ST X02 User Manual

X02
1.25 A sensitive gate SCR
Features
on-state rms current: 1.25 A
repetitive peak off-state voltage: 600 V and
gate triggering current:
50 and 200 µA
Applications
ground fault circuit interrupters
overvoltage crowbar protection in power
supplies
capacitive ignition circuits
Description
The X02 SCR can be used as the on/off function in applications where topology does not offer high current for gate triggering.
This device is optimized in forward voltage drop and inrush current capabilities for reduced power losses and high reliability in harsh environments.
A
A
K
SOT-223
X02xxN
G
G
K
G
SMBflat-3L
X0202NUF
A
K
A
G
K
TO-92
X02xxA
A

Table 1. Device summary

Vol tag e
Order code
Sensitivity µA Package
600 V 800 V
X0202MA Y 200 TO-92
X0202MN Y 200 SOT-223
X0202NA Y 200 TO-92
X0202NN Y 200 SOT-223
X0205MA Y 50 TO-92
X0205NA Y 50 TO-92
X0202NUF Y 200 SMBflat-3L
January 2011 Doc ID 7480 Rev 4 1/11
www.st.com
11
Characteristics X02

1 Characteristics

Table 2. Absolute ratings (limiting values, TJ = 25 °C unless otherwise specified)
Symbol Parameter Value Unit
TO-92 T
I
T(RMS)
On-state rms current (180 °Conduction angle)
SMBflat-3L T
TO-92 T
IT
Average on-state current (180 °Conduction angle)
(AV)
SMBflat-3L T
t
= 8.3 ms
I
TSM
di/dt
I
P
G(AV)
T
Table 3. Electrical characteristics (TJ = 25 °C unless otherwise specified)
Non repetitive surge peak on-state current
²
tI²t Value for fusing tp = 10 ms Tj = 25 °C 2.5 A2s
I
Critical rate of rise of on-state current I
= 2 x IGT , tr 100 ns
G
Peak gate current tp = 20 µs Tj = 125 °C 1.2 A
GM
Average gate power dissipation Tj = 125 °C 0.2 W
Storage junction temperature range
stg
T
Operating junction temperature range
j
p
= 10 ms 22.5
t
p
F = 60 Hz T
= 63 °C
L
= 99 °C
tab
= 111 °C
tab
= 63 °C
L
= 99 °C
tab
= 111 °C
tab
1.25 ASOT-223 T
0.8 ASOT-223 T
25
= 25 °C
T
j
= 125 °C 50 A/µs
j
- 40 to + 150
- 40 to + 125
A
°C
Symbol Test conditions X0202 X0205 Unit
I
GT
VD = 12 V, RL = 140 Ω
V
GT
V
V
dV/dt V

Table 4. Static electrical characteristics

VD = V
GD
RG
I
I
H
L
DRM, RL
IRG = 10 µA Min. 8 V
IT = 50 mA, RGK = 1 kΩ Max. 5 mA
IG = 1 mA, RGK = 1 kΩ Max. 6 mA
= 67% V
D
= 3.3 kΩ , RGK = 1 kΩ Tj = 125 °C Min. 0.1 V
DRM, RGK
= 1 kΩ Tj = 110 °C Min. 10 15 V/µs
Symbol Test conditions X0202 X0205 Unit
V
TM
V
TO
R
I
DRM IRRMVDRM
ITM = 2.5 A, tp = 380 µs Tj = 25 °C
Threshold voltage
Dynamic resistance 200 mΩ
d
= V
RRM, RGK
= 1 kΩ
Min. 20
Max. 200 50
Max. 0.8 V
1.45 V
0.9 V
= 125 °C
T
j
T
= 25 °C 5 µA
j
= 125 °C 500
T
j
Max.
µA
µA
2/11 Doc ID 7480 Rev 4
X02 Characteristics

