WhereESDand/oroverandundershoot
protection for datalines is required :
Sensitive logic input protection
■
Microprocessor based equipment
■
Audio / Video inputs
■
Portable electronics
■
Networks
■
ISDN equipment
■
USB interface
■
DESCRIPTION
The DALC208SC6 diode array is designed to
protect components which are connected to data
and transmission lines from overvoltages caused
byelectrostaticdischarge(ESD)orother
transients. It is a rail-to-rail protection device also
suited for overshoot and undershoot suppression
on sensitive logic inputs.
The low capacitance of the DALC208SC6
prevents from significant signal distortion.
TM
LOW CAPACITANCE
DIODE ARRAY
1
SOT23-6L (SC74)
FUNCTIONAL DIAGRAM
FEATURES
■
PROTECTION OF 4 LINES
■
PEAK REVERSE VOLTAGE:
= 9 V per diode
V
RRM
■
VERY LOW CAPACITANCE PER DIODE:
C< 5pF
■
VERY LOW LEAKAGE CURRENT: IR<1µA
BENEFITS
■
Cost-effectiveness compared to discrete solution
■
High efficiency in ESD suppression
■
No significant signal distortion thanks to very low
capacitance
■
High reliability offered by monolithic integration
■
Lower PCB area consumption versus discrete
solution
February 2002 - Ed: 5C
I/O 1
I/O 4
REF 2REF 1
I/O 2I/O 3
COMPLIESWITHTHEFOLLOWINGSTANDARDS:
IEC61000-4-2level4
MIL STD 883C - Method 3015-6
(human body test)class 3
1/10
DALC208SC6
ABSOLUTE MAXIMUM RATINGS (T
amb
= 25°C).
SymbolParameterValueUnit
V
PP
V
RRM
∆V
REF
max.
V
In
min.
V
In
I
F
I
FRM
I
FSM
IEC61000-4-2, air discharge
IEC61000-4-2, contact discharge
Peak reverse voltage per diode
Reference voltage gap between V
REF2
and V
REF1
Maximum operating signal input voltage
Minimum operating signal input voltage
Continuous forward current (single diode loaded)
Repetitive peak forward current (tp=5µs,F=50kHz)
Surge non repetitive forward current -
15
8
9V
9V
V
REF2
V
REF1
200mA
700mA
rectangular waveform (see curve on figure 1)
= 2.5 µs
t
p
=1ms
t
p
= 100 ms
t
p
T
stg
T
j
Storage temperature range
Maximum junction temperature
6
2
1
-55 to + 150
150
THERMAL RESISTANCE
SymbolParameterValueUnit
R
th(j-a)
Note 1: device mounted on FR4 PCB with recommended footprint dimensions.
Junction to ambient (note 1)
500°C/W
kV
V
V
A
°C
°C
ELECTRICAL CHARACTERISTICS (T
amb
= 25°C).
SymbolParameterConditionsTyp.Max.Unit
V
F
I
R
C
Note 2: The dynamical behavior is described in the Technical Information section, on page 4.
Forward voltage
Reverse leakage current per diode
Input capacitance between Line and GND
=50mA1.2V
I
F
=5V1µA
V
R
see note 3710pF
Note 3: Input capacitance measurement
REF2
REF1 connected to GND
I/O
+V
CC
REF2 connected to +Vcc
Input applied :
R
V
G
Vcc = 5V, Vsign = 30 mV, F = 1 MHz
REF1
2/10
DALC208SC6
Fig. 1: Maximumnon-repetitive peak forward current
versus rectangular pulse duration (Tj initial = 25°C).
IFSM(A)
8
7
I/O vs
REF1 or
REF2
6
5
4
3
2
1
0
0.0010.010.11101001000
tp(ms)
Fig. 3: Variation of leakage current versus junction
temperature (typical values).
IR(µA)
100
Fig. 2: Reverse clamping voltage versus peak
pulse current (Tj initial = 25°C), typical values.
Rectangular waveform tp = 2.5 µs.
Ipp(A)
2.0
tp=2.5µs
1.0
I/O vs REF1
or REF2
0.1
5 1015202530
Vcl(V)
Fig. 4: Input capacitance versus reverse applied
voltage (typical values).
C(pF)
8.0
10
1
0.1
0.01
255075100125150
Tj(°C)
Fig. 5: Peak forward voltage drop versus peak for-
ward current (typical values).
Rectangular waveform tp = 2.5 µs.
