STMicroelectronics C55 User Manual

UM2636

User manual

Standard Software Driver for C55 Flash module embedded on SPC58 B, C, E, H, G and N lines microcontroller

Introduction

The standard software driver (SSD) is a set of APIs that enable user applications to operate on the Flash module embedded on a microcontroller. The C55 SSD contains a set of functions which allow to program/erase a single C55 Flash module.

The C55 standard software driver provides the following APIs:

•FlashInit

•FlashErase

•FlashEraseAlternate

•BlankCheck

•FlashProgram

•ProgramVerify

•CheckSum

•FlashCheckStatus

•FlashSuspend

•FlashResume

•GetLock

•SetLock

•OverPgmProtGetStatus

•FlashArrayIntegrityCheck

•FlashArrayIntegritySuspend

•FlashArrayIntegrityResume

•UserMarginReadCheck

UM2636 - Rev 1 - May 2020	www.st.com
For further information contact your local STMicroelectronics sales office.

UM2636

Overview

1Overview

This document is the user manual for the standard software driver (SSD) for single C55 Flash module. The roadmap for the document is the following.

Section 1.1 Features lists the features of the driver.

Section 2 API specifications describes the API specifications. This section includes many sub-sections which describe the different aspects of the driver.

• Section 2.1 General overview provides a general overview of the driver.

• Section 2.2 General type definitions provides the type definitions used for the driver.

• Section 2.3 SSD configuration parameters reports the driver configuration parameters.

•Section 2.4 Context data structure and Section 2.5 Other data structures describe the data context structure and provide some other data structures used in this driver.

•Section 2.6 Return codes provides return code information.

•Section 2.7 Normal mode functions and Section 2.8 User Test Mode Functions provide the detailed description of the standard software Flash driver APIs for the normal mode and the user's test mode respectively.

Section A.1 System requirements details the system requirements for the driver development. Section

B.1 Acronyms lists the acronyms used in the present document. Section C.1 Document reference lists the reference documents.

1.1Features

The C55 SSD provides the following features:

•Driver binary built with Variable-Length-Encoding (VLE) instruction set.

•Driver released in binary c-array format to provide compiler-independent support for non-debug-mode embedded applications.

•Driver released in s-record format to provide compiler-independent support for debug-mode/JTAG programming tools.

•Each driver function is independent of each other so the end user can choose the function subset to meet their particular needs.

•Support from word-wise to quad-page-wise programming according to specific hardware feature for fast programming.

•Position-independent and ROM-able

•Ready-to-use demos illustrating the usage of the driver

•Concurrency support via asynchronous design.

UM2636 - Rev 1	page 2/45

UM2636

API specifications

2API specifications

2.1General overview

The C55 SSD has APIs to handle the erase, program, erase verify and program verify operations on the Flash. Apart from these, it also provides the feature for locking specific blocks and calculating check sum. This SSD also provides four User Test APIs to check the array integrity, perform the user margin read check as well as to suspend/resume these operations. All functions work as an asynchronous model for concurrency event support by invoking the 'FlashCheckStatus' function to track the on-going status of the targeted operation.

2.2General type definitions

		Table 1. Type definitions
Derived type	Size		C language type description
BOOL	8-bit		unsigned char
INT8	8-bit		signed char
VINT8	8-bit		volatile signed char
UINT8	8-bit		unsigned char
VUINT8	8-bit		volatile unsigned char
INT16	16-bit		signed short
VINT16	16-bit		volatile signed short
UINT16	16-bit		unsigned short
VUINT16	16-bit		volatile unsigned short
INT32	32-bit		signed long
VINT32	32-bit		volatile signed long
UINT32	32-bit		unsigned long
VUINT32	32-bit		volatile unsigned long

UM2636 - Rev 1	page 3/45

UM2636

SSD configuration parameters

2.3SSD configuration parameters

This section explains the configuration parameters used for the SSD operation. The configuration parameters are handled as structure. The user should correctly initialize the fields including c55RegBase, mainArrayBase, uTestArrayBase, mainInterfaceFlag, programmableSize and BDMEnable before passing the structure to SSD functions. The rest of parameters such as lowBlockInfo, midBlockInfo, highBlockInfo and nLargeBlockNum, are initialized by ‘FlashInit’ automatically and can be used for other purposes of the user’s application.

