TAOS TSL1406RS, TSL1406R Datasheet

TSL1406R, TSL1406RS
768 × 1 LINEAR SENSOR ARRAY WITH HOLD
TAOS042 – AUGUST 2002
768 × 1 Sensor-Element Organization 400 Dot-Per-Inch (DPI) Sensor Pitch
TSL1406R
(TOP VIEW)
High Linearity and Uniformity Wide Dynamic Range...4000:1 (72 dB) Output Referenced to Ground Low Image Lag ... 0.5% Typ Operation to 8 MHz Single 3-V to 5-V Supply Rail-to-Rail Output Swing (AO) No External Load Resistor Required Replacement for TSL1406
Description
The TSL1406R is a 400 dots-per-inch (DPI) linear sensor array consisting of two 384-pixel sections, each with its own output. The sections are aligned to form a contiguous 768 × 1 pixel array. The device incorporates a pixel data-hold function that provides simultaneous integration-start and in­tegration-stop times for all pixels.
Pixels measure 63.5 µm by 55.5 µm, with 63.5-µm center-to-center spacing and 8-µm spacing between pixels. Operation is simplified by internal logic that requires only a serial-input (SI) pulse and a clock.
1 2 3 4 5 6 7 8
9 10 11 12 13
V
PP
SI1 HOLD1 CLK1 GND AO1 SO1 SI2 HOLD2 CLK2 SO2 AO2 V
DD
The device operates from a single 5-V power source. The two sections of 384 pixels each can be read out separately or can be cascaded to provide a single output for all 768 pixels (see Figure 9).
The TSL1406RS is the same device mounted in a shorter package. These devices are intended for use in a wide variety of applications including mark and code reading, OCR and contact imaging, edge detection and positioning, and optical encoding.
Functional Block Diagram (each section)
Pixel 1 (385)
_ +
4,10
CLK 384-Bit Shift Register (2 each)
2,8
SI
Hold
3, 9
Integrator
Reset
Sample/
Output
Switch Control Logic
Pixel
2
(386)
Pixel
3
(387)
Pixel
384
(768)
Q3Q2Q1Hold
Analog
Bus
Q384(Q768)
Output Buffer
Gain Trim
6, 12
7,11
13
V
DD
AO
5
GND
SO
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LUMENOLOGY
Company
Texas Advanced Optoelectronic Solutions Inc.
800 Jupiter Road, Suite 205 Plano, TX 75074 (972) 673-0759
www.taosinc.com
1
TSL1406R, TSL1406RS
768 × 1 LINEAR SENSOR ARRAY WITH HOLD
TAOS042 – AUGUST 2002
Terminal Functions
TERMINAL
NAME NO.
AO1 6 O Analog output, section 1. AO2 12 O Analog output, section 2. CLK1 4 I Clock, section 1. CLK1 controls charge transfer, pixel output, and reset. CLK2 10 I Clock, section 2. CLK2 controls charge transfer, pixel output, and reset. GND 5 Ground (substrate). All voltages are referenced to GND.
HOLD1 3 I HOLD2 9 I Hold signal. HOLD2 shifts pixel data to parallel buffer. HOLD2 is normally connected to SI2 in parallel mode.
SI1 2 I Serial input (section 1). SI1 defines the start of the data-out sequence. SI2 8 I Serial input (section 2). SI2 defines the start of the data-out sequence. SO1 7 O Serial output (section 1). SO1 provides a signal to drive the SI2 input in serial mode.
SO2 11 O V
DD
V
PP
I/O DESCRIPTION
Hold signal. HOLD1 shifts pixel data to parallel buffer. HOLD1 is normally connected to SI1 and HOLD2 in serial mode, SI1 in parallel mode.
Serial output (section 2). SO2 provides a signal to drive the SI input of another device for cascading or as an
end-of-data
13 Supply voltage for both analog and digital circuitry.
1 Normally grounded.
indication.
Detailed Description
The sensor consists of 768 photodiodes, called pixels, arranged in a linear array. Light energy impinging on a pixel generates photocurrent that is then integrated by the active integration circuitry associated with that pixel.
During the integration period, a sampling capacitor connects to the output of the integrator through an analog switch. The amount of charge accumulated at each pixel is directly proportional to the light intensity on that pixel and the integration time.
