Ultra-low-power 32-bit MCU Arm®-based Cortex®-M3 with 512KB
Flash, 80KB SRAM, 16KB EEPROM, LCD, USB, ADC, DAC
Datasheet - production data
Features
Includes ST state-of-the-art patented
technology
• Ultra-low-power platform
– 1.65 V to 3.6 V power supply
– -40 °C to 105 °C temperature range
– 290 nA Standby mode (3 wakeup pins)
– 1.11 µA Standby mode + RTC
– 560 nA Stop mode (16 wakeup lines)
– 1.4 µA Stop mode + RTC
– 11 µA Low-power run mode down to 4.6 µA
in Low-power sleep mode
– 195 µA/MHz Run mode
– 10 nA ultra-low I/O leakage
– 8 µs wakeup time
• Core: Arm
®
Cortex®-M3 32-bit CPU
– From 32 kHz up to 32 MHz max
– 1.25 DMIPS/MHz (Dhrystone 2.1)
– Memory protection unit
• Up to 34 capacitive sensing channels
• CRC calculation unit, 96-bit unique ID
• Reset and supply management
– Low-power, ultrasafe BOR (brownout reset)
with 5 selectable thresholds
– Ultra-low-power POR/PDR
– Programmable voltage detector (PVD)
• Clock sources
– 1 to 24 MHz crystal oscillator
– 32 kHz oscillator for RTC with calibration
– Internal 16 MHz oscillator factory trimmed
RC(+/-1%) with PLL option
– Internal low-power 37 kHz oscillator
– Internal multispeed low-power 65 kHz to
4.2 MHz oscillator
– PLL for CPU clock and USB (48 MHz)
• Pre-programmed bootloader
– USB and USART supported
• Up to 116 fast I/Os (102 I/Os 5V tolerant), all
mappable on 16 external interrupt vectors
• Memories
– 512 Kbytes of Flash memory with ECC
(with 2 banks of 256 Kbytes enabling RWW
capability)
– 80 Kbytes of RAM
– 16 Kbytes of true EEPROM with ECC
– 128-byte backup register
• LCD driver (except STM32L151xE devices) up
to 8x40 segments, contrast adjustment,
blinking mode, step-up converter
• Rich analog peripherals (down to 1.8 V)
– 2x operational amplifiers
– 12-bit ADC 1 Msps up to 40 channels
– 12-bit DAC 2 ch with output buffers
– 2x ultra-low-power comparators
(window mode and wake up capability)
• DMA controller 12x channels
• 11x peripheral communication interfaces
– 1x USB 2.0 (internal 48 MHz PLL)
– 5x USARTs
– Up to 8x SPIs (2x I2S, 3x 16 Mbit/s)
– 2x I
2
Cs (SMBus/PMBus)
• 11x timers: 1x 32-bit, 6x 16-bit with up to 4
IC/OC/PWM channels, 2x 16-bit basic timers,
2x watchdog timers (independent and window)
• Development support: serial wire debug, JTAG
and trace
April 2021DS10002 Rev 101/136
This is information on a product in full production.
This datasheet provides the ordering information and mechanical device characteristics of
the STM32L151xE and STM32L152xE ultra-low-power Arm
®
Cortex®-M3 based
microcontroller product line. STM32L151xE and STM32L152xE devices are
microcontrollers with a Flash memory density of 512
Kbytes.
The ultra-low-power STM32L151xE and STM32L152xE family includes devices in 5
different package types: from 64 pins to 144 pins. Depending on the device chosen,
different sets of peripherals are included, the description below gives an overview of the
complete range of peripherals proposed in this family.
These features make the ultra-low-power STM32L151xE and STM32L152xE
microcontroller family suitable for a wide range of applications:
•Medical and handheld equipment
•Application control and user interface
•PC peripherals, gaming, GPS and sport equipment
•Alarm systems, wired and wireless sensors, video intercom
•Utility metering
This STM32L151xE and STM32L152xE datasheet must be read in conjunction with the
STM32L1xxxx reference manual (RM0038). The application note “Getting started with
STM32L1xxxx hardware development” (AN3216) gives a hardware implementation
overview. Both documents are available from the STMicroelectronics website www.st.com.
For information on the Arm
®(a)
Cortex®-M3 core, refer to the Arm® Cortex®-M3 technical
reference manual, available from the www.arm.com website. Figure 1 shows the general
block diagram of the device family.
For information on the device errata with respect to the datasheet and reference manual,
refer to the STM32L15xE errata sheet (ES0235), available on the STMicroelectronics
website www.st.com.
a. Arm is a registered trademark of Arm Limited (or its subsidiaries) in the US and/or elsewhere.
DS10002 Rev 109/136
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DescriptionSTM32L151xE STM32L152xE
2 Description
The ultra-low-power STM32L151xE and STM32L152xE devices incorporate the
connectivity power of the universal serial bus (USB) with the high-performance Arm
®
Cortex
protection unit (MPU), high-speed embedded memories (Flash memory up to 512
and RAM up to 80 Kbytes), and an extensive range of enhanced I/Os and peripherals
connected to two APB buses.
The STM32L151xE and STM32L152xE devices offer two operational amplifiers, one 12-bit
ADC, two DACs, two ultra-low-power comparators, one general-purpose 32-bit timer, six
general-purpose 16-bit timers and two basic timers, which can be used as time bases.
Moreover, the STM32L151xE and STM32L152xE devices contain standard and advanced
communication interfaces: up to two I2Cs, three SPIs, two I2S, three USARTs, two UARTs
and an USB. The STM32L151xE and STM32L152xE devices offer up to 34
sensing channels to simply add a touch sensing functionality to any application.
They also include a real-time clock and a set of backup registers that remain powered in
Standby mode.
Finally, the integrated LCD controller (except STM32L151xE devices) has a built-in LCD
voltage generator that allows to drive up to 8 multiplexed LCDs with the contrast
independent of the supply voltage.
The ultra-low-power STM32L151xE and STM32L152xE devices operate from a 1.8 to 3.6 V
power supply (down to 1.65
supply without BOR option. They are available in the -40 to +85 °C and -40 to +105 °C
temperature ranges. A comprehensive set of power-saving modes allows the design of lowpower applications.
-M3 32-bit RISC core operating at a frequency of 32 MHz (33.3 DMIPS), a memory
capacitive
V at power down) with BOR and from a 1.65 to 3.6 V power
®
Kbytes
10/136DS10002 Rev 10
Page 11
STM32L151xE STM32L152xEDescription
2.1 Device overview
Table 2. Ultra-low-power STM32L151xE and STM32L152xE device features and peripheral
1. 5 SPIs are USART configured in synchronous mode emulating SPI master.
2. STM32L152xx devices only.
1.8 V to 3.6 V (down to 1.65 V at power-down) with BOR option
1.65 V to 3.6 V without BOR option
Ambient operating temperature: -40 °C to 85 °C / -40 °C to 105 °C
Junction temperature: –40 to + 110 °C
LQFP100,
WLCSP104
UFBGA132LQFP144
DS10002 Rev 1011/136
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DescriptionSTM32L151xE STM32L152xE
2.2 Ultra-low-power device continuum
The ultra-low-power family offers a large choice of cores and features. From proprietary 8bit to up to Cortex-M3, including the Cortex-M0+, the STM32Lx series are the best choice to
answer the user needs, in terms of ultra-low-power features. The STM32 ultra-low-power
series are the best fit, for instance, for gas/water meter, keyboard/mouse or fitness and
healthcare, wearable applications. Several built-in features like LCD drivers, dual-bank
memory, Low-power run mode, op-amp, AES 128-bit, DAC, USB crystal-less and many
others clearly allow very cost-optimized applications to be built by reducing BOM.
Note:STMicroelectronics as a reliable and long-term manufacturer ensures as much as possible
the pin-to-pin compatibility between any STM8Lxxxxx and STM32Lxxxxx devices and
between any of the STM32Lx and STM32Fx series. Thanks to this unprecedented
scalability, the old applications can be upgraded to respond to the latest market features and
efficiency demand.
2.2.1 Performance
All the families incorporate highly energy-efficient cores with both Harvard architecture and
pipelined execution: advanced STM8 core for STM8L families and Arm Cortex-M3 core for
STM32L family. In addition specific care for the design architecture has been taken to
optimize the mA/DMIPS and mA/MHz ratios.
This allows the ultra-low-power performance to range from 5 up to 33.3 DMIPs.
2.2.2 Shared peripherals
STM8L15xxx, STM32L15xxx and STM32L162xx share identical peripherals which ensure a
very easy migration from one family to another:
•Analog peripherals: ADC, DAC and comparators
•Digital peripherals: RTC and some communication interfaces
2.2.3 Common system strategy.
To offer flexibility and optimize performance, the STM8L15xxx, STM32L15xxx and
STM32L162xx family uses a common architecture:
•Same power supply range from 1.65 V to 3.6 V
•Architecture optimized to reach ultra-low consumption both in low-power modes and
Run mode
•Fast startup strategy from low-power modes
•Flexible system clock
•Ultrasafe reset: same reset strategy including power-on reset, power-down reset,
brownout reset and programmable voltage detector
2.2.4 Features
ST ultra-low-power continuum also lies in feature compatibility:
•More than 15 packages with pin count from 20 to 144 pins and size down to 3 x 3 mm
•Memory density ranging from 2 to 512 Kbytes
12/136DS10002 Rev 10
Page 13
STM32L151xE STM32L152xEFunctional overview
MSv34186V1
POWER
VOLT. REG.
12bit ADC
EXT.IT
WKUP
WinWATCHDOG
JTAG & SW
Fmax: 32 MHz
JTDI
NJTRST
NRST
USB2.0 FS device
SRAM 80K
2x(8x16bit)
I2C2
TIMER2
TIMER3
XTAL OSC
1-24 MHz
XTAL 32 kHz
EEPROM 64 bit
Backup interface
TIMER4
RTC V2
AWU
RC HSI
obl
USB SRAM 512 B
Trace Controller ETM
USART1
USART2
SPI2/I2S
Backup
Reg 128
I2C1
USART3
RC MSI
Standby
interface
WDG 32K
BOR / Bgap
SPI1
IF
@VDDA
PVD
GPIO PORT C
GPIO PORT D
GPIO PORT E
LCD 8x40
12bit DAC1
FIFIIF
12bit DAC2
DAC_OUT1 as AF
DAC_OUT2 as AF
MPU
GP Comp
PU / PD
PDR
PDR
TIMER6
TIMER7
General purpose
timers
LCD Booster
GPIO PORT H
RC LSI
TIMERS (32 bits)
2x(8x16bit)
SPI3/I2S
TRACECK, TRACED0, TRACED1, TRACED2, TRACED4
System
Cap. sens
Supply
monitoring
@VDDA
@VDDA
@VDDA
@VDDA
Supply monitoring
Cap. sensing
GPIO PORT B
GPIO PORT A
APB2: Fmax = 32 MHz
APB1: Fmax = 32 MHz
PLL &
Clock
Mgmt
VINP
a
VOUT
VINP
VINM
VOUT
RTC_OUT
AHB/APB2 AHB/APB1
JTCK / SWCLK
JTMS / SWDAT
JTDO
as AF
512 KB PROGRAM
16 KB DATA
8KB BOOT
DUAL BANK
@ VDD 33
VDD CORE
Vref
M3 CPU
GP DMA2 5 channels
GP DMA 7 channels
AHBPCLK
APBPCLK
HCLK
FCLK
@ VDD33
VDD33=1.65V to 3.6V
Vss
OSC_IN
OSC_OUT
TAMPER
4 channels
4 channels
4 channels
4 channels
RX, TX, CTS, RTS,
SmartCard as AF
RX, TX, CTS, RTS,
SmartCard as AF
MOSI, MISO, SCK,NSS,WS, CK
MCK, SD as AF
MOSI, MISO, SCK,NSS,WS, CK
MCK, SD as AF
SCL, SDA
As AF
SCL, SDA, SMBus, PMBus
As AF
USB_DP
USB_DM
Px
SEGx
COMx
OPAMP1
OPAMP2
COMPx_INx
VDDA /
VSSA
PA[15:0]
115 AF
PH[2:0]
PB[15:0]
PC[15:0]
PD[15:0]
PE[15:0]
TIMER9
TIMER10
TIMER11
2 channels
1 channel
1 channel
MOSI, MISO,
SCK, NSS as AF
RX, TX, CTS, RTS,
SmartCard as AF
40 AF
VDDREF_ADC*
VSSREF_ADC*
pbus
ibus
Dbus
BOR
Int
AHB: Fmax = 32 MHz
Bus Matrix 5M / 5S
VLCD = 2.5V to 3.6V
VLCD
@VDD33
Temp sensor
OSC32_IN
OSC32_OUT
NVIC
EEPROM
Interface
GPIO PORT F
GPIO PORT G
PF[15:0]
PG[15:0]
USART4
RX, TX as AF
USART5
RX, TX as AF
3 Functional overview
Figure 1. Ultra-low-power STM32L151xE and STM32L152xE block diagram
56
DS10002 Rev 1013/136
Page 14
Functional overviewSTM32L151xE STM32L152xE
3.1 Low-power modes
The ultra-low-power STM32L151xE and STM32L152xE devices support dynamic voltage
scaling to optimize its power consumption in run mode. The voltage from the internal lowdrop regulator that supplies the logic can be adjusted according to the system’s maximum
operating frequency and the external voltage supply.
There are three power consumption ranges:
•Range 1 (VDD range limited to 1.71 V - 3.6 V), with the CPU running at up to 32 MHz
•Range 2 (full V
•Range 3 (full V
only with the multispeed internal RC oscillator clock source)
Seven low-power modes are provided to achieve the best compromise between low-power
consumption, short startup time and available wakeup sources:
•Sleep mode
In Sleep mode, only the CPU is stopped. All peripherals continue to operate and can
wake up the CPU when an interrupt/event occurs. Sleep mode power consumption at
16 MHz is about 1 mA with all peripherals off.
•Low-power run mode
This mode is achieved with the multispeed internal (MSI) RC oscillator set to the MSI
range 0 or MSI range 1 clock range (maximum 131 kHz), execution from SRAM or
Flash memory, and internal regulator in low-power mode to minimize the regulator's
operating current. In low-power run mode, the clock frequency and the number of
enabled peripherals are both limited.
•Low-power sleep mode
This mode is achieved by entering Sleep mode with the internal voltage regulator in
Low-power mode to minimize the regulator’s operating current. In Low-power sleep
mode, both the clock frequency and the number of enabled peripherals are limited; a
typical example would be to have a timer running at 32 kHz.
When wakeup is triggered by an event or an interrupt, the system reverts to the run
mode with the regulator on.
•Stop mode with RTC
Stop mode achieves the lowest power consumption while retaining the RAM and
register contents and real time clock. All clocks in the V
PLL, MSI RC, HSI RC and HSE crystal oscillators are disabled. The LSE or LSI is still
running. The voltage regulator is in the low-power mode.
The device can be woken up from Stop mode by any of the EXTI line, in 8 µs. The EXTI
line source can be one of the 16 external lines. It can be the PVD output, the
Comparator 1 event or Comparator 2 event (if internal reference voltage is on), it can
be the RTC alarm(s), the USB wakeup, the RTC tamper events, the RTC timestamp
event or the RTC wakeup.
range), with a maximum CPU frequency of 16 MHz
DD
range), with a maximum CPU frequency limited to 4 MHz (generated
DD
domain are stopped, the
CORE
14/136DS10002 Rev 10
Page 15
STM32L151xE STM32L152xEFunctional overview
•Stop mode without RTC
Stop mode achieves the lowest power consumption while retaining the RAM and
register contents. All clocks are stopped, the PLL, MSI RC, HSI and LSI RC, LSE and
HSE crystal oscillators are disabled. The voltage regulator is in the low-power mode.
The device can be woken up from Stop mode by any of the EXTI line, in 8 µs. The EXTI
line source can be one of the 16 external lines. It can be the PVD output, the
Comparator 1 event or Comparator 2 event (if internal reference voltage is on). It can
also be wakened by the USB wakeup.
•Standby mode with RTC
Standby mode is used to achieve the lowest power consumption and real time clock.
The internal voltage regulator is switched off so that the entire V
CORE
domain is
powered off. The PLL, MSI RC, HSI RC and HSE crystal oscillators are also switched
off. The LSE or LSI is still running. After entering Standby mode, the RAM and register
contents are lost except for registers in the Standby circuitry (wakeup logic, IWDG,
RTC, LSI, LSE Crystal 32K osc, RCC_CSR).
The device exits Standby mode in 60 µs when an external reset (NRST pin), an IWDG
reset, a rising edge on one of the three WKUP pins, RTC alarm (Alarm A or Alarm B),
RTC tamper event, RTC timestamp event or RTC Wakeup event occurs.
•Standby mode without RTC
Standby mode is used to achieve the lowest power consumption. The internal voltage
regulator is switched off so that the entire V
domain is powered off. The PLL, MSI
CORE
RC, HSI and LSI RC, HSE and LSE crystal oscillators are also switched off. After
entering Standby mode, the RAM and register contents are lost except for registers in
the Standby circuitry (wakeup logic, IWDG, RTC, LSI, LSE Crystal 32K osc,
RCC_CSR).
The device exits Standby mode in 60 µs when an external reset (NRST pin) or a rising
edge on one of the three WKUP pin occurs.
Note:The RTC, the IWDG, and the corresponding clock sources are not stopped automatically by
entering Stop or Standby mode.
Table 3. Functionalities depending on the operating power supply range
-
Operating power supply
range
= V
V
DD
V
DD=VDDA
V
DD=VDDA
= 1.65 to 1.71 VNot functionalNot functionalRange 2 or Range 3
DDA
= 1.71 to 1.8 V
= 1.8 to 2.0 V
(2)
(2)
Functionalities depending on the operating power supply
DAC and ADC
operation
Not functionalNot functional
Conversion time up
to 500 Ksps
USB
Not functional
range
(1)
Dynamic voltage scaling
range
Range 1, Range 2 or
Range 3
Range 1, Range 2 or
Range 3
DS10002 Rev 1015/136
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Functional overviewSTM32L151xE STM32L152xE
Table 3. Functionalities depending on the operating power supply range (continued)
-
Operating power supply
range
VDD=V
V
DD=VDDA
1. The GPIO speed also depends from VDD voltage and the user has to refer to Table 44: I/O AC
characteristics for more information about I/O speed.
2. CPU frequency changes from initial to final must respect “F
due to current consumption peak when frequency increases. It must also respect 5 µs delay between two
changes. For example to switch from 4.2 MHz to 32 MHz, the user can switch from 4.2 MHz to 16 MHz,
wait 5 µs, then switch from 16 MHz to 32 MHz.
