The T221160A is a randomly accessed solid state
memory containing 1,048,551 bits organized in a
x16 configuration. The T221160A has both BYTE
WRITE and WORD WRITE access cycles via two
CAS
pins. It offers Fast Page mode operation
CAS
The T221160A
determined by the first
by the last to transition back high. Use only one of
CAS
the two
and leave the other staying high
during WRITE will result in a BYTE WRITE.
CASL
transiting low in a WRITE cycle will write
data into the lower byte (IO1~IO8), and
transiting low will write data into the upper byte
(IO9~16).
function and timing are
CAS
to transition low and
CASH
Vcc
I/01
I/02
I/03
I/04
Vcc
I/05
I/06
I/07
I/08
NC
NC
W E
RA S
NC
A0
A1
A2
A3
Vcc
1
2
3
4
5
6
7
8
9
10
TSO P (II)
11
12
13
14
15
16
17
18
19
20
40
Vss
39
I/016
38
I/015
37
I/014
36
I/013
35
Vss
34
I/012
33
I/011
32
I/010
31
I/09
30
NC
29
CASL
CASH
28
OE
27
26
NC
25
A7
24
A6
23
A5
22
A4
21
VSS
Taiwan Memory Technology, Inc. reserves the right P. 1 Publication Date: FEB. 2002
to change products or specifications without notice. Revision:A
TE
tm
FUNCTIONAL BLOCK DIAGRAM
CH
T221160A
WE
RAS
A0
A1
A2
A3
A4
A5
A6
A7
CASL
CASH
NO.2 CLOCK
GENERATOR
COLUMN.
ADDRESS
8
REFRESH
CONTROLLER
REFRESH
COUNTER
ADDRESS
8
BUFFERS(8)
NO.1 CLOCK
GENERATOR
BUFFER
8
ROW.
CAS
CONTROL
LOGIC
8
DATA-IN BUFFER
DQ01
OE
Vcc
Vss
.
.
DQ16
16
DATA-
OUT
BUFFER
COLUMN
8
DECODER
256
SENSE AMPLIFIERS
256
ROW
DECODER
8
VO GATING
256 x 16
256 x 256 x 16
MEMORY
ARRA
Y
8
16
PIN DESCRIPTIONS
PIN NO. SYM. TYPE DESCRIPTION
16~19,22~25 A0-A7 Input Address Input
14
28
29
13
27
2~5,6~10,31~34,36~39 I/O1 - I/O16 Input/ Output Data Input/ Output
1,6,20 Vcc Supply Power, 5V
21,35,40 Vss Ground Ground
11,12,15,30 NC - No Connect
Taiwan Memory Technology, Inc. reserves the right P. 2 Publication Date: FEB. 2002
to change products or specifications without notice. Revision:A
Supply Voltage Vcc 4.5 5.5 V 1
Supply Voltage Vss 0 0 V
Input High (Logic) voltage VIH 2.4 Vcc+1 V 1
Input Low (Logic) voltage VIL -1.0 0.8 V 1
Input Leakage Current
Output Leakage Current
Output High Voltage IOH = -5 mA VOH 2.4 - V
Output Low Voltage IOL = 4.2 mA VOL - 0.4 V
CH
T221160A
to the device. This is a stress rating only and
functional operation of the device at these or any
other conditions above those indicated in the
operational sections of this specification is not
implied. Exposure to absolute maximum rating
conditions for extended periods may affect
reliability.
0V ≤ VIN ≤ 7V
0V ≤ V
Output(s) disabled
OUT
≤ 7V
ILI -10 10 uA
ILO -10 10 uA
Note: 1.All Voltages referenced to Vss
Taiwan Memory Technology, Inc. reserves the right P. 3 Publication Date: FEB. 2002
to change products or specifications without notice. Revision:A
TE
tm
DC CHARACTERISTICS
(Ta = 0 to 70°C, Vcc = 5V ±10%, Vss = 0V)
CH
T221160A
Parameter
Operating Current
Standby Current
Standby Current
Fast Page Mode Current
RAS
-only refresh
Current
CAS
Before
Refresh Current
RAS
-25 -30 -35 -40
Symbol
Min Max Min Max Min Max Min Max
Icc1 - 170 - 150 - 130 - 120 mA
Icc2 - 4 - 4 - 4 - 4 mA
Icc3 - 2 - 2 - 2 - 2 mA
Icc4 -
Icc5 -
Icc6 -
170
170
170
-
150
-
150
-
150
-
130
-
130
-
130
-
-
-
120
120
120
Unit
mA
mA
mA
Test Condition
RAS, CAS
tRC=min
TTL interface,
RAS,CAS
D
OUT
CMOS interface,
RAS, CAS
RAS
=VIL,
cycling, tPC= min
CAS
=VIH,
cycling, tRC= min
RAS,CAS
tRC= min
cycling
=VIH,
=High-Z
> Vcc-0.2V
CAS
RAS
cycling,
Note: Icc depends on output load condition when the device is selected.
