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VNB35NV04 / VNP35NV04 |
® |
/ VNV35NV04 / VNW35NV04 |
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“OMNIFET II”: |
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FULLY AUTOPROTECTED POWER MOSFET |
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TYPE |
RDS(on) |
Ilim |
Vclamp |
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VNB35NV04 |
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VNP35NV04 |
10 mΩ (*) |
30 A |
40 V |
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VNV35NV04 |
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VNW35NV04 |
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(*) For PowerSO-10 only
nLINEAR CURRENT LIMITATION
nTHERMAL SHUT DOWN
nSHORT CIRCUIT PROTECTION
nINTEGRATED CLAMP
nLOW CURRENT DRAWN FROM INPUT PIN
nDIAGNOSTIC FEEDBACK THROUGH INPUT PIN
nESD PROTECTION
nDIRECT ACCESS TO THE GATE OF THE POWER MOSFET (ANALOG DRIVING)
nCOMPATIBLE WITH STANDARD POWER MOSFET
DESCRIPTION
The VNB35NV04, VNP35NV04, VNV35NV04, VNW35NV04 are monolithic devices designed in STMicroelectronics VIPower M0-3 Technology,
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10 |
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3 |
1 |
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1 |
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D2PAK |
PowerSO-10™ |
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3 |
3 |
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2 |
2 |
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1 |
1 |
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TO-220 |
TO-247 |
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ORDER CODES: |
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D2PAK |
VNB35NV04 |
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TO-220 |
VNP35NV04 |
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PowerSO-10™ |
VNV35NV04 |
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TO-247 |
VNW35NV04 |
intended for replacement of standard Power MOSFETS from DC up to 25KHz applications. Built in thermal shutdown, linear current limitation and overvoltage clamp protect the chip in harsh environments. Fault feedback can be detected by monitoring the voltage at the input pin.
BLOCK DIAGRAM
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DRAIN |
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2 |
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Overvoltage |
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Clamp |
INPUT |
Gate |
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1 |
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Control |
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Linear |
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Over |
Current |
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Limiter |
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Temperature |
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3 |
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SOURCE |
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FC01000 |
March 2004 |
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1/19 |
VNB35NV04 / VNP35NV04 / VNV35NV04 / VNW35NV04
ABSOLUTE MAXIMUM RATING
Symbol |
Parameter |
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Value |
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Unit |
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PowerSO-10™ |
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D2PAK |
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TO-220 |
TO-247 |
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VDS |
Drain-source Voltage (VIN=0V) |
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Internally Clamped |
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V |
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VIN |
Input Voltage |
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Internally Clamped |
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V |
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IIN |
Input Current |
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+/-20 |
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mA |
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RIN MIN |
Minimum Input Series Impedance |
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4.7 |
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Ω |
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ID |
Drain Current |
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Internally Limited |
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A |
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IR |
Reverse DC Output Current |
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-30 |
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A |
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VESD1 |
Electrostatic Discharge (R=1.5KΩ, C=100pF) |
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4000 |
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V |
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VESD2 |
Electrostatic Discharge on output pin only |
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16500 |
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V |
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(R=330Ω, C=150pF) |
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Ptot |
Total Dissipation at Tc=25°C |
125 |
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125 |
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125 |
208 |
W |
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Tj |
Operating Junction Temperature |
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Internally limited |
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°C |
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Tc |
Case Operating Temperature |
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Internally limited |
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°C |
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Tstg |
Storage Temperature |
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-55 to 150 |
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°C |
CONNECTION DIAGRAM (TOP VIEW)
INPUT |
6 |
5 |
SOURCE |
INPUT |
7 |
4 |
SOURCE |
INPUT |
8 |
3 |
N.C. |
INPUT |
9 |
2 |
SOURCE |
INPUT |
10 |
1 |
SOURCE |
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11 |
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DRAIN |
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(*) For the pins configuration related to TO-220, TO-247, D2PAK, see outlines at page 1.