3. Must be USB compliant from I/O voltage standpoint, the minimum V
= 2.0 to 2.4 V
DDA
= 2.4 to 3.6 V
Table 4. CPU frequency range depending on dynamic voltage scaling
Functionalities depending on the operating power supply
DAC and ADC
operation
Conversion time up
to 500 Ksps
Conversion time up
to 1 Msps
USB
Functional
Functional
initial < 4*F
CPU
range
(3)
(3)
is 3.0 V.
DD
(1)
Dynamic voltage scaling
range
Range 1, Range 2 or
Range 3
Range 1, Range 2 or
Range 3
final” to limit V
CPU
CORE
CPU frequency rangeDynamic voltage scaling range
drop
16 MHz to 32 MHz (1ws)
32 kHz to 16 MHz (0ws)
8 MHz to 16 MHz (1ws)
32 kHz to 8 MHz (0ws)
2.1MHz to 4.2 MHz (1ws)
32 kHz to 2.1 MHz (0ws)
Range 1
Range 2
Range 3
16/136DS10002 Rev 10
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STM32L151xE STM32L152xEFunctional overview
Table 5. Functionalities depending on the working mode (from Run/active down to
standby)
StopStandby
Wakeup
-
capability
-
Wakeup
capability
IpsRun/ActiveSleep
Low-
power
Run
Low-
power
Sleep
CPUY--Y----------
FlashYYYY--------
RAMYYYYY------
Backup RegistersYYYYY--Y--
EEPROMYYYYY------
Brown-out rest
(BOR)
YYYYYYY--
DMAYYYY--------
Programmable
Voltage Detector
YYYYYYY--
(PVD)
Power On Reset
(POR)
Power Down Rest
(PDR)
High Speed
Internal (HSI)
High Speed
External (HSE)
YYYYYYY--
YYYYY--Y--
YY------------
YY------------
Low Speed Internal
(LSI)
Low Speed
External (LSE)
Multi-Speed
Internal (MSI)
Inter-Connect
Controller
YYYYY--Y--
YYYYY--Y--
YYYY--------
YYYY--------
RTCYYYYYYY--
RTC TamperYYYYYYYY
Auto WakeUp
(AWU)
YYYYYYYY
LCDYYYYY------
USBYY------Y----
USARTYYYYY
(1)
----
SPIYYYY--------
I2CYY------
(1)
----
DS10002 Rev 1017/136
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Functional overviewSTM32L151xE STM32L152xE
Table 5. Functionalities depending on the working mode (from Run/active down to
standby) (continued)
Low-
IpsRun/ActiveSleep
ADCYY------------
DACYYYYY------
TempsensorYYYYY------
OP ampYYYYY------
ComparatorsYYYYYY----
16-bit and 32-bit
Timers
IWDGYYYYYYYY
WWDGYYYY--------
Touch sensingYY------------
Systic TimerYYYY-------
GPIOsYYYYYY--3 pins
Wakeup time to
Run mode
Consumption
=1.8 to 3.6 V
V
DD
(Typ)
1. The startup on communication line wakes the CPU which was made possible by an EXTI, this induces a delay before
entering run mode.
YYYY--------
0 µs0.4 µs3 µs46 µs< 8 µs58 µs
Down to 195
µA/MHz (from
Flash)
Down to 38
µA/MHz (from
Flash)
power
Run
Down to
11 µ A
Low-
power
Sleep
Down to
4.6 µA
StopStandby
Wakeup
-
capability
0.53 µA
(no RTC)
=1.8V
V
DD
1.2 µA
(with RTC)
V
=1.8V
DD
0.56 µA
(no RTC)
V
=3.0V
DD
1.4 µA
(with RTC)
V
=3.0V
DD
-
Wakeup
capability
0.285 µA
(no RTC)
VDD=1.8V
0.97 µA
(with RTC)
VDD=1.8V
0.29 µA
(no RTC)
VDD=3.0V
1.11 µA
(with RTC)
VDD=3.0V
3.2 Arm® Cortex®-M3 core with MPU
The Arm® Cortex®-M3 processor is the industry leading processor for embedded systems. It
has been developed to provide a low-cost platform that meets the needs of MCU
implementation, with a reduced pin count and low-power consumption, while delivering
outstanding computational performance and an advanced system response to interrupts.
The Arm® Cortex®-M3 32-bit RISC processor features exceptional code-efficiency,
delivering the high-performance expected from an Arm core in the memory size usually
associated with 8- and 16-bit devices.
18/136DS10002 Rev 10
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STM32L151xE STM32L152xEFunctional overview
The memory protection unit (MPU) improves system reliability by defining the memory
attributes (such as read/write access permissions) for different memory regions. It provides
up to eight different regions and an optional predefined background region.
Owing to its embedded Arm core, the STM32L151xE and STM32L152xE devices are
compatible with all Arm tools and software.
Nested vectored interrupt controller (NVIC)
The ultra-low-power STM32L151xE and STM32L152xE devices embed a nested vectored
interrupt controller able to handle up to 56 maskable interrupt channels (not including the 16
interrupt lines of Arm
•Interrupt entry vector table address passed directly to the core
•Closely coupled NVIC core interface
•Allows early processing of interrupts
•Processing of late arriving, higher-priority interrupts
•Support for tail-chaining
•Processor state automatically saved on interrupt entry, and restored on interrupt exit,
with no instruction overhead
This hardware block provides flexible interrupt management features with minimal interrupt
latency.
®
Cortex®-M3) and 16 priority levels.
3.3 Reset and supply management
3.3.1 Power supply schemes
•VDD = 1.65 to 3.6 V: external power supply for I/Os and the internal regulator. Provided
externally through V
•V
SSA
, V
= 1.65 to 3.6 V: external analog power supplies for ADC, reset blocks, RCs
DDA
and PLL (minimum voltage to be applied to V
and V
must be connected to V
SSA
3.3.2 Power supply supervisor
The device has an integrated ZEROPOWER power-on reset (POR)/power-down reset
(PDR) that can be coupled with a brownout reset (BOR) circuitry.
The device exists in two versions:
•The version with BOR activated at power-on operates between 1.8 V and 3.6 V.
•The other version without BOR operates between 1.65 V and 3.6 V.
After the VDD threshold is reached (1.65 V or 1.8 V depending on the BOR which is active or
not at power-on), the option byte loading process starts, either to confirm or modify default
thresholds, or to disable the BOR permanently: in this case, the V
1.65 V (whatever the version, BOR active or not, at power-on).
When BOR is active at power-on, it ensures proper operation starting from 1.8 V whatever
the power ramp-up phase before it reaches 1.8 V. When BOR is not active at power-up, the
power ramp-up must guarantee that 1.65
POR area.
DD
pins.
and VSS, respectively.
DD
V is reached on VDD at least 1 ms after it exits the
is 1.8 V when the ADC is used). V
DDA
min value becomes
DD
DDA
DS10002 Rev 1019/136
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Functional overviewSTM32L151xE STM32L152xE
Five BOR thresholds are available through option bytes, starting from 1.8 V to 3 V. To
reduce the power consumption in Stop mode, it is possible to automatically switch off the
internal reference voltage (V
V
is below a specified threshold, V
DD
) in Stop mode. The device remains in reset mode when
REFINT
POR/PDR
or V
, without the need for any external
BOR
reset circuit.
Note:The start-up time at power-on is typically 3.3 ms when BOR is active at power-up, the start-
up time at power-on can be decreased down to 1
ms typically for devices with BOR inactive
at power-up.
The device features an embedded programmable voltage detector (PVD) that monitors the
V
DD/VDDA
levels between 1.85
interrupt can be generated when V
V
DD/VDDA
power supply and compares it to the V
V and 3.05 V, chosen by software, with a step around 200 mV. An
drops below the V
is higher than the V
DD/VDDA
threshold. The interrupt service routine can then generate
PVD
threshold. This PVD offers 7 different
PVD
threshold and/or when
PVD
a warning message and/or put the MCU into a safe state. The PVD is enabled by software.
3.3.3 Voltage regulator
The regulator has three operation modes: main (MR), low-power (LPR) and power down.
•MR is used in Run mode (nominal regulation)
•LPR is used in the Low-power run, Low-power sleep and Stop modes
•Power down is used in Standby mode. The regulator output is high impedance, the
kernel circuitry is powered down, inducing zero consumption but the contents of the
registers and RAM are lost except for the standby circuitry (wakeup logic, IWDG, RTC,
LSI, LSE crystal 32K osc, RCC_CSR).
3.3.4 Boot modes
At startup, boot pins are used to select one of three boot options:
•Boot from Flash memory
•Boot from System memory
•Boot from embedded RAM
The boot from Flash usually boots at the beginning of the Flash (bank 1). An additional boot
mechanism is available through user option byte, to allow booting from bank 2 when bank 2
contains valid code. This dual boot capability can be used to easily implement a secure field
software update mechanism.
The boot loader is located in System memory. It is used to reprogram the Flash memory by
using USART1, USART2 or USB. See Application note “STM32 microcontroller system
memory boot mode” (AN2606) for details.
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STM32L151xE STM32L152xEFunctional overview
3.4 Clock management
The clock controller distributes the clocks coming from different oscillators to the core and
the peripherals. It also manages clock gating for low-power modes and ensures clock
robustness. It features:
•Clock prescaler: to get the best trade-off between speed and current consumption, the
clock frequency to the CPU and peripherals can be adjusted by a programmable
prescaler.
•Safe clock switching: clock sources can be changed safely on the fly in run mode
through a configuration register.
•Clock management: to reduce power consumption, the clock controller can stop the
clock to the core, individual peripherals or memory.
•System clock source: three different clock sources can be used to drive the master
clock SYSCLK:
–1-24 MHz high-speed external crystal (HSE), that can supply a PLL
–16 MHz high-speed internal RC oscillator (HSI), trimmable by software, that can
supply a PLL
–Multispeed internal RC oscillator (MSI), trimmable by software, able to generate 7
frequencies (65 kHz, 131 kHz, 262 kHz, 524 kHz, 1.05 MHz, 2.1 MHz, 4.2 MHz).
When a 32.768 kHz clock source is available in the system (LSE), the MSI
frequency can be trimmed by software down to a ±0.5% accuracy.
•Auxiliary clock source: two ultra-low-power clock sources that can be used to drive
the LCD controller and the real-time clock:
–32.768 kHz low-speed external crystal (LSE)
–37 kHz low-speed internal RC (LSI), also used to drive the independent watchdog.
The LSI clock can be measured using the high-speed internal RC oscillator for
greater precision.
•RTC and LCD clock sources: the LSI, LSE or HSE sources can be chosen to clock
the RTC and the LCD, whatever the system clock.
•USB clock source: the embedded PLL has a dedicated 48 MHz clock output to supply
the USB interface.
•Startup clock: after reset, the microcontroller restarts by default with an internal 2 MHz
clock (MSI). The prescaler ratio and clock source can be changed by the application
program as soon as the code execution starts.
•Clock security system (CSS): this feature can be enabled by software. If a HSE clock
failure occurs, the master clock is automatically switched to HSI and a software
interrupt is generated if enabled.
•Clock-out capability (MCO: microcontroller clock output): it outputs one of the
internal clocks for external use by the application.
Several prescalers allow the configuration of the AHB frequency, each APB (APB1 and
APB2) domains. The maximum frequency of the AHB and the APB domains is 32 MHz. See
Figure 2 for details on the clock tree.
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Functional overviewSTM32L151xE STM32L152xE
MS18583V1
LSI RC
LSE OSC
HSI RC
HSE
OSC
@V33
@V
DDCORE
@V33
level shifters
level shifters
PLL
X 3,4,6,8,12
@V33
level shifters
LSE tempo
1 MHz clock
detector
@V33
LS
Watchdog
ck_pllin
source
control
Clock
Wat ch dog
enable
RTC enable
ck_hsi
ck_hse
HSE present or not
LSI tempo
ck_pll
AHB
prescaler
/ 1,2,..512
APB2
/ 1,2,4,8,16
APB1
/ 1,2,4,8,16
ck_usb = Vco / 2 (Vco must be at 96 MHz)
/ 8
CK_TIMSYS
CK_CPU
CK_FCLK
CK_PWR
CK_USB48
CK_TIMTGO
CK_APB1
CK_APB2
usben and (not deepsleep)
timer9en and (not deepsleep)
apb1 periphen and (not deepsleep)
apb2 periphen and (not deepsleep)
not (sleep or
deepsleep)
not (sleep or
deepsleep
not deepsleep
not deepsleep
Standby supplied voltage domain
System
clock
MCO
if (APB1 presc = 1)
x1
else
x2
16,24,32,48
ck_lse
CK_LCD
/ 2, 3, 4
1 MHz
@V
DDCORE
@V
DDCORE
@V
DDCORE
/ 1,2,4,8,16
LCD enable
MSI RC
@V33
@V
DDCORE
level shifters
ck_msi
ck_lsi
CK_ADC
ADC enable
LSLS LSLS
LS
LS
/ 2,4,8,16
prescaler prescaler
Radio Sleep Timer
RTC
Radio Sleep Timer enable
Figure 2. Clock tree
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STM32L151xE STM32L152xEFunctional overview
3.5 Low-power real-time clock and backup registers
The real-time clock (RTC) is an independent BCD timer/counter. Dedicated registers contain
the sub-second, second, minute, hour (12/24 hour), week day, date, month, year, in BCD
(binary-coded decimal) format. Correction for 28, 29 (leap year), 30, and 31 day of the
month are made automatically. The RTC provides two programmable alarms and
programmable periodic interrupts with wakeup from Stop and Standby modes.
The programmable wakeup time ranges from 120 µs to 36 hours.
The RTC can be calibrated with an external 512 Hz output, and a digital compensation
circuit helps reduce drift due to crystal deviation.
The RTC can also be automatically corrected with a 50/60Hz stable powerline.
The RTC calendar can be updated on the fly down to sub second precision, which enables
network system synchronization.
A time stamp can record an external event occurrence, and generates an interrupt.
There are thirty-two 32-bit backup registers provided to store 128 bytes of user application
data. They are cleared in case of tamper detection.
Three pins can be used to detect tamper events. A change on one of these pins can reset
backup register and generate an interrupt. To prevent false tamper event, like ESD event,
these three tamper inputs can be digitally filtered.
3.6 GPIOs (general-purpose inputs/outputs)
Each of the GPIO pins can be configured by software as output (push-pull or open-drain), as
input (with or without pull-up or pull-down) or as peripheral alternate function. Most of the
GPIO pins are shared with digital or analog alternate functions, and can be individually
remapped using dedicated AFIO registers. All GPIOs are high current capable. The
alternate function configuration of I/Os can be locked if needed following a specific
sequence in order to avoid spurious writing to the I/O registers. The I/O controller is
connected to the AHB with a toggling speed of up to 16 MHz.
External interrupt/event controller (EXTI)
The external interrupt/event controller consists of 24 edge detector lines used to generate
interrupt/event requests. Each line can be individually configured to select the trigger event
(rising edge, falling edge, both) and can be masked independently. A pending register
maintains the status of the interrupt requests. The EXTI can detect an external line with a
pulse width shorter than the Internal APB2 clock period. Up to 115 GPIOs can be connected
to the 16 external interrupt lines. The 8 other lines are connected to RTC, PVD, USB,
comparator events or capacitive sensing acquisition.
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Functional overviewSTM32L151xE STM32L152xE
3.7 Memories
The STM32L151xE and STM32L152xE devices have the following features:
•80 Kbytes of embedded RAM accessed (read/write) at CPU clock speed with 0 wait
states. With the enhanced bus matrix, operating the RAM does not lead to any
performance penalty during accesses to the system bus (AHB and APB buses).
•The non-volatile memory is divided into three arrays:
–512 Kbytes of embedded Flash program memory
–16 Kbytes of data EEPROM
–Options bytes
Flash program and data EEPROM are divided into two banks, this enables writing in
one bank while running code or reading data in the other bank.
The options bytes are used to write-protect or read-out protect the memory (with 4
Kbytes granularity) and/or readout-protect the whole memory with the following
options:
–Level 0: no readout protection
–Level 1: memory readout protection, the Flash memory cannot be read from or
written to if either debug features are connected or boot in RAM is selected
–Level 2: chip readout protection, debug features (Arm Cortex-M3 JTAG and serial
wire) and boot in RAM selection disabled (JTAG fuse)
The whole non-volatile memory embeds the error correction code (ECC) feature.
3.8 DMA (direct memory access)
The flexible 12-channel, general-purpose DMA is able to manage memory-to-memory,
peripheral-to-memory and memory-to-peripheral transfers. The DMA controller supports
circular buffer management, avoiding the generation of interrupts when the controller
reaches the end of the buffer.
Each channel is connected to dedicated hardware DMA requests, with software trigger
support for each channel. Configuration is done by software and transfer sizes between
source and destination are independent.
The DMA can be used with the main peripherals: SPI, I2C, USART, general-purpose timers,
DAC and ADC.
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STM32L151xE STM32L152xEFunctional overview
3.9 LCD (liquid crystal display)
The LCD drives up to 8 common terminals and 44 segment terminals to drive up to 320
pixels.
•Internal step-up converter to guarantee functionality and contrast control irrespective of
V
. This converter can be deactivated, in which case the V
DD
the voltage to the LCD
•Supports static, 1/2, 1/3, 1/4 and 1/8 duty
•Supports static, 1/2, 1/3 and 1/4 bias
•Phase inversion to reduce power consumption and EMI
•Up to 8 pixels can be programmed to blink
•Unneeded segments and common pins can be used as general I/O pins
•LCD RAM can be updated at any time owing to a double-buffer
•The LCD controller can operate in Stop mode
pin is used to provide
LCD
3.10 ADC (analog-to-digital converter)
A 12-bit analog-to-digital converters is embedded into STM32L151xE and STM32L152xE
devices with up to 40 external channels, performing conversions in single-shot or scan
mode. In scan mode, automatic conversion is performed on a selected group of analog
inputs with up to 28 external channels in a group.
The ADC can be served by the DMA controller.
An analog watchdog feature allows very precise monitoring of the converted voltage of one,
some or all scanned channels. An interrupt is generated when the converted voltage is
outside the programmed thresholds.
The events generated by the general-purpose timers (TIMx) can be internally connected to
the ADC start triggers, to allow the application to synchronize A/D conversions and timers.
An injection mode allows high priority conversions to be done by interrupting a scan mode
which runs in as a background task.
The ADC includes a specific low-power mode. The converter is able to operate at maximum
speed even if the CPU is operating at a very low frequency and has an auto-shutdown
function. The ADC’s runtime and analog front-end current consumption are thus minimized
whatever the MCU operating mode.
3.10.1 Temperature sensor
The temperature sensor (TS) generates a voltage V
temperature.
The temperature sensor is internally connected to the ADC_IN16 input channel which is
used to convert the sensor output voltage into a digital value.
