STMicroelectronics L9963E Datasheet

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L9963E
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L9963E
Datasheet
Automotive Multicell battery monitoring and balancing IC

Features

AEC-Q100 qualified
Coulomb counter supporting pack overcurrent detection in both ignition on and off states. Fully synchronized current and voltage samples
16-bit voltage ADC with maximum error of ±2 mV in the [0.5 – 4.3] V range, after soldering, in [-40; +105] °C Tj range
2.66 Mbps isolated serial communication with regenerative buffer, supporting dual access ring. Less than 4 us latency between start of conversion of the 1st and the 31st device in a chain. Less than 4 ms to convert and read 96 cells in a system using 8 L9963E and L9963T transceiver. Less than 8 ms to convert and read 210 cells in a system using 15 L9963E and L9963T transceiver. Less than 16 ms to convert and read 434 cells in a system using 31 L9963E and L9963T transceiver. Supports both XFMR and CAP based isolation
200 mA passive internal balancing current for each cell in both normal and silent-balancing mode. Possibility of executing cyclic wake up measurements. Manual/Timed balancing, on multiple channels simultaneously; Internal/External balancing
Fully redundant cell measurement path, with ADC Swap, for enhanced safety and limp home functionality
Intelligent diagnostic routine providing automatic failure validation. Redundant fault notification through both SPI Global Status Word (GSW) and dedicated FAULT line
Two 5 V regulators supporting external load connection with 25 mA (VCOM) and 50 mA (VTREF) current capability
9 GPIOs, with up to 7 analog inputs for NTC sensing
Robust hot-plug performance. No Zeners needed in parallel to each cell
Full ISO26262 compliant, ASIL-D systems ready

Application

Automotive: 48 V and high-voltage battery packs
Backup energy storage systems and UPS
E-bikes, e-scooters
Portable and semi-portable equipment

Description

The L9963E is a Li-ion battery monitoring and protecting chip for high-reliability automotive applications and energy storage systems. Up to 14 stacked battery cells can be monitored to meet the requirements of 48 V and higher voltage systems.
Each cell voltage is measured with high accuracy, as well as the current for the on-chip coulomb counting. The device can monitor up to 7 NTCs. The information is transmitted through SPI communication or isolated interface.
DS13636 - Rev 3 - April 2021 For further information contact your local STMicroelectronics sales office.
www.st.com
L9963E
Multiple L9963E can be connected in a daisy chain and communicate with one host processor via the transformer isolated interfaces, featuring high-speed, low EMI, long distance, and reliable data transmission.
Passive balancing with programmable channel selection is offered in both normal and low power mode (silent balance). The balancing can be terminated automatically based on internal timer interrupt. Nine GPIOs are integrated for external monitoring and controlling. The L9963E features a comprehensive set of fault detection and notification functions to meet the safety standard requirements.
DS13636 - Rev 3
page 2/184

1 Device introduction

The L9963E is intended for operation in both hybrid (HE) and full electric (FE) vehicles using lithium battery packs. The IC embeds all the features needed to perform battery management. A single device can monitor from 4 up to 14 cells. Several devices can be stacked in a vertical arrangement in order to monitor up to 31 battery packs for a total of 434 series cells.
The device can be supplied with the same battery it monitors, and generates stable internal references by means of a voltage regulator and a bootstrap. Both unit need to be surrounded by external components to be functional. It also features two internal bandgaps that are constantly monitored by internal circuitry to guarantee measurement precision. The microcontroller can also monitor the precision of the bandgap by reading the conversion of an internally generated voltage reference (VTREF).
L9963E main activity consists in monitoring cells and battery pack status through stack voltage measurement, cell voltage measurement, temperature measurement and coulomb counting. Measurement and diagnostic tasks can be executed either on demand or periodically, with a programmable cycle interval. Measurement data is available for an external microcontroller to perform charge balancing and to compute the State Of Health (SOH) and State Of Charge (SOC). In a typical use, the IC works in normal mode performing measurement conversions, diagnostics and communication; the device can also be put into a cyclic wake up state, in order to reduce the current consumption from the battery: while in this state, the main functions are activated periodically.
Passive cell balancing can be performed either via internal discharge path or via external MOSFETs. The controller can either manually control the balancing drivers or start a balancing task with a fixed duration. In the second case, the balancing may be programmed to continue also when the IC enters a low power mode called Silent Balancing, in order to avoiding unnecessary current absorption from the battery pack.
Thanks to the GPIOs, the device also offers the possibility to operate a distributed cell temperature sensing via external NTCs resistances. In general, the GPIOs can be used to perform both absolute and differential voltage conversions. They can also be configured as digital inputs/outputs. The IC supports up to 7 NTCs.
The external microcontroller can communicate with L9963E via SPI protocol, depending on the status of one pin at the startup (SPIEN pin). The physical layer can be either a classical 4-wire based SPI or a 2-wire, transformer/ capacitive based, isolated interface through a dedicated isolated transceiver device. L9963E, in fact, can be used as a transceiver, acting as a bridge between the two physical layers. In case of multiple L9963E vertically arrayed, each L9963E communicates with the others by means of a vertical isolated interface. The microcontroller can either address a single device of the chain or send broadcast commands.
L9963E has been engineered to perform automatic validation of any failure involving the cells or the whole battery pack. The device is able to detect the loss of the connection to a cell or GPIO terminal. Moreover it features an HardWare Self Check (HWSC) that verifies the correct functionality of the internal analog comparators and the ADCs. All these checks are automatically performed in case a failure involving both cells or the battery pack is detected, in order to provide always a reliable information to the external microcontroller. The current sensing interface used for coulomb counting is also capable of detecting failures such as open wires and overcurrent in sleep mode. Conversions for coulomb counting are validated by built in self-test of the precision and detecting any counter overflow. The cell balancing terminals can detect any short/open fault and the internal powerMOS are protected against overcurrent.
The stack voltage is monitored for OV/UV by three parallel and independent system. They have been engineered to protect the IC against AMR violation, to detect any overvoltage event as per LV 148 and to provide the possibility to trim the OV/UV levels according to the application and the total number of cells. Moreover, all internal voltage regulators are equipped with UV/OV detection circuitry, that is also self-validated upon failure detection via HWSC. Ground loss detection has also been implemented. In case of overtemperature, thermal shutdown protects the IC. GPIOs are capable of detecting ‘stuck @’ faults when used as digital outputs. Communication integrity is guaranteed by CRC check, while trimming and calibration data is continuously checked against corruption. Protocol errors such as incorrect address, inconsistent frame and communication interruption will be detected.
Critical failure modes will trigger the assertion of a dedicated FAULT line (implemented via two GPIOs), propagating through the L9963E chain via external optocouplers and reaching the microcontroller. L9963E can guarantee the FAULT line integrity via a heartbeat routine.
L9963E
Device introduction
DS13636 - Rev 3
page 3/184
Figure 1. Typical application
L9963E
VBAT
GNDREF
CGND DGND
AGND ISENSEp
ISENSEm
RSENSE
S2 B2_1
C1
S1 C0
RLPF
RLPF
RDIS
RDIS
CLPF
CLPF
CESD
CESD
CELL1
CELL2
C14
S4
B4_3 C3
S3
C2
RLPF
RLPF
RDIS
RDIS
CLPF
CLPF
CESD
CESD
CELL3
CELL4
S6
B6_5
C5 S5
C4
RLPF
RLPF
RDIS
RDIS
CLPF
CLPF
CESD
CESD
CELL5
CELL6
S8 B8_7
C7 S7
C6
RLPF
RLPF
RDIS
RDIS
CLPF
CLPF
CESD
CESD
CELL7
CELL8
S10 B10_9
C9
S9 C8
RLPF
RLPF
RDIS
RDIS
CLPF
CLPF
CESD
CESD
CELL9
CELL10
S12
B12_11 C11
S11
C10
RLPF
RLPF
RDIS
RDIS
CLPF
CLPF
CESD
CESD
CELL11
CELL12
S14
B14_13
C13 S13
C12
RLPF
RLPF
RDIS
RDIS
CLPF
CLPF
CESD
CESD
CELL13
CELL14
RLPF
CESD
FR_BAT
BATT_MINUS
BATT_PLUS
CISENSE_1
VTREF
NPNDRV
VREG
CREG
CBAT_1
VCOM
CVCOM
VANA
CVANA
SPIEN
FAULTL
RFAULTL
RBAT_DOWNRFAULT_DOWN
FAULT_DOWN BAT_DOWN
DOPT
RBAT_UP
BATT_UP
FAULTH
CFLTH
RFLT
DZ_FLT
RFLT_PD
FAULT_UP
ISOHp
ISOHm
ISOLp_UP ISOLm_UP
ISOLp
ISOLm
ISOHp_DOWN
ISOHm_DOWN
RTERM
RTERM
GPIO9
RNTC
RVTREF
CNTC
RGPIO
GPIO8
RNTC
RVTREF
CNTC
RGPIO
GPIO7
RNTC
RVTREF
CNTC
RGPIO
GPIO6
RNTC
RVTREF
CNTC
RGPIO
GPIO5
RNTC
RVTREF
CNTC
RGPIO
GPIO4
RNTC
RVTREF
CNTC
RGPIO
GPIO3
RNTC
RVTREF
CNTC
RGPIO
CAP1
CAP2
CBOOT
MREG
TRANSF
TRANSF
OPT
DZBAT
CVTREF
CESD
RISENSE
RISENSE
CESD
CBAT_2
CISENSE_2
CISENSE_3
CNPN
CBAT_3
AGND
DGND
GND_ESD
PACK_GND
L9963E
Device introduction
DS13636 - Rev 3
page 4/184

