model 8007 features, specifica­tions, and accessories.
Outlines test fixture connections and sockets, and details how to connect the fixture to instruments for typical device tests.
Contains performance verification and cleaning procedures for the test fixture, as well as interlock switch adjustment.
Lists replacement parts, and also includes component layout and schematic drawings for the Model 8007.
SECTION 1
General Information
SECTION 2
Operation
SECTION 3
Service Information
SECTION 4
Replaceable Parts
Table of Contents
SECTION 1 - General Information
1.1 INTRODUCTION
1.2 FEATURES .
1.3 WARRANTY INFORMATION
1.4 MANUAL ADDENDA
1.5 SAFETY SYMBOLS AND TERMS
1.6
1.7 UNPACKING AND INSPECTION
1.7.1
1.72 Shipment Contents
1.7.3
1.8 REPACKING FOR SHIPMENT
1.9
SECTION 2 - Operation
SPECIFICATIONS
Inspection for Damage
Instruction Manual
OPTIONAL ACCESSORIES
2.1
2.2
2.2.1
2.2.2
2.2.3
2.3
2.4
2.4.1
2.4.2
2.4.3
2.4.4
2.4.5
2.5
2.5.1
2.5.2
2.5.3
2.54
2.5.5
2.5.6
2.57
2.5.8
2.5.9
2.5.10
2.5.11
2.5.12
2.5.13
2.5.14
2.5.15
INTRODUCTION FIXTURE CONFIGURATION
RearPanel .......................
Front Panel. ......................
Sub Chassis Guarding
MATRIXCARDCONNECTIONS ......................................................
TYPICAL INSTRUMENT CONNECTIONS
Adapters Source Measure Unit DMM (Digital Multimeter) Electrometer SourceConnections
MEASUREMENT CONSIDERATIONS
Path Isolation Keeping Connectors and Sockets Clean Shielding
Guarding .......................................................................... 2-18
CableNoiseCurrents MagneticFields RadioFrequencyInterference
GroundLoops .....................................................................
Capacitance Considerations Device Oscillation Environmental Considerations Vibration Low Current and Low Voltage Measurements Cumulative Power AC Measurements
..........................................................................
..........................................................................
..........................................................................
..................
........
............................................................... 2-6
................................................................
...........................................................
.......................................................................
.................................................................
......................................................................
...............................................................
....................................................................
........................................................
..........................................................
..................................................................
.......................................................
..................................................................
.................................................................. 2-24
................................................. 2-l
.................................................
.................................................
.................................................
..............................................
..................................................
................................................
..........................................
2-1 2-l 2-5
2-7 2-7 2-9 2-11 2-11 2-14 2-14
2.17 2-17
2-18 2-18
2-20 2-20 2-21 2-21 2-22 2-22 2-24 2-24 2-24 2-24
2.6
2.6.1
2.6.2
2.6.3
2.7
2.7.1
2.7.2
2.7.3
2.7.4
2.7.5
TYPICAL APPLICATIONS ...............................
CVMeasurements .....................................
FETTesting ...........................................
Semiconductor Parameter Analysis
USING THE I’ROTOTYPING BOARD
Board Wiring .........................................
Board Cleaning .......................................
Board Installation .....................................
Prototyping Board Considerations Wiring Kelvin Connections on the Prototyping Board
SECTION 3 - Service Information
......................
.....................
.......................
......
..........
..........
.......... 2-28
..........
.......... 2-31
.......... 2-31
.......... 2-31
.......... 2-32
.......... 2-32
..........
2-25 2-25
2-29
2-32
3.1
3.2
3.2.1
3.2.2
3.2.3
3.2.4
3.2.5
3.2.6
3.2.7
3.3
3.3.1
3.3.2
3.4
3.4.1
3.4.2
3.5
3.6
3.7
3.7.1
3.7.2
3.7.3
3.7.4
INTRODUCTION ............................
PERFORMANCE VERIFICATION ..............
Environmental Conditions ...................
Recommended Test Equipment. ..............
Performance Record ........................
