• Transmitter high output power, programmable
up to +22 dBm
• Transmitter low output power, programmable
up to +15 dBm
• Compliant with the following radio frequency
regulations such as ETSI EN 300 220,
EN 300 113, EN 301 166, FCC CFR 47
Part 15, 24, 90, 101 and the Japanese ARIB
STD-T30, T-67, T-108
• Compatible with standardized or proprietary
protocols such as LoRaWAN
W-MBus and more (fully open wireless
system-on-chip)
Ultra-low-power platform
• 1.8 V to 3.6 V power supply
•
–40 °C to +105 °C temperature range
• Shutdown mode: 31 nA (V
• Standby (+ RTC) mode:
360 nA (V
• Stop2 (+ RTC) mode: 1.07 µA (V
• Active-mode MCU: < 72 µA/MHz (CoreMark
• Active-mode RX: 4.82 mA
• Active-mode TX: 15 mA at 10 dBm and 87 mA
at 20 dBm (LoRa
Core
• 32-bit Arm® Cortex®-M4 CPU
®
, (G)FSK, (G)MSK, BPSK, up to 256KB Flash, 64KB SRAM
®
, (G)FSK, (G)MSK and
–123 dBm for 2-FSK
–148 dBm for LoRa
= 3 V)
DD
®
125 kHz)
DD
®
®
, Sigfox™,
= 3 V)
= 3 V)
DD
®
Datasheet - production data
– Adaptive real-time accelerator (ART
Accelerator) allowing 0-wait-state
execution from Flash memory, frequency
up to 48 MHz, MPU and DSP instructions
– 1.25 DMIPS/MHz (Dhrystone 2.1)
• 32-bit Arm
®
Cortex®-M0+ CPU
– Frequency up to 48 MHz, MPU
– 0.95 DMIPS/MHz (Dhrystone 2.1)
update, secure firmware install and storage and management of secure keys.
These devices offer a 12-bit ADC, a 12-bit DAC low-power sample-and-hold, two
ultra-low-power comparators associated with a high-accuracy reference voltage generator.
The devices embed a low-power RTC with a 32-bit sub-second wakeup counter, one 16-bit
single-channel timer, two 16-bit four-channel timers (supporting motor control), one 32-bit
four-channel timer and three 16-bit ultra-low-power timers.
a. Arm is a registered trademark of Arm Limited (or its subsidiaries) in the US and/or elsewhere.
DS13293 Rev 111/145
14
Page 12
DescriptionSTM32WL55/54xx
These devices also embed two DMA controllers (7 channels each) allowing any transfer
combination between memory (Flash memory, SRAM1 and SRAM2) and peripheral, using
the DMAMUX1 for flexible DMA channel mapping.
The devices also feature the standard and advanced communication interfaces listed below:
•inter-processor communication controller (mailbox) and semaphores for
communication between the two Arm
®
Cortex®-M cores
•two USART (supporting LIN, smartcard, IrDA, modem control and ISO7816)
•one low-power UART (LPUART)
•three I2C (SMBus/PMBus)
•two SPIs (up to 16 MHz, one supporting I
The operating temperature/voltage ranges are
2
S)
–40 °C to +105 °C (+85 °C with radio)
(a)
from
a 1.8 V to 3.6 V power supply. A comprehensive set of power-saving modes allows the
design of low-power applications.
The devices integrate a high-efficiency SMPS step-down converter and independent power
supplies for ADC, DAC and comparator analog inputs.
A V
dedicated supply allows the LSE 32.768 kHz oscillator, the RTC and the backup
BAT
registers to be backed up. The devices can maintain these functions even if the main V
not present, through a CR2032-like battery, a supercap or a small rechargeable battery.
Feature
CPUArm
Maximum CPU frequency (MHz)48
Flash memory density (Kbytes)256
SRAM density
(Kbytes)
Radio
Radio PA
SRAM132
SRAM232
LoRa
(G)FSK
BPSK
Low output power (up to
15 dBm)
High output power (up to
22 dBm)
Table 2. Main features and peripheral count
STM32WL55Cx
STM32WL54Cx
Available on STM32WL55xx devices.
Not available on STM32WL54xx devices
STM32WL55Jx
STM32WL54Jx
Cortex-M4 and Cortex-M0
Yes(G)MSK
Yes
DD
STM32WL55Ux
STM32WL54Ux
is
General purpose4
Timer
a. Devices with suffix 6 operate up to 85 °C. Devices with suffix 7 can operate up to 105 °C except radio.
12/145DS13293 Rev 1
Low-power3
SysTick1
Page 13
STM32WL55/54xxDescription
Table 2. Main features and peripheral count (continued)
The devices embed a sub-GHz RF subsystem that interfaces with a generic microcontroller
subsystem using an Arm Cortex-M4 (called CPU1) and an Arm Cortex-M0+ (called CPU2).
An RF low-layer stack is needed and is to be run on CPU1 or CPU2, whereas the host
application code is preferably run on CPU1.
The RF subsystem communication is done through an internal SPI interface.
All secure code must be run by CPU2.
3.2 Arm Cortex-M cores
With its embedded Arm cores, the STM32WL55/54xx devices are compatible with all
Arm tools and software.
Figure 1 shows the general block diagram of the STM32WL55/54xx devices.
Arm Cortex-M4
The Arm Cortex-M4 is a processor for embedded systems. It has been developed to provide
a low-cost platform that meets the needs of MCU implementation, with a reduced pin count
and low-power consumption, while delivering outstanding computational performance and
an advanced response to interrupts.
The Arm Cortex-M4 32-bit RISC processor features exceptional code-efficiency, delivering
the high-performance expected from an Arm core in the memory size usually associated
with 8- and 16-bit devices.
This processor supports a set of DSP instructions that allow efficient signal processing and
complex algorithm execution.
Arm Cortex-M0+
The Arm Cortex-M0+ is an entry-level processor for embedded systems. It has been
developed to provide lowest power consumption in the Cortex-M family, while delivering
good computation performance and response to interrupts.
The Arm Cortex-M0+ 32-bit RISC processor features good code-efficiency with ultra-low
power consumption in the memory size usually associated with 8-bit and 16-bit devices.
The ART Accelerator is a memory accelerator that is optimized for STM32 industry-standard
Arm Cortex-M4 processor. The ART Accelerator balances the inherent performance
advantage of the Arm Cortex-M4 over Flash memory technologies, that normally require the
processor to wait for the Flash memory at higher frequencies.
To release the processor near 60 DMIPS performance at 48 MHz, the ART Accelerator
implements an instruction prefetch queue and branch cache, that increases the program
execution speed from the 64-bit Flash memory. Based on CoreMark benchmark, the
DS13293 Rev 115/145
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Functional overviewSTM32WL55/54xx
performance achieved thanks to the ART Accelerator is equivalent to 0 wait state program
execution from Flash memory at a CPU frequency up to 48 MHz.
3.4 Memory protection unit (MPU)
The memory protection unit (MPU) is used to manage the CPU1 and CPU2 accesses to
memory, to prevent one task to accidentally corrupt the memory or resources used by any
other active task. This memory area is organized into up to eight protected areas that can in
turn be divided up into eight subareas. The protection area sizes are between 32 bytes and
the whole 4 Gbytes of addressable memory.
The MPU is especially helpful for applications where some critical or certified code must be
protected against the misbehavior of other tasks. It is usually managed by an RTOS (realtime operating system). If a program accesses a memory location that is prohibited by the
MPU, the RTOS can detect it and take action. In an RTOS environment, the kernel can
dynamically update the MPU area setting, based on the process to be executed.
The MPU is optional and can be bypassed for applications that do not need it.
3.5 Memories
3.5.1 Embedded Flash memory
The Flash memory interface manages the accesses from CPU1 AHB ICode/DCode and
CPU2 AHB Sbus to the Flash memory. It implements the access, the erase and program
Flash memory operations, and the read and write protection.
The main features of the Flash memory are listed below:
•Memory organization: 1 bank
–main memory: up to 256 Kbytes
–page size: 2 Kbytes
•72-bit wide data read (64 bits plus 8 ECC bits)
•72-bit wide data write (64 bits plus 8 ECC bits)
•Page erase and mass erase
Flexible protections can be configured thanks to option bytes:
•Readout protection (RDP) to protect the whole memory. Three levels are available:
–Level 0: no readout protection
–Level 1: memory readout protection. The Flash memory cannot be read from or
written to if either debug features are connected, boot in SRAM or bootloader is
selected.
–Level 2: chip readout protection. Debug features (JTAG and serial wire), boot in
SRAM and bootloader selection are disabled (JTAG fuse). This selection can only
be reverted by the secure CPU2.
16/145DS13293 Rev 1
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STM32WL55/54xxFunctional overview
Table 3. Access status versus RDP level and execution mode
Area
Main memory
System memory
Option bytes
Backup registers
SRAM2
1. The option byte can be modified by the sub-GHz radio.
2. Erased when RDP changes from Level 1 to Level 0.
RDP
level
ReadWriteEraseReadWriteErase
1YesYesYesNoNoNo
2YesYesYesNANANA
1YesNoNoYesNoNo
2YesNoNoNANANA
1YesYesYesYesYesYes
2Yes No
1YesYes NA
2YesYesNANANANA
1YesYesYes
2YesYesYesNANANA
User execution
(1)
•Write protection (WRP): the protected area is protected against erasing and
programming. Two areas can be selected, with 4-Kbyte granularity.
•Proprietary code readout protection (PCROP): two parts of the Flash memory can be
protected against read and write from third parties. The protected area is execute-only:
it can only be reached by the STM32 CPU1/2, as an instruction code, while all other
accesses (DMA, debug and CPU1/2 data read, write and erase) are strictly prohibited.
Two areas can be selected, with 2-Kbyte granularity. An additional option bit
(PCROP_RDP) is used to select if the PCROP area is erased or not when the RDP
protection is changed from Level 1 to Level 0.
No
(1)
(2)
(2)
Debug, boot from SRAM or boot from
system memory (loader)
NANANA
NoNoNA
NoNoNo
(2)
(2)
A section of the Flash memory can be secured for CPU2, and, in that case, cannot be
accessed by CPU1.
The whole non-volatile memory embeds the error correction code (ECC) feature supporting:
•single error detection and correction
•double error detection
•address of the ECC fail can be read in the FLASH_ECCR register
The embedded Flash memory is shared between CPU1 and CPU2 on a time sharing basis.
A dedicated hardware mechanism allows both CPUs to suspend write/erase operations.
3.5.2 Embedded SRAM
The devices feature up to 64 Kbytes of embedded SRAM, split in two blocks:
•SRAM1: up to 32 Kbytes mapped at address 0x2000 0000
•SRAM2: up to 32 Kbytes located at address 0x2000 8000 (contiguous to SRAM1), also
mirrored at 0x1000 0000, with hardware parity check (this SRAM can be retained in
Standby mode)
The SRAMs can be accessed in read/write with 0 wait states for all CPU1/2 clock speeds.
DS13293 Rev 117/145
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Functional overviewSTM32WL55/54xx
3.6 Security memory management
The devices contain many security blocks both for the sub-GHz MAC layer and the Host
application, such as:
•securable RNG
•customer keys storage
•secure Flash memory partition for CPU2 only access
•secure SRAM partition, that can be accessed only by CPU2
–modular arithmetic including exponentiation with maximum modulo size of
3136 bits
–elliptic curves over prime field scalar multiplication, ECDSA signature, ECDSA
verification with maximum modulo size of 521 bits
•cyclic redundancy check calculation unit (CRC)
3.7 Boot modes
At startup, BOOT0 pin and BOOT1 option bit are used to select one of the following boot
options:
•Boot from user Flash memory
•Boot from boot system memory (where embedded bootloader is located)
•Boot from embedded SRAM
•Boot from system memory (where the embedded SFI is located)
The bootloader makes possible to download code from USART or SPI.
3.8 Global security controller (GTZC)
The GTZC includes the following sub-blocks:
•TZSC: security controller
This sub-block defines the secure/privileged state of slave peripherals. It also controls
the unprivileged area size for the watermark memory peripheral controller (MPCWM).
•TZIC: security illegal access controller
This sub-block gathers all illegal access events in the system and generates a secure
interrupt towards the secure CPU2 NVIC.
These sub-blocks are used to configure the system security and privilege such as:
•on-chip Flash memory and RAM with programmable privileged protection on both
secure and non-secure memory areas
•AHB and APB peripherals with programmable security and/or privileged access
18/145DS13293 Rev 1
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STM32WL55/54xxFunctional overview
MSv62614V1
Sub-GHz radio
Sub-GHz
RF frontend
Radio
control
SUBGHZSPI
hse32
Interrups
RFO_LP
RFO_HP
RFI_P
RFI_N
FSK
modem
LoRa
modem
(note)
Data
and
control
HSE32
OSC_IN
OSC_OUT
BUSY
HSERDY
HSEON
HSEBYPPWR
Note: LoRa modem is only available on STM32WL55xx devices.
VR_PA
VDDPA
PB0_VDDTCXO
3.9 Sub-GHz radio
3.9.1 Introduction
The sub-GHz radio is an ultra-low-power sub-GHz radio operating in the 150 - 960 MHz ISM
band. LoRa, (G)FSK/(G)MSK modulation in transmit and receive, and (D)BPSK in transmit
only, allow an optimal trade-off between range, data rate and power consumption. This subGHz radio is compliant with the LoRaWAN
ETSI EN 300 220, EN 300 113, EN 301 166, FCC CFR 47 part 15, 24, 90, 101 and the ARIB
STD-T30, T-67, T-108.
The sub-GHz radio consists of:
•an analog front-end transceiver, capable of outputting up to + 15 dBm maximum power
on its RFO_LP pin and up to + 22 dBm maximum power on RFO_HP pin
•a digital modem bank providing the following modulation schemes:
–LoRa Rx/Tx with bandwidth (BW) from 7.8 - 500 kHz, spreading factor (SF)
5 - 12, bit rate (BR) from 0.013 to 17.4 Kbit/s (real bitrate)
–FSK and GFSK Rx/Tx with BR from 0.6 to 300 Kbit/s
–(G)MSK Tx with BR from 0 to 10 Kbit/s
–BPSK and DBPSK TX only with bitrate for 100 and 600 bit/s
•a digital control including all data processing and sub-GHz radio configuration control
•a high-speed clock generation
®
specification v1.0 and radio regulations such as
3.9.2 General description
The sub-GHz radio provides an internal processing unit to handle communication with the
system CPU. Communication is handled by commands sent over the SPI interface, and a
set of interrupts is used to signal events. BUSY information signals operation activity and is
used to indicate when the sub-GHz radio commands cannot be received.
The block diagram of the sub-GHz radio system is shown in the figure below.
Figure 2. sub-GHz radio system block diagram
DS13293 Rev 119/145
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Functional overviewSTM32WL55/54xx
MSv62616V2
VLXSMPS
VFBSMPS (1.55V)
VDDPA
VR_PA (up to 3.1V)
RFO_HP
LDO/SMPS
REG
PA
HP PA
VLXSMPS
VFBSMPS (1.55V)
VDDPA
VR_PA (up to 3.1V)
RFO_HP
LDO/SMPS
REG
PA
HP PA
V
DD
V
DD
V
DD
V
DD
VDDSMPS (1.8 to 3.6V)VDDSMPS (1.8 to 3.6V)
LDO mode
SMPS mode
Note: Use of the SMPS is optional. When SMPS is not used, the BOM can be reduced by removing the coil
between VLXSMPS and VFBSMPS pins.
3.9.3 Transmitter
The transmit chain comprises the modulated output from the modem, that directly
modulates the RF-PLL. An optional pre-filtering of the bit stream can be enabled to reduce
the power in the adjacent channel also dependent on the selected modulation scheme. The
modulated signal from the RF-PLL directly drives the high output power PA (HP PA) or low
output power PA (LP PA).
Transmitter high output power
Transmit high output power up to + 22 dBm, is supported through the RFO_HP RF pin.
For this, the REG PA must be supplied directly from V
on VDDSMPS pin, as shown in the
DD
figure below.
The output power range is programmable in 32 steps of ~ 1 dB. The power amplifier
ramping timing is also programmable.This allows adaptation to meet radio regulation
requirements.
Figure 3. High output power PA
The table below gives the maximum transmit output power versus the V
V
DDPA
Table 4. Sub-GHz radio transmit high output power
supply (V)Transmit output power (dBm)
3.3+ 22
20/145DS13293 Rev 1
2.7+ 20
2.4+ 19
1.8+ 16
supply level.
DDPA
Page 21
STM32WL55/54xxFunctional overview
MSv62617V2
Note: Use of the SMPS is optional. When SMPS is not used, the BOM can be reduced by removing the coil
between VLXSMPS and VFBSMPS pins.
VLXSMPS
VFBSMPS (1.55V)
VDDPA
VR_PA (up to 1.35V)
RFO_LP
LDO/SMPS
REG
PA
LP PA
LDO modeSMPS mode
VDDSMPS (1.8 to 3.6V)
V
DD
VLXSMPS
VFBSMPS (1.55V)
VDDPA
VR_PA (up to 1.35V)
RFO_LP
LDO/SMPS
REG
PA
V
DD
LP PA
VDDSMPS (1.8 to 3.6V)
Transmitter low output power
The transmit low output power up to + 15 dBm on full VDD range (1.8 to 3.6 V), is supported
through the RFO_LP RF pin. For this, the REG PA must be supplied from the regulated
V
FBSMPS
The output power range is programmable in 32 steps of ~1 dB. The power amplifier ramping
timing is also programmable.This allows adaptation to meet radio regulation requirements.
supply at 1.55 V, as shown in the figure below.
