STMicroelectronics STP3NK80Z, STF3NK80Z, STD3NK80Z, STD3NK80Z-1 Technical data

N-channel 800V - 3.8Ω - 2.5A - TO-220/TO-220FP/DPAK/IPAK
Zener-protected SuperMESH™ Power MOSFET
General features
V
Type
STP3NK80Z 800 V < 4.5 2.5 A
STF3NK80Z 800 V < 4.5 2.5 A
STD3NK80Z 800 V < 4.5 2.5 A
STD3NK80Z-1 800 V < 4.5 2.5 A
DSS
(@Tjmax)
R
DS(on)
STP3NK80Z - STF3NK80Z
STD3NK80Z - STD3NK80Z-1
I
D
3
2
1
TO-220FPTO-220
Extremely high dv/dt capability
Gate charge minimized
Very low intrinsic capacitances
Very good manufacturing repeatibility
Description
The SuperMESH™ series is obtained through an extreme optimization of ST’s well established strip-based PowerMESH™ layout. In addition to pushing on-resistance significantly down, special care is taken to ensure a very good dv/dt capability for the most demanding applications. Such series complements ST full range of high voltage MOSFETs including revolutionary MDmesh™ products.
Applications
Switching application
3
1
IPAKDPAK
Internal schematic diagram
3
2
1
Order codes
Part number Marking Package Packaging
STP3NK80Z P3NK80Z TO-220 Tube
STF3NK80Z F3NK80Z TO-220FP Tube
STD3NK80ZT4 D3NK80Z DPAK Tape & reel
STD3NK80Z-1 D3NK80Z IPAK Tube
August 2006 Rev 4 1/18
www.st.com
18
Contents STP3NK80Z - STF3NK80Z - STD3NK80Z - STD3NK80Z-1
Contents
1 Electrical ratings . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 3
1.1 Protection features of gate-to-source zener diodes . . . . . . . . . . . . . . . . . . 4
2 Electrical characteristics . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 5
2.1 Electrical characteristics (curves) . . . . . . . . . . . . . . . . . . . . . . . . . . . . 7
3 Test circuit . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 10
4 Package mechanical data . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 11
5 Packing mechanical data . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 16
6 Revision history . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 17
2/18
STP3NK80Z - STF3NK80Z - STD3NK80Z - STD3NK80Z-1 Electrical ratings

1 Electrical ratings

Table 1. Absolute maximum ratings

Symbol Parameter Value Unit
V
I
P
V
DGR
V
DM
Drain-source voltage (VGS = 0) 800 V
DS
Drain-gate voltage (RGS = 20KΩ)800V
Gate-source voltage ± 30 V
GS
Drain current (continuous) at TC = 25°C 2.5
I
D
I
Drain current (continuous) at TC=100°C 1.57
D
(2)
Drain current (pulsed) 10
Total dissipation at TC = 25°C 70 25 W
TOT
Derating factor 0.56 0.2 W/°C
V
ESD(G-S)
dv/dt
V
T
T
1. Limited only by maximum temperature allowed
2. Pulse width limited by safe operating area
3. ISD ≤ 2.5A, di/dt ≤ 200A/µs, VDD ≤ V
Gate source ESD (HBM-C=100pF, R=1.5ΚΩ)
(3)
Peak diode recovery voltage slope 4.5 V/ns
Insulation withstand voltage (DC) - 2500 V
ISO
Operating junction temperature
J
Storage temperature
stg
, Tj ≤ T
(BR)DSS
JMAX.
TO-220 / DPAK
IPAK
-55 to 150 °C
TO-220FP
2.5
1.57
10
(1)
(1)
(1)
A
A
A
2V

Table 2. Thermal data

Symbol Parameter Value Unit
DPAK
IPAK
R
thj-case
R
TO-220 TO-220FP
Thermal resistance junction-case max 1.78 5 1.78 °C/W
Thermal resistance junction-ambient
thj-a
max
Maximum lead temperature for
T
l
soldering purpose
62.5 100 °C/W
300 °C
3/18
Electrical ratings STP3NK80Z - STF3NK80Z - STD3NK80Z - STD3NK80Z-1