Table 2. SSD configuration structure field definition

	Parameter name	Type	Parameter description
	c55RegBase	UINT32	The base address of C55 control registers.
	mainArrayBase	UINT32	The base address of Flash main array.
	lowBlockInfo	BLOCK_INFO	Block info of the low address space. It includes information of this block space based on
			different block sizes.
	midBlockInfo	BLOCK_INFO	Block info of the mid address space. It includes information of this block space based on
			different block sizes.
	highBlockInfo	BLOCK_INFO	Block info of the high address space. It includes information of this block space based on
			different block sizes.
	nLargeBlockNum	UINT32	Number of blocks of the 256 K address space.
	uTestArrayBase	UINT32	The base address of the UTest block.
	mainInterfaceFlag	BOOL	The flag to select the main interface or not.
	programmableSize	UINT32	The maximum programmable size of the C55 Flash according to specific interface.
	BDMEnable	BOOL	The debug mode selection. User can enable/disable the debug mode via this input
			argument.

The type definition for the structure is given below:

typedef struct _c55_ssd_config

{

UINT32 c55RegBase; UINT32 mainArrayBase; BLOCK_INFO lowBlockInfo; BLOCK_INFO midBlockInfo; BLOCK_INFO highBlockInfo; UINT32 nLargeBlockNum; UINT32 uTestArrayBase; BOOL mainInterfaceFlag; UINT32 programmableSize; BOOL BDMEnable;

}SSD_CONFIG, *PSSD_CONFIG;

2.4Context data structure

The Context data structure is used for storing the context variable values while an operation is in progress. The operations that support asynchronous model may require caching the context data including ‘FlashProgram’, ‘ProgramVerify’, ‘BlankCheck’, ‘CheckSum’, ‘FlashArrayIntegrityCheck’, and ‘UserMarginReadCheck’. The user needs to declare and initialize a context data structure before passing it to the SSD functions mentioned above. Refer to ‘FlashCheckStatus’ to have a quick view of how to initialize the context data. The context data structure contents can be reviewed at anytime during the operation progress (these information may be useful in some cases), but they must not be changed for any reason in order to make the operation complete correctly.

UM2636 - Rev 1	page 4/45

UM2636

Other data structures

	Table 3. Context data structure field definitions
Name	Description
dest	The context destination address of an operation
size	The context size of an operation
source	The context source of an operation
pFailedAddress	The context failed address of an operation
pFailedData	The context failed data of an operation
pFailedSource	The context failed source of an operation
pSum	The context sum of an operation
pMisr	The context MISR values of an operation
pReqCompletionFn	Function pointer to the Flash function being checked for status

The type definition for the structure is given below:

typedef struct _c55_context_data

{

UINT32 dest; UINT32 size; UINT32 source;

UINT32 *pFailedAddress; UINT32 *pFailedData; UINT32 *pFailedSource; UINT32 *pSum;

MISR *pMisr;

void* pReqCompletionFn;

}CONTEXT_DATA, *PCONTEXT_DATA;

2.5Other data structures

This section reports some other data structures used for the SSD operation. These are the structures used for variables' declaration in SSD configuration and context data structures or input arguments' declaration in some APIs.

Table 4. Block information structure field definitions

Name	Type	Definition
n16KBlockNum	UINT32	Number of 16K block
n32KBlockNum	UINT32	Number of 32K block
n64KBlockNum	UINT32	Number of 64K block
n128KBlockNum	UINT32	Number of 128K block

The type definition for the structure is given below:

typedef struct _c55_block_info

{

UINT32 n16KBlockNum; UINT32 n32KBlockNum; UINT32 n64KBlockNum; UINT32 n128KBlockNum;

} BLOCK_INFO, *PBLOCK_INFO;

UM2636 - Rev 1	page 5/45

			UM2636
			Other data structures
		Table 5. 256K block select structure field definitions
	Name	Type	Definition
	firstLargeBlockSelect	UINT32	Bit map for the first 32-bit block select (from bit 0 to bit 31) in 256K block space; bit 0
			corresponds to the least significant bit and bit 31 corresponds to the most significant bit.
			Bit map for the second 32-bit block select (from bit 32 to upper bits) in 256K block space;
	secondLargeBlockSelect	UINT32	bit 32 corresponds to the least significant bit and bit 63 corresponds to the most significant
			bit.