Figure 4. Low output power PA
3.9.4 Receiver
3.9.5 RF-PLL
The receive chain comprises a differential low-noise amplifier (LNA), a down-converter to
low-IF by mixer operation in quadrature configuration. The I and Q signals are low pass
filtered and a ADC converts them into the digital domain. In the digital modem, the
signals are decimated, further down converted and channel filtered. The demodulation is
done according to the selected modulation scheme.
The down mixing to low-IF is done by mixing the receive signal with the local RF-PLL
located in the negative frequency, where -f
frequency, f
is located at f
is the received signal and fif is the intermediate frequency). The wanted signal
rf
= flo + fif.
rf
= -frf + -fif. (where flo is the local RF-PLL
lo
The receiver features automatic I and Q calibration, that improves image rejection. The
calibration is done automatically at startup before using the receiver, and can be requested
by command.
The receiver supports LoRa, (G)MSK and (G)FSK modulations.
The RF-PLL is used as the frequency synthesizer for the generation of the local oscillator
frequency (f
) for both transmit and receive chains. The RF-PLL uses auto calibration and
lo
DS13293 Rev 121/145
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Functional overviewSTM32WL55/54xx
uses the 32 MHz HSE32 reference. The sub-GHz radio covers all continuous frequencies in
the range between 150 to 960 MHz.
3.9.6 Intermediate frequencies
The sub-GHz radio receiver operates mostly in low-IF configuration, except for specific highbandwidth settings.
The devices embed two different regulators: one LDO and one DC/DC (SMPS). The SMPS
can be optionally switched-on by software to improve the power efficiency. As LDO and
SMPS operate in parallel, the SMPS switch-on is transparent to the user and only the power
efficiency is affected.
3.10.1 Power supply schemes
The devices require a V
independent supplies (V
peripherals:
•V
= 1.8 V to 3.6 V
DD
V
is the external power supply for the I/Os, the system analog blocks such as reset,
DD
power management, internal clocks and low-power regulator. It is provided externally
through VDD pins.
•V
DDSMPS
V
DDSMPS
= 1.8 V to 3.6 V
is the external power supply for the SMPS step-down converter. It is provided
externally through VDDSMPS supply pin and must be connected to the same supply as
V
.
DD
•V
FBSMPS
V
FBSMPS
= 1.45 V to 1.62 V (1.55 V typical)
is the external power supply for the main system regulator. It is provided
externally through VFBSMPS pin and is supplied through the SMPS step-down
converter.
•V
= 0 V to 3.6 V (DAC minimum voltage is 1.71 V without buffer and 1.8 V with
DDA
buffer. COMP and ADC minimum voltage is 1.62 V. VREFBUF minimum voltage is
2.4 V)
V
is the external analog power supply for A/D converters, D/A converters, voltage
DDA
reference buffer, and comparators. The V
voltage (see power-up and power-down limitations below) and must preferably be
connected to V
•V
DDRF
V
DDRF
= 1.8 V to 3.6 V
is an external power supply for the radio. It is provided externally through the
DD
VDDRF pin and must be connected to the same supply as V
•V
DDRF1V5
V
DDRF1V5
= 1.45 V to 1.62 V
is an external power supply for the radio. It is provided externally through the
operating voltage supply between 1.8 V and 3.6 V. Several
DD
DDSMPS
, V
FBSMPS
when these peripherals are not used.
, V
if
DDA
DDA
, V
) can be provided for specific
DDRF
voltage level is independent from the V
.
DD
(kHz)
DD
DS13293 Rev 123/145
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Functional overviewSTM32WL55/54xx
MSv68044V1
0.3
1
V
BOR0
3.6
Operating modePower-onPower-downtime
V
V
DDA
V
DD
Invalid supply areaV
DDA
< V
DD
+ 300 mV
V
DDA
independent from V
DD
VDDRF1V5 pin and must be connected externally to VFBSMPS.
•V
•VREF-, VREF
= 1.55 V to 3.6 V
BAT
V
is the power supply for RTC, TAMP, external clock 32 kHz oscillator and backup
BAT
registers (through power switch) when V
+
V
is the input reference voltage for ADC and DAC. It is also the output of the
REF+
is not present.
DD
internal voltage reference buffer when enabled.
–When V
–When V
V
can be grounded when ADC/DAC is not active. The internal voltage reference
REF+
DDA
DDA
< 2 V, V
2 V, V
must be equal to V
REF+
must be between 2 V and V
REF+
DDA
.
.
DDA
buffer supports the following output voltages, configured with VRS bit in the
VREFBUF_CSR register:
–V
–V
around 2.048 V: this requires V
REF+
around 2.5 V: this requires V
REF+
DDA
2.4 V.
DDA
2.8 V.
During power up and power down, the following power sequence is required:
1.When V
During power down, V
< 1 V other power supplies (V
DD
can temporarily become lower then other supplies only if the
DD
) must remain below V
DDA
+ 300 mV.
DD
energy provided to the device remains below 1 mJ. This allows external decoupling
capacitors to be discharged with different time constants during this transient phase.
2. When V
An embedded linear voltage regulator is used to supply the internal digital power V
V
is the power supply for digital peripherals, SRAM1 and SRAM2. The Flash memory
CORE
is supplied by V
part V
DDI
.
> 1 V, all other power supplies (V
DD
CORE
and VDD. V
is split in two parts: V
CORE
) become independent.
DDA
part and an interruptible
DDO
CORE
.
Figure 5.
Note:VDD, V
sequence.
DDRF
and V
DDSMPS
must be wired together, so they can follow the same voltage
Power-up/power-down sequence
24/145DS13293 Rev 1
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STM32WL55/54xxFunctional overview
MSv50973V1
LDO/SMPS
MR
V
DD
V
LXSMPS
V
FBSMPS
V
BKP
V
DDO
V
DDI
V
BAT
V
RF
V
MAIN
V
LP
V
SW
POR
mode
FW mode
en
RFLDO
V
DDSMPS
V
DDRF1V5
LPR
MSv50974V1
LDO/SMPS
LDO/SMPS supplyLDO supply
RF
LDO
MRLPR
V
DDRF1V5
V
FBSMPS
V
LXSMPS
V
DDSMPS
V
DD
LDO/SMPS
RF
LDO
MRLPR
V
DDRF1V5
V
FBSMPS
V
LXSMPS
V
DDSMPS
V
DD
Figure 6. Power supply overview
The different supply configurations are shown in the figure below.
Figure 7. Supply configurations
DS13293 Rev 125/145
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Functional overviewSTM32WL55/54xx
The LDO or SMPS step-down converter operating mode can be configured by one of the
following:
•by the MCU using the SMPSEN setting in PWR control register 5 (PWR_CR5), that
depends upon the MCU system operating mode (Run, Stop, Standby or Shutdown).
•by the sub-GHz radio using SetRegulatorMode() command and the sub-GHz radio
operating mode (Sleep, Calibrate, Standby, Standby with HSE32 or Active).
After any POR and NRST reset, the LDO mode is selected. The SMPS selection has priority
over LDO selection.
While the sub-GHz radio is in Standby with HSE32 or in Active mode, the supply mode is
not altered until the sub-GHz radio enters Standby or Sleep mode. The sub-GHz radio
activity may add a delay for entering the MCU software requested supply mode.
The LDO or SMPS supply mode can be checked with the SMPSRDY flag in power status
register 2 (PWR_SR2).
Note:When the radio is active, the supply mode is not changed until after the radio activity is
finished.
During Stop 1, Stop 2 and Standby modes, when the sub-GHz radio is not active, the LDO
or SMPS step-down converter is switched off. When exiting low-power modes (except
Shutdown), the SMPS step-down converter is set by hardware to the mode selected by the
SMPSEN bit in PWR control register 5 (PWR_CR5). SMPSEN is retained in Stop and
Standby modes.
Independently from the MCU software selected supply operating mode, the sub-GHz radio
allows the supply mode selection while the sub-GHz radio is active (thanks to the sub-GHz
radio SetRegulatorMode()command).
The maximum load current delivered by the SMPS can be selected by the sub- GHz radio
SUBGHZ_SMPSC2R register.
The inrush current of the LDO and SMPS step-down converter can be controlled via the
sub- GHz radio SUBGHZ_PCR register. This information is retained in all but the sub-GHz
radio Deep-sleep mode.
The SMPS needs a clock to be functional. If for any reason this clock stops, the device may
be destroyed. To avoid this situation, a clock detection is used to, in case of a clock failure,
switch off the SMPS and enable the LDO. The SMPS clock detection is enabled by the subGHz radio SUBGHZ_SMPSC0R.CLKDE. By default, the SMPS clock detection is disabled
and must be enabled before enabling the SMPS.
Danger:Before enabling the SMPS, the SMPS clock detection must be
enabled in the sub-GHz radio SUBGHZ_SMPSC0R.CLKDE.
3.10.2 Power supply supervisor
The devices integrate a power-on reset/power-down reset, coupled with a Brownout reset
(BOR) circuitry.
BOR0 level cannot be disabled. Other BOR levels can be enabled by user option. When
enabled, BOR is active in all power modes except in Shutdown
26/145DS13293 Rev 1
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STM32WL55/54xxFunctional overview
Five BOR thresholds can be selected through option bytes.
During power-on, BOR keeps the device under reset until the supply voltage V
the specified V
•When V
•When V
DD
DD
threshold:
BORx
drops below the selected threshold, a device reset is generated.
is above the V
can start.
The devices feature an embedded PVD (programmable voltage detector) that monitors the
V
power supply and compares it with the V
DD
when V
drops below the V
DD
PVD
threshold. The interrupt service routine can then generate a warning message and/or put
the MCU into a safe state.
The PVD is enabled by software and can be configured to monitor the V
needed for the sub-GHz radio operation. For this, the PVD must select its lowest threshold,
and the PVD and the wakeup must be enabled by the EWPVD bit in PWR_CR3 register.
Only a voltage drop below the PVD level generates a wakeup event.
In addition, the devices embed a PVM (peripheral voltage monitor) that compares the
independent supply voltage V
functional supply range.
Finally, a radio end-of-life monitor provides information on the V
low to operate the sub-GHz radio. When reaching the EOL level, the software must stop all
radio activity in a safe way.
3.10.3 Linear voltage regulator
reaches
DD
upper limit, the device reset is released and the system
BORx
threshold. An interrupt can be generated
threshold and/or when VDD is higher than the V
with a fixed threshold to ensure that the peripheral is in its
DDA
PVD
DD
supply when V
DD
PVD
supply level
DD
is too
Two embedded linear voltage regulators supply all the digital circuitries, except for the
Standby circuitry and the Backup domain. The main regulator (MR) output voltage (V
can be programmed by software to two different power ranges (range 1 and range 2), to
optimize the consumption depending on the system maximum operating frequency.
The voltage regulators are always enabled after a reset. Depending on the application
modes, the V
supply is provided either by the main regulator or by the low-power
CORE
regulator (LPR).
When MR is used, a dynamic voltage scaling is proposed to optimize power as follows:
•range 1: high-performance range
The system clock frequency can be up to 48 MHz. The Flash memory access time for
read access is minimum. Write and erase operations are possible.
•range 2: low-power range
The system clock frequency can be up to 16 MHz.The Flash memory access time for a
read access is increased as compared to range 1. Write and erase operations are
possible.
Note:MR is supplied by VDD during power-on or at wakeup from Stop1, Stop2, Standby or
Shutdown mode. MR is powered by LDO/SMPS after these transition phases.
3.10.4 VBAT operation
The VBAT pin is used to power the device V
from an external battery, an external super-capacitor, or from V
domain (RTC, LSE and backup registers)
BAT
when no external battery
DD
CORE
)
DS13293 Rev 127/145
48
Page 28
Functional overviewSTM32WL55/54xx
nor an external super-capacitor are present. Three anti-tamper detection pins are available
in VBAT mode.
VBAT operation is automatically activated when V
An internal V
battery charging circuit is embedded and can be activated when VDD is
BAT
present.
Note:When the microcontroller is supplied only from V
alarm/events do not exit it from VBAT operation.
3.11 Low-power modes
The devices support several low-power modes to achieve the best compromise between
low-power consumption, short startup time, available peripherals and available wakeup
sources.
By default, the microcontroller is in Run mode, range 1, after a system or a power-on reset.
It is up to the user to select one of the low-power modes described below:
•Sleep mode: CPU clock off, all peripherals including CPU core peripherals (among
them NVIC, SysTick) can run and wake up the CPU when an interrupt or an event
occurs.
•Low-power run mode (LPRun): when the system clock frequency is reduced below
2 MHz. The code is executed from the SRAM or from the Flash memory. The regulator
is in low-power mode to minimize the operating current.
•Low-power sleep mode (LPSleep): entered from the LPRun mode.
•Stop 0 and Stop 1 modes: the content of SRAM1, SRAM2 and of all registers is
retained. All clocks in the V
disabled. LSI and LSE can be kept running.
RTC can remain active (Stop mode with RTC, Stop mode without RTC). The sub-GHz
radio may remain active independently from the CPUs.
Some peripherals with the wakeup capability can enable HSI16 RC during the Stop
mode to detect their wakeup condition.
Stop 1 offers the largest number of active peripherals and wakeup sources, a smaller
wakeup time but a higher consumption compared with Stop 2.
In Stop 0 mode, the main regulator remains on, resulting in the fastest wakeup time but
with much higher consumption. The active peripherals and wakeup sources are the
same as in Stop 1 mode that uses the low-power regulator.
The system clock, when exiting Stop 0 or Stop 1 mode, can be either MSI up to 48 MHz
or HSI16, depending on the software configuration.
•Stop 2 mode: part of the V
and some peripherals preserve their contents (see Table 7).
All clocks in the V
domain are stopped. PLL, MSI, HSI16 and HSE32 are disabled.
CORE
LSI and LSE can be kept running.
RTC can remain active (Stop 2 mode with RTC, Stop 2 mode without RTC). The subGHz radio may also remain active independent from the CPUs.
Some peripherals with the wakeup capability can enable HSI16 RC during the Stop 2
mode to detect their wakeup condition (see Tab le 7).
The system clock when exiting from Stop 2 mode, can be either MSI up to 48 MHz or
domain are stopped. PLL, MSI, HSI16 and HSE32 are
CORE
domain is powered off. Only SRAM1, SRAM2, CPUs
CORE
is not present.
DD
, external interrupts and RTC
BAT
28/145DS13293 Rev 1
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STM32WL55/54xxFunctional overview
HSI16, depending on the software configuration.
•Standby mode: V
domain is powered off. However, it is possible to preserve the
CORE
SRAM2 content as detailed below:
–Standby mode with SRAM2 retention when the RRS bit is set in the PWR control
register 3 (PWR_CR3). In this case, SRAM2 is supplied by the low-power
regulator.
–Standby mode when the RRS bit is cleared in the PWR control register 3
(PWR_CR3). In this case the main regulator and the low-power regulator are
powered off.
All clocks in the V
domain are stopped. PLL, MSI, HSI16 and HSE32 are disabled.
CORE
LSI and LSE can be kept running.
Th RTC can remain active (Standby mode with RTC, Standby mode without RTC). The
sub-GHz radio and the PVD may also remain active when enabled independent from
the CPUs. In Standby mode, the PVD selects its lowest level.
The system clock, when exiting Standby modes, is MSI at 4 MHz.
•Shutdown mode: V
domain is powered off. All clocks in the V
CORE
domain are
CORE
stopped. PLL, MSI, HSI16, LSI and HSE32 are disabled. LSE can be kept running. The
system clock when exiting the Shutdown mode, is MSI at 4 MHz. In this mode, the
supply voltage monitoring is disabled and the product behavior is not guaranteed in
case of a power voltage drop.
The table below summarizes the peripheral features over all available modes. Wakeup
capability is detailed in gray cells.