2 Block diagram and pin description

GADG1010180719PS
BOOTSTRAP
DGND
VBAT
CAP1
CAP2
c14
s14
b14_13
b12_11
c13
c11
c12
s13
s11
s2
c1
c2
c0
ISENSEp
ISENSEm
GNDREF
s1
b2_1
VBAT
AGND CGND
GNDREF
CGND
CGND
CGND
AGND
AGND
DGND
DGND
GNDREF
GNDREF
GNDREF
DGND
AGND
CGND
NPNDRV
NPNDRV
Ree
Digital Control & Data Register
VDIG
VANA
VCOM
ISO
SPI
GPIO
VTREF
CSA
DIAG
ADCs
VREG
VDIG
VANA
VANA
Bal CT
Bal CT
Bal CT
Bal CT
Bal CT
Bal CT
VANA
VCOM
VCOM
VCOM
VCOM
VANA
VDIG
VDIG
VTREF
VANA
VCOM
VTREF
SPIEN
GPIO9/SDO
GPIO8/SCK
GPIO7/WAKEUP
GPIO6
GPIO5
GPIO4 GPIO3
GPIO2/FAULTL
GPIO1/FAULTH
ISOHp
ISOHm
ISOLp/SDI
ISOLm/NCS

2.1 Block diagram

Figure 2. Block diagram
L9963E
Block diagram and pin description
DS13636 - Rev 3
page 5/184

2.2 Pin description

L9963E
Pin description
Figure 3. Pin connections (top view)
DS13636 - Rev 3
Pin #
1 GPIO8_ SCK
2 GPIO9_ SDO
3 ISOLp_SDI
4 ISOLm_NCS
Pin name Description
Table 1. Pin function
General-purpose I/O / Serial clock input (SPI). Its configuration is locked to Digital Input in case SPIEN = 1. Refer to Section 4.9 General purpose I/O:
GPIOs. Generally used to sense NTCs when not configured as SPI. Refer to Section 6.9 NTC analog front end.
General-purpose I/O / Serial data output (SPI). Its configuration is locked to Digital Output in case SPIEN = 1. Refer to Section 4.9 General purpose I/O:
GPIOs. Generally used to sense NTCs when not configured as SPI. Refer to Section 6.9 NTC analog front end.
Non-inverting, low-side isolated serial communication port (isolated SPI) / Serial data input (SPI). Its configuration is locked to Digital Input in case SPIEN = 1. Refer to
Section 4.2 Serial communication interface. When used as isolated SPI, refer to Section 6.8 ISO lines circuit.
Inverting, low-side isolated serial communication port (isolated SPI) / Active low, Chip-Select input (SPI). Its configuration is locked to Digital Input in case SPIEN =
1. Refer to Section 4.2 Serial communication interface. When used as isolated SPI, refer to Section 6.8 ISO lines circuit.
I/O type
DO/DI/AI
DO/DI/AI
DI/AIO
DI/AIO
page 6/184
(1)
L9963E
Pin description
Pin # Pin name Description
I/O type
Regulated power supply used for communication interfaces. Connect a tank
5 VCOM
capacitor as indicated in Table 73. Can be used to supply external loads with a maximum I
VCOM_ext
current budget.
6 CGND Communication ground. Connect to DGND on top. G
Non-inverting, high-side isolated serial communication port. Refer to
7 ISOHp
Section 4.2.3 Isolated Serial Peripheral Interface. Refer to Section 6.8 ISO lines
AIO
circuit.
Inverting, high-side isolated serial communication port. Refer to
8 ISOHm
Section 4.2.3 Isolated Serial Peripheral Interface. Refer to Section 6.8 ISO lines
AIO
circuit.
9 DGND Digital ground. Connect to AGND on top. G
10 GPIO1_ FAULTH Digital input used for FAULTH receiver. Refer to Section 4.3 FAULT line. DI
11 GPIO2_ FAULTL Digital output used for FAULTL transmitter. Refer to Section 4.3 FAULT line. DO
12 GPIO3
13 GPIO4 AI/DI/DO
14 GPIO5 AI/DI/DO
General-purpose I/O. Refer to Section 4.9 General purpose I/O: GPIOs. Generally used to sense NTCs. Refer to Section 6.9 NTC analog front end.
AI/DI/DO
15 GPIO6 AI/DI/DO
General-purpose I/O. Refer to Section 4.9 General purpose I/O: GPIOs. Generally
16 GPIO7_ WAKEUP
used to sense NTCs. Refer to Section 6.9 NTC analog front end. Can be
AI/DI/DO
configured to act as wake up input. Refer to Section 4.9.4 GPIO7: wake up feature.
17 NPNDRV
Internal voltage regulator controller output. Connect to the base of the external NPN transistor.
AO
Regulated analog power supply for core circuitry. Connect a tank capacitor as
18 VREG
indicated in Table 73. It is disabled in low power modes (Silent Balancing, Sleep and during the OFF phase of Cyclic Wakeup). VCOM, VANA and VTREF regulators are fed by pre-regulated VREG.
19 VTREF
Buffered, precise analog reference voltage for driving multiple NTCs. Connect a tank capacitor as indicated in Table 73. It has a maximum IVTREF_ext current budget.
At first power up, after VCOM is out of undervoltage, this pin is sampled to
20 SPIEN
determine port L configuration. Connect to VCOM to configure SPI mode. Connect to AGND to select isolated SPI communication.
DI
If left floating, this pin has a 100KΩ internal Pull down, forcing isolated SPI mode.
21 VANA Precise ADC analog supply. Connect a tank capacitor as indicated in Table 73. P
22 AGND Analog/ESD ground. Ground supply of chip. G
23 ISENSEp Non-inverting input of current measurement. Refer to Table 73. AI
24 ISENSEm Inverting input of current measurement. Refer to Table 73. AI
25 GNDREF Analog/reference GND. Connect to AGND on top G
26 C0 Connect to the negative terminal of 1st cell. AI
27 C1 Cell voltage input. Connect to the positive terminal of 1st cell. AI
28 S1 Cell balancing FET control output for 1st cell. AO
29 B2_1 Common terminal for cell balancing S1 and S2. AO
30 S2 Cell balancing FET control output for 2nd cell. AO
31 C2 Cell voltage input. Connect to the positive terminal of 2nd cell. AI
32 C3 Cell voltage input. Connect to the positive terminal of 3rd cell. AI
33 S3 Cell balancing FET control output for 3rd cell. AO
34 B4_3 Common terminal for cell balancing S3 and S4. AO
35 S4 Cell balancing FET control output for 4th cell. AO
(1)
P
P
P
DS13636 - Rev 3
page 7/184
L9963E
Pin description
Pin # Pin name Description
I/O type
36 C4 Cell voltage input. Connect to the positive terminal of 4th cell. AI
37 C5 Cell voltage input. Connect to the positive terminal of 5th cell. AI
38 S5 Cell balancing FET control output for 5th cell. AO
39 B6_5 Common terminal for cell balancing S5 and S6. AO
40 S6 Cell balancing FET control output for 6th cell. AO
41 C6 Cell voltage input. Connect to the positive terminal of 6th cell. AI
42 C7 Cell voltage input. Connect to the positive terminal of 7th cell. AI
43 S7 Cell balancing FET control output for 7th cell. AO
44 B8_7 Common terminal for cell balancing S7 and S8. AO
45 S8 Cell balancing FET control output for 8th cell. AO
46 C8 Cell voltage input. Connect to the positive terminal of 8th cell. AI
47 C9 Cell voltage input. Connect to the positive terminal of 9th cell. AI
48 S9 Cell balancing FET control output for 9th cell. AO
49 B10_9 Common terminal for cell balancing S9 and S10. AO
50 S10 Cell balancing FET control output for 10th cell. AO
51 C10 Cell voltage input. Connect to the positive terminal of 10th cell. AI
52 C11 Cell voltage input. Connect to the positive terminal of 11th cell. AI
53 S11 Cell balancing FET control output for 11th cell. AO
54 B12_11 Common terminal for cell balancing S11 and S12. AO
55 S12 Cell balancing FET control output for 12th cell. AO
56 C12 Cell voltage input. Connect to the positive terminal of 12th cell. AI
57 C13 Cell voltage input. Connect to the positive terminal of 13th cell. AI
58 S13 Cell balancing FET control output for 13th cell. AO
59 B14_13 Common terminal for cell balancing S13 and S14. AO
60 S14 Cell balancing FET control output for 14th cell. AO
61 C14 Cell voltage input. Connect to the positive terminal of 14th cell. AI
62 VBAT
Power supply of chip. This pin is also sensed by internal ADC through a voltage divider. Refer to Table 73.
63 CAP2 Pin2 external bootstrap capacitance. Refer to Table 73. AI
64 CAP1 Pin1 external bootstrap capacitance. Refer to Table 73. AI
- GNDEP Ground terminal, connect to AGND plane G
1. I/O type legend: AI = Analog Input; AO = Analog Output; AIO = Analog I/O; DI = Digital Input; DO = DigitalOutput; DIO = Digital I/O; P = Power; G = Ground; NC = Not Connect.
(1)
P
DS13636 - Rev 3
page 8/184