Icc max is specified at the output open condition, Icc is specified as an average current.
CAPACITANCE
(Ta =25°C, Vcc =5V, f = 1M HZ)
Parameter Symbol Typ Max Unit
Input Capacitance
(address)
Input Capacitance
RAS,CAS,WE,OE
(
Output Capacitance
(data-in/out)
)
CI1 - 5 pF
CI2 - 7 pF
C
- 10 pF
I/O
Taiwan Memory Technology, Inc. reserves the right P. 4
to change products or specifications without notice. Revision:A
Publication Date: FEB. 2002
tm
TE
CH
T221160A
AC CHARACTERISTICS
(note 1,2,3) (Ta = 0 to 70°C)
AC TEST CONDITIONS:
Vcc=5V ±10%, input pulse level = 0 to 3V
Input rise and fall times: 2ns
Output Load: 2TTL gate + CL (50pF)
PARAMETER
SYM
-25 -30 -35 -40 AC CHARACTERISTICS
MIN MAX MIN MAX MIN MAX MIN MAX
Read or Write Cycle Time tRC 43 55 65 75 ns
Read-Modify-Write Cycle Time t
65 85 95 105 ns
RWC
Fast-Page-Mode Read or Write Cycle Time tPC 15 20 23 25 ns
Fast-Page-Mode Read-Write Cycle Time t
Access Time From
Access Time From
Access Time From
RAS
CAS
OE
37 42 49 52 ns
PCM
t
25 30 35 40
RAC
t
7 8 9 10
CAC
t
7 8 9 10
OAC
Access Time From Column Address tAA 12 16 18 20 ns
t
CAS
Access Time From
RAS
Pulse Width
RAS
Pulse Width
RAS
Hold Time
RAS
Precharge Time
CAS
Pulse Width
CAS
Hold Time
CAS
Precharge Time
RAS
CAS
to
to
CAS
Delay Time
RAS
Precharge Time
Precharge
Row Address Setup Time t
Row Address Hold Time t
RAS
to Column Address Delay Time
Column Address Setup Time t
Column Address Hold Time t
Column Address Hold Time (Reference to
RAS
)
RAS
Column Address to
Lead Time
Read Command Setup Time t
CAS
RAS
or
Read Command Hold Time Reference to
Read Command Hold Time Reference to
CAS
to Output in Low-Z
Output Buffer Turn-off Delay From
RAS
CAS
14 18 20 22
ACP
t
25 10K 30 10K 35 10K 40 10K
RAS
t
RASC
t
7 8 9 10
RSH
25
100K
30
100K
35
100K
40
tRP 15 20 23 25
t
4 10K 6 10K 8 10K 10 10K
CAS
t
21 26 30 35
CSH
3 3 4 5
tCP
t
10 17 10 21 10 25 10 29
RCD
t
3 3 3 5
CRP
0 0 0 0 ns
ASR
5 5 5 5 ns
RAH
t
8 13 8 14 8 16 8 18
RAD
0 0 0 0 ns
ASC
4 4 4 5 ns
CAH
tAR 22 26 30 34
t
12 14 16 18
RAL
0 0 0 0 ns
RCS
t
0 0 0 0
RCH
t
0 0 0 0
RRH
t
3 3 3 3
CLZ
t
3 15 3 15 3 15 3 15
OFF1
100K
UNIT
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
Notes
4
5
13
8
7
8
14
9,14
9
10,16
Taiwan Memory Technology, Inc. reserves the right P. 5
Publication Date: FEB. 2002
to change products or specifications without notice. Revision:A
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