The M24256-Bxdevices are I2C-compatible electrically erasable programmable memories
(EEPROM). They are organized as 32 Kb × 8 bits.
The M24256-Bx and M24256-DR can decode the type identifier code (1010) in accordance
with the I
2
C bus definition. The M24256-DR also decodes the type identifier code (1011)
when accessing the identification page.
The device behaves as a slave in the I
2
C protocol, with all memory operations synchronized
by the serial clock. Read and Write operations are initiated by a Start condition, generated
by the bus master. The Start condition is followed by a device select code and Read/Write
bit (RW
) (as described in Ta bl e 2 ), terminated by an acknowledge bit.
When writing data to the memory, the device inserts an acknowledge bit during the 9
th
bit
time, following the bus master’s 8-bit transmission. When data is read by the bus master, the
bus master acknowledges the receipt of the data byte in the same way. Data transfers are
terminated by a Stop condition after an Ack for Write, and after a NoAck for Read.
1. See Package mechanical data section for package dimensions, and how to identify pin-1.
3
4
8
7
6
5
CC
WCE1
SCL
SDAV
AI04035e
Figure 3.WLCSP connections (top view, marking side, with balls on the underside)
Doc ID 6757 Rev 207/42
Signal descriptionM24256-BF, M24256-BR, M24256-BW, M24256-DR
Ai12806
V
CC
M24xxx
V
SS
E
i
V
CC
M24xxx
V
SS
E
i
2 Signal description
2.1 Serial Clock (SCL)
This input signal is used to strobe all data in and out of the device. In applications where this
signal is used by slave devices to synchronize the bus to a slower clock, the bus master
must have an open drain output, and a pull-up resistor must be connected from Serial Clock
(SCL) to V
most applications, though, this method of synchronization is not employed, and so the pullup resistor is not necessary, provided that the bus master has a push-pull (rather than open
drain) output.
2.2 Serial Data (SDA)
This bidirectional signal is used to transfer data in or out of the device. It is an open drain
output that may be wire-OR’ed with other open drain or open collector signals on the bus. A
pull up resistor must be connected from Serial Data (SDA) to V
the value of the pull-up resistor can be calculated).
. (Figure 6 indicates how the value of the pull-up resistor can be calculated). In
CC
. (Figure 6 indicates how
CC
2.3 Chip Enable (E0, E1, E2)
These input signals are used to set the value that is to be looked for on the three least
significant bits (b3, b2, b1) of the 7-bit device select code. These inputs must be tied to V
or V
, to establish the device select code. When not connected (left floating), these inputs
SS
are read as Low (0,0,0).
Figure 4.Device select code
2.4 Write Control (WC)
This input signal is useful for protecting the entire contents of the memory from inadvertent
write operations. Write operations are disabled to the entire memory array when Write
Control (WC
Write operations are allowed.
) is driven High. When unconnected, the signal is internally read as VIL, and
CC
When Write Control (WC
) is driven High, device select and address bytes are
Prior to selecting the memory and issuing instructions to it, a valid and stable VCC voltage
within the specified [V
(min), VCC(max)] range must be applied (see Tab l e 8 , Tab le 9 and
CC
Ta bl e 1 0 ). In order to secure a stable DC supply voltage, it is recommended to decouple the
V
line with a suitable capacitor (usually of the order of 10 nF to 100 nF) close to the
CC
V
CC/VSS
package pins.
This voltage must remain stable and valid until the end of the transmission of the instruction
and, for a Write instruction, until the completion of the internal write cycle (t
2.6.2 Power-up conditions
VCC has to rise continuously from 0 V up to VCC(min) (see Ta bl e 8 , Ta bl e 9 and Tab le 1 0 ),
and the rise time must not vary faster than 1 V/µs.
2.6.3 Device reset
In order to prevent inadvertent write operations during power-up, a power on reset (POR)
circuit is included. At power-up, the device does not respond to any instruction until V
reaches an internal reset threshold voltage. This threshold is lower than the minimum V
operating voltage defined in Ta bl e 8 , Ta bl e 9 and Ta bl e 1 0.
When V
Power mode. However, the device must not be accessed until V
stable V
In a similar way, during power-down (continuous decrease in V
below the power on reset threshold voltage, the device stops responding to any instruction
sent to it.
passes over the POR threshold, the device is reset and enters the Standby
CC
voltage within the specified [VCC(min), VCC(max)] range.
CC
CC
).
W
reaches a valid and
CC
), as soon as VCC drops
CC
CC
CC
2.6.4 Power-down conditions
During power-down (where V
Power mode (mode reached after decoding a Stop condition, assuming that there is no
internal Write cycle in progress).
decreases continuously), the device must be in the Standby
CC
Doc ID 6757 Rev 209/42
Signal descriptionM24256-BF, M24256-BR, M24256-BW, M24256-DR
1
10
100
101001000
Bus line capacitor (pF)
Bus line pull-up resistor
(k
)
When t
LOW
= 1.3 µs (min value for
f
C
= 400 kHz), the R
bus
× C
bus
time constant m ust be below the
400 ns time constant line
represented on the left.
1
10
100
10100
Bus line capacitor (pF)
Bus line pull-up resistor (k )
ai14795d
I²C bus
master
M24xxx
R
bus
V
CC
C
bus
SCL
SDA
R
bus
× C
bus
= 270 ns
When t
LOW
= 700 ns
(max possible value for
f
C
= 1 MHz), the R
bus
× C
bus
time constant must be below
the 270 ns time constant line
represented on the left.
When t
LOW
= 400 ns
(min value for f
C
= 1 MHz),
the R
bus
× C
bus
time constant
must be below the 100 ns
time constant line represented
on the left.