The type definition for the structure is given below:

typedef struct _c55_nLarge_block_sel

{

UINT32 firstLargeBlockSelect; UINT32 secondLargeBlockSelect;

} NLARGE_BLOCK_SEL,*PNLARGE_BLOCK_SEL;

		Table 6. MISR structure field definitions
Name	Type	Definition
Wn	UINT32	Each Wn corresponds to each MISR value provided by the user. The user must provide ten MISR
n = 0, 1, …9		values in total via this structure to perform the user’s test mode functions.

The type definition for the structure is given below:

typedef struct _c55_misr

{

UINT32 w0; UINT32 w1; UINT32 w2; UINT32 w3; UINT32 w4; UINT32 w5; UINT32 w6; UINT32 w7; UINT32 w8; UINT32 w9;

} MISR, *PMISR;

UM2636 - Rev 1	page 6/45

UM2636

Return codes

2.6Return codes

The return code returned to the caller function notifies the success or the errors of the API execution. These are the possible values of the return code:

Table 7. Return codes

	Name	Value	Description
	C55_OK	0x00000000	The requested operation is successful.
	C55_ERROR_ALIGNMENT	0x00000001	Alignment error.
	C55_ERROR_ENABLE	0x00000002	Fail to enable the operation.
			New program/erase cannot be performed while a high-voltage operation is
	C55_ERROR_BUSY	0x00000004	already in progress.
			New array integrity cannot be performed while an array integrity is going
			on.
	C55_ERROR_PGOOD	0x00000008	The program operation is unsuccessful.
	C55_ERROR_EGOOD	0x00000010	The erase operation is unsuccessful.
	C55_ERROR_NOT_BLANK	0x00000020	There is a non-blank Flash memory location within the checked Flash
			memory region.
	C55_ERROR_VERIFY	0x00000040	There is a mismatch between the source data and the content in the
			checked Flash memory.
	C55_ERROR_BLOCK_INDICATOR	0x00000080	Invalid block space indicator.
	C55_ERROR_ALTERNATE	0x00000100	The operation does not support an alternate interface for the specified
			address space.
	C55_ERROR_FACTORY_OP	0x00000200	Factory erase/program is locked.
			In ‘FlashArrayIntegrityCheck’ or ‘UserMarginReadCheck’, the MISR
	C55_ERROR_MISMATCH	0x00000400	values generated by the hardware do not match the values passed by the
			user.
	C55_ERROR_NO_BLOCK	0x00000800	In ‘FlashArrayIntegrityCheck’ or ‘UserMarginReadCheck’, no block has
			been enabled for array integrity check.
	C55_ERROR_ADDR_SEQ	0x00001000	Invalid address sequence error.
	C55_ERROR_MARGIN_LEVEL	0x00002000	Invalid margin level error.
	C55_ERROR_ERASE_OPTION	0x00004000	Invalid erase option.
	C55_ERROR_MODE_OP	0x00008000	Invalid mode op.
	C55_DONE	0x00010000	The operation has been done and this operation is no more requested on
			FlashCheckStatus function.
	C55_INPROGRESS	0x00020000	The operation is in progress and the user needs to call the
			FlashCheckStatus more times to finish this operation.

UM2636 - Rev 1	page 7/45

UM2636

Normal mode functions

2.7Normal mode functions

2.7.1FlashInit

Description

This function initializes an individual Flash module. It accesses the Flash configuration register and read out the number of blocks for each memory space of single Flash module.