3 Product electrical ratings

3.1 Operating range

Within the operating range the part operates as specified and without parameter deviations. The device may not operate properly if maximum operating conditions are exceeded.
Once taken beyond the operative ratings and returned back within, the part will recover with no damage or degradation, unless the AMR are exceeded.
Additional supply voltage and temperature conditions are given separately at the beginning of each electrical specification table.
All voltages are related to the potential at substrate ground AGND, unless otherwise noted.
Symbol Parameter Test conditions Min. Typ. Max. Unit
VBAT Global
VBAT, VREG, VCOM, VTREF
C0 Global Lower Cell Terminal Voltage -0.3 0.3 V
B(n,n-1); Sn Global Cell Terminal Voltage 0 VBAT V
C(n) for n=1 to 9 Global Cell Terminal Voltage 0 VBAT – 4.5 V
C(n) for n=10 to 14 Global Cell Terminal Voltage 3 VBAT + 0.3 V
C(n)-C(n-1) for n=1 to 14 Cell Terminal Differential Voltage 0 4.7 V
S(n+1)-B(n+1,n); B(n+1,n)-S(n)
for n=1 to 13 odd
C(n)-S(n) for n=1 to 14 Cell Terminal Differential Voltage 0 4.7 V
VBAT – C(14)
ISOHP/M, ISOLP/M Global -0.3 VCOM V
GPIOn Local -0.3 VCOM V
SPIEN Local -0.3 VCOM V
VTREF Local 5 V
|ISENSEP – ISENSEM| Local
|ISENSEP + ISENSEM| / 2 Local
VCOM Local 5 V
VANA Local Info only 3.3 V
VREG Local 6.5 V
NPNDRV Local VREG-0.3 VREG + 1.5 V
CAP1 Local 0 VBAT V
CAP2 Local VREG VBAT + VREG V
L9963E
Product electrical ratings
Table 2. Operating ranges
Supply voltage 9.6 64 V
Transient operation, 40 ms pulse, repetitive as per VDA320 E48-02 test.
Supply voltage in case of transceiver use only (see
Section 6.12 Transceiver mode)
Cell Balance Terminal Differential Voltage
Battery / high Terminal Differential Voltage
CSA Input Differential Mode Range
CSA Input Common Mode Range (Referenced to GNDREF)
64 70 V
4.6 5 5.4 V
0 4.7 V
-0.3 61 V
-0.15 0.15 V
-0.225 0.225 V
DS13636 - Rev 3
page 9/184

3.1.1 Supply voltage ranges

AMR Violation
•Permanent damage
•Permanent parameter deviation
Critical UV
• Params may deviate
• Balance disabled
• Transceiver usage
Dyn UV
•No param deviation
•All functions guarante ed
Normal Op
•All functions guarantee d
Dyn OV
•Cell total error slightly increased
•All functions guarantee d
Critical OV
•Params may deviate
•All functions available
AMR Violation
•Permanent damage
•Permanent parameter deviation
VBAT
- 0.3 V
5.4 V
4.6 V
9.6 V
12 V
64 V
70 V
72 V
The device operates up to 14 cells of battery for hybrid and electric vehicles. The device can cover the voltage range of the main automotive Lithium batteries, up to a maximum of 4.6 V per cell in operating conditions. The IC has been engineered to sustain transient OV events as per LV 148
All operative ranges are listed in picture below.
If the stand by V3V3 regulator goes in POR, the device is put in reset.
Figure 4. Device operation in the VBAT supply voltage ranges
L9963E

Absolute maximum ratings

3.2
Absolute maximum ratings
Exceeding any Absolute Maximum Rating (AMR) may cause permanent damage to the integrated circuit.
All voltages are related to the potential at substrate ground AGND.
Table 3. Absolute Maximum Rating
Symbol Parameter Test conditions Min. Typ. Max. Unit
VBAT, C14 - -0.3 - 72 V
C0 - -0.3 - 0.3 V
C(n); B(n,n-1); Sn - -0.3 - 72 V
In this range, the device is not damaged, but leakage from
C(n)-C(n-1) for n=1 to 14 -
C(n)-C(n-1) for n=1 to 14 -
S(n+1)-B(n+1,n) B(n+1,n)-S(n)
for n=1 to 13 odd
C(n)-S(n) for n=1 to 14 - Vreg < 2 V -72 - 72 V
VBAT-C14 - -72 - 72 V
ISOHP/M, ISOLP/M - -0.3 - 6 V
GPIOn - -0.3 - 5.5 V
SPIEN - -0.3 - 12 V
VTREF - -0.3 - 6 V
pins may exceed I (see Table 39) if ADCs are
enabled; it doesn’t exceed if ADCs are disabled
In this range, the leakage from pins I
CELL_LEAK
(see Section 6.10.5 Busbar
connection) if ADCs are
enabled or disabled
- -0.3 -
CELL_LEAK
is guaranteed
-72 - 72 V
-6 - 6 V
V
BAL_CLAMP
V
DS13636 - Rev 3
page 10/184