Isolation Resistance Verification ..............
Offset Current Verification ...................
Path Resistance Verification ..................
ACPerformance ...........................
HANDLING AND CLEANING PRECAUTIONS
Board Handling and Cleaning ................
Connector Cleaning. ........................
DISASSEMBLY ..............................
Fixture Disassembly ........................
Sub Chassis Disassembly ....................
INTERLOCK SWITCH CALIBRATION
PATHWAY MODIFICATION ..................
BINDING POST INSTALLATION ..............
Supplied Binding Posts ......................
Installation Procedure .......................
Binding Post Wiring ........................
Sub Chassis Installation .....................
.........
......
...... 3-1
......
...... 3-1
...... 3-2
...... 3-2
...... 3-4
...... 3-5
......
...... 3-7
...... 3-8
...... 3-8
......
......
...... 3-9
......
......
...... 3-11
......
...... 3-12
...... 3-12
...... 3-12
3-1
3-1
3-6
3-8
3-8
3-9 3-10
3-11
SECTION 4 - Replaceable Parts
4.1
4.2
4.3
4.4
4.5
INTRODUCTION .............................................................
PARTS LIST ..................................................................
ORDERING INFORMATION ...................................................
FACTORY SERVICE ...........................................................
COMPONENT LAYOUT AND SCHEMATIC DIAGRAM
...........................
...... 4-1
...... 4-l
......
...... 4-1
...... 4-1
4-1
SECTION 2 - Operation
List of Illustrations
Figure 2-l Figure 2-2 Figure 2-3 Figure 2-4 Figure 2-5 Figure 2-6
Figure 2-7 Figure 2-8 Figure 2-9
Figure 2-10
Figure 2-11 Figure 2-12 Figure 2-13 Figure 2-14 Figure 2-15
Figure 2-16 Figure 2-17 Figure 2-18 Figure 2-19 Figure 2-20 Figure 2-21 Figure 2-22 Figure 2-23 Figure 2-24
Figure 2-25 Figure 2-26
Figure 2-27 Figure 2-28 Typical Common-Source FET IV Characteristics Figure 2-29
Figure 2-30
Figure 2-31
Figure 2-32
Figure 2-33
Figure 2-34
Model8007RearPanel ............................................................
Safety Interlock Connections
Input/OutputEquivalentCircuit ...................................................
Front Panel ......................................................................
Example of Sub Chassis Guarding Matrix Card Connection Example Adapters Required for Connections Source Measure Unit Connections
DMMConnections ...............................................................
Electrometer Connections
Voltage Source Connections Current Source Connections Path Isolation Resistance Voltage Attenuation by Path Isolation Resistance
ShieldingExample ................................................................
GuardedCircuit ..................................................................
Typical Guarded Signal Connections
Power Line GroundLoops .........................................................
Eliminating Ground Loops 5pe #73 Material, Impedance vs. Frequency Type #43 Material, Impedance vs. Frequency Without Leads. Type #43 Material, Impedance vs. Frequency With Leads.
CVTestSystem ..................................................................
Typical High Frequency CV Curve Generated by Model 590
Typical Quasistatic CV Curve Generated by Model 595
FETTestSystem ..................................................................
System Connections for JFET Test
Semiconductor Parameter Analysis Switching System Current Gain Test Configuration
Prototyping Board ................................................................
PrototypingBoardInstallation .....................................................
KelvinConnections ...............................................................
Using Socket Jumpering to Add Kelvin Connections
.......................................................
..................................................
..................................................
................................................. 2-10
..................................................
.........................................................
........................................................
.......................................................
.......................................................... 2-17
................................................
........................................................
.........................................
...................................................
....................................................
.....................................
...........................
..............................
...........................
................................
......................................
.................................
..................................