IFM(A)
10.0
Tj=25°C
Tj=150°C
1.0
7.5
7.0
6.5
6.0
5.5
5.0
012345
F=1MHz
Vsign=30mV
Vref1/ref2=5V
VR(V)
I/O vs REF 1
or REF2
0.1
0246810 12 14 16 18 20
VFM(V)
3/10
DALC208SC6
TECHNICAL INFORMATION
SURGE PROTECTION
The DALC208SC6 is particularly optimized to
perform surge protection based on the rail to rail
topology.
The clamping voltage V
follow :
+=V
V
CL
V
CL
with : V
(V
F=Vt
forward drop voltage) / (Vtforward drop
F
-=V
+ rd.Ip
REF2+VF
REF1 -VF
threshold voltage)
can be calculated as
CL
for positive surges
for negative surges
APPLICATION EXAMPLE
If we consider that the connections from the pin
REF
to VCCand from REF1to GND are done by
2
two tracks of 10mm long and 0.5mm large; we
assume that the parasitic inductances of these
tracks are about 6nH.
So when an IEC61000-4-2 surge occurs, due to
the rise time of this spike (tr=1ns), the voltage V
CL
has an extra value equal to Lw.dI/dt.
The dI/dt is calculated as:
di/dt = Ip/tr ′ 24 A/ns
The overvoltage due to the parasitic inductances
is: Lw.di/dt=6x24′144V
According to the curve Fig.5 on page 3, we
assumethatthevalueof the dynamic resistance of
the clamping diode is typically rd = 0.7Ω and V
t
1.2V.
For an IEC61000-4-2 surge Level 4 (Contact
Discharge: Vg=8kV, Rg=330Ω), V
V
= 0V, and if in first approximation, we
REF1
REF2
= +5V,
assume that : Ip=Vg/Rg ′ 24A.
So, we find:
+ ′ +23V
V
CL
V
- ′ -18V
CL
Note: the calculations do not take into account
By taking into account the effect of these parasitic
inductancesdueto unsuitable layout, the clamping
=
voltage will be :
+ = +23 + 144 ′ 167V
V
CL
V
- = -18 - 144 ′ -162V
CL
We can reduce as much as possible these
phenomena with simple layout optimization.
It’s the reason why some recommendations have
to be followed (
good ESD protection”
phenomena due to parasitic inductances
Fig. A1: ESD behavior; parasitic phenomena due to unsuitable layout.
Vf
Vcl+ =
Vcl- =
Lw
di
Lw
dt
Vcc+Vf+
-Vf-
Lw
Lw
dt
di
dt
REF2=+Vcc
di
surge >0
surge <0
ESD
SURGE
VI/O
Lw
I/O
di
dt
see paragraph “How to ensure a
).
4/10
167V
di
Lw
dt
Vcc+Vf
Vcl+
tr=1ns
POSITIVE
SURGE
REF1=GND
tr=1ns
-Vf
NEGATIVE
di
-Lw
dt
t
-162V
SURGE
Vcl-
t
DALC208SC6
HOW TO ENSURE A GOOD ESD PROTECTION
While the DALC208SC6 provides a high immunity
to ESD surge, an efficient protection depends on
the layout of the board. In the same way, with the
rail to rail topology, the track from the V
the power supply +V
and from the V
CC
REF2
REF1
pin to
pin to
GND must be as short as possible to avoid
overvoltagesdue to parasitic phenomena (seeFig.
A1).
It’s often harder to connect the power supply near
to the DALC208SC6 unlike the ground thanks to
the ground plane that allows a short connection.
To ensure the same efficiency for positive surges
when the connections can’t be short enough, we
recommend to put close to the DALC208SC6,
between V
and ground, a capacitance of
REF2
100nF to prevent from these kinds of overvoltage
disturbances (see Fig. A2).
The add of this capacitance will allow a better
protection by providing during surge a constant
voltage.
Fig.A3,A4a and A4b show the improvement of the
ESDprotectionaccording to the recommendations
described above.
Fig. A2: ESD behavior: optimized layout and add
of a capacitance of 100nF.
C=100nF
Lw
REF2=+Vcc
ESD
SURGE
Fig. A3: ESD behavior: measurements conditions
(with coupling capacitance).
ESD
SURGE
TEST BOARD
DALC
208
+5V
Fig. A4a: Remaining voltage after the
DALC208SC6 during positive ESD surge.
IEC61000-4-2
Air Discharge
(150pF/330Ω)
Vpp=15kV
I/O
Vcc+Vf
VI/O
Vcl+
Vcl+ =
Vcl- =
REF1=GND
POSITIVE
SURGE
t
-Vf
surge >0
surge <0
t
NEGATIVE
SURGE
Vcl-
Important:
A main precaution to take is to put the protection
device closer to the disturbance source (generally
the connector).
Note: The measurements have been done with the DALC208SC6
in open circuit.