The device supports the I2C protocol. This is summarized in Figure 7. Any device that sends
data on to the bus is defined to be a transmitter, and any device that reads the data to be a
receiver. The device that controls the data transfer is known as the bus master, and the
other as the slave device. A data transfer can only be initiated by the bus master, which will
also provide the serial clock for synchronization. The device is always slave in all
communications.
3.1 Start condition
Start is identified by a falling edge of Serial Data (SDA) while Serial Clock (SCL) is stable in
the High state. A Start condition must precede any data transfer instruction. The device
continuously monitors (except during a Write cycle) Serial Data (SDA) and Serial Clock
(SCL) for a Start condition, and will not respond unless one is given.
3.2 Stop condition
Stop is identified by a rising edge of Serial Data (SDA) while Serial Clock (SCL) is stable
and driven High. A Stop condition terminates communication between the device and the
bus master. A Read instruction that is followed by NoAck can be followed by a Stop
condition to force the device into the Standby mode. A Stop condition at the end of a Write
instruction triggers the internal Write cycle.
3.3 Acknowledge bit (ACK)
The acknowledge bit is used to indicate a successful byte transfer. The bus transmitter,
whether it be bus master or slave device, releases Serial Data (SDA) after sending eight bits
of data. During the 9
acknowledge the receipt of the eight data bits.
th
clock pulse period, the receiver pulls Serial Data (SDA) Low to
3.4 Data input
During data input, the device samples Serial Data (SDA) on the rising edge of Serial Clock
(SCL). For correct device operation, Serial Data (SDA) must be stable during the rising edge
of Serial Clock (SCL), and the Serial Data (SDA) signal must change only when Serial Clock
(SCL) is driven Low.
To start communication between the bus master and the slave device, the bus master must
initiate a Start condition. Following this, the bus master sends the device select code, shown
in Ta bl e 2 (on Serial Data (SDA), most significant bit first).
The device select code consists of a 4-bit device type identifier, and a 3-bit Chip Enable
“Address” (E2, E1, E0). To address the memory array, the 4-bit Device Type Identifier is
1010b.
Up to eight memory devices can be connected on a single I
unique 3-bit code on the Chip Enable (E0, E1, E2) inputs. When the device select code is
received, the device only responds if the Chip Enable Address is the same as the value on
the Chip Enable (E0, E1, E2) inputs.
th
The 8
bit is the Read/Write bit (RW). This bit is set to 1 for Read and 0 for Write operations.
2
C bus. Each one is given a
If a match occurs on the device select code, the corresponding device gives an
acknowledgment on Serial Data (SDA) during the 9
th
bit time. If the device does not match
the device select code, it deselects itself from the bus, and goes into Standby mode.
Following a Start condition the bus master sends a device select code with the Read/Write
bit (RW
address bytes. The device responds to each address byte with an acknowledge bit, and
then waits for the data byte.
) reset to 0. The device acknowledges this, as shown in Figure 9, and waits for two
Writing to the memory may be inhibited if Write Control (WC
instruction with Write Control (WC
condition until the end of the two address bytes) will not modify the memory contents, and
the accompanying data bytes are not acknowledged, as shown in Figure 8.
Each data byte in the memory has a 16-bit (two byte wide) address. The most significant
byte (Ta bl e 4 ) is sent first, followed by the least significant byte (Tab le 5 ). Bits b15 to b0 form
the address of the byte in memory.
When the bus master generates a Stop condition immediately after the Ack bit (in the “10
bit” time slot), either at the end of a Byte Write or a Page Write, the internal Write cycle is
triggered. A Stop condition at any other time slot does not trigger the internal Write cycle.
After the Stop condition, the delay t
the device’s internal address counter is incremented automatically, to point to the next byte
address after the last one that was modified.
During the internal Write cycle, Serial Data (SDA) is disabled internally, and the device does
not respond to any requests.
3.7 Byte Write
After the device select code and the address bytes, the bus master sends one data byte. If
the addressed location is Write-protected, by Write Control (WC
device replies with NoAck, and the location is not modified. If, instead, the addressed
location is not Write-protected, the device replies with Ack. The bus master terminates the
transfer by generating a Stop condition, as shown in Figure 9.
) is driven High. Any Write
) driven High (during a period of time from the Start
, and the successful completion of a Write operation,
W
) being driven High, the
th
3.8 Page Write (memory array)
The Page Write mode allows up to 64 bytes to be written in a single Write cycle, provided
that they are all located in the same ‘row’ in the memory: that is, the most significant
memory address bits (b15-b6) are the same. If more bytes are sent than will fit up to the end
of the row, a condition known as ‘roll-over’ occurs. This should be avoided, as data starts to
become overwritten in an implementation dependent way.
The bus master sends from 1 to 64 bytes of data, each of which is acknowledged by the
device if Write Control (WC
addressed memory location are not modified, and each data byte is followed by a NoAck.
After each byte is transferred, the internal byte address counter (the 7 least significant
address bits only) is incremented. The transfer is terminated by the bus master generating a
Stop condition.
16/42Doc ID 6757 Rev 20
) is Low. If Write Control (WC) is High, the contents of the
The Identification page is written by issuing an ID Write instruction. This instruction uses the
same protocol and format as the Page Write in memory array, except for the following
differences:
●Device Type Identifier = 1011b
●MSB address bits A15/A6 are don't care except for address bit A10 which must be ‘0’.
LSB address bits A5/A0 define the byte address inside the identification page.
If the Identification page is locked, the data bytes transferred during the Identification Page
Write instruction are not acknowledged (NoAck).