Temperature ranges and thermal data

Symbol Parameter Test conditions Min. Typ. Max. Unit
ISENSEP/M - -0.3 - 4.5 V
VCOM - -0.3 - 6 V
VANA - -0.3 - 4.5 V
VREG - -0.3 - 12 V
NPNDRV - -0.3 - 12 V
CAP1 - -0.3 - VBAT + 0.3V V
CAP2 - VREG – 0.3V - VBAT + 7V V
DGND, CGND - -0.3 - + 0.3 V
GNDREF shorted to AGND - -
Table 4. ESD protection
Item Parameter Test conditions Min. Typ. Max. Unit
All pins Except Isolated
Communication Terminals and
Global pins
Isolated Communication
Terminals
(1)(2)
(1)
and Global pins
-
HBM
(2)
versus all GND+EP connected
All pins except Corner Pins
Corner Pins -750 - 750 V
All pins -
-
(3)
CDM
Latch up
(4)
1. Tested per AEC-Q100-002.
2. Isolated Communication Terminals: ISOHP, ISOHM, ISOLP_SDI, ISOLM_NCS.
3. Tested per AEC-Q100-011.
4. Tested per AEC-Q100-004, Class-2, Level-A.
-2 - 2 kV
-4 - 4 kV
-500 - 500 V
-100 - 100 mA
L9963E
3.3
Pins are all GND connected together.
Temperature ranges and thermal data
Table 5. Temperature ranges and thermal data
Symbol Parameter Test conditions Min Max Unit
T
amb
T
J
T
stg
T
ot
T
ot
O
Thys
R
Thj-amb
1. In “2s2p”, the “s” suffix stands for “Signal” and the number before indicates how many PCB layers are dedicated to signal wires. The “p” suffix stands for “Power” and the number before indicates how many PCB layers are dedicated to power planes.
Operating and testing temperature (ECU environment) - -40 105 °C
Junction temperature for all parameters - -40 125 °C
Storage temperature - -65 150 °C
Thermal shut-down temperature (junction) - 175 200 °C
Temperature ADC accuracy - -10 +10 °C
Thermal shut-down temperature hysteresis - 5 15 °C
Thermal resistance junction-to-ambient
(1)
- 22 °C/W
DS13636 - Rev 3
page 11/184

3.4 Power management

All parameters are tested and guaranteed in the following conditions, unless otherwise noted:
9.6 V < VBAT < 64 V; -40 °C < Tambient < 105 °C
Symbol Parameter Test conditions Min. Typ. Max. Unit
I
BAT_NORM
in Normal Mode from VBAT pin
I Current in Normal Mode from
I
REG_NORM_CSEN1
Current in Normal Mode from
I
REG_NORM_CSEN0
Current in Normal Mode from
I
Supply Current in Normal Mode
I
Supply Current in Normal Mode
I
supply current drawn from VREG
I
BAT_SLP
, Total Supply Current
BAT_NORM_ADC
, Total Supply
VBAT pin
, Total Supply
VREG MOS
, Total Supply
VREG MOS
REG_NORM_ADC_CSEN1
from VREG MOS
REG_NORM_ADC_CSEN0
from VREG MOS
REG_NORM_COMM
, Additional
for communication
, Supply Current in Sleep
Mode
I
BAT_SLP_BAL_CONF
I
BAT_BALANCE
, Total
, Total
Figure 5. Sketch of a 2s2p PCB with thermal vias
Table 6. Power Management
Normal state (refer to Section 4.1 Device
functional state); no load on VTREF; the chip
performs continuously data transmission via isolated communication interfaces to higher and lower sides
-
in a stack daisy chain.
Application info: IBAT is not affected by communication. Current needed for COM interfaces is drawn out of VREG regulator.
Normal state; No load on VTREF; no
-
communication; The chip performs continuously sampling and converting.
Normal state; No load on VTREF; no
-
communication; no ADC conversion; Curr sense. Enabled by coulombcounter_en = 1
Normal state; No load on VTREF; no
-
communication; no ADC conversion; Curr sense Disabled by coulombcounter_en = 0
Normal state; No load on VTREF; no communication; The chip performs continuously
­sampling and converting. Curr sense Enabled by
coulombcounter_en = 1
Normal state; No load on VTREF; no communication; The chip performs continuously
­sampling and converting. Curr sense Disabled by
coulombcounter_en = 0
Normal state; No load on VTREF; The chip performs continuously data transmission via isolated communication interfaces to higher and
­lower sides in a stack daisy chain. (measured
with out_res_tx_isoh/l = 11, highest differential amplitude, highest consumption).
Lowest power state; Both internal oscillator and
­external wakeup detection on.
Supply Current in Silent Balance Mode (enabled only regulators necessary to bias balance
­preregulators, refer to Section 4.1 Device
functional state).
Delta current when the balancing of all 14 cells are
­act ivated.
L9963E
Power management
1 2.5 mA
5.5 9 mA
21 mA
20 mA
38 mA
37 mA
8 10.8 13 mA
10 50 µA
1.2 2 2.8 mA
0.4 0.55 0.7 mA
DS13636 - Rev 3
page 12/184
Power management
Symbol Parameter Test conditions Min. Typ. Max. Unit
I
REG_GPIO_DIGOUT
Delta current from VREG pin needed to use 1 GPIO
­as digital output.
0.4 0.8 1.2 mA
Average DC current consumption in application can be estimated according to the following equations:
Estimation of the average DC current consumption in application
=
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L9963E
(1)
DS13636 - Rev 3
page 13/184

4 Functional description

In the following paragraphs, the functionalities of the device are listed and described in detail.

4.1 Device functional state

L9963E
Functional description
Figure 6. Device functional states

4.1.1 Reset and Sleep states

Reset state: when stand-by logic is reset, all registers on device are reset.The battery voltage is still under
threshold.
From here, as soon as the PORN_STBY goes high the Stby Logic gets its supply power and the Sleep state is reached.
4.1.1.1 Operations in Reset state
No operation is possible in Reset state
Sleep state:
This state is reached:
coming from Reset state on PORN_STBY rising
from other states in case a Go2SLP cmd is sent by uP or no communication is received for t > t_SLEEP
from Init State in case the device address is still 0b0000 after t > t_SHUT
from Cyclic_Wup state once the Cyclic Wup job is done and a silent balancing is not to be resumed.
In this state the device is sensitive to External Sources in order to wake up the Main Logic. External sources are: ISO lines, Fault line, SPI_CS (SPI_CLK) pins, also a GPIO pin for “Master” units.
In this state a slow oscillator is working allowing the device to wake itself up every t = t
DS13636 - Rev 3
t
CYCLIC_WUP
and move to Cyclic Wup state.
CYCLIC_SLEEP
+
page 14/184
L9963E
Device functional state
During Sleep state, the current consumption is significantly reduced to I Communication wake up sources monitoring, low-speed oscillator for cyclic wake up timer, and the corresponding
reference and power supply are activated.
Different events can cause a wake up, depending on the configuration decided by the microcontroller:
ISO COMM/ SPI SIGNAL: this wake-up during a regular SLEEP mode state moves the L9963 FSM to Init or Normal State. A proper signal will be detected as pre-wake up (simple edge readout), and later it must be followed by a wake-up signal that will be decoded by the L9963 which, in the meanwhile, has entered in a higher consumption mode (regulators turned ON, isolated RX/TX enabled). Any protocol frame recognized as electrically consistent will wake up the device. However, the command will not be interpreted and thus no execution takes place;
INTERNAL COUNTER: it is possible that the microcontroller defines an automatic wake up of L9963 (when put in SLEEP mode) every T
state;
GPIO SIGNAL: In case GPIO7 is configured as wake up source (GPIO7_WUP_EN = 1), a high logic level on it will wake up L9963;
FAULT: in case a fault is detected in an upper L9963, a proper signal is communicated through the FAULT line. The receiver connected to GPIO1/FAULTH pin will detect the event and the device will be forced to evolve into the normal state, in order to transmit the fault downward.
The wake-up event coming from external wake up sources is verified by the stby logic (pattern confirmation step) before waking up the main logic (the main logic is kept under reset and its clock is gated off until the Sleep state is left).
The wakeup sequence lasts T
4.1.1.2 Operations in Sleep state
Only the Stand-by logic is working in Sleep state.
CYCLE_SLEEP
WAKEUP
current value: only the
SLEEP
, in order to perform the diagnostics in the CYCLIC WAKEUP
.
Wake up Management Always ON
Awakening Pattern Detection Once Comparison logic