Table 7. Functionalities depending on system operating mode
Stop 0Stop 1Stop 2Standby Shutdown
Peripheral
Run
Sleep
LPRun
-
LPSleep
Wakeup capability
-
Wakeup capability
-
Wakeup capability
CPU1YRYRR-R-R---- --
CPU2YRYRR
Sub-GHz radio systemOOOOO
(2)
Flash memory
(256 Kbytes)
(2)O(3)
YO
O
(3)
-R-R---- --
OOOOOOO- --
R-R-R-R-R -R
Flash memory interfaceYYYYR-R-R---- --
SRAM1YO
SRAM2 YO
(2)
(2)
Backup registersYYYYR
Brownout reset (BOR)YYYYY
Programmable voltage
detector (PVD)
OOOOO
(2)
YO
(2)
YO
R-R-R---- --
R-R-R-O
-R-R-R-R -R
YYYYYYY- --
OOOOOO
(1)
-
-
Wakeup capability
(4)
-- --
(5)O(5)
---
VBAT
Wakeup capability
DS13293 Rev 129/145
48
Page 30
Functional overviewSTM32WL55/54xx
Table 7. Functionalities depending on system operating mode
Peripheral
Peripheral voltage monitor
(PVM3)
DMAx (x = 1, 2)OOOOR
DMAMUX1OOOOR
High-speed internal (HSI16)OOOOO
High-speed external (HSE32)OOO
Low-speed internal (LSI)OOOOO
Low-speed external (LSE)OOOOO
Multi-speed internal (MSI)OOOOO
Clock security system (CSS)OOOOR
Clock security system on LSEOOOOO
Run
Sleep
LPRun
LPSleep
OOOOO
(7)O(7)O(7)
(1)
(continued)
Stop 0Stop 1Stop 2Standby Shutdown
-
Wakeup capability
-
Wakeup capability
-
Wakeup capability
-
Wakeup capability
-
Wakeup capability
OOOOO- -- --
-R------ --
-R------ --
(6)
(6)
-O
(7)
-O
(6)
-O
(7)
-O
---- --
(7)
-O
-- --
-O-O-O-- --
-O-O-O-O -O
-O-O---- --
-R------ --
OOOOOOO- --
VBAT
RTC/auto wakeupOOOOO
Number of tamper pins33333
USARTx (x= 1, 2)OOOOO
Low-power UART (LPUART1)OOOOO
I2Cx (x = 1, 2)OOOOO
I2C3OOOOO
SPI1OOOOR
SUBGHZSPIOOOOR
SPI2S2OOOOR
ADCOOOOR
DACOOOOR
VREFBUFOOOOO
COMPx (x = 1, 2)OOOOO
Temperature sensorOOOOR
TIMx (x = 1, 2, 16, 17)OOOOR
LPTIM1OOOOO
LPTIMx (x = 2, 3)OOOOO
Independent watchdog
(IWDG)
OOOOOOOOOOOO- --
OOOOOOOO OO
O3O3O3O3 O3
(8)O(8)O(8)O(8)
(8)O(8)O(8)O(8)O(8)O(8)
(9)O(9)O(9)O(9)
(9)O(9)O(9)O(9)O(9)O(9)
----- --
--- --
----- --
--- --
-R------ --
-R------ --
-R------ --
-R------ --
-R------ --
-O-R---- --
OOOOO- -- --
-R------ --
-R------ --
OOOOO- -- --
OOO- ---- --
30/145DS13293 Rev 1
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STM32WL55/54xxFunctional overview
Table 7. Functionalities depending on system operating mode
(1)
(continued)
Stop 0Stop 1Stop 2Standby Shutdown
Peripheral
Run
Sleep
LPRun
-
LPSleep
Wakeup capability
-
Wakeup capability
-
Wakeup capability
-
-
Wakeup capability
VBAT
Wakeup capability
Window watchdog (WWDG)OOOOR-R-R---- --
SysTick timerOOOOR
True random number
generator (RNG)
O
(10)
(1
O
RRR-R------ --
0)
-R-R---- --
AES hardware acceleratorOOOOR-R------ --
PKA hardware acceleratorOOOOR
CRC calculation unitOOOOR
IPCCORORR
HSEMORORR
GTZC TZSCORORR
GTZC TZICORORR
-R------ --
-R-R---- --
-R-R---- --
-R------ --
-R-R---- --
-R-R---- --
EXTIOOOOR
GPIOsOOOOOOOOOO
1. Legend: Y = Yes (enabled). O = Optional (disabled by default and can be enabled by software). R = data retained.
- = Not available. Gray cells indicate wakeup capability.
2. The SRAM clock can be gated on or off.
3. Flash memory can be placed in power-down mode.
4. The SRAM2 content can optionally be retained when the PWR_CR3.RRS bit is set.
5. Only when the sub-GHz radio is active.
6. Some peripherals with wakeup from Stop capability can request HSI16 to be enabled. In this case, HSI16 is woken up by
the peripheral, and only feeds the peripheral that requested it. HSI16 is automatically put off when the peripheral does not
need it anymore.
7. HSE32 can be used by sub-GHz radio system.
8. USART reception is functional in Stop 0 and Stop 1 modes. LPUART1 reception is functional is Stop 0, Stop 1, and Stop 2
modes. LPUART1 generates a wakeup interrupt on Start address match or received frame event.
9. I2Cx (x= 1, 2) address detection is functional in Stop 0 and Stop 1 modes. I2C3 address detection is functional in Stop 0,
Stop 1 and Stop 2 modes. I2C3 generates a wakeup interrupt in case of address match.
10. Voltage scaling range 1 only.
11. I/Os can be configured with internal pull-up, pull-down or floating in Standby mode.
12. The I/Os with wakeup from Standby/Shutdown capability are PA0, PC13 and PB3.
13. I/Os can be configured with internal pull-up, pull-down or floating in Shutdown mode, but the configuration is lost when
exiting the Shutdown mode.
ORORO- -- --
R
(11)
3
pin
s
(12)
(13)
3
pins
(12)
-
DS13293 Rev 131/145
48
Page 32
Functional overviewSTM32WL55/54xx
Mode nameEntry
Sleep
(Sleep-now or
Sleep-on-exit)
WFI or return
from ISR
WFEWakeup event
Table 8. Low-power mode summary
Wakeup
(1)
source
Any interrupt
LPRunSet LPR bit Clear LPR bit
Set LPR bit +
LPSleep
WFI or return
from ISR
Set LPR bit +
WFE
Any interrupt
Wakeup eventOFFON
LPMS = 0b000 +
Stop 0
SLEEPDEEP bit
+ WFI or return
from ISR or WFE
Any EXTI line
(configured in the
EXTI registers).
Specific
peripherals
events
Stop 1
Stop 2
(with I2C3,
LPUART1,
LPTIM1,
SRAM1,
LPMS = 0b001 +
SLEEPDEEP bit
+ WFI or return
from ISR or WFE
LPMS = 0b010+
SLEEPDEEP bit
+ WFI or return
from ISR or WFE
SRAM2)
Wakeup
system clock
Same as before
entering Sleep mode
Same as LPRun
clock
Same as before
entering LPSleep
mode
HSI16 when
STOPWUCK = 1 in
RCC_CFGR.
MSI with the
frequency before
entering the Stop
mode when
STOPWUCK = 0.
Vol tage
Effect on clocks
regulators
MRLPR
CPU clock OFF
No effect on other clocks
ONON
or analog clock sources
NoneOFFON
CPU clock OFF
OFFON
No effect on other clocks
or analog clock sources
ON
All clocks OFF
except HSI16, LSI and
ON
LSE
OFF
LPMS = 0b011+
Standby (with
SRAM2)
Standby
Set RRS bit +
SLEEPDEEP bit
+ WFI or return
from ISR or WFE
LPMS = 0b011 +
Clear RRS bit +
SLEEPDEEP bit
+ WFI or return
Wakeup PVD,
RFIRQ, wakeup
RFBUSY, WKUP
pin edge, RTC
and TAMP event,
LSECSS,
external reset in
NRST pin,
IWDG reset
MSI 4 MHz
from ISR or WFE
LPMS = 0b1xx +
Shutdown
SLEEPDEEP bit
+ WFI or return
from ISR or WFE
1. Refer to Table 7: Functionalities depending on system operating mode.
WKUP pin edge,
RTC and TAMP
event, external
reset in NRST
pin
MSI 4 MHz
32/145DS13293 Rev 1
All clocks OFF
except LSI and LSE
All clocks OFF
except LSE
OFFON
OFF OFF
OFF OFF
Page 33
STM32WL55/54xxFunctional overview
Relation between MCU and sub-GHz radio operating modes
The CPUs and sub-GHz radio have their own operating modes (see the table below).
Table 9. MCU and sub-GHz radio operating modes
CPU operating mode
Run, Sleep
Sub-GHz radio operating modeDescription
Sleep, Calibration, Standby, Active
(FS, TX,
RX)
(1)
Deep-Sleep
LDO or SMPS regulator active, MCU running in
main regulator (MR) mode
LDO and SMPS regulator off, MCU running in low
power regulator (LPR) mode
LPRun, LPSleep
Stop 0
Sleep, Calibration, Standby, Active
(FS, TX, RX)
Sleep, Calibration, Standby, Active
(FS, TX,
RX)
(1)
Deep-Sleep
LDO or SMPS regulator active, MCU running in low
power regulator (LPR) mode
LDO or SMPS regulator active, MCU running in
main regulator (MR) mode
LDO and SMPS regulator off, MCU using low power
regulator (LPR) mode
Stop 1 and Stop 2
Sleep, Calibration, Standby, Active
(FS, TX, RX)
Deep-Sleep
LDO or SMPS regulator active, MCU using low
power regulator (LPR) mode
LDO and SMPS regulator off, MCU regulator off or
on in low power (LPR) mode
(2)
.
Standby
Sleep, Calibration, Standby, Active
(FS, TX, RX)
ShutdownDeep-Sleep
1. In the MCU Run, Sleep and Stop 0 modes, the sub-GHz radio is prevented from entering Deep-sleep mode.
2. When retaining SRAM2 in Standby mode, the MCU uses the low-power regulator (LPR) mode.
3. When the CPU is in Shutdown mode, the sub-GHz radio cannot be activated and is forced in Deep-sleep mode.
(3)
LDO or SMPS regulator active, MCU regulator off or
on in low power (LPR) mode
(2)
LDO and SMPS regulator off, MCU regulator off
3.11.1 Reset mode
In order to improve the consumption under reset, the I/Os state under and after reset is
"analog state" (the I/O Schmitt trigger is disabled). In addition, the internal reset pull-up is
deactivated when the reset source is internal.
This excludes the five serial-wire JTAG debug ports that are in pull-up/pull-down after reset.
3.12 Peripheral interconnect matrix
Several peripherals have direct connections between them. This allows autonomous
communication between peripherals, saving CPU resources and, consequently, reducing
power-supply consumption. In addition, these hardware connections allow fast and
predictable latency.
Depending on peripherals, these interconnections can operate in Run, Sleep, LPRun,
LPSleep, Stop 0, Stop 1 and Stop 2 modes.
DS13293 Rev 133/145
48
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Functional overviewSTM32WL55/54xx
Table 10. Peripherals interconnect matrix
(1) (2)
Destination
Source
ADC
TIM1
TIM2
TIM16
TIM17
LPTIM1
LPTIM2
LPTIM3
DAC
COMP1
COMP2
DMAMUX1
TIM1-X----- XXXX ---
TIM2X
TIM16
TIM17X
LPTIM1
LPTIM2
LPTIM3
ADCX
Temperature
sensor
(3)
VBAT
VREFINT
HSE32
------ XXXX ---
------------X-
-----------X-
------X-X--X--
------X-X--X--
-----------X-X
------------
-------X------
-------X------
-------X------
---X----------
IRTIM
SUBGHZSPI
LSE
MSI
LSI
MCO
GPIO EXTI
RTC
TAMP
COMP1XXXXXX
COMP2XXXXXX
SYST ERRX
1. For more details, refer to section “Interconnection details” of the reference manual.
2. The “-” symbol in grayed cells means no interconnect.
3. VDD on STM32WL55/4UxYx devices.
-XX-----------
---X----------
--X-----------
---X----------
-------XX--X--
--X-XX--------
----XX--------
--------
--------
-XX----------
34/145DS13293 Rev 1
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STM32WL55/54xxFunctional overview
3.13 Reset and clock controller (RCC)
The following different clock sources can be used to drive the system clock (SYSCLK):
•MSI (multi-speed internal) RC oscillator clock from 100 kHz to 48 MHz
•HSE32 (high-speed external) 32 MHz oscillator clock, with trimming capacitors.
•PLL clock
The MSI is used as system clock source after startup from reset, configured at 4 MHz.
The devices have the following additional clock sources:
•LSI: 32 kHz low-speed internal RC that may drive the independent watchdog and
optionally the RTC used for auto-wakeup from Stop and Standby modes.
•LSE: 32.768 kHz low-speed external crystal that optionally drives the RTC used for
auto-wakeup from Stop, Standby and Shutdown modes, or the real-time clock
(RTCCLK).
Each clock source can be switched on or off independently when it is not used, to optimize
power consumption.
Several prescalers can be used to configure the AHB frequencies (HCLK3/PCLK3, HCLK1,
HCLK2), the high-speed APB2 (PCLK2) and the low-speed APB1 (PCLK1) domains. The
maximum frequency of the AHB (HCLK3, HCLK1, and HCLK2), the PCLK1 and the PCLK2
domains is 48 MHz.
Most peripheral clocks are derived from their bus clock (HCLK, PCLK) except the following:
•The clock used for true RNG, is derived (selected by software) from one of the following
sources:
–PLL VCO (PLLQCLK) (only available in Run mode)
–MSI (only available in Run mode)
–LSI clock
–LSE clock
•The ADC clock is derived (selected by software) from one of the following sources:
–system clock (SYSCLK) (only available in Run mode)
–HSI16 clock (only available in Run mode)
–PLL VCO (PLLPCLK) (only available in Run mode)
•The DAC uses the LSI clock in sample and hold mode
•The (LP)U(S)ARTs clocks are derived (selected by software) from one of the following
sources:
–system clock (SYSCLK) (only available in Run mode)
–HSI16 clock (available in Run and Stop modes)
–LSE clock (available in Run and Stop modes)
–APB clock (PCLK depending on which APB the U(S)ART is mapped) (available in
CRun and CSleep when also enabled in (LP)U(S)ARTxSMEN)
The wakeup from Stop mode is supported only when the clock is HSI16 or LSE.
DS13293 Rev 135/145
48
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Functional overviewSTM32WL55/54xx
•The I2Cs clocks are derived (selected by software) from one of the following sources:
–system clock (SYSCLK) (only available in Run mode)
–HSI16 clock (available in Run and Stop modes)
–APB clock (PCLK depending on which APB the I2C is mapped) (available in CRun
and CSleep when also enabled in I2CxSMEN.)
The wakeup from Stop mode is supported only when the clock is HSI16.
•The SPI2S2 I2S clock is derived (selected by software) from one of the following
sources:
–HSI16 clock (only available in Run mode)
–PLL VCO (PLLQCLK) (only available in Run mode)
–external input I2S_CK (available in Run and Stop modes)
•The low-power timers (LPTIMx) clock is derived (selected by software) from one of the
following sources:
–LSI clock (available in Run and Stop modes)
–LSE clock (available in Run and Stop modes)
–HSI16 clock (only available in Run mode)
–APB clock (PCLK depending on which APB the LPTIMx is mapped) (available in
Run and CStop when enabled in LPTIMxSMEN.)
–external clock mapped on LPTIMx_IN1 (available in Run and Stop modes)
The functionality in Stop mode (including wakeup) is supported only when the clock is
LSI or LSE, or in external clock mode.
•The RTC clock is derived (selected by software) from one of the following sources:
–LSE clock
–LSI clock
–HSE32 clock divided by 32
The functionality in Stop mode (including wakeup) is supported only when the clock is
LSI or LSE.
•The IWDG clock is always the LSI clock.
The RCC feeds the CPU1 system timer (SysTick) external clock with the AHB clock
(HCLK1) divided by eight. The SysTick can work either with this clock or directly with the
CPU1 clock (HCLK1), configurable in the SysTick control and status register.
FCLK1 acts as CPU1 free-running clock. For more details, refer to the programming manual
STM32 Cortex-M4 MCUs and MPUs programming manual (PM0214).
The RCC feeds the CPU2 system timer (SysTick) external clock with the AHB clock
(HCLK2) divided by eight. The SysTick can work either with this clock or directly with the
CPU2 clock (HCLK2), configurable in the SysTick control and status register.
FCLK2 acts as CPU2 free-running clock.
36/145DS13293 Rev 1
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STM32WL55/54xxFunctional overview
MSv62604V2
LSI RCC 32 kHz
LSE OSC
32.768 kHz
LSCO
to IWDG
HSE32 OSC
32 MHz
HSE CSS
OSC_IN
OSC_OUT
HSI16 RC
16 MHz
MSI RC
100 kHz - 48 MHz
MCO
/1 - 16
/32
LSE CSS
PLL
/P
/R
/Q
/M
SYSCLK
MSI
MSI
HSI16
HSI16
HSE32
HSE32
PLLRCLK
PLLRCLK
LSE
LSI
SYS clock
source
control
SYSCLK
MSI
HSI16
CPU1
HPRE
/1,2,...,512
HCLK1
HCLK2
HCLK3
APB1
PPRE1
/1,2,4,8,16
to CPU1, AHB1, AHB2
to CPU1 FCLK
/8
to CPU1 system timer
APB2
PPRE2
/1,2,4,8,16
PCLK1
PCLK2
to CPU2
to CPU2 FCLK
/8
to CPU2 system timer
to AHB3, Flash, SRAM1, SRAM2
to APB1 TIMx
to APB2 TIMx
to USART1to LPTIM1
to LPUART1
to ADC
to RTC
x1 or
x2
x1 or
x2
to I2C1
PCLKn
SYSCLK
HSI16
HSI16
HSI16
PCLKn
LSI
LSE
PLLPCLK
SYSCLK
PCLKn
LSE
to APB2
to APB1
to RF
SYSCLK
MSI
to RNG
PLLQCLK
PLLRCLK
OSC32_IN
OSC32_OUT
LSI
LSE
LSI
LSE
HSEPRE
/1,2
xN
to I2C2
to I2C3
to LPTIM3
to LPTIM2
PCLK3to APB3
to USART2
HSI16
to SPI2S2
I2S_CKIN
HSI16
PLLPCLK
PLLQCLK
LSIPRE
/1,128
CPU2
C2HPRE
1,2,...,512
AHB3
SHDHPRE
/1,2,...,512
LSIDAC
Figure 8. Clock tree
DS13293 Rev 137/145
1. For full details about the internal and external clock source characteristics, refer to the electrical characteristics section in
the device datasheet.