2-2 2-3
2-5 2-6 2-7
2-8
2-12
2-13
2-14
2-15
2-16
2-18
2-19
2-19
2-20
2-21
2-21
2-23 2-23
2-23
2-25
2-26 2-27 2-28 2-29 2-29 2-30 2-31 2-32 2-33 2-33
2-33
SECTION 3 - Service Information
Figure 3-l Figure 3-2 Figure 33 Figure 3-4 Figure 3-5 Figure 3-6 Figure 3-7 Figure 3-8 Figure 3-9 Figure 3-10 Figure 3-11
Path Isolation Verification Connections Offset Current Verification Connections Path Resistance Verification Connections Connections for AC Response Tests
Sub Chassis Removal ...................
Fixture Assembly .......................
Sub Chassis Disassembly ................
Hinge Alignment .......................
Safety Interlock Switch Adjustment Examples of Pathway Modification
Binding Post Installation ................
.......
.......
.......
....
...
............
............
............ 3-6
............ 3-7
............ 3-8
............ 3-9
............
............ 3-10
............ 3-10
............ 3-11
............
3-4 3-5
3-9
3-12
SECTION 2 - Operation
List of Tables
Table 2-l Table 2-2
Input/output Numbering Supplied Ferrite Beads.
SECTION 3 - Service Information
Table 3-1 Table 3-2 Table 3-3
Recommended Test Equipment Performance Record
Supplied Binding Posts ......................
........................
SECTION 4 - Replaceable Parts
Table 4-l
Mass-terminated Connector Parts List
...............
2-4 2-22
......
......
...... 3-12
3-2 3-3
SECTION 1
General Information
1.1 INTRODUCTION
This section contains general information about the Model 8007 Semiconductor Test Fixture, and it is ar­ranged in the following manner:
1.2 Features
1.3 Warranty Information
1.4 Manual Addenda
1.5 Safety Symbols and Terms
1.6 Specifications
.
IHinged seamless lid for light-tight and Shielded meas­urements.
.
Interlocked lid for safety.
1.3 WARRANTY INFORMATION
Warranty information is located on the inside front cover of this instruction manual. Should your Model 8007 re­quire warranty service, contact the I<eithley representa­tive or authorized repair facility in your area for further information. When returning the fixture for repair, be sure to fill out and include the service form at the back of this manual in order to provide the repair facility with the necessary information.
1.7 Unpacking and Inspection
1.8 Repacking for Shipment
1.9 Optional Accessories
1.2 FEATURES
The Model 8007 Semiconductor Test Fixture provides a convenient way to connect the Model 7072 Semiconduc­tor Matrix Card to standard packaged semiconductor de­vices. The Model 8007 has two ZIF (zero insertion force) sockets to simplify connections to a variety of devices.
Key features of the Model 8007 include:
Six mass-terminated connectors located on the rear panel for connecting the fixture to the Model 7072 ma­trix card or other devices.
24.pin and 48-pin ZIF sockets for ease of connections to a variety of DIP packaged devices from 0.3” to 0.6” lead centers. Prototyping board, which plugs into the ZIF sockets, can be used for custom circuit wiring.
Guarding pathways are carried through to the ZIF socket terminals in order to maintain maximum path­way isolation.
1.4 MANUAL ADDENDA
Any improvements or changes concerning the test fix­ture or manual will be explained in an addendum in­cluded with the the unit. Be sure to note these changes
and incorporate them ilvto the manual before using or servicing the fixture.
1.5 SAFETY SYMBOLS AND TERMS
The following symbols and terms may be found on an in-
strument or used in this manual.
The A
should refer to the operating instructions located in the instruction manual.
The = symbol represents a protective grounding ter­minal. This terminal must be connected to a safety earth ground via #18 AWG minimum wire before operation.
The WARNING heading used in this manual explains dangers that might result in personal injury or death. Al­ways read the associated information very carefully be-
fore performing the indicated procedure.
symbol on an instrument indicates that the user
0
l-1
SECTION 1
GeneralInformation
The CAUTION heading used in this manual explains hazards that could damage the unit. Such damage may invalidate the warranty.
1.6 SPECIFICATIONS
Model 8007 specifications may be found at the front of this manual.
