The T4312816A is 134,217,728 bits
synchronous high data rate Dynamic RAM
organized as 4 x 2,097,152 words by 16 bits,
fabricated with high performance CMOS
technology .
Synchronous design allows precise cycle control
with the use of system clock I/O transactions are
possible on every clockcycle . Range of operating
frequencies , programmable burst length and
programmable latencies allow the same device to
be useful for a variety of high bandwidth , high
performance memory system applications.
to change products or specifications without notice. Revision: 0.B
TE
tm
BLOCK DIAGRAM
CH
Preliminary T4312816A
I/O ControlOutput Buffer
CLK
ADD
Bank Select
Refresh Counter
Row Buffeer
Address Register
LCBR
LRA S
Timing Register
Row Decoder
Col. Buffer
Data Input Register
2M x 16
2M x 16
2M x 16
2M x 16
Column D ecoder
Laten c y & Burst Le n g th
Programming Register
Sense AMP
DQi
CASWE
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L(U)DQ MRASCSCKECLK
Publication Date: APR. 2003
to change products or specifications without notice. Revision: 0.B
TE
tm
PIN DESCRIPTION
CH
Preliminary T4312816A
PIN NAME
CLK System Clock
CS
CKE Clock Enable
A0 ~ A11 Address
BA0 ~ BA1 Bank Select Address
RAS
CAS
Chip Select
Row Address Strobe
Column Address Strobe
INPUT FUNCTION
Active on the positive going edge to sample all input.
Disables or enables device operation by masking or enabling all input
except CLK,CKE and L(U)DQM
Masks system clock to freeze operation from the next clock cycle.
CKE should be enabled at least one cycle prior to new command.
Disable input buffers for power down in standby.
Row/column addresses are multiplexed on the same pins.
Row address : RA0 ~ RA11,column address : CA0 ~ CA8
Selects bank to be activated during row address latch time.
Select bank for read/write during column address latch time.
Latches row addresses on the positive going edge of the CLK
RAS
with
Enables row access & precharge.
Latches column addresses on the positive going edge of the CLK
with
CAS
low.
low.
WE
L(U)DQM
DQ0 ~ DQ15 Data Input/Output
VDD/VSS Power Supply/Ground
V
DDQ/VSSQ
N.C/RFU
Write Enable
Data Input/Output
Mask
Data Output
Power/Ground
No
Connection/Reserved
for Future Use
Enables column access .
Enables write operation and row precharge.
Latches data in starting from
Makes data output Hi-Z,
Blocks data input when L(U)DQM active.
Data inputs/outputs are multiplexed on the same pins.
Power and ground for the input buffers and the core logic.
Isolated power supply and ground for the output buffers to provide
improved noise immunity.
This pin is recommended to be left No Connection on the device.
CAS, WE
t
after the clock and masks the output.
SHZ
active.
TM Technology Inc. reserves the right P. 3
to change products or specifications without notice. Revision: 0.B
Publication Date: APR. 2003
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ABSOLUTE MAXIMUM RATINGS
Parameter Symbol Value Unit
CH
Preliminary T4312816A
Voltage on Any Pin Relative To Vss VIN,V
Supply Voltage Relative To Vss VDD,V
Short circuit Output Current I
Power Dissipation PD 1 W
Operating Temperature T
Storage Temperature T
Permanent device damage may occur if ABSOLUTE MAXIMUM RATINGS are exceeded.
Note :
Functional operation should be restricted to recommended operating condition.
Exposure to higher than recommended voltage for extended periods of time could affect device reliability.
RECOMMENDED DC OPERATING CONDITIONS
(TA = 0 to +70
Parameter Symbol Min. Typ Max. Unit Notes
Supply Voltage VDD,V
Input High Voltage VIH 2.0 3.0 VDD+0.3V V
Input Low Voltage VIL -0.3 0 0.8 V
Output logic high voltage VOH 2.4 - - V IOH=-4mA
, Voltage referenced to VSS=0V)
°°°°C
3.0 3.3 3.6 V
DDQ
-1.0 to 4.6 V
OUT
-1.0 to 4.6 V
DDQ
50 mA
out
0 to +70
OPR
-55 to +150
stg
C
°
C
°
Output logic low voltage VOL - - 0.4 V IOL=4mA
Input leakage current IIL -1 - 1 uA 1
Output leakage current IOL -1.5 - 1.5 uA 2
Note :
1. Any input 0V
2. Dout = disable, 0V≤ V
VIN ≤ VDD+ 0.3V , all other pin are not under test = 0V.
≤
V
OUT
≤
DD .