Each time this driver is used, the user must provide the chip-dependent parameters such as c55RegBase, mainArrayBase, uTestArrayBase, mainInterfaceFlag, programmableSize and DBMEnable and the rest of parameters initialized via this function. Those are block information including the number of the block based on the block size for each address space.

Prototype

UINT32 FlashInit (PSSD_CONFIG pSSDConfig);

Arguments

				Table 8. FlashInit
Argument		Description			Range
pSSDConfig	Pointer to the SSD Configuration			The values in this structure are chip-dependent. Please refer to Section
	Structure.			2.3 SSD configuration parameters for more details.
Return values
		Table 9. Return values for FlashInit
Type			Description			Possible values
UINT32		Indicates successful completion of operation.				C55_OK

Troubleshooting

None.

Comments

In case that the mainInterfaceFlag is the main interface, ‘FlashInit’ checks the C55_MCR_RWE, C55_MCR_EER and C55_MCR_SBC bits, and then clears them if any of them is set.

This function also clears the PGM and ERS bits in the MCR and MCRA registers respectively if any of them is set.

Assumptions

None.

UM2636 - Rev 1	page 8/45

UM2636

Normal mode functions

2.7.2FlashErase

Description

This function is to perform an erase operation for multi-blocks on a single Flash module according to user’s input arguments via the main interface. The target Flash module status is checked in advance to return relevant error code if any. This function only sets the high voltage without waiting for the operation to be finished. Instead, the user must call the ‘FlashCheckStatus’ function to confirm the successful completion of this operation.

Prototype

UINT32 FlashErase(PSSD_CONFIG pSSDConfig,

UINT8 eraseOption,

UINT32 lowBlockSelect,

UINT32 midBlockSelect,

UINT32 highBlockSelect,

NLARGE_BLOCK_SEL nLargeBlockSelect

Arguments

Table 10. Arguments for FlashErase

	Argument	Description	Range
	pSSDConfig	Pointer to the SSD	The values in this structure are chip-dependent. Please refer to Section
		Configuration Structure.	2.3 SSD configuration parameters for more details.
			The valid value can be:
		The option is to select	C55_ERASE_MAIN (0x0)
	eraseOption	user’s expected erase	C55_ERASE_MAIN_FERS (0x1)
		operation.	C55_ERASE_UTEST (0x2)
			C55_ERASE_UTEST_FERS (0x3)
			Bit-mapped value which corresponds to LOWSEL of the block select register
		To select the array blocks	in which the least significant bit of this argument corresponds to LOWSEL[0].
	lowBlockSelect	in low address space for	Select the block to be erased by setting 1 to the appropriate bit of
		erasing.	lowBlockSelect. If there is not any block to be erased in the low address
			space, lowBlockSelect must be set to 0.
			Bit-mapped value which corresponds to 256KSEL of the block select register.
		To select the array blocks	The first 256K block select corresponds to the first 32 bits (from 0 to 31) of
			256KSEL. The second 256K block select corresponds to the rest of 256KSEL
	midBlockSelect	in mid address space for
			bits. Select the block to be erased by setting 1 to the appropriate bit of
		erasing.
			nLargeBlockSelect. If there is not any block to be erased in the 256K address
			space, nLargeBlockSelect must be set to 0.
			Bit-mapped value such that the least significant bit is at bit 0 of 16K block
	highBlockSelect	To select the array blocks	region (if available), then 32K block region (if available) and lastly 64K block
		in high address space for	region (if available). Select the block in the high address space to be erased
		erasing.	by setting 1 to the appropriate bit of highBlockSelect. If there is not any block
			to be erased in the high address space, highBlockSelect must be set to 0.
		To select the array blocks
		in 256K address space for	Bit-mapped value such that the least significant bit is at bit 0 of 256K block
		erasing. It includes two	region (if available). Select the block in the 256K address space to be erased
	nLargeBlockSelect	elements to decode the	by setting 1 to the appropriate bit of nLargeBlockSelect. If there is not any
		first half of 256K block	block to be erased in the 256K address space, nLargeBlockSelect must be
		select and the second half	set to 0.
		of 256K block select.