3.10 Lock Identification Page (M24256-DR only)
The Lock Identification Page instruction (Lock ID) permanently locks the Identification page
in read-only mode. The Lock ID instruction is similar to Byte Write (into memory array) with
the following specific conditions:
●Device Type Identifier = 1011b
●Address bit A10 must be ‘1’; all other address bits are don't care
●The data byte must be equal to the binary value xxxx xx1x, where x is don't care.
If the Identification Page is locked, the data bytes transferred during the ID Write instruction
are not acknowledged (NoAck).
3.11 ECC (error correction code) and write cycling
The M24256-Bx and M24256-DRdevices offer an ECC (error correction code) logic which
compares each 4-byte word with its six associated ECC EEPROM bits. As a result, if a
single bit out of 4 bytes of data happens to be erroneous during a Read operation, the ECC
detects it and replaces it by the correct value. The read reliability is therefore much improved
by the use of this feature.
Note however that even if a single byte has to be written, 4 bytes are internally modified
(plus the ECC bits), that is, the addressed byte is cycled together with the other three bytes
making up the word. It is therefore recommended to write by word (4 bytes) in order to
benefit from the larger amount of Write cycles.
The M24256-Bx and M24256-DRdevices are qualified at 1 million (1 000 000) Write cycles,
using a cycling routine that writes to the device by multiples of 4-bytes.
First byte of instruction
with RW = 0 already
decoded by the device
YESNO
Start
condition
Continue the
Write operation
Continue the
Random Read operation
Figure 10. Write cycle polling flowchart using ACK
3.12 Minimizing system delays by polling on ACK
During the internal Write cycle, the device disconnects itself from the bus, and writes a copy
of the data from its internal latches to the memory cells. The maximum Write time (t
shown in Ta bl e 1 6 , but the typical time is shorter. To make use of this, a polling sequence
can be used by the bus master.
The sequence, as shown in Figure 10, is:
●Initial condition: a Write cycle is in progress.
●Step 1: the bus master issues a Start condition followed by a device select code (the
●Step 2: if the device is busy with the internal Write cycle, no Ack will be returned and
first byte of the new instruction).
the bus master goes back to Step 1. If the device has terminated the internal Write
cycle, it responds with an Ack, indicating that the device is ready to receive the second
w
) is
part of the instruction (the first byte of this instruction having been sent during Step 1).
Read operations are performed independently of the state of the Write Control (WC) signal.
After the successful completion of a Read operation, the device’s internal address counter is
incremented by one, to point to the next byte address.
Figure 11. Read mode sequences
3.14 Random Address Read (in memory array)
A dummy Write is first performed to load the address into this address counter (as shown in
Figure 11) but without sending a Stop condition. Then, the bus master sends another Start
condition, and repeats the device select code, with the Read/Write
device acknowledges this, and outputs the contents of the addressed byte. The bus master
must not acknowledge the byte, and terminates the transfer with a Stop condition.
For the Current Address Read operation, following a Start condition, the bus master only
sends a device select code with the Read/Write
this, and outputs the byte addressed by the internal address counter. The counter is then
incremented. The bus master terminates the transfer with a Stop condition, as shown in
Figure 11, without acknowledging the byte.
bit (RW) set to 1. The device acknowledges
3.16 Sequential Read
This operation can be used after a Current Address Read or a Random Address Read. The
bus master does acknowledge the data byte output, and sends additional clock pulses so
that the device continues to output the next byte in sequence. To terminate the stream of
bytes, the bus master must not acknowledge the last byte, and must generate a Stop
condition, as shown in Figure 11.
The output data comes from consecutive addresses, with the internal address counter
automatically incremented after each byte output. After the last memory address, the
address counter ‘rolls-over’, and the device continues to output data from memory address
00h.
3.17 Read Identification Page
This instruction uses the same protocol and format as the Random Address Read (in
memory array) instruction. The only differences between the two instructions are that, in the
Read Identification Page instruction:
●the device type identifier = 1011b
●MSB address bits A15/A6 are don't care except for address bit A10 which must be ‘0’.
LSB address bits A5/A0 define the byte address inside the identification page. During a
Read Identification Page instruction, the (A5/A0) address should not exceed 3Fh.
3.18 Read Identification Page status (locked/unlocked)
The locked/unlocked status of the Identification page can be checked by issuing a specific
truncated instruction consisting of the Identification Page Write instruction followed by one
data byte. The data byte will be acknowledged if the Identification page is unlocked, while it
will not be acknowledged if the Identification page is locked.
Once the acknowledge bit of this data byte is read, it is recommended to generate a Start
condition followed by a Stop condition, so that:
●The instruction is truncated and not executed as the Start condition resets the device
internal logic.
●The device is set to Standby mode by the Stop condition.
3.19 Acknowledge in Read mode
For all Read instructions, the device waits, after each byte read, for an acknowledgment
during the 9
time, the device terminates the data transfer and switches to its Standby mode.
th
bit time. If the bus master does not drive Serial Data (SDA) Low during this
22/42Doc ID 6757 Rev 20
M24256-BF, M24256-BR, M24256-BW, M24256-DRInitial delivery state
4 Initial delivery state
The device is delivered with all bits in the memory array set to 1 (each byte contains FFh).
5 Maximum rating
Stressing the device outside the ratings listed in Ta bl e 7 may cause permanent damage to
the device. These are stress ratings only, and operation of the device at these, or any other
conditions outside those indicated in the operating sections of this specification, is not
implied. Exposure to absolute maximum rating conditions for extended periods may affect
device reliability.