CURRENT AND VOLTAGE CONVENTIONS
ID
VDS
DRAIN
IIN RIN
INPUT
SOURCE
VIN
2/19
VNB35NV04 / VNP35NV04 / VNV35NV04 / VNW35NV04
THERMAL DATA
Symbol |
Parameter |
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Value |
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Unit |
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PowerSO-10™ |
D2PAK |
TO-220 |
TO-247 |
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Rthj-case |
Thermal Resistance Junction-case}}} |
MAX |
1 |
1 |
1 |
0.6 |
°C/W |
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Rthj-amb |
Thermal Resistance Junction-ambient |
MAX |
50(*) |
50(*) |
50 |
30 |
°C/W |
(*) When mounted on a standard single-sided FR4 board with 50mm2 of Cu (at least 35 μm thick) connected to all DRAIN pins.
ELECTRICAL CHARACTERISTICS (-40°C < T j < 150°C, unless otherwise specified) OFF
Symbol |
Parameter |
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Test Conditions |
Min |
Typ |
Max |
Unit |
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VCLAMP |
Drain-source Clamp |
VIN=0V; ID=15A |
40 |
45 |
55 |
V |
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Voltage |
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VCLTH |
Drain-source Clamp |
VIN=0V; ID=2mA |
36 |
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V |
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Threshold Voltage |
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VINTH |
Input Threshold Voltage |
VDS=VIN; ID=1mA |
0.5 |
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2.5 |
V |
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I |
Supply Current from Input |
V |
=0V; V =5V |
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100 |
150 |
μA |
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ISS |
Pin |
DS |
IN |
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VINCL |
Input-Source Clamp |
IIN=1mA |
6 |
6.8 |
8 |
V |
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Voltage |
IIN=-1mA |
-1.0 |
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-0.3 |
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IDSS |
Zero Input Voltage Drain |
VDS=13V; VIN=0V; Tj=25°C |
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30 |
μA |
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Current (VIN=0V) |
V |
=25V; V =0V |
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75 |
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DS |
IN |
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ON
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Max |
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Symbol |
Parameter |
Test Conditions |
PowerSO-10 |
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D2PAK |
Unit |
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TO-220 / TO-247 |
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RDS(on) |
Static Drain-source On |
VIN=5V; ID=15A; Tj=25°C |
10 |
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13 |
mΩ |
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Resistance |
VIN=5V; ID=15A; Tj=150°C |
20 |
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24 |
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3/19
VNB35NV04 / VNP35NV04 / VNV35NV04 / VNW35NV04
ELECTRICAL CHARACTERISTICS (continued) (Tj=25°C, unless otherwise specified) DYNAMIC
Symbol |
Parameter |
Test Conditions |
Min |
Typ |
Max |
Unit |
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gfs (*) |
Forward |
VDD=13V; ID=15A |
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35 |
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S |
Transconductance |
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COSS |
Output Capacitance |
VDS=13V; f=1MHz; VIN=0V |
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1300 |
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pF |
SWITCHING
Symbol |
Parameter |
Test Conditions |
Min |
Typ |
Max |
Unit |
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td(on) |
Turn-on Delay Time |
VDD=15V; ID=15A |
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150 |
500 |
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tr |
Rise Time |
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840 |
2500 |
ns |
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Vgen=5V; Rgen=RIN MIN=4.7Ω |
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td(off) |
Turn-off Delay Time |
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980 |
3000 |
ns |
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(see figure 1) |
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tf |
Fall Time |
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600 |
1500 |
ns |
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td(on) |
Turn-on Delay Time |
VDD=15V; ID=15A |
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4 |
12 |
μs |
tr |
Rise Time |
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27 |
100 |
μs |
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Vgen=5V; Rgen=2.2KΩ |
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td(off) |
Turn-off Delay Time |
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34 |
120 |
μs |
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(see figure 1) |
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tf |
Fall Time |
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31 |
110 |
μs |
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(di/dt)on |
Turn-on Current Slope |
VDD=15V; ID=15A |
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18 |
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A/μs |
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Vgen=5V; Rgen=RIN MIN=4.7Ω |
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Qi |
Total Input Charge |
VDD=12V; ID=15A; VIN=5V |
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118 |
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nC |
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Igen =2.13mA (see figure 5) |
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SOURCE DRAIN DIODE