UM2636 - Rev 1	page 9/45

UM2636

Normal mode functions

Return values

Table 11. Return values for FlashErase

Type	Description	Possible values
		C55_OK
		C55_ERROR_ERASE_OPTION
UINT32	Successful completion or error value.	C55_ERROR_BUSY
		C55_ERROR_FACTORY_OP
		C55_ERROR_ENABLE

Troubleshooting

Table 12. Troubleshooting for FlashErase

	Error Codes	Possible Causes	Solution
	C55_ERROR_ERASE_OPTION	Invalid erase option.	Use one of the valid values for the option.
			Wait until all previous program/erase operations on the
		New erase operation cannot	Flash module finish.
	C55_ERROR_BUSY	be performed because there is	Possible cases that erase cannot start are:
		a program/erase sequence in	1. erase in progress (MCR-ERS is high);
		progress on the Flash module.
			2. program in progress (MCR-PGM is high);
	C55_ERROR_FACTORY_OP	The factory erase could not be	Factory erase is locked by the system due to the data at
		performed.	the UTest NVM ‘diary’ location.
		ERS bit cannot be set	If UT0[UTE] bit is being set, then the erase operation
	C55_ERROR_ENABLE		cannot be started. Thus, make sure that the UT0[UTE] is
		correctly.
			cleared before any erase operation.

Comments

'FlashErase' always uses the main interface to complete an erase operation and ignores the value of the ‘mainInterfaceFlag’ in the SSD configuration structure. However, it is recommended that the user explicitly sets this flag value to TRUE before calling 'FlashErase'.

The eraseOption input argument provides an option for the user to select the expected erase operation. If the user wants to set a factory erase, he has to select eraseOption as C55_ERASE_MAIN_FERS or C55_ERASE_UTEST_FERS. If the user wants to perform a normal erase operation on the main array, eraseOption must be C55_ERASE_MAIN and lastly, the user must select C55_ERASE_UTEST to make an erase operation on the UTest block.

The factory erase feature can be used to provide a faster erase. But the feature cannot be performed if the data at “diary” location in the UTest NVM space contains at least one zero at reset. In that case, each try to perform factory erase causes the error C55_ERROR_FACTORY_OP to be returned.

The inputs lowBlockSelect, midBlockSelect, highBlockSelect and nLargeBlockSelect are bit-mapped arguments that are used to select the blocks to be erased in the low/mid/high/256K address spaces of main array. The selection of the blocks of the main array is determined by setting/clearing the corresponding bit in lowBlockSelect, midBlockSelect, highBlockSelect or nLargeBlockSelect.

The bit allocations for low/mid/high/first 256K blocks are: the least significant bit corresponds to the least significant bit of LOWSEL/MIDSEL/HIGHSEL/256KSEL in the relevant block select register. The first 256K block select can specify maximum 32 blocks. If there are more than 32 blocks of 256K, the second 256K block select will be used to specify the remaining ones. In this case the least significant bit of the second 256K block corresponds to 256KSEL[32] and so on.

UM2636 - Rev 1	page 10/45

UM2636

Normal mode functions

Table 13. Bit allocation for low block select argument is an example for block allocation and bit map for specific Flash modules with two blocks for each block size in low, middle or high address space. The invalid blocks are marked as reserved and the number of valid bits may vary according to specific Flash module.

Table 13. Bit allocation for low block select argument

MSB						LSB
bit 31	…	bit 4	bit 3	bit 2	bit 1	bit 0
reserved	…	LOWSEL[4]	LOWSEL[3]	LOWSEL[2]	LOWSEL[1]	LOWSEL[0]

Table 14. Bit allocation for middle block select argument

MSB						LSB
bit 31	…	bit 4	bit 3	bit 2	bit 1	bit 0
reserved	…	MIDSEL[4]	MIDSEL[3]	MIDSEL[2]	MIDSEL[1]	MIDSEL[0]

Table 15. Bit allocation for blocks in high address space

MSB						LSB
bit 31	…	bit 4	bit 3	bit 2	bit 1	bit 0
reserved	…	64K block 0	32K block 1	32K block 0	16K block 1	16K block 0