4.1.2 Init state

In Init state, after having been woken up, the device waits for the uP to send the Address assignment command. Refer to Section 4.1.2.2 Addressing procedure.
If the address command is received before the Init timer expires (t_SHUT), the device address is stored into a stand-by logic register (chip_ID) and the device goes to Normal state.
The chip_ID field is then locked and no longer editable. Two actions can correctly re-initialize the device (including the chip_ID):
Hard reset: (POR_STBY)
Soft reset: it is recommended to set SW_RST and GO2SLP in the same frame
Note that Soft reset will leave communication timeout (CommTimeout) unmodified
Note that Soft reset will also clear the chip_ID
If only SW_RST is sent, the device will wait for CommTimeout and then move to Sleep state
If the Init timer (t_SHUT) expires before the command is received, the device goes back to Sleep state.
All references are powered, interfaces are ready data transmission. The commands sent by the micro-controller can be read from both ISO lines and SPI pins. However, while in Init state, only the chip_ID, isotx_en_h and iso_freq_sel fields are writable. It is not possible to write/read other registers.
Any failure is masked until the device receives an address.
Table 7. Operations in Sleep state
Operation Timing mode Functions involved
Timers, Pin Input Buffer and ISO lines receiver ON. External sources activity detection, receivers and input buffers powered
DS13636 - Rev 3
page 15/184
4.1.2.1 Operations in Init state
Set X = 1
Send
BROADCAST
command
with
out_res_tx_is
o = XX ,
iso_freq_sel =
11
Send WRITE
command
with
chip_ID =
N
DEVICES
with
Farthest_Un
it = 1 (if not
in dual ring system, set
also
isotx_en_h
= 0 )
Send
BROADCAST
command
with
Lock_isoh_iso
freq = 1 to
lock the ISOH
port and ISO
frequency
configuration
s
Here below a list of operations the device can perform during Init State.
Operation Timing mode Functions involved
Communication Always ON SPI/isolated SPI Logic and storage
Init Timeout Always ON t_SHUT timer
4.1.2.2 Addressing procedure
The following algorithm describes the correct daisy-chain addressing procedure for a stack of N
Table 8. Operations in Init state
Figure 7. Daisy chain addressing algorithm
L9963E
Device functional state
DEVICES
:
Switching to high frequency (iso_freq_sel = 11) before initialization procedure has been completed is not recommended, since it might prevent other units from being initialized.
Once initialization procedure is done, it is possible to lock ISOH port status and ISO frequency configuration by setting Lock_isoh_isofreq = 1: the lock adds more safety against unwanted write access to iso_freq_sel and
isotx_en_h bit in DEV_GEN_CFG register.

4.1.3 Normal state

All references are powered, and the ADCs and interfaces are ready for measurement and data transmission respectively. The commands sent by the micro-controller can be read from both ISO lines and SPI pins.
On receiving a valid command, the L9963 executes the corresponding operations, such as voltage, current and over-temperature measurement.
Some core safety operations (e.g. OV, UV, OT, UV, and VBAT monitoring) are checked in the background automatically.
In case the communication with MCU is missing for t > t_SLEEP (programmable via CommTimeout, maskable via comm_timeout_dis) or a GO2SLP command is received, the device moves either to Sleep state or to Silent
Balancing state, depending on slp_bal_conf bit and balancing state.
DS13636 - Rev 3
page 16/184
A Soft RESET command received when in Normal state clears all registers except CommTimeout. The device is kept in Normal and doesn’t move to Reset state.

4.1.4 Power up sequence

Final Normal state is reached through a power up sequence, which involves the turn ON of all regulators. The following power up sequence is performed correctly if VBAT pin voltage lays in the operating range (refer to
Table 3):
VREG is the first regulator to turn ON
As soon as VREG reaches enough voltage dynamic (> 3V), also VANA regulator starts to turn ON
When VANA regulator voltage reaches V T
VTREF_DELAY
After T connected to VREG, CAP1 to GND)
After T
Normally, the power up sequence lasts T back to a low power state (Sleep or Silent Balancing, depending on the previous state). The following timeouts
are implemented:
timeout_VCOM_UP_first, valid only for the first power up
timeout_VCOM_UP, valid for each wake up
timeout_OSCI_MAIN, valid for each wake up
During power down:
VCOM, VTREF and Bootstrap are turned off at the same time
VREG is turned off after T
When VREG falls below 4 V (typical value), VANA starts falling along with VREG.
expires, VTREF regulator is turned ON
BOOT_DELAY
VCOM_DELAY
Device functional state
VANA_UV
threshold and related digital filter time T
POR_FILT
in respect to VTREF enable, Bootstrap circuit is enabled in charge phase (CAP2
in respect to VTREF enable, VCOM regulator is turned ON
WAKEUP
VREG_OFF
. In case it lasts longer than a specific timeout, the device moves
L9963E
+
Figure 8. Power up Sequence
DS13636 - Rev 3
page 17/184
The device is still able to communicate if VTREF and Bootstrap power up fails: VCOM regulator is started anyway. It is not recommended to send any SPI frame to the device before T
L9963E is still performing the power up routine might be discarded.

4.1.5 Silent Balancing state

There is the possibility to perform the balancing of one (or more) cells with a reduced current consumption with respect to doing that in Normal mode: this state is called Silent Balancing.
In Silent_Bal the same resources as in Sleep state are active, in addition to the balance predrivers and the necessary bias circuitry.
To enter in Silent Balancing state from Normal state, the following conditions shall be verified:
1. Cell balancing must be ON
2. The slp_bal_conf flag shall be set to ‘1’
3. A “go to sleep” condition shall be verified (either an explicit GO2SLP command or communication timeout expiration)
If a cell balancing is previously demanded in Normal mode and the slp_bal_conf flag is set to 1, when a condition to go to sleep (low consumption) occurs the device enters Silent Balancing, not Sleep state and the required cell-balancing starts (or continues).
3 possible leaving ways from Silent Balancing mode:
any wake up signal on communication or FAULT Line can force the chip to stop the balancing and then go back to the Normal state. Any protocol frame recognized as electrically consistent will wake up the device. However, the command will not be interpreted and thus no execution takes place.
An external Fault must bring the device to Normal state and stop the balancing.
As soon as the required balancing target is finished, the EOB (End of Balancing) bit is set to one and the chip enters the Sleep state.
If the Cyclic signal is raised the device goes to Cyclic_Wup state, runs the diagnosis then it goes back to Silent Balancing (if slp_bal_conf flag = 1) where the balancing resumes
WAKEUP
L9963E
Device functional state
expires. Any incoming frame while
4.1.5.1 Operations in Silent Balancing state
Here below a list of operations the device can perform during Silent Balancing state.
Table 9. Opeations in Silent Balancing state
Operation Timing mode Functions involved
Balancing low power Always ON Balancing timer, Drivers ON, Balance short comparators
Wakeup management Always ON Wakeup logic and wakeup sources interfaces ON

4.1.6 Cyclic wake up state

From both Sleep and Silent Balancing states, the device moves periodically (once every t Cyclic_Wup state in order to perform a fault monitoring.
Diagnostic checks are done in this state as well as always-on monitorings. ADC must be ON to check possible critical battery conditions. Any detected fault moves the device to the Normal state.
An “On-demand” operation is only possible once the device has moved to Normal in case of any detected fault
Possible ways to leave this state:
Any fault detected during this mode moves the device to the Normal state.
A wake up from Fault line or Comm lines moves the device to the Normal state. Any protocol frame recognized as electrically consistent will wakeup the device. However, the command will not be interpreted and thus no execution takes place
If the defined monitoring tasks are finished, the device can move to the SLEEP or SILENT BALANCING states automatically based on the state before Cyclic Conversions (slp_bal_conf flag).
CYCLIC_SLEEP
) to
4.1.6.1 Operations in Cyclic wake up state
Here below a list of operations the device can perform during Cyclic wake up state.
DS13636 - Rev 3
page 18/184
L9963E
Device functional state
Table 10. Operations in Cyclic Wakeup state
Operation Timing mode Functions involved
Battery fast OV/UV Always ON Threshold Comparator
Battery OV/UV Once ADCV measurements vs. threshold
Cells OV/UV Once ADCV measurements vs. threshold
GPIO OT/UT Once ADCV measurements vs. threshold
OC Monitor Always ON ADCC measurements vs. threshold
OT Monitor Always ON ADCT measurements vs. threshold
GPO Short Detection Always ON Logical Comparison
Clock Monitor Always ON Frequency comparison to secondaty monitor
Downward Fault Signalling Always Receivers and Transmitters
Cell Open Once ADCV measurements vs. threshold
Balancing Open Once Voltage Comparator, Timer
Wake up Management Always ON Wake up logic and wakeup sources interfaces ON
Cyclic operations have their own periods written by MCU in specific SPI registers.
In case the “On-demand” and “cyclic” timing modes are both possible, an “on-demand” command starts a single operation immediately, breaking the cyclic period, and resets the cyclic counter.
In GPIO short detection the detection is guaranteed only in the duty phase, if the pin is configured as an output.