The sensor provides good linearity but it has to be calibrated to obtain good overall
accuracy of the temperature measurement. As the offset of the temperature sensor varies
from chip to chip due to process variation, the uncalibrated internal temperature sensor is
suitable for applications that detect temperature changes only.
that varies linearly with
SENSE
To improve the accuracy of the temperature sensor measurement, each device is
individually factory-calibrated by ST. The temperature sensor factory calibration data are
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Functional overviewSTM32L151xE STM32L152xE
stored by ST in the system memory area, accessible in read-only mode. See Tab le 60:
Temperature sensor calibration values.
3.10.2 Internal voltage reference (V
The internal voltage reference (V
ADC and Comparators. V
enables accurate monitoring of the V
available for ADC). The precise voltage of V
ST during production test and stored in the system memory area. It is accessible in readonly mode. See
Tabl e 15: Embedded internal reference voltage calibration values.
REFINT
REFINT
is internally connected to the ADC_IN17 input channel. It
REFINT
DD
)
) provides a stable (bandgap) voltage output for the
value (when no external voltage, VREF+, is
REFINT
3.11 DAC (digital-to-analog converter)
The two 12-bit buffered DAC channels can be used to convert two digital signals into two
analog voltage signal outputs. The chosen design structure is composed of integrated
resistor strings and an amplifier in non-inverting configuration.
This dual digital Interface supports the following features:
•Two DAC converters: one for each output channel
•8-bit or 12-bit monotonic output
•Left or right data alignment in 12-bit mode
•Synchronized update capability
•Noise-wave generation
•Triangular-wave generation
•Dual DAC channels, independent or simultaneous conversions
•DMA capability for each channel (including the underrun interrupt)
•External triggers for conversion
•Input reference voltage V
Eight DAC trigger inputs are used in the STM32L151xE and STM32L152xE devices. The
DAC channels are triggered through the timer update outputs that are also connected to
different DMA channels.
REF+
is individually measured for each part by
3.12 Operational amplifier
The STM32L151xE and STM32L152xE devices embed two operational amplifiers with
external or internal follower routing capability (or even amplifier and filter capability with
external components). When one operational amplifier is selected, one external ADC
channel is used to enable output measurement.
The operational amplifiers feature:
•Low input bias current
•Low offset voltage
•Low-power mode
•Rail-to-rail input
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STM32L151xE STM32L152xEFunctional overview
3.13 Ultra-low-power comparators and reference voltage
The STM32L151xE and STM32L152xE devices embed two comparators sharing the same
current bias and reference voltage. The reference voltage can be internal or external
(coming from an I/O).
•One comparator with fixed threshold
•One comparator with rail-to-rail inputs, fast or slow mode. The threshold can be one of
the following:
–DAC output
–External I/O
–Internal reference voltage (V
Both comparators can wake up from Stop mode, and be combined into a window
comparator.
The internal reference voltage is available externally via a low-power / low-current output
buffer (driving current capability of 1
µA typical).
) or a sub-multiple (1/4, 1/2, 3/4)
REFINT
3.14 System configuration controller and routing interface
The system configuration controller provides the capability to remap some alternate
functions on different I/O ports.
The highly flexible routing interface allows the application firmware to control the routing of
different I/Os to the TIM2, TIM3 and TIM4 timer input captures. It also controls the routing of
internal analog signals to ADC1, COMP1 and COMP2 and the internal reference voltage
V
REFINT
.
3.15 Touch sensing
The STM32L151xE and STM32L152xE devices provide a simple solution for adding
capacitive sensing functionality to any application. Thesedevices offer up to 34 capacitive
sensing channels distributed over 11 analog I/O groups. Both software and timer capacitive
sensing acquisition modes are supported.
Capacitive sensing technology is able to detect the presence of a finger near a sensor which
is protected from direct touch by a dielectric (glass, plastic...). The capacitive variation
introduced by the finger (or any conductive object) is measured using a proven
implementation based on a surface charge transfer acquisition principle. It consists of
charging the sensor capacitance and then transferring a part of the accumulated charges
into a sampling capacitor until the voltage across this capacitor has reached a specific
threshold. The capacitive sensing acquisition only requires few external components to
operate. This acquisition is managed directly by the GPIOs, timers and analog I/O groups
(see
Section 3.14: System configuration controller and routing interface).
Reliable touch sensing functionality can be quickly and easily implemented using the free
STM32L1xx STMTouch touch sensing firmware library.
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Functional overviewSTM32L151xE STM32L152xE
3.16 Timers and watchdogs
The ultra-low-power STM32L151xE and STM32L152xE devices include seven generalpurpose timers, two basic timers, and two watchdog timers.
Tabl e 6 compares the features of the general-purpose and basic timers.
There are seven synchronizable general-purpose timers embedded in the STM32L151xE
and STM32L152xE devices (see
TIM2, TIM3, TIM4, TIM5
Tabl e 6 for differences).
TIM2, TIM3, TIM4 are based on 16-bit auto-reload up/down counter. TIM5 is based on a 32bit auto-reload up/down counter. They include a 16-bit prescaler. They feature four
independent channels each for input capture/output compare, PWM or one-pulse mode
output. This gives up to 16 input captures/output compares/PWMs on the largest packages.
TIM2, TIM3, TIM4, TIM5 general-purpose timers can work together or with the TIM10,
TIM11 and TIM9 general-purpose timers via the Timer Link feature for synchronization or
event chaining. Their counter can be frozen in debug mode. Any of the general-purpose
timers can be used to generate PWM outputs.
TIM2, TIM3, TIM4, TIM5 all have independent DMA request generation.
These timers are capable of handling quadrature (incremental) encoder signals and the
digital outputs from 1 to 3 hall-effect sensors.
TIM10, TIM11 and TIM9
TIM10 and TIM11 are based on a 16-bit auto-reload upcounter. TIM9 is based on a 16-bit
auto-reload up/down counter. They include a 16-bit prescaler. TIM10 and TIM11 feature one
independent channel, whereas TIM9 has two independent channels for input capture/output
compare, PWM or one-pulse mode output. They can be synchronized with the TIM2, TIM3,
TIM4, TIM5 full-featured general-purpose timers.
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STM32L151xE STM32L152xEFunctional overview
They can also be used as simple time bases and be clocked by the LSE clock source
(32.768 kHz) to provide time bases independent from the main CPU clock.
3.16.2 Basic timers (TIM6 and TIM7)
These timers are mainly used for DAC trigger generation. They can also be used as generic
16-bit time bases.
3.16.3 SysTick timer
This timer is dedicated to the OS, but could also be used as a standard downcounter. It is
based on a 24-bit downcounter with autoreload capability and a programmable clock
source. It features a maskable system interrupt generation when the counter reaches 0.
3.16.4 Independent watchdog (IWDG)
The independent watchdog is based on a 12-bit downcounter and 8-bit prescaler. It is
clocked from an independent 37 kHz internal RC and, as it operates independently of the
main clock, it can operate in Stop and Standby modes. It can be used either as a watchdog
to reset the device when a problem occurs, or as a free-running timer for application timeout
management. It is hardware- or software-configurable through the option bytes. The counter
can be frozen in debug mode.
3.16.5 Window watchdog (WWDG)
The window watchdog is based on a 7-bit downcounter that can be set as free-running. It
can be used as a watchdog to reset the device when a problem occurs. It is clocked from
the main clock. It has an early warning interrupt capability and the counter can be frozen in
debug mode.
3.17 Communication interfaces
3.17.1 I²C bus
Up to two I²C bus interfaces can operate in multimaster and slave modes. They can support
standard and fast modes.
They support dual slave addressing (7-bit only) and both 7- and 10-bit addressing in master
mode. A hardware CRC generation/verification is embedded.
They can be served by DMA and they support SM Bus 2.0/PM Bus.
The three USART and two UART interfaces are able to communicate at speeds of up to 4
Mbit/s. They support IrDA SIR ENDEC and have LIN Master/Slave capability. The three
USARTs provide hardware management of the CTS and RTS signals and are ISO 7816
compliant.
All USART/UART interfaces can be served by the DMA controller.
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Functional overviewSTM32L151xE STM32L152xE
3.17.3 Serial peripheral interface (SPI)
Up to three SPIs are able to communicate at up to 16 Mbits/s in slave and master modes in
full-duplex and half-duplex communication modes. The 3-bit prescaler gives 8 master mode
frequencies and the frame is configurable to 8 bits or 16 bits. The hardware CRC
generation/verification supports basic SD Card/MMC modes.
The SPIs can be served by the DMA controller.
3.17.4 Inter-integrated sound (I2S)
Two standard I2S interfaces (multiplexed with SPI2 and SPI3) are available. They can
operate in master or slave mode, and can be configured to operate with a 16-/32-bit
resolution as input or output channels. Audio sampling frequencies from 8 kHz up to 192
kHz are supported. When either or both of the I2S interfaces is/are configured in master
mode, the master clock can be output to the external DAC/CODEC at 256 times the
sampling frequency.
The I2Ss can be served by the DMA controller.
3.17.5 Universal serial bus (USB)
The STM32L151xE and STM32L152xE devices embed a USB device peripheral compatible
with the USB full-speed 12
function interface. It has software-configurable endpoint setting and supports
suspend/resume. The dedicated 48
clock source must use a HSE crystal oscillator).
Mbit/s. The USB interface implements a full-speed (12 Mbit/s)
MHz clock is generated from the internal main PLL (the
3.18 CRC (cyclic redundancy check) calculation unit
The CRC (cyclic redundancy check) calculation unit is used to get a CRC code from a 32-bit
data word and a fixed generator polynomial.
Among other applications, CRC-based techniques are used to verify data transmission or
storage integrity. In the scope of the EN/IEC 60335-1 standard, they offer a means of
verifying the Flash memory integrity. The CRC calculation unit helps compute a signature of
the software during runtime, to be compared with a reference signature generated at linktime and stored at a given memory location.
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STM32L151xE STM32L152xEFunctional overview
3.19 Development support
3.19.1 Serial wire JTAG debug port (SWJ-DP)
The Arm SWJ-DP interface is embedded, and is a combined JTAG and serial wire debug
port that enables either a serial wire debug or a JTAG probe to be connected to the target.
The JTAG JTMS and JTCK pins are shared with SWDAT and SWCLK, respectively, and a
specific sequence on the JTMS pin is used to switch between JTAG-DP and SW-DP.
The JTAG port can be permanently disabled with a JTAG fuse.
3.19.2 Embedded Trace Macrocell™
The Arm
flow inside the CPU core by streaming compressed data at a very high rate from the
STM32L151xE and STM32L152xE device through a small number of ETM pins to an
external hardware trace port analyzer (TPA) device. The TPA is connected to a host
computer using USB, Ethernet, or any other high-speed channel. Real-time instruction and
data flow activity can be recorded and then formatted for display on the host computer
running debugger software. TPA hardware is commercially available from common
development tool vendors. It operates with third party debugger software tools.
®
Embedded Trace Macrocell provides a greater visibility of the instruction and data
Table 7. Legend/abbreviations used in the pinout table
NameAbbreviationDefinition
Pin name
Pin type
Notes
Alternate
functions
Additional
functions
Unless otherwise specified in brackets below the pin name, the pin function
during and after reset is the same as the actual pin name
SSupply pin
IInput only pin
I/OInput / output pin
FT5 V tolerant I/O
TCStandard 3.3 V I/O
BDedicated BOOT0 pin
RSTBidirectional reset pin with embedded weak pull-up resistor
Unless otherwise specified by a note, all I/Os are set as floating inputs during
and after reset
Functions selected through GPIOx_AFR registers
Functions directly selected/enabled through peripheral registers
Pins
LQFP144
UFBGA132
LQFP100
1B21-D6PE2I/O FTPE2
2A12-D7PE3I/O FTPE3
Table 8. STM32L151xE and STM32L152xE pin definitions
LQFP64
(1)
Pin name
Pin Type
WLCSP104
function
I / O structure
Main
(after
reset)
(2)
Alternate functions
TIM3_ETR/LCD_SEG38/
TRACECLK
TIM3_CH1/LCD_SEG39/
TRACED0
Pin functions
Additional
functions
3B13-C8PE4I/O FTPE4TIM3_CH2/TRACED1-
4C24-B9PE5I/OFTPE5TIM9_CH1/TRACED2-
5D25-E6
6E261E7V
PE6-
WKUP3
LCD
(3)
I/O FTPE6TIM9_CH2/TRACED3
S- V
LCD
--
WKUP3/
RTC_TAMP3
WKUP2/RTC_TA
7C172C9PC13-WKUP2I/OFTPC13-
MP1/RTC_TS/
RTC_OUT
-
-
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Pin descriptionsSTM32L151xE STM32L152xE
Table 8. STM32L151xE and STM32L152xE pin definitions (continued)
Pins
LQFP144
UFBGA132
LQFP64
LQFP100
WLCSP104
8D183D8
9E194D9
Pin name
PC14-
OSC32_IN
(4)
PC15-
OSC32_OUT
(1)
Pin Type
function
I / O structure
Main
(after
reset)
(2)
Alternate functions
I/O TCPC14-OSC32_IN
I/O TCPC15-OSC32_OUT
Pin functions
Additional
functions
10D6---PF0I/O FTPF0--