Fig. A4b: Remaining voltage after the
DALC208SC6 during negative ESD surge.
IEC61000-4-2
Air Discharge
(150pF/330Ω)
Vpp=15kV
5/10
DALC208SC6
CROSSTALK BEHAVIOR
1- Crosstalk phenomena
Fig. A4: Crosstalk phenomena.
V
G1
R
G1
R
G2
Line 1
Line 2
β
α
V
V
+
R
L1
1
G2
G1
12
V
G2
DRIVERS
The crosstalk phenomena are due to the coupling
between 2 lines. The coupling factor (β12 or β21)
increases when the gap across lines decreases,
particularly in silicon dice. In the example above
the expected signal on load R
is α2VG2, in fact
L2
the real voltage at this point has got an extra value
β
. This part of the VG1signal represents the
21VG1
effect of the crosstalk phenomenon of the line 1 on
the line 2. This phenomenon has to be taken into
account when the drivers impose fast digital data
or high frequency analog signals in the disturbing
line. The perturbed line will be more affected if it
works with low voltage signal or high load
impedance (few kΩ). The following chapters give
the value of both digital and analog crosstalk.
2- Digital Crosstalk
Fig. A5: Digital crosstalk measurements.
+5V
74HC04
100nF
G1
β
V
21
G1
Square
Pulse
Generator
5KHz
+5V
+5V+5V
74HC04
Line 1
V
Line 2
α
β
+
V
V
G2
G1
21
R
L2
RECEIVERS
2
Fig. A6: Digital crosstalk results.
DALC208SC6
Figure A5 shows the measurement circuit used to
quantify the crosstalk effect in a classical digital
application.
Figure A6 shows that in such a condition: signal
from 0V to 5V and a rise time of 5 ns, the impact on
thedisturbedline is less than 100mV peak to peak.
No data disturbance was noted on the concerned
line. The same results were obtained with falling
edges.
Note: The measurements have been done in the worst case i.e. on
two adjacent cells (I/O1 & I/O4).
6/10
3- Analog Crosstalk
Fig. A7: Analog crosstalk measurements.
DALC208SC6
TRACKING GENERATOR
50
Ω
+5V
Vg
Vin
C=100nF
Figure A7 gives the measurement circuit for the
analog application. In usual frequency range of
analog signals (up to 100MHz) the effect on
disturbedline is less than -45 dBm(please see Fig.
Fig. A8: Analog crosstalk results.
dBm
0
-20
-40
-60
TEST BOARD
DALC
208
SPECTRUM ANALYSER
Vout
Fig. A9: Measurement conditions.
TRACKING GENERATOR
50
Ω
Vg
+5V
Vin
TEST BOARD
C=100nF
50
Ω
SPECTRUM ANALYSER
DALC
208
50
Vout
Ω
-80
-100
1101001,000
f(MHz)
As the DALC208SC6 is designed to protect high
speed data lines, it must ensure a good
transmission of operating signals. The attenuation
curve give such an information.
Fig. A10 shows that the DALC208SC6 is well
suitable for data line transmission up to 100 Mbit/s
while it works as a filter for undesirable signals as
GSM (900MHz).
Fig. A10: DALC206SC6 attenuation.
dBm
0
-10
-20
-30
1101001,000
f(MHz)
7/10
DALC208SC6
APPLICATION EXAMPLES
Video line protection
■
T1/E1 protection
■
Tx
SMP75-8
Rx
SMP75-8
+Vcc
100nF
100nF
100nF
+Vcc
+Vcc
5
15
DALC
208
DALC
208
DALC
1
208
DATA
TRANSCEIVER
Pin N°Signal
1RED VIDEO
2GREEN VIDEO
or COMPOSITE SYNC with GREEN VIDEO
3BLUE VIDEO
4GROUND
5DDC (Display Data Channel) GROUND
6RED GROUND
7GREEN GROUND
8BLUE GROUND
9NC
Figure A11 shows the PSpice model of one
DALC208SC6 cell. In this model, the diodes are
defined by the PSpice parameters given in table
below (Fig A12).
Informationfurnished is believed to beaccurate and reliable. However,STMicroelectronics assumes no responsibility forthe consequences of
useof such information norfor any infringement ofpatents or other rightsof third parties whichmay result from itsuse. No license isgranted by
implication or otherwise under any patent or patent rights of STMicroelectronics. Specifications mentioned in this publication are subject to
change without notice. This publication supersedes and replaces all information previously supplied.
STMicroelectronics products are not authorized for use as critical components in life support devices or systems without express written approval of STMicroelectronics.
mm
inch
0.95
0.037
1.10
0.043
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