Table 3. Avalanche characteristics

Symbol Parameter Value Unit
I
AR
E
Avalanche current, repetitive or not-repetitive (pulse width limited by Tj Max)
Single pulse avalanche energy
AS
(starting Tj=25°C, Id=Iar, Vdd=50V)
2.5 A
170 mJ

Table 4. Gate-source zener diode

Symbol Parameter Test conditions Min. Typ. Max. Unit
BV
Gate-source breakdown voltage Igs=± 1mA (Open Drain) 30 V
GSO

1.1 Protection features of gate-to-source zener diodes

The built-in back-to-back Zener diodes have specifically been designed to enhance not only the device’s ESD capability, but also to make them safely absorb possible voltage transients that may occasionally be applied from gate to source. In this respect the Zener voltage is appropriate to achieve an efficient and cost-effective intervention to protect the device’s integrity. These integrated Zener diodes thus avoid the usage of external components.
4/18
STP3NK80Z - STF3NK80Z - STD3NK80Z - STD3NK80Z-1 Electrical characteristics

2 Electrical characteristics

(T
=25°C unless otherwise specified)
CASE

Table 5. On/off states

Symbol Parameter Test conditions Min. Typ. Max. Unit
V
(BR)DSS
I
DSS
I
GSS
V
GS(th)
R
DS(on)
Drain-source breakdown voltage
Zero gate voltage drain current (V
GS
= 0)
Gate body leakage current (VGS = 0)
Gate threshold voltage V
Static drain-source on resistance
= 1mA, VGS= 0 800 V
I
D
V
= Max rating,
DS
= Max rating,
V
DS
Tc = 125°C
V
= ± 20V ±10 µA
GS
= VGS, ID = 50µA 3 3.75 4.5 V
DS
= 10V, ID = 1.25 A 3.8 4.5
V
GS
1
50

Table 6. Dynamic

Symbol Parameter Test conditions Min. Typ. Max. Unit
(1)
g
fs
C
C
C
C
osseq
t
d(on)
t
d(off)
Q Q Q
1. Pulsed: pulse duration=300µs, duty cycle 1.5%
2. C increases from 0 to 80% V
Forward transconductance V
Input capacitance
iss
Output capacitance
oss
Reverse transfer
rss
capacitance
Equivalent output
(2)
.
capacitance
Turn-on delay time
t
Rise time
r
Off-voltage rise time
t
Fall time
f
Total gate charge
g
Gate-source charge
gs
Gate-drain charge
gd
is defined as a constant equivalent capacitance giving the same charging time as C
oss eq.
DSS
=15V, ID = 1.25A 2.1 S
DS
=25V, f=1 MHz, VGS=0
V
DS
=0, V
V
GS
=400 V, ID= 1.25 A,
V
DD
=4.7Ω, VGS=10V
R
G
=0V to 640V 22 pF
DS
(see Figure 18)
=640V, ID = 2.5 A
V
DD
=10V
V
GS
485
57 11
17 27 36 40
19
3.2
10.8
when VDS
oss
µA µA
pF pF pF
ns ns ns ns
nC nC nC
5/18
Electrical characteristics STP3NK80Z - STF3NK80Z - STD3NK80Z - STD3NK80Z-1

Table 7. Source drain diode

Symbol Parameter Test conditions Min Typ. Max Unit
I
I
SDM
V
SD
Q
I
RRM
Q
I
RRM
1. Pulse width limited by safe operating area
2. Pulsed: pulse duration=300µs, duty cycle 1.5%
Source-drain current 2.5 A
SD
(1)
Source-drain current (pulsed) 10 A
(2)
Forward on voltage ISD= 2.5 A, VGS=0 1.6 V
Reverse recovery time
t
rr
Reverse recovery charge
rr
Reverse recovery current
Reverse recovery time
t
rr
Reverse recovery charge
rr
Reverse recovery current
= 2.5A,
I
SD
di/dt = 100A/µs,
=50V, Tj=25°C
V
DD
(see Figure 20)
= 2.5 A,
I
SD
di/dt = 100A/µs,
=50V, Tj=150°C
V
DD
(see Figure 20)
384
1600
8.4
474
2100
8.8
ns µC
A
ns µC
A
6/18
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