4.1.7 Sleep parameters

All parameters are tested and guaranteed in the following conditions, unless otherwise noted:
9.6 V < VBAT < 64 V; -40 °C < Tambient < 105 °C
Symbol Parameter Test conditions Min. Typ. Max. Unit
T
GPIO7_WAKEUP
T
UV_SHORT_DELAY
T
WAKEUP
t_SHUT Tested by SCAN 60 s
t_SLEEP_00
t_SLEEP_01
t_SLEEP_10
t_SLEEP_11
t
CYCLIC_SLEEP_000
t
CYCLIC_SLEEP_001
t
CYCLIC_SLEEP_010
Table 11. Sleep parameters
GPIO7 deglitch filter when used as Wakeup Source
Delay after POR. Used to latch VCOM_UV and VTREF_UV
Time necessary to complete Wake up from SLEEP mode (between Wake up source and VCOM out of UV condition)
Communication Timeout
CommTimeout = 00
Communication Timeout
CommTimeout = 01
Communication Timeout
CommTimeout = 10
Communication Timeout
CommTimeout = 11
Tested by SCAN 150 μs
Tested by SCAN 40 μs
2 ms
Tested by SCAN 32 ms
Tested by SCAN 256 ms
Tested by SCAN 1024 ms
Tested by SCAN 2048 ms
Tested by SCAN 100 ms
Tested by SCAN 200 ms
Tested by SCAN 400 ms
DS13636 - Rev 3
page 19/184
L9963E
Serial communication interface
Symbol Parameter Test conditions Min. Typ. Max. Unit
t
CYCLIC_SLEEP_011
t
CYCLIC_SLEEP_100
t
CYCLIC_SLEEP_101
t
CYCLIC_SLEEP_110
t
CYCLIC_SLEEP_111
T
VREG_OFF
FMAIN_OSC_stby Internal standby Oscillator frequency 20 32 45 KHz
FAUX_OSC_stby Internal standby redundant Oscillator frequency 20 32 45 KHz
timeout_VCOM_UP_first
timeout_VCOM_UP
Timeout at first power up. From wakeup event to VCOM_UV release
Default power up timeout. From wakeup event to VCOM_UV release
timeout_OSCI_MAIN From wakeup event to main oscillator stable Tested by SCAN 10 ms
timeout_POR_MAIN VANA settling time timeout Tested by SCAN 1.5 ms
T
BOOT_DELAY
T
VTREF_DELAY
T
VCOM_DELAY
T
WAKEUP_TIMEOUT_ISO
T
WAKEUP_TIMEOUT_SPI
T
WAKEUP_NCS_HIGH
Delay between VTREF enable and Bootstrap enable
Delay between VANA_UV release (POR_STBY asserted after T
POR_FILT
) and VTREF enable
Delay between VTREF enable and VCOM enable
Timeout of the pulse counter for wakeup detection (isolated SPI)
Timeout of the pulse counter for wakeup detection (SPI)
Minimum NCS high time before sending SPI wake up frame
Tested by SCAN 800 ms
Tested by SCAN 1600 ms
Tested by SCAN 3200 ms
Tested by SCAN 6400 Ms
Tested by SCAN
1280
0
Tested by SCAN 500 μs
Tested by SCAN 8 ms
Tested by SCAN 4 ms
Tested by SCAN 200 μs
Tested by SCAN 630 μs
Tested by SCAN 400 μs
Tested by SCAN 282 μs
Tested by SCAN 84 138 μs
Tested by SCAN 400 μs
Ms

4.2 Serial communication interface

Two types of serial communication ports are included in L9963E: SPI and isolated interface:
SPI can be used for the local communication between MCU and the closest L9963E
Isolated SPI can be used for the global communication between several L9963E stacked in a daisy chain
Refer to Section 6.11 Communication architectures for all the different application scenarios.
The frequencies on the 2 communication interfaces are different and not related.
From micro-controller point of view a daisy chain of many L9963E devices is controlled as a single device addressable by using both the device ID and the device’s internal register addresses.

4.2.1 Communication interface selection

Two communication ports are available:
Port H: implemented via the ISOHp and ISOHm pins. It always works as Isolated SPI interface. It can be enabled by setting isotx_en_h = 1
Port L: implemented via the ISOLp_SDI, ISOLm_NCS, GPIO8_SCK, GPIO9_SDO pins. It is always enabled and its configuration is latched upon first powe up and depends on the SPIEN pin
DS13636 - Rev 3
page 20/184
L9963E
Serial communication interface
Table 12. Port L configuration determination
Electrical condition Latched when Configuration Wake up source
SPIEN = 1
SPIEN = 0 (default
condition if pin is left
floating)
Upon VCOM_UV release
Upon VCOM_UV release
In case the first power up fails and L9963E comes back to Sleep state without having latched the PORT L operating mode, both wake up sources will be kept active in order to allow subsequent power up trigger in both operating configurations.
When first power up completes successfully, only the wake up source related to the units with SPIEN = 1 are Master units of the daisy chain. A Master Unit differs from the Slave ones (SPIEN = 0) because:
It manages the asynchronicity between SPI CLK and the programmable bit-rate on the isolated line;
It exploits an internal buffer to store answers received from the slaves on ISOH port;
It implements timeout mechanisms and frame error checks described in Section 4.2.4.4 Special frames;
It forwards commands only if they are addressing Slave units. Any command addressed to the Master unit is not propagated on the ISOH port;
In case Master Unit has port H disabled (isotx_en_h = 0), trying to communicate with a Slave unit will return the corresponding Master’s register content;
Interaction between Port H and Port L is managed by L9963E. The IC is capable of converting analog signals incoming on the isolated twisted pair to digital signals suitable for SPI, and viceversa. Passing a signal through a single unit takes a single pulse period (2*T
programmed operating frequency), which can be used to account for the insertion delay of an L9963E in the daisy chain.
Port L configured as SPI. Master Unit. SPIEN must be connected to VCOM
Port L configured as isolated SPI. Slave Unit. SPIEN must be connected to AGND
BIT_HIGH_LOW_FAST
or 2*T
BIT_HIGH_LOW_SLOW
SPI wake up logic
ISOL wake up
comparator
, depending on the
4.2.1.1 Wake up via communications interface
To wake up the device from low power modes, any communication frame in low frequency (F
ISO_SLOW
) can be
sent:
If port L is configured in SPI mode, a sequence of at least 37 clock pulses on SCK line with active low chip select NCS will wake up the device. Pulses must be received within T
WAKEUP_TIMEOUT_SPI
timeout starting
from the NCS assertion. Before sending the wake up frame, NCS must have been set high for at least T
WAKEUP_NCS_HIGH.
If port L is configured in isolated SPI mode, a sequence of at least 37 differential pulses on ISOLP/ISOLM pins, whose minimum duration is T
DET_MIN_WU
up the device. Pulses must be received within T
and whose amplitude is greater than Wakeup_thr will wake
WAKEUP_TIMEOUT_ISO
timeout starting from the first valid
pulse.
If port H is enabled, a sequence of at least 37 differential pulses, whose minimum duration is T
DET_MIN_WU
and whose amplitude is greater than Wakeup_thr will wake up the device. Pulses must be received within T
WAKEUP_TIMEOUT_ISO
timeout starting from the first valid pulse.
Note: Depending on pulses re-synchronization uncertainty with the internal standby oscillator, the wake up event may
occur even if COM pulses are less than 37 (min. number of pulses in the best case is 8). However, 37 pulses will always guarantee a correct wake up.
In case first power up fails and SPIEN value is not correctly latched, port L will listen to both wake up sources, until a correct power up sequence is achieved and port L configuration is determined.