Table 7.Absolute maximum ratings
SymbolParameterMin.Max.Unit
T
T
STG
T
LEAD
V
IO
V
CC
I
OL
V
ESD
1. Compliant with JEDEC Std J-STD-020D (for small body, Sn-Pb or Pb assembly), the ST ECOPACK®
7191395 specification, and the European directive on the restriction of the use of certain hazardous
substances in electrical and electronic equipment (RoHS) 2002/95/EC.
Electrostatic discharge voltage (human body model)
(2)
–30003000V
°C
Doc ID 6757 Rev 2023/42
DC and AC parametersM24256-BF, M24256-BR, M24256-BW, M24256-DR
AI00825B
0.8V
CC
0.2V
CC
0.7V
CC
0.3V
CC
Input and Output
Timing Reference Levels
Input Levels
6 DC and AC parameters
This section summarizes the operating and measurement conditions, and the dc and ac
characteristics of the device. The parameters in the DC and AC characteristic tables that
follow are derived from tests performed under the measurement conditions summarized in
the relevant tables. Designers should check that the operating conditions in their circuit
match the measurement conditions when relying on the quoted parameters.
Table 8.Operating conditions (voltage range W)
SymbolParameterMin.Max.Unit
V
CC
Supply voltage2.55.5V
Ambient operating temperature (device grade 6)–4085°C
T
A
Ambient operating temperature (device grade 3)–40125°C
Table 9.Operating conditions (voltage range R)
SymbolParameterMin.Max.Unit
V
CC
T
Table 10.Operating conditions (voltage range F)
Supply voltage1.85.5V
Ambient operating temperature–4085°C
A
SymbolParameterMin.Max.Unit
V
CC
T
Table 11.AC test measurement conditions
Supply voltage1.75.5V
Ambient operating temperature–4085°C
A
SymbolParameterMin.Max.Unit
C
Load capacitance100pF
L
Input rise and fall times50ns
Input levels0.2V
Input and output timing reference levels0.3V
to 0.8V
CC
to 0.7V
CC
CC
CC
V
V
Figure 12. AC test measurement I/O waveform
24/42Doc ID 6757 Rev 20
M24256-BF, M24256-BR, M24256-BW, M24256-DRDC and AC parameters
Table 12.Input parameters
SymbolParameter
(1)
Test conditionMin.Max.Unit
C
C
Z
Z
H
1. Sampled only, not 100% tested.
2. E2,E1,E0: Input impedance when the memory is selected (after a Start condition).
Table 13.DC characteristics (voltage range W)
SymbolParameter
I
LI
I
LO
I
CC
I
CC0
I
CC1
V
V
IH
V
OL
1. Characterized value, not tested in production.
2. The device is not selected after power-up, after a Read instruction (after the Stop condition), or after the
completion of the internal write cycle tW (tW is triggered by the correct decoding of a Write instruction).
Input capacitance (SDA)8pF
IN
Input capacitance (other pins)6pF
IN
Input impedance
(2)
L
(E2, E1, E0, WC
Input impedance
(2)
(E2, E1, E0, WC)
Input leakage current
(SCL, SDA, E0, E1,
E2)
Output leakage
current
)
Test conditions (see Table 8 and
V
= VSS or V
IN
device in Standby mode
SDA in Hi-Z, external voltage applied
on SDA: VSS or V
V
= 2.5 V, fc = 400 kHz
CC
< 0.3V
V
IN
V
> 0.7V
IN
Table 11)
CC
CC
CC
CC
30k
500k
Min.Max.Unit
(rise/fall time < 50 ns)
Supply current (Read)
= 5.5 V, fc = 400 kHz
V
CC
(rise/fall time < 50 ns)
Supply current (Write) During tW, 2.5 V < VCC < 5.5 V5
(2)
,
Device grade 35
CC
Device grade 62
= 5.5 V5µA
CC
–0.450.3V
0.7V
CC
0.7V
CCVCC
Standby supply
current
Input low voltage
IL
(SCL, SDA, WC
Input high voltage
(SCL, SDA)
Input high voltage
(W
C, E0, E1, E2)
Device not selected
V
= VSS or VCC, V
IN
= 2.5 V
= VSS or VCC, V
V
IN
)
Output low voltageIOL = 2.1 mA, VCC = 2.5 V0.4V
± 2µA
± 2µA
1mA
2mA
(1)
CC
6.5
+0.6
mA
µA
V
V
Doc ID 6757 Rev 2025/42
DC and AC parametersM24256-BF, M24256-BR, M24256-BW, M24256-DR
Table 14.DC characteristics (voltage range R)
SymbolParameter
Input leakage current
I
LI
(E1, E2, SCL, SDA)
I
I
I
CC0
I
CC1
V
Output leakage current
LO
Supply current (Read)
CC
Supply current (Write)During tW, 1.8 V < VCC < 5.5 V5
Standby supply current
Input low voltage
IL
(SCL, SDA, WC)
Input high voltage
(SCL, SDA)
V
IH
Input high voltage
, E0, E1, E2)
(WC
V
1. Only for devices operating at fC max = 1 MHz (see Ta bl e 1 7 ).
2. Characterized value, not tested in production.
3. The device is not selected after power-up, after a Read instruction (after the Stop condition), or after the
completion of the internal write cycle tW (tW is triggered by the correct decoding of a Write instruction).
