Taiwan Memory Technology T221160A-30J, T221160A-35S, T221160A-35J, T221160A-30S Datasheet

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TE
CH
T221160A

DRAM

FEATURES
High speed access time : 25/30/35/40 ns
Industry-standard x 16 pinouts and tim ing
functions.
Single 5V (±10%) power supply.
All device pins are TTL- compatible.
256-cycle refresh in 4ms.
Refresh modes:
RAS
(CBR) and HIDDEN.
Conventional FAST PAGE MODE access cycle.
BYTE WRITE and BYTE READ access cycles.
RAS
only,
CAS
BEFORE
PART NUMBER EXAMPLES
PART NUMBER
T221160A-30J T221160A-30S
T221160A-35J T221160A-35S
ACCESS TIME PACKAGE
30ns SOJ 30ns TSOP-II
35ns SOJ 35ns TSOP-II
64K x 16 DYNAMIC RAM

FAST PAGE MODE

PIN ASSIGNMENT ( Top View )
40 39 38 37 36 35 34 33 32 31 30 29 28 27 26 25 24 23 22 21
Vss I/016 I/015 I/014 I/013 Vss I/012 I/011 I/010 I/09 NC CASL CASH OE NC A7 A6 A5 A4 VSS
Vc c I/01 I/02 I/03 I/04 Vc c I/05 I/06 I/07 I/08
NC NC
W E
R A S
NC
A0 A1 A2 A3
Vc c
10 11 12 13 14 15 16 17 18 19 20
1 2 3 4 5 6 7 8 9
SOJ

GENERAL DESCRIPTION

The T221160A is a randomly accessed solid state memory containing 1,048,551 bits organized in a x16 configuration. The T221160A has both BYTE WRITE and WORD WRITE access cycles via two
CAS
pins. It offers Fast Page mode operation
CAS
The T221160A determined by the first by the last to transition back high. Use only one of
CAS
the two
and leave the other staying high
during WRITE will result in a BYTE WRITE.
CASL
transiting low in a WRITE cycle will write data into the lower byte (IO1~IO8), and transiting low will write data into the upper byte (IO9~16).
function and timing are
CAS
to transition low and
CASH
Vcc I/01 I/02 I/03 I/04 Vcc I/05 I/06 I/07 I/08
NC NC
W E
RA S
NC A0 A1 A2 A3
Vcc
1 2 3 4 5 6 7 8 9
10
TSO P (II)
11 12 13 14 15 16 17 18 19 20
40
Vss
39
I/016
38
I/015
37
I/014
36
I/013
35
Vss
34
I/012
33
I/011
32
I/010
31
I/09
30
NC
29
CASL CASH
28
OE
27 26
NC
25
A7
24
A6
23
A5
22
A4
21
VSS
Taiwan Memory Technology, Inc. reserves the right P. 1 Publication Date: FEB. 2002 to change products or specifications without notice. Revision:A
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FUNCTIONAL BLOCK DIAGRAM
CH
T221160A
WE
RAS
A0 A1 A2 A3 A4 A5 A6 A7
CASL CASH
NO.2 CLOCK
GENERATOR
COLUMN.
ADDRESS
8
REFRESH
CONTROLLER
REFRESH
COUNTER
ADDRESS
8
BUFFERS(8)
NO.1 CLOCK
GENERATOR
BUFFER
8
ROW.
CAS
CONTROL
LOGIC
8
DATA-IN BUFFER
DQ01
OE
Vcc
Vss
. .
DQ16
16
DATA-
OUT
BUFFER
COLUMN
8
DECODER
256
SENSE AMPLIFIERS
256
ROW
DECODER
8
VO GATING
256 x 16
256 x 256 x 16
MEMORY
ARRA
Y
8
16
PIN DESCRIPTIONS
PIN NO. SYM. TYPE DESCRIPTION
16~19,22~25 A0-A7 Input Address Input
14 28 29 13 27
2~5,6~10,31~34,36~39 I/O1 - I/O16 Input/ Output Data Input/ Output
1,6,20 Vcc Supply Power, 5V
21,35,40 Vss Ground Ground
11,12,15,30 NC - No Connect
Taiwan Memory Technology, Inc. reserves the right P. 2 Publication Date: FEB. 2002 to change products or specifications without notice. Revision:A
RAS CASH CASL
WE
OE
Input Row Address Strobe Input Column Address Strobe /Upper Byte Control Input Column Address Strobe /Lower Byte Control Input Write Enable Input Output Enable
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ABSOLUTE MAXIMUM RATINGS*

Voltage on Any pin Relative to VSS… … -1V to 7V Operating Temperature, Ta (ambient)..0°C to +70°C
Storage Temperature (plastic)….... -55°C to +150°C
Power Dissipation ...............................…......... 1.0W
Short Circuit Output Current...................….... 50mA
*Stresses greater than those listed under "Absolute Maxi mum Rat ings" ma y caus e per manent damag e
DC ELECTRICAL CHARACTERISTICS AND RECOMMENDED OPERATING CONDITIONS
(0°C Ta ≤ 70°C; VCC = 5V ± 10 % unless otherwise noted)
DESCRIPTION CONDITIONS SYM. MIN MAX UNITS NOTES
Supply Voltage Vcc 4.5 5.5 V 1 Supply Voltage Vss 0 0 V Input High (Logic) voltage VIH 2.4 Vcc+1 V 1 Input Low (Logic) voltage VIL -1.0 0.8 V 1 Input Leakage Current
Output Leakage Current Output High Voltage IOH = -5 mA VOH 2.4 - V
Output Low Voltage IOL = 4.2 mA VOL - 0.4 V
CH
T221160A
to the device. This is a stress rating only and functional operation of the device at these or any other conditions above those indicated in the operational sections of this specification is not implied. Exposure to absolute maximum rating conditions for extended periods may affect reliability.
0V VIN 7V 0V V
Output(s) disabled
OUT
7V
ILI -10 10 uA
ILO -10 10 uA
Note: 1.All Voltages referenced to Vss
Taiwan Memory Technology, Inc. reserves the right P. 3 Publication Date: FEB. 2002 to change products or specifications without notice. Revision:A
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DC CHARACTERISTICS