2. The ADC clock can additionally be derived from the AHB clock of the ADC bus interface, divided by a programmable factor
(1, 2 or 4). When the programmable factor is 1, the AHB prescaler must be equal to 1.
3.14 Hardware semaphore (HSEM)
The HSEM provides a 16- (32-bit) register based semaphores. The semaphores can be
used to ensure synchronization between different processes running between different
cores. The HSEM provides a non blocking mechanism to lock semaphores in an atomic
way. The following functions are provided:
•Locking a semaphore can be done in two ways:
–2-step lock: by writing COREID and PROCID to the semaphore, followed by a
read check
–1-step lock: by reading the COREID from the semaphore
•Interrupt generation when a semaphore is unlocked: Each semaphore may generate
an interrupt on one of the interrupt lines.
48
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Functional overviewSTM32WL55/54xx
•Semaphore clear protection: A semaphore is only unlocked when COREID and
PROCID match.
•Global semaphore clear per COREID
3.15 Inter-processor communication controller (IPCC)
The IPCC is used for communicating data between two processors.
The IPCC block provides a non blocking signaling mechanism to post and retrieve
communication data in an atomic way. It provides the signaling for twelve channels:
•six channels in the direction from processor 1 to processor 2
•six channels in the opposite direction
It is then possible to have two different communication types in each direction.
The IPCC communication data must be located in a common memory, that is not part of the
IPCC block.
3.16 General-purpose inputs/outputs (GPIOs)
Each of the GPIO pins can be configured by software as output (push-pull or open-drain), as
input (with or without pull-up or pull-down) or as peripheral alternate function. Most of the
GPIO pins are shared with digital or analog alternate functions. Fast I/O toggling can be
achieved thanks to their mapping on the AHB2 bus.
The I/Os alternate function configuration can be locked if needed following a specific
sequence in order to avoid spurious writing to the I/Os registers.
3.17 Direct memory access controller (DMA)
The DMA (direct memory access) is used to provide high-speed data transfer between
peripherals and memory, as well as memory to memory. Data can be quickly moved by
DMA without any CPU actions. This keeps CPU resources free for other operations.
The DMA controller has 14 channels in total. A full cross matrix allows the peripherals, with
DMA support, to be mapped on any of the available DMA channels. Each DMA channel has
an arbiter for handling the priority between DMA requests.
•a full cross matrix between peripherals and all 14 channels and an hardware trigger
possibility through the DMAMUX1
•software programmable priorities between requests from channels of one DMA (four
levels: very-high, high, medium, low), plus hardware priorities management in case of
equality (example: request 1 has priority over request 2)
•independent source and destination transfer size (byte, half-word, word), emulating
packing and unpacking. Source/destination addresses must be aligned on the data
size.
•support for circular buffer management
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STM32WL55/54xxFunctional overview
•three event flags (DMA half-transfer, DMA transfer complete and DMA transfer error),
logically ORed together in a single interrupt request for each channel
•memory-to-memory transfer
•peripheral-to-memory, memory-to-peripheral, and peripheral-to-peripheral transfers
•access to Flash memory, SRAM, APB and AHB peripherals, as source and destination
•programmable number of data to be transferred (up to 65536)
•secure and privileged support per channel level configuration
FeatureDMA1DMA2
Number of channels77
Table 11. DMA1 and DMA2 implementation
DMAMUX1 is used to route the peripherals with DMA source support, to any DMA channel.
The devices embed an NIVC able to manage 16 priority levels, and to handle up to
62 maskable interrupt channels plus the 16 interrupt lines of the Cortex-M4.
The device also embeds an NVIC able to manage four priority levels, and handles up to
32 maskable interrupt channels plus the 16 interrupt lines of the Cortex-M0+.
The NVIC benefits are the following:
•low-latency interrupt processing
•interrupt entry vector table address passed directly to the core
•early processing of interrupts
•processing of late-arriving higher-priority interrupts
•support for tail chaining
•processor state automatically saved
•interrupt entry restored on interrupt exit, with no instruction overhead
The NVIC hardware block provides flexible interrupt management features with minimal
interrupt latency.
3.18.2 Extended interrupt/event controller (EXTI)
The EXTI manages wakeup through configurable and direct event inputs. It provides wakeup requests to the power control, and generates interrupt requests to the CPU1/2 NVIC and
events to the CPU1/2 event input.
Configurable events/interrupts come from peripherals that are able to generate a pulse and
allow the selection between the event/interrupt trigger edge and a software trigger.
Direct events/interrupts come from peripherals having their own clearing mechanism.
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3.19 Cyclic redundancy check (CRC)
The CRC calculation unit is used to get a CRC code from 8-, 16- or 32-bit data word and a
generator polynomial.
Among other applications, CRC-based techniques are used to verify data transmission or
storage integrity. In the scope of the functional safety standards, they offer a means of
verifying the Flash memory integrity. The CRC calculation unit helps to compute a signature
of he software during runtime, to be compared with a reference signature generated at link
time and stored at a given memory location.
3.20 Analog-to-digital converter (ADC)
A native 12-bit ADC is embedded into the devices. It can be extended to 16-bit resolution
through hardware oversampling. The ADC has up to 12 external channels and four internal
channels (temperature sensor, voltage reference, V
ADC performs conversions in single-shot or scan mode. In scan mode, automatic
conversion is performed on a selected group of analog inputs.
The ADC frequency is independent from the CPU1/2 frequency, allowing maximum
sampling rate of ~2 Msps even with a low CPU speed. An auto-shutdown function
guarantees that the ADC is powered off except during the active conversion phase.
(a)
monitoring, DAC output). The
BAT
The ADC can be served by the DMA controller. It can operate in the whole V
range.
The ADC features a hardware oversampler up to 256 samples, improving the resolution to
16 bits. Refer to the application note Improving STM32F1 Series, STM32F3 Series and STM32Lx Series ADC resolution by oversampling (AN2668).
An analog watchdog feature allows very precise monitoring of the converted voltage of one,
some or all scanned channels. An interrupt is generated when the converted voltage is
outside the programmed thresholds.
The events generated by the general-purpose timers (TIMx) can be internally connected to
the ADC start triggers, to allow the application to synchronize A/D conversions with timers.
3.20.1 Temperature sensor
The temperature sensor (TS) generates a VTS voltage that varies linearly with temperature.
The temperature sensor is internally connected to the ADC VIN[12] input channel, to
convert the sensor output voltage into a digital value.
The sensor provides good linearity but it has to be calibrated to obtain good overall
accuracy of the temperature measurement. As the offset of the temperature sensor may
vary from part to part due to process variation, the uncalibrated internal temperature sensor
is suitable only for relative temperature measurements.
To improve the accuracy of the temperature sensor, each part is individually factorycalibrated by ST. The resulting calibration data is stored in the device engineering bytes,
accessible in read-only mode.
DD
supply
a. VDD on STM32WL55/54UxYx devices.
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STM32WL55/54xxFunctional overview
Calibration value
name
TS_CAL1
TS_CAL2
Table 12. Temperature sensor calibration values
TS ADC raw data acquired at 30 °C (± 5 °C),
V
= V
DDA
TS ADC raw data acquired at 130 °C (± 5 °C),
V
= V
DDA
= 3.3 V (± 10 mV)
REF+
= 3.3 V (± 10 mV)
REF+
3.20.2 Internal voltage reference (V
V
is internally connected to the ADC VIN[13] input channel.
V
and stored in the device engineering bytes. It is accessible in read-only mode.
provides a stable (bandgap) voltage output for the ADC and comparators. V
REFINT
is individually and precisely measured, for each part, by ST, during production test
REFINT
Table 13. Internal voltage reference calibration values
Calibration value nameDescriptionMemory address
VREFINT_CAL
Raw data acquired at 30 °C (± 5 °C),
= V
V
DDA
REF+
DescriptionMemory address
0x1FFF 75A8 - 0x1FFF 75A9
0x1FFF 75C8 - 0x1FFF 75C9
REFINT
)
= 3.3 V (± 10 mV)
0x1FFF 75AA - 0x1FFF 75AB
REFINT
3.20.3 V
battery voltage monitoring
BAT
This embedded hardware feature allows the application to measure the V
voltage using the ADC VIN[14] input channel. As V
outside the ADC input range, the VBAT pin is internally connected to a bridge divider by
three. As a consequence, the converted digital value is one third the V
3.21 Digital-to-analog converter (DAC)
The 1-channel 12-bit buffered DAC converts a digital value into an analog voltage available
on the channel output. The architecture of each channel is based on an integrated resistor
string and an inverting amplifier. The digital circuitry is common for both channels.
DAC main features:
•1 DAC output channel
•8-bit or 12-bit output mode
•buffer offset calibration (factory and user trimming)
•left or right data alignment in 12-bit mode
•synchronized update capability
•noise-wave generation
•triangular-wave generation
•independent or simultaneous conversion for DAC channels
may be higher than V
BAT
BAT
voltage.
BAT
(a)
battery
, and thus
DDA
a. VDD on STM32WL55/54UxYx devices.
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•DMA capability for either DAC channel
•triggering with timer events, synchronized with DMA
•triggering with external events
Sample-and-hold low-power mode, with internal or external capacitor
3.22 Voltage reference buffer (VREFBUF)
The devices embed a voltage reference buffer that can be used as voltage reference for
ADC, and also as voltage reference for external components through the VREF+ pin.
VREFBUF supports two voltages: 2.048 V and 2.5 V.
An external voltage reference can be provided through the VREF+ pin when VREFBUF
is off.
3.23 Comparator (COMP)
The devices embed two rail-to-rail comparators with programmable reference voltage
(internal or external), hysteresis and speed (low speed for low-power) and with selectable
output polarity.
The reference voltage can be one of the following:
•external I/O
•internal reference voltage or submultiple (1/4, 1/2, 3/4)
All comparators can wake up from Stop mode, generate interrupts and breaks for the timers,
and can be also combined into a window comparator.
3.24 True random number generator (RNG)
The devices embed a true RNG that delivers 32-bit random numbers generated by an
integrated analog circuitry.
3.25 Advanced encryption standard hardware accelerator (AES)
The AES encrypts or decrypts data, using an algorithm and implementation fully compliant
with the advanced encryption standard (AES) defined in FIPS (federal information
processing standards) publication 197.
Multiple chaining modes are supported (ECB, CBC, CTR, GCM, GMAC, CCM), for key
sizes of 128 or 256 bits. The AES supports DMA single transfers for incoming and outgoing
data (two DMA channels required).
3.26 Public key accelerator (PKA)
The PKA is used to compute cryptographic public key primitives, specifically those related to
RSA (Rivest, Shamir and Adleman), Diffie-Hellmann or ECC (elliptic curve cryptography)
over GF(p) (Galois fields). These operations are executed in the Montgomery domain.
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3.27 Timer and watchdog
The devices include one advanced 16-bit timer, one general-purpose 32-bit timer, two 16-bit
basic timers, three low-power timers, two watchdog timers and a SysTick timer.
The table below compares the features of the advanced control, general purpose and basic
timers.
Table 14. Timer features
Counter
resolution
(bits)
16Up
Counter
type
Up, down
and
up/down
Prescaler
Any integer
1 and 65536
Timer type
Advanced
control
General
purpose
Low power
Timer
name
TIM116
TIM232NA
TIM16
TIM17
LPTIM1
LPTIM2
LPTIM3
3.27.1 Advanced-control timer (TIM1)
The advanced-control timer TIM1 can be seen as a three-phase PWM multiplexed on six
channels. Each channel has complementary PWM outputs with programmable inserted
dead-times. Each channel can also be seen as complete general-purpose timers.
The four independent channels can be used for:
•input capture
•output compare
•PWM generation (edge or center-aligned modes) with full modulation capability
(0 - 100 %)
•one-pulse mode output
factor
between
DMA
request
generation
Yes
Capture/
compare
channels
4
2
1
Complementary
outputs
3
1
In debug mode, the TIM1 counter can be frozen and the PWM outputs disabled to turn off
any power switches driven by these outputs.
Many features are shared with those of the general-purpose timers (described in the next
section) using the same architecture. TIM1 can then work together with TIM2 via the
peripheral interconnect matrix, for synchronization or event chaining.
Each general-purpose timer can be used to generate PWM outputs, or act as a simple time
base.
TIM2 main features:
•full-featured general-purpose timer
•four independent channels for input capture/output compare, PWM or one-pulse mode
output
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Functional overviewSTM32WL55/54xx
•counter that can be frozen in debug mode
•independent DMA request generation, support of quadrature encoders
TIM16 and TIM17 main features:
•general-purpose timers with mid-range features
•16-bit auto-reload upcounters and 16-bit prescalers
•1 channel and 1 complementary channel
•channels that can all be used for input capture/output compare, PWM or one-pulse
mode output
•counter that can be frozen in debug mode
•independent DMA request generation
3.27.3 Low-power timers (LPTIM1, LPTIM2 and LPTIM3)
These low-power timers have an independent clock and run in Stop mode if they are
clocked by LSE, LSI, or by an external clock. They are able to wake up the system from
Stop mode.
LPTIM1 is active in Stop 0, Stop 1 and Stop 2 modes.
LPTIM2 and LPTIM3 are active in Stop 0 and Stop 1 modes.
LPTIM1/2/3 main features:
•16-bit up counter with 16-bit autoreload register
•16-bit compare register
•configurable output: pulse, PWM
•continuous/one-shot mode
•selectable software/hardware input trigger
•selectable clock source
•internal clock sources: LSE, either LSI, HSI16 or APB clock
•external clock source over LPTIM input (works even with no internal clock source
running, used by pulse counter application)
•programmable digital glitch filter
•encoder mode (LPTIM1 only)
3.27.4 Independent watchdog (IWDG)
The independent watchdog is based on a 12-bit downcounter and a 8-bit prescaler. The
IWDG is clocked from an independent 32 kHz internal RC (LSI). As the IWDG operates
independently from the main clock, it can operate in Stop and Standby modes.
The IWDG can be used either as a watchdog to reset the device when a problem occurs, or
as a free running timer for application timeout management. The IWDG is hardware or
software configurable through the option bytes. The counter can be frozen in debug mode.
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3.27.5 System window watchdog (WWDG)
The window watchdog is based on a 7-bit downcounter that can be set as free running. The
WWDG can be used as a watchdog to reset the device when a problem occurs.
The WWDG is clocked from the main clock and has an early warning interrupt capability.
The counter can be frozen in debug mode.
3.27.6 SysTick timer
This timer is dedicated to real-time operating systems, but can also be used as a standard
down counter.
SysTick timer main features:
•24-bit down counter
•autoreload capability
•maskable system interrupt generation when the counter reaches 0
•programmable clock source
3.28 Real-time clock (RTC), tamper and backup registers
The RTC is an independent BCD timer/counter. The RTC provides a time-of-day
clock/calendar with programmable alarm interrupts.
As long as the supply voltage remains in the operating range, the RTC never stops,
regardless of the device status (Run mode, low-power mode or under reset).
The RTC provides an automatic wakeup to manage all low-power modes.
The RTC is functional in VBAT mode.
Twenty 32-bit backup registers are retained in all low-power modes and also in VBAT mode.
These registers can be used to store sensitive data as their content is protected by a tamper
detection circuit.
Three tamper pins and four internal tampers are available for anti-tamper detection. The
external tamper pins can be configured for edge or level detection with or without filtering.
3.29 Inter-integrated circuit interface (I2C)
The device embeds three I2Cs, with features implementation listed in the he table below.
2
The I
C bus interface handles communications between the microcontroller and the serial
2
I
C bus. It controls all I2C bus-specific sequencing, protocol, arbitration and timing.
The I2C peripheral supports:
2
•I
C bus specification and user manual rev. 5 compatibility:
–slave and master modes, multimaster capability
–Standard-mode (Sm), with a bitrate up to 100 Kbit/s
–Fast-mode (Fm), with a bitrate up to 400 Kbit/s
–Fast-mode plus (Fm+), with a bitrate up to 1 Mbit/s and 20 mA output drive I/Os
–7-bit and 10-bit addressing mode, multiple 7-bit slave addresses
The devices embed two universal synchronous receiver transmitters, USART1 and
USART2 (see Table 16 for the implementation details).
Each USART provides asynchronous communication, IrDA SIR ENDEC support,
multiprocessor communication mode, single-wire half-duplex communication mode. Each
USART has LIN Master/Slave capability and provides hardware management of the CTS
and RTS signals, and RS485 driver enable.
The USART is able to communicate at speeds of up to 4 Mbit/s, and also provides
Smart Card mode (ISO 7816 compliant) and SPI-like communication capability.
The USART supports synchronous operation (SPI mode), and can be used as an SPI
master.
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The USART has a clock domain independent from the CPU clock, allowing the USART to
wake up the MCU from Stop mode, using baudrates up to 200 kbaud.
The wakeup events from Stop mode are programmable and can be one of the following:
•start bit detection
•any received data frame
•a specific programmed data frame
The USART interface can be served by the DMA controller.
The devices embed one low-power UART (LPUART1) that enables asynchronous serial
communication with minimum power consumption. The LPUART supports half-duplex
single-wire communication and modem operations (CTS/RTS), allowing multiprocessor
communication.