Output low voltage
OL
Test conditions (in addition to
those in Tabl e 9 )
= VSS or V
V
IN
CC
Min.Max.Unit
device in Standby mode
SDA in Hi-Z, external voltage
applied on SDA: V
= 1.8 V, fc= 400 kHz
V
CC
SS
or V
CC
(rise/fall time < 50 ns)
= 2.5 V, fc= 400 kHz
V
CC
(rise/fall time < 50 ns)
= 5.0 V, fc= 400 kHz
V
CC
(rise/fall time < 50 ns)
1.8 V < V
< 5.5 V, fc= 1 MHz
CC
(1)
(rise/fall time < 50 ns)
Device not selected
V
= VSS or VCC, VCC = 1.8 V
IN
Device not selected
V
= VSS or VCC, VCC = 2.5 V
IN
Device not selected
= VSS or VCC, VCC = 5.5 V
V
IN
1.8 V V
2.5 V V
1.8 V V
2.5 V V
1.8 V V
2.5 V V
I
= 1 mA, VCC = 1.8 V0.2V
OL
= 2.1 mA, VCC = 2.5 V0.4V
I
OL
I
= 3.0 mA, VCC = 5.5 V0.4V
OL
CC
CC
CC
CC
CC
CC
(3)
,
(3)
,
(3)
,
< 2.5 V–0.450.25 V
5.5 V–0.450.3 V
< 2.5 V0.75V
< 5.5 V0.7V
< 2.5 V0.75V
5.5 V0.7V
CC
CC
CCVCC
CCVCC
± 2µA
± 2µA
0.8mA
1mA
2mA
2.5mA
(2)
1µA
2µA
3µA
CC
CC
6.5
6.5
+0.6
+0.6
mA
V
V
V
26/42Doc ID 6757 Rev 20
M24256-BF, M24256-BR, M24256-BW, M24256-DRDC and AC parameters
Table 15.DC characteristics (voltage range F)
SymbolParameter
Input leakage current
I
LI
(E1, E2, SCL, SDA)
I
Output leakage current
LO
Test condition (in addition to
those in Tabl e 9 )
V
IN
device in Standby mode
SDA in Hi-Z, external voltage
applied on SDA: V
V
= 1.7 V, fc= 400 kHz
CC
(rise/fall time < 50 ns)
= 2.5 V, fc= 400 kHz
V
I
Supply current (Read)
CC
CC
(rise/fall time < 50 ns)
= 5.0 V, fc= 400 kHz
V
CC
(rise/fall time < 50 ns)
I
CC0
Supply current (Write)During tW, 1.7 V < VCC < 5.5 V5
Device not selected
= VSS or VCC, VCC = 1.7 V
V
IN
I
CC1
Standby supply current
Device not selected
V
= VSS or VCC, VCC = 2.5 V
IN
Device not selected
V
= VSS or VCC, VCC = 5.5 V
IN
V
Input low voltage
IL
(SCL, SDA, WC
)
Input high voltage
(SCL, SDA)
V
IH
Input high voltage
, E0, E1, E2)
(WC
V
1. Preliminary data.
2. Characterized value, not tested in production.
3. The device is not selected after power-up, after a Read instruction (after the Stop condition), or after the
completion of the internal write cycle tW (tW is triggered by the correct decoding of a Write instruction).
Output low voltage
OL
1.7 V VCC < 2.5 V–0.450.25 V
2.5 V V
1.7 V V
2.5 V V
1.7 V V
2.5 V V
= 1 mA, VCC = 1.7 V0.2V
I
OL
I
= 2.1 mA, VCC = 2.5 V0.4V
OL
= 3.0 mA, VCC = 5.5 V0.4V
I
OL
(1)
= VSS or V
CC
or V
SS
CC
(3)
,
(3)
,
(3)
,
5.5 V–0.450.3 V
CC
< 2.5 V0.75V
CC
5.5 V0.7V
CC
< 2.5 V0.75V
CC
5.5 V0.7V
CC
Min.Max.Unit
± 2µA
± 2µA
0.8mA
1mA
2mA
(2)
1µA
2µA
3µA
CC
CC
CC
CC
CCVCC
CCVCC
6.5
6.5
+0.6
+0.6
mA
V
V
V
Doc ID 6757 Rev 2027/42
DC and AC parametersM24256-BF, M24256-BR, M24256-BW, M24256-DR
Table 16.400 kHz AC characteristics
Test conditions specified in Table 8, Ta b l e 9 , Ta b l e 1 0 and Ta b l e 1 1
SymbolAlt.ParameterMin.
(1)
Max.
(1)
Unit
f
C
t
CHCL
t
CLCH
t
QL1QL2
t
XH1XH2
t
XL1XL2
t
DXCX
t
CLDX
t
CLQX
(6)(7)
t
CLQV
t
CHDL
t
DLCL
t
CHDH
t
DHDL
t
W
t
NS
1. All values are referred to VIL(max) and VIH(min).
2. Characterized only, not tested in production.
3. With CL = 10 pF.
4. There is no min. or max. values for the input signal rise and fall times. It is however recommended by the
I²C specification that the input signal rise and fall times be more than 20 ns and less than 300 ns when
f
< 400 kHz.
C
5. The new M24xxx-W, M24xxx-R, and M24xxx-BF devices (identified by the process letter K) offer
t
CLQX
t
CLQX
specification which recommends t
6. To avoid spurious Start and Stop conditions, a minimum delay is placed between SCL=1 and the falling or
rising edge of SDA.
