ST MICROELECTRONICS TDA 8145 Datasheet

TELEFUNKEN Semiconductors

TDA8145

TV East/West Correction Circuit for Square Tubes

Technology: Bipolar

Features

D

D

Low dissipation

D

Square generator for parabolic current specially de­signed for square C.R.T. correction

D

External keystone adjustment (symmetry of the pa­rabola)

D

Input for dynamic field correction (beam current
change)

Case: 8 pin dual inline plastic

Static picture width adjustment

D

Pulse-width modulator

D

Final stage D-class with energy redelivery

D

Parasitic parabola suppression, during flyback time of
the vertical sawtooth

Figure 1. Block diagram

Rev . A1: 13.04.1995 1 (4)

TDA8145

V

7A

V

7C

%

Absolute Maximum Ratings

Parameters Symbol Value Unit
Supply voltage Pin 6 V
Supply current Pin 6 I
Power dissipation T
Storage temperature range T
Junction temperature T

Electrical Characteristics

V

= 26 V, T

S

Supply voltage Pin 6 V
Supply current Test circuit 1 Pin 6 I
Reference voltage Test circuit 1 Pin 3 V
Voltage at Pin 7 * Test circuit figure 2, Pin 7

Parabola coefficient

Difference, figure 2
Current source Test circuit 3 Pin 8 I

Saturation voltage I

Forward voltage I

= 25°C, Test circuits 1 to 5

amb

Parameters Test Conditions / Pins Symbol Min. Typ. Max. Unit

= 50°C P

case

I

= 0 mA

fr

I

= 30 mA

fr

V

*

V

K1+
K2+

V

+

V7E*

DE7

= 400 mA, Pin 5

5

7A

V7A*
V7A*

V7A*

V

7F

V
V

V

Test circuit 4
I

= –100 mA, Pin 5

5

Test circuit 5

= 400 mA, Pin 5

5

Test circuit 5

V
V

7B
7

7C
7D

V

V

satL

satH

V

S
ref

7A
7C

8

TELEFUNKEN Semiconductors

S

S
tot
stg

j

S

17 24 30 V

7.6 8.0 8.8 V

15.3

–40 0 40 mV

F

35 V
500 mA
500 mW

–25 to 150 °C
–25 to 150 °C

4.5 7 mA

16.0

16.7 V

15.0
26

70

100

1

0.8

2

1.5

1.2 1.7 V

93 7666

%

m

A

V

V

V

7

V

7A

V

7B

V

7C

V

V

7E

7D

–60 0 10 20 35 60 mA

Figure 2. Parabola coefficients

V

7F

I

FR

Rev . A1: 13.04.19952 (4)

TELEFUNKEN Semiconductors

Figure 3. Test circuit 1 Figure 4. Test circuit 2

TDA8145

Figure 5. Test circuit 3 Figure 6. Test circuit 4

Figure 7. Test circuit 5

Rev . A1: 13.04.1995 3 (4)

TDA8145

Dimensions in mm

Package: DIP 8

TELEFUNKEN Semiconductors

94 8873

We reserve the right to make changes to improve technical design and may do so without further notice.

Parameters can vary in different applications. All operating parameters must be validated for each customer

application by the customer. Should the buyer use TEMIC products for any unintended or unauthorized

application, the buyer shall indemnify TEMIC against all claims, costs, damages, and expenses, arising out of,

directly or indirectly, any claim of personal damage, injury or death associated with such unintended or

unauthorized use.

TEMIC TELEFUNKEN microelectronic GmbH, P.O.B. 3535, D-74025 Heilbronn, Germany

Telephone: [phone], Fax number: 49 (0)7131 67 2423

Rev . A1: 13.04.19954 (4)