Table 16. Bit allocation for first 256K block select argument

MSB						LSB
bit 31	…	bit 4	bit 3	bit 2	bit 1	bit 0
	…	256KSEL[4]	256KSEL[3]	256KSEL[2]	256KSEL[1]	256KSEL[0]

Table 17. Bit allocation for second256K block select argument

MSB						LSB
bit 31	…	bit 4	bit 3	bit 2	bit 1	bit 0
reserved	…	256KSEL[36]	256KSEL[35]	256KSEL[34]	256KSEL[33]	256KSEL[32]

If the selected main array blocks or UTest block are locked for erasing, those blocks do not erase, but ‘FlashErase’ still returns C55_OK. The user needs to check the erasing result with the ‘BlankCheck’ function.

It is impossible to erase any Flash block when a program or erase operation is already in progress on C55 module. ‘FlashErase’ returns C55_ERROR_BUSY when trying to do so. In addition, when ‘FlashErase’ is running, it is unsafe to read the data from the flash partitions having one or more blocks being erased. Otherwise, it causes a Read-While-Write error.

Assumptions

It is assumed that the Flash block is initialized using a ‘FlashInit’ API.

UM2636 - Rev 1	page 11/45

UM2636

Normal mode functions

2.7.3FlashEraseAlternate

Description

This function is to perform an erase operation for single blocks on a single Flash module according to user’s input arguments via alternate interface. The targeted Flash module status is checked in advance to return relevant error code if any. This function only set the high voltage without waiting for the operation to be finished. Instead, the user must call ‘FlashCheckStatus’ function to confirm the successful completion of this operation.

Prototype

UINT32 FlashEraseAlternate (PSSD_CONFIG pSSDConfig,

UINT32 interlockAddress);

Arguments

Table 18. Arguments for FlashEraseAlternate

	Argument	Description	Range
	pSSDConfig	Pointer to the SSD Configuration	The values in this structure are chip-dependent. Please refer to
		Structure.	Section 2.3 SSD configuration parameters for more details.
	interlockAddress	The interlock address which points to	The interlockAddress must fall in the block that the user wants to
		the block needs to be erased.	erase and must be aligned to word.

Return values

Table 19. Return values for FlashEraseAlternate

Type	Description	Possible values
		C55_OK
UINT32	Successful completion or error value.	C55_ERROR_BUSY
		C55_ERROR_ALIGNMENT

Troubleshooting

Table 20. Troubleshooting for FlashEraseAlternate

	Returned Error Bits	Description		Solution
			Wait until all previous program/erase operations on
		New erase operation cannot be	the Flash module finish.
	C55_ERROR_BUSY	performed because a program/erase	Possible cases that erase cannot start are:
		sequence is in progress on the Flash
			•	erase in progress (MCR-ERS is high);
		module.
			•	program in progress (MCR-PGM is high);
	C55_ERROR_ALIGNMENT	The input argument of interlockAddress	The input argument of interlockAddress must be
		is not aligned by word.	aligned by word.

UM2636 - Rev 1	page 12/45

UM2636

Normal mode functions

Comments

FlashEraseAlternate’ always uses the main interface to complete an erase operation and ignores the value of the ‘mainInterfaceFlag’ in the SSD configuration structure. However, it is recommended that user should explicitly set this flag value to FALSE before calling FlashEraseAlternate’. The ‘FlashEraseAlternate’ must not be used to erase any block in the 256K address space. In that case the function only returns C55_OK without performing the operation. If the selected main array blocks are locked for erasing, those blocks are not erased, but ‘FlashEraseAlternate’ still return C55_OK. The user needs to check the erasing result with the ‘BlankCheck’ function. It is impossible to erase any Flash block when a program or erase operation is already in progress on C55 module. ‘FlashEraseAlternate’ returns C55_ERROR_BUSY when trying to do so. In addition, when ‘FlashEraseAlternate’ is running, it is unsafe to read the data from the Flash partitions having one or more blocks being erased. Otherwise, it causes a Read-While-Write error.