1.7 UNPACKING AND INSPECTION
1.7.1
Upon receiving the Model 8007, carefully unpack it from its shipping carton and inspect the fixture for any obvi­ous signs of physical damage. Report any such damage to the shipping agent immediately. Save the original pack­ing carton for possible future reshipment.
1.7.2
The following items are included with every Model 8007
order:
.
Model 8007 Semiconductor Test Fixture
.
Model 8007~PTB prototyping board
.
Two Model 8007-MTC-3 mass-terminated triax cable assemblies
.
Safety grounding cable (Model 8007-GND-3)
.
Safety interlock cable (Model 236~ILC-3)
.
Five 5-way binding posts
.
24 ferrite beads for device oscillation control (see para-
graph 2.5.10).
.
Model 8007 Instruction Manual
.
Additional accessories as ordered
1
7.3
If an additional instruction manual is required, order the manual package, Keithley part number 8007-901-00. The manual package includes an instruction manual and any pertinent addenda.
Inspection for Damage
Shipment Contents
Instruction Manual
1.8 REPACKING FOR SHIPMENT
Should it become necessary to return the Model 8007 for repair, carefully pack the unit in its original packing car­ton or the equivalent, and include the following informa­tion:
Advise as to the wwranty status of the test fixture. Write ATTENTION REPAIR DEPARTMENT on the shipping label. Fill out and include the service form located at theback of this manual.
1.9 OPTIONAL ACCESSORIES
Model 236ILC-3 Interlock Cable: The Model 236.ILC-3 is 3m (10 ft.) in length and is intended to connect the Model 8007 interlock to instruments with similar inter-
lock circuits such as the Model 236 and 237 Source Meas-
ure Units.
Model 8007-MTC-3 Triax Cable Assembly: The Model
8007.MTC-3 is intended for input/output connections to the Model 8007. The Model 8007-MTC-3 has hyelve
3.meter (lo-foot) triaxial cables that terminate to a single mass-terminated connector on one end, and each cable is terminated with a male triax connector on the other end. A total of six Model 8007-MTC-3 cable assemblies are re­quired to use all 72 input/output pathways on the test fixture.
Model 8007-PTB Prototyping Board: The Model 8007~PTB Prototyping board is the board supplied with the Model 8007. Additional Model 8007-FTB boards may
be ordered to allow ease of changing test circuits. The
prototyping board contains breadboarding areas with holes on standard 0.1” centers, 0.04” in diameter for easy mounting of standard components such as ICs, transis­tors, diodes, resistors, and capacitors. The Model 8007-PTB plugs into the two ZIF sockets located on the top panel of the test fixture. The prototypingboard canbe secured to the top panel with the captive screw, if de­sired, or it can be left unsecured for ease of removal.
l-2
SECTION 2
Operation
2.1 INTRODUCTION
This section contains information on making connections to the Model 8007, as well as considerations when mak­ing measurements using the test fixture, and it is organ­ized as follows:
Fixture Configuration: Details the test fixture con-
2.2 nectors and sockets, and also discusses safety interlock connections.
Matrix Card Connections: Covers test fixture con-
2.3 nections to the Model 7072 Semiconductor Matrix Card.
2.4 Typical Instrument Connections: Shows how to connect various types of instruments to the fixture, in­cluding source measure units, current and voltage sources, electrometers, and CV meters.
2.5 Measurement Considerations: Outlines a number of considerations that should be observed for optimum measurements made using the test fixture.
2.6 TypicalApplications: Summarizesapplicationsex­amples for the test fixture when used with appropriate test equipment.
@
SCP3V
The = screw provides a connecting point for safety
0
earth ground.
WARNING
To avoid electric shock, the = screw must be connected to safety earth ground using #I18 AWG or large wire. Use the supplied safety 8007-GND-3).
Rear Panel Screws
The two screws that secure the rear panel to the fixture base must be installed in order to ensure a good ground connection between the rear panel and the test fixture base.
Safety Interlock Connections
grounding
WARNING
0
cable (Model
2.7 Using the Prototyping Board: Summarizes use of the prototyping board for connection of custom circuits to the test fixture.