The output and reset of the integrators are controlled by a 384-bit shift register and reset logic. An output cycle is initiated by clocking in a logic 1 on SI. Another signal, called HOLD, is generated from the rising edge of SI1 when SI1 and HOLD1 are connected together. This causes all 384 sampling capacitors to be disconnected from their respective integrators and starts an integrator reset period. As the SI pulse is clocked through the shift register, the charge stored on the sampling capacitors is sequentially connected to a charge-coupled output amplifier that generates a voltage on analog output AO. The integrator reset period ends 18 clock cycles after the SI pulse is clocked in. Then the next integration period begins. On the 384th clock rising edge, the SI pulse is clocked out on the SO1 pin (section 1) and becomes the SI pulse for section 2 (when SO1 is connected to SI2). The rising edge of the 385th clock cycle terminates the SO1 pulse, and returns the analog output AO of section 1 to high-impedance state. Similarly, SO2 is clocked out on the 768th clock pulse. Note that a 769th clock pulse is needed to terminate the SO2 pulse and return AO of Section 2 to the high-impedance state. Sections 1 and 2 may be operated in parallel or in serial fashion.
2
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TSL1406R, TSL1406RS
768 × 1 LINEAR SENSOR ARRAY WITH HOLD
TAOS042 – AUGUST 2002
AO is an op amp-type output that does not require an external pull-down resistor. This design allows a rail-to-rail output voltage swing. With V
for saturation light level. When the device is not in the output phase, AO is in a high-impedance state. The voltage developed at analog output (AO) is given by:
where:
V
out
V
drk
R E
e
t
int
is the analog output voltage for white condition is the analog output voltage for dark condition is the device responsivity for a given wavelength of light given in V/(µJ/cm2)
e
is the incident irradiance in µW/cm is integration time in seconds
A 0.1 µF bypass capacitor should be connected between VDD and ground as close as possible to the device.
= 5 V, the output is nominally 0 V for no light input, 2 V for normal white level, and 4.8 V
DD
V
= V
out
+ (Re) (Ee)(t
drk
2
int
)
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TSL1406R, TSL1406RS
768 × 1 LINEAR SENSOR ARRAY WITH HOLD
TAOS042 – AUGUST 2002
Absolute Maximum Ratings
Supply voltage range, VDD –0.3 V to 6 V. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Input voltage range, VI –0.3 V to VDD + 0.3V. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Input clamp current, IIK (VI < 0) or (VI > VDD) –20 mA to 20 mA. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Output clamp current, IOK (VO < 0 or VO > VDD) –25 mA to 25 mA. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Voltage range applied to any output in the high impedance or power-off state, VO –0.3 V to VDD + 0.3 V. . . Continuous output current, I
(V
= 0 to VDD) –25 mA to 25 mA. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
O
O
Continuous current through VDD or GND –40 mA to 40 mA. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Analog output current range, IO –25 mA to 25 mA. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Maximum light exposure at 638 nm 5 mJ/cm
. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Operating free-air temperature range, TA 0°C to 70°C. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Storage temperature range, T
–25°C to 85°C. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
stg
Lead temperature 1,6 mm (1/16 inch) from case for 10 seconds 260°C. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Stresses beyond those listed under “Absolute Maximum Ratings” may cause permanent damage to the device. These are stress ratings only, and functional operation of the device at these or any other conditions beyond those indicated under “Recommended Operating Conditions” is not implied. Exposure to absolute-maximum-rated conditions for extended periods may affect device reliability.
Recommended Operating Conditions (see Figure 1 and Figure 2)
MIN NOM MAX UNIT
Supply voltage, V Input voltage, V High-level input voltage, V Low-level input voltage, V Wavelength of light source, λ 400 1000 nm Clock frequency, f Sensor integration time, Serial, t Sensor integration time, Parallel, t Setup time, serial input, t Hold time, serial input, t Operating free-air temperature, T
NOTE 1: SI must go low before the rising edge of the next clock pulse.
DD
I
IH
IL
clock
int
int
su(SI)
(see Note 1) 0 ns
h(SI)
A
3 5 5.5 V 0 V 2 V 0 0.8 V
5 8000 kHz
0.098 100 ms
0.050 100 ms 20 ns
0 70 °C
DD DD
V V
2
4
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