Assumptions

It is assumed that the Flash block is initialized using a ‘FlashInit’ API.

2.7.4BlankCheck

Description

This function is used to run a blank check for the previous erase operation. It verifies whether the expected Flash range is blank or not. In case of mismatch, the failed address and failed destination are saved and the relevant error code is returned. This function only runs blank check for given number of bytes which can terminate this function within the expected time interval. Thus, if the user wants to conduct a blank check for large size, the remaining information that needs to be blank-checked is stored in “pCtxData” variable and ‘FlashCheckStatus’ must be called periodically to run the next blank check for next destination based on all data provided in “pCtxData”.

Prototype

UINT32 BlankCheck (PSSD_CONFIG pSSDConfig,

UINT32 dest,

UINT32 size,

UINT32 *pFailedAddress,

UINT32 *pFailedData,

PCONTEXT_DATA pCtxData);

Arguments

Table 21. Arguments for BlankCheck

	Argument	Description	Range
			The values in this structure are chip-dependent.
	pSSDConfig	Pointer to the SSD Configuration Structure.	Please refer to Section 2.3 SSD configuration
			parameters for more details.
	dest	Destination address to be checked.	Any accessible address aligned on word boundary in
			either main array or UTest block.
			If size = 0, the return value is C55_OK.
	size	Size, in bytes, of the Flash region to check.	It should be word aligned and its combination with
			dest should fall in either main array or UTest block.
	pFailedAddress	Return the address of the first non-blank	Only valid when this function returns
		Flash location in the checking region	C55_ERROR_NOT_BLANK.
	pFailedData	Return the content of the first non-blank	Only valid when this function returns
		Flash location in the checking region.	C55_ERROR_NOT_BLANK.
	pCtxData	Address of context data structure.	A data structure for storing context variables.

UM2636 - Rev 1	page 13/45

UM2636

Normal mode functions

Return values

Table 22. Return values for BlankCheck

Type	Description	Possible values
UINT32	Successful completion or error value.	C55_OK

C55_ERROR_ALIGNMENTC55_ERROR_NOT_BLANK

Troubleshooting

Table 23. Troubleshooting for BlankCheck

	Returned Error Bits	Description	Solution
	C55_ERROR_ALIGNMENT	The dest and size provided by the user are not	The dest and size must be word-aligned.
		aligned by word.
	C55_ERROR_NOT_BLANK	There is a non-blank area within targeted Flash	Call ‘FlashErase’ to re-erase the targeted
		range.	Flash range and do blank check again.

Comments

If the blank checking fails, the first failing address is saved to pFailedAddress, and the failing data in Flash are saved in pFailedData. The contents pointed by pFailedAddress and pFailedData are updated only when there is a non-blank location in the checked Flash range.

If the user wants to run a blank check for large size, this Flash size is divided into many small portions defined by NUM_WORDS_BLANK_CHECK_CYCLE so that blank check for one small portion can be finished within the expected time interval. In this case, ‘BlankCheck’ function plays a role to kick-off this blank check operation by finishing blank check for the first portion after backing-up all necessary information to pCtxData variable and blank checks from the second portion are done within ‘FlashCheckStatus’ function. Thus, user must call ‘FlashCheckStatus’ to finish all the expected operations defined by size argument.

Assumptions

It is assumed that the Flash block is initialized using a ‘FlashInit’ API.

2.7.5FlashProgram

Description

This function is used to perform a program operation for single or multi-programmable sizes via different interface on targeted Flash module according to user’s input arguments. The targeted Flash module status is checked in advance to return relevant error code if any. This function only sets the high voltage without waiting for the operation to be finished. Instead, the user must call ‘FlashCheckStatus’ function to confirm the successful completion of this operation.

In case of programming for multi-programmable size, the remaining information needs to be programmed and is stored in the “pCtxData” variable, and the ‘FlashCheckStatus’ function is called periodically by the user to confirm the successful completion of the previous destination and once finished, this function invokes ‘FlashProgram’more times to program the next destination based on the data provided in “pCtxData” until all is over.

UM2636 - Rev 1	page 14/45