2.2 FIXTURE CONFIGURATION
2.2.1
The rear panel of the Model 8007 is shown in Figure 2-1. Keys aspects of the rear panel include the six input/out­put mass-terminated connectors, the safety interlock connector, CHASSIS (MEASURE) and SUB CHASSIS
posts, the - ternmal, and the plugged 3/8” holes for 0 user expansion. Each of these items are discussed below.
Rear Panel
Thesafetyinterlockconnectorisintendedforusewithin­struments equipped tiith a matching interlock connector to provide user safety when using hazardous voltages. Note that you must use the Keithley safety interlock cable
(Model 236~ILC-3) with the instrument in order for the source measure unit to properly recognize whether the lid is open or closed.
Figure 2-2A shows typical connections to a Model 236 or 237 source measure unit. Note that the Model 8007 LID INTERLOCK connector is connected to one of the IN­TERLOCK connectors on the unit using the Model 236-ILC-3 interlock cable. With multiple source measure unit systems, all source measure units should be con­nected to the interlock by daisy chaining the interlock connectors of the source measure units together using additional Model 236~ILC-3 cables. Figure 2-2B shows an
2-l
SECTION 2
Operation
Lid Interlock
connector
Figure 2-l. Model 8007 Rear Panel
InputJOutput
Connectors
example of a system using three source measure units all connected to one Model 8007 test fixture.
minimum #18 AWG
Link
sponds to the input/output numbering on the top panel, is summarized in Table 2-l.
For those using instruments without the standard inter­lock connector, the equivalent circuit of the internal inter­lock switch is shown in Figure Z-X, both with lid open and lid closed.
WARNING User-supplied lethal voltages may be pm­sent when lid is open. Safe operation re­quires the use of the lid interlock.
CAUTION Do not exceed the voltage and current rat­ings of the safety interlock circuits (28V,
0.05A maximum).
Input/Output Connectors Input/output signal connections to the Model 8007 Test
Fixture are made through the six mass-terminated con­nectors located on the rear panel. Each mating connector has 12 trim cables attached, for a total of 72 input/output connectors. The pathway numbering, which corre-
NOTE The connector pinout is shown on the rear panel and in Figure 2-l.
The equivalent circuit for each input/output pathway is shown in Figure 2-3. Note that the inner shield of each tri­axial cable is connected to the corresponding guard that surrounds the signal pathway. The outer cable shield is connected to chassis ground at either pin 13 or pin 14 of that particular connector.
WARNING Maximum signal level is 2OOV, 1A peak. Ex­ceeding these values may create a shock haz­ard. See paragraph 2.5.13 for cumulative power restrictions.
Plugged 3/8” Holes The four plugged 3/8” holes that are located on the rear
panel can be used to install custom connectors such as the supplied 5-way binding posts. One possible use for these jacks would be to provide permanent power supply con-
2-2
SECTION 2
Operation
236 Source Measure Unit
8007 Test Fixture
A.) Connections to Single Source Measure Unit
B.) Multiple Source Measure Unit Interlock Connections
Figure 2-2.
I
Lid open
C.) Equivalent Circuit
Safety Interlock Connections
2-3
SECTION 2 Operation
Table 2-1. Input/output Numbering
Connector Connector Pin Socket Pin Connector
Number Number Number* Number
1
1
4 1 2 3 4 5
6 7 8
9 10 11 12
2
6 7 8 9
10
11
12
13
5 14 15 16
17 6 7 8
18 19
20 9 21
10 22 11 23
24
ConnectorPin Socket Pin
Number Number*
37 2 3 4
38
39
40
41 : 7 8 9
10 11 12
42
43
44
45
46
47
48
1 1 2 2 3 3 4 4 5 5 6 7
6
7 8 8 9 9
10 10 11 11 12 12
3
25 26 27 28 29 30
7
31 8 32 9
10 11 12
33
34
35
36
6
1 2 3 4 5 6 7 8 9
10 11 12
13 14 15 16 17 18
19 20 21 22 23 24
2-4
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