11D5---PF1I/OFTPF1--
12D4---PF2I/O FTPF2--
13E4---PF3I/OFTPF3--
14F3---PF4I/O FTPF4--
15F4---PF5I/O FTPF5--
16F210-E8V
17G211-E9V
SS_5
DD_5
S- V
S- V
SS_5
DD_5
--
--
18G3---PF6I/O FTPF6TIM5_CH1/TIM5_ETRADC_IN27
19G4---PF7I/O FTPF7TIM5_CH2
ADC_IN28/
COMP1_INP
20H4---PF8I/O FTPF8TIM5_CH3
21J6---PF9I/O FTPF9TIM5_CH4
22----PF10I/O FTPF10-
(5)
23F1125F8 PH0-OSC_IN
24G1136F9
PH1-
OSC_OUT
I/O TCPH0-OSC_IN
I/O TCPH1-OSC_OUT
(5)
ADC_IN29/
COMP1_INP
ADC_IN30/
COMP1_INP
ADC_IN31/
COMP1_INP
25H2147F7NRSTI/O RSTNRST--
26H1158F6PC0I/OFTPC0LCD_SEG18
27J2169H9PC1I/O FTPC1LCD_SEG19
28-1710 G9PC2I/OFTPC2LCD_SEG20
ADC_IN10/
COMP1_INP
ADC_IN11/
COMP1_INP
ADC_IN12/
COMP1_INP
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STM32L151xE STM32L152xEPin descriptions
Table 8. STM32L151xE and STM32L152xE pin definitions (continued)
Pins
(1)
Pin name
LQFP144
UFBGA132
LQFP64
LQFP100
WLCSP104
Pin Type
function
I / O structure
Main
(after
reset)
(2)
Alternate functions
-J3---PC2I/OFTPC2LCD_SEG20
Pin functions
Additional
functions
ADC_IN12/
COMP1_INP
-K1---NCI-NC--
29K21811 G8PC3I/O TCPC3LCD_SEG21
30J11912 J9V
31-20-H8V
32L121-G7V
33M12213 G6V
SSA
REF-
REF+
DDA
S- V
S- V
S- V
S- V
SSA
REF-
REF+
DDA
--
--
--
--
TIM2_CH1_ETR/
34L223 14 K9PA0-WKUP1I/O FTPA0
TIM5_CH1/
USART2_CTS
ADC_IN13/
COMP1_INP
WKUP1/RTC_TA
MP2/ADC_IN0/
COMP1_INP
35M22415L9PA1I/O FTPA1
36-2516J8PA2I/O FTPA2
-K3---PA 2I/OFTPA2
-M3---OPAMP1_VINMITC
OPAMP1_
VINM
37L326 17 H7PA3I/O TCPA3
38-2718 K8V
39-2819
L8,
M9
V
SS_4
DD_4
S- V
S- V
SS_4
DD_4
40J42920 J7PA4I/O TCPA4
TIM2_CH2/TIM5_CH2/
USART2_RTS/
LCD_SEG0
TIM2_CH3/TIM5_CH3/
TIM9_CH1/
USART2_TX/LCD_SEG1
TIM2_CH3/TIM5_CH3/
TIM9_CH1/
USART2_TX/LCD_SEG1
--
TIM2_CH4/TIM5_CH4/
TIM9_CH2/
USART2_RX/LCD_SEG2
--
--
SPI1_NSS/SPI3_NSS/
I2S3_WS/
USART2_CK
ADC_IN1/
COMP1_INP/
OPAMP1_VINP
ADC_IN2/
COMP1_INP/
OPAMP1_VINM
ADC_IN2/
COMP1_INP
ADC_IN3/
COMP1_INP/
OPAMP1_VOUT
ADC_IN4/
DAC_OUT1/
COMP1_INP
DS10002 Rev 1039/136
56
Page 40
Pin descriptionsSTM32L151xE STM32L152xE
Table 8. STM32L151xE and STM32L152xE pin definitions (continued)
Pins
(1)
Pin name
LQFP144
UFBGA132
LQFP64
LQFP100
WLCSP104
Pin Type
Main
function
(after
reset)
I / O structure
41K430 21 M8PA5I/O TCPA5
(2)
Alternate functions
TIM2_CH1_ETR/
SPI1_SCK
Pin functions
TIM3_CH1/TIM10_CH1/S
42L431 22 H6PA6I/OFTPA6
PI1_MISO/
LCD_SEG3
TIM3_CH2/TIM11_CH1/
43-3223 K7PA7I/O FTPA7
SPI1_MOSI/
LCD_SEG4
TIM3_CH2/TIM11_CH1/
-J5---PA7I/OFTPA7
SPI1_MOSI/
LCD_SEG4
-M4---OPAMP2_VINMITC
OPAMP2_
VINM
--
44K533 24L7PC4I/O FTPC4LCD_SEG22
45L534 25 M7PC5I/OFTPC5LCD_SEG23
Additional
functions
ADC_IN5/
DAC_OUT2/
COMP1_INP
ADC_IN6/
COMP1_INP/
OPAMP2_VINP
ADC_IN7/
COMP1_INP/
OPAMP2_VINM
ADC_IN7/
COMP1_INP
ADC_IN14/
COMP1_INP
ADC_IN15/
COMP1_INP
ADC_IN8/
46M535 26J6PB0I/O TCPB0TIM3_CH3/LCD_SEG5
COMP1_INP/
OPAMP2_VOUT/
VREF_OUT
ADC_IN9/
47M636 27 K6PB1I/O FTPB1TIM3_CH4/LCD_SEG6
COMP1_INP/
VREF_OUT
48L637 28 M6PB2I/O FT
PB2/
BOOT1
BOOT1ADC_IN0b
49K6---PF11I/OFTPF11-ADC_IN1b
50J7---PF12I/OFTPF12-ADC_IN2b
51E3---V
52H3---V
SS_6
DD_6
S- V
S- V
SS_6
DD_6
--
--
53K7---PF13I/O FTPF13-ADC_IN3b
54J8---PF14I/OFTPF14-ADC_IN6b
55J9---PF15I/OFTPF15-ADC_IN7b
40/136DS10002 Rev 10
Page 41
STM32L151xE STM32L152xEPin descriptions
Table 8. STM32L151xE and STM32L152xE pin definitions (continued)
Pins
(1)
Pin name
LQFP144
UFBGA132
LQFP64
LQFP100
WLCSP104
Pin Type
function
I / O structure
Main
(after
reset)
(2)
Alternate functions
Pin functions
Additional
functions
56H9---PG0I/O FTPG0-ADC_IN8b
57G9---PG1I/OFTPG1-ADC_IN9b
58M738-L6PE7I/O TCPE7-
59L739-M5PE8I/O TCPE8-
60M840-M4PE9I/O TCPE9TIM2_CH1_ETR
61----V
62----V
SS_7
DD_7
S- V
S- V
SS_7
DD_7
--
--
63L841-J5PE10I/O TCPE10TIM2_CH2
ADC_IN22/
COMP1_INP
ADC_IN23/
COMP1_INP
ADC_IN24/
COMP1_INP
ADC_IN25/
COMP1_INP
64M942-L5PE11I/OFTPE11TIM2_CH3-
65L943-M3PE12I/OFTPE12TIM2_CH4/SPI1_NSS-
66 M1044-K5PE13I/O FTPE13SPI1_SCK-
67M11 45-L4PE14I/O FTPE14SPI1_MISO-
68 M1246-K4PE15I/O FTPE15SPI1_MOSI-
TIM2_CH3/I2C2_SCL/
69L104729 M2PB10I/O FTPB10
USART3_TX/
LCD_SEG10
TIM2_CH4/I2C2_SDA/
70L114830 L3PB11I/OFTPB11
USART3_RX/
LCD_SEG11
71F124931
72G125032 K3V
L2,
M1
V
SS_1
DD_1
S- V
S- V
SS_1
DD_1
--
--
TIM10_CH1/I2C2_SMBA/
73L125133J4PB12I/OFTPB12
SPI2_NSS/I2S2_WS/
USART3_CK/
ADC_IN18/
COMP1_INP
LCD_SEG12
-
-
DS10002 Rev 1041/136
56
Page 42
Pin descriptionsSTM32L151xE STM32L152xE
Table 8. STM32L151xE and STM32L152xE pin definitions (continued)
Pins
(1)
Pin name
LQFP144
UFBGA132
LQFP64
LQFP100
WLCSP104
Pin Type
Main
function
(after
reset)
I / O structure
74K125234J3PB13I/OFTPB13
75K115335 L1PB14I/O FTPB14
76K105436 K2PB15I/O FTPB15
77K955-H4PD8I/OFTPD8
78K856-J2PD9I/O FTPD9
79J1257-K1PD10I/OFTPD10
80J1158-G4PD11I/OFTPD11
(2)
Alternate functions
TIM9_CH1/SPI2_SCK/
I2S2_CK/
USART3_CTS/
LCD_SEG13
TIM9_CH2/SPI2_MISO/
USART3_RTS/
LCD_SEG14
TIM11_CH1/SPI2_MOSI/
I2S2_SD/
LCD_SEG15
USART3_TX/
LCD_SEG28
USART3_RX/
LCD_SEG29
USART3_CK/
LCD_SEG30
USART3_CTS/
LCD_SEG31
Pin functions
Additional
functions
ADC_IN19/
COMP1_INP
ADC_IN20/
COMP1_INP
ADC_IN21/
COMP1_INP/
RTC_REFIN
-
-
-
-
TIM4_CH1/
81J1059-H3PD12I/OFTPD12
USART3_RTS/
-
LCD_SEG32
82H1260-H2PD13I/OFTPD13TIM4_CH2/LCD_SEG33-
83----V
84----V
SS_8
DD_8
S- V
S- V
SS_8
DD_8
--
--
85H1161-J1PD14I/OFTPD14TIM4_CH3/LCD_SEG34-
86H1062-G3PD15I/O FTPD15TIM4_CH4/LCD_SEG35-
87G10---PG2I/OFTPG2-ADC_IN10b
88F9---PG3I/OFTPG3-ADC_IN11b
89F10---PG4I/O FTPG4-ADC_IN12b
90E9---PG5I/OFTPG5--
91----PG6I/O FTPG6--
92----PG7I/O FTPG7--
93----PG8I/O FTPG8--
42/136DS10002 Rev 10
Page 43
STM32L151xE STM32L152xEPin descriptions
Table 8. STM32L151xE and STM32L152xE pin definitions (continued)
Pins
Pin name
LQFP144
UFBGA132
LQFP64
LQFP100
WLCSP104
94F6---V
95G6---V
SS_9
DD_9
(1)
Pin Type
S- V
S- V
Main
function
(after
reset)
I / O structure
SS_9
DD_9
96E126337 H1PC6I/O FTPC6
97E116438 G1PC7I/OFTPC7
(2)
Alternate functions
TIM3_CH1/I2S2_MCK/
LCD_SEG24
TIM3_CH2/I2S3_MCK/
LCD_SEG25
Pin functions
Additional
functions
--
--
98E106539 G2PC8I/OFTPC8TIM3_CH3/LCD_SEG26-
99D126640 F4PC9I/OFTPC9TIM3_CH4/LCD_SEG27-
100 D116741 F3PA8I/O FTPA8
101 D106842 F1PA9I/OFTPA9
USART1_CK/MCO/
LCD_COM0
USART1_TX /
LCD_COM1
-
-
-
-
102 C126943 F2PA10I/OFTPA10
103 B127044 E1PA11I/O FTPA11
104 A127145 E2PA12I/OFTPA12
105 A117246 E3PA13I/OFT
JTMS-
SWDIO
USART1_RX /
LCD_COM2
USART1_CTS/
SPI1_MISO
USART1_RTS/
SPI1_MOSI
USB_DM
USB_DP
JTMS-SWDIO-
106 C1173-D1PH2I/O FTPH2--
107 F117447
108 G117548 C1V
D2,
A1
V
SS_2
DD_2
109 A107649 D3PA14I/OFT
S- V
S- V
SS_2
DD_2
JTCK-
SWCLK
--
--
JTCK-SWCLK-
TIM2_CH1_ETR/
110A 9775 0B1PA 15I/OFTJTDI
SPI1_NSS/SPI3_NSS/
I2S3_WS/LCD_SEG17/
JTDI
SPI3_SCK/I2S3_CK/
111 B117851 E4PC10I/OFTPC10
USART3_TX/ UART4_TX/
LCD_SEG28/
LCD_SEG40/LCD_COM4
-
-
-
DS10002 Rev 1043/136
56
Page 44
Pin descriptionsSTM32L151xE STM32L152xE
Table 8. STM32L151xE and STM32L152xE pin definitions (continued)
Pins
(1)
Pin name
LQFP144
UFBGA132
LQFP64
LQFP100
WLCSP104
Pin Type
function
I / O structure
Main
(after
reset)
(2)
Alternate functions
Pin functions
Additional
functions
SPI3_MISO/USART3_RX/
112 C107952 C2PC11I/O FTPC11
UART4_RX/
LCD_SEG29/
LCD_SEG41/LCD_COM5
SPI3_MOSI/I2S3_SD/
USART3_CK/
113 B108053 B2PC12I/O FTPC12
UART5_TX/LCD_SEG30/
LCD_SEG42/
LCD_COM6
114C981-A2PD0I/O FTPD0
TIM9_CH1/SPI2_NSS/
I2S2_WS
115B982-D4PD1I/O FTPD1SPI2_SCK/I2S2_CK-
TIM3_ETR/UART5_RX/
116C883 54 C3PD2I/OFTPD2
LCD_SEG31/
LCD_SEG43/LCD_COM7
-
-
-
-
117B884-C4PD3I/O FTPD3
118B785-A3PD4I/O FTPD4
SPI2_MISO/
USART2_CTS
SPI2_MOSI/I2S2_SD/
USART2_RTS
119A686-B3PD5I/OFTPD5USART2_TX-
120F7---V
121G7---V
SS_10
DD_10
S- V
S- V
SS_10
DD_10
--
--
122B687-B4PD6I/O FTPD6USART2_RX-
123A588-A4PD7I/O FTPD7TIM9_CH2/USART2_CK-
124D9---PG9I/OFTPG9--
125D8---PG10I/OFTPG10--
126----PG11I/OFTPG11--
127D7---PG12I/OFTPG12--
128C7---PG13I/OFTPG13--
129C6---PG14I/OFTPG14--
130----V
131----V
SS_11
DD_11
S- V
S- V
SS_11
DD_11
--
--
-
-
44/136DS10002 Rev 10
Page 45
STM32L151xE STM32L152xEPin descriptions
Table 8. STM32L151xE and STM32L152xE pin definitions (continued)
Pins
(1)
Pin name
LQFP144
UFBGA132
LQFP64
LQFP100
WLCSP104
Pin Type
function
I / O structure
Main
(after
reset)
(2)
Alternate functions
Pin functions
Additional
functions
132----PG15I/OFTPG15--
TIM2_CH2/SPI1_SCK/
133A889 55 B5PB3I/O FTJTDO
SPI3_SCK/ I2S3_CK/
COMP2_INM
LCD_SEG7/JTDO
TIM3_CH1/SPI1_MISO/
134A790 56 A5PB4I/O FTNJTRST
SPI3_MISO/
COMP2_INP
LCD_SEG8/NJTRST
TIM3_CH2/I2C1_SMBA/
135C59157 A6PB5I/O FTPB5
SPI1_MOSI/
SPI3_MOSI/I2S3_SD/
COMP2_INP
LCD_SEG9
136B592 58 C5PB6I/OFTPB6
TIM4_CH1/I2C1_SCL/
USART1_TX
COMP2_INP
137B493 59 B6PB7I/O FTPB7
TIM4_CH2/I2C1_SDA/
USART1_RX
COMP2_INP/
PVD_IN
138A49460 A7BOOT0IBBOOT0--
TIM4_CH3/TIM10_CH1/
139A395 61 D5PB8I/OFTPB8
I2C1_SCL/
-
LCD_SEG16
TIM4_CH4/
140B396 62 C6PB9I/OFTPB9
TIM11_CH1/I2C1_SDA/
-
LCD_COM3
141C397-B7PE0I/O FTPE0
TIM4_ETR/TIM10_CH1/
LCD_SEG36
-
142A298-A8PE1I/O FTPE1TIM11_CH1/LCD_SEG37-
143D399 63 C7V
144C4100 64
1. I = input, O = output, S = supply.
2. Function availability depends on the chosen device.
3. Applicable to STM32L152xE devices only. In STM32L151xE devices, this pin should be connected to V
4. The PC14 and PC15 I/Os are only configured as OSC32_IN/OSC32_OUT when the LSE oscillator is ON (by setting the
LSEON bit in the RCC_CSR register). The LSE oscillator pins OSC32_IN/OSC32_OUT can be used as general-purpose
PH0/PH1 I/Os, respectively, when the LSE oscillator is off (after reset, the LSE oscillator is off). The LSE has priority over
the GPIO function. For more details, refer to Using the OSC32_IN/OSC32_OUT pins as GPIO PC14/PC15 port pins section
in the STM32L151xx, STM32L152xx and STM32L162xx reference manual (RM0038).
B8,
A9
V
SS_3
DD_3
S- V
S- V
SS_3
DD_3
--
--
.
DD
DS10002 Rev 1045/136
56
Page 46
Pin descriptionsSTM32L151xE STM32L152xE
5. The PH0 and PH1 I/Os are only configured as OSC_IN/OSC_OUT when the HSE oscillator is ON (by setting the HSEON
bit in the RCC_CR register). The HSE oscillator pins OSC_IN/OSC_OUT can be used as general-purpose PH0/PH1 I/Os,
respectively, when the HSE oscillator is off ( after reset, the HSE oscillator is off). The HSE has priority over the GPIO
function.
Table 9. Alternate function input/output (continued)
Digital alternate function number
Pin descriptionsSTM32L151xE STM32L152xE
AFIO0AFIO1AFIO2AFIO3AFIO4AFIO5AFIO6AFIO7AFIO8
.
AFIO11
.
.
AFIO14 AFIO15
.
Port name
Alternate function
SYSTEMTIM2
PC7--TIM3_CH2 ---I2S3_MCK--- SEG25 - TIMx_IC4
PC8--TIM3_CH3 ------- SEG26 - TIMx_IC1
PC9--TIM3_CH4 ------- SEG27 - TIMx_IC2
PC10------
PC11------SPI3_MISO USART3_RX UART4_RX -
PC12------
PC13-WKUP2------------ TIMx_IC2
PC14
OSC32_IN
PC15
OSC32_OUT
PD0---TIM9_CH1 -
PD1-----
PD2--TIM3_ETR -----UART5_RX -
PD3-----SPI2_MISO - USART2_CTS ---- TIMx_IC4
------- - ----TIMx_IC3
------- - ----TIMx_IC4
TIM3/4/5TIM9/
10/11
I2C1/2SPI1/2SPI3
SPI3_SCK
I2S3_CK
SPI3_MOSI
I2S3_SD
SPI2_NSS
I2S2_WS
SPI2 SCK
I2S2_CK
USART1/2/3UART4/
USART3_TX UART4_TX -
USART3_CK UART5_TX -
------TIMx_IC1
------TIMx_IC2
-LCD-CPRISYSTEM
5
COM4/
SEG28/
SEG40
COM5/
SEG29
/SEG41
COM6/
SEG30/
SEG42
COM7/
SEG31/
SEG43
- TIMx_IC3
- TIMx_IC4
- TIMx_IC1
- TIMx_IC3
EVENT
OUT
EVENT
OUT
EVENT
OUT
EVENT
OUT
EVENT
OUT
EVENT
OUT
EVENT
OUT
EVENT
OUT
EVENT
OUT
EVENT
OUT
EVENT
OUT
EVENT
OUT
EVENT
OUT
Page 51
Table 9. Alternate function input/output (continued)
Digital alternate function number
STM32L151xE STM32L152xEPin descriptions
DS10002 Rev 1051/136
AFIO0AFIO1AFIO2AFIO3AFIO4AFIO5AFIO6AFIO7AFIO8
.
AFIO11
.
.
AFIO14 AFIO15
.
Port name
Alternate function
SYSTEMTIM2
PD4-----
PD5-------USART2_TX ---- TIMx_IC2
PD6-------USART2_RX ---- TIMx_IC3
PD7---TIM9_CH2 ---USART2_CK ---- TIMx_IC4
PD8-------USART3_TX -- SEG28 - TIMx_IC1
PD9-------USART3_RX -- SEG29 - TIMx_IC2
PD10-------USART3_CK -- SEG30 - TIMx_IC3
PD11------- USART3_CTS - - SEG31 - TIMx_IC4
PD12--TIM4_CH1 ----USART3_RTS -- SEG32 - TIMx_IC1
PD13--TIM4_CH2 ------- SEG33 - TIMx_IC2
PD14--TIM4_CH3 ------- SEG34 - TIMx_IC3
PD15--TIM4_CH4 ------- SEG35 - TIMx_IC4
PE0--TIM4_ETR TIM10_CH1 ------ SEG36 - TIMx_IC1
PE1---TIM11_CH1 ------ SEG37 - TIMx_IC2
TIM3/4/5TIM9/
10/11
I2C1/2SPI1/2SPI3
SPI2_MOSI
I2S2_SD
USART1/2/3UART4/
- USART2_RTS ---- TIMx_IC1
-LCD-CPRISYSTEM
5
EVENT
OUT
EVENT
OUT
EVENT
OUT
EVENT
OUT
EVENT
OUT
EVENT
OUT
EVENT
OUT
EVENT
OUT
EVENT
OUT
EVENT
OUT
EVENT
OUT
EVENT
OUT
EVENT
OUT
EVENT
OUT
Page 52
52/136DS10002 Rev 10
Table 9. Alternate function input/output (continued)
Digital alternate function number
Pin descriptionsSTM32L151xE STM32L152xE
AFIO0AFIO1AFIO2AFIO3AFIO4AFIO5AFIO6AFIO7AFIO8
.
AFIO11
.
.
AFIO14 AFIO15
.
Port name
Alternate function
SYSTEMTIM2
PE2TRACECK -TIM3_ETR ------- SEG 38 - TIMx_IC3
PE3TRACED0 -TIM3_CH1 ------- SEG 39 - TIMx_IC4
PE4TRACED1 -TIM3_CH2 --------- TIMx_IC1
PE5TRACED2 --TIM9_CH1 -------- TIMx_IC2
PE6WKUP3
PE7------------ TIMx_IC4
PE8------------ TIMx_IC1
PE9-
PE10-TIM2_CH2 ---------- TIMx_IC3
PE11-TIM2_CH3 ---------- TIMx_IC4
PE12-TIM2_CH4 ---SPI1_NSS ------ TIMx_IC1
PE13-----SPI1_SCK ------ TIMx_IC2
PE14-----SPI1_MISO ------ TIMx_IC3
PE15-----SPI1_MOSI ------ TIMx_IC4
TRACED3 --TIM9_CH2-------- TIMx_IC3
TIM2_CH1_
ETR
TIM3/4/5TIM9/
10/11
----- - ----TIMx_IC2
I2C1/2SPI1/2SPI3
USART1/2/3UART4/
5
-LCD-CPRISYSTEM
EVENT
OUT
EVENT
OUT
EVENT
OUT
EVENT
OUT
EVENT
OUT
EVENT
OUT
EVENT
OUT
EVENT
OUT
EVENT
OUT
EVENT
OUT
EVENT
OUT
EVENT
OUT
EVENT
OUT
EVENT
OUT
Page 53
Table 9. Alternate function input/output (continued)
Digital alternate function number
STM32L151xE STM32L152xEPin descriptions
DS10002 Rev 1053/136
AFIO0AFIO1AFIO2AFIO3AFIO4AFIO5AFIO6AFIO7AFIO8
.
AFIO11
.
.
AFIO14 AFIO15
.
Port name
Alternate function
SYSTEMTIM2
PF0-------------
PF1-------------
PF2-------------
PF3-------------
PF4-------------
PF5-------------
PF6--TIM5_ETR ----------
PF7--TIM5_CH2 ----------
PF8--TIM5_CH3 ----------
PF9--TIM5_CH4 ----------
PF10-------------
PF11-------------
PF12-------------
PF13-------------
TIM3/4/5TIM9/
10/11
I2C1/2SPI1/2SPI3
USART1/2/3UART4/
5
-LCD-CPRISYSTEM
EVENT
OUT
EVENT
OUT
EVENT
OUT
EVENT
OUT
EVENT
OUT
EVENT
OUT
EVENT
OUT
EVENT
OUT
EVENT
OUT
EVENT
OUT
EVENT
OUT
EVENT
OUT
EVENT
OUT
EVENT
OUT
Page 54
54/136DS10002 Rev 10
Table 9. Alternate function input/output (continued)
Digital alternate function number
Pin descriptionsSTM32L151xE STM32L152xE
AFIO0AFIO1AFIO2AFIO3AFIO4AFIO5AFIO6AFIO7AFIO8
.