4.2.2 Serial Peripheral Interface (SPI)

The SPI pinout is listed in the following table:
DS13636 - Rev 3
Table 13. L9963E pin used as SPI
L9963E pin SPI function Configuration
ISOLp_SDI Serial Data Input (SDI) Digital input
page 21/184
L9963E pin SPI function Configuration
ISOLm_NCS Chip Select (CS) Digital input. Active low.
GPIO8_SCK Serial Clock (SCK) Digital input.
GPIO9_SDO Serial Data Out (SDO) Digital output
A 40-bit frame is used including a 7-bit CRC.
Refer to Section 4.2.4 SPI protocol details for further details about the protocol.
Table 14. SPI interface quick look
Parameter Description
Protocol Out of frame
Single Frame Length 40 bit
Addressable Devices 15
Frame protection 7 bit CRC
Max. Frequency 5 MHz
CPOL 0
CPHA 0
Master/Slave configuration MCU Master / L9963E Slave
L9963E
Serial communication interface

4.2.3 Isolated Serial Peripheral Interface

The Isolated SPI interface allows units with different ground levels and on different boards to communicate with each other. Physically the interface is based on twisted-pair wire with transformer isolators.
The isolated SPI pinout is listed in the following table:
Pin SPI Function Configuration
ISOLp_SDI Port L positive differential input/output Analog input/output
ISOLm_NCS Port L negative differential input/output Analog input/output
ISOHp Port H positive differential input/output Analog input/output
ISOHm Port H negative differential input/output Analog input/output
Table 15. Isolated SPI pinout
DS13636 - Rev 3
page 22/184
Figure 9. Isolated SPI interface
L9963E
Serial communication interface
Table 16. Isolated SPI quick look
Parameter
Protocol Half-Duplex / Out of frame
Single Frame Length 40 bit
Addressable Devices 31
Frame protection 6 bit CRC
Max. Bit-rate
Master/Slave configuration L9963E Slave
2.66 Mbps (high speed configuration)
333 kbps (low speed configuration, default)
Description
The transmission line on the isolated SPI exploits a single twisted pair. Communication data is transmitted/ received over a pulse-shaped signal, in a half-duplex protocol.
Line bit-rate can be selected by programming the iso_freq_sel bit via SPI. A single bit is made of a pulse time (T
T
T
) followed by two pause slices (2T
PULSE
= 2T
PULSE
PULSE
BIT_HIGH_LOW_FAST
= 2T
BIT_HIGH_LOW_SLOW
).:
PULSE
for the high speed configuration
for the low speed configuration
Once the operating frequency has been programmed and the ISOH port has been enabled/disabled, it is possible to lock these settings by writing the Lock_isoh_isofreq bit to ‘1’, to avoid unwanted changes due to wrong MCU write frame.
Lock_isoh_isofreq is added to the reg map into a separate register in respect to isotx_en_h and iso_freq_sel, in order to avoid that a single frame can both unlock and write fields
Lock_isoh_isofreq bit (default 0) is reset every time the device goes to a low power mode. When Lock_isoh_isofreq is set to ‘1’, isotx_en_h and iso_freq_sel bits are write protected
Architecture and MCU command’s time constraints are specified taking into account signal propagation delay over the communication bus. Refer to Inter-frame delay for further details.
DS13636 - Rev 3
page 23/184
Serial communication interface
Figure 10. Isolated SPI pulse shape and logical meaning
L9963E
4.2.3.1 ISO communicator receiver and transmitter
An isolated receiver and transmitter are connected to the couple of pins ISOLP/M and ISOHP/M. Depending on the communication phase, they can be enabled or disabled.
4.2.3.1.1 ISO communicator receiver
The receiver is able to convert a differential input signal into a single ended signal that is provided to the logic.
In order to guarantee a correct communication and guarantee Wake up via Communication Interface the input common mode must be included into range V
At power up by default the device is configured for a low frequency communication (F F
ISO_FAST
can be configured by acting on the iso_freq_sel bit.
4.2.3.1.2 ISO communicator transmitter
The transmitter is able to force as differential output the single ended signal that is provided by the logic.
Transmitter output impedance can be programmed via out_res_tx_iso (R
Table 18. It affects differential pulse amplitude. In order to guarantee a correct communication in case of high
frequency configuration the bit length must be at least T a single bit into a period T
BIT_LENGTH_FAST
In case of low frequency configuration T
must be T
BIT_LENGTH_SLOW
4.2.3.2 Dual access ring
L9963E supports dual access ring topology (refer to Section 6.11.3 Dual access ring for the application scenario). The device accepts commands from both ports (ISOL/SPI and ISOH ports) and generates answers in both directions.
This kind of functionality is present by default and can not be disabled.
In the typical application scenario featuring a number of N devices (referred to as bottom and top Masters), while the remaining are configured as isolated SPI slaves (refer
to Section 4.2.1 Communication interface selection for Master and Slave behavior).
Referring to Figure 51, the Section 4.1.2.2 Addressing procedure follows the standard approach, except for the top Master, that must be initialized through its own SPI interface.
Once the initialization is complete, MCU is able to communicate with any Slave through any of the 2 Masters SPI interface. It is also possible to verify the loop integrity, accessing one Master through the opposite one.
In case the access to a Slave is performed exploiting the bottom Master, the corresponding answer must be retrieved through the bottom Master itself (the same applies for the dual case of the top Master).
CM_ISO_IN
.
BIT_LENGTH_FAST
BIT_HIGH_LOW_FAST
and T
BIT_HIGH_LOW_SLOW
DEVICES
L9963E, two of them are configured as SPI
ISO_SLOW
DIFF_ISO_OUT1…3
); higher frequency
), as described in
and the duration of high and low level of .
are valid.
DS13636 - Rev 3
page 24/184
4.2.3.3 Electrical parameters
4.2.3.3.1 Receiver
All parameters are tested and guaranteed in the following conditions, unless otherwise noted:
9.6 V < VBAT <64 V; -40 °C < Tambient < 105 °C
Symbol Parameter Test conditions Min. Typ. Max. Unit
V
DIFF_ISO_IN3
V
CM_ISO_IN
R
ISO_DIFF
R
ISO_EXT
I
ISO_LEAK
T
DET_MIN_WU
Wakeup_thr Wake up comparator threshold 80 200 320 mV
Differential input voltage threshold |V(ISOP) – V(ISOM)| 100 250 400 mV
Input voltage common mode range
Differential input resistance
External termination resistance connected between ISOxP and ISOxM pins
ISO input leakage current 0 V < ISOHP/M, ISOLP/M < VCOM 5 μA
Minimum pulse duration to be detected
Table 17. Isolated receiver electrical parameters
|V(ISOP) + V(ISOM)| /2
Design info
VIF enabled, no communication Resistance measured between ISOP and ISOM pins
Info only, not tested 120 Ω
Application info 400 ns
L9963E
Serial communication interface
0 1.9 V
5 15
4.2.3.3.2 Transmitter
All parameters are tested and guaranteed in the following conditions, unless otherwise noted:
9.6 V < VBAT < 64 V; -40 °C < Tambient < 105 °C
Symbol Parameter Test conditions Min. Typ. Max. Unit
R
DIFF_ISO_OUT1
R
DIFF_ISO_OUT2
R
DIFF_ISO_OUT3
V
CM_ISO_OUT
T
BIT_HIGH_LOW_FAST
T
BIT_HIGH_LOW_SLOW
T
BIT_LENGTH_FAST
T
BIT_LENGTH_SLOW
F
ISO_FAST
Table 18. Isolated transmitter electrical parameters
R
measured with
pullup
Total output resistance: sum of pullup and pulldown resistance contribution
Output voltage common mode |V(ISOP) + V(ISOM)|/2 1 1.4 V
High/low level bit duration into a whole period in case of high frequency configuration
High/low level bit duration into a whole period in case of low frequency configuration
Bit duration with high frequency configured
Bit duration with low frequency configured
Isolated Communication Rate
V(ISOHL/MP) = 1.5 V
R
pulldown
measured with
310 440 570 Ω
V(ISOHL/MP) = 0.9 V (out_res_tx_iso = 00, default)
(out_res_tx_iso = 01) 220 314 410 Ω
(out_res_tx_iso = 11) 170 244 310 Ω
Application info
iso_freq_sel = 11
Application info
iso_freq_sel = 00
Guarantee by SCAN
iso_freq_sel = 11
Guarantee by SCAN
iso_freq_sel = 00
High frequency communication
Application info
62.5 ns
500 ns
375 ns
3 μs
2.66 Mbps
DS13636 - Rev 3
page 25/184
Symbol Parameter Test conditions Min. Typ. Max. Unit
F
ISO_SLOW
T
ANSWER_DELAY_FAST
TANSWER_DELAY_SLOW
Isolated Communication Rate
Delay between receival of a command and generation of the answer
Delay between receival of a command and generation of the answer
For terminals ISOHP/M, and ISOLP/M
iso_freq_sel = 11
Low frequency communication
Application info
For terminals ISOHP/M, and ISOLP/M
iso_freq_sel = 00
High speed mode Guarantee by SCAN
iso_freq_sel = 11
Low speed mode Guarantee by SCAN
iso_freq_sel = 00
L9963E
Serial communication interface
333.3 Kbps
4.5 μs
9 μs
DS13636 - Rev 3
page 26/184

