ST MICROELECTRONICS STE40NC60 Datasheet

STE40NC60
N-CHANNEL 600V - 0.098- 40A ISOTOP
PowerMesh™II MOSFET
TYPE V
STE40NC60 600V < 0.13 40 A
n
TYPICAL RDS(on) = 0.098
EXTREMELY HIGH dv /d t C APABILITY
n
100% AVALANCHE TESTED
n
NEW HIGH VOLTAGE BENCHMARK
n
GATE CHARGE MINIMIZED
DSS
R
DS(on)
I
D
DESCRIPTION
The PowerMESH generation of MESH OVERLAY
II is the evolution of the first
™. The layout re-
finements introduced greatly improve the Ron*area figure of merit while keeping the device at the lea d­ing edge for what concerns swithing speed, gate charge and ruggedness.
APPLICATIONS
n
HIGH CURRENT, HIGH SPEED SWITCHING
n
SWITH MODE POWER SUPPLI ES (SMPS)
n
DC-AC CONVERTERS FOR WELDING EQUIPMENT AND UNINTERRUPTIBLE POWER SUPPLIES AND MOTOR DRIVER
ISOTOP
INTERNAL SCHEMATIC DIAGRAM
ABSOLUTE MAXIMUM RATINGS
Symbol Parameter Value Unit
V
DS
V
DGR
V
GS
I
D
I
D
I
DM
P
TOT
dv/dt (1) Peak Diode Recovery voltage slope 3 V/ns
V
ISO
T
stg
T
j
(•)Pu l se width limite d by safe operat i ng area
Drain-source Voltage (VGS = 0) Drain-gate Voltage (RGS = 20 k) Gate- source Voltage ±30 V
Drain Current (continuos) at TC = 25°C Drain Current (continuos) at TC = 100°C
(l)
Drain Current (pulsed) 160 A Total Dissipation at TC = 25°C Derating Factor 3.68 W/°C
Insulation Winthstand Voltage (AC-RMS) 2500 V Storage Temperature –65 to 150 °C Max. Operating Junction Temperature 150 °C
(1) ISD≤ 40A, di/dt100 A/µs, VDD≤ 24V, TjT
600 V 600 V
40 A 23 A
460 W
jMAX
1/8May 2002
STE40NC60
THERMA L D ATA
Rthj-case Thermal Resistance Junction-case Max 0.272 °C/W
Rthc-h Thermal Resistance Case-heatsink with Conduct ive
Grease Applied
AVALANCHE CHARACTERISTICS
Symbol Parameter Max Value Unit
I
AR
E
AS
Avalanche Current, Repetitive or Not-Repetitive (pulse width limited by T
max)
j
Single Pulse Avalanche Energy (starting T
= 25 °C, ID = IAR, VDD = 50 V)
j
ELECTRICAL CHARACTERISTICS (TCASE = 25 °C UNLESS OTHERWISE SPECIFIED) OFF
Symbol Parameter Test Conditions Min. Typ. Max. Unit
V
(BR)DSS
I
DSS
I
GSS
Drain-source Breakdown Voltage
Zero Gate Voltage Drain Current (V
GS
Gate-body Leakage Current (V
DS
= 0)
= 0)
ID = 250 µA, VGS = 0 600 V
V
= Max Rating
DS
VDS = Max Rating, TC = 125 °C V
= ± 30V ±100 nA
GS
0.05 °C/W
40 A
1150 mJ
10 µA
100 µA
ON
(1)
Symbol Parameter Test Conditions Min. Typ. Max. Unit
V
V
GS(th)
R
DS(on)
Gate Threshold Voltage Static Drain-source On
= VGS, ID = 250µA
DS
VGS = 10V, ID = 20A
234V
0.098 0.130
Resistance
DYNAMIC
Symbol Parameter Test Conditions Min. Typ. Max. Unit
(1) Forward Transconductance VDS > I
g
fs
ID= 15 A
C
iss
C
oss
C
rss
Input Capacitance Output Capacitance 1190 pF Reverse Transfer
V
Capacitance
Note: 1. Pulsed: Pu l se duration = 300 µs, duty cycle 1.5 %.
DS
D(on)
x R
DS(on)max,
= 25V, f = 1 MHz, VGS = 0
42 S
11.1 nF
100 pF
2/8
STE40NC60
ELECTRICAL CHARACTERISTICS (CONTINUED)
SWITCHING ON
Symbol Parameter Test Conditions Min. Typ. Max. Unit
V
t
d(on)
Q
Q
Q
t
r
gs
gd
Turn-on Delay Time Rise Time 42 ns Total Gate Charge
g
Gate-Source Charge 48 nC Gate-Drain Charge 146.5 nC
SWITCHING OFF
Symbol Param eter Test Conditions Min. Typ. Max. U nit
t
r(Voff)
t
t
f
c
Off-voltage Rise Time Fall Time 26 ns Cross-over Time 74 ns
SOURCE DRAIN DIODE
Symbol Parameter Test Conditions Min. Typ. Max. Unit
I
SD
I
SDM
VSD (1)
t
rr
Q
rr
I
RRM
Note: 1. Pulsed: Pulse duration = 300 µ s, duty cycle 1.5 %.
2. Pulse width limi ted by safe ope rating area.
(2)
Source-drain Current 40 A Source-drain Current (pulsed) 160 A Forward On Voltage Reverse Recovery Time
Reverse Recovery Charg e 15 µC Reverse Recovery Curren t 44 A
= 300 V, ID = 20 A
DD
RG= 4.7 VGS = 10V (see test circuit, Figure 3)
V
= 480V, ID = 40A,
DD
V
= 10V
GS
V
= 480V, ID = 40A,
DD
RG= 4.7Ω, V
GS
= 10V
(see test circuit, Figure 5)
ISD = 40A, VGS = 0 I
= 40 A, di/dt = 100 A/µs,
SD
V
= 40 V, Tj = 150 °C
DD
(see test circuit, Figure 5)
49 ns
307.5 430 nC
41 ns
1.6 V
685 ns
Safe Operating Area Thermal Impedence
3/8
STE40NC60
Output Characteristics
Transconductance
Transfer Characteristics
Static Drain-source On Resistance
4/8
Capacitance VariationsGate Charge vs Gate-source Voltage
STE40NC60
Normalized Gate Thereshold Voltage vs Temp.
Source-drain Diode Forward Characteristics
Normalized On Resistance vs Temperature
5/8
STE40NC60
Fig. 2: Unclamped Inductive WaveformFig. 1: Unclamped Inductive Load Test Circuit
Fig. 3: Switching Times Test Circuit For
Resistive Load
Fig. 5: Test Circuit For Inductive Load Switching And Diode Recovery Times
Fig. 4: Gate Charge test Circuit
6/8
ISOTOP MECHANICAL DATA
STE40NC60
DIM.
MIN. TYP. MAX. MIN. TYP. MAX.
A 11.8 12.2 0.466 0.480 B 8.9 9.1 0.350 0.358 C 1.95 2.05 0.076 0.080 D 0.75 0.85 0.029 0.033 E 12.6 12.8 0.496 0.503 F 25.15 25.5 0.990 1.003 G 31.5 31.7 1.240 1.248 H4 0.157
J 4.1 4.3 0.161 0.169 K 14.9 15.1 0.586 0.594 L 30.1 30.3 1.185 1.193
M 37.8 38.2 1.488 1.503 N4 0.157 O 7.8 8.2 0.307 0.322
mm inch
G
A
N
O
B
D
E
F
H
J
C
K L
M
7/8
STE40NC60
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