(Ta = 0 to 70°C, Vcc = 5V ±10%, Vss = 0V)
CH
T221160A
Parameter
Operating Current
Standby Current
Standby Current
Fast Page Mode Current
RAS
-only refresh
Current
CAS
Before
Refresh Current
RAS
-25 -30 -35 -40
Symbol
Min Max Min Max Min Max Min Max
Icc1 - 170 - 150 - 130 - 120 mA
Icc2 - 4 - 4 - 4 - 4 mA
Icc3 - 2 - 2 - 2 - 2 mA
Icc4 -
Icc5 -
Icc6 -
170
170
170
-
150
-
150
-
150
-
130
-
130
-
130
-
-
-
120
120
120
Unit
mA
mA
mA
Test Condition
RAS, CAS
tRC=min TTL interface,
RAS,CAS
D
OUT
CMOS interface,
RAS, CAS RAS
=VIL,
cycling, tPC= min
CAS
=VIH,
cycling, tRC= min
RAS,CAS
tRC= min
cycling
=VIH,
=High-Z
> Vcc-0.2V
CAS
RAS
cycling,
Note: Icc depends on output load condition when the device is selected. Icc max is specified at the output open condition, Icc is specified as an average current.
CAPACITANCE
(Ta =25°C, Vcc =5V, f = 1M HZ)
Parameter Symbol Typ Max Unit
Input Capacitance
(address)
Input Capacitance
RAS,CAS,WE,OE
(
Output Capacitance
(data-in/out)
)
CI1 - 5 pF
CI2 - 7 pF
C
- 10 pF
I/O
Taiwan Memory Technology, Inc. reserves the right P. 4 to change products or specifications without notice. Revision:A
Publication Date: FEB. 2002
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TE
CH
T221160A
AC CHARACTERISTICS
(note 1,2,3) (Ta = 0 to 70°C)
AC TEST CONDITIONS: Vcc=5V ±10%, input pulse level = 0 to 3V Input rise and fall times: 2ns Output Load: 2TTL gate + CL (50pF)
PARAMETER
SYM
-25 -30 -35 -40 AC CHARACTERISTICS
MIN MAX MIN MAX MIN MAX MIN MAX
Read or Write Cycle Time tRC 43 55 65 75 ns Read-Modify-Write Cycle Time t
65 85 95 105 ns
RWC
Fast-Page-Mode Read or Write Cycle Time tPC 15 20 23 25 ns Fast-Page-Mode Read-Write Cycle Time t
Access Time From Access Time From Access Time From
RAS CAS OE
37 42 49 52 ns
PCM
t
25 30 35 40
RAC
t
7 8 9 10
CAC
t
7 8 9 10
OAC
Access Time From Column Address tAA 12 16 18 20 ns
t
CAS
Access Time From
RAS
Pulse Width
RAS
Pulse Width
RAS
Hold Time
RAS
Precharge Time
CAS
Pulse Width
CAS
Hold Time
CAS
Precharge Time RAS CAS
to
to
CAS
Delay Time
RAS
Precharge Time
Precharge
Row Address Setup Time t Row Address Hold Time t
RAS
to Column Address Delay Time
Column Address Setup Time t Column Address Hold Time t Column Address Hold Time (Reference to
RAS
)
RAS
Column Address to
Lead Time
Read Command Setup Time t
CAS RAS
or
Read Command Hold Time Reference to Read Command Hold Time Reference to
CAS
to Output in Low-Z
Output Buffer Turn-off Delay From
RAS
CAS
14 18 20 22
ACP
t
25 10K 30 10K 35 10K 40 10K
RAS
t
RASC
t
7 8 9 10
RSH
25
100K
30
100K
35
100K
40
tRP 15 20 23 25 t
4 10K 6 10K 8 10K 10 10K
CAS
t
21 26 30 35
CSH
3 3 4 5
tCP t
10 17 10 21 10 25 10 29
RCD
t
3 3 3 5
CRP
0 0 0 0 ns
ASR
5 5 5 5 ns
RAH
t
8 13 8 14 8 16 8 18
RAD
0 0 0 0 ns
ASC
4 4 4 5 ns
CAH
tAR 22 26 30 34 t
12 14 16 18
RAL
0 0 0 0 ns
RCS
t
0 0 0 0
RCH
t
0 0 0 0
RRH
t
3 3 3 3
CLZ
t
3 15 3 15 3 15 3 15
OFF1
100K
UNIT
ns ns ns
ns ns ns ns ns ns ns ns ns ns
ns
ns
ns
ns ns
ns ns
Notes
4 5 13 8
7
8
14 9,14
9
10,16
Taiwan Memory Technology, Inc. reserves the right P. 5
Publication Date: FEB. 2002
to change products or specifications without notice. Revision:A
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