7. t
CLQV
0.7VCC, assuming that R
8. The current M24xxx devices (identified by the Process letter A) offer tNS=100 ns (min), the new M24256BR and M24256-DR device (identified by the process letter K) offer t
safe margin compared to the 50 ns minimum value recommended by the I
f
t
HIGH
t
LOW
(2)
t
SU:DAT
t
HD:DAT
t
t
SU:STA
t
HD:STA
t
SU:STO
t
t
= 100 ns (min) and t
= 200 ns (min) and t
is the time (from the falling edge of SCL) required by the SDA bus line to reach either 0.3VCC or
Clock frequency400kHz
SCL
Clock pulse width high600ns
Clock pulse width low1300ns
t
SDA (out) fall time20
F
t
Input signal rise time
R
t
Input signal fall time
F
(3)
(4)
(4)(4)
Data in set up time100ns
Data in hold time0ns
Data out hold time100
DH
t
Clock low to next data valid (access time)100
AA
(5)
(5)
Start condition setup time600ns
Start condition hold time600ns
Stop condition set up time600ns
Time between Stop condition and next Start
BUF
condition
Write time5ms
WR
1300ns
Pulse width ignored (input filter on SCL and
SDA) - single glitch
= 100 ns (min), while the current devices (process letter A) offer
CLQV
= 200 ns (min). Both series offer a safe margin compared to the I2C
CLQV
bus
× C
= 0 ns (min).
CLQV
time constant is within the values specified in Figure 6.
bus
=80 ns (min). Both products offer a
NS
2
C specification.
120ns
(4)
900ns
(8)
80
ns
ns
ns
ns
28/42Doc ID 6757 Rev 20
M24256-BF, M24256-BR, M24256-BW, M24256-DRDC and AC parameters
Table 17.1 MHz AC characteristics
(1)
Test conditions specified in Tab l e 9 and Ta b l e 1 1
SymbolAlt.ParameterMin.
f
C
t
CHCL
t
CLCH
t
XH1XH2
t
XL1XL2
t
QL1QL2
t
DXCX
t
CLDX
t
CLQX
(7)(8)
t
CLQV
t
CHDL
t
DLCL
t
CHDH
t
DHDL
t
W
(4)
t
NS
1. Only new M24256-BR and M24256-DR devices identified by the process letter K are qualified at 1 MHz.
2. All values are referred to VIL(max) and VIH(min).
3. There is no min. or max. values for the input signal rise and fall times. It is however recommended by the
I²C specification that the input signal rise and fall times be more than 20 ns and less than 300 ns when
fC< 400 kHz, or less than 120 ns when fC<1MHz.
4. Characterized only, not tested in production.
5. With CL = 10 pF.
6. The new M24xxx devices (identified by the process letter K) offer t
(min) which is an improved value compared to the t
current M24xxx devices (identified with the Process letter A)
7. To avoid spurious Start and Stop conditions, a minimum delay is placed between SCL=1 and the falling or
rising edge of SDA.
8. t
CLQV
0.7V
9. The new M24xxx devices (identified with the process letter K) offer tNS = 80 ns (min) which is an improved
value compared to the current M24xxx devices (identified by the process letter A).
(4)
f
SCL
t
HIGH
t
LOW
t
R
t
F
t
F
t
SU:DAT
t
HD:DAT
t
SU:STA
t
HD:STA
t
SU:STO
t
BUF
t
WR
Clock frequency01MHz
Clock pulse width high300-ns
Clock pulse width low400-ns
Input signal rise time
Input signal fall time
SDA (out) fall time20
Data in setup time80-ns
Data in hold time0-ns
t
Data out hold time50
DH
t
Clock low to next data valid (access time) 50
AA
Start condition setup time250-ns
Start condition hold time250-ns
Stop condition setup time250-ns
Time between Stop condition and next
Start condition
Write time-5ms
Pulse width ignored (input filter on SCL and
SDA)
=100 ns (min) and t
=50 ns (min) and t
CLQX
is the time (from the falling edge of SCL) required by the SDA bus line to reach either 0.3VCC or
, assuming that the R
CC
bus
× C
time constant is within the values specified in Figure 6.
bus
CLQX
(2)
(3)
(3)(3)
(5)
(6)
(6)
500-ns
-50
=50 ns (min) offered by the
CLQV
(2)
Max.
(3)
Unit
ns
ns
120ns
-ns
500ns
(9)
CLQV
ns
=100 ns
Doc ID 6757 Rev 2029/42
DC and AC parametersM24256-BF, M24256-BR, M24256-BW, M24256-DR
SCL
SDA In
SCL
SDA Out
SCL
SDA In
tCHCL
tDLCL
tCHDL
Start
condition
tCLCH
tDXCHtCLDX
SDA
Input
SDA
Change
tCHDH tDHDL
Stop
condition
Data valid
tCLQVtCLQX
tCHDH
Stop
condition
tCHDL
Start
condition
Write cycle
tW
AI00795e
Start
condition
tCHCL
tXH1XH2
tXH1XH2
tXL1XL2
tXL1XL2
Data valid
tQL1QL2
Figure 13. AC waveforms
30/42Doc ID 6757 Rev 20
M24256-BF, M24256-BR, M24256-BW, M24256-DRPackage mechanical data
6L_ME
E
N
CP
b
e
A2
D
c
LA1k
E1
A
1
7 Package mechanical data
In order to meet environmental requirements, ST offers these devices in different grades of
ECOPACK
specifications, grade definitions and product status are available at: www.st.com.
ECOPACK
®
packages, depending on their level of environmental compliance. ECOPACK®
®
is an ST trademark.
