N-channel 800 V, 3.5 Ω typ., 2 A MDmesh™ K5 Power MOSFETs
in DPAK, TO-220FP, TO-220 and IPAK packages
Datasheet − production data
Features
2
1
TAB
3
2
1
Figure 1. Internal schematic diagram
Order codesV
STD2N80K5
3
STF2N80K520 W
STP2N80K5
800 V4.5 Ω2 A
STU2N80K5
• Industry’s lowest R
DS
R
DS(on)
DS(on)
maxI
* area
P
D
TOT
45 W
45 W
• Industry’s best figure of merit (FoM)
• Ultra low gate charge
• 100% avalanche tested
• Zener-protected
Applications
• Switching applications
Description
These very high voltage N-channel Power
MOSFETs are designed using MDmesh™ K5
technology based on an innovative proprietary
vertical structure. The result is a dramatic
reduction in on-resistance and ultra-low gate
charge for applications requiring superior power
density and high efficiency.
Table 1. Device summary
Order codesMarkingPackagePackaging
STD2N80K5
DPAKTape and reel
STF2N80K5TO-220FP
2N80K5
TubeSTP2N80K5TO-220
STU2N80K5IPAK
September 2015DocID024993 Rev 31/22
This is information on a product in full production.
1. For TO-220FP limited by maximum junction temperature.
2. Pulse width limited by safe operating area.
3. ISD ≤ 2 A, di/dt ≤ 100 A/µs, peak VDS ≤ V
4. VDS ≤ 640 V
Gate- source voltage30V
Drain current (continuous) at TC = 25 °C2
Drain current (continuous) at TC = 100 °C1.3A
Drain curr ent (pulsed)8A
Total dissipation at TC = 25 °C4520W
Max current during repetitive or single pulse
avalanche (pulse wi dth limited by T
jmax
Single pulse avalanche energy
(starting TJ = 25 °C, ID=IAS, VDD= 50 V)
(3)
Peak diode recovery voltage slope4.5V/ns
(4)
MOSFET dv/dt ruggedness50V/ns
Operating junction temperature
Storage temperature°C
(BR)DSS
DPAK,
TO-220,
TO-220FP
Unit
IPAK
(1)
)
0.5A
A
60.5mJ
°C
-55 to 150
Table 3. Thermal data
SymbolParameter
R
thj-case
thj-pcb
R
thj-amb
1. When mounted on FR-4 board of 1 inch², 2 oz Cu.
Thermal resistance jun cti on- cas e2.786.252.782.78
Thermal resistance jun cti on- pcb50
Thermal resistance jun cti on- amb 62.5100
Forward on voltage ISD= 2 A, VGS=0-1.5V
Reverse recovery time
rr
Reverse recovery charge-1µC
rr
I
= 2 A, VDD= 60 V
SD
di/dt = 100 A/µs,
-255ns
Reverse recovery current-8A
Reverse recovery time
rr
Reverse recovery charge-1.45µC
rr
Reverse recovery current-7.5A
ISD= 2 A,VDD= 60 V
di/dt=100 A/µs,
Tj=150 °C
-285ns
Table 8. Gate-source Zener diode
SymbolParameterTest conditionsMin.Typ. Max.Unit
V
(BR)GSO
Gate-source breakdown voltage IGS= ± 1mA, ID= 0 30--V
The built-in back-to-back Zener diodes have been specifically designed to enhance the ESD
capability of the device. The Zener voltage is appropriate for efficient and cost-effective
intervention to protect the device integrity. These integrated Zener diodes thus eliminate the
need for external components.