Symbol |
Parameter |
Test Conditions |
Min |
Typ |
Max |
Unit |
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VSD (*) |
Forward On Voltage |
ISD=15A; VIN=0V |
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0.8 |
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V |
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trr |
Reverse Recovery Time |
ISD=15A; dI/dt=100A/μs |
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400 |
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Qrr |
Reverse Recovery Charge |
VDD=30V; L=200μH |
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1.4 |
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μC |
IRRM |
Reverse Recovery Current |
(see test circuit, figure 2) |
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7 |
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A |
PROTECTIONS (-40°C < T j < 150°C, unless otherwise specified)
Symbol |
Parameter |
Test Conditions |
Min |
Typ |
Max |
Unit |
Ilim |
Drain Current Limit |
VIN=6V; VDS=13V |
30 |
45 |
60 |
A |
tdlim |
Step Response Current |
VIN=6V; VDS=13V |
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50 |
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μs |
Limit |
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Tjsh |
Overtemperature |
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150 |
175 |
200 |
°C |
Shutdown |
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Tjrs |
Overtemperature Reset |
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135 |
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°C |
Igf |
Fault Sink Current |
VIN=5V; VDS=13V; Tj=Tjsh |
10 |
15 |
20 |
mA |
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Single Pulse |
starting Tj=25°C; V DD=24V |
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Eas |
VIN=5V; Rgen=RIN MIN=4.7Ω; L=24mH |
1.7 |
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J |
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Avalanche Energy |
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(see figures 3 & 4) |
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(*) Pulsed: Pulse duration = 300μs, duty cycle 1.5% |
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4/19
VNB35NV04 / VNP35NV04 / VNV35NV04 / VNW35NV04
PROTECTION FEATURES
During normal operation, the INPUT pin is electrically connected to the gate of the internal power MOSFET through a low impedance path.
The device then behaves like a standard power MOSFET and can be used as a switch from DC up to 25KHz. The only difference from the user’s standpoint is that a small DC current IISS (typ. 100μA) flows into the INPUT pin in order to supply the internal circuitry.
The device integrates:
- OVERVOLTAGE CLAMP PROTECTION:
internally set at 45V, along with the rugged avalanche characteristics of the Power MOSFET stage give this device unrivalled ruggedness and energy handling capability. This feature is mainly important when driving inductive loads.
- LINEAR CURRENT LIMITER CIRCUIT:
limits the drain current ID to Ilim whatever the INPUT pin voltages is. When the current limiter is active, the device operates in the linear region, so power dissipation may exceed the capability of the heatsink. Both case and junction temperatures increase, and if this phase lasts long enough, junction temperature may reach the overtemperature threshold Tjsh.
- OVERTEMPERATURE AND SHORT CIRCUIT PROTECTION:
these are based on sensing the chip temperature and are not dependent on the input voltage. The location of the sensing element on the chip in the power stage area ensures fast, accurate detection of the junction temperature. Overtemperature cutout occurs in the range 150 to 190 °C, a typical value being 170 °C. The device is automatically restarted when the chip temperature falls of about 15°C below shut-down temperature.
- STATUS FEEDBACK:
in the case of an overtemperature fault condition (Tj > Tjsh), the device tries to sink a diagnostic current Igf through the INPUT pin in order to indicate fault condition. If driven from a low impedance source, this current may be used in order to warn the control circuit of a device shutdown. If the drive impedance is high enough so that the INPUT pin driver is not able to supply the current Igf, the INPUT pin will fall to 0V. This will not however affect the device operation: no requirement is put on the current capability of the INPUT pin driver except to be able to supply the normal operation drive current IISS.
Additional features of this device are ESD protection according to the Human Body model and the ability to be driven from a TTL Logic circuit.
5/19
VNB35NV04 / VNP35NV04 / VNV35NV04 / VNW35NV04
Fig.1: Switching Time Test Circuit for Resistive Load
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VD |
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Rgen |
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Vgen |
ID |
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90% |
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t |
10% |
tf |
r |
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t |
td(on) |
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t |
Vgen |
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d(off) |
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t |
Fig.2: Test Circuit for Diode Recovery Times
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FAST |
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L=100uH |
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OMNIFET |
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DIODE |
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25 Ω |
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Rgen |
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VDD |
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Vgen |
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OMNIFET |
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8.5 Ω |
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6/19