AFIO11
.
.
AFIO14 AFIO15
.
Port name
Alternate function
SYSTEMTIM2
PF14-------------
PF15-------------
PG0-------------
PG1-------------
PG2-------------
PG3-------------
PG4-------------
PG5-------------
PG6-------------
PG7-------------
PG8-------------
PG9-------------
PG10-------------
PG11-------------
TIM3/4/5TIM9/
10/11
I2C1/2SPI1/2SPI3
USART1/2/3UART4/
5
-LCD-CPRISYSTEM
EVENT
OUT
EVENT
OUT
EVENT
OUT
EVENT
OUT
EVENT
OUT
EVENT
OUT
EVENT
OUT
EVENT
OUT
EVENT
OUT
EVENT
OUT
EVENT
OUT
EVENT
OUT
EVENT
OUT
EVENT
OUT
Page 55
Table 9. Alternate function input/output (continued)
Digital alternate function number
STM32L151xE STM32L152xEPin descriptions
DS10002 Rev 1055/136
AFIO0AFIO1AFIO2AFIO3AFIO4AFIO5AFIO6AFIO7AFIO8
.
AFIO11
.
.
AFIO14 AFIO15
.
Port name
Alternate function
SYSTEMTIM2
PG12-------------
PG13-------------
PG14-------------
PG15-------------
PH0OSC_IN--------------
PH1OSC_OUT--------------
PH2--------------
TIM3/4/5TIM9/
10/11
I2C1/2SPI1/2SPI3
USART1/2/3UART4/
5
-LCD-CPRISYSTEM
EVENT
OUT
EVENT
OUT
EVENT
OUT
EVENT
OUT
Page 56
Memory mappingSTM32L151xE STM32L152xE
MS33003V4
reserved
reserved
APB memory space
CRC
Reserved
RTC
WWDG
IWDG
SPI2
USART2
USART3
SYSCFG
TIM9
TIM11
reserved
ADC
USART1
reserved
SPI3
SPI1
I2C1
PWR
TIM10
I2C2
EXTI
RCC
DMA2
USB Registers
DMA1
0
1
2
3
4
5
6
7
0x6000 0000
Peripherals
SRAM
Cortex-M3 Internal
Peripherals
512 byte USB
TIM6
TIM7
LCD
0x4000 1000
0x4000 1400
0x4000 2400
0x4000 1C00
DAC1 & 2
Port A
Port B
Port C
Port D
Port E
Port H
Port F
0x4002 1C00
0x4002 1800
0x4002 1400
0x4002 1000
0x4002 0C00
0x4002 0800
0x4002 0400
COMP + RI
Flash memory
reserved
System memory
Aliased to Flash or system
memory depending on
BOOT pins
0x0000 0000
EEPROM
reserved
UART5
UART4
Port G
Non-
volatile
memory
Bank 1
Flash memory
Bank 2
Data EEPROM
Bank 2
Bank 1
System memory
Bank 2
Bytes
reserved
Bytes
0xFFFF FFFF
0xE010 0000
0xE000 0000
0xC000 0000
0xA000 0000
0x8000 0000
0x1FF0 2000
0x4000 0000
0x2000 0000
0x0000 0000
0x1FF8 009F
0x1FF8 0080
0x1FF8 0020
0x1FF8 0000
0x1FF0 0000
0x1FF0 1000
0x0808 4000
0x0808 2000
0x0808 0000
0x0804 0000
0x0800 0000
0x4002 6000
0x4002 67FF
0x4002 6400
0x4002 3800
0x4002 4000
0x4002 3C00
0x4002 3400
0x4002 0000
0x4002 3000
0x4002 2000
0x4001 3C00
0x4001 3000
0x4001 3800
0x4001 3400
0x4001 0400
0x4001 2C00
0x4001 2800
0x4001 2400
0x4001 1400
0x4001 1000
0x4001 0C00
0x4001 0800
0x4001 0000
0x4000 8000
0x4001 7C00
0x4000 7800
0x4000 7400
0x4000 7000
0x4000 6400
0x4000 6000
0x4000 5C00
0x4000 5800
0x4000 5400
0x4000 5000
0x4000 4C00
0x4000 4800
0x4000 4400
0x4000 4000
0x4000 3C00
0x4000 3800
0x4000 3400
0x4000 3000
0x4000 2C00
0x4000 2800
0x4000 0C00
0x4000 0800
0x4000 0000
0x4000 0400
reserved
reserved
reserved
Data
Bank 1
reserved
reserved
reserved
reserved
reserved
reserved
Flash Interface
Option
Bank 2
Option
Bank 1
reserved
TIM2
TIM3
TIM4
TIM5
5 Memory mapping
56/136DS10002 Rev 10
Figure 8. Memory map
Page 57
STM32L151xE STM32L152xEElectrical characteristics
ai17851c
C = 50 pF
MCU pin
ai17852d
MCU pin
V
IN
6 Electrical characteristics
6.1 Parameter conditions
Unless otherwise specified, all voltages are referenced to VSS.
6.1.1 Minimum and maximum values
Unless otherwise specified the minimum and maximum values are guaranteed in the worst
conditions of ambient temperature, supply voltage and frequencies by tests in production on
100% of the devices with an ambient temperature at T
the selected temperature range).
Data based on characterization results, design simulation and/or technology characteristics
are indicated in the table footnotes. Based on characterization, the minimum and maximum
values refer to sample tests and represent the mean value plus or minus three times the
standard deviation (mean
6.1.2 Typical values
Unless otherwise specified, typical data are based on TA = 25 °C, VDD = 3.6 V (for the
1.65
V ≤ V
tested.
≤ 3.6 V voltage range). They are given only as design guidelines and are not
DD
±3σ).
= 25 °C and TA = TAmax (given by
A
Typical ADC accuracy values are determined by characterization of a batch of samples from
a standard diffusion lot over the full temperature range, where 95% of the devices have an
error less than or equal to the value indicated
6.1.3 Typical curves
Unless otherwise specified, all typical curves are given only as design guidelines and are
not tested.
6.1.4 Loading capacitor
The loading conditions used for pin parameter measurement are shown in Figure 9.
6.1.5 Pin input voltage
The input voltage measurement on a pin of the device is described in Figure 10.
Figure 9. Pin loading conditionsFigure 10. Pin input voltage
(mean ±2σ).
DS10002 Rev 1057/136
114
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Electrical characteristicsSTM32L151xE STM32L152xE
MS32461V3
Analog:
OSC,PLL,COMP,
….
V
DD
GP I/Os
OUT
IN
Kernel logic
(CPU,
Digital &
Memories)
Standby-power circuitry
(LSE,RTC,Wake-up
logic, RTC backup
registers)
N × 100 nF +
1 × 4.7 μF
Regulator
V
SS
V
DDA
V
REF+
V
REF-
V
SSA
ADC/
DAC
Level shifter
IO
Logic
V
DD
100 nF
+ 1 μF
V
REF
100 nF
+ 1 μF
V
DDA
N – number of
V
DD
/V
SS
pairs
6.1.6 Power supply scheme
Figure 11. Power supply scheme
58/136DS10002 Rev 10
Page 59
STM32L151xE STM32L152xEElectrical characteristics
MS32462V2
V
DD1/2/.../N
N x 100 nF
+ 1 x 10 μF
Step-up
Converter
V
SS1/2/.../N
V
DD
100 nF
V
LCD
V
LCD
C
EXT
LCD
VSEL
Option 1
Option 2
N x 100 nF
+1 x 10 μF
N x V
SS
N x V
DD
V
SSA
100 nF
+1 μF
A
+
-
V
REF+
V
REF-
V
DDA
V
LCD
MS33028V1
6.1.7 Optional LCD power supply scheme
Figure 12. Optional LCD power supply scheme
1. Option 1: LCD power supply is provided by a dedicated VLCD supply source, VSEL switch is open.
2. Option 2: LCD power supply is provided by the internal step-up converter, VSEL switch is closed, an
external capacitance is needed for correct behavior of this converter.
6.1.8 Current consumption measurement
Figure 13. Current consumption measurement scheme
DS10002 Rev 1059/136
114
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Electrical characteristicsSTM32L151xE STM32L152xE
6.2 Absolute maximum ratings
Stresses above the absolute maximum ratings listed in Tab le 10: Voltage characteristics,
Tabl e 11: Current characteristics, and Table 12: Thermal characteristics may cause
permanent damage to the device. These are stress ratings only and functional operation of
the device at these conditions is not implied. Exposure to maximum rating conditions for
extended periods may affect device reliability.
SymbolRatingsMinMaxUnit
Table 10. Voltage characteristics
VDD–V
(2)
V
IN
|ΔV
DDx
− VSS|Variations between all different ground pins
|V
SSX
V
REF+ –VDDA
V
ESD(HBM)
1. All main power (VDD, V
permitted range.
maximum must always be respected. Refer to Table 11 for maximum allowed injected current values.
2. V
IN
3. Include V
External main supply voltage
SS
(including V
DDA
and VDD)
(1)
Input voltage on five-volt tolerant pinV
Input voltage on any other pinV
|Variations between different V
Allowed voltage difference for V
power pins-50
DD
(3)
> V
REF+
DDA
Electrostatic discharge voltage
(human body model)
REF-
pin.
) and ground (VSS, V
DDA
Table 11. Current characteristics
) pins must always be connected to the external power supply, in the
SSA
–0.34.0
− 0.3VDD+4.0
SS
− 0.34.0
SS
-50
-0.4V
see Section 6.3.11-
SymbolRatings Max.Unit
(1)
(1)
(1)
(1)
100
100
70
-70
I
VDD(Σ)
I
VSS(Σ)
I
VDD(PIN)
I
VSS(PIN)
(2)
Total current into sum of all V
Total current out of sum of all V
Maximum current into each V
power lines (source)
DD_x
ground lines (sink)
SS_x
power pin (source)
DD_x
Maximum current out of each VSS_x ground pin (sink)
Output current sunk by any I/O and control pin25
I
IO
ΣI
IO(PIN)
INJ(PIN)
ΣI
INJ(PIN)
(3)
I
1. All main power (VDD, V
permitted range.
2. This current consumption must be correctly distributed over all I/Os and control pins. The total output current must not be
sunk/sourced between two consecutive power supply pins referring to high pin count LQFP packages.
3. Negative injection disturbs the analog performance of the device. See note in Section 6.3.17.
Output current sourced by any I/O and control pin- 25
(6)
(2)
(2)
60
-60
± 5
± 25
Total output current sunk by sum of all IOs and control pins
Total output current sourced by sum of all IOs and control pins
(5)
(4)
, RST and B pins-5/+0
Injected current on five-volt tolerant I/O
Injected current on any other pin
Total injected current (sum of all I/O and control pins)
) and ground (VSS, V
DDA
) pins must always be connected to the external power supply, in the
SSA
mA
V
mV
60/136DS10002 Rev 10
Page 61
STM32L151xE STM32L152xEElectrical characteristics
4. Positive current injection is not possible on these I/Os. A negative injection is induced by VIN<VSS. I
exceeded. Refer to Table 10 for maximum allowed input voltage values.
5. A positive injection is induced by V
exceeded. Refer to Table 10: Voltage characteristics for the maximum allowed input voltage values.
6. When several inputs are submitted to a current injection, the maximum ΣI
negative injected currents (instantaneous values).
> VDD while a negative injection is induced by V
IN
INJ(PIN)
< VSS. I
IN
is the absolute sum of the positive and
INJ(PIN)
must never be
INJ(PIN)
must never be
Table 12. Thermal characteristics
SymbolRatings ValueUnit
T
STG
T
J
Storage temperature range–65 to +150°C
Maximum junction temperature150°C
6.3 Operating conditions
6.3.1 General operating conditions
SymbolParameter ConditionsMinMaxUnit
f
HCLK
PCLK1
f
PCLK2
V
Internal AHB clock frequency-0 32
Internal APB1 clock frequency-0 32
Internal APB2 clock frequency-0 32
Standard operating voltage
DD
Analog operating voltage
(ADC and DAC not used)
(1)
V
DDA
Analog operating voltage
(ADC or DAC used)
V
I/O input voltage
IN
Table 13. General operating conditions
BOR detector disabled1.653.6
BOR detector enabled, at
power on
BOR detector disabled, after
power on
Must be the same voltage as
(2)
V
DD
FT pins; 2.0 V ≤ V
FT pins; V
< 2.0 V-0.35.25
DD
BOOT0 pin05.5
-0.35.5
DD
MHzf
1.83.6
1.653.6
1.653.6
1.83.6
(3)
(3)
V
V
V
Any other pin-0.3V
UFBGA132 package-333
LQFP144 package-500
Power dissipation at TA = 85 °C for
P
D
suffix 6 or TA = 105 °C for suffix 7
(4)
LQFP100 package-465
LQFP64 package-435
WLCSP104 package-435
Ambient temperature for 6 suffix version Maximum power dissipation
(5)
–40 85
TA
Ambient temperature for 7 suffix version Maximum power dissipation–40 105
DS10002 Rev 1061/136
DD
+0.3
mW
°C
114
Page 62
Electrical characteristicsSTM32L151xE STM32L152xE
Table 13. General operating conditions (continued)
SymbolParameter ConditionsMinMaxUnit
TJ Junction temperature range
6 suffix version–40 105
7 suffix version–40 110
1. When the ADC is used, refer to Table 55: ADC characteristics.
2. It is recommended to power V
V
can be tolerated during power-up .
DDA
3. To sustain a voltage higher than VDD+0.3V, the internal pull-up/pull-down resistors must be disabled.
is lower, higher PD values are allowed as long as TJ does not exceed TJ max (see Table 71: Thermal characteristics
4. If T
A
on page 130).
5. In low-power dissipation state, T
max (see Table 71: Thermal characteristics on page 130).
and V
DD
can be extended to -40°C to 105°C temperature range as long as TJ does not exceed T
A
from the same source. A maximum difference of 300 mV between VDD and
DDA
6.3.2 Embedded reset and power control block characteristics
The parameters given in the following table are derived from the tests performed under the
conditions summarized in
Table 14. Embedded reset and power control block characteristics
SymbolParameterConditionsMinTyp MaxUnit
VDD rise time rate
(1)
t
VDD
V
fall time rate
DD
T
RSTTEMPO
V
POR/PDR
(1)
Reset temporization
Power on/power down reset
threshold
Tabl e 13.
BOR detector enabled0-
∞
BOR detector disabled0-1000
BOR detector enabled20-∞
BOR detector disabled0-1000
V
rising, BOR enabled-23.3
DD
rising, BOR disabled
V
DD
(2)
0.40.71.6
Falling edge11.51.65
Rising edge1.31.51.65
°C
J
µs/V
ms
V
BOR0
Brown-out reset threshold 0
Rising edge1.691.761.8
Falling edge1.871.931.97
Falling edge1.671.71.74
V
BOR1
Brown-out reset threshold 1
Rising edge1.962.032.07
Falling edge2.222.302.35
V
BOR2
Brown-out reset threshold 2
Rising edge2.312.412.44
62/136DS10002 Rev 10
V
Page 63
STM32L151xE STM32L152xEElectrical characteristics
Table 14. Embedded reset and power control block characteristics (continued)
SymbolParameterConditionsMinTyp MaxUnit
V
V
V
V
V
V
V
V
V
BOR3
BOR4
PVD0
PVD1
PVD2
PVD3
PVD4
PVD5
PVD6
Brown-out reset threshold 3
Brown-out reset threshold 4
Programmable voltage detector
threshold 0
PVD threshold 1
PVD threshold 2
PVD threshold 3
PVD threshold 4
PVD threshold 5
PVD threshold 6
Falling edge2.452.552.6
Rising edge2.542.662.7
Falling edge2.682.82.85
Rising edge2.782.92.95
Falling edge1.81.851.88
Rising edge1.881.941.99
Falling edge1.982.042.09
Rising edge2.082.142.18
Falling edge2.202.242.28
V
Rising edge2.282.342.38
Falling edge2.392.442.48
Rising edge2.472.542.58
Falling edge2.572.642.69
Rising edge2.682.742.79
Falling edge2.772.832.88
Rising edge2.872.942.99
Falling edge2.973.053.09
Rising edge3.083.153.20
BOR0 threshold-40-
V
hyst
1. Guaranteed by characterization results.
2. Valid for device version without BOR at power up. See option “D” in Ordering information scheme for more details.
Hysteresis voltage
All BOR and PVD
thresholds excepting BOR0
-100-
mV
DS10002 Rev 1063/136
114
Page 64
Electrical characteristicsSTM32L151xE STM32L152xE
6.3.3 Embedded internal reference voltage
The parameters given in Tab le 16 are based on characterization results, unless otherwise
specified.
VREFINT_CAL
Table 15. Embedded internal reference voltage calibration values
Calibration value nameDescriptionMemory address
Raw data acquired at
temperature of 30 °C ±5 °C
V
= 3 V ±10 mV
DDA
0x1FF8 00F8 - 0x1FF8 00F9
Table 16. Embedded internal reference voltage
SymbolParameterConditionsMinTyp MaxUnit
Coeff
Coeff
(3)
(3)
(3)
(1)
Internal reference voltage– 40 °C < TJ < +110 °C 1.202 1.2241.242V
Internal reference current
consumption
--1.42.3µA
Internal reference startup time--23ms
V
and V
DDA
V
Accuracy of factory-measured V
value
factory measure
REFINT
(2)
voltage during
REF+
Including uncertainties
REF
due to ADC and
V
DDA/VREF+
-2.9933.01V
-- ±5mV
values
Temperature coefficient–40 °C < TJ < +110 °C-25100ppm/°C
Long-term stability1000 hours, T= 25 °C--1000ppm
(3)
Voltage coefficient3.0 V < V
ADC sampling time when reading
(3)
the internal reference voltage
Startup time of reference voltage
(3)
buffer for ADC
Consumption of reference voltage
(3)
buffer for ADC
(3)
VREF_OUT output current
(3)
VREF_OUT output load---50pF
(4)
Consumption of reference voltage
buffer for VREF_OUT and COMP
(3)
1/4 reference voltage-242526
(3)
1/2 reference voltage-495051
(3)
3/4 reference voltage-747576
value is individually measured in production and stored in dedicated EEPROM bytes.
REF
< 3.6 V--2000ppm/V
DDA
-4--µs
---10µs
--13.525µA
---1µA
--7301200nA
V
REFINT out
I
REFINT
T
VREFINT
V
VREF_MEAS
A
VREF_MEAS
T
A
V
DDCoeff
T
S_vrefint
T
ADC_BUF
I
BUF_ADC
I
VREF_OUT
C
VREF_OUT
I
LPBUF
V
REFINT_DIV1
V
REFINT_DIV2
V
REFINT_DIV3
1. Guaranteed by test in production.
2. The internal V
3. Guaranteed by characterization results.
4. To guarantee less than 1% VREF_OUT deviation.
V
REFINT
%
64/136DS10002 Rev 10
Page 65
STM32L151xE STM32L152xEElectrical characteristics
6.3.4 Supply current characteristics
The current consumption is a function of several parameters and factors such as the
operating voltage, temperature, I/O pin loading, device software configuration, operating
frequencies, I/O pin switching rate, program location in memory and executed binary code.