Figure 14. SO8W – 8-lead plastic small outline, 208 mils body width, package outline
1. Drawing is not to scale.
Table 18.SO8W – 8-lead plastic small outline, 208 mils body width, package data
millimetersinches
Symbol
TypMinMaxTypMinMax
(1)
A2.50.0984
A100.2500.0098
A21.5120.05940.0787
b0.40.350.510.01570.01380.0201
c0.20.10.350.00790.00390.0138
CP0.10.0039
D6.050.2382
E5.026.220.19760.2449
E17.628.890.30.35
e1.27--0.05--
k0°10°0°10°
L0.50.80.01970.0315
N (number of pins)88
1. Values in inches are converted from mm and rounded to 4 decimal digits.
Figure 17. UFDFPN8 (MLP8) 8-lead ultra thin fine pitch dual flat package no lead
2 x 3 mm, outline
e
D
b
L3
E
A
D2
A1
1. Drawing is not to scale.
2. The central pad (the area E2 by D2 in the above illustration) is pulled, internally, to V
allowed to be connected to any other voltage or signal line on the PCB, for example during the soldering
process.
3. The circle in the top view of the package indicates the position of pin 1.
Table 21.UFDFPN8 (MLP8) 8-lead ultra thin fine pitch dual flat package no lead
ddd
L1
E2
L
UFDFPN-01
. It must not be
SS
2 x 3 mm, data
millimetersinches
Symbol
TypMinMaxTypMinMax
(1)
A0.550.450.60.02170.01770.0236
A10.0200.050.000800.002
b0.250.20.30.00980.00790.0118
D21.92.10.07870.07480.0827
D21.61.51.70.0630.05910.0669
E32.93.10.11810.11420.122
E20.20.10.30.00790.00390.0118
e0.5--0.0197--
L0.450.40.50.01770.01570.0197
L10.150.0059
L30.30.0118
(2)
ddd
1. Values in inches are converted from mm and rounded to 4 decimal digits.
2. Applied for exposed die paddle and terminals. Exclude embedding part of exposed die paddle from
measuring.
0.080.08
34/42Doc ID 6757 Rev 20
M24256-BF, M24256-BR, M24256-BW, M24256-DRPackage mechanical data
D
E
e2
G
321
B
e
A
B
C
D
E
F
e3
e1
Orientation reference
A1
A
A2
Figure 18. WLCSP, 0.5 mm pitch, package outline
1. Drawing is not to scale.
Table 22.WLCSP 0.5 mm pitch, package mechanical data
MillimetersInches
(1)
(2)
Symbol
TypMin MaxTypMinMax
A 0.60 0.55 0.650.02360.02170.0256
A1 0.245 0.22 0.270.00960.00870.0106
A2 0.355 0.330 0.3800.01400.01300.0150
B Ø 0.311 Ø 0.0122
D 1.97 1.95 1.99 0.07760.07680.0783
E 1.785 1.765 1.805 0.07030.06950.0711
e 0.5 0.0197
e1 0.866 0.0341
e2 0.25 0.0098
e3 0.433 0.0170
F 0.552 0.502 0.602 0.02170.01980.0237
G 0.392 0.342 0.442 0.01540.01350.0174
(3)
N
1. Preliminary data.
2. Values in inches are converted from mm and rounded to 4 decimal digits.
3. N is the total number of terminals.
8 8
Doc ID 6757 Rev 2035/42
Part numberingM24256-BF, M24256-BR, M24256-BW, M24256-DR
8 Part numbering
Table 23.Ordering information scheme
Example:M24256–BWMW 6TP/AB
Device type
2
M24 = I
C serial access EEPROM
Device function
256– = 256 Kbit (32 Kb × 8)
Device family
B: Without Identification page
D: With additional Identification page
6 = Industrial temperature range, –40 to 85 °C. Device tested with standard test flow
3 = Automotive: device tested with high reliability certified flow
(1)
over –40 to 125 °C
Option
blank = standard packing
T = tape and reel packing
Plating technology
P or G = ECOPACK
Process
(2)
®
(RoHS compliant)
/A = F8L process (CSP package)
/AB = F8L process (for device grade 3)
/K = F8H process
1. ST strongly recommends the use of the Automotive Grade devices for use in an automotive environment. The High
Reliability Certified Flow (HRCF) is described in the quality note QNEE9801. Please ask your nearest ST sales office for a
copy.
2. Used only for device grade 3 and WLCSP packages.
For a list of available options (speed, package, etc.) or for further information on any aspect
of this device, please contact your nearest ST sales office.
Lead Soldering Temperature in the Absolute Maximum Ratings table
amended
29-Jan-20011.1
10-Apr-20011.2
16-Jul-20011.3LGA8 Package given the designator “LA”
02-Oct-20011.4LGA8 Package mechanical data updated
13-Dec-20011.5
12-Jun-20011.6Document promoted to Full Datasheet
22-Oct-20032.0
02-Sep-20043.0
22-Feb-20054.0
Write Cycle Polling Flow Chart using ACK illustration updated
LGA8 and SO8(wide) packages added
References to PSDIP8 changed to PDIP8, and Package Mechanical data
updated
LGA8 Package Mechanical data and illustration updated
SO16 package removed
Document becomes Preliminary Data
Test conditions for ILI, ILO, ZL and ZH made more precise
VIL and VIH values unified. tNS value changed
Table of contents, and Pb-free options added. Minor wording changes in
Summary Description, Power-On Reset, Memory Addressing, Write
Operations, Read Operations. V
(min) improved to –0.45V.
IL
LGA8 package is Not for New Design. 5V and -S supply ranges, and
Device Grade 5 removed. Absolute Maximum Ratings for V
(min) and
IO
VCC(min) changed. Soldering temperature information clarified for RoHS
compliant devices. Device grade information clarified. AEC-Q100-002
compliance. V
specification unified for SDA, SCL and WC
IL
Initial delivery state is FFh (not necessarily the same as Erased).
LGA package removed, TSSOP8 and SO8N packages added (see
Package mechanical data section and Table 23: Ordering information
scheme).
Voltage range R (1.8V to 5.5V) also offered. Minor wording changes.