Table 5. Thermal resistances

Symbol Parameter Value Unit
R
R
R
th(j-l)
th(j-t)
th(j-t)
Junction to leads (DC) TO-92
60
Junction to tab (DC) SOT-223 25
Junction to tab (DC) SMBflat-3L 14
Max.
TO-92 150
R
th(j-a)
Junction to ambient (DC)
S = 5 cm
SOT-223 60
2
SMBflat-3L 75
P(W)
dissipation versus average on-state current (full cycle)
360°
α
α = 180°
I (A)
T(AV)
Figure 2. Average and DC on-state current
versus tab (SOT-223, SMBflat-3L) or lead (TO-92) temperature
I (A)
T(AV)
1.4
1.2
1.0
0.8
0.6
0.4
0.2
0.0
D.C.(TO-92)
α = 180° (TO-92)
α = 180° (SOT-223)
T or T (°C)
lead tab
0 25 50 75 100 125
D.C.(SOT-223)
α = 180° (SMBflat-3L)
D.C.(SMBflat-3L)
Figure 1. Maximum average power
1.2
1.0
0.8
0.6
0.4
0.2
0.0
0 0.1 0.2 0.3 0.4 0.5 0.6 0.7 0.8
°C/W
Figure 3. Average and DC on-state current
versus ambient temperature
I (A)
T(AV)
1.4
1.2
D.C.(SMBflat-3L)
1.0
0.8
0.6
α = 180° (TO-92)
0.4
0.2
0.0
0 25 50 75 100 125
D.C.(TO-92)
α = 180° (SOT-223)
T (°C)
amb
D.C.(SOT-223)
α = 180° (SMBflat-3L)
Figure 4. Relative variation of thermal
impedance junction to ambient versus pulse duration
K=[Z /R
1.00
th(j-a) th(j-a)
0.10
0.01
1.E-02 1.E-01 1.E+00 1.E+01 1.E+02 1.E+03 1.E+04 1.E+05
SOT-223
TO-92
]
SMBflat-3L
t (s)
p
Doc ID 7480 Rev 4 3/11
Characteristics X02
Figure 5. Relative variation of triggering,
holding and latching current versus junction temperature
I,I,I[T] /
GT H L j
1.50
1.25
1.00
0.75
0.50
0.25
0.00
-40 -20 0 20 40 60 80 100 120 140
I ,I ,I [T =25°C]
GT H L j
T (°C)
j
Typical values
IH& I
R = 1k
GK
I
GT
L
Ω
Figure 7. Relative variation of dV/dt immunity
versus gate-cathode resistance (typical values)
dV/dt[R ] / dV/dt[ =1k ]GKΩ
10.0
1.0
0.1
0.0 0.2 0.4 0.6 0.8 1.0 1.2 1.4 1.6 1.8 2.0
R
GK
R(k)GKΩ
Tj= 125°C
V = 0.67 x V
D DRM
Figure 6. Relative variation of holding
current versus gate-cathode resistance (typical values)
I [R ] / I [ =1k ]
HGK HΩRGK
4.0
3.5
Tj=25
3.0
2.5
2.0
1.5
1.0
0.5
0.0
R(k)GKΩ
1.E-02 1.E-01 1.E+00 1.E+01
Figure 8. Relative variation of dV/dt immunity
versus gate-cathode capacitance (typical values)
dV/dt[C ] / dV/dt[ =1k ]GKΩ
20
V = 0.67 x V
D DRM
18
T
= 125°C
j
Ω
R = 1k
GK
16
14
12
10
8
6
4
2
0
0
24
R
GK
C (nF)
GK
6810
12 14
16 18 20
22
Figure 9. Surge peak on-state current
versus number of cycles
I (A)
TSM
25
20
15
10
Repetitive
T =25°C
5
0
1 10 100 1000
amb
Non repetitive T initial=25°C
j
4/11 Doc ID 7480 Rev 4
t =10ms
p
One cycle
Number of cycles
Figure 10. Non repetitive surge peak on state
current for a sinusoidal pulse and
2
T
T initial = 25°C
j
I
TSM
2
I t
1.00 10.000.100.01
I (A), I t (A s)
TSM
300
dI/dt limitation
100
10
1
corresponding value of I
22
t (ms)
p
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