The current consumption is measured as described in
measurement scheme.
All Run-mode current consumption measurements given in this section are performed with a
reduced code that gives a consumption equivalent to the Dhrystone 2.1 code, unless
otherwise specified. The current consumption values are derived from tests performed
under ambient temperature T
= 25 °C and VDD supply voltage conditions summarized in
A
Tabl e 13: General operating conditions, unless otherwise specified.
The MCU is placed under the following conditions:
•All I/O pins are configured in analog input mode
•All peripherals are disabled except when explicitly mentioned.
•The Flash memory access time, 64-bit access and prefetch is adjusted depending on
f
frequency and voltage range to provide the best CPU performance.
HCLK
•When the peripherals are enabled f
APB1
= f
•When PLL is ON, the PLL inputs are equal to HSI = 16 MHz (if internal clock is used) or
HSE = 16 MHz (if HSE bypass mode is used).
•The HSE user clock applied to OSCI_IN input follows the characteristic specified in
Table 26: High-speed external user clock characteristics.
•For maximum current consumption V
•For typical current consumption V
DD
DD
= V
= V
DDA
specified otherwise.
Figure 13: Current consumption
= f
APB2
= 3.6 V is applied to all supply pins.
DDA
AHB
.
= 3.0 V is applied to all supply pins if not
DS10002 Rev 1065/136
114
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Electrical characteristicsSTM32L151xE STM32L152xE
Table 17. Current consumption in Run mode, code with data processing running from
Flash
Symbol ParameterConditionsf
Range 3, V
CORE
=1.2
V VOS[1:0] = 11
f
I
DD
(Run
from
Flash)
Supply
current in
Run mode,
code
executed
from Flash
= f
HSE
16 MHz included,
= f
f
HSE
above 16 MHz (PLL
(2)
ON)
HSI clock source
(16 MHz)
HCLK
HCLK
up to
/2
Range 2, V
CORE
V VOS[1:0] = 10
Range 1, V
CORE
V VOS[1:0] = 01
Range 2, V
CORE
V VOS[1:0] = 10
Range 1, V
CORE
=1.5
=1.8
=1.5
=1.8
V VOS[1:0] = 01
MSI clock, 65 kHz
Range 3, V
CORE
=1.2
V VOS[1:0] = 11
MSI clock, 4.2 MHz4.2 MHz8201200
1. Guaranteed by characterization results, unless otherwise specified.
2. Oscillator bypassed (HSEBYP = 1 in RCC_CR register).
HCLK
TypMax
1 MHz225500
4 MHz7801200
4 MHz0.981.6
8 MHz1.852.9
16 MHz3.65.2
8 MHz2.23.5
16 MHz4.46.5
32 MHz8.612
16 MHz3.65.2
32 MHz8.712.3
65 kHz42145
(1)
Unit
µA2 MHz420750
mA
µAMSI clock, 524 kHz524 kHz135250
66/136DS10002 Rev 10
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STM32L151xE STM32L152xEElectrical characteristics
Table 18. Current consumption in Run mode, code with data processing running from
RAM
SymbolParameterConditionsf
Range 3,
=1.2 V
V
CORE
VOS[1:0] = 11
IDD
(Run
from
RAM)
Supply current
in Run mode,
code executed
from RAM,
Flash switched
off
= f
f
HSE
16 MHz included,
= f
f
HSE
above 16 MHz
(PLL ON)
HSI clock source
(16 MHz)
HCLK
HCLK
(2)
up to
/2
Range 2,
=1.5 V
V
CORE
VOS[1:0] = 10
Range 1,
=1.8 V
V
CORE
VOS[1:0] = 01
Range 2,
=1.5 V
V
CORE
VOS[1:0] = 10
Range 1,
V
=1.8 V
CORE
VOS[1:0] = 01
HCLK
TypM ax
1 MHz200470
4 MHz6851200
4 MHz0.801.5
8 MHz1.63
16 MHz3.15
8 MHz1.93.5
16 MHz3.75.55
32 MHz7.5510.9
16 MHz3.154.8
32 MHz7.7511.7
(1)
Unit
µA2 MHz360780
mA
MSI clock, 65 kHz
MSI clock, 4.2 MHz4.2 MHz7151100
1. Guaranteed by characterization results, unless otherwise specified.
2. Oscillator bypassed (HSEBYP = 1 in RCC_CR register).
Range 3,
V
=1.2 V
CORE
VOS[1:0] = 11
65 kHz40130
µAMSI clock, 524 kHz524 kHz115215
DS10002 Rev 1067/136
114
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Electrical characteristicsSTM32L151xE STM32L152xE
Table 19. Current consumption in Sleep mode
SymbolParameterConditionsf
Range 3,
V
=1.2 V
CORE
VOS[1:0] = 11
f
Supply current
in Sleep
= f
HSE
16 MHz included,
= f
f
HSE
above 16 MHz (PLL
(2)
ON)
HCLK
HCLK
up to
/2
Range 2,
=1.5 V
V
CORE
VOS[1:0] = 10
Range 1,
=1.8 V
V
CORE
VOS[1:0] = 01
mode, Flash
OFF
HSI clock source
(16 MHz)
Range 2,
V
=1.5 V
CORE
VOS[1:0] = 10
Range 1,
V
=1.8 V
CORE
VOS[1:0] = 01
MSI clock, 65 kHz
MSI clock, 524 kHz524 kHz33110
MSI clock, 4.2 MHz4.2 MHz150273
Range 3,
V
=1.2 V
CORE
VOS[1:0] = 11
IDD (Sleep)
Range 3,
V
=1.2 V
CORE
VOS[1:0] = 11
Supply current
in Sleep
mode, Flash
ON
= f
f
HSE
16 MHz included,
f
= f
HSE
above 16 MHz (PLL
(2)
ON)
HCLK
HCLK
up to
/2
Range 2,
=1.5 V
V
CORE
VOS[1:0] = 10
Range 1,
=1.8 V
V
CORE
VOS[1:0] = 01
Range 2,
=1.5 V
V
CORE
HSI clock source
(16 MHz)
VOS[1:0] = 10
Range 1,
V
=1.8 V
CORE
VOS[1:0] = 01
Supply current
in Sleep
mode, Flash
ON
1. Guaranteed by characterization results, unless otherwise specified.
2. Oscillator bypassed (HSEBYP = 1 in RCC_CR register)
MSI clock, 65 kHz
MSI clock, 524 kHz524 kHz45125
MSI clock, 4.2 MHz4.2 MHz160290
Range 3,
=1.2V
V
CORE
VOS[1:0] = 11
HCLK
TypMa x
1 MHz51220
2 MHz81300
4 MHz140380
4 MHz175500
8 MHz330700
16 MHz6251100
8 MHz395800
16 MHz7601250
32 MHz17002700
16 MHz6701100
32 MHz17502700
65 kHz1992
1 MHz63250
2 MHz93300
4 MHz155380
4 MHz190500
8 MHz340700
16 MHz6401120
8 MHz410800
16 MHz7701300
32 MHz17502700
16 MHz6901160
32 MHz17502800
65 kHz31105
(1)
Unit
µA
68/136DS10002 Rev 10
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STM32L151xE STM32L152xEElectrical characteristics
Table 20. Current consumption in Low-power run mode
SymbolParameterConditionsTypMax
TA = -40 °C to 25 °C1116
MSI clock, 65 kHz
= 32 kHz
f
All
HCLK
peripherals
OFF, code
executed
from RAM,
Flash
MSI clock, 65 kHz
= 65 kHz
f
HCLK
switched
OFF, V
from 1.65 V
to 3.6 V
DD
MSI clock, 131 kHz
f
HCLK
= 131 kHz
Supply
I
DD (LP
Run)
current in
Low-power
run mode
MSI clock, 65 kHz
= 32 kHz
f
HCLK
All
peripherals
OFF, code
executed
from Flash,
MSI clock, 65 kHz
= 65 kHz
f
HCLK
VDD from
1.65 V to
3.6 V
Max allowed
I
max
DD
(LP Run)
current in
Low-power
run mode
1. Guaranteed by characterization results, unless otherwise specified.
from
V
DD
1.65 V to
3.6 V
MSI clock, 131 kHz
f
= 131 kHz
HCLK
---200
= 85 °C36.240
T
A
= 105 °C65.4102
T
A
TA =-40 °C to 25 °C16.523
= 85 °C41.948
T
A
= 105 °C72.1108
T
A
TA = -40 °C to 25 °C3045
= 55 °C36.148
T
A
= 85 °C55.766
T
A
T
= 105 °C86.6125
A
TA = -40 °C to 25 °C2640.5
T
= 85 °C53.267
A
= 105 °C92.1120
T
A
TA = -40 °C to 25 °C3349
T
= 85 °C60.275
A
= 105 °C95.6130
T
A
T
= -40 °C to 25 °C48.571
A
T
= 55 °C54.775
A
= 85 °C76.195
T
A
= 105 °C112140
T
A
(1)
Unit
µA
DS10002 Rev 1069/136
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Electrical characteristicsSTM32L151xE STM32L152xE
Table 21. Current consumption in Low-power sleep mode
SymbolParameterConditionsTypMax
MSI clock, 65 kHz
f
HCLK
= 32 kHz
TA = -40 °C to 25 °C5.5-
Flash OFF
T
= -40 °C to 25 °C18.521
A
= 85 °C26.829
T
A
= 105 °C3747
T
A
T
= -40 °C to 25 °C18.521
A
= 85 °C27.229
T
A
= 105 °C37.347
T
A
= -40 °C to 25 °C21.525
T
A
= 55 °C23.726
T
A
T
= 85 °C29.832
A
= 105 °C39.750
T
A
I
DD
(LP Sleep)
Supply
current in
Low-power
sleep mode
All peripherals
DD
from
OFF, V
1.65 V to 3.6 V
MSI clock, 65 kHz
f
= 32 kHz
HCLK
Flash ON
MSI clock, 65 kHz
f
= 65 kHz,
HCLK
Flash ON
MSI clock, 131 kHz
= 131 kHz,
f
HCLK
Flash ON
TA = -40 °C to 25 °C18.521
TIM9 and
USART1
enabled, Flash
DD
from
ON, V
1.65 V to 3.6 V
MSI clock, 65 kHz
f
= 32 kHz
HCLK
MSI clock, 65 kHz
= 65 kHz
f
HCLK
MSI clock, 131 kHz
f
= 131 kHz
HCLK
T
= 85 °C26.829
A
= 105 °C38.347
T
A
TA = -40 °C to 25 °C18.521
T
= 85 °C27.229
A
= 105 °C38.547
T
A
T
= -40 °C to 25 °C21.525
A
T
= 55 °C23.726
A
= 85 °C29.832
T
A
= 105 °C41.250
T
A
Max
max
I
DD
(LP Sleep)
allowed
current in
Low-power
from 1.65 V
V
DD
to 3.6 V
---200
sleep mode
1. Guaranteed by characterization results, unless otherwise specified.
(1)
Unit
µA
70/136DS10002 Rev 10
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STM32L151xE STM32L152xEElectrical characteristics
Table 22. Typical and maximum current consumptions in Stop mode
SymbolParameterConditionsTypMax
= -40°C to 25°C
T
RTC clocked by LSI
or LSE external clock
(32.768kHz),
regulator in LP mode,
HSI and HSE OFF
(no independent
watchdog)
LCD
OFF
LCD
ON
(static
duty)
A
= 1.8 V
V
DD
= -40°C to 25°C1.44
T
A
= 55°C3.026
T
A
T
= 85°C7.4411
A
= 105°C15.527
T
A
TA = -40°C to 25°C1.56
T
= 55°C4.657
A
= 85°C9.0713
T
A
(2)
= 105°C15.631
T
A
1.18-
TA = -40°C to 25°C3.910
(Stop
I
DD
with RTC)
Supply current in
Stop mode with RTC
enabled
LCD
ON (1/8
duty)
LCD
OFF
= 55°C5.1911
T
A
(3)
T
= 85°C9.817
A
= 105°C18.448
T
A
T
= -40°C to 25°C1.65-
A
T
= 55°C3.32-
A
= 85°C7.83-
T
A
= 105°C16-
T
A
TA = -40°C to 25°C1.75-
RTC clocked by LSE
external quartz
(32.768kHz),
regulator in LP mode,
HSI and HSE OFF
(no independent
watchdog
(4)
LCD
ON
(static
duty)
LCD
ON (1/8
duty)
LCD
OFF
= 55°C4.9-
T
A
= 85°C9.41-
T
A
(2)
T
= 105°C15.8-
A
TA = -40°C to 25°C4.1-
= 55°C5.53-
T
A
(3)
T
= 85°C10-
A
= 105°C18.5-
T
A
= -40°C to 25°C
T
A
= 1.8V
V
DD
= -40°C to 25°C
T
A
VDD = 3.0V
1.33-
1.62-
(1)
Unit
µA
T
= -40°C to 25°C
A
VDD = 3.6V
1.87-
DS10002 Rev 1071/136
114
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Electrical characteristicsSTM32L151xE STM32L152xE
Table 22. Typical and maximum current consumptions in Stop mode (continued)
SymbolParameterConditionsTypMax
Regulator in LP mode, HSI and
HSE OFF, independent
= -40°C to 25°C1.82.2
T
A
watchdog and LSI enabled
Supply current in
I
DD
(Stop)
Stop mode (RTC
disabled)
Regulator in LP mode, LSI, HSI
and HSE OFF (no independent
watchdog)
I
DD
(WU from
Stop)
1. Guaranteed by characterization results, unless otherwise specified.
2. LCD enabled with external VLCD, static duty, division ratio = 256, all pixels active, no LCD connected.
3. LCD enabled with external VLCD, 1/8 duty, 1/3 bias, division ratio = 64, all pixels active, no LCD connected.
4. Based on characterization done with a 32.768 kHz crystal (MC306-G-06Q-32.768, manufacturer JFVNY) with two 6.8 pF
loading capacitors.
5. When MSI = 64 kHz, the RMS current is measured over the first 15 µs following the wakeup event. For the remaining part
of the wakeup period, the current corresponds the Run mode current.
Supply current during
wakeup from Stop
mode
MSI = 4.2 MHz
MSI = 65 kHz
(5)
= -40°C to 25°C0.5601.5
T
A
T
= 55°C2.184
A
= 85°C6.612
T
A
= 105°C14.926
T
A
2-
TA = -40°C to 25°C
1.45-
(1)
Unit
µA
mAMSI = 1.05 MHz1.45-
72/136DS10002 Rev 10
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STM32L151xE STM32L152xEElectrical characteristics
Table 23. Typical and maximum current consumptions in Standby mode
(2)
(2)
(1)
Unit
µA
SymbolParameterConditionsTypMax
T
= -40 °C to 25 °C
I
DD
(Standby
with RTC)
I
DD
(Standby)
IDD
(WU from
Standby)
Supply current in
Standby mode with RTC
enabled
Supply current in
Standby mode (RTC
disabled)
Supply current during
wakeup time from
Standby mode
RTC clocked by LSI (no
independent watchdog)
RTC clocked by LSE
external quartz (no
independent
watchdog)
(3)
Independent watchdog
and LSI enabled
Independent watchdog
and LSI OFF
-T
A
=1.8 V
V
DD
= -40 °C to 25 °C1.111.9
T
A
= 55 °C1.722.2
T
A
T
= 85 °C2.124
A
= 105 °C2.548.3
T
A
TA = -40 °C to 25 °C
= 1.8 V
V
DD
= -40 °C to 25 °C1.28-
T
A
= 55 °C2.01-
T
A
T
= 85 °C2.5-
A
= 105 °C2.98-
T
A
= -40 °C to 25 °C11.7
T
A
TA = -40 °C to 25 °C0.291
T
= 55 °C0.961.3
A
= 85 °C1.383
T
A
= 105 °C1.987
T
A
= -40 °C to 25 °C1-mA
A
0.865-
0.97-
1. Guaranteed by characterization results, unless otherwise specified.
2. Guaranteed by test in production.
3. Based on characterization done with a 32.768 kHz crystal (MC306-G-06Q-32.768, manufacturer JFVNY) with two 6.8pF
loading capacitors.
On-chip peripheral current consumption
The current consumption of the on-chip peripherals is given in the following table. The MCU
is placed under the following conditions:
•all I/O pins are in input mode with a static value at VDD or VSS (no load)
•all peripherals are disabled unless otherwise mentioned
•the given value is calculated by measuring the current consumption
–with all peripherals clocked off
–with only one peripheral clocked on
DS10002 Rev 1073/136
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Electrical characteristicsSTM32L151xE STM32L152xE
APB1
Table 24. Peripheral current consumption
Typical consumption, VDD = 3.0 V, TA = 25 °C
Peripheral
Range 1,
V
=
CORE
1.8 V
VOS[1:0] = 01
TIM212.010.08.010.0
TIM310.58.87.08.8
TIM410.48.87.08.8
TIM513.811.59.111.5
TIM63.93.02.53.0
TIM73.83.32.63.3
LCD4.23.62.83.6
WWDG2.92.52.12.5
SPI25.44.43.54.4
SPI35.54.63.74.6
USART27.66.24.96.2
USART37.66.25.06.2
Range 2,
V
=
CORE
1.5 V
VOS[1:0] = 10
Range 3,
V
=
CORE
1.2 V
VOS[1:0] = 11
(1)
Low-power
sleep and run
Unit
µA/MHz
(f
HCLK
)
USART47.36.14.86.1
USART57.66.35.06.3
I2C17.36.14.86.1
I2C27.25.94.75.9
USB13.011.28.911.2
PWR2.62.31.92.3
DAC5.95.04.05.0
COMP3.93.32.63.3
74/136DS10002 Rev 10
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STM32L151xE STM32L152xEElectrical characteristics
APB2
AHB
Table 24. Peripheral current consumption
(1)
(continued)
Typical consumption, VDD = 3.0 V, TA = 25 °C
Peripheral
Range 1,
V
=
CORE
1.8 V
VOS[1:0] = 01
Range 2,
V
=
CORE
1.5 V
VOS[1:0] = 10
Range 3,
V
=
CORE
1.2 V
VOS[1:0] = 11
SYSCFG & RI2.92.42.02.4
TIM98.26.95.56.9
TIM106.25.14.15.1
TIM116.25.14.15.1
(2)
ADC
9.57.96.27.9
SPI14.83.93.23.9
USART18.26.95.46.9
GPIOA6.35.34.15.3
GPIOB6.35.34.15.3
GPIOC6.35.24.15.2
GPIOD8.16.85.46.8
GPIOE6.75.74.55.7
GPIOF5.94.93.94.9
GPIOG7.26.14.96.1
GPIOH1.71.41.11.4
Low-power
sleep and run
Unit
µA/MHz
(f
HCLK
)
CRC0.80.70.50.7
FLASH21.618.116.0-
(3)
DMA116.814.511.514.5
DMA215.713.610.813.6
All enabled222184160165.9
I
DD (RTC)
I
DD (LCD)
I
DD (ADC)
I
DD (DAC)
I
DD (COMP1)
(4)
(5)
0.4
3.1
1450
340
0.16
µA
Slow mode2
I
DD (COMP2)
I
DD (PVD / BOR)
I
DD (IWDG)
1. Data based on differential IDD measurement between all peripherals OFF an one peripheral with clock enabled, in the
following conditions: f
power run/sleep), f
both cases. No I/O pins toggling.