Test Conditions modified in Table 12: Input parameters and Note 2
Z
L
added.
I
CC
and I
values for VCC = 5.5V added to Table 13: DC characteristics
CC1
(voltage range W).
Note added to Table 13: DC characteristics (voltage range W).
Power On Reset paragraph specified.
max value modified in Table 16: 400 kHz AC characteristics and note 4
t
W
added. Plating technology changed in Table 23: Ordering information
scheme.
Resistance and capacitance renamed in Figure 6.
38/42Doc ID 6757 Rev 20
M24256-BF, M24256-BR, M24256-BW, M24256-DRRevision history
Table 26.Document revision history (continued)
DateRevisionChanges
Power On Reset paragraph replaced by Section 2.6: Supply voltage
). Figure 4: Device select code added.
(V
CC
ECC (error correction code) and write cycling added and specified at 1
05-May-20065
16-Oct-20066
02-Jul-20077
16-Oct-20078
Million cycles.
added and I
I
CC0
specified over the whole voltage range in Ta b le 1 3
CC1
and Ta bl e 1 4 .
PDIP8 package removed. Packages are ECOPACK® compliant. Small
text changes.
M24256-BW and M24256-BR part numbers added.
Section 3.11: ECC (error correction code) and write cycling updated.
I
CC
and I
modified in Table 14: DC characteristics (voltage range R).
CC1
tW modified in Table 16: 400 kHz AC characteristics.
SO8Narrow package specifications updated (see Ta b l e 1 9 and
Figure 15). Blank option removed from below Plating technology in
Table 23: Ordering information scheme.
Section 2.6: Supply voltage (VCC) modified.
Section 3.11: ECC (error correction code) and write cycling modified.
JEDEC standard and European directive references corrected below
Table 7: Absolute maximum ratings.
Rise/fall time conditions modified for I
and VIH max modified in
CC
Table 13: DC characteristics (voltage range W) and Table 14: DC
characteristics (voltage range R)
Note 1 removed from Table 13: DC characteristics (voltage range W).
SO8W package specifications modified in Section 7: Package mechanical
data.
Table 24: Available M24256-BR, M24256-BW, M24256-BF products
(package, voltage range, temperature grade) and Table 26: Available
M24512-x products (package, voltage range, temperature grade) added.
Section 2.5: V
max changed and Note 1 updated to latest standard revision in
V
IO
ground added. Small text changes.
SS
Table 7: Absolute maximum ratings.
Note removed from Table 12: Input parameters.
min and VIL max modified in Table 14: DC characteristics (voltage
V
IH
range R).
Removed t
CH1CH2
, t
CL1CL2
and t
DH1DH2
, and added t
XL1XL2
, t
DL1DL2
and
Note 3 in Table 16: 400 kHz AC characteristics.
t
XH1XH2
, t
and Note 2 added to Table 17: 1 MHz AC characteristics.
XL1XL2
Figure 13: AC waveforms modified.
Package mechanical data inch values calculated from mm and rounded to
4 decimal digits (see Section 7: Package mechanical data).
1 MHz frequency introduced (M24512-HR root part number).
14-Dec-20079
27-Mar-200810
22-Apr-200811
Section 2.6.3: Device reset modified.
Figure 5: I
parasitic capacitance (C
1 MHz): maximum R
added.
t
NS
Ta bl e 1 3 .
Table 14: DC characteristics (voltage range R) and Table 17: 1 MHz AC
characteristics modified. Small text changes.
Small text changes. M24256-BHR root part number added.
Section 2.6.3: Device reset on page 9 updated.
Figure 6: I
bus parasitic capacitance (C
Caution removed in Section 3.11: ECC (error correction code) and write
cycling.
M24512-W and M24256-BW offered in the device grade 3 option
(automotive temperature range):
– Table 8: Operating conditions (voltage range W),
– Table 13: DC characteristics (voltage range W),
– /AB Process letters added to Table 23: Ordering information scheme,
– Table 24: Available M24256-BR, M24256-BW, M24256-BF products
(package, voltage range, temperature grade) and
– Table 26: Available M24512-x products (package, voltage range,
temperature grade) updated accordingly).
Small text changes.
2
C Fast mode (fC = 400 kHz): maximum R
) modified, Figure 6: I2C Fast mode Plus (fC =
bus
value versus bus parasitic capacitance (C
bus
value versus bus
bus
bus
moved from Ta bl e 1 2 to Ta bl e 1 6 . ILO test conditions modified in
2
C Fast mode Plus (fC = 1 MHz): maximum R
) on page 10 updated.
bus
value versus
bus
)
WLCSP package added (see Figure 3: WLCSP connections (top view,
22-Dec-200812
marking side, with balls on the underside) and Section 7: Package
mechanical data).
M24256-BF part number added (V
added, see Ta bl e 1 0 , Tab l e 1 5 , Tab le 1 6 and Ta bl e 2 4 ).
21-Jan-200913
test conditions modified in Table 13: DC characteristics (voltage
I
CC1
range W), Table 14: DC characteristics (voltage range R) and Ta bl e 1 5:
DC characteristics (voltage range F).
M24512-DR part number and Identification page feature added.
Command replaced by instruction in the whole document.
UFDFPN8 added.
UFDFPN8 package is now offered (see Section 7: Package mechanical
10-Dec-200919
data, Table 23: Ordering information scheme and Table 24: Available
M24256-BR, M24256-BW, M24256-BF products (package, voltage
range, temperature grade).
19-Jan-201020Revision number corrected at bottom of pages.
Doc ID 6757 Rev 2041/42
M24256-BF, M24256-BR, M24256-BW, M24256-DR
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