The LPUART has a clock domain independent from the CPU clock, and can wake up the
system from Stop mode using baudrates up to 220 Kbaud. The wakeup events from Stop
mode are programmable and can be one of the following:
•start bit detection
•any received data frame
•a specific programmed data frame
Only a 32.768 kHz clock (LSE) is needed to allow LPUART communication up to
9600 baud. Therefore, even in Stop mode, the LPUART can wait for an incoming frame
while having an extremely low-energy consumption. Higher speed clock can be used to
reach higher baudrates.
The LPUART interface can be served by the DMA controller.
USART modes/features
Hardware flow control for modemXX
Continuous communication using DMAXX
Multiprocessor communicationXX
Synchronous mode (Master/Slave)X-
Smartcard modeX-
Single-wire half-duplex communicationXX
IrDA SIR ENDEC blockX-
LIN modeX-
Dual clock domain and wakeup from low-power modeXX
Receiver timeout interruptX-
Modbus communicationX-
Auto baud rate detectionX-
Table 16. USART/LPUART features
(1)
USART1/2LPUART1
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Table 16. USART/LPUART features (continued)
USART modes/features
Driver enableXX
USART data length7, 8 and 9 bits
Tx/Rx FIFOXX
Tx/Rx FIFO size 8
1. X = supported.
(1)
USART1/2LPUART1
3.32 Serial peripheral interface (SPI)/integrated-interchip sound
interface (I2S)
The SPI/I2S interface can be used to communicate with external devices using the SPI
protocol or the I
2
S audio protocol. SPI or I2S mode is selectable by software. SPI Motorola®
mode is selected by default after a device reset.
The SPI protocol supports half-duplex, full-duplex and simplex synchronous, serial
communication with external devices. The SPI interface can be configured as master and, in
this case, it provides the communication clock (SCK) to the external slave device. The SPI
interface can also operate in multimaster configuration.
2
The I
S protocol is also a synchronous serial communication interface. It can operate in
slave or master mode with half-duplex communication. It can address four different audio
standards including the Philips I
2
S standard, the MSB- and LSB-justified standards and the
PCM standard.
FeaturesSPI1SPI2S2 SUBGHZSPI
Enhanced NSSP and TI modesYes
Hardware CRC calculationYesYesNo
2
I
S supportNoYesNo
Data size configurable (bits)from 4 to 16
Rx/Tx FIFO size (bits)32
Wakeup capability from LPSleepYes
1. The SPI1 and SPI2S2 instances are general purpose type while the SUBGHZSPI instance is dedicated for
Sub-GHz radio control exclusively. Radio is controlled internally through SUBGHZSPI and, for debug
purpose only, from the external.
Table 17. SPI and SPI/I2S implementation
(1)
3.33 Development support
Serial-wire JTAG debug port (SWJ-DP)
The Arm SWJ-DP interface is embedded, and is a combined JTAG and serial-wire debug
port, that enables either a serial-wire debug or a JTAG probe to be connected to the target.
The debug is performed using only two pins instead of the five required by the JTAG (JTAG
pins can then be reused as GPIOs with alternate function). The JTAG TMS and TCK pins
are shared with SWDIO and SWCLK, respectively, and a specific sequence on the TMS pin
is used to switch between JTAG-DP and SW-DP.
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STM32WL55/54xxPinouts, pin description and alternate functions
MSv48144V4
PB3
PB4
PB5
PB6
PB7
PB8
PA0
PA1
PA2
PA3
VDD
PA4
PA5
PA6
PA9
RFI_P
VR_PA
PA7
PA8
RFI_N
NRST
PH3-BOOT0
RFO_LP
RFO_HP
PA13
PA12
PA11
PA10
PB12
PB2
PB0-VDD_TCXO
VDDRF1V55
VDDRF
OSC_OUT
OSC_IN
VDDPA
VSSSMPS
VLXSMPS
VDD
VDDA
VBAT
VDDSMPS
VFBSMPS
PC15-OSC32_OUT
PA15
PA14
PC14-OSC32_IN
PC13
UFQFPN48
136
35
34
33
32
31
30
29
28
27
26
25
393740
38
45
43
41
484746
44
42
222421
23
16
18
20
131415
17
19
2
3
4
5
6
7
8
9
10
11
12
4 Pinouts, pin description and alternate functions
Figure 9. UFQFPN48 pinout
1. The above figure shows the package top view.
2. The exposed pad must be connected to the ground plain.
DS13293 Rev 149/145
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Pinouts, pin description and alternate functionsSTM32WL55/54xx
MSv48145V4
A
B
C
D
E
F
G
H
J
143987652
PA4
PA3
PC1
PB6
PB3
VLXSMPS
VSSSMPS
PA5
PA2
PC6
PC0
VDD
PB5
PB4
VFBSMPS
VDDSMPS
PA8
PA7
PA1
PC4
VSS
PB8
PB7
PA15
PB10
PB11
PA6
PC5
PC2
PB9
PB15
PA14
PC3
PC15-
OSC32
_OUT
VREF+
VDDA
RFI_P
VSSRF
VSSRF
PB0-
VDD_TCXO
PA0
PB14
PC14-
OSC32_IN
VDDRF
1V55
PB13
PC13
VSS
VDD
OSC_OUT
PB2
PA10
PA13
VBAT
VSS
PA11
PA12
PA9PB12PB1VDDRFVDD
NRST
VSS
PH3-
BOOT0
VDDRFI_N
VSSRF
RFO_LP
VDDPA
VSSRF
RFO_HP
VR_PA
OSC_IN
Figure 10. UFBGA73 pinout
1. The above figure shows the package top view.
Table 18. Legend/abbreviations used in the pinout table
NameAbbreviationDefinition
Pin name
Unless otherwise specified in brackets below the pin name, the pin function during and
after reset is the same as the actual pin name
SSupply pin
IInput only pin
Pin type
I/OInput / output pin
OOutput only pin
I/O structure
RFRadio RF pin
TT3 V tolerant I/O
_fI/O, Fm+ capable
FT5 V tolerant I/O
_aI/O, with Analog switch function supplied by V
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STM32WL55/54xxPinouts, pin description and alternate functions
Table 18. Legend/abbreviations used in the pinout table (continued)
NameAbbreviationDefinition
Unless otherwise specified by a note, all I/Os are set as analog inputs during and after
reset.
Functions selected through GPIOx_AFR registers
Functions directly selected/enabled through peripheral registers
Table 19. STM32WL55/54xx pin definition
Pin
functions
Notes
Alternate
functions
Additional
functions
Pin number
Pin name
WLCSP59
UFQFPN48
(function after
UFBGA73
reset)
Pin type
Notes
I/O structure
Alternate functionsAdditional functions
-E10-VSSS----
1D11C1PB3I/OFT_a-
JTDO/TRACESWO,
TIM2_CH2, SPI1_SCK,
RF_IRQ0, USART1_RTS,
DEBUG_RF_DTB1,
CM4_EVENTOUT
COMP1_INM,
COMP2_INM,
ADC_IN2,
TAMP_IN3/WKUP3
NJTRST, I2C3_SDA,
2D9C2PB4I/OFT_fa-
SPI1_MISO, USART1_CTS,
DEBUG_RF_LDORDY,
TIM17_BKIN,
COMP1_INP,
COMP2_INP,
ADC_IN3
CM4_EVENTOUT
LPTIM1_IN1, I2C1_SMBA,
SPI1_MOSI, RF_IRQ1,
3-D2PB5I/OFT_a-
USART1_CK, COMP2_OUT,
TIM16_BKIN,
CM4_EVENTOUT
-F7E3VSSS----
-F11E2VDDS----
-
4-E1PB6I/OFT_f-
5-C3PB7I/OFT_f-
6-D3PB8I/OFT_f-
DS13293 Rev 151/145
LPTIM1_ETR, I2C1_SCL,
USART1_TX, TIM16_CH1N,
CM4_EVENTOUT
LPTIM1_IN2, TIM1_BKIN,
I2C1_SDA, USART1_RX,
TIM17_CH1N,
CM4_EVENTOUT
TIM1_CH2N, I2C1_SCL,
RF_IRQ2, TIM16_CH1,
CM4_EVENTOUT
-
-
-
60
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Pinouts, pin description and alternate functionsSTM32WL55/54xx
Pinouts, pin description and alternate functionsSTM32WL55/54xx
Port
PC0
PC1
PC2
PC3
PC4
Port C
PC5
PC6
PC13
PC14
PC15
SYS_
AF
TIM1/
TIM2/
LPTIM1
LPTIM1_
-
LPTIM1_
-
LPTIM1_
-
LPTIM1_
-
---- -- - - ----- --
---- -- - - ----- --
---- -
---- -- - - ----- --
---- -- - - ----- --
---- -- - - ----- --
TIM1/
IN1
OUT
IN2
ETR
SPI2S2/
TIM2
TIM1/
LPTIM3
--
SPI2_
-
MOSI/
I2S2_SD
-- -
-- -
I2C1/
I2C2/
I2C3
I2C3_
SCL
I2C3_
SDA
SPI1/
SPI2S2
-- -
-- -
SPI2_
MISO
SPI2_
MOSI/
I2S2_SD
I2S2_
MCK
USART1
RF
/
LPUART1---
USART2
LPUART1_
RX
LPUART1_
TX
-- ----- - -
-- ----- -
-- ----- - -
--- --
--- ---
COMP1/
COMP2/
TIM1
DEBUG
TIM2/
TIM16/
TIM17/
LPTIM2
LPTIM2_
IN1
LPTIM2_
ETR
EVENOUT
CM4_
EVENTOUT
CM4_
EVENTOUT
CM4_
EVENTOUT
CM4_
EVENTOUT
CM4_
EVENTOUT
CM4_
EVENTOUT
CM4_
EVENTOUT
CM4_
EVENTOUT
CM4_
EVENTOUT
CM4_
EVENTOUT
PH3
Port H
---- -- - - ----- -EVENTOUT
CM4_
Page 61
STM32WL55/54xxElectrical characteristics
MSv68045V1
MCU pin
C = 50 pF
MSv68046V1
MCU pin
V
IN
5 Electrical characteristics
5.1 Parameter conditions
Unless otherwise specified, all voltages are referenced to VSS and, for parameter values
based on characterization results, measurements are performed on the UFQFPN48
package.
5.1.1 Minimum and maximum values
Unless otherwise specified, the minimum and maximum values are guaranteed in the worst
conditions of ambient temperature, supply voltage and frequencies, by tests in production
on 100 % of the devices, with an ambient temperature at T
by the selected temperature range).
Data based on characterization results, design simulation and/or technology characteristics
are indicated in the table footnotes and are not tested in production. Based on
characterization, the minimum and maximum values refer to sample tests and represent the
mean value plus or minus three times the standard deviation (mean ±3).
5.1.2 Typical values
= 25 °C and TA = TAmax (given
A
Unless otherwise specified, typical data are based on TA = 25 °C, V
Typical values are given only as design guidelines and are not tested.
Typical ADC accuracy values are determined by characterization of a batch of samples from
a standard diffusion lot over the full temperature range, where 95 % of the devices have an
error less than or equal to the value indicated
5.1.3 Typical curves
Unless otherwise specified, all typical curves are given only as design guidelines and are
not tested.
5.1.4 Loading capacitor
The loading conditions used for pin parameter measurement are shown in Figure 11.
5.1.5 Pin input voltage
The input voltage measurement on a pin of the device is described in Figure 12.
Figure 11. Pin loading conditionsFigure 12. Pin input voltage
(mean ± 2).
DD
= V
DDA
= V
BAT
= 3 V.
DS13293 Rev 161/145
135
Page 62
Electrical characteristicsSTM32WL55/54xx
MSv64325V5
V
DD
Backup circuitry
(LSE, RTC and
backup registers)
Kernel logic
(CPU, digital
and memories
Level shifter
I/O
logic
IN
LPR
GPIOs
1.55 to 3.6 V
n x 100 nF + 1 x 4.7 μF
n x VSS
n x VDD
VBAT
V
CORE
Power switch
ADC
DAC
COMPs
VREFBUF
V
REF+
V
REF-
V
DDA
10 nF + 1 μF
VDDA
VSS
V
REF
100 nF
1 μF
SMPS
MR
VDDSMPS
VLXSMPS
VFBSMPS
VSSSMPS
4.7 μF
V
DD
Exposed pad
470 nF
To all modules (VSS/VSSRF)
LDO/SMPS
RFLDO
VDDRF1V5
REG PA
VDDPA (= VDDRF1V5 or VDDSMPS)
VDDRF
15 μH
V
BAT
Sub-GHz radio
OUT
5.1.6 Power supply scheme
Figure 13. Power supply scheme
Caution:Each power supply pair (such as V
Note:For the UFQFPN48 and WLCSP59 package, VREF+ is internally connected to VDDA.
62/145DS13293 Rev 1
ceramic capacitors as shown in the above figure. These capacitors must be placed as close
DD/VSS or VDDA/VSS
) must be decoupled with filtering
as possible to (or below) the appropriate pins on the underside of the PCB to ensure the
good functionality of the device.
Page 63
STM32WL55/54xxElectrical characteristics
MSv64326V2
VBAT
I
DD
VDD
VDDA
VDDRF
VDDSMPS
I
DDVBAT
VBAT
I
DDA
VDD
VDDA
I
DDRF
VDDRF
I
DDSMPS
VDDSMPS
5.1.7 Current consumption measurement
Figure 14. Current consumption measurement scheme
5.2 Absolute maximum ratings
Stresses above the absolute maximum ratings listed in the tables below, may cause
permanent damage to the device. These are stress ratings only and functional operation of
the device at these conditions is not implied. Exposure to maximum rating conditions for
extended periods may affect device reliability.
Device mission profile (application conditions) is compliant with JEDEC JESD47
Qualification Standard, extended mission profiles are available on demand.
Table 21. Voltage characteristics
SymbolRatingsMinMaxUnit
External main supply voltage
V
DDX
V
- V
(including V
SS
V
DDSMPS, VBAT, VREF+
DD
, V
DDA
,
Input voltage on FT_xx pins
(2)
IN
Input voltage on TT pins3.9
V
DDRF
)
,
–0.33.9
min (VDD, V
V
- 0.3
SS
Input voltage on any other pin3.9
DDx
|V
SSx-VSS
- V
V
REF+
1. All main power (VDD, VDDRF, VDDA, VBAT) and ground (VSS) pins must always be connected to the external power
supply, in the permitted range.
power pins of the same domain
Variations between all the different
|
ground pins
Allowed voltage difference for
DDA
V
REF+
(5)
V
>
DDA
Variations between different V
|
|V
DDX
-50
-50
-0.4V
(1)
DDA
, V
DDRF
, V
DDSMPS
) +
3.9
(3)(4)
V
mV
DS13293 Rev 163/145
135
Page 64
Electrical characteristicsSTM32WL55/54xx
2. VIN maximum must always be respected. Refer to the next table for the maximum allowed injected current values.
3. This formula must be applied only on the power supplies related to the I/O structure described in Table 19:
STM32WL55/54xx pin definition.
4. To sustain a voltage higher than 4 V, the internal pull-up/pull-down resistors must be disabled.
5. Include VREF- pin.
Table 22. Current characteristics
SymbolRatingsMaxUnit
(1)
(1)
(1)
(1)
130
130
130
100
IV
IV
IV
DD(PIN)
IV
SS(PIN)
DD
SS
Total current into sum of all V
Total current out of sum of all V
Maximum current into each
VDD
Maximum current out of each
power lines (source)
DD
ground lines (sink)
SS
power pin (source)
ground pin (sink)
VSS
Output current sunk by any I/O and control pin, except FT_f20
I
IO(PIN)
Output current sunk by any FT_f pin20
Output current sourced by any I/O and control pin20
I
Total output current sunk by sum of all I/Os and control pins
IO(PIN)
I
INJ(PIN)
|I
INJ(PIN)
1. All main power (VDD, VDDRF, VDDA, VBAT) and ground (VSS) pins must always be connected to the external power
supplies, in the permitted range.
2. This current consumption must be correctly distributed over all I/Os and control pins.
3. Positive injection (when V
specified maximum value.
4. A negative injection is induced by V
maximum allowed input voltage values.
5. When several inputs are submitted to a current injection, the maximum |I
injected currents (instantaneous values).