4.2.4 SPI protocol details

The protocol is out-of-frame in order to manage the propagation delay of the commands sent by MCU and the answers generated by the L9963E stacked in the vertical interface. A command sent at the N-th frame will receive its feedback at the (N+1)th frame.
MCU can access the devices in different ways.
4.2.4.1 Single access
The single access behavior is based on a Write and Read approach.
The execution of each WRITE command sent by MCU can be immediately verified by interpreting the answer incoming from the addressed device. Any reply is buffered into L9963E Master unit, which passes it to the MCU on its next command.
L9963E
Serial communication interface
Figure 11. Out of frame protocol description
Table 19. SPI protocol: single access addressed frame (write and read)
393837363534333231302928272625
Dev ID Address
P.A.=1
P.A.=0
R/W
Dev ID Address feedback
Burst = 0
MOSI
MISO
Figure 12. Write and read access
24232221201918171615141312
GSW
GSW
DATA WRITE CRC
DATA READ CRC
987654321
11
10
0
DS13636 - Rev 3
READ commands require the same inter-frame time as the WRITE ones. Any reply is buffered into L9963E Master unit, which passes it to the MCU on its next command.
page 27/184
Figure 13. Single read access
Frame fields are described in the table below:
Table 20. Single access frames field description
L9963E
Serial communication interface
Field Length Value Description
P.A. 1 bit
R/W 1 bit
Dev ID 5 bit From 0x1 to 0x1F Identifies the x-th L9963E unit in a daisy chain
Address
Address
feedback
GSW 2 bit From 0x0 to 0x3 Refer to Section 4.2.4.5 Global Status Word (GSW)
DATA WRITE 18 bit Depends on the register
CRC 6 bit From 0x00 to 0x3F
Burst 1 bit 0 Answer to a single access command
DATA READ 18 bit Depends on the register
0 Answer sent by any Slave unit (MISO)
1 Command sent by Master unit (MOSI)
0 Read
1 Write
7 bit From 0x00 to 0x5F Identifies the y-th register of the device
Data to be written in the y-th register of the x-th device. It is discarded in case of READ command.
CRC calculated on the [39-7] field of the frame. Refer to
Section 4.2.4.6 CRC calculation
Answer containing the data read from the y-th register of the y-th device
DS13636 - Rev 3
page 28/184
4.2.4.2 Burst access
1
st
MOSI
Dummy Frames (all zeroes) Last MOSI
1
st
MISO
Burst Answer
NCS
SCK
MOSI
MISO
T
WAIT
The Burst Access supports only READ commands. It can be used to reduce the time needed to readout long data series from a single unit. The addressed unit receives the Burst command and starts replying the requested data frame by frame towards the MCU. Any reply is buffered into L9963E Master unit, which passes it to the MCU on its next command.
L9963E
Serial communication interface
Figure 14. Burst access
Table 21
describes the burst frame sequence.
In case L9963E is configured in SPI mode, its internal buffer will store answers incoming from upper units. Apply the following strategy to download the burst data:
First frame (sent with a single NCS window as a normal command)
First MOSI contains the corresponding Burst command (see Table 23 for available commands)
First MISO stores the answer to the previous MCU command, as per out-of-frame behavior
Wait for burst answer to come back to the Master unit
400 μs (in case iso_freq_sel = 11)
3 ms (in case iso_freq_sel = 00)
Intermediate frames (all downloaded keeping NCS low)
Intermediate MOSI can be dummy commands (e.g. all zeroes). They are not interpreted by the
L9963E SPI logic
Intermediate MISO contain burst data formatted as in Table 21
Last frame (attached to intermediate frames, keeping NCS low)
Last MOSI must be a valid command, because it will be interpreted by L9963E SPI logic
Last MISO contains last burst data register (MISOn) as shown in Table 21
In case L9963E transceiver is interposed between MCU and L9963E, refer to the L9963T datasheet. The Application Information section hosts a paragraph explaining how to handle burst commands.
Table 21. SPI protocol: answer to a burst read request
987654321
11
393837363534333231302928272625242322212019181716151413
12
10
0
DS13636 - Rev 3
MOSI
P.A.=1
P.A.=0
MISO1
P.A.=0
MISO2
Dev ID
R/W=0
Dev ID Command feedback
Burst = 1
Dev ID 1 1
Burst = 1
Command
Frame Num
GSW
GSW
(00010)
GSW
Unused (Any Data Is Possible) CRC
DATA READ CRC
DATA READ CRC
page 29/184
L9963E
Serial communication interface
393837363534333231302928272625242322212019181716151413
Frame Num
(00011)
Frame Num
….
Frame Num
….
Frame Num
(10011)
GSW
GSW
GSW
GSW
P.A.=0
MISO3
P.A.=0
MISO4
P.A.=0
MISOn
P.A.=0
MISO20
Dev ID 1 1
Burst = 1
Dev ID 1 1
Burst = 1
Dev ID 1 1
Burst = 1
Dev ID 1 1
Burst = 1
Frame fields related to the burst access are described in the table below:
Table 22. Burst access special frame fields
121110
DATA READ CRC
DATA READ CRC
DATA READ CRC
DATA READ CRC
987654321
0
Field
P.A. 1 bit
R/W 1 bit
Dev ID 5 bit From 0x1 to 0x1F Identifies the x-th L9963E unit in a daisy chain
Command
Command
feedback
GSW 2 bit From 0x0 to 0x3 Refer to Section 4.2.4.5 Global Status Word (GSW)
CRC 6 bit From 0x00 to 0x3F
Burst 1 bit 1 Identifies the frame being part of a burst
DATA READ 18 bit
Frame Num 5 bit From 0x02 to 0x14
Length Value Description
0 Answer sent by any Slave unit (MISO)
1 Command sent by Master unit (MOSI)
0 Read
1 Write
7 bit From 0x78 to 0x7D Identifies a set of registers to be read out of the device
CRC calculated on the [39-7] field of the frame. Refer to
Section 4.2.4.6 CRC calculation
Depends on the register
Answer containing the data read from the y-th register of the y-th device
Identifies the n-th frame of a burst answer. In the first frame it is replaced by the Command feedback.
Several burst commands are available:
Table 23. Available burst commands
DS13636 - Rev 3
Command
code
0x78
Description Reference
All cells voltage, Sum of cells, Stack Voltage divider, Instantaneous Current, Balancing status. This command clears the measurement data_ready bit (refer to Section 4.4 Cell voltage
measurement)
Table 24
page 30/184
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