2. HSI oscillator is OFF for this measure.
Fast mode5
(6)
= 32 MHz (range 1), f
HCLK
= f
HCLK
, f
APB1
APB2
= f
HCLK
= 16 MHz (range 2), f
HCLK
, default prescaler value for each peripheral. The CPU is in Sleep mode in
2.6
0.25
= 4 MHz (range 3), f
HCLK
= 64kHz (Low-
HCLK
DS10002 Rev 1075/136
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Electrical characteristicsSTM32L151xE STM32L152xE
3. In Low-power sleep and run mode, the Flash memory must always be in power-down mode.
4. Data based on a differential I
consumption not included).
5. Data based on a differential I
VDD/2. DAC is in buffered mode, output is left floating.
6. Including supply current of internal reference voltage.
DD measurement between ADC in reset configuration and continuous ADC conversion (HSI
DD measurement between DAC in reset configuration and continuous DAC conversion of
6.3.5 Wakeup time from low-power mode
The wakeup times given in the following table are measured with the MSI RC oscillator. The
clock source used to wake up the device depends on the current operating mode:
•Sleep mode: the clock source is the clock that was set before entering Sleep mode
•Stop mode: the clock source is the MSI oscillator in the range configured before
entering Stop mode
•Standby mode: the clock source is the MSI oscillator running at 2.1 MHz
All timings are derived from tests performed under the conditions summarized in Tab le 13.
SymbolParameterConditionsTypMax
Table 25. Low-power mode wakeup timings
(1)
Unit
t
WUSLEEP
t
WUSLEEP_LP
t
WUSTOP
t
WUSTDBY
Wakeup from Sleep modef
Wakeup from Low-power sleep
mode, f
HCLK
= 262 kHz
Wakeup from Stop mode,
regulator in Run mode
ULP bit = 1 and FWU bit = 1
Wakeup from Stop mode,
regulator in low-power mode
ULP bit = 1 and FWU bit = 1
Wakeup from Standby mode
ULP bit = 1 and FWU bit = 1
Wakeup from Standby mode
FWU bit = 0
= 32 MHz0.4-
HCLK
f
= 262 kHz
HCLK
Flash enabled
f
= 262 kHz
HCLK
Flash switched OFF
= f
f
HCLK
f
HCLK
= 4.2 MHz8.2-
MSI
= f
= 4.2 MHz
MSI
Voltage range 1 and 2
f
= f
HCLK
= 4.2 MHz
MSI
Voltage range 3
= f
f
HCLK
f
HCLK
f
HCLK
f
HCLK
f
HCLK
f
HCLK
f
HCLK
f
HCLK
= 2.1 MHz10.213.4
MSI
= f
= 1.05 MHz1620
MSI
= f
= 524 kHz3137
MSI
= f
= 262 kHz5766
MSI
= f
= 131 kHz112123
MSI
= MSI = 65 kHz221236
= MSI = 2.1 MHz58104
= MSI = 2.1 MHz2.63.25ms
46-
46-
7.78.9
8.213.1
µs
1. Guaranteed by characterization, unless otherwise specified
76/136DS10002 Rev 10
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STM32L151xE STM32L152xEElectrical characteristics
MS19214V2
V
HSEH
t
f(HSE)
90%
10%
T
HSE
t
t
r(HSE)
V
HSEL
t
w(HSEH)
t
w(HSEL)
6.3.6 External clock source characteristics
High-speed external user clock generated from an external source
In bypass mode the HSE oscillator is switched off and the input pin is a standard GPIO.The
external clock signal has to respect the I/O characteristics in
recommended clock input waveform is shown in Figure 14.
SymbolParameterConditionsMinTypMaxUnit
Table 26. High-speed external user clock characteristics
Section 6.3.12. However, the
(1)
f
HSE_ext
V
HSEH
V
HSEL
t
w(HSEH)
t
w(HSEL)
t
r(HSE)
t
f(HSE)
C
in(HSE)
1. Guaranteed by design.
User external clock source
frequency
OSC_IN input pin high level voltage
OSC_IN input pin low level voltageV
OSC_IN high or low time12--
OSC_IN rise or fall time--20
OSC_IN input capacitance-2.6-pF
Figure 14. High-speed external clock source AC timing diagram
CSS is on or
PLL is used
CSS is off, PLL
not used
-
1832MHz
0832MHz
0.7V
SS
DD
-V
-0.3V
DD
DD
V
ns
DS10002 Rev 1077/136
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Electrical characteristicsSTM32L151xE STM32L152xE
MS19215V2
V
LSEH
t
f(LSE)
90%
10%
T
LSE
t
t
r(LSE)
V
LSEL
t
w(LSEH)
t
w(LSEL)
Low-speed external user clock generated from an external source
The characteristics given in the following table result from tests performed using a lowspeed external clock source, and under the conditions summarized in
SymbolParameterConditionsMinTypMaxUnit
Table 27. Low-speed external user clock characteristics
Table 13.
(1)
f
LSE_ext
V
LSEH
V
LSEL
t
w(LSEH)
t
w(LSEL)
t
r(LSE)
t
f(LSE)
C
IN(LSE)
1. Guaranteed by design.
User external clock source
frequency
OSC32_IN input pin high level
voltage
OSC32_IN input pin low level
voltage
OSC32_IN high or low time465--
OSC32_IN rise or fall time--10
OSC32_IN input capacitance--0.6-pF
Figure 15. Low-speed external clock source AC timing diagram
132.7681000kHz
0.7V
DD
-V
DD
V
-
V
SS
-0.3V
DD
ns
High-speed external clock generated from a crystal/ceramic resonator
The high-speed external (HSE) clock can be supplied with a 1 to 24 MHz crystal/ceramic
resonator oscillator. All the information given in this paragraph are based on
characterization results obtained with typical external components specified in
the application, the resonator and the load capacitors have to be placed as close as
possible to the oscillator pins in order to minimize output distortion and startup stabilization
time. Refer to the crystal resonator manufacturer for more details on the resonator
characteristics (frequency, package, accuracy).
78/136DS10002 Rev 10
Table 28. In
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STM32L151xE STM32L152xEElectrical characteristics
Table 28. HSE oscillator characteristics
(1)(2)
SymbolParameterConditionsMin TypMaxUnit
f
OSC_IN
R
F
Oscillator frequency-1-24MHz
Feedback resistor--200-kΩ
Recommended load
capacitance versus
C
equivalent serial
resistance of the crystal
(3)
(RS)
RS = 30 Ω-20-pF
VDD= 3.3 V,
I
HSE
HSE driving current
V
= V
IN
with 30 pF
SS
--3mA
load
C = 20 pF
f
= 16 MHz
I
DD(HSE)
g
m
t
SU(HSE)
1. Resonator characteristics given by the crystal/ceramic resonator manufacturer.
2. Guaranteed by characterization results.
3. The relatively low value of the RF resistor offers a good protection against issues resulting from use in a humid
environment, due to the induced leakage and the bias condition change. However, it is recommended to take this point into
account if the MCU is used in tough humidity conditions.
4. t
SU(HSE)
reached. This value is measured for a standard crystal resonator and it can vary significantly with the crystal manufacturer.
HSE oscillator power
consumption
Oscillator
transconductance
(4)
Startup time VDD is stabilized-1-ms
is the startup time measured from the moment it is enabled (by software) to a stabilized 8 MHz oscillation is
OSC
C = 10 pF
= 16 MHz
f
OSC
Startup3.5--mA /V
--
--
2.5 (startup)
0.7 (stabilized)
2.5 (startup)
0.46 (stabilized)
mA
For CL1 and CL2, it is recommended to use high-quality external ceramic capacitors in the
5
pF to 25 pF range (typ.), designed for high-frequency applications, and selected to match
the requirements of the crystal or resonator (see
Figure 16). CL1 and C
are usually the
L2
same size. The crystal manufacturer typically specifies a load capacitance which is the
series combination of C
and CL2. PCB and MCU pin capacitance must be included (10 pF
L1
can be used as a rough estimate of the combined pin and board capacitance) when sizing
C
and CL2. Refer to the application note AN2867 “Oscillator design guide for ST
L1
microcontrollers” available from the ST website www.st.com.
DS10002 Rev 1079/136
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Electrical characteristicsSTM32L151xE STM32L152xE
OSC_OUT
OSC_IN
f
HSE
to core
C
L1
C
L2
R
F
STM32
Resonator
Consumption
control
g
m
R
m
C
m
L
m
C
O
Resonator
ai18235b
Figure 16. HSE oscillator circuit diagram
Low-speed external clock generated from a crystal/ceramic resonator
The low-speed external (LSE) clock can be supplied with a 32.768 kHz crystal/ceramic
resonator oscillator. All the information given in this paragraph are based on
characterization results obtained with typical external components specified in
the application, the resonator and the load capacitors have to be placed as close as
possible to the oscillator pins in order to minimize output distortion and startup stabilization
time. Refer to the crystal resonator manufacturer for more details on the resonator
characteristics (frequency, package, accuracy).
SymbolParameterConditionsMinTypMaxUnit
Table 29. LSE oscillator characteristics (f
= 32.768 kHz)
LSE
Table 29. In
(1)
f
C
I
LSE
R
(2)
LSE
Low speed external oscillator
frequency
Feedback resistor--1.2-MΩ
F
Recommended load capacitance
versus equivalent serial
resistance of the crystal (R
LSE driving currentV
(3)
)
S
DD
--32.768-kHz
RS = 30 kΩ-8 -pF
= 3.3 V, V
IN
= V
--1.1µA
SS
VDD = 1.8 V-450-
I
DD (LSE)
g
t
SU(LSE)
LSE oscillator current
consumption
Oscillator transconductance-3--µA/V
m
(4)
Startup time VDD is stabilized-1-s
= 3.0 V-600-
DD
= 3.6V-750-
V
DD
1. Guaranteed by characterization results.
2. Refer to the note and caution paragraphs below the table, and to the application note AN2867 “Oscillator
design guide for ST microcontrollers”.
3. The oscillator selection can be optimized in terms of supply current using an high quality resonator with
small R
4. t
32.768 kHz oscillation is reached. This value is measured for a standard crystal resonator and it can vary
significantly with the crystal manufacturer.
80/136DS10002 Rev 10
value for example MSIV-TIN32.768kHz. Refer to crystal manufacturer for more details.
S
is the startup time measured from the moment it is enabled (by software) to a stabilized
SU(LSE)
nAV
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STM32L151xE STM32L152xEElectrical characteristics
ai17853b
OSC3 2_ OU T
OSC32_IN
f
LSE
CL1
R
F
STM32L1xx
32.768 kHz
resonator
CL2
Resonator with
integrated capacitors
Bias
controlled
gain
Note:For CL1 and CL2, it is recommended to use high-quality ceramic capacitors in the 5 pF to
15
pF range selected to match the requirements of the crystal or resonator (see Figure 17).
CL1 and C
capacitance which is the series combination of C
Load capacitance CL has the following formula: CL = CL1 x CL2 / (CL1 + CL2) + C
C
is the pin capacitance and board or trace PCB-related capacitance. Typically, it is
stray
are usually the same size. The crystal manufacturer typically specifies a load
L2,
and CL2.
L1
stray
where
between 2 pF and 7 pF.
Caution:To avoid exceeding the maximum value of CL1 and CL2 (15 pF) it is strongly recommended
to use a resonator with a load capacitance C
≤ 7 pF. Never use a resonator with a load
L
capacitance of 12.5 pF.
Example: if the user chooses a resonator with a load capacitance of C
C
= 2 pF, then CL1 = CL2 = 8 pF.
stray
= 6 pF and
L
Figure 17. Typical application with a 32.768 kHz crystal
DS10002 Rev 1081/136
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Electrical characteristicsSTM32L151xE STM32L152xE
6.3.7 Internal clock source characteristics
The parameters given in Tab le 30 are derived from tests performed under the conditions
summarized in Table 13.
High-speed internal (HSI) RC oscillator
SymbolParameterConditionsMinTypMaxUnit
Table 30. HSI oscillator characteristics
f
HSI
TRIM
ACC
t
SU(HSI)
I
DD(HSI)
1. The trimming step differs depending on the trimming code. It is usually negative on the codes which are
multiples of 16 (0x00, 0x10, 0x20, 0x30...0xE0).
2. Guaranteed by characterization results.
3. Guaranteed by test in production.
FrequencyVDD = 3.0 V-16-MHz
HSI user-trimmed
(1)(2)
resolution
Accuracy of the
(2)
factory-calibrated
HSI
HSI oscillator
HSI oscillator
(2)
startup time
HSI oscillator
(2)
power consumption
Trimming code is not a multiple of 16-± 0.40.7%
Trimming code is a multiple of 16--± 1.5%
= 3.0 V, TA = 25 °C-1
V
DDA
= 3.0 V, TA = 0 to 55 °C-1.5-1.5%
V
DDA
= 3.0 V, TA = -10 to 70 °C-2-2%
V
DDA
V
= 3.0 V, TA = -10 to 85 °C-2.5-2%
DDA
= 3.0 V, TA = -10 to 105 °C-4-2%
V
DDA
V
= 1.65 V to 3.6 V
DDA
TA = -40 to 105 °C
(3)
-1
-4-3%
--3.76µs
--100140µA
(3)
Low-speed internal (LSI) RC oscillator
%
Table 31. LSI oscillator characteristics
SymbolParameterMinTypMaxUnit
(1)
f
LSI
D
LSI
t
su(LSI)
I
DD(LSI)
1. Guaranteed by test in production.
2. This is a deviation for an individual part, once the initial frequency has been measured.
1. This is a deviation for an individual part, once the initial frequency has been measured.
2. Guaranteed by characterization results.
µs
-2
-3
-4
MHz
-6
84/136DS10002 Rev 10
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STM32L151xE STM32L152xEElectrical characteristics
6.3.8 PLL characteristics
The parameters given in Tab le 33 are derived from tests performed under the conditions
summarized in Table 13.
SymbolParameter
PLL input clock
f
PLL_IN
f
PLL_OUT
PLL input clock duty cycle45-55%
PLL output clock2-32MHz
PLL lock time
t
LOCK
PLL input = 16 MHz
PLL VCO = 96 MHz
JitterCycle-to-cycle jitter--±
I
(PLL)Current consumption on V
DDA
(PLL)Current consumption on V
I
DD
1. Guaranteed by characterization results.
2. Take care of using the appropriate multiplier factors so as to have PLL input clock values compatible with
the range defined by f
PLL_OUT
Table 33. PLL characteristics
MinTypMax
(2)
DDA
DD
.
2- 24MHz
-115 160 µs
-220 450
-120 150
Val ue
(1)
600ps
Unit
µA
6.3.9 Memory characteristics
The characteristics are given at TA = -40 to 105 °C unless otherwise specified.
RAM memory
SymbolParameter ConditionsMinTypMaxUnit
VRMData retention mode
1. Minimum supply voltage without losing data stored in RAM (in Stop mode or under Reset) or in hardware
registers (only in Stop mode).
Table 34. RAM and hardware registers
(1)
STOP mode (or RESET)1.65--V
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Electrical characteristicsSTM32L151xE STM32L152xE
Flash memory and data EEPROM
SymbolParameter ConditionsMinTypMax
Table 35. Flash memory and data EEPROM characteristics
(1)
Unit
V
t
Operating voltage
DD
Read / Write / Erase
Programming/ erasing
time for byte / word /
prog
double word / half-page
-1.65-3.6V
Erasing-3.283.94
Programming-3.283.94
Average current during
the whole programming /
erase operation
I
DD
Maximum current (peak)
TA = 25 °C, VDD = 3.6 V
during the whole
programming / erase
operation
1. Guaranteed by design.
Table 36. Flash memory and data EEPROM endurance and retention
SymbolParameter Conditions
Cycling (erase / write)
N
CYC
Program memory
(2)
Cycling (erase / write)
T
= -40°C to
A
105 °C
EEPROM data memory
Data retention (program memory) after
10 kcycles at T
Data retention (EEPROM data memory)
after 300 kcycles at T
(2)
t
RET
Data retention (program memory) after
10 kcycles at T
Data retention (EEPROM data memory)
after 300 kcycles at T
1. Guaranteed by characterization results.
2. Characterization is done according to JEDEC JESD22-A117.
= 85 °C
A
= 105 °C
A
= 85 °C
A
= 105 °C
A
T
T
RET
RET
= +85 °C
= +105 °C
ms
-600-µA
-1.52.5mA
Val ue
Unit
Min
10
(1)
Typ M ax
--
kcycles
300
--
30--
30--
years
10--
10--
86/136DS10002 Rev 10
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STM32L151xE STM32L152xEElectrical characteristics
6.3.10 EMC characteristics
Susceptibility tests are performed on a sample basis during device characterization.
Functional EMS (electromagnetic susceptibility)
While a simple application is executed on the device (toggling 2 LEDs through I/O ports).
the device is stressed by two electromagnetic events until a failure occurs. The failure is
indicated by the LEDs:
•Electrostatic discharge (ESD) (positive and negative) is applied to all device pins until
a functional disturbance occurs. This test is compliant with the IEC 61000-4-2 standard.
•FTB: A Burst of Fast Transient voltage (positive and negative) is applied to V
V
through a 100 pF capacitor, until a functional disturbance occurs. This test is
SS
compliant with the IEC 61000-4-4 standard.
A device reset allows normal operations to be resumed.
The test results are given in Tab le 37. They are based on the EMS levels and classes
defined in application note AN1709.
Table 37. EMS characteristics
DD
and
SymbolParameterConditions
= 3.3 V, LQFP144, TA = +25 °C,
V
V
V
FESD
EFTB
Voltage limits to be applied on any I/O pin to
induce a functional disturbance
Fast transient voltage burst limits to be
applied through 100 pF on VDD and V
pins to induce a functional disturbance
SS
DD
f
= 32 MHz
HCLK
conforms to IEC 61000-4-2
V
= 3.3 V, LQFP144, TA = +25 °C,
DD
f
= 32 MHz
HCLK
conforms to IEC 61000-4-4
Level/
Class
Designing hardened software to avoid noise problems
EMC characterization and optimization are performed at component level with a typical
application environment and simplified MCU software. It must be noted that good EMC
performance is highly dependent on the user application and the software in particular.