Total output current sourced by sum of all I/Os and control pins
Injected current on FT_xx, TT and RST pins, except PB0–5 / +0
(3)
Injected current on PB0-5/0
|
Total injected current (sum of all I/Os and control pins)
> VDD) is not possible on these I/Os and does not occur for input voltages lower than the
IN
< VSS. I
IN
must never be exceeded. Refer also to the previous table for the
INJ(PIN)
(2)
(2)
(5)
|
is the absolute sum of the negative
INJ(PIN)
100
100
(4)
25
mA
Table 23. Thermal characteristics
SymbolRatings ValueUnit
T
STG
T
J
Storage temperature range-65 to +150
Maximum junction temperature125
64/145DS13293 Rev 1
°C
Page 65
STM32WL55/54xxElectrical characteristics
5.3 Operating conditions
5.3.1 Main performances
Table 24. Main performances at VDD = 3 V
Parameter Test conditionsTypUnit
VBAT (V
= 3V, VDD = 0 V)0.005
BAT
Shutdown0.031
Standby (32-Kbyte RAM retention) 0.360
I
CORE
Core current consumption
Stop 2, RTC enabled1
Sleep (16 MHz)770
LPRun (2 MHz)220
Run, SMPS ON (48 MHz)3450
Rx boostedLoRa 125 kHz, SMPS ON4.82
434 to 490 MHz, 14 dBm, 3.3 V21
Tx low power
868 to 915 MHz, 14 dBm, 3.3 V26
434 to 490 MHz, 22 dBm, 3.3 V120
Tx high power
868 to 915 MHz, 22 dBm, 3.3 V107
5.3.2 General operating conditions
Table 25. General operating conditions
µA
mA
SymbolParameter ConditionsMinMaxUnit
f
HCLK
PCLK1
f
PCLK2
V
Internal AHB clock frequency-
Internal APB1 clock frequency-
Internal APB2 clock frequency-
Standard operating voltage-1.8
DD
0 48MHzf
(1)
3.6
ADC or COMP used1.62
DAC used1.71
DDA
V
BAT
V
FBSMPS
V
DDRF
V
Analog supply voltage
VREFBUF used2.4
ADC, DAC, COMP and
VREFBUF not used
0
Backup operating voltage-1.553.6
SMPS feedback voltage-1.43.6
Minimum RF voltage-1.83.6
TT I/O–0.3V
I/O input voltage
IN
All I/O except TT–0.3
min (V
3.6
+ 0.3
DD
min between
, V
DD
DDA
and 5.5 V
(2)(3)
) + 3.6 V
VV
V
DS13293 Rev 165/145
135
Page 66
Electrical characteristicsSTM32WL55/54xx
Table 25. General operating conditions (continued)
SymbolParameter ConditionsMinMaxUnit
Power dissipation at
= 85 °C for suffix 6 version
T
P
A
D
or TA = 105 °C for suffix 7
UFBGA73-392.0mW
(4)
Ambient temperature for
suffix 6 version
Maximum power
dissipation
Low-power dissipation
–40
(5)
85
105
TA
Ambient temperature for the
suffix 7 version
dissipation
Low-power dissipation
–40
(5)
Suffix 6 version
T
Maximum power
Junction temperature range
J
1. When the reset is released, the functionality is guaranteed down to V
2. This formula has to be applied only on the power supplies related to the I/O structure described in Table 19:
STM32WL55/54xx pin definition. Maximum I/O input voltage is the smallest value between min (V
5.5 V.
3. For operation with voltage higher than min (V
disabled.
4. If T
5. In low-power dissipation state, T
is lower, higher PD values are allowed as long as TJ does not exceed TJ max (see Table 101: Package thermal
A
characteristics).
can be extended to this range, as long as TJ does not exceed TJ max (see Table 101:
Package thermal characteristics).
A
Suffix 7 version125
BOR0
, V
DD
) + 0.3 V, the internal pull-up and pull-down resistors must be
DDA
–40
min.
DD
105
125
105
, V
DDA
°C
°C
) + 3.6 V and
66/145DS13293 Rev 1
Page 67
STM32WL55/54xxElectrical characteristics
5.3.3 Sub-GHz radio characteristics
Electrical characteristics of the sub-GHz radio are given with the following conditions unless
otherwise specified:
•V
•Temperature = 25 °C
•HSE32 = 32 MHz
•F
•All RF impedances matched using reference design
•Reference design implementing a 32 MHz crystal oscillator
•Transmit mode output power defined in 50 load
•FSK BER (bit error rate) = 0.1 %, 2-level FSK modulation without pre-filtering,
•LoRa PER (packet error rate) = 1 %, packet of 64 bytes, preamble of 8 bytes, error
•Sensitivities given using highest LNA gain step
•Power consumption measured with -140 dBm signal and AGC ON
•Blocking immunity, ACR and co-channel rejection, given for a single tone interferer and
•Bandwidth expressed on DSB (double-sided band)
= 3.3 V. The current consumption is measured as described in Figure 14.
DD
I
includes current consumption of all supplies (V
DD
DDRF
, V
DDSMPS
, VDD, V
DDA
, V
BAT
).
All peripherals except Sub-GHz radio are disabled and the system is in Standby mode.
= 434/868/915 MHz
RF
BR = 4.8 Kbit/s, FDA = 5 kHz, BW_F = 20 kHz
correction code CR = 4/5, CRC on payload enabled, no reduced encoding, no implicit
header
referenced to sensitivity +6 dB, blocking tests performed with unmodulated signal
Table 26. Operating range of RF pads
PadDescriptionMaxUnit
RFI_P/RFI_NRF input power0
RFO_LP/RFO_HP/VR_PAVoltage Standing Wave Ratio (VSWR)10.1
dBm
DS13293 Rev 167/145
135
Page 68
Electrical characteristicsSTM32WL55/54xx
Table 27. Sub-GHz radio power consumption
SymbolModeConditionsMinTypMaxUnit
Deep-Sleep
I
DD
mode (Sleep
with cold
(1)(2)
start)
Sleep mode
(with warm
(2)(3)
start)
Sleep, LDO
(4)
mode
Sleep, SMPS
(4)
mode
Standby mode
(RC 13 MHz on)
Standby mode
(HSE32)
Synthesizer
mode
All blocks off-50-
Configuration retained-140-
Configuration retained + RC64k-810-
LDO, band-gap,
RC 13 MHz on
Band-gap,
HSE32 off-414-
HSE32 on-564-
HSE32 off-700RC 13 MHz on,
SMPS 40 mA max
HSE32 on-950-
RC 13 MHz on, HSE32 off-0.7-
SMPS mode40 mA max settings-1.05-
LDO mode-0.99-
SMPS mode used with 40 mA drive capability-2.66-
LDO mode-4.05-
nA
µA
mA
FSK 4.8 Kbit/s-4.47-
Receive mode,
SMPS mode
used
SMPS 40 mA max
LoRa 125 kHz-4.82-
Rx boosted, FSK 4.8 Kbit/s-5.12-
RX boosted, LoRa 125 kHz-5.46-
mA
FSK 4.8 Kbit/s-8.18-
Receive mode,
LDO mode used
LoRa 125 kHz8.90
FSK 4.8 Kbit/s9.52
RX boosted
LoRa 125 kHz10.22
1. Cold start is equivalent to device at POR or when the device wakes up from Sleep mode with all blocks off.
2. Only Sub-GHz radio power consumption.
3. Warm start only happens when the device wakes up from Sleep mode with its configuration retained,
4. System in Stop 0 mode range 2.
68/145DS13293 Rev 1
Page 69
STM32WL55/54xxElectrical characteristics
Table 28. Sub-GHz radio power consumption in transmit mode
SymbolFrequency band (MHz)PA match (conditions)Power outputTypUnit
+14 dBm, V
Low power
(optimized for 14 dBm)
+10 dBm, V
+14 dBm, V
+10 dBm, V
868 to 915
+15 dBm, V
Low power
(optimal settings)
(1)
+10 dBm, V
+15 dBm, V
+10 dBm, V
+14 dBm, V
Low power
(optimized for 14 dBm)
+10 dBm, V
+14 dBm, V
+10 dBm, V
434 to 490
+15 dBm, V
+10 dBm, V
Low power (optimal settings)
+15 dBm, V
+10 dBm, V
I
DD
868 to 915
Low-power PA, SMPS OFF+14 dBm, V
434 to 49043.5
+22 dBm, V
High power
(optimized for 22 dBm)
868 to 915
+20 dBm, V
+17 dBm, V
+14 dBm, V
+20 dBm, V
High power (optimal settings)
+17 dBm, V
+14 dBm, V
+22 dBm, V
High power
(optimized for 22 dBm)
434 to 490
+20 dBm, V
+17 dBm, V
+14 dBm, V
+20 dBm, V
High power (optimal settings)
+17 dBm, V
+14 dBm, V
1. Optimal settings can be used to optimize power consumption when the output power is NOT 22 dBm (high power) or
14 dBm (low power). In that case, a dedicated firmware configuration associated to a dedicated board matching network
(see AN5457 for details) corresponding to the custom output power, can be used.
Crystal oscillator trimming range
for crystal frequency error
compensation
(4)
Min/max XTAL specifications±15±30-ppm
Programmable
(min modulation index is 0.5)
Programmable
(FDA + BR_F/2 250 kHz)
0.6-300
0.6-200kHz
(5)
µs
Kbit/s
BR_LBitrate, LoRa
Min for SF12, BW_L = 7.8 kHz
Max for SF7, BW_L = 500 kHz
0.018-62.5
BW_LSignal BW, LoRaProgrammable7.8-500
SFSpreading factor for LoRaProgrammable, chips/symbol = 2
1. Phase Noise specifications are given for the recommended PLL bandwidth to be used for the specific modulation/BR,
optimized settings may be used for specific applications.
2. Phase Noise is not constant over frequency, due to the topology of the PLL. For two frequencies close to each other, the
phase noise may change significantly
3. Wakeup time till crystal oscillator frequency is within ±10 ppm.
4. OSC_TRIM is the available trimming range to compensate for crystal initial frequency error and to allow crystal temperature
compensation implementation. The total available trimming range is higher and allows the compensation for all device
process variations
5. Maximum bit rate is assumed to scale with the RF frequency: for example 300 Kbit /s in the 869-to-915 MHz frequency
band and only 50 Kbit/s at 150 MHz.
6. For RF frequencies below 400 MHz, there is a scaling between the frequency and supported bandwidth. Some bandwidths
may not be available below 400 MHz.
SF
5-12-
(6)
(6)
Kbit/s
kHz
70/145DS13293 Rev 1
Page 71
STM32WL55/54xxElectrical characteristics
Table 30. Sub-GHz radio receive mode specifications
SymbolDescriptionConditionsMinTypMaxUnit
RXS_2FB
Sensitivity 2-FSK,
RX boosted gain,
split RF paths for RX and Tx,
RF switch insertion loss excluded
BR = 0.6 Kbit/s, FDA = 0.8 kHz,
BW = 4 kHz
BR = 1.2 Kbit/s, FDA = 5 kHz,
BW = 20 kHz
BR = 4.8 Kbit/s, FDA = 5 kHz,
BW = 20 kHz
BR = 38.4 Kbit/s, FDA = 40 kHz,
BW = 160 kHz
BR = 250 Kbit/s, FDA = 125 kHz,
BW = 500 kHz
-–125-
-–123-
-–117 -
-–108-
-–103-
BW = 10.4 kHz, SF = 7-–135-
BW = 10.4 kHz, SF = 12-–148-
dBm
RXS_LB
Sensitivity LoRa,
RX boosted gain,
split RF paths for RX and Tx,
RF switch insertion loss excluded
BW = 125 kHz, SF = 7-–125-
BW = 125 kHz, SF = 12-–138-
BW = 250 kHz, SF = 7-–122-
BW = 250 kHz, SF = 12-–135-
BW = 500 kHz, SF = 7-–118-
BW = 500 kHz, SF = 12-–130-
RSX_2F
Sensitivity 2-FSK, RX power
saving gain with direct tie
connection between RX and Tx
1. The default current limiter value is set to 50 mA.
Current limiter max value-2550200mA
5.3.4 Operating conditions at power-up/power-down
Parameters given in the table below are derived from tests performed under the ambient
temperature condition summarized in Table 25: General operating conditions.
SymbolParameterMinMaxUnit
t
VDD
t
VDDA
t
VDDRF
Table 33. Operating conditions at power-up/power-down
VDD rise time rate-
fall time rate10
V
DD
V
rise time rate0
DDA
V
fall time rate10
DDA
V
rise time rate-
DDRF
fall time rate-
V
DDRF
µAV
µs/V
74/145DS13293 Rev 1
Page 75
STM32WL55/54xxElectrical characteristics
5.3.5 Embedded reset and power-control block characteristics
Parameters given in the table below are derived from tests performed under the ambient
temperature conditions summarized in Table 25: General operating conditions.
Table 34. Embedded reset and power-control block characteristics
SymbolParameterConditions
t
RSTTEMPO
V
BOR0
(2)
Reset temporization after BOR0 is detected V
Brownout reset threshold 0
rising-250400s
DD
Rising edge1.721.761.80
Falling edge1.701.741.78
(2)
Rising edge2.062.102.14
V
BOR1
Brownout reset threshold 1
Falling edge1.962.002.04
Rising edge2.262.312.35
V
BOR2
Brownout reset threshold 2
Falling edge2.162.202.24
(1)
MinTypMaxUnit
V
BOR3
V
BOR4
V
PVD0
V
PVD1
V
PVD2
V
PVD3
V
PVD4
V
PVD5
V
PVD6
V
hyst_BORH0
V
hyst_BOR_PVD
(BOR_PVD)
I
DD
Brownout reset threshold 3
Brownout reset threshold 4
Programmable voltage detector threshold 0
PVD threshold 1
PVD threshold 2
PVD threshold 3
PVD threshold 4
PVD threshold 5
PVD threshold 6
Hysteresis voltage of BORH0
Hysteresis voltage of BORH (except
BORH0) and PVD
(3)
BOR
(2)
(except BOR0) and PVD
consumption from V
DD
Rising edge2.562.612.66
Falling edge2.472.522.57
Rising edge2.852.902.95
Falling edge2.762.812.86
Rising edge1.881.952.02
Falling edge1.831.901.97
Rising edge2.262.312.36
Falling edge2.152.202.25
Rising edge2.412.462.51
Falling edge2.312.362.41
Rising edge2.562.612.66
Falling edge2.472.522.57
Rising edge2.692.742.79
Falling edge2.592.642.69
Rising edge2.852.912.96
Falling edge2.752.812.86
Rising edge2.922.983.04
Falling edge2.842.902.96
Hysteresis in
continuous mode
Hysteresis in
other mode
-20-
-30-
--100-
--1.11.6µA
V
V
mV
DS13293 Rev 175/145
135
Page 76
Electrical characteristicsSTM32WL55/54xx
Table 34. Embedded reset and power-control block characteristics (continued)
SymbolParameterConditions
(1)
MinTypMaxUnit
V
PVM3
V
hyst_PVM3
(PVM3)
I
DD
1. Continuous mode means Run and Sleep modes, or temperature sensor enable in LPRun and LPSleep modes.
2. Guaranteed by design.
3. BOR0 is enabled in all modes (except Shutdown) and its consumption is therefore included in the supply current
characteristics tables.
V
peripheral voltage monitoring
DDA
Falling edge1.61.641.68
PVM3 hysteresis--10-mV
(2)
PVM3 consumption from V
DD
--2-µA
5.3.6 Embedded voltage reference
Parameters given in the table below are derived from tests performed under the ambient
temperature and supply voltage conditions summarized in Table 25: General operating
conditions.
Rising edge1.611.651.69
SymbolParameterConditionsMinTypMaxUnit
Internal reference voltage–40 °C < TJ < +105 °C1.182 1.2121.232V
ADC sampling time when reading
(1)
the internal reference voltage
Start time of reference voltage
buffer when ADC is enable
V
REFINT
)
VDD when converted by ADC
t
t
IDD(V
V
REFINT
S_vrefint
start_vrefint
REFINTBUF
Table 35. Embedded internal voltage reference
-4
--812
buffer consumption from
--12.520
(2)
--
(2)
(2)
V
µs
µA
V
REFINT
T
Coeff
A
Coeff
V
DDCoeff
V
REFINT_DIV1
V
REFINT_DIV2
V
REFINT_DIV3
1. The shortest sampling time can be determined in the application by multiple iterations.
2. Guaranteed by design.
Internal reference voltage spread
over the temperature range
Temperature coefficient–40 °C < TJ < +105 °C-3050
Long term stability1000 hours, T = 25 °C-3001000
Voltage coefficient3.0 V < VDD < 3.6 V-2501200
1/4 reference voltage
1/2 reference voltage495051
3/4 reference voltage747576
= 3.3 V-57.5
V
DD
-
76/145DS13293 Rev 1
242526
(2)
(2)
(2)
(2)
mV
ppm/°C
ppm
ppm/V
%
V
REFINT
Page 77
STM32WL55/54xxElectrical characteristics
MSv66005V3
1.185
1.19
1.195
1.2
1.205
1.21
1.215
1.22
1.225
1.23
1.235
-40-20020406080100120
V
°C
MeanMinMax
Figure 15. V
5.3.7 Supply current characteristics
The current consumption is a function of several parameters and factors such as operating
voltage, ambient temperature, I/O pin loading, device software configuration, operating
frequencies, I/O pin switching rate, program location in memory and executed binary code.
versus temperature
REFINT
The current consumption is measured as described in Figure 14.
Typical and maximum current consumption
The device is put under the following conditions:
•All I/O pins are in analog input mode.
•All peripherals are disabled, except when explicitly mentioned.
•The Flash memory access time is adjusted with the minimum wait-states number,
depending on the f
to Flash clock (HCLK3) frequency’ in the reference manual (RM0461).
•f
•f
PCLK
PCLK
= f
= f
when the peripherals are enabled.
HCLK
= f
HCLK
HCLKS
Parameters given in the tables below (Table 36 to Table 55) are derived from tests
performed under ambient temperature and supply voltage conditions summarized in
Table 25: General operating conditions.
frequency. Refer to the table ‘Number of wait states according
HCLK
for the Flash memory and shared peripherals.