CAPACITANCE
(TA =25
RAS,CAS,WE,CS,CKE,LDQM,
,VDD=3.3V, f = 1MHz)
C
°
Pin Symbol Min Max Unit
CLOCK C
ADDRESS C
DQ0 ~ DQ15 C
UDQM
2.5 4.0 pF
CLK
2.5 5.0 pF
ADD
4.0 6.5 pF
OUT
CIN 2.5 5.0 pF
TM Technology Inc. reserves the right P. 4
to change products or specifications without notice. Revision: 0.B
Publication Date: APR. 2003
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tm
DC CHARACTERISTICS
CH
Preliminary T4312816A
TA = 0 to 70
, VIH(min)/VIL(max)=2.0V/0.8V
C
°
Parameter Symbol
Operating Current
I
CC1
( One Bank Active)
Precharge Standby
I
CC2
Current in power-
I
down mode
CC2
Precharge Standby
I
Current in non
CC2
power-down mode
I
CC2
Active Standby
I
CC3
Current in power-
I
down mode
CC3
Active Standby
I
Current in non
CC3
power-down mode
I
(One Bank Active)
CC3
Speed version
Unit Test Condition
-6 -7 -7.5 -8 -10
140 120 115 110 100 mA
P 2
mA
PS 2
N 20
mA
NS 8
P 5
mA
PS 4
N 30
mA
NS 20
Burst Length = 1
t
t
≥
RC
RC
CKE≤ VIL(max),
CKE≤ VIL(max),CLK ≤VIL(max),
CKE
≥
Input signals are changed one time during 30ns
CKE≥VIH(min),CLK≤VIL(min),
Input signals are stable
CKE≤ VIL(max),
CKE≤ VIL(max),CLK ≤VIL(max),
CKE≥VIH(min),
Input signals are changed one time during 30ns
CKE≥VIH(min),CLK≤VIL(min),
Input signals are stable
(min) ,
VIH(min),
t
CC
t
(min),IOL= 0 mA
≥
CC
t
=15ns
CC
VIH(min),
≥
CS
t
=15ns
CC
VIH(min),
≥
CS
t
t
CC
t
t
CC
CC
t
CC
=15ns
CC
=∞
t
CC
=15ns
=∞
=∞
=∞
Note
1,3
3
3
3
3
Operating Current
(Burst Mode)
Refresh Current
Self refresh
Current
150 130 125 120 110
I
CC4
150 130 125 120 110
150 130 125 120 110 mA
I
CC5
I
2 mA
CC6
CAS Latency 3
mA
CAS Latency 2
t
RC
CKE≤0.2V
=0 mA,Page Burst
I
OL
All Band Activated
t
t
=
CCD
CCD
t
(min)
≥
RC
Note: 1. Measured with output open. Addresses are changed only one time during
2. Refresh period is 64ms. Addresses are changed only one time during
3.
t
: Clock cycle time.
CC
t
: Row cycle time.
RC
t
: Column address to column address delay time.
CCD
t
CC
(min)
t
CC
(min)
(min)
.
1,3
2,3
.
TM Technology Inc. reserves the right P. 5
Publication Date: APR. 2003
to change products or specifications without notice. Revision: 0.B
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tm
AC OPERATING CONDITIONS
(VDD=3.3V ±0.3V ,TA= 0 to 70
Input levels (VIH/VIL) 2.4 / 0.4 V
Input timing measurement reference level 1.4 V
CH
Preliminary T4312816A
)
C
°
Parameter Value Unit
Input rise and fall time
Output timing measurement reference level 1.4 V
Output load condition See Fig.2
t
r / tf = 1 / 1
ns
3.3V
Output
870 ohm
1200 ohm
ZO=50 ohmOutput
VOH(DC)=2.4,IOH=-4mA
VOL(DC)=0.4,IOL=4mA
30pf
Vtt=1.4v
50 ohm
30pf
(Fig.1) DC Output Load Circuit (Fig.2)AC Output Load Circuit
TM Technology Inc. reserves the right P. 6
to change products or specifications without notice. Revision: 0.B
Publication Date: APR. 2003
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tm
OPERATING AC PARAMETER
(AC opterating conditions unless otherwise noted)
Row active to row active delay
RAS to CAS delay
CH
Preliminary T4312816A
Parameter Symbol
t
(min)
RRD
t
(min)
RCD
Speed Version
Unit Note
-6 -7 -7.5 -8 -10
12 14 15 16 20 ns 1
15 15 18 20 20 ns 1
Row precharge time
Row active time
Row cycle time
Last data in to new col. Address delay
Last data in to row precharge
Last data in to burst stop
Col. Address to col. Address delay
Number of valid output data
t
(min)
RP
t
(min)
RAS
t
RAS
t
(min)
RC
t
CDL
t
RDL
t
BDL
t
CCD
CAS latency=3 1
CAS latency=2 1
(max)
(min)
(min)
(min)
(min)
15 15 20 20 20 ns 1
42 42 45 48 50 ns 1
120K ns
60 63 65 68 70 ns 1
1 CLK 2
2 CLK 2
1 CLK 2
1 CLK 3
ea 4
Note:
1. The minimum number of clock cycles is determined by dividing the minimum time required
with clock cycle time and then rounding off to the next higher integer.
2. Minimum delay is required to complete write.
3. All parts allow every cycle column address change.
4. In case of row precharge interrupt, auto precharge and read burst stop.
The earliest a precharge command can be issued after a Read command without the loss of data is
CL + BL-2 clocks.
TM Technology Inc. reserves the right P. 7
to change products or specifications without notice. Revision: 0.B
Publication Date: APR. 2003
TE
tm
AC CHARACTERISTICS
(AC opterating conditions unless otherwise noted)
CLK cycle time
CH
Preliminary T4312816A
-6 -7 -7.5 -8 -10
t
Min Max Min Max Min Max Min Max Min Max
CC
8 9 9 10 10
Parameter
CAS Latency = 3 6 1K 7 1K 7.5 1K 8 1K 10 1K
CAS Latency = 2
Symbol
Unit Note
ns 1
CLK to valid
Output delay
Output data hold time
CLK high pulse width
CLK low pulse width
Input setup time
Input hold time
CLK to output in Low-Z