Therefore it is recommended that the user applies EMC software optimization and
prequalification tests in relation with the EMC level requested for his application.
Software recommendations
The software flowchart must include the management of runaway conditions such as:
•Corrupted program counter
•Unexpected reset
•Critical data corruption (control registers...)
4B
4A
Prequalification trials
Most of the common failures (unexpected reset and program counter corruption) can be
reproduced by manually forcing a low state on the NRST pin or the oscillator pins for 1
second.
DS10002 Rev 1087/136
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Electrical characteristicsSTM32L151xE STM32L152xE
To complete these trials, ESD stress can be applied directly on the device, over the range of
specification values. When unexpected behavior is detected, the software can be hardened
to prevent unrecoverable errors occurring (see application note AN1015).
Electromagnetic Interference (EMI)
The electromagnetic field emitted by the device are monitored while a simple application is
executed (toggling 2 LEDs through the I/O ports). This emission test is compliant with
IEC
61967-2 standard which specifies the test board and the pin loading.
Table 38. EMI characteristics
Max vs. frequency range
Symbol ParameterConditions
= 3.6 V,
V
DD
Monitored
frequency band
0.1 to 30 MHz-14-6-4
TA = 25 °C,
S
EMI
Peak level
LQFP144 package
compliant with IEC
61967-2
130 MHz to 1GHz-7-19
SAE EMI Level122.5-
6.3.11 Electrical sensitivity characteristics
Based on three different tests (ESD, LU) using specific measurement methods, the device is
stressed in order to determine its performance in terms of electrical sensitivity.
Electrostatic discharge (ESD)
Electrostatic discharges (a positive then a negative pulse separated by 1 second) are
applied to the pins of each sample according to each pin combination. The sample size
depends on the number of supply pins in the device (3 parts × (n+1) supply pins). This test
conforms to the JESD22-A114, ANSI/ESD STM5.3.1. standard.
SymbolRatingsConditionsClass
Table 39. ESD absolute maximum ratings
4 MHz
voltage
range 3
16 MHz
voltage
range 2
32 MHz
voltage
range 1
Maximum
(1)
value
Unit
dBµV30 to 130 MHz-1109
Unit
Electrostatic
V
ESD(HBM)
discharge voltage
(human body model)
Electrostatic
V
ESD(CDM)
discharge voltage
(charge device model)
1. Guaranteed by characterization results.
= +25 °C, conforming
T
A
to JESD22-A114
= +25 °C, conforming
T
A
to ANSI/ESD STM5.3.1.
88/136DS10002 Rev 10
LQFP144
and
WLCSP104
packages
packages
except
LQFP144
and
WLCSP104
22000V
C3250
V
C4500
Page 89
STM32L151xE STM32L152xEElectrical characteristics
Static latch-up
Two complementary static tests are required on six parts to assess the latch-up
performance:
•A supply overvoltage is applied to each power supply pin
•A current injection is applied to each input, output and configurable I/O pin
These tests are compliant with EIA/JESD 78A IC latch-up standard.
SymbolParameterConditionsClass
Table 40. Electrical sensitivities
LUStatic latch-up classT
= +105 °C conforming to JESD78AII level A
A
6.3.12 I/O current injection characteristics
As a general rule, current injection to the I/O pins, due to external voltage below VSS or
above V
in order to give an indication of the robustness of the microcontroller in cases when
abnormal injection accidentally happens, susceptibility tests are performed on a sample
basis during device characterization.
Functional susceptibility to I/O current injection
While a simple application is executed on the device, the device is stressed by injecting
current into the I/O pins programmed in floating input mode. While current is injected into
the I/O pin, one at a time, the device is checked for functional failures.
The failure is indicated by an out of range parameter: ADC error above a certain limit (higher
than 5 LSB TUE), out of conventional limits of induced leakage current on adjacent pins (out
of –5 µA/+0 µA range), or other functional failure (for example reset occurrence oscillator
frequency deviation, LCD levels).
The test results are given in the Tab le 41.
SymbolDescription
I
INJ
1. It is recommended to add a Schottky diode (pin to ground) to analog pins which may potentially inject
negative currents.
2. Injection is not possible.
(for standard pins) must be avoided during normal product operation. However,
DD
Table 41. I/O current injection susceptibility
Injected current on all 5 V tolerant (FT) pins-5
Injected current on any other pin-5
Functional susceptibility
Negative
injection
(1)
(1)
Positive
injection
(2)
NA
(2)
+5
Unit
mAInjected current on BOOT0-0NA
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Electrical characteristicsSTM32L151xE STM32L152xE
6.3.13 I/O port characteristics
General input/output characteristics
Unless otherwise specified, the parameters given in Tab le 48 are derived from tests
performed under the conditions summarized in Table 13. All I/Os are CMOS and TTL
compliant.
SymbolParameterConditionsMinTyp
V
V
V
I
Input low level voltage
IL
Input high level voltage
IH
I/O Schmitt trigger voltage
hys
hysteresis
Input leakage current
lkg
(2)
Table 42. I/O static characteristics
TC and FT I/O--0.3 V
BOOT0--0.14 V
(4)
TC I/O0.45 V
FT I/O0.39 V
BOOT00.15 V
TC and FT I/O-10% V
BOOT0- 0.01-
V
≤ V
IN
≤ V
DD
SS
I/Os with LCD
≤ V
V
SS
IN
≤ V
DD
I/Os with analog
switches
V
≤ V
IN
≤ V
DD
SS
I/Os with analog
switches and LCD
V
≤ V
IN
≤ V
DD
SS
I/Os with USB
DD
DD
DD
+0.38
+0.59
+0.56
(2)
(2)
(2)
--
--
--
(3)
DD
MaxUnit
(1)(2)
DD
(2)
DD
V
-
--±50
--±50
--±50
nA
--±250
V
≤ V
FT I/O
≤ V
V
IN
V
IN
IN
= V
= V
IN
≤ V
≤ 5V
SS
DD
DD
--±50
--±10µA
254565kΩ
254565kΩ
SS
TC and FT I/Os
V
DD
R
R
C
1. Guaranteed by test in production.
2. Guaranteed by design.
3. With a minimum of 200 mV.
4. The max. value may be exceeded if negative current is injected on adjacent pins.
5. Pull-up and pull-down resistors are designed with a true resistance in series with a switchable PMOS/NMOS. This
MOS/NMOS contribution to the series resistance is minimum (~10% order).
Weak pull-up equivalent
PU
PD
IO
(5)(1)
resistor
Weak pull-down equivalent
(5)
resistor
I/O pin capacitance--5-pF
90/136DS10002 Rev 10
Page 91
STM32L151xE STM32L152xEElectrical characteristics
Output driving current
The GPIOs (general purpose input/outputs) can sink or source up to ±8 mA, and sink or
source up to ±20
mA with the non-standard VOL/V
specifications given in Tab le 43.
OH
In the user application, the number of I/O pins which can drive current must be limited to
respect the absolute maximum rating specified in
•The sum of the currents sourced by all the I/Os on V
consumption of the MCU sourced on V
I
(see Tab l e 11 ).
VDD(Σ)
•The sum of the currents sunk by all the I/Os on V
consumption of the MCU sunk on V
I
(see Table 11).
VSS(Σ)
SS
Section 6.2:
plus the maximum Run
cannot exceed the absolute maximum rating
DD,
DD,
plus the maximum Run
SS
cannot exceed the absolute maximum rating
Output voltage levels
Unless otherwise specified, the parameters given in Tab le 43 are derived from tests
performed under the conditions summarized in Table 13. All I/Os are CMOS and TTL
compliant.
SymbolParameterConditionsMinMaxUnit
(1)(2)
V
OL
V
OH
V
OL
V
OH
V
OL
V
OH
1. The IIO current sunk by the device must always respect the absolute maximum rating specified in Table 11
and the sum of IIO (I/O ports and control pins) must not exceed I
2. Guaranteed by test in production.
3. The IIO current sourced by the device must always respect the absolute maximum rating specified in
Table 11 and the sum of IIO (I/O ports and control pins) must not exceed I
4. Guaranteed by characterization results.
Output low level voltage for an I/O pin
(2)(3)
Output high level voltage for an I/O pinVDD-0.4-
(3)(4)
Output low level voltage for an I/O pin
(3)(4)
Output high level voltage for an I/O pinVDD-0.45-
(1)(4)
Output low level voltage for an I/O pin
(3)(4)
Output high level voltage for an I/O pinVDD-1.3-
Table 43. Output voltage characteristics
I
= 8 mA
IO
2.7 V < VDD < 3.6 V
I
= 4 mA
IO
1.65 V < VDD < 3.6 V
I
= 20 mA
IO
VSS
< 3.6 V
DD
.
VDD
.
2.7 V < V
-0.4
-0.45
V
-1.3
DS10002 Rev 1091/136
114
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Electrical characteristicsSTM32L151xE STM32L152xE
Input/output AC characteristics
The definition and values of input/output AC characteristics are given in Figure 18 and
Tabl e 44, respectively.
Unless otherwise specified, the parameters given in Tab le 44 are derived from tests
performed under the conditions summarized in Table 13.
Table 44. I/O AC characteristics
(1)
OSPEEDRx
[1:0] bit
(1)
value
00
01
10
11
SymbolParameterConditionsMin Max
f
max(IO)out
t
f(IO)out
t
r(IO)out
f
max(IO)out
t
f(IO)out
t
r(IO)out
F
max(IO)out
t
f(IO)out
t
r(IO)out
F
max(IO)out
t
f(IO)out
t
r(IO)out
Maximum frequency
(3)
Output rise and fall time
Maximum frequency
(3)
Output rise and fall time
Maximum frequency
(3)
Output rise and fall time
Maximum frequency
(3)
Output rise and fall time
CL = 50pF, V
= 50pF, V
C
L
C
= 50pF, V
L
= 50pF, V
C
L
CL = 50pF, V
= 50pF, V
C
L
CL = 50pF, V
= 50pF, V
C
L
CL = 50 pF, V
= 50pF, V
C
L
C
= 50pF, V
L
= 50pF, V
C
L
CL = 30 pF, V
= 50pF, V
C
L
C
= 30pF, V
L
C
= 50pF, V
L
= 2.7 V to 3.6 V-400
DD
= 1.65 V to 2.7 V-400
DD
= 2.7 V to 3.6 V-625
DD
= 1.65 V to 2.7 V-625
DD
= 2.7 V to 3.6 V-2
DD
= 1.65 V to 2.7 V-1
DD
= 2.7 V to 3.6 V-125
DD
= 1.65 V to 2.7 V-250
DD
= 2.7 V to 3.6 V-10
DD
= 1.65 V to 2.7 V-2
DD
= 2.7 V to 3.6 V-25
DD
= 1.65 V to 2.7 V-125
DD
= 2.7 V to 3.6 V-50
DD
= 1.65 V to 2.7 V-8
DD
= 2.7 V to 3.6 V-5
DD
= 1.65 V to 2.7 V-30
DD
(2)
MHz
MHz
MHz
Pulse width of external
-t
EXTIpw
signals detected by the
-8-
EXTI controller
1. The I/O speed is configured using the OSPEEDRx[1:0] bits. Refer to the STM32L151xx, STM32L152xx and STM32L162xx
reference manual for a description of GPIO Port configuration register.
2. Guaranteed by design.
3. The maximum frequency is defined in Figure 18.
Unit
kHz
ns
ns
ns
ns
92/136DS10002 Rev 10
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STM32L151xE STM32L152xEElectrical characteristics
ai14131c
10%
90%
50%
t
r(IO)out
OUTPUT
EXTERNAL
ON 50pF
Maximum frequency is achieved if (tr + tf) ≤ 2/3)T and if the duty cycle is (45-55%)
10%
50%
90%
when loaded by 50pF
T
t
f(IO)out
Figure 18. I/O AC characteristics definition
6.3.14 NRST pin characteristics
The NRST pin input driver uses CMOS technology. It is connected to a permanent pull-up
resistor, R
Unless otherwise specified, the parameters given in Tab le 45 are derived from tests
performed under the conditions summarized in Table 13.
(see Tab le 45)
PU
Table 45. NRST pin characteristics
SymbolParameterConditionsMinTypMaxUnit
NRST input low level
V
IL(NRST)
V
IH(NRST)
V
OL(NRST)
V
hys(NRST)
V
F(NRST)
V
NF(NRST)
1. Guaranteed by design.
2. With a minimum of 200 mV.
3. The pull-up is designed with a true resistance in series with a switchable PMOS. This PMOS contribution to the series
resistance is around 10%.
(1)
voltage
NRST input high
(1)
level voltage
NRST output low
(1)
2.7 V < V
level voltage
1.65 V < V
NRST Schmitt trigger
(1)
voltage hysteresis
R
PU
Weak pull-up
equivalent resistor
NRST input filtered
(1)
(3)
pulse
NRST input not
(3)
filtered pulse
---0.3 V
-0.39V
IOL = 2 mA
< 3.6 V
DD
= 1.5 mA
I
OL
< 2.7 V
DD
--10%V
V
= V
IN
SS
+0.59--
DD
--
--
(2)
DD
254565kΩ
DD
0.4
-mV
---50ns
-350--ns
V
DS10002 Rev 1093/136
114
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Electrical characteristicsSTM32L151xE STM32L152xE
ai17854b
STM32L1xx
R
PU
NRST
(2)
V
DD
Filter
Internal reset
0.1 μF
External reset circuit(1)
Figure 19. Recommended NRST pin protection
1. The reset network protects the device against parasitic resets. 0.1 uF capacitor must be placed as close as
possible to the chip.
2. The user must ensure that the level on the NRST pin can go below the V
Table 45. Otherwise the reset is not taken into account by the device.
max level specified in
IL(NRST)
6.3.15 TIM timer characteristics
The parameters given in the Table 46 are guaranteed by design.
Refer to Section 6.3.13: I/O port characteristics for details on the input/output ction
characteristics (output compare, input capture, external clock, PWM output).
Table 46. TIMx
(1)
characteristics
SymbolParameterConditionsMinMaxUnit
-1-t
t
res(TIM)
f
EXT
Res
t
COUNTER
Timer resolution time
f
Timer external clock
frequency on CH1 to CH4
Timer resolution--16bit
TIM
f
TIMxCLK
16-bit counter clock
= 32 MHz 31.25-ns
TIMxCLK
-0f
TIMxCLK
= 32 MHz016MHz
-165536t
period when internal clock
is selected (timer’s
prescaler disabled)
f
TIMxCLK
= 32 MHz 0.03122048µs
/2MHz
--65536 × 65536t
t
MAX_COUNT
1. TIMx is used as a general term to refer to the TIM2, TIM3 and TIM4 timers.
Maximum possible count
f
TIMxCLK
= 32 MHz-134.2s
TIMxCLK
TIMxCLK
TIMxCLK
94/136DS10002 Rev 10
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STM32L151xE STM32L152xEElectrical characteristics
6.3.16 Communications interfaces
I2C interface characteristics
2
The device
protocol with the following restrictions: SDA and SCL are not “true” open-drain I/O pins.
When configured as open-drain, the PMOS connected between the I/O pin and V
disabled, but is still present.
The I2C characteristics are described in Tab le 47. Refer also to Section 6.3.13: I/O port
characteristics
I
C interface meets the requirements of the standard I2C communication
for more details on the input/output ction characteristics (SDA and SCL)
Table 47. I2C characteristics
DD
is
.
SymbolParameter
t
w(SCLL)
t
w(SCLH)
t
su(SDA)
t
h(SDA)
t
r(SDA)
t
r(SCL)
t
f(SDA)
t
f(SCL)
t
h(STA)
t
su(STA)
t
su(STO)
t
w(STO:STA)
C
SCL clock low time4.7-1.3 -
SCL clock high time4.0-0.6 -
SDA setup time250-100 -
SDA data hold time-3450
SDA and SCL rise time-1000-300
SDA and SCL fall time-300-300
Start condition hold time4.0-0.6-
Repeated Start condition
setup time
Stop condition setup time4.0-0.6 -μs
Stop to Start condition time
(bus free)
Capacitive load for each bus
b
line
Standard mode
I2C
(1)(2)
Fast mode I2C
(1)(2)
Unit
MinMaxMinMax
(3)
-900
(3)
4.7- 0.6 -
4.7-1.3-μs
-400-400pF
µs
ns
µs
Pulse width of spikes that
t
SP
are suppressed by the
050
(4)
050
(4)
analog filter
Guaranteed by design.
1.
2. f
3.
4. The minimum width of the spikes filtered by the analog filter is above t
must be at least 2 MHz to achieve standard mode I²C frequencies. It must be at least 4 MHz to
PCLK1
achieve fast mode I²C frequencies. It must be a multiple of 10 MHz to reach the 400 kHz maximum I²C fast
mode clock.
The maximum Data hold time has only to be met if the interface does not stretch the low period of SCL
signal.
.
SP(max)
DS10002 Rev 1095/136
ns
114
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Electrical characteristicsSTM32L151xE STM32L152xE
ai17855c
START
SDA
R
S
R
P
I
2
C bus
R
P
R
S
V
DD_I2C
V
DD_I2C
STM32L1xx
SDA
SCL
t
f(SDA)
t
r(SDA)
SCL
t
h(STA)
t
w(SCKH)
t
w(SCKL)
t
su(SDA)
t
r(SCK)
t
f(SCK)
t
h(SDA)
START REPEATED
START
t
su(STA)
t
su(STO)
STOP
t
su(STA:STO)
Figure 20. I2C bus AC waveforms and measurement circuit
1. RS = series protection resistor.
= external pull-up resistor.
2. R
P
3. V
4.
is the I2C bus power supply.
DD_I2C
Measurement points are done at CMOS levels: 0.3V
Table 48. SCL frequency (f
PCLK1
and 0.7V
DD
DD.
= 32 MHz, VDD = V
DD_I2C
= 3.3 V)
(1)(2)
I2C_CCR value
f
(kHz)
SCL
R
= 4.7 kΩ
P
4000x801B
3000x8024
2000x8035
1000x00A0
500x0140
200x0320
1. RP = External pull-up resistance, f
2. For speeds around 200 kHz, the tolerance on the achieved speed is of ±5%. For other speed ranges, the
tolerance on the achieved speed is ±2%. These variations depend on the accuracy of the external
components used to design the application.
SCL
= I2C speed.
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STM32L151xE STM32L152xEElectrical characteristics
SPI characteristics
Unless otherwise specified, the parameters given in the following table are derived from
tests performed under the conditions summarized in
Refer to Section 6.3.12: I/O current injection characteristics for more details on the
input/output alternate function characteristics (NSS, SCK, MOSI, MISO).
SymbolParameterConditionsMinMax
f
1/t
t
r(SCK)
t
f(SCK)
SCK
c(SCK)
SPI clock frequency
(2)
SPI clock rise and fall timeCapacitive load: C = 30 pF- 6ns