DS13293 Rev 177/145
135
Page 78
78/145DS13293 Rev 1
Table 36. Current consumption in Run and LPRun modes on CPU1, CoreMark code with data
running from Flash memory, ART enable (cache ON, prefetch OFF)
ConditionsTypMax
SymbolParameter
-
f
= f
(Run)
I
DD
I
DD
(LPRun)
1. Guaranteed by characterization results, unless otherwise specified.
Supply current
in Run mode
Supply current
in LPRun mode
HCLK
All peripherals
disabled
f
HCLK
All peripherals disabled
= f
MSI
MSI
Voltage
scaling
Range 2
SMPS
Range 2
Range 1
SMPS
Range 1
(1)
f
HCLK
(MHz)
25 °C55 °C85 °C105 °C25 °C85 °C105 °C
161.851.901.952.102.202.402.80
81.101.151.201.301.401.601.90
20.5850.6100.6700.760---
161.501.451.651.70---
81.001.051.051.10---
20.7300.7500.7800.830---
485.555.655.805.957.4011.014.0
323.853.954.054.205.608.4013.0
162.152.202.302.453.706.6011.0
483.403.453.553.60---
322.502.552.602.65---
161.601.601.651.70---
20.2200.2350.2900.3800.2700.4900.880
10.1200.1350.1850.2750.1500.3900.780
0.40.0580.07150.1200.2100.0840.3300.710
Electrical characteristicsSTM32WL55/54xx
Unit
mA
Page 79
DS13293 Rev 179/145
Table 37. Current consumption in Run and LPRun modes on CPU1 and CPU2, CoreMark code
SymbolParameter
I
DD
(Run)
I
DD
(LPRun)
Supply current in
Run mode
Supply current in
LPRun mode
with data running from SRAM1
ConditionsTyp
-
f
= f
HCLK
All peripherals
disabled
f
HCLK
All peripherals disabled
= f
MSI
MSI
Volt age
scaling
f
HCLK
(MHz)
25 °C55 °C85 °C105 °C
Range 2162.52.552.652.75
488.008.158.358.55
Range 1
325.805.906.056.25
484.754.854.955.00
SMPS
Range 1
323.503.603.653.75
162.202.252.302.40
20.350- - -
10.185- - -
0.40.0805---
STM32WL55/54xxElectrical characteristics
Unit
mA
Page 80
80/145DS13293 Rev 1
Table 38. Current consumption in Run and LPRun modes on CPU1, CoreMark code
SymbolParameter
-
f
= f
I
DD
(Run)
I
DD
(LPRun)
1. Guaranteed by characterization results, unless otherwise specified.
Supply current
in Run mode
Supply current
in LPRun mode
HCLK
All peripherals
disabled
f
HCLK
All peripherals disabled
= f
MSI
MSI
with data running from SRAM1
ConditionsTypMax
Voltage
scaling
Range 2
SMPS
Range 2
Range 1
SMPS
Range 1
f
HCLK
(MHz)
25 °C55 °C85 °C105 °C25 °C85 °C105 °C
161.901.902.002.102.202.402.80
8 1.101.151.201.301.401.602.00
2-------
161.401.451.501.55---
81.001.051.051.10---
20.7300.7500.7800.825---
485.655.755.906.056.506.707.10
323.904.004.104.254.604.805.20
162.202.252.302.452.502.803.20
483.453.503.603.65---
322.502.552.602.70---
161.601.601.651.70---
20.2200.2300.2850.3750.2400.4800.860
10.1200.1300.1800.2700.1400.3800.770
0.40.0520.0640.1150.2050.0770.3200.710
Electrical characteristicsSTM32WL55/54xx
(1)
Unit
mA
Page 81
Table 39. Typical current consumption in Run and LPRun modes on CPU1, with different codes
STM32WL55/54xxElectrical characteristics
running from Flash memory, ART enable (cache ON, prefetch OFF)
DS13293 Rev 181/145
SymbolParameter
IDD(Run)
Supply current in
Run mode
-Voltage scalingCode25 °C25 °C
= f
f
HCLK
MSI
All peripherals disabled
ConditionsTyp
Reduced code1.90
(1)
f
HCLK
Range 2
= 16 MHz
CoreMark
Dhrystone 2.11.85115.63
Fibonacci1.80112.50
While(1)1.60100.00
Reduced code1.4590.63
(1)
f
HCLK
SMPS
Range 2
= 16 MHz
CoreMark
Dhrystone 2.11.4087.50
Fibonacci1.4087.50
While(1)1.3081.25
Reduced code5.70118.75
(1)
f
HCLK
Range 1
= 48 MHz
CoreMark
Dhrystone 2.15.50114.58
Fibonacci5.40112.50
While(1)4.6596.88
Reduced code3.5072.92
(1)
f
HCLK
SMPS
Range 1
= 48 MHz
CoreMark
Dhrystone 2.13.4070.83
Fibonacci3.3068.75
While(1)2.9060.42
Typ
Unit
118.75
1.85115.63
1.4087.50
mA
5.55115.63
3.4070.83
Unit
µA/MHz
Page 82
82/145DS13293 Rev 1
Table 39. Typical current consumption in Run and LPRun modes on CPU1, with different codes
running from Flash memory, ART enable (cache ON, prefetch OFF) (continued)
Electrical characteristicsSTM32WL55/54xx
ConditionsTyp
SymbolParameter
-Voltage scalingCode25 °C25 °C
= f
IDD(LPRun)
1. CoreMark used for characterization results provided in Table 36 and Table 39.
Supply current in
LPRun mode
f
HCLK
All peripherals disabled
MSI
= 2 MHz
Typ
Unit
Reduced code0.225
CoreMark
(1)
Dhrystone 2.10.220110.00
0.220110.00
mA
112.50
Fibonacci0.240120.00
While(1)0.17587.50
Unit
µA/MHz
Page 83
Table 40. Typical current consumption in Run and LPRun modes on CPU1,
STM32WL55/54xxElectrical characteristics
with different codes running from SRAM1
DS13293 Rev 183/145
SymbolParameter
IDD(Run)
Supply current
in Run mode
-Voltage scalingCode25 °C25 °C
= f
f
HCLK
MSI
All peripherals disabled
ConditionsTyp
Reduced code1.95
(1)
f
HCLK
Range 2
= 16 MHz
CoreMark
Dhrystone 2.11.90118.75
Fibonacci1.90118.75
While(1)1.75109.38
Reduced code1.4590.63
Range 2
SMPS ON
f
HCLK
= 16 MHz
CoreMark
Dhrystone 2.11.4590.63
Fibonacci1.4590.63
(1)
While(1)1.3584.38
Reduced code5.90122.92
(1)
f
HCLK
Range 1
= 48 MHz
CoreMark
Dhrystone 2.15.70118.75
Fibonacci5.65117.71
While(1)5.10106.25
Reduced code3.6075.00
Range 1
SMPS ON
f
HCLK
= 48 MHz
CoreMark
Dhrystone 2.13.5072.92
Fibonacci3.4571.88
(1)
While(1)3.1565.63
Typ
Unit
121.88
1.90118.75
1.4590.63
mA
5.65117.71
3.4571.88
Unit
µA/MHz
Page 84
84/145DS13293 Rev 1
Table 40. Typical current consumption in Run and LPRun modes on CPU1,
with different codes running from SRAM1 (continued)
Electrical characteristicsSTM32WL55/54xx
ConditionsTyp
SymbolParameter
-Voltage scalingCode25 °C25 °C
= f
Supply current
IDD(LPRun)
1. CoreMark used for characterization results provided in Table 36 and Table 39.
2. Flash memory in power-down mode.
(2)
in LPRun mode
f
HCLK
All peripherals disabled
MSI
= 2 MHz
Typ
Unit
Reduced code0.225
CoreMark
(1)
Dhrystone 2.10.225112.50
0.220110.00
mA
112.50
Fibonacci0.225112.50
While(1)0.19597.50
Unit
µA/MHz
Page 85
SymbolParameter
I
DD
(Sleep)
Supply current
in Sleep mode
Table 41. Current consumption in Sleep and LPSleep modes on CPU1, Flash memory ON
ConditionsTypMax
-
= f
f
HCLK
MSI
All peripherals disabled
Volt age
scaling
Range 2
Range 1
f
HCLK
(MHz)
25 °C55 °C85 °C105 °C25 °C85 °C105 °C
160.7700.8000.8600.9551.001.301.60
80.5700.6000.6550.7450.7800.9901.40
20.4450.4700.5250.6150.6500.8601.30
481.701.701.801.902.102.302.70
321.251.301.401.501.601.902.30
160.8450.8750.9451.051.101.401.80
STM32WL55/54xxElectrical characteristics
(1)
Unit
DS13293 Rev 185/145
Supply current
(LPSleep)
I
DD
in LPSleep
mode
1. Guaranteed by characterization results, unless otherwise specified.
= f
f
HCLK
MSI
All peripherals disabled
SMPS
Range 1
481.351.401.451.50---
321.151.151.201.25---
160.8950.9150.9501.00---
20.0680.08050.1300.2200.0950.3300.720
10.0440.05650.1050.1950.0690.3100.700
0.40.02250.0400.08850.1800.0520.2900.680
0.10.0180.0320.0810.1700.0450.2800.670
mA
Page 86
86/145DS13293 Rev 1
Table 42. Current consumption in Sleep and LPSleep modes on CPU1 and CPU2,
SymbolParameter
Flash memory ON
ConditionsTyp
-Voltage scalingf
(MHz)25 °C
HCLK
160.790
Electrical characteristicsSTM32WL55/54xx
Unit
(Sleep)
I
DD
(LPSleep)
I
DD
Supply current in
Sleep mode
Supply current in
LPSleep mode
Table 43. Current consumption in LPSleep mode on CPU1, Flash memory in power-down
f
= f
HCLK
MSI
All peripherals disabled
= f
f
HCLK
MSI
All peripherals disabled
ConditionsTypMax
SymbolParameter
-f
(MHz)25 °C55 °C85 °C105 °C25 °C85 °C105 °C
HCLK
258.074.512521586.0330710
I
DD
(LPSleep)
Supply current in
LPSleep mode
HCLK
All peripherals
disabled
MS
135.550.599.019060.0300690
0.418.533.581.517041.0280670
= f
f
0.111.026.574.516536.0280660
1. Guaranteed by characterization results, unless otherwise specified.
Range 2
Range 1
SMPS Range 1
80.585
20.450
481.75
321.30
160.870
mA
481.40
321.15
160.905
0.10.0165
(1)
Unit
µA
Page 87
SymbolParameter
(LPSleep)
I
DD
Supply current in
LPSleep mode
Table 44. Current consumption in LPSleep mode on CPU1 and CPU2,
Flash memory in power-down
ConditionsTyp
-f
f
= f
HCLK
MS
All peripherals disabled
(MHz)25 °C
HCLK
259.5
136.0
0.421.5
0.112.5
STM32WL55/54xxElectrical characteristics
Unit
µA
Table 45. Current consumption in Stop 2 mode
ConditionsTypMax
SymbolParameter
DS13293 Rev 187/145
I
DD
(Stop 2)
I
DD
(Stop 2 with
RTC)
1. Guaranteed based on test during characterization, unless otherwise specified.
2. LSI using LSIPRE = 1 configuration.
Supply current in Stop 2 mode
RTC disabled
Supply current in Stop 2 mode
RTC enabled, clocked by LSI
(2)
(1)
V
(V)0 °C25 °C55 °C85 °C105 °C0 °C25 °C85 °C105 °C
DD
1.80.5450.8302.458.4513.51.202.2024.066.0
2.40.5250.8502.608.8014.0----
3.00.6050.8852.809.2514.51.102.6026.069.0
3.60.6300.9353.109.7515.51.402.8026.071.0
1.80.6500.8802.558.2513.51.302.3024.066.0
2.40.6300.9452.708.8514.0----
3.00.7151.002.909.7015.01.402.8026.069.0
3.60.7501.103.1510.515.51.503.0026.071.0
Unit
µA
Page 88
88/145DS13293 Rev 1
Table 46. Current consumption during wakeup from Stop 2 mode
Typ a t 2 5 ° C
Conditions
= 1.8 VVDD = 2.4 VVDD = 3.0 VVDD = 3.6 V
V
DD
Wakeup clock: MSI 4 MHz, voltage range 22.933.223.454.79
Wakeup clock: MSI 2 MHz, voltage range 24.445.035.827.36
Wakeup clock: MSI 4 MHz, voltage range 13.033.143.514.66
Wakeup clock: MSI 16 MHz, voltage range 11.751.952.003.06
Wakeup clock: MSI 48 MHz, voltage range 11.751.401.892.80
Electrical characteristicsSTM32WL55/54xx
Unit
nAs
Table 47. Current consumption in Stop 1 mode
ConditionsTypMax
SymbolParameter
(V)0 °C25 °C55 °C85 °C105 °C0 °C25 °C85 °C105 °C
V
DD
1.82.054.0014.047.074.56.1020.0200480
I
DD
(Stop 1)
Supply current in Stop 1 mode
RTC disabled
2.42.153.9514.047.075.0----
3.02.154.1514.047.575.55.9020.0200490
3.62.254.2014.048.076.56.2020.0200490
1.82.154.1014.047.075.06.3020.0200480
I
DD
(Stop 1with
RTC)
Supply current in Stop 1 mode
RTC enabled, clocked by LSI
(2)
2.42.154.1014.047.575.5----
3.02.254.2014.047.576.06.4021.0200490
3.62.304.1514.548.577.06.7021.0200490
1. Guaranteed based on test during characterization, unless otherwise specified.
2. LSI using LSIPRE = 1 configuration.
(1)
Unit
µA
Page 89
Table 48. Current consumption during wakeup from Stop 1 mode
Typ a t 2 5 ° C
Conditions
= 1.8 VVDD = 2.4 VVDD = 3.0 VVDD = 3.6 V
V
DD
Wakeup clock: MSI 4 MHz, voltage range 21.051.151.091.18
Wakeup clock: MSI 2 MHz, voltage range 21.811.812.122.40
Wakeup clock: MSI 4 MHz, voltage range 10.7661.231.341.49
Wakeup clock: MSI 16 MHz, voltage range 10.3100.1690.9350.836
Wakeup clock: MSI 48 MHz, voltage range 10.07070.4610.5330.565
STM32WL55/54xxElectrical characteristics
Unit
nAs
Table 49. Current consumption in Stop 0 mode
ConditionsTypMax
SymbolParameter
-
DS13293 Rev 189/145
I
DD
(Stop 0)
1. Guaranteed based on test during characterization, unless otherwise specified.
Supply current in Stop 0 mode
RTC disabled
Table 50. Current consumption during wakeup from Stop 0 mode
Conditions
Wakeup clock: MSI 4 MHz, voltage range 23.453.763.454.04
Wakeup clock: MSI 2 MHz, voltage range 23.053.203.743.35
Wakeup clock: MSI 4 MHz, voltage range 13.203.663.304.11
Wakeup clock: MSI 16 MHz, voltage range 11.071.251.711.80
Wakeup clock: MSI 48 MHz, voltage range 10.8671.131.390.949
(1)
V
DD
(V)
0 °C25 °C55 °C85 °C105 °C0 °C25 °C85 °C105 °C
1.83353453654154554805007401200
2.4360370395445485----
3.03904004254755155405708001200
3.64254354605155505806008401300
Typ a t 2 5 ° C
Unit
VDD = 1.8 VVDD = 2.4 VVDD = 3.0 VVDD = 3.6 V
nAs
Unit
µA
Page 90
90/145DS13293 Rev 1
Table 51. Current consumption in Standby mode
ConditionsTypMax
SymbolParameter
-
V
(V)
DD
0 °C25 °C55 °C85 °C105 °C0 °C25 °C85 °C105 °C
1.80.0090.0270.2451.002.40----
2.40.0220.0510.3401.352.85----
3.00.0460.0710.4701.753.40----
3.60.0750.1250.6502.304.05----
1.80.1300.2050.8202.905.550.2000.5508.2024.0
2.40.1400.2250.9153.256.05----
3.00.1650.2551.053.706.600.2800.7109.4027.0
I
DD
(Standby)
Supply current in
Standby mode
RTC disabled
Backup registers
retained
No retention
SRAM2 retained
3.60.1900.3001.204.257.250.3300.77010.028.0
1.80.2150.2950.8953.105.30----
RTC clocked by LSI
(PREDIV = 1)
RTC clocked by LSE
(2)
quartz
in low drive
I
DD
(Standby
with RTC)
Supply current in
Standby mode
(backup registers
and SRAM2
retained)
RTC enabled
mode
1. Guaranteed by characterization results, unless otherwise specified.
2. Based on characterization done with a 32.768 kHz crystal (MC306-G-06Q-32.768, manufacturer JFVNY) with two 6.8 pF loading capacitors.
Table 52. Current consumption during wakeup from Standby mode
2.4
3.0
3.6
1.8
2.4
3.0
3.6
0.2300.3250.9903.455.95----
0.2600.3601.153.956.85----
0.3050.4251.304.557.85----
0.2700.3500.9753.155.80----
0.2950.3901.103.506.25----
0.3450.4451.254.006.85----
0.4150.5351.454.607.55----
Typ at 25 °C
SymbolConditions
= 1.8 VVDD = 2.4 VVDD = 3.0 VVDD = 3.6 V
V
DD
IDD (wakeup from Standby)
Wakeup clock: MSI 4 MHz23.581.3111114
Wakeup clock: MSI 8 MHz15.215.717.319.6
Electrical characteristicsSTM32WL55/54xx
(1)
Unit
µA
Unit
nAs
Page 91
SymbolParameter
Table 53. Current consumption in Shutdown mode
ConditionsTypMax
V
-
DD
(V)
1.80.0010.0080.1050.3800.9950.0010.0431.706.40
0 °C25 °C55 °C85 °C105 °C0 °C25 °C85 °C105 °C
STM32WL55/54xxElectrical characteristics
(1)
Unit
I
DD
(Shutdown)
Supply current in Shutdown mode
RTC disabled
Backup registers retained
2.40.0080.0180.1350.4451.20----
3.00.0180.0310.1800.5451.450.0780.1502.408.50
3.60.0410.0620.2600.6901.800.1100.1902.909.90
1.80.0540.0650.1450.5451.35----
2.40.0900.1050.2000.6651.60----
3.00.1600.1750.2950.8601.95----
3.60.2500.2800.4401.152.45----
1.80.1400.1550.2700.6051.20----
2.40.1650.1850.3150.7051.40----
3.00.2050.2250.3800.8551.70----
DS13293 Rev 191/145
I
DD
(Shutdown
with RTC)
Supply current
in Shutdown
mode (backup
registers
retained)
RTC enabled
RTC clocked by
an external clock
RTC clocked by
LSE quartz
(2)
in
low drive mode
3.60.2650.2950.5001.102.10----
1. Guaranteed by characterization results, unless otherwise specified.
2. Based on characterization done with a 32.768 kHz crystal (MC306-G-06Q-32.768, manufacturer JFVNY) with two 6.8 pF loading capacitors.
