STD4NK50ZD - STD4NK50ZD-1
STF4NK50ZD - STP4NK50ZD
N-channel 500V - 2.4Ω - 3A - TO-220 - TO-220FP- DPAK - IPAK Fast diode SuperMESH™ Power MOSFET
General features |
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Type |
VDSS |
RDS(on) |
ID |
Pw |
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3 |
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STD4NK50ZD-1 |
500V |
<2.7Ω |
3A |
45W |
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1 |
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STD4NK50ZD |
500V |
<2.7Ω |
3A |
45W |
3 |
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DPAK |
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2 |
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1 |
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STF4NK50ZD |
500V |
<2.7Ω |
3A |
20W |
TO-220 |
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STP4NK50ZD |
500V |
<2.7Ω |
3A |
45W |
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■ |
100% avalanche tested |
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■ Extremely high dv/dt capability |
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3 |
3 |
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2 |
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2 |
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Gate charge minimized |
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1 |
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■ |
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IPAK |
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TO-220FP |
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■Very low intrinsic capacitances
■Very good manufacturing repeability
Description |
Internal schematic diagram |
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The fast SuperMESH™ series associates all advantages of reduced on-resistance, zener gate protection and outstanding dc/dt capability with a Fast body-drain recovery diode. Such series complements the FDmesh™ advanced tecnology.
Applications
■ Switching application
Order codes
Part number |
Marking |
Package |
Packaging |
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STD4NK50ZD-1 |
D4NK50ZD-1 |
IPAK |
Tube |
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STD4NK50ZD |
D4NK50ZD |
DPAK |
Tape & reel |
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STF4NK50ZD |
F4NK50ZD |
TO-220FP |
Tube |
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STP4NK50ZD |
P4NK50ZD |
TO-220 |
Tube |
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April 2006 |
Rev 3 |
1/17 |
www.st.com
Contents |
STD4NK50ZD - STD4NK50ZD-1 - STF4NK50ZD - STP4NK50ZD |
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Contents
1 |
Electrical ratings . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . |
. 3 |
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2 |
Electrical characteristics . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . |
5 |
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2.1 |
Electrical characteristics (curves) . . . . . . . . . . . . . . . . . . . . . . . . . . . . |
6 |
3 |
Test circuit . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . |
10 |
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4 |
Package mechanical data . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . |
11 |
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5 |
Packaging mechanical data . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . |
16 |
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6 |
Revision history . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . |
17 |
2/17
STD4NK50ZD - STD4NK50ZD-1 - STF4NK50ZD - STP4NK50ZD |
Electrical ratings |
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Table 1. |
Absolute maximum ratings |
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Value |
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Symbol |
Parameter |
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Unit |
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TO-220 |
IPAK/DPAK |
TO-220FP |
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VDS |
Drain-source voltage (VGS = 0) |
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500 |
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V |
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VDGR |
Drain-gate voltage (RGS = 20KΩ) |
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500 |
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V |
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VGS |
Gate-source voltage |
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± 30 |
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V |
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ID |
Drain current (continuous) at TC = 25°C |
3 |
3 (1) |
3 (1) |
A |
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ID |
Drain current (continuous) at TC=100°C |
1.9 |
1.9 (1) |
1.9 (1) |
A |
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(2) |
Drain current (pulsed) |
12 |
12 (1) |
12 (1) |
A |
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IDM |
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PTOT |
Total dissipation at TC = 25°C |
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45 |
20 |
W |
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Derating factor |
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0.36 |
0.16 |
W/°C |
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VESD(G-D) |
Gate source ESD(HBM-C=100pF, R=1.5KΩ) |
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2800 |
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V |
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dv/dt(3) |
Peak diode recovery voltage slope |
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15 |
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V/ns |
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VISO |
Insulation withstand voltage (DC) |
-- |
-- |
2500 |
V |
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TJ |
Operating junction temperature |
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-55 to 150 |
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°C |
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Tstg |
Storage temperature |
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1.Limited only by maximum temperature allowed
2.Pulse width limited by safe operating area
3.ISD ≤3A, di/dt ≤200A/µs, VDD =80%V(BR)DSS
Table 2. |
Thermal resistance |
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Value |
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Symbol |
Parameter |
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Unit |
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TO-220 |
IPAK/DPAK |
TO-220FP |
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Rthj-case |
Thermal resistance junction-case Max |
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2.78 |
6.25 |
°C/W |
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Rthj-a |
Thermal resistance junction-ambient Max |
62.5 |
100 |
62.5 |
°C/W |
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Tl |
Maximum lead temperature for soldering |
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300 |
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°C |
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purpose |
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Table 3. |
Avalanche data |
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Symbol |
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Parameter |
Value |
Unit |
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IAR |
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Avalanche current, repetitive or not-repetitive |
3 |
A |
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(pulse width limited by Tj Max) |
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EAS |
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Single pulse avalanche energy |
120 |
mJ |
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(starting Tj=25°C, Id=Iar, Vdd=50V) |
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3/17
Electrical characteristics |
STD4NK50ZD - STD4NK50ZD-1 - STF4NK50ZD - STP4NK50ZD |
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(TCASE=25°C unless otherwise specified) |
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Table 4. |
On/off states |
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Symbol |
Parameter |
Test condictions |
Min. |
Typ. |
Max. |
Unit |
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V(BR)DSS |
Drain-source breakdown |
ID = 1mA, VGS= 0 |
500 |
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V |
voltage |
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IDSS |
Zero gate voltage drain |
VDS = Max rating, |
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1 |
µA |
current (VGS = 0) |
VDS = Max rating @125°C |
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50 |
µA |
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IGSS |
Gate body leakage current |
VGS = ±20V |
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±10 |
µA |
(VDS = 0) |
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VGS(th) |
Gate threshold voltage |
VDS= VGS, ID = 50µA |
2.5 |
3.5 |
4.5 |
V |
RDS(on) |
Static drain-source on |
VGS= 10V, ID= 1.5A |
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2.3 |
2.7 |
Ω |
resistance |
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Table 5. |
Dynamic |
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Symbol |
Parameter |
Test condictions |
Min. |
Typ. |
Max. |
Unit |
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g (1) |
Forward transconductance |
VDS =15V, ID = 1.5A |
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1.5 |
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S |
fs |
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Ciss |
Input capacitance |
VDS = 25V, f = 1 MHz, |
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310 |
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pF |
Coss |
Output capacitance |
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49 |
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pF |
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Crss |
Reverse transfer |
VGS= 0 |
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10 |
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pF |
capacitance |
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(2) |
Equivalent output |
VGS= 0, VDS =0V to 400V |
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33 |
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pF |
Coss eq . |
capacitance |
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Qg |
Total gate charge |
VDD= 400V, ID = 3A |
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12 |
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nC |
Qgs |
Gate-source charge |
VGS =10V |
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3 |
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nC |
Qgd |
Gate-drain charge |
(see Figure 11) |
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7 |
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nC |
1.Pulsed: pulse duration=300µs, duty cycle 1.5%
2.Coss eq. is defined as a constant equivalent capacitance giving the same charging time as Coss when VDS inceases from 0 to 80% VDSS
Table 6. |
Switching times |
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Symbol |
Parameter |
Test condictions |
Min. |
Typ. |
Max. |
Unit |
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td(on) |
Turn-on delay time |
VDD = 250 V, ID= 1.5A, |
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9.5 |
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ns |
tr |
Rise time |
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15.5 |
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ns |
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RG = 4.7Ω, VGS =10V |
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td(off) |
Turn-off delay time |
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23 |
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ns |
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(see Figure 18) |
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tf |
Fall time |
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22 |
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ns |
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4/17
STD4NK50ZD - STD4NK50ZD-1 - STF4NK50ZD - STP4NK50ZD |
Electrical characteristics |
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Table 7. |
Source drain diode |
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Symbol |
Parameter |
Test condictions |
Min |
Typ. |
Max |
Unit |
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ISD |
Source-drain current |
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3 |
A |
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(1) |
Source-drain current (pulsed) |
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12 |
A |
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ISDM |
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(2) |
Forward on voltage |
ISD = 3A, VGS=0 |
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1.6 |
V |
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VSD |
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trr |
Reverse recovery time |
ISD = 3A, |
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73 |
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Qrr |
Reverse recovery charge |
di/dt = 100A/µs, |
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140 |
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nC |
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IRRM |
Reverse recovery current |
VDD = 34V, Tj = 25°C |
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3.82 |
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A |
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trr |
Reverse recovery time |
ISD = 3A, |
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118 |
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Qrr |
Reverse Recovery Charge |
di/dt = 100A/µs, |
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260 |
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nC |
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IRRM |
Reverse recovery current |
VDD = 34V, Tj = 150°C |
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4.4 |
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A |
1.Pulse width limited by safe operating area
2.Pulsed: pulse duration=300µs, duty cycle 1.5%
Table 8. |
Gate-source zener diode |
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Symbol |
Parameter |
Test condictions |
Min. |
Typ. |
Max |
Unit |
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(1) |
Gate-source braekdown |
IGS = ±1mA (open drain) |
30 |
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V |
BVGSO |
voltage |
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1. The built-in back-to-back Zener diodes have specifically been designed to enhance not only the device’s ESD capability, but also to make them safely absorb possible voltage transients that may occasionally be applied from gate to source. In this respect the Zener voltage is appropriate to achieve an efficient and cost-effective intervention to protect the device’s integrity. These integrated Zener diodes thus avoid the usage of external components.
5/17
Electrical characteristics |
STD4NK50ZD - STD4NK50ZD-1 - STF4NK50ZD - STP4NK50ZD |
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Figure 1. Safe operating area for TO-220 |
Figure 2. Thermal impedance for TO-220 |
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Figure 3. Safe operating areafor TO-220FP |
Figure 4. Thermal impedance for TO-220FP |
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Figure 5. Safe operating area for DPAK/IPAK Figure 6. Thermal impedance for DPAK/IPAK
6/17