µA
Page 92
92/145DS13293 Rev 1
Table 54. Current consumption in VBAT mode
ConditionsTypMax
SymbolParameter
-
V
BAT
(V)
0 °C25 °C55 °C85 °C105 °C105 °C
1.81.003.0019.095.01801.00
2.41.003.0022.01102001.00
3.01.005.0031.01502701.00
3.63.0011.050.02203803.00
1.8140150180275390140
2.4155170200310435155
(1)
3.0185200235375545185
I
DD
(VBAT)
RTC disabled
Backup domain
supply current
RTC enabled and
clocked by LSE quartz
3.6230245295485710230
1. Based on characterization done with a 32.768 kHz crystal (MC306-G-06Q-32.768, manufacturer JFVNY) with two 6.8 pF loading capacitors.
Table 55. Current under Reset condition
ConditionsTyp
Symbol
V
(V)25 °C
DD
1.8 V600
I
DD
(RST)
2.4 V650
3.0 V700
3.6 V780
Electrical characteristicsSTM32WL55/54xx
Unit
nA
Unit
µA
Page 93
STM32WL55/54xxElectrical characteristics
I
SW
V
DDfSW
C××=
I/O system current consumption
The current consumption of the I/O system has two components: a static and a dynamic.
I/O static current consumption
All the I/Os used as inputs with pull-up generate current consumption when the pin is
externally held low. The value of this current consumption can be simply computed by using
the pull-up/pull-down resistors values given in Table 75: I/O static characteristics.
For the output pins, any external pull-down or external load must also be considered to
estimate the current consumption.
Additional I/O current consumption is due to I/Os configured as inputs if an intermediate
voltage level is externally applied. This current consumption is caused by the input Schmitt
trigger circuits used to discriminate the input value. Unless this specific configuration is
required by the application, this supply current consumption can be avoided by configuring
these I/Os in analog mode. This is notably the case of ADC input pins which should be
configured as analog inputs.
Caution:Any floating input pin can also settle to an intermediate voltage level or switch inadvertently,
as a result of external electromagnetic noise. To avoid current consumption related to
floating pins, these pins must either be configured in analog mode, or forced internally to a
definite digital value. This can be done either by using pull-up/down resistors or by
configuring the pins in output mode.
I/O dynamic current consumption
In addition to the internal peripheral current consumption measured previously (see
Table 56: Peripheral current consumption, the I/Os used by an application also contribute to
the current consumption. When an I/O pin switches, it uses the current from the I/O supply
voltage to supply the I/O pin circuitry and to charge/discharge the capacitive load (internal or
external) connected to the pin:
where
•I
•V
•f
•C is the total capacitance seen by the I/O pin: C = C
•C
is the current sunk by a switching I/O to charge/discharge the capacitive load.
SW
is the I/O supply voltage.
DD
is the I/O switching frequency.
SW
+ C
Io
EXT .
is the PCB board capacitance plus any connected external device pin
EXT
capacitance.
The test pin is configured in push-pull output mode and is toggled by software at a fixed
frequency.
DS13293 Rev 193/145
135
Page 94
Electrical characteristicsSTM32WL55/54xx
On-chip peripheral current consumption
The current consumption of the on-chip peripherals is given in the table below. The device is
placed under the following conditions:
•All I/O pins are in analog mode.
•The given value is calculated by measuring the difference of the current consumptions:
–when the peripheral is clocked on
–when the peripheral is clocked off
•Ambient operating temperature and supply voltage conditions summarized in Table 21:
Voltage characteristics.
•The power consumption of the digital part of the on-chip peripherals is given in the table
below. The power consumption of the analog part of the peripherals (where applicable)
is indicated in each related section of the datasheet.
PeripheralRange 1Range 2LPRun and LPSleepUnit
CRC10.420.381.00
DMA12.291.881.45
Table 56. Peripheral current consumption
AHB1
AHB2
AHB3
DMA22.501.941.50
DMAMUX13.963.382.50
All AHB1 peripherals9.177.509.30
GPIOA0.010.120.20
GPIOB0.010.120.15
GPIOC0.010.120.15
GPIOH0.010.060.10
All AHB2 peripherals0.620.560.40
AES12.502.131.80
FLASH7.926.5611.3
PKA3.332.752.15
RNG11.04N/AN/A
RNG1 independent clock domain0.62N/AN/A
SRAM10.620.380.55
SRAM20.420.370.50
All AHB3 peripherals
DAC0.830.690.50
I2C11.671.371.05
(1)
16.013.416.0
µA/MHz
µA/MHz
µA/MHz
APB1
I2C1 independent clock domain2.291.941.40
I2C21.671.371.05
I2C2 independent clock domain2.502.001.60
I2C31.671.370.90
94/145DS13293 Rev 1
µA/MHz
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STM32WL55/54xxElectrical characteristics
Table 56. Peripheral current consumption (continued)
PeripheralRange 1Range 2LPRun and LPSleepUnit
I2C3 independent clock domain2.291.871.30
LPTIM11.671.441.50
LPTIM1 independent clock domain2.502.191.45
LPTIM21.671.370.90
LPTIM2 independent clock domain2.502.121.55
LPTIM30.830.690.65
LPTIM3 independent clock domain2.291.940.65
LPUART12.081.813.55
APB1
LPUART1 independent clock
domain
RTCAPB2.081.811.50
SPI21.461.190.90
TIM24.583.812.95
USART21.881.561.35
USART2 independent clock domain4.583.753.05
2.502.061.35
µA/MHz
WWDG10.420.310.05
All APB1 peripherals
ADC1.251.000.70
ADC independent clock domain0.210.130.30
SPI11.251.060.90
TIM16.255.198.30
APB2
APB3
All peripherals
1. Without independent clocks.
TIM162.291.941.35
TIM172.291.871.25
USART11.671.381.00
USART1 independent clock domain4.173.382.90
All APB2 peripherals
SUBGHZSPI1.461.251.10
(1)
(1)
(1)
19.616.120.2
15.813.015.8
62.952.359.7
5.3.8 Wakeup time from low-power modes and voltage scaling
transition times
µA/MHz
µA/MHzAll APB3 peripherals1.461.251.10
The wakeup times given in the table below, are the latency between the event and the
execution of the first user instruction.
The device goes in low-power mode after the WFE (wait for event) instruction.
DS13293 Rev 195/145
135
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Electrical characteristicsSTM32WL55/54xx
Table 57. Low-power mode wakeup timings
(1)
SymbolParameterConditionsTypMaxUnit
t
WUSLEEP
t
WULPSLEEP
Wakeup time from
Sleep to Run mode
Wakeup time from
LPSleep to LPRun
mode
-0.188 0.222
Wakeup in Flash with memory in power-down
during LPSleep mode (FPDS = 1 in PWR_CR1)
and with clock MSI = 2 MHz
3.814.38
Wakeup clock MSI = 48 MHz2.142.90
Wakeup clock MSI = 16 MHz2.783.58
Wakeup clock HSI16 = 16 MHz1.99-
To Run mode
(Range 1)
Wakeup clock HSI16 = 16 MHz
with HSIKERON enabled
1.011.13
t
WUSTOP0
Wakeup time from
Stop 0 mode in Flash
memory
(2)
Wakeup clock MSI = 4 MHz6.798.21
Wakeup clock MSI = 2 MHz10.412.2
To LPRun mode Wakeup clock MSI = 2 MHz10.512.3
Wakeup clock MSI = 48 MHz5.156.55
Wakeup clock MSI = 16 MHz5.737.14
Wakeup clock HSI16 = 16 MHz5.717.10
To Run mode
(Range 1)
Wakeup clock HSI16 = 16 MHz
with HSIKERON enabled
4.576.52
t
WUSTOP1
Wakeup time from
Stop 1 mode in Flash
memory
(2)
Wakeup clock MSI = 4 MHz8.439.93
µs
µs
µs
Wakeup clock MSI = 2 MHz11.913.7
To LPRun mode Wakeup clock MSI = 2 MHz10.613.9
Wakeup clock MSI = 48 MHz5.566.85
Wakeup clock MSI = 16 MHz6.327.59
Wakeup clock HSI16 = 16 MHz6.287.51
Wakeup clock HSI16 = 16 MHz
with HSIKERON enabled
6.267.53
t
WUSTOP2
Wakeup time from
Stop 2 mode in Flash
memory
(2)
To Run mode
(Range 1)
Wakeup clock MSI = 4 MHz9.6910.9
Wakeup clock MSI = 2 MHz14.015.4
t
WUSTBY
t
WUSHUTD
1. Guaranteed by characterization results (VDD = 3 V, T = 25 °C).
2. Wakeup time is equivalent when code is executed from SRAM1 compared to Flash memory. It is also equivalent when
going to Range 2 rather than Range 1.
Wakeup time from
Standby to Run mode
Wakeup time from
Shutdown to Run mode
Range 1
Range 1Wakeup clock MSI = 4 MHz264316
Wakeup clock MSI = 4 MHz34.339.2
Wakeup clock MSI = 8 MHz22.425.6
µs
µs
96/145DS13293 Rev 1
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STM32WL55/54xxElectrical characteristics
Table 58. Regulator modes transition times
(1)
SymbolParameterConditionsTypMaxUnit
t
WULPRUN
t
VOST
1. Guaranteed by characterization results (VDD = 3 V, T = 25 °C).
2. Time until REGLPF flag is cleared in PWR_SR2.
3. Time until VOSF flag is cleared in PWR_SR2.
Transition time from LPRun to Run
(2)
mode
Regulator transition time from Range 2 to
Range 1
Regulator transition time from Range 1 to
Range 2
(3)
(3)
Code run with MSI = 2 MHz19.6-
21.932.2
Code run with HSI16
23.133.9
5.3.9 External clock source characteristics
High-speed external user clock generated from an external source
The high-speed external (HSE32) clock can be supplied with a 32 MHz crystal oscillator or
by a TCXO (temperature controlled crystal oscillator).
Crystal oscillator
The devices include internal programmable capacitances that can be used to tune the
crystal frequency in order to compensate the PCB parasitic one.
µs
Characteristics in the tables below, are measured over recommended operating conditions,
unless otherwise specified. Typical values are referred to T
SymbolParameterConditionsMinTypMaxUnit
f
nom
f
TOL
C
C
Shunt
C
motion
ESR
P
1. 32 MHz XTAL is specified for two specific references: NX2016SA and NX1612SA.
2. Load capacitance can be managed by internal programmable capacitances at calibration phase. No need to add external
foot capacitances. The values indicated take into account the combination of the two foot capacitances.
Oscillator frequency--32-MHz
Frequency accuracy
Load capacitance
Load
Crystal shunt capacitance-0.30.62
Crystal motional capacitance-1.31.892.5fF
Crystal equivalent series
resistance
Drive level---100µW
D
Table 59. HSE32 crystal requirements
Initial--±10
Aging over 10 years--±10
(2)
-9.51010.5
--3060
= 25 °C and VDD = 3 V.
A
(1)
ppmOver temperature (-20 to 70 °C)--±10
pF
DS13293 Rev 197/145
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Electrical characteristicsSTM32WL55/54xx
Table 60. HSE32 oscillator characteristics
SymbolParameterConditionsMinTypMaxUnit
stabilized,
V
t
SUA(HSE)
t
SUR(HSE)
I
DDRF(HSE)
XOT
g(HSE)
XOT
fp(HSE)
Startup time for 80% amplitude
stabilization
Startup time
for HSEREADY signal
HSE32 current consumption
SUBGHZ_HSEINTRIMR
granularity
SUBGHZ_HSEINTRIMR
frequency pulling
DDRF
SUBGHZ_HSEINTRIMR = 0x12,
-40 to +105 °C temperature range
stabilized,
V
DDRF
SUBGHZ_HSEINTRIMR = 0x12,
-40 to +105 °C temperature range
HSEGMC = 000,
SUBGHZ_HSEINTRIMR = 0x12
-1000-
-180-
-50-µA
-15
±15±30-
Capacitor bank
XOT
XOT
nb(HSE)
st(HSE)
SUBGHZ_HSEINTRIMR
number of tuning bits
SUBGHZ_HSEINTRIMR setting
time
-6-bit
--0.1ms
For more information about the trimming methodology of the oscillator, refer to the
application note HSE trimming for STM32 wireless MCUs (AN5042).
µs
ppm
TCXO regulator
SymbolParameterConditionsMinTypMaxUnit
V
TCXO
Regulated voltage range for
TCXO voltage supply
ILTCXOLoad current for TCXO regulator --1.54mA
TSVTCXO Startup time for TCXO regulator
IDDTCXO
ATC XO
1. In order to minimize spurious injection, the capacitance value must be calculated such that an amplitude of
0.4 to 0.5 Vpk-pk on OSC_IN is obtained. For TCXO output voltage of 0.8 Vpk-pk, 10 pF can be used.
Current consumption for TCXO
regulator
Amplitude voltage for external
TCXO applied to OSC_IN pin
Table 61. HSE32 TCXO regulator characteristics
> V
V
DDOP
From enable to regulated voltage
within 25 mV from target
Quiescent current--70µA
Relative to load current-1.62%
Provided through a 220 resistor
in series with a capacitance
(voltage divider)
+ 200 mV1.61.73.3V
TCXO
(1)
--50µs
0.40.61.2Vpk-pk
Low-speed external user clock generated from an external source
The low-speed external (LSE) clock can be supplied with a 32.768 kHz crystal resonator
oscillator. The information provided in this section is based on design simulation results
obtained with typical external components specified in the table below. In the application,
98/145DS13293 Rev 1
Page 99
STM32WL55/54xxElectrical characteristics
MS30253V2
OSC32_IN
OSC32_OUT
Drive
programmable
amplifier
f
LSE
32.768 kHz
resonator
Resonator with integrated
capacitors
C
L1
C
L2
the resonator and the load capacitors have to be placed as close as possible to the
oscillator pins to minimize output distortion and startup stabilization time.
Refer to the crystal resonator manufacturer for more details on the resonator characteristics
(frequency, package, accuracy).
Table 62. Low-speed external user clock characteristics
reached. This value is measured for a standard crystal and it can vary significantly with the crystal manufacturer.
Startup timeVDD stabilized-2-s
is the startup time measured from the moment it is enabled (by software) until a stable 32.768 kHz oscillation is
For more information on the crystal selection, refer to application note Oscillator design guide for STM8AF/AL/S, STM32 MCUs and MPUs (AN2867).
Figure 16. Typical application with a 32.768 kHz crystal
nA
µA/V
Note:No external resistors are required between OSC32_IN and OSC32_OUT, and it is forbidden
to add one.
In bypass mode, the LSE oscillator is switched off and the input pin is a standard GPIO.
DS13293 Rev 199/145
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Electrical characteristicsSTM32WL55/54xx
MS19215V2
V
LSEH
t
f(LSE)
90%
10%
T
LSE
t
t
r(LSE)
V
LSEL
t
w(LSEH)
t
w(LSEL)
The external clock signal has to respect the I/O characteristics detailed in Section 5.3.16:
I/O port characteristics.The recommend clock input waveform is shown in the figure below.
Figure 17. Low-speed external clock source AC timing diagram
Table 63. Low-speed external user clock characteristics
(1)
– Bypass mode
SymbolParameterConditionsMinTypMaxUnit
f
LSE_ext
V
LSEH
V
LSEL
t
w(LSEH)
t
w(LSEL)
User external clock source
frequency
OSC32_IN input pin highlevel voltage
OSC32_IN input pin lowlevel voltage
OSC32_IN high or low time-250--ns
-21.232.76844.4kHz
-
-V
0.7 x
V
DDx
SS
-V
-0.3 x V
DDx
DDx
Includes initial accuracy,
f
tolLSE
Frequency tolerance
stability over temperature,
–500-+500ppm
aging and frequency pulling
1. Guaranteed by design.
5.3.10 Internal clock source characteristics
Parameters given in the table below are derived from tests performed under ambient
temperature and supply voltage conditions summarized in Table 25: General operating
conditions. The provided curves are characterization results, not tested in production.
V
High-speed internal (HSI16) RC oscillator
SymbolParameterConditionsMinTypMaxUnit
f
HSI16
100/145DS13293 Rev 1
HSI16 frequency V
Table 64. HSI16 oscillator characteristics
(1)
= 3.0 V, TA = 30 °C